The Atmel® AT27C020 is a low-power, high-performance, 2,097,152-bit, one-time programmable, read-only memory (OTP EPROM) organized as 256K by 8 bits. It requires only
one 5V power supply in normal read mode operation. Any byte can be accessed in less than
55ns, eliminating the need for speed-reducing WAIT states on high-performance microprocessor systems.
2Mb (256K x 8)
One-time
Programmable,
Read-only Memory
Atmel AT27C020
In read mode, the AT27C020 typically consumes 8mA. Standby mode supply current is
typically less than 10µA.
The AT27C020 is available in a choice of industry-standard, JEDEC approved, one-time programmable (OTP) PDIP and PLCC packages. All devices feature two-line control (CE, OE)
to give designers the flexibility to prevent bus contention.
With 256K byte storage capability, the AT27C020 allows firmware to be stored reliably and
to be accessed by the system without the delays of mass storage media.
The AT27C020 has additional features to ensure high quality and efficient production use.
The rapid programming algorithm reduces the time required to program the part and guarantees reliable programming. Programming time is typically only 100µs/byte. The
integrated product identification code electronically identifies the device and manufacturer.
This feature is used by industry standard programming equipment to select the proper programming algorithms and voltages.
0570H–EPROM–4/11
Page 2
2.Pin configurations
Pin nameFunction
A0 - A17Addresses
O0 - O7Outputs
CEChip enable
OEOutput enable
PGMProgram strobe
3.System considerations
Switching between active and standby conditions via the chip enable pin may produce transient voltage excursions. Unless
accommodated by the system design, these transients may exceed datasheet limits, resulting in device nonconformance.
At a minimum, a 0.1µF, high-frequency, low inherent inductance, ceramic capacitor should be utilized for each device. This
capacitor should be connected between the VCC and ground terminals of the device, as close to the device as possible.
Additionally, to stabilize the supply voltage level on printed circuit boards with large EPROM arrays, a 4.7µF bulk electrolytic
capacitor should be utilized, again connected between the VCC and ground terminals. This capacitor should be positioned as
close as possible to the point where the power supply is connected to the array.
A7
A6
A5
A4
A3
A2
A1
A0
O0
32-lead PLCC
Top view
A12
A15
A16
VPP
432
5
6
7
8
9
10
11
12
13
14151617181920
01
1
02
030405
GND
VCC
PGM
323130
A17
29
28
27
26
25
24
23
22
21
06
A14
A13
A8
A9
A11
OE
A10
CE
07
32-lead PDIP
1
VPP
2
A16
3
A15
4
A12
5
A7
6
A6
7
A5
8
A4
9
A3
10
A2
11
A1
12
A0
13
O0
14
O1
15
O2
16
GND
Top view
VCC
32
PGM
31
A17
30
A14
29
A13
28
A8
27
A9
26
A11
25
OE
24
A10
23
CE
22
07
21
06
20
05
19
04
18
03
17
Figure 3-1.Block diagram
2
Atmel AT27C020
0570H–EPROM–4/11
Page 3
4.Absolute maximum ratings*
Atmel AT27C020
Temperature under bias . . . . . . . . . . . . . .-55°C to +125°C
Note:1. Minimum voltage is -0.6V DC, which may undershoot to -2.0V for pulses of less than 20ns. Maximum output pin voltage is
V
+ 0.75V DC, which may overshoot to +7.0V for pulses of less than 20ns.
CC
5.DC and AC characteristics
Table 5-1.Operating modes
Mode/PinCEOEPGMAiV
ReadV
Output disableXV
StandbyV
Rapid program
(2)
PGM verifyV
PGM inhibitV
Product identification
Notes:1. X can be V
(4)
or VIH.
IL
2. Refer to programming characteristics.
= 12.0 ± 0.5V.
3. V
H
4. Two identifier bytes may be selected. All Ai inputs are held low (V
gled low (V
) to select the manufacturer’s identification byte and high (VIH) to select the device code byte.
IL
IL
IH
V
IL
IL
IH
V
IL
*NOTICE: Stresses beyond those listed under “Absolute
maximum ratings” may cause permanent damage to
the device. This is a stress rating only, and functional
operation of the device at these or any other conditions
beyond those indicated in the operational sections of
(1)
this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may
affect device reliability.
(1)
(1)
PP
V
IL
IH
(1)
X
AiXD
XXXHigh-Z
Outputs
OUT
XXXXHigh-Z
V
IH
V
IL
XXXV
V
IL
V
IL
V
IH
X
AiV
AiV
(3)
A9 = V
H
A0 = VIH or V
A1 - A17 = V
) except A9, which is set to VH, and A0, which is tog-
IL
PP
PP
PP
IL
IL
XIdentification code
D
IN
D
OUT
High-Z
Table 5-2.DC and AC operating conditions for read operation
Operating temperature (case)
power supply5V 10%5V 10%
V
CC
0570H–EPROM–4/11
Atmel AT27C020
-55-90
Ind.-40C - 85C-40C - 85C
Auto.-40C - 125C
3
Page 4
Table 5-3.DC and operating characteristics for read operation
SymbolParameterConditionMinMaxUnits
I
LI
I
LO
(2)
I
PP
I
SB
I
CC
V
IL
V
IH
V
OL
V
OH
Notes:1. V
Input load currentVIN = 0V to V
Output leakage currentV
(1)
V
read/standby currentV
PP
(1)
V
standby current
CC
= 0V to V
OUT
= V
PP
(CMOS), CE = VCC 0.3V100µA
I
SB1
(TTL), CE = 2.0 to V
I
SB2
VCC active currentf = 5MHz, I
CC
CC
OUT
CC
= 0mA, CE = V
Input low voltage-0.60.8V
Input high voltage2.0VCC + 0.5V
Output low voltageI
= 2.1mA0.4V
OL
Output high voltageIOH = -400µA2.4V
must be applied simultaneously or before V
CC
, and removed simultaneously or after V
PP
2. VPP may be connected directly to VCC except during programming. The supply current would then be the sum of I
I
.
PP
Table 5-4.AC characteristics for read operation
SymbolParameterCondition
t
t
t
t
ACC
CE
OE
DF
(3)
(2)
(2)(3)
(4)(5)
Address to output delay
CE to output delayOE = V
OE to output delayCE = V
OE or CE high to output float,
Whichever occurred first
CE = OE
= V
(Com., Ind.)±1.0µA
(Com., Ind.)±5.0µA
±10µA
+ 0.5V1.0mA
CC
IL
25mA
PP
Atmel AT27C020
-55-90
MinMaxMinMax
Units
5590ns
IL
IL
IL
5590ns
2035ns
1820ns
CC
and
t
OH
4
Atmel AT27C020
Output hold from address, CE or OE,
Whichever occurred first
70ns
0570H–EPROM–4/11
Page 5
Atmel AT27C020
Figure 5-1.AC waveforms for read operation
(1)
Notes:1. Timing measurement references are 0.8V and 2.0V. Input AC drive levels are 0.45V and 2.4V, unless otherwise specified.
OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE.
2.
OE may be delayed up to t
3.
- tOE after the address is valid without impact on t
ACC
ACC
.
4. This parameter is only sampled, and is not 100% tested.
5. Output float is defined as the point when data is no longer driven.
Figure 5-2.Input test waveforms and measurement levels
For -55 devices only:
3.0V
AC
DRIVING
LEVELS
0.0V
1.5V
tR, tF < 5ns (10% to 90%)
For -90 devices only:
tR, tF < 20ns (10% to 90%)
Figure 5-3.Output test load
AC
MEASUREMENT
LEVEL
Note:CL = 100pF including jig capacitance, except -55 devices, where CL = 30pF
0570H–EPROM–4/11
5
Page 6
Table 5-5.Pin capacitance
f = 1MHz, T = 25C
(1)
SymbolTypMaxUnitsConditions
C
IN
C
OUT
48pFVIN = 0V
812pFV
OUT
= 0V
Note:1. Typical values for nominal supply voltage. This parameter is only sampled, and is not 100% tested.
Figure 5-4.Programming waveforms
(1)
Note:1. The input timing reference is 0.8V for VIL and 2.0V for VIH.
and t
2. t
OE
3. When programming the Atmel AT27C020, a 0.1µF capacitor is required across V
are characteristics of the device, but must be accommodated by the programmer
A 100µs PGM pulse width is used to program. The address is set to the first location. VCC is raised to 6.5V and VPP is raised
to 13.0V. Each address is first programmed with one 100µs
verification/reprogramming loop is executed for each address. In the event a byte fails to pass verification, up to 10
successive 100µs pulses are applied with a verification after each pulse. If the byte fails to verify after 10 pulses have been
applied, the part is considered failed. After the byte verifies properly, the next address is selected until all have been
checked. VPP is then lowered to 5.0V and VCC to 5.0V. All bytes are read again and compared with the original data to
determine if the device passes or fails.
Notes: 1. This package conforms to JEDEC reference MS-016, Variation AE.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254mm) per side. Dimension D1
and E1 include mold mismatch and are measured at the extreme
material condition at the upper or lower parting line.
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