• Die Sales: Wafer Form, Waffle Pack and Bumped Die
Description
The AT24C512B provides 524,288 bits of serial electrically erasable and programmable read only memory (EEPROM) organized as 65,536 words of 8 bits each. The
device’s cascadable feature allows up to eight devices to share a common two-wire
bus. The device is optimized for use in many industrial and commercial applications
where low-power and low-voltage operation are essential. The devices are available
in space-saving 8-pin PDIP, 8-lead JEDEC SOIC, 8-lead EIAJ SOIC, 8-lead TSSOP,
8-ball dBGA2 and 8-lead Ultra Thin SAP packages. In addition, the entire family is
available in 1.8V (1.8V to 3.6V) and 2.5V (2.5V to 5.5V) versions.
Two-wire Serial
EEPROM
512K (65,536 x 8)
AT24C512B
with Three Device Address Inputs
Table 0-1.Pin Configurations
Pin NameFunction
A0–A2Address Inputs
SDASerial Data
SCLSerial Clock Input
WPWrite Protect
8-ball dBGA2
Bottom View
8-lead TSSOP
8-lead Ultra Thin SAP
Bottom View
8-lead PDIP
8-lead SOIC
Rev. 5297A–SEEPR–1/08
Absolute Maximum Ratings*
STA RT
STOP
LOGIC
VCC
GND
WP
SCL
SDA
A
2
A
1
A
0
SERIAL
CONTROL
LOGIC
EN
H.V. PUMP/TIMING
EEPROM
DATA RECOVERY
SERIAL MUX
X DEC
D
OUT
/ACK
LOGIC
COMP
LOAD
INC
DATA WORD
ADDR/COUNTER
Y DEC
R/W
D
OUT
D
IN
LOAD
DEVICE
ADDRESS
COMPARATOR
Operating Temperature..................................–55°C to +125°C
Storage Temperature .....................................–65°C to +150°C
Voltage on Any Pin
with Respect to Ground .................................... –1.0V to +7.0V
Maximum Operating Voltage .......................................... 6.25V
DC Output Current........................................................ 5.0 mA
Figure 0-1.Block Diagram
*NOTICE:Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect device
reliability.
2
AT24C512B
5297A–SEEPR–1/08
1.Pin Description
SERIAL CLOCK (SCL): The SCL input is used to positive edge clock data into each EEPROM
device and negative edge clock data out of each device.
SERIAL DATA (SDA): The SDA pin is bidirectional for serial data transfer. This pin is opendrain driven and may be wire-ORed with any number of other open-drain or open collector
devices.
DEVICE/PAGE ADDRESSES (A2, A1, A0): The A2, A1, and A0 pins are device address inputs
that are hardwired (directly to GND or to Vcc) for compatibility with other AT24Cxx devices.
When the pins are hardwired, as many as eight 512K devices may be addressed on a single bus
system. (Device addressing is discussed in detail under “Device Addressing,” page 8.) A device
is selected when a corresponding hardware and software match is true. If these pins are left
floating, the A2, A1, and A0 pins will be internally pulled down to GND. However, due to capacitive coupling that may appear during customer applications, Atmel
connecting the address pins to a known state. When using a pull-up resistor, Atmel recommends
using 10kΩ or less.
WRITE PROTECT (WP): The write protect input, when connected to GND, allows normal write
operations. When WP is connected directly to Vcc, all write operations to the memory are inhibited. If the pin is left floating, the WP pin will be internally pulled down to GND. However, due to
capacitive coupling that may appear during customer applications, Atmel recommends always
connecting the WP pins to a known state. When using a pull-up resistor, Atmel recommends
using 10kΩ or less.
AT24C512B
®
recommends always
5297A–SEEPR–1/08
3
2.Memory Organization
AT24C512B, 512K SERIAL EEPROM: The 512K is internally organized as 512 pages of 128-bytes each. Random word
addressing requires a 16-bit data word address.
Table 2-1.Pin Capacitance
(1)
Applicable over recommended operating range from: TA = 25°C, f = 1.0 MHz, VCC = +1.8V to +5.5V
SymbolTest ConditionMaxUnitsConditions
C
I/O
C
IN
Input/Output Capacitance (SDA)8pFV
I/O
= 0V
Input Capacitance (A0, A1, SCL)6pFVIN = 0V
Note:1. This parameter is characterized and is not 100% tested.
Table 2-2.DC Characteristics
Applicable over recommended operating range from: T
SymbolParameterTest ConditionMinTypMaxUnits
V
CC1
V
CC2
I
CC
I
CC
I
SB1
I
SB2
I
LI
I
LO
V
IL
V
IH
V
OL1
V
OL2
Note:1. VIL min and VIH max are reference only and are not tested.
Supply Voltage1.83.6V
Supply Voltage2.55.5V
Supply CurrentVCC = 5.0VREAD at 400 kHz2.0mA
Supply CurrentVCC = 5.0VWRITE at 400 kHz3.0mA
V
= 1.8V
Standby Current
CC
= 3.6V3.0µA
V
CC
VCC = 2.5V
Standby Current
= 5.5V6.0µA
V
CC
Input Leakage CurrentVIN = V
Output Leakage
Current
Input Low Level
Input High Level
(1)
(1)
V
OUT
CC or VSS
= V
CC or VSS
Output Low LevelVCC = 1.8VIOL = 0.15 mA0.2V
Output Low LevelVCC = 3.0VIOL = 2.1 mA0.4V
= –40°C to +85°C, VCC = +1.8V to +5.5V (unless otherwise noted)
AI
1.0µA
= VCC or V
V
IN
SS
2.0µA
VIN = VCC or V
SS
0.103.0µA
0.053.0µA
–0.6VCC x 0.3V
VCC x 0.7VCC + 0.5V
4
AT24C512B
5297A–SEEPR–1/08
Table 2-3.AC Characteristics (Industrial Temperature)
Applicable over recommended operating range from T
= −40°C to +85°C, VCC = +1.8V to +5.5V, CL = 100 pF (unless oth-
AI
erwise noted). Test conditions are listed in Note 2.
AT24C512B
1.8-volt2.5, 5.0-volt
SymbolParameter
f
SCL
t
LOW
t
HIGH
t
i
t
AA
t
BUF
t
HD.STA
t
SU.STA
t
HD.DAT
t
SU.DAT
t
R
t
F
t
SU.STO
t
DH
t
WR
Endurance
Clock Frequency, SCL4001000kHz
Clock Pulse Width Low1.30.4µs
Clock Pulse Width High0.60.4µs
Noise Suppression Time
(1)
Clock Low to Data Out Valid0.050.90.050.55µs
Time the bus must be free before
a new transmission can start
(1)
Start Hold Time0.60.25µs
Start Set-up Time0.60.25µs
Data In Hold Time00µs
Data In Set-up Time100100ns
Inputs Rise Time
Inputs Fall Time
(1)
(1)
Stop Set-up Time0.60.25µs
Data Out Hold Time5050ns
Write Cycle Time 55ms
(1)
25°C, Page Mode, 3.3V1,000,000
Notes:1. This parameter is ensured by characterization only.
2. AC measurement conditions:
(connects to VCC): 1.3 kΩ (2.5V, 5V), 10 kΩ (1.8V)
R
L
Input pulse voltages: 0.3 VCC to 0.7 V
CC
Input rise and fall times: ≤ 50 ns
Input and output timing reference voltages: 0.5 V
UnitsMinMaxMinMax
10050ns
1.30.5µs
0.30.3µs
300100ns
Write
Cycles
CC
5297A–SEEPR–1/08
5
3.Device Operation
Start bit
Stop bitStart bitDummy Clock Cycles
SCL
SDA
12389
CLOCK and DATA TRANSITIONS: The SDA pin is normally pulled high with an external device.
Data on the SDA pin may change only during SCL low time periods (see Figure 3-4 on page 8).
Data changes during SCL high periods will indicate a start or stop condition as defined below.
START CONDITION: A high-to-low transition of SDA with SCL high is a start condition which
must precede any other command (see Figure 3-5 on page 8).
STOP CONDITION: A low-to-high transition of SDA with SCL high is a stop condition. After a
read sequence, the stop command will place the EEPROM in a standby power mode (see Fig-
ure 3-5 on page 8).
ACKNOWLEDGE: All addresses and data words are serially transmitted to and from the
EEPROM in 8-bit words. The EEPROM sends a zero during the ninth clock cycle to acknowledge that it has received each word.
STANDBY MODE: The AT24C512B features a low power standby mode which is enabled: a)
upon power-up and b) after the receipt of the STOP bit and the completion of any internal
operations.
Software Reset: After an interruption in protocol, power loss or system reset, any 2-wire
part can be protocol reset by following these steps: (a) Create a start bit condition, (b)
clock 9 cycles, (c) create another start bit followed by stop bit condition as shown below.
The device is ready for next communication after above steps have been completed.
Figure 3-1.Protocol Reset Condition
6
AT24C512B
5297A–SEEPR–1/08
Figure 3-2.Bus Timing (SCL: Serial Clock, SDA: Serial Data I/O)
SCL
SDA IN
SDA OUT
t
F
t
HIGH
t
LOW
t
LOW
t
R
t
AA
t
DH
t
BUF
t
SU.STO
t
SU.DAT
t
HD.DAT
t
HD.STA
t
SU.STA
Figure 3-3.Write Cycle Timing (SCL: Serial Clock, SDA: Serial Data I/O)
AT24C512B
SCL
SDA
8th BIT
ACK
WORDn
(1)
t
wr
STOP
CONDITION
START
CONDITION
Note:1. The write cycle time tWR is the time from a valid stop condition of a write sequence to the end of the internal clear/write cycle.
5297A–SEEPR–1/08
7
Figure 3-4.Data Validity
SDA
SCL
DATA STABLEDATA STABLE
DATA
CHANGE
SCL
DATA IN
DATA OUT
STARTACKNOWLEDGE
9
8
1
Figure 3-5.Start and Stop Definition
SDA
SCL
Figure 3-6.Output Acknowledge
STA RTSTOP
8
AT24C512B
5297A–SEEPR–1/08
4.Device Addressing
The 512K EEPROM requires an 8-bit device address word following a start condition to enable
the chip for a read or write operation (see Figure 6-1 on page 10). The device address word consists of a mandatory “1”, “0” sequence for the first four most significant bits as shown. This is
common to all two-wire EEPROM devices.
The 512K uses the three device address bits A2, A1, A0 to allow as many as eight devices on
the same bus. These bits must compare to their corresponding hardwired input pins. The A2, A1
and A0 pins use an internal proprietary circuit that biases them to a logic low condition if the pins
are allowed to float.
The eighth bit of the device address is the read/write operation select bit. A read operation is initiated if this bit is high and a write operation is initiated if this bit is low.
Upon a compare of the device address, the EEPROM will output a “0”. If a compare is not made,
the device will return to a standby state.
DATA SECURITY: The AT24C512B has a hardware data protection scheme that allows the user
to Write Protect the whole memory when the WP pin is at V
5.Write Operations
BYTE WRITE: A write operation requires two 8-bit data word addresses following the device
address word and acknowledgment. Upon receipt of this address, the EEPROM will again
respond with a “0” and then clock in the first 8-bit data word. Following receipt of the 8-bit data
word, the EEPROM will output a “0”. The addressing device, such as a microcontroller, then
must terminate the write sequence with a stop condition. At this time the EEPROM enters an
internally-timed write cycle, t
write cycle and the EEPROM will not respond until the write is complete (see Figure 6-2 on page
10).
AT24C512B
.
CC
, to the nonvolatile memory. All inputs are disabled during this
WR
PAGE WRITE: The 512K EEPROM is capable of 128-byte page writes.
A page write is initiated the same way as a byte write, but the microcontroller does not send a
stop condition after the first data word is clocked in. Instead, after the EEPROM acknowledges
receipt of the first data word, the microcontroller can transmit up to 127 more data words. The
EEPROM will respond with a “0” after each data word received. The microcontroller must terminate the page write sequence with a stop condition (see Figure 6-3 on page 11).
The data word address lower 7 bits are internally incremented following the receipt of each data
word. The higher data word address bits are not incremented, retaining the memory page row
location. When the word address, internally generated, reaches the page boundary, the following byte is placed at the beginning of the same page. If more than 128 data words are
transmitted to the EEPROM, the data word address will “roll over” and previous data will be
overwritten. The address roll over during write is from the last byte of the current page to the first
byte of the same page.
ACKNOWLEDGE POLLING: Once the internally-timed write cycle has started and the
EEPROM inputs are disabled, acknowledge polling can be initiated. This involves sending a
start condition followed by the device address word. The Read/Write bit is representative of the
operation desired. Only if the internal write cycle has completed will the EEPROM respond with
a “0”, allowing the read or write sequence to continue.
5297A–SEEPR–1/08
9
6.Read Operations
MSB
1 0 1 0 A
2
A
1
A0 R/W
LSB
Read operations are initiated the same way as write operations with the exception that the
Read/Write select bit in the device address word is set to “1”. There are three read operations:
current address read, random address read and sequential read.
CURRENT ADDRESS READ: The internal data word address counter maintains the last
address accessed during the last read or write operation, incremented by “1”. This address stays
valid between operations as long as the chip power is maintained. The address roll over during
read is from the last byte of the last memory page, to the first byte of the first page.
Once the device address with the Read/Write select bit set to “1” is clocked in and acknowledged by the EEPROM, the current address data word is serially clocked out. The
microcontroller does not respond with an input “0” but does generate a following stop condition
(see Figure 6-4 on page 11).
RANDOM READ: A random read requires a “dummy” byte write sequence to load in the data
word address. Once the device address word and data word address are clocked in and
acknowledged by the EEPROM, the microcontroller must generate another start condition. The
microcontroller now initiates a current address read by sending a device address with the
Read/Write select bit high. The EEPROM acknowledges the device address and serially clocks
out the data word. The microcontroller does not respond with a “0” but does generate a following
stop condition (see Figure 6-5 on page 11).
SEQUENTIAL READ: Sequential reads are initiated by either a current address read or a random address read. After the microcontroller receives a data word, it responds with an
acknowledge. As long as the EEPROM receives an acknowledge, it will continue to increment
the data word address and serially clock out sequential data words. When the memory address
limit is reached, the data word address will roll over and the sequential read will continue. The
sequential read operation is terminated when the microcontroller does not respond with a “0” but
does generate a following stop condition (see Figure 6-6 on page 11).
Figure 6-2.Byte Write
10
AT24C512B
Figure 6-1.Device Address
5297A–SEEPR–1/08
Figure 6-3.Page Write
Figure 6-4.Current Address Read
AT24C512B
Figure 6-5.Random Read
Figure 6-6.Sequential Read
5297A–SEEPR–1/08
11
Ordering Information
Ordering CodeVoltagePackageOperation Range
AT24C512B-PU (Bulk form only)1.88P3
AT24C512B-PU25 (Bulk form only)2.58P3
(1)
AT24C512BN-SH-B
AT24C512BN-SH-T
AT24C512BN-SH25-B
AT24C512BN-SH25-T
AT24C512BW-SH-B
AT24C512BW-SH-T
AT24C512BW-SH25-B
AT24C512BW-SH25-T
AT24C512B-TH-B
AT24C512B-TH-T
AT24C512B-TH25-B
AT24C512B-TH25-T
AT24C512BY7-YH-T
AT24C512BY7-YH25-T
AT24C512BU2-UU-T
AT24C512B-W-11
(NiPdAu Lead Finish)1.88S1
(2)
(NiPdAu Lead Finish)1.88S1
(1)
(NiPdAu Lead Finish)2.58S1
(2)
(NiPdAu Lead Finish)2.58S1
(1)
(NiPdAu Lead Finish)1.88S2
(2)
(NiPdAu Lead Finish)1.88S2
(1)
(NiPdAu Lead Finish)2.58S2
(2)
(NiPdAu Lead Finish)2.58S2
(1)
(NiPdAu Lead Finish)1.88A2
(2)
(NiPdAu Lead Finish)1.88A2
(1)
(NiPdAu Lead Finish)2.58A2
(2)
(NiPdAu Lead Finish)2.58A2
(2)
(NiPdAu Lead Finish)1.88Y7
(2)
(NiPdAu Lead Finish)2.58Y7
(2)
1.88U2-1
(3)
1.8Die SaleIndustrial Temperature
Lead-free/Halogen-free/
Industrial Temperature
(–40°C to 85°C)
(–40°C to 85°C)
Notes:1. “-B” denotes bulk
2. “-T” denotes tape and reel. SOIC = 4K per reel. TSSOP and dBGA2 = 5K per reel. SAP = 3K per reel. EIAJ = 2K per reel.
3. Available in tape and reel, and wafer form; order as SL788 for inkless wafer form. Bumped die available upon request.
These drawingsare for general information only. Refer to JEDEC Drawing MS-012, Variation AA for proper dimensions, tolerances, datums, etc.
A 1.35 – 1.75
B 0.31 – 0.51
C 0.17 – 0.25
D 4.80 – 5.00
E1 3.81 – 3.99
E 5.79 – 6.20
e 1.27 BSC
L 0.40 – 1.27
∅ 0° – 8°
∅
Top View
End View
Side View
e
B
D
A
A1
N
E
1
C
E1
L
20
AT24C512B
5297A–SEEPR–1/08
8S2 - EIAJ SOIC
2325 Orchard Parkway
San Jose, CA 95131
TITLE
DRAWING NO.
R
REV.
8S2, 8-lead, 0.209" Body, Plastic Small
Outline Package (EIAJ)
4/7/06
8S2
D
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL
MIN
NOM
MAX
NOTE
Notes: 1. This drawing is for general information only; refer to EIAJ Drawing EDR-7320 for additional information.
2. Mismatch of the upper and lower dies and resin burrs aren't included.
3. It is recommended that upper and lower cavities be equal. If they are different, the larger dimension shall be regarded.
4. Determines the true geometric position.
5. Values b,C apply to plated terminal. The standard thickness of the plating layer shall measure between 0.007 to .021 mm.
A1.702.16
A10.050.25
b0.350.485
C0.150.355
D5.135.35
E15.185.402, 3
E7.708.26
L0.510.85
θ 0˚ 8˚
e 1.27 BSC4
θθ
11
NN
EE
TOP VIEWTOP VIEW
CC
E1E1
END VIEWEND VIEW
AA
bb
LL
A1A1
ee
DD
SIDE VIEWSIDE VIEW
AT24C512B
5297A–SEEPR–1/08
21
8A2 – TSSOP
2325 Orchard Parkway
San Jose, CA 95131
TITLE
DRAWING NO.
R
REV.
5/30/02
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL
MIN
NOM
MAX
NOTE
D2.903.003.102, 5
E6.40 BSC
E14.304.404.503, 5
A––1.20
A20.801.001.05
b0.19–0.304
e0.65 BSC
L0.450.600.75
L11.00 REF
8A2, 8-lead, 4.4 mm Body, Plastic
Thin Shrink Small Outline Package (TSSOP)
Notes: 1. This drawing is for general information only. Refer to JEDEC Drawing MO-153, Variation AA, for proper dimensions, tolerances,
datums, etc.
2. Dimension D does not include mold Flash, protrusions or gate burrs. Mold Flash, protrusions and gate burrs shall not exceed
0.15 mm (0.006 in) per side.
3. Dimension E1 does not include inter-lead Flash or protrusions. Inter-lead Flash and protrusions shall not exceed 0.25 mm
(0.010 in) per side.
4. Dimension b does not include Dambar protrusion. Allowable Dambar protrusion shall be 0.08 mm total in excess of the
b dimension at maximum material condition. Dambar cannot be located on the lower radius of the foot. Minimum space between
protrusion and adjacent lead is 0.07 mm.
5. Dimension D and E1 to be determined at Datum Plane H.
8A2
B
Side View
End View
Top View
A2
A
L
L1
D
123
E1
N
b
Pin 1 indicator
this corner
E
e
22
AT24C512B
5297A–SEEPR–1/08
8Y7 – UTSAP
1150 E. Cheyenne Mtn. Blvd.
Colorado Springs, CO 80906
TITLE
DRAWING NO.
R
REV.
8Y7, 8-lead (6.00 x 4.90 mm Body) Ultra-Thin SOIC Array
Package (UTSAP) Y7
B
8Y7
10/13/05
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL
MIN
NOM
MAX
NOTE
A––0.60
A10.00–0.05
D5.806.006.20
E4.704.905.10
D13.303.403.50
E13.904.004.10
b0.350.400.45
e1.27 TYP
e13.81 REF
L0.500.600.70
D1
PIN 1 ID
E1
L
b
e1
e
PIN 1 INDEX AREA
A
E
D
A1
A
AT24C512B
5297A–SEEPR–1/08
23
8U2-1 – dBGA2
1150 E. Cheyenne Mtn. Blvd.
Colorado Springs, CO 80906
TITLE
DRAWING NO.
R
REV.
PO8U2-1
A
6/17/03
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL
MIN
NOM
MAX
NOTE
8U2-1, 8-ball, 2.35 x 3.73 mm Body, 0.75 mm pitch,
Small Die Ball Grid Array Package (dBGA2)
A0.810.911.00
A
10.150.200.25
A
20.400.450.50
b0.250.300.35
D 2.35 BSC
E 3.73 BSC
e 0.75 BSC
e1 0.74 REF
d 0.75 BSC
d1 0.80 REF
5. Dimension 'b' is measured at the maximum solder ball diameter.
This drawing is for general information only.
d
A
SIDE VIEW
TOP VIEW
8 SOLDER BALLS
BOTTOM VIEW
1
A
B
C
D
2
(e1)
e
A1 BALL PAD CORNER
(d1)
5.
b
A1
A2
D
A1 BALL PAD CORNER
E
24
AT24C512B
5297A–SEEPR–1/08
Revision History
Doc. Rev.DateComments
AT24C512B product with date code 2008 work week 14 (814) or later
5297A1/2008
supports 5Vcc operation
Initial document release
AT24C512B
5297A–SEEPR–1/08
25
HeadquartersInternational
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www.atmel.com/contacts
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