ATMEL AT24C512 User Manual

Features

Low-voltage and Standard-voltage Operation
– 2.7 (VCC = 2.7V to 5.5V) – 1.8 (V
= 1.8V to 3.6V)
CC
Internally Organized 65,536 x 8
Two-wire Serial Interface
Bidirectional Data Transfer Protocol
1 MHz (5V), 400 kHz (2.7V) and 100 kHz (1.8V) Compatibility
Write Protect Pin for Hardware and Software Data Protection
128-byte Page Write Mode (Partial Page Writes Allowed)
Self-timed Write Cycle (5 ms Max)
High Reliability
– Endurance: 100,000 Write Cycles – Data Retention: 40 Years
Automotive Grade, Extended Temperature and Lead-free/Halogen-free
Devices Available
8-lead PDIP, 8-lead EIAJ SOIC, 8-lead JEDEC SOIC, 8-lead TSSOP,
8-lead LAP, 8-lead SAP and 8-ball dBGA2 Packages
Die Sales: Wafer Form, Waffle Pack and Bumped Die

Description

The AT24C512 provides 524,288 bits of serial electrically erasable and programmable read only memory (EEPROM) organized as 65,536 words of 8 bits each. The device’s cascadable feature allows up to four devices to share a common two-wire bus. The device is optimized for use in many industrial and commercial applications where low­power and low-voltage operation are essential. The devices are available in space­saving 8-pin PDIP, 8-lead EIAJ SOIC, 8-lead JEDEC SOIC, 8-lead TSSOP, 8-lead Leadless Array (LAP), and 8-lead SAP packages. In addition, the entire family is avail­able in 2.7V (2.7V to 5.5V) and 1.8V (1.8V to 3.6V) versions.
Two-wire Serial EEPROM
512K (65,536 x 8)
AT24C512
Table 1. Pin Configurations
Pin Name Function
A0–A1 Address Inputs
SDA Serial Data
SCL Serial Clock Input
WP Write Protect
NC No Connect
8-ball dBGA2
1
8
VCC
7
WP
6
SCL
5
SDA
Bottom View
A0
2
A1
3
NC
4
GND
8-lead TSSOP
8 7 6 5
A0 A1
NC
GND
VCC WP SCL SDA
A0 A1
NC
GND
1 2 3 4
8-lead Leadless Array
VCC
WP
SCL
SDA
8 7 6 5
A0
1
A1
2
NC
3
GND
4
Bottom View
GND
8-lead SOIC
1 2 3 4
8 7 6 5
VCC
SCL
SDA
8-lead PDIP
1
A0
2
A1
3
NC
4
VCC WP SCL SDA
8-lead SAP
8
WP
7 6 5
Bottom View
8
VCC
7
WP
6
SCL
5
SDA
A0
1
A1
2
NC
3
GND
4
Rev. 1116M–SEEPR–05/05
1
Absolute Maximum Ratings*
Operating Temperature..................................–55°C to +125°C
Storage Temperature .....................................–65°C to +150°C
Voltage on Any Pin
with Respect to Ground ....................................–1.0V to +7.0V
Maximum Operating Voltage .......................................... 6.25V
DC Output Current........................................................ 5.0 mA
Figure 1. Block Diagram
*NOTICE: Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam­age to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
2
AT24C512
1116M–SEEPR–05/05
AT24C512

Pin Description SERIAL CLOCK (SCL): The SCL input is used to positive edge clock data into each

EEPROM device and negative edge clock data out of each device.
SERIAL DATA (SDA): The SDA pin is bidirectional for serial data transfer. This pin is open-drain driven and may be wire-ORed with any number of other open-drain or open collector devices.
DEVICE/ADDRESSES (A1, A0): The A1 and A0 pins are device address inputs that are hardwired or left not connected for hardware compatibility with other AT24Cxx devices. When the pins are hardwired, as many as four 512K devices may be addressed on a single bus system (device addressing is discussed in detail under the Device Address- ing section. If the pins are left floating, the A1 and A0 pins will be internally pulled down to GND if the capacitive coupling to the circuit board V >3 pF, Atmel recommends connecting the address pins to GND.
WRITE PROTECT (WP): The write protect input, when connected to GND, allows nor­mal write operations. When WP is connected high to V memory are inhibited. If the pin is left floating, the WP pin will be internally pulled down to GND if the capacitive coupling to the circuit board V >3 pF, Atmel recommends connecting the pin to GND. Switching WP to V write operation creates a software write protect function.
plane is <3 pF. If coupling is
CC
, all write operations to the
CC
plane is <3 pF. If coupling is
CC
prior to a
CC

Memory Organization AT24C512, 512K SERIAL EEPROM: The 512K is internally organized as 512 pages of

128-bytes each. Random word addressing requires a 16-bit data word address.
1116M–SEEPR–05/05
3
Table 2. Pin Capacitance
(1)
Applicable over recommended operating range from TA = 25°C, f = 1.0 MHz, VCC = +1.8V
Symbol Test Condition Max Units Conditions
C
I/O
C
IN
Input/Output Capacitance (SDA) 8 pF V
Input Capacitance (A0, A1, SCL) 6 pF VIN = 0V
I/O
= 0V
Note: 1. This parameter is characterized and is not 100% tested.
Table 3. DC Characteristics Applicable over recommended operating range from: T V
= +1.8V to +5.5V (unless otherwise noted)
CC
Symbol Parameter Test Condition Min Typ Max Units
V
CC1
V
CC2
V
CC3
I
CC1
I
CC2
I
SB1
I
SB2
I
SB3
I
LI
I
LO
V
IL
V
IH
V
OL2
V
OL1
Note: 1. V
Supply Voltage 1.8 3.6 V
Supply Voltage 2.7 5.5 V
Supply Voltage 4.5 5.5 V
Supply Current VCC = 5.0V READ at 400 kHz 1.0 2.0 mA
Supply Current VCC = 5.0V WRITE at 400 kHz 2.0 3.0 mA
= 1.8V
V
Standby Current (1.8V option)
Standby Current (2.7V option)
Standby Current (5.0V option)
Input Leakage Current VIN = V
Output Leakage Current
Input Low Level
Input High Level
(1)
(1)
CC
= 3.6V 3.0
V
CC
= 2.7V
V
CC
= 5.5V 6.0
V
CC
= 4.5 - 5.5V VIN = VCC or V
V
CC
CC or VSS
= V
V
OUT
CC or VSS
Output Low Level VCC = 3.0V IOL = 2.1 mA 0.4 V
Output Low Level VCC = 1.8V IOL = 0.15 mA 0.2 V
min and VIH max are reference only and are not tested.
IL
= 40°C to +85°C, VCC = +1.8V to +5.5V, TAC = 0°C to +70°C,
AI
1.0 µA
= VCC or V
V
IN
SS
2.0 µA
VIN = VCC or V
SS
SS
6.0 µA
0.10 3.0 µA
0.05 3.0 µA
–0.6 VCC x 0.3 V
VCC x 0.7 VCC + 0.5 V
4
AT24C512
1116M–SEEPR–05/05
Table 4. AC Characteristics Applicable over recommended operating range from T erwise noted) Test conditions are listed in Note 2.
Symbol Parameter
f
SCL
t
LOW
t
HIGH
t
AA
t
BUF
t
HD.STA
t
SU.STA
t
HD.DAT
t
SU.DAT
t
R
t
F
t
SU.STO
t
DH
t
WR
Endurance
Clock Frequency, SCL 100 400 1000 kHz
Clock Pulse Width Low 4.7 1.3 0.4 µs
Clock Pulse Width High 4.0 1.0 0.4 µs
Clock Low to Data Out Valid 0.1 4.5 0.05 0.9 0.05 0.55 µs
Time the bus must be free before a new transmission can start
(1)
Start Hold Time 4.0 0.6 0.25 µs
Start Set-up Time 4.7 0.6 0.25 µs
Data In Hold Time 0 0 0 µs
Data In Set-up Time 200 100 100 ns
Inputs Rise Time
Inputs Fall Time
(1)
(1)
Stop Set-up Time 4.7 0.6 0.25 µs
Data Out Hold Time 100 50 50 ns
Write Cycle Time 20 or 5
(1)
5.0V, 25°C, Page Mode 100K 100K 100K Write Cycles
AT24C512
= 40°C to +85°C, VCC = +1.8V to +5.5V, CL = 100 pF (unless oth-
A
1.8 Volt 2.7 Volt 5.0 Volt
UnitsMin Max Min Max Min Max
4.7 1.3 0.5 µs
1.0 0.3 0.3 µs
300 300 100 ns
(3)
10 or 5
(3)
10 or 5
(3)
ms
Notes: 1. This parameter is characterized and is not 100% tested.
2. AC measurement conditions: (connects to VCC): 1.3 k (2.7V, 5V), 10 k (1.8V)
R
L
Input pulse voltages: 0.3VCC to 0.7V
CC
Input rise and fall times: 50 ns Input and output timing reference voltages: 0.5V
CC
3. The Write Cycle Time of 5 ms only applies to the AT24C512 devices bearing the process letter “A” on the package (the mark
is located in the lower right corner on the top side of the package).
1116M–SEEPR–05/05
5

Device Operation CLOCK and DATA TRANSITIONS: The SDA pin is normally pulled high with an exter-

nal device. Data on the SDA pin may change only during SCL low time periods (see Figure 4 on page 7). Data changes during SCL high periods will indicate a start or stop condition as defined below.
START CONDITION: A high-to-low transition of SDA with SCL high is a start condition which must precede any other command (see Figure 5 on page 8).
STOP CONDITION: A low-to-high transition of SDA with SCL high is a stop condition. After a read sequence, the stop command will place the EEPROM in a standby power mode (see Figure 5 on page 8).
ACKNOWLEDGE: All addresses and data words are serially transmitted to and from the EEPROM in 8-bit words. The EEPROM sends a zero during the ninth clock cycle to acknowledge that it has received each word.
STANDBY MODE: The AT24C512 features a low power standby mode which is enabled: a) upon power-up and b) after the receipt of the STOP bit and the completion of any internal operations.
MEMORY RESET: After an interruption in protocol, power loss or system reset, any two­wire part can be reset by following these steps:
(a) Clock up to 9 cycles, (b) look for SDA high in each cycle while SCL is high and then (c) create a start condition as SDA is high.
6
AT24C512
1116M–SEEPR–05/05
Figure 2. Bus Timing (SCL: Serial Clock, SDA: Serial Data I/O)
Figure 3. Write Cycle Timing (SCL: Serial Clock, SDA: Serial Data I/O)
SCL
AT24C512
SDA
WORDn
Note: 1. The write cycle time tWR is the time from a valid stop condition of a write sequence to the end of the internal clear/write cycle.
8th BIT
ACK
STOP
CONDITION
(1)
t
wr
START
CONDITION
Figure 4. Data Validity
1116M–SEEPR–05/05
7
Figure 5. Start and Stop Definition
Figure 6. Output Acknowledge
8
AT24C512
1116M–SEEPR–05/05
AT24C512

Device Addressing The 512K EEPROM requires an 8-bit device address word following a start condition to

enable the chip for a read or write operation (see Figure 7 on page 10). The device address word consists of a mandatory “1”, “0” sequence for the first five most significant bits as shown. This is common to all two-wire EEPROM devices.
The 512K uses the two device address bits A1, A0 to allow as many as four devices on the same bus. These bits must compare to their corresponding hardwired input pins. The A1 and A0 pins use an internal proprietary circuit that biases them to a logic low condition if the pins are allowed to float.
The eighth bit of the device address is the read/write operation select bit. A read opera­tion is initiated if this bit is high and a write operation is initiated if this bit is low.
Upon a compare of the device address, the EEPROM will output a “0”. If a compare is not made, the device will return to a standby state.
DATA SECURITY: The AT24C512 has a hardware data protection scheme that allows the user to Write Protect the whole memory when the WP pin is at V

Write Operations BYTE WRITE: A write operation requires two 8-bit data word addresses following the

device address word and acknowledgment. Upon receipt of this address, the EEPROM will again respond with a “0” and then clock in the first 8-bit data word. Following receipt of the 8-bit data word, the EEPROM will output a “0”. The addressing device, such as a microcontroller, then must terminate the write sequence with a stop condition. At this time the EEPROM enters an internally-timed write cycle, t All inputs are disabled during this write cycle and the EEPROM will not respond until the write is complete (see Figure 8 on page 11).
, to the nonvolatile memory.
WR
CC
.
PAGE WRITE: The 512K EEPROM is capable of 128-byte page writes.
A page write is initiated the same way as a byte write, but the microcontroller does not send a stop condition after the first data word is clocked in. Instead, after the EEPROM acknowledges receipt of the first data word, the microcontroller can transmit up to 127 more data words. The EEPROM will respond with a “0” after each data word received. The microcontroller must terminate the page write sequence with a stop condition (see Figure 9 on page 11).
The data word address lower 7 bits are internally incremented following the receipt of each data word. The higher data word address bits are not incremented, retaining the memory page row location. When the word address, internally generated, reaches the page boundary, the following byte is placed at the beginning of the same page. If more than 128 data words are transmitted to the EEPROM, the data word address will “roll over” and previous data will be overwritten. The address roll over during write is from the last byte of the current page to the first byte of the same page.
ACKNOWLEDGE POLLING: Once the internally-timed write cycle has started and the EEPROM inputs are disabled, acknowledge polling can be initiated. This involves send­ing a start condition followed by the device address word. The Read/Write bit is representative of the operation desired. Only if the internal write cycle has completed will the EEPROM respond with a “0”, allowing the read or write sequence to continue.
1116M–SEEPR–05/05
9

Read Operations Read operations are initiated the same way as write operations with the exception that

the Read/Write select bit in the device address word is set to “1”. There are three read operations: current address read, random address read and sequential read.
CURRENT ADDRESS READ: The internal data word address counter maintains the last address accessed during the last read or write operation, incremented by “1”. This address stays valid between operations as long as the chip power is maintained. The address roll over during read is from the last byte of the last memory page, to the first byte of the first page.
Once the device address with the Read/Write select bit set to “1” is clocked in and acknowledged by the EEPROM, the current address data word is serially clocked out. The microcontroller does not respond with an input “0” but does generate a following stop condition (see Figure 10 on page 11).
RANDOM READ: A random read requires a “dummy” byte write sequence to load in the data word address. Once the device address word and data word address are clocked in and acknowledged by the EEPROM, the microcontroller must generate another start condition. The microcontroller now initiates a current address read by sending a device address with the Read/Write select bit high. The EEPROM acknowledges the device address and serially clocks out the data word. The microcontroller does not respond with a “0” but does generate a following stop condition (see Figure 11 on page 11).
SEQUENTIAL READ: Sequential reads are initiated by either a current address read or a random address read. After the microcontroller receives a data word, it responds with an acknowledge. As long as the EEPROM receives an acknowledge, it will continue to increment the data word address and serially clock out sequential data words. When the memory address limit is reached, the data word address will roll over and the sequential read will continue. The sequential read operation is terminated when the microcontroller does not respond with a “0” but does generate a following stop condition (see Figure 12 on page 12).
Figure 7. Device Address
10
AT24C512
1116M–SEEPR–05/05
Figure 8. Byte Write
Figure 9. Page Write
AT24C512
Figure 10. Current Address Read
Figure 11. Random Read
1116M–SEEPR–05/05
11
Figure 12. Sequential Read
12
AT24C512
1116M–SEEPR–05/05
AT24C512
Ordering Information
(1)
Ordering Code Package Operation Range
AT24C512C1-10CI-2.7 AT24C512-10PI-2.7 AT24C512W-10SI-2.7 AT24C512N-10SI-2.7 AT24C512-10TI-2.7
AT24C512C1-10CI-1.8 AT24C512-10PI-1.8 AT24C512W-10SI-1.8 AT24C512N-10SI-1.8 AT24C512-10TI-1.8
AT24C512C1-10CU-2.7 AT24C512C1-10CU-1.8 AT24C512-10PU-2.7 AT24C512-10PU-1.8
(2)
(2)
AT24C512W-10SU-2.7 AT24C512W-10SU-1.8 AT24C512N-10SU-2.7 AT24C512N-10SU-1.8 AT24C512-10TU-2.7 AT24C512-10TU-1.8
(2)
(2)
AT24C512Y4-10YU-1.8 AT24C512U4-10UU-1.8
AT24C512-W2.7-11 AT24C512-W1.8-11
(3)
(3)
(2)
(2)
(2)
(2)
(2)
(2)
(2)
(2)
8CN1
8P3 8S2 8S1 8A2
8CN1
8P3 8S2 8S1 8A2
8CN1 8CN1
8P3 8P3 8S2 8S2 8S1 8S1 8A2 8A2 8Y4
8U4-1
Die Sale Die Sale
Industrial Temperature
(–40°C to 85°C)
Industrial Temperature
(–40°C to 85°C)
Lead-free/Halogen-free/
Industrial Temperature
(–40°C to 85°C)
Industrial Temperature
(–40°C to 85°C)
Notes: 1. For 2.7V devices used in the 4.5V to 5.5V range, please refer to performance values in the AC and DC characteristics tables.
2. “U” designates Green package + RoHS compliant.
3. Available in waffle pack and wafer form; order as SL719 for wafer form. Bumped die available upon request. Please contact
Serial EEPROM marketing.
Package Type
8CN1 8-lead, 0.300" Wide, Leadless Array Package (LAP)
8P3 8-lead, 0.300" Wide, Plastic Dual In-line Package (PDIP)
8S2 8-lead, 0.200” Wide, Plastic Gull Wing Small Outline Package (EIAJ SOIC)
8S1 8-lead, 0.150” Wide, Plastic Gull Wing Small Outline Package (JEDEC SOIC)
8A2 8-lead, 4.4 mm Body, Plastic Thin Shrink Small Outline Package (TSSOP)
8Y4 8-lead, 6.00 mm x 4.90 mm Body, Dual Footprint, Non-leaded, Small Array Package (SAP)
8U4-1 8-ball, die Ball Grid Array Package (dBGA2)
Options
–2.7 Low-voltage (2.7V to 5.5V)
–1.8 Low-voltage (1.8V to 3.6V)
1116M–SEEPR–05/05
13

Packaging Information

8U4-1 — dBGA2
A1 BALL PAD CORNER
D
5.
b
E
A1
TOP VIEW
A1 BALL PAD CORNER
1
2
A
e
(e1)
B
C
D
SIDE VIEW
A2
A
d
(d1)
BOTTOM VIEW
8 SOLDER BALLS
5. Dimension 'b' is measured at the maximum solder ball diameter.
This drawing is for general information only.
1150 E. Cheyenne Mtn. Blvd.
R
Colorado Springs, CO 80906
TITLE
8U4-1, 8-ball, 2.47 x 4.07 mm Body, 0.75 mm pitch, Small Die Ball Grid Array Package (dBGA2)
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL
MIN
NOM
A 0.81 0.91 1.00 A
1
0.15 0.20 0.25
A
2
0.40 0.45 0.50 b 0.25 0.30 0.35 D 2.47 BSC E 4.07 BSC
e e1
0.75 BSC
0.74 REF d 0.75 BSC
d1
0.80 REF
DRAWING NO.
PO8U4-1
MAX
NOTE
1/5/05
REV.
A
14
AT24C512
1116M–SEEPR–05/05
8CN1 – LAP
AT24C512
Marked Pin1 Indentifier
E
A
D
A1
Top View
0.10 mm TYP
8
e
7
6
5
e1
L1
Bottom View
Note: 1. Metal Pad Dimensions.
2. All exposed metal area shall have the following finished platings. Ni: 0.0005 to 0.015 mm Au: 0.0005 to 0.001 mm
1150 E.Cheyenne Mtn Blvd. Colorado Springs, CO 80906
R
TITLE
8CN1, 8-lead (8 x 5 x 1.04 mm Body), Lead Pitch 1.27 mm,
Leadless Array Package (LAP)
Side View
Pin1 Corner
1
COMMON DIMENSIONS
2
SYMBOL
3
b
4
L
A 0.94 1.04 1.14
A1 0.30 0.34 0.38
b 0.36 0.41 0.46 1
D 7.90 8.00 8.10
E 4.90 5.00 5.10
e 1.27 BSC
e1 0.60 REF
L 0.62 .0.67 0.72 1
L1 0.92 0.97 1.02 1
(Unit of Measure = mm)
MIN
NOM
MAX
DRAWING NO.
8CN1
NOTE
11/8/04
REV.
B
1116M–SEEPR–05/05
15
8P3 – PDIP
D1
b3
4 PLCS
Top View
D
e
Side View
N
1
b
b2
A2 A
E
E1
c
eA
End View
COMMON DIMENSIONS
(Unit of Measure = inches)
SYMBOL
A
A2 0.115 0.130 0.195
b 0.014 0.018 0.022 5
b2 0.045 0.060 0.070 6
b3 0.030 0.039 0.045 6
c 0.008 0.010 0.014
D 0.355 0.365 0.400 3
L
D1 0.005
E 0.300 0.310 0.325 4
E1 0.240 0.250 0.280 3
e 0.100 BSC
eA 0.300 BSC 4
L 0.115 0.130 0.150 2
MIN
NOM
MAX
0.210 2
3
NOTE
Notes: 1. This drawing is for general information only; refer to JEDEC Drawing MS-001, Variation BA, for additional information.
2. Dimensions A and L are measured with the package seated in JEDEC seating plane Gauge GS-3.
3. D, D1 and E1 dimensions do not include mold Flash or protrusions. Mold Flash or protrusions shall not exceed 0.010 inch.
4. E and eA measured with the leads constrained to be perpendicu
5. Pointed or rounded lead tips are preferred to ease insertion.
6. b2 and b3 maximum dimensions do not include Dambar protrusions. Dambar protrusions shall not exceed 0.010 (0.25 mm).
TITLE
16
2325 Orchard Parkway
R
San Jose, CA 95131
AT24C512
8P3, 8-lead, 0.300" Wide Body, Plastic Dual In-line Package (PDIP)
lar to datum.
DRAWING NO.
8P3
01/09/02
REV.
B
1116M–SEEPR–05/05
8S2 – EIAJ SOIC
AT24C512
C
1
Top View
E
N
E1
L
End View
e
D
Side View
b
A
SYMBOL
A1
A 1.70 2.16
A1 0.05 0.25
b 0.35 0.48 5
C 0.15 0.35 5
D 5.13 5.35
E1 5.18 5.40 2, 3
E 7.70 8.26
L 0.51 0.85
e 1.27 BSC 4
COMMON DIMENSIONS
(Unit of Measure = mm)
MIN
8°
NOM
MAX
NOTE
Notes: 1. This drawing is for general information only; refer to EIAJ Drawing EDR-7320 for additional information.
2. Mismatch of the upper and lower dies and resin burrs are not included.
3. It is recommended that upper and lower cavities be equal. If they are different, the larger dimension shall be regarded.
4. Determines the true geometric position.
5. Values b and C apply to pb/Sn solder plated terminal. The standard thickness of the solder layer sha
2325 Orchard Parkway
R
San Jose, CA 95131
1116M–SEEPR–05/05
TITLE
8S2, 8-lead, 0.209" Body, Plastic Small Outline Package (EIAJ)
ll be 0.010 +0.010/0.005 mm.
DRAWING NO.
8S2
10/7/03
REV.
C
17
8S1 – JEDEC SOIC
C
1
E
N
E1
L
Top View
End View
e
D
Side View
B
A
SYMBOL
A1
A 1.35 – 1.75
A1 0.10 0.25
B 0.31 – 0.51
C 0.17 0.25
D 4.80 – 5.00
E1 3.81 – 3.99
E 5.79 6.20
e 1.27 BSC
L 0.40 1.27
0° –
COMMON DIMENSIONS
(Unit of Measure = mm)
MIN
NOM
MAX
NOTE
18
Note:
These drawings are for general information only. Refer to JEDEC Drawing MS-012, Variation AA for proper dimensions, tolerances, datums, etc.
1150 E. Cheyenne Mtn. Blvd. Colorado Springs, CO 80906
R
TITLE
8S1, 8-lead (0.150" Wide Body), Plastic Gull Wing Small Outline (JEDEC SOIC)
AT24C512
DRAWING NO.
8S1 B
1116M–SEEPR–05/05
10/7/03
REV.
8A2 – TSSOP
Pin 1 indicator
this corner
AT24C512
123
N
Top View
b
e
D
Side View
A2
E1
E
L1
L
End View
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL
A
D 2.90 3.00 3.10 2, 5
E 6.40 BSC
E1 4.30 4.40 4.50 3, 5
A 1.20
A2 0.80 1.00 1.05
b 0.19 0.30 4
e 0.65 BSC
L 0.45 0.60 0.75
L1 1.00 REF
MIN
NOM
MAX
NOTE
Notes: 1. This drawing is for general information only. Refer to JEDEC Drawing MO-153, Variation AA, for proper dimensions, tolerances,
1116M–SEEPR–05/05
datums, etc.
2. Dimension D does not include mold Flash, protrusions or gate burrs. Mold Flash, protrusions and gate burrs shall not exceed
0.15 mm (0.006 in) per side.
3. Dimension E1 does not include inter-lead Flash or protrusions. Inter-lead Flash and protrusions shall not exceed 0.25 mm (0.010 in) per side.
4. Dimension b does not include Dambar protrusion. Allowable Dambar protrusion shall be 0.08 mm total in excess of the b dimension at maximum material condition. Dambar cannot be located on the lower radius of the foot. Minimum space between protrusion and adjacent lead is 0.07 mm.
5. Dimension D and E1 to be determined at Datum Plane H.
2325 Orchard Parkway
R
San Jose, CA 95131
TITLE
8A2, 8-lead, 4.4 mm Body, Plastic
Thin Shrink Small Outline Package (TSSOP)
DRAWING NO.
8A2
5/30/02
REV.
B
19
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1116M–SEEPR–05/05
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