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Description
The AT24C512 provides 524,288 bits of serial electrically erasable and programmable
read only memory (EEPROM) organized as 65,536 words of 8 bits each. The device’s
cascadable feature allows up to four devices to share a common two-wire bus. The
device is optimized for use in many industrial and commercial applications where lowpower and low-voltage operation are essential. The devices are available in spacesaving 8-pin PDIP, 8-lead EIAJ SOIC, 8-lead JEDEC SOIC, 8-lead TSSOP, 8-lead
Leadless Array (LAP), and 8-lead SAP packages. In addition, the entire family is available in 2.7V (2.7V to 5.5V) and 1.8V (1.8V to 3.6V) versions.
Two-wire Serial
EEPROM
512K (65,536 x 8)
AT24C512
Table 1. Pin Configurations
Pin NameFunction
A0–A1Address Inputs
SDASerial Data
SCLSerial Clock Input
WPWrite Protect
NCNo Connect
8-ball dBGA2
1
8
VCC
7
WP
6
SCL
5
SDA
Bottom View
A0
2
A1
3
NC
4
GND
8-lead TSSOP
8
7
6
5
A0
A1
NC
GND
VCC
WP
SCL
SDA
A0
A1
NC
GND
1
2
3
4
8-lead Leadless Array
VCC
WP
SCL
SDA
8
7
6
5
A0
1
A1
2
NC
3
GND
4
Bottom View
GND
8-lead SOIC
1
2
3
4
8
7
6
5
VCC
SCL
SDA
8-lead PDIP
1
A0
2
A1
3
NC
4
VCC
WP
SCL
SDA
8-lead SAP
8
WP
7
6
5
Bottom View
8
VCC
7
WP
6
SCL
5
SDA
A0
1
A1
2
NC
3
GND
4
Rev. 1116M–SEEPR–05/05
1
Absolute Maximum Ratings*
Operating Temperature..................................–55°C to +125°C
Storage Temperature .....................................–65°C to +150°C
Voltage on Any Pin
with Respect to Ground ....................................–1.0V to +7.0V
Maximum Operating Voltage .......................................... 6.25V
DC Output Current........................................................ 5.0 mA
Figure 1. Block Diagram
*NOTICE:Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect device
reliability.
2
AT24C512
1116M–SEEPR–05/05
AT24C512
Pin DescriptionSERIAL CLOCK (SCL): The SCL input is used to positive edge clock data into each
EEPROM device and negative edge clock data out of each device.
SERIAL DATA (SDA): The SDA pin is bidirectional for serial data transfer. This pin is
open-drain driven and may be wire-ORed with any number of other open-drain or open
collector devices.
DEVICE/ADDRESSES (A1, A0): The A1 and A0 pins are device address inputs that are
hardwired or left not connected for hardware compatibility with other AT24Cxx devices.
When the pins are hardwired, as many as four 512K devices may be addressed on a
single bus system (device addressing is discussed in detail under the Device Address-ing section. If the pins are left floating, the A1 and A0 pins will be internally pulled down
to GND if the capacitive coupling to the circuit board V
>3 pF, Atmel recommends connecting the address pins to GND.
WRITE PROTECT (WP): The write protect input, when connected to GND, allows normal write operations. When WP is connected high to V
memory are inhibited. If the pin is left floating, the WP pin will be internally pulled down
to GND if the capacitive coupling to the circuit board V
>3 pF, Atmel recommends connecting the pin to GND. Switching WP to V
write operation creates a software write protect function.
plane is <3 pF. If coupling is
CC
, all write operations to the
CC
plane is <3 pF. If coupling is
CC
prior to a
CC
Memory Organization AT24C512, 512K SERIAL EEPROM: The 512K is internally organized as 512 pages of
128-bytes each. Random word addressing requires a 16-bit data word address.
1116M–SEEPR–05/05
3
Table 2. Pin Capacitance
(1)
Applicable over recommended operating range from TA = 25°C, f = 1.0 MHz, VCC = +1.8V
SymbolTest ConditionMaxUnitsConditions
C
I/O
C
IN
Input/Output Capacitance (SDA)8pFV
Input Capacitance (A0, A1, SCL)6pFVIN = 0V
I/O
= 0V
Note:1. This parameter is characterized and is not 100% tested.
Table 3. DC Characteristics
Applicable over recommended operating range from: T
V
= +1.8V to +5.5V (unless otherwise noted)
CC
SymbolParameterTest ConditionMinTypMaxUnits
V
CC1
V
CC2
V
CC3
I
CC1
I
CC2
I
SB1
I
SB2
I
SB3
I
LI
I
LO
V
IL
V
IH
V
OL2
V
OL1
Note:1. V
Supply Voltage1.83.6V
Supply Voltage2.75.5V
Supply Voltage4.55.5V
Supply CurrentVCC = 5.0VREAD at 400 kHz1.02.0mA
Supply CurrentVCC = 5.0VWRITE at 400 kHz2.03.0mA
= 1.8V
V
Standby Current
(1.8V option)
Standby Current
(2.7V option)
Standby Current
(5.0V option)
Input Leakage CurrentVIN = V
Output Leakage
Current
Input Low Level
Input High Level
(1)
(1)
CC
= 3.6V3.0
V
CC
= 2.7V
V
CC
= 5.5V6.0
V
CC
= 4.5 - 5.5VVIN = VCC or V
V
CC
CC or VSS
= V
V
OUT
CC or VSS
Output Low LevelVCC = 3.0VIOL = 2.1 mA0.4V
Output Low LevelVCC = 1.8VIOL = 0.15 mA0.2V
min and VIH max are reference only and are not tested.
IL
= –40°C to +85°C, VCC = +1.8V to +5.5V, TAC = 0°C to +70°C,
AI
1.0µA
= VCC or V
V
IN
SS
2.0µA
VIN = VCC or V
SS
SS
6.0µA
0.103.0µA
0.053.0µA
–0.6VCC x 0.3V
VCC x 0.7VCC + 0.5V
4
AT24C512
1116M–SEEPR–05/05
Table 4. AC Characteristics
Applicable over recommended operating range from T
erwise noted) Test conditions are listed in Note 2.
SymbolParameter
f
SCL
t
LOW
t
HIGH
t
AA
t
BUF
t
HD.STA
t
SU.STA
t
HD.DAT
t
SU.DAT
t
R
t
F
t
SU.STO
t
DH
t
WR
Endurance
Clock Frequency, SCL1004001000kHz
Clock Pulse Width Low4.71.30.4µs
Clock Pulse Width High4.01.00.4µs
Clock Low to Data Out Valid0.14.50.050.90.050.55µs
Time the bus must be free before a
new transmission can start
(1)
Start Hold Time4.00.60.25µs
Start Set-up Time4.70.60.25µs
Data In Hold Time000µs
Data In Set-up Time200100100ns
Inputs Rise Time
Inputs Fall Time
(1)
(1)
Stop Set-up Time4.70.60.25µs
Data Out Hold Time1005050ns
Write Cycle Time20 or 5
(1)
5.0V, 25°C, Page Mode100K100K100KWrite Cycles
AT24C512
= –40°C to +85°C, VCC = +1.8V to +5.5V, CL = 100 pF (unless oth-
A
1.8 Volt 2.7 Volt5.0 Volt
UnitsMinMaxMinMaxMinMax
4.71.30.5µs
1.00.30.3µs
300300100ns
(3)
10 or 5
(3)
10 or 5
(3)
ms
Notes: 1. This parameter is characterized and is not 100% tested.
2. AC measurement conditions:
(connects to VCC): 1.3 kΩ (2.7V, 5V), 10 kΩ (1.8V)
R
L
Input pulse voltages: 0.3VCC to 0.7V
CC
Input rise and fall times: ≤50 ns
Input and output timing reference voltages: 0.5V
CC
3. The Write Cycle Time of 5 ms only applies to the AT24C512 devices bearing the process letter “A” on the package (the mark
is located in the lower right corner on the top side of the package).
1116M–SEEPR–05/05
5
Device OperationCLOCK and DATA TRANSITIONS: The SDA pin is normally pulled high with an exter-
nal device. Data on the SDA pin may change only during SCL low time periods (see
Figure 4 on page 7). Data changes during SCL high periods will indicate a start or stop
condition as defined below.
START CONDITION: A high-to-low transition of SDA with SCL high is a start condition
which must precede any other command (see Figure 5 on page 8).
STOP CONDITION: A low-to-high transition of SDA with SCL high is a stop condition.
After a read sequence, the stop command will place the EEPROM in a standby power
mode (see Figure 5 on page 8).
ACKNOWLEDGE: All addresses and data words are serially transmitted to and from the
EEPROM in 8-bit words. The EEPROM sends a zero during the ninth clock cycle to
acknowledge that it has received each word.
STANDBY MODE: The AT24C512 features a low power standby mode which is
enabled: a) upon power-up and b) after the receipt of the STOP bit and the completion
of any internal operations.
MEMORY RESET: After an interruption in protocol, power loss or system reset, any twowire part can be reset by following these steps:
(a) Clock up to 9 cycles, (b) look for SDA high in each cycle while SCL is high and then
(c) create a start condition as SDA is high.
6
AT24C512
1116M–SEEPR–05/05
Figure 2. Bus Timing (SCL: Serial Clock, SDA: Serial Data I/O)
Figure 3. Write Cycle Timing (SCL: Serial Clock, SDA: Serial Data I/O)
SCL
AT24C512
SDA
WORDn
Note:1. The write cycle time tWR is the time from a valid stop condition of a write sequence to the end of the internal clear/write cycle.
8th BIT
ACK
STOP
CONDITION
(1)
t
wr
START
CONDITION
Figure 4. Data Validity
1116M–SEEPR–05/05
7
Figure 5. Start and Stop Definition
Figure 6. Output Acknowledge
8
AT24C512
1116M–SEEPR–05/05
AT24C512
Device AddressingThe 512K EEPROM requires an 8-bit device address word following a start condition to
enable the chip for a read or write operation (see Figure 7 on page 10). The device
address word consists of a mandatory “1”, “0” sequence for the first five most significant
bits as shown. This is common to all two-wire EEPROM devices.
The 512K uses the two device address bits A1, A0 to allow as many as four devices on
the same bus. These bits must compare to their corresponding hardwired input pins.
The A1 and A0 pins use an internal proprietary circuit that biases them to a logic low
condition if the pins are allowed to float.
The eighth bit of the device address is the read/write operation select bit. A read operation is initiated if this bit is high and a write operation is initiated if this bit is low.
Upon a compare of the device address, the EEPROM will output a “0”. If a compare is
not made, the device will return to a standby state.
DATA SECURITY: The AT24C512 has a hardware data protection scheme that allows
the user to Write Protect the whole memory when the WP pin is at V
Write OperationsBYTE WRITE: A write operation requires two 8-bit data word addresses following the
device address word and acknowledgment. Upon receipt of this address, the EEPROM
will again respond with a “0” and then clock in the first 8-bit data word. Following receipt
of the 8-bit data word, the EEPROM will output a “0”. The addressing device, such as a
microcontroller, then must terminate the write sequence with a stop condition. At this
time the EEPROM enters an internally-timed write cycle, t
All inputs are disabled during this write cycle and the EEPROM will not respond until the
write is complete (see Figure 8 on page 11).
, to the nonvolatile memory.
WR
CC
.
PAGE WRITE: The 512K EEPROM is capable of 128-byte page writes.
A page write is initiated the same way as a byte write, but the microcontroller does not
send a stop condition after the first data word is clocked in. Instead, after the EEPROM
acknowledges receipt of the first data word, the microcontroller can transmit up to 127
more data words. The EEPROM will respond with a “0” after each data word received.
The microcontroller must terminate the page write sequence with a stop condition (see
Figure 9 on page 11).
The data word address lower 7 bits are internally incremented following the receipt of
each data word. The higher data word address bits are not incremented, retaining the
memory page row location. When the word address, internally generated, reaches the
page boundary, the following byte is placed at the beginning of the same page. If more
than 128 data words are transmitted to the EEPROM, the data word address will “roll
over” and previous data will be overwritten. The address roll over during write is from the
last byte of the current page to the first byte of the same page.
ACKNOWLEDGE POLLING: Once the internally-timed write cycle has started and the
EEPROM inputs are disabled, acknowledge polling can be initiated. This involves sending a start condition followed by the device address word. The Read/Write bit is
representative of the operation desired. Only if the internal write cycle has completed
will the EEPROM respond with a “0”, allowing the read or write sequence to continue.
1116M–SEEPR–05/05
9
Read OperationsRead operations are initiated the same way as write operations with the exception that
the Read/Write select bit in the device address word is set to “1”. There are three read
operations: current address read, random address read and sequential read.
CURRENT ADDRESS READ: The internal data word address counter maintains the
last address accessed during the last read or write operation, incremented by “1”. This
address stays valid between operations as long as the chip power is maintained. The
address roll over during read is from the last byte of the last memory page, to the first
byte of the first page.
Once the device address with the Read/Write select bit set to “1” is clocked in and
acknowledged by the EEPROM, the current address data word is serially clocked out.
The microcontroller does not respond with an input “0” but does generate a following
stop condition (see Figure 10 on page 11).
RANDOM READ: A random read requires a “dummy” byte write sequence to load in the
data word address. Once the device address word and data word address are clocked
in and acknowledged by the EEPROM, the microcontroller must generate another start
condition. The microcontroller now initiates a current address read by sending a device
address with the Read/Write select bit high. The EEPROM acknowledges the device
address and serially clocks out the data word. The microcontroller does not respond
with a “0” but does generate a following stop condition (see Figure 11 on page 11).
SEQUENTIAL READ: Sequential reads are initiated by either a current address read or
a random address read. After the microcontroller receives a data word, it responds with
an acknowledge. As long as the EEPROM receives an acknowledge, it will continue to
increment the data word address and serially clock out sequential data words. When the
memory address limit is reached, the data word address will roll over and the sequential
read will continue. The sequential read operation is terminated when the microcontroller
does not respond with a “0” but does generate a following stop condition (see Figure 12
on page 12).
Notes: 1. This drawing is for general information only. Refer to JEDEC Drawing MO-153, Variation AA, for proper dimensions, tolerances,
1116M–SEEPR–05/05
datums, etc.
2. Dimension D does not include mold Flash, protrusions or gate burrs. Mold Flash, protrusions and gate burrs shall not exceed
0.15 mm (0.006 in) per side.
3. Dimension E1 does not include inter-lead Flash or protrusions. Inter-lead Flash and protrusions shall not exceed 0.25 mm
(0.010 in) per side.
4. Dimension b does not include Dambar protrusion. Allowable Dambar protrusion shall be 0.08 mm total in excess of the
b dimension at maximum material condition. Dambar cannot be located on the lower radius of the foot. Minimum space between
protrusion and adjacent lead is 0.07 mm.
5. Dimension D and E1 to be determined at Datum Plane H.
2325 Orchard Parkway
R
San Jose, CA 95131
TITLE
8A2, 8-lead, 4.4 mm Body, Plastic
Thin Shrink Small Outline Package (TSSOP)
DRAWING NO.
8A2
5/30/02
REV.
B
19
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