• Die Sales: Wafer Form, Waffle Pack and Bumped Die
Description
The AT24C512 provides 524,288 bits of serial electrically erasable and programmable
read only memory (EEPROM) organized as 65,536 words of 8 bits each. The device’s
cascadable feature allows up to four devices to share a common two-wire bus. The
device is optimized for use in many industrial and commercial applications where lowpower and low-voltage operation are essential. The devices are available in spacesaving 8-pin PDIP, 8-lead EIAJ SOIC, 8-lead JEDEC SOIC, 8-lead TSSOP, 8-lead
Leadless Array (LAP), and 8-lead SAP packages. In addition, the entire family is available in 2.7V (2.7V to 5.5V) and 1.8V (1.8V to 3.6V) versions.
Two-wire Serial
EEPROM
512K (65,536 x 8)
AT24C512
Table 1. Pin Configurations
Pin NameFunction
A0–A1Address Inputs
SDASerial Data
SCLSerial Clock Input
WPWrite Protect
NCNo Connect
8-ball dBGA2
1
8
VCC
7
WP
6
SCL
5
SDA
Bottom View
A0
2
A1
3
NC
4
GND
8-lead TSSOP
8
7
6
5
A0
A1
NC
GND
VCC
WP
SCL
SDA
A0
A1
NC
GND
1
2
3
4
8-lead Leadless Array
VCC
WP
SCL
SDA
8
7
6
5
A0
1
A1
2
NC
3
GND
4
Bottom View
GND
8-lead SOIC
1
2
3
4
8
7
6
5
VCC
SCL
SDA
8-lead PDIP
1
A0
2
A1
3
NC
4
VCC
WP
SCL
SDA
8-lead SAP
8
WP
7
6
5
Bottom View
8
VCC
7
WP
6
SCL
5
SDA
A0
1
A1
2
NC
3
GND
4
Rev. 1116M–SEEPR–05/05
1
Absolute Maximum Ratings*
Operating Temperature..................................–55°C to +125°C
Storage Temperature .....................................–65°C to +150°C
Voltage on Any Pin
with Respect to Ground ....................................–1.0V to +7.0V
Maximum Operating Voltage .......................................... 6.25V
DC Output Current........................................................ 5.0 mA
Figure 1. Block Diagram
*NOTICE:Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect device
reliability.
2
AT24C512
1116M–SEEPR–05/05
AT24C512
Pin DescriptionSERIAL CLOCK (SCL): The SCL input is used to positive edge clock data into each
EEPROM device and negative edge clock data out of each device.
SERIAL DATA (SDA): The SDA pin is bidirectional for serial data transfer. This pin is
open-drain driven and may be wire-ORed with any number of other open-drain or open
collector devices.
DEVICE/ADDRESSES (A1, A0): The A1 and A0 pins are device address inputs that are
hardwired or left not connected for hardware compatibility with other AT24Cxx devices.
When the pins are hardwired, as many as four 512K devices may be addressed on a
single bus system (device addressing is discussed in detail under the Device Address-ing section. If the pins are left floating, the A1 and A0 pins will be internally pulled down
to GND if the capacitive coupling to the circuit board V
>3 pF, Atmel recommends connecting the address pins to GND.
WRITE PROTECT (WP): The write protect input, when connected to GND, allows normal write operations. When WP is connected high to V
memory are inhibited. If the pin is left floating, the WP pin will be internally pulled down
to GND if the capacitive coupling to the circuit board V
>3 pF, Atmel recommends connecting the pin to GND. Switching WP to V
write operation creates a software write protect function.
plane is <3 pF. If coupling is
CC
, all write operations to the
CC
plane is <3 pF. If coupling is
CC
prior to a
CC
Memory Organization AT24C512, 512K SERIAL EEPROM: The 512K is internally organized as 512 pages of
128-bytes each. Random word addressing requires a 16-bit data word address.
1116M–SEEPR–05/05
3
Table 2. Pin Capacitance
(1)
Applicable over recommended operating range from TA = 25°C, f = 1.0 MHz, VCC = +1.8V
SymbolTest ConditionMaxUnitsConditions
C
I/O
C
IN
Input/Output Capacitance (SDA)8pFV
Input Capacitance (A0, A1, SCL)6pFVIN = 0V
I/O
= 0V
Note:1. This parameter is characterized and is not 100% tested.
Table 3. DC Characteristics
Applicable over recommended operating range from: T
V
= +1.8V to +5.5V (unless otherwise noted)
CC
SymbolParameterTest ConditionMinTypMaxUnits
V
CC1
V
CC2
V
CC3
I
CC1
I
CC2
I
SB1
I
SB2
I
SB3
I
LI
I
LO
V
IL
V
IH
V
OL2
V
OL1
Note:1. V
Supply Voltage1.83.6V
Supply Voltage2.75.5V
Supply Voltage4.55.5V
Supply CurrentVCC = 5.0VREAD at 400 kHz1.02.0mA
Supply CurrentVCC = 5.0VWRITE at 400 kHz2.03.0mA
= 1.8V
V
Standby Current
(1.8V option)
Standby Current
(2.7V option)
Standby Current
(5.0V option)
Input Leakage CurrentVIN = V
Output Leakage
Current
Input Low Level
Input High Level
(1)
(1)
CC
= 3.6V3.0
V
CC
= 2.7V
V
CC
= 5.5V6.0
V
CC
= 4.5 - 5.5VVIN = VCC or V
V
CC
CC or VSS
= V
V
OUT
CC or VSS
Output Low LevelVCC = 3.0VIOL = 2.1 mA0.4V
Output Low LevelVCC = 1.8VIOL = 0.15 mA0.2V
min and VIH max are reference only and are not tested.
IL
= –40°C to +85°C, VCC = +1.8V to +5.5V, TAC = 0°C to +70°C,
AI
1.0µA
= VCC or V
V
IN
SS
2.0µA
VIN = VCC or V
SS
SS
6.0µA
0.103.0µA
0.053.0µA
–0.6VCC x 0.3V
VCC x 0.7VCC + 0.5V
4
AT24C512
1116M–SEEPR–05/05
Table 4. AC Characteristics
Applicable over recommended operating range from T
erwise noted) Test conditions are listed in Note 2.
SymbolParameter
f
SCL
t
LOW
t
HIGH
t
AA
t
BUF
t
HD.STA
t
SU.STA
t
HD.DAT
t
SU.DAT
t
R
t
F
t
SU.STO
t
DH
t
WR
Endurance
Clock Frequency, SCL1004001000kHz
Clock Pulse Width Low4.71.30.4µs
Clock Pulse Width High4.01.00.4µs
Clock Low to Data Out Valid0.14.50.050.90.050.55µs
Time the bus must be free before a
new transmission can start
(1)
Start Hold Time4.00.60.25µs
Start Set-up Time4.70.60.25µs
Data In Hold Time000µs
Data In Set-up Time200100100ns
Inputs Rise Time
Inputs Fall Time
(1)
(1)
Stop Set-up Time4.70.60.25µs
Data Out Hold Time1005050ns
Write Cycle Time20 or 5
(1)
5.0V, 25°C, Page Mode100K100K100KWrite Cycles
AT24C512
= –40°C to +85°C, VCC = +1.8V to +5.5V, CL = 100 pF (unless oth-
A
1.8 Volt 2.7 Volt5.0 Volt
UnitsMinMaxMinMaxMinMax
4.71.30.5µs
1.00.30.3µs
300300100ns
(3)
10 or 5
(3)
10 or 5
(3)
ms
Notes: 1. This parameter is characterized and is not 100% tested.
2. AC measurement conditions:
(connects to VCC): 1.3 kΩ (2.7V, 5V), 10 kΩ (1.8V)
R
L
Input pulse voltages: 0.3VCC to 0.7V
CC
Input rise and fall times: ≤50 ns
Input and output timing reference voltages: 0.5V
CC
3. The Write Cycle Time of 5 ms only applies to the AT24C512 devices bearing the process letter “A” on the package (the mark
is located in the lower right corner on the top side of the package).
1116M–SEEPR–05/05
5
Device OperationCLOCK and DATA TRANSITIONS: The SDA pin is normally pulled high with an exter-
nal device. Data on the SDA pin may change only during SCL low time periods (see
Figure 4 on page 7). Data changes during SCL high periods will indicate a start or stop
condition as defined below.
START CONDITION: A high-to-low transition of SDA with SCL high is a start condition
which must precede any other command (see Figure 5 on page 8).
STOP CONDITION: A low-to-high transition of SDA with SCL high is a stop condition.
After a read sequence, the stop command will place the EEPROM in a standby power
mode (see Figure 5 on page 8).
ACKNOWLEDGE: All addresses and data words are serially transmitted to and from the
EEPROM in 8-bit words. The EEPROM sends a zero during the ninth clock cycle to
acknowledge that it has received each word.
STANDBY MODE: The AT24C512 features a low power standby mode which is
enabled: a) upon power-up and b) after the receipt of the STOP bit and the completion
of any internal operations.
MEMORY RESET: After an interruption in protocol, power loss or system reset, any twowire part can be reset by following these steps:
(a) Clock up to 9 cycles, (b) look for SDA high in each cycle while SCL is high and then
(c) create a start condition as SDA is high.
6
AT24C512
1116M–SEEPR–05/05
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