Package (SAP), 8-lead TSSOP, and 8-ball dBGA2 Packages
• Die Sales: Wafer Form, Waffle Pack and Bumped Wafers
= 1.8V to 5.5V)
CC
Two-wire Serial
EEPROM
256K (32,768 x 8)
AT24C256B
Description
The AT24C256B provides 262,144 bits of serial electrically erasable and programmable read-only memory (EEPROM) organized as 32,768 words of 8 bits each. The
device’s cascadable feature allows up to eight devices to share a common two-wire
bus. The device is optimized for use in many industrial and commercial applications
where low-power and low-voltage operation are essential. The devices are available
in space-saving 8-lead JEDEC PDIP, 8-lead JEDEC SOIC, 8-lead Ultra Thin SAP, 8lead TSSOP, and 8-ball dBGA2 packages. In addition, the entire family is available in
a 1.8V (1.8V to 5.5V) version.
Pin Configurations
Pin NameFunction
A0–A2Address Inputs
SDASerial Data
SCLSerial Clock Input
WPWrite Protect
GNDGround
GND
A0
A1
A2
VCC
SDA
WP
SCL
8-lead PDIP
1
2
3
4
8-lead dBGA2
8
7
6
5
8-lead SOIC
1
GND
A0
A1
A2
GND
A0
A1
A2
2
3
4
8-lead TSSOP
1
2
3
4
8
VCC
7
WP
6
SCL
5
SDA
1
A0
2
A1
3
A2
4
GND
8
7
6
5
8
VCC
7
WP
6
SCL
5
SDA
Not
Recommended
for New Design
VCC
WP
SCL
SDA
Bottom View
8-lead Ultra Thin SAP
VCC
8
WP
7
SCL
6
SDA
5
Bottom View
1
A0
2
A1
3
A2
4
GND
Rev. 5279C–SEEPR–3/09
1.Absolute Maximum Ratings*
Operating Temperature 55C to +125C
Storage Temperature 65C to +150C
Voltage on Any Pin
with Respect to Ground 1.0V to +7.0V
Maximum Operating Voltage .......................................... 6.25V
DC Output Current........................................................ 5.0 mA
Figure 1-1.Block Diagram
VCC
GND
WP
SCL
SDA
A
A
A
2
1
0
START
STOP
LOGIC
LOAD
DEVICE
ADDRESS
COMPARATOR
R/W
*NOTICE:Stresses beyond those listed under “Absolute
SERIAL
CONTROL
LOGIC
COMP
LOAD
DATA W OR D
ADDR/COUNTER
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only;
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect device
reliability.
EN
H.V. PUMP/TIMING
DATA RECOVERY
INC
EEPROM
X DEC
Y DEC
D
IN
D
OUT
2
AT24C256B
SERIAL MUX
D
/ACK
OUT
LOGIC
5279C–SEEPR–3/09
2.Pin Description
SERIAL CLOCK (SCL): The SCL input is used to positive-edge clock data into each EEPROM
device and negative-edge clock data out of each device.
SERIAL DATA (SDA): The SDA pin is bidirectional for serial data transfer. This pin is opendrain driven and may be wire-ORed with any number of other open-drain or open-collector
devices.
DEVICE/PAGE ADDRESSES (A2, A1, A0): The A2, A1, and A0 pins are device address inputs
that are hardwired (directly to GND or to Vcc) for compatibility with other AT24Cxx devices.
When the pins are hardwired, as many as eight 256K devices may be addressed on a single bus
system. (Device addressing is discussed in detail under “Device Addressing,” page 9.) A device
is selected when a corresponding hardware and software match is true. If these pins are left
floating, the A2, A1, and A0 pins will be internally pulled down to GND. However, due to capacitive coupling that may appear during customer applications, Atmel recommends always
connecting the address pins to a known state. When using a pull-up resistor, Atmel recommends
using 10k or less.
WRITE PROTECT (WP): The write protect input, when connected to GND, allows normal write
operations. When WP is connected directly to Vcc, all write operations to the memory are inhibited. If the pin is left floating, the WP pin will be internally pulled down to GND. However, due to
capacitive coupling that may appear during customer applications, Atmel recommends always
connecting the WP pins to a known state. When using a pull-up resistor, Atmel recommends
using 10k or less.
AT24C256B
3.Memory Organization
AT24C256B, 256K SERIAL EEPROM: The 256K is internally organized as 512 pages of 64
bytes each. Random word addressing requires a 15-bit data word address.
Table 3-1.Pin Capacitance
Applicable over recommended operating range from TA=25C, f = 1.0 MHz, VCC= +1.8V
SymbolTest ConditionMaxUnitsConditions
C
I/O
C
IN
Note:1. This parameter is characterized and is not 100% tested.
Input/Output Capacitance (SDA)8pFV
Input Capacitance (A0,A1, SCL)6pFVIN=0V
(1)
I/O
=0V
5279C–SEEPR–3/09
3
Table 3-2.DC Characteristics
Applicable over recommended operating range from: T
SymbolParameterTest ConditionMinTypMaxUnits
V
CC1
I
CC1
I
CC2
I
SB1
I
LI
I
LO
V
IL
V
IH
V
OL2
V
OL1
Notes: 1. VILmin and VIHmax are reference only and are not tested.
Supply Voltage1.85.5V
Supply CurrentVCC= 5.0VREAD at 400 kHz1.02.0mA
Supply CurrentVCC= 5.0VWRITE at 400 kHz2.03.0mA
V
= 1.8V
Standby Current
(1.8V option)
Input Leakage
Current V
CC
= 5.0V
Output Leakage
Current V
CC
= 5.0V
Input Low Level
Input High Level
(1)
(1)
CC
= 5.5V6.0µA
V
CC
V
IN=VCC
V
OUT=VCC
or V
or V
Output Low LevelVCC= 3.0VIOL= 2.1 mA0.4V
Output Low LevelVCC= 1.8VIOL= 0.15 mA0.2V
= 40Cto+85C, VCC= +1.8V to +5.5V (unless otherwise noted)
AI
1.0µA
SS
SS
V
IN=VCC
or V
SS
0.103.0µA
0.053.0µA
0.6VCCx 0.3V
VCCx 0.7VCC+ 0.5V
4
AT24C256B
5279C–SEEPR–3/09
Table 3-3.AC Characteristics (Industrial Temperature)
Applicable over recommended operating range from T
= 40C to +85C, VCC= +1.8V to +5.5V, CL = 100 pF (unless oth-
AI
erwise noted). Test conditions are listed in Note 2.
AT24C256B
1.8-volt2.5, 5.0-volt
SymbolParameter
f
SCL
t
LOW
t
HIGH
t
i
t
AA
t
BUF
t
HD.STA
t
SU.STA
t
HD.DAT
t
SU.DAT
t
R
t
F
t
SU.STO
t
DH
t
WR
Endurance
Clock Frequency, SCL4001000kHz
Clock Pulse Width Low1.30.4µs
Clock Pulse Width High0.60.4µs
Noise Suppression Time
(1)
10050ns
Clock Low to Data Out Valid0.050.90.050.55µs
Time the bus must be free before a
new transmission can start
(1)
1.30.5µs
Start Hold Time0.60.25µs
Start Set-up Time0.60.25µs
Data In Hold Time00µs
Data In Set-up Time100100ns
(1)
(1)
0.30.3µs
300100ns
Inputs Rise Time
Inputs Fall Time
Stop Set-up Time0.60.25µs
Data Out Hold Time5050ns
Write Cycle Time55ms
(1)
25°C, Page Mode, 3.3V1,000,000
Notes: 1. This parameter is ensured by characterization and is not 100% tested.
2. AC measurement conditions:
(connects to VCC): 1.3 k (2.5V, 5.5V), 10 k (1.8V)
R
L
Input pulse voltages: 0.3 V
CC
to 0.7 V
CC
Input rise and fall times: 50 ns
Input and output timing reference voltages: 0.5 V
CC
UnitsMinMaxMinMax
Write
Cycles
5279C–SEEPR–3/09
5
4.Device Operation
CLOCK and DATA TRANSITIONS: The SDA pin is normally pulled high with an external device.
Data on the SDA pin may change only during SCL low time periods (see Figure 4-1). Data
changes during SCL high periods will indicate a start or stop condition as defined below.
Figure 4-1.Data Validity
START CONDITION: A high-to-low transition of SDA with SCL high is a start condition that must
precede any other command (see Figure 4-2).
Figure 4-2.Start and Stop Definition
SDA
SCL
DATA STABLEDATA STABLE
DATA
CHANGE
SDA
SCL
STARTSTOP
STOP CONDITION: A low-to-high transition of SDA with SCL high is a stop condition. After a
read sequence, the stop command will place the EEPROM in a standby power mode (see Fig-
ure 4-2).
ACKNOWLEDGE: All addresses and data words are serially transmitted to and from the
EEPROM in 8-bit words. The EEPROM sends a “0” during the ninth clock cycle to acknowledge
that it has received each word.
STANDBY MODE: The AT24C256B features a low-power standby mode that is enabled upon
power-up and after the receipt of the stop bit and the completion of any internal operations.
6
AT24C256B
5279C–SEEPR–3/09
SOFTWARE RESET: After an interruption in protocol, power loss or system reset, any 2-wire
part can be protocol reset by following these steps: (a) Create a start bit condition, (b) clock 9
cycles, (c) create another start bit followed by stop bit condition as shown below. The device is
ready for next communication after above steps have been completed.
Figure 4-3.Software Reset
Start bit
AT24C256B
Stop bitStart bitDummy Clock Cycles
SCL
SDA
Figure 4-4.Bus Timing
SCL
t
SU.STA
SDA IN
SDA OUT
12389
t
HIGH
t
LOW
t
HD.DAT
t
AA
t
SU.DAT
t
DH
t
HD.STA
t
F
t
LOW
t
R
t
SU.STO
t
BUF
Figure 4-5.Write Cycle Timing
SCL
DA
8th BIT
WORDn
Note:1. The write cycle time tWRis the time from a valid stop condition of a write sequence to the end of the internal clear/write cycle.
5279C–SEEPR–3/09
ACK
STOP
CONDITION
(1)
t
wr
START
CONDITION
7
Figure 4-6.Output Acknowledge
SCL
DATA IN
DATA OUT
1
STARTACKNOWLEDGE
8
9
8
AT24C256B
5279C–SEEPR–3/09
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