Versatile Platform Combines Features of Data Generator, Pulse
Generator, and DC Source
Up to 3.35 Gb/s Data Ra te
From 1 to 96 D ata Channels (Master/Slave)
Class Leading Delay Resolution of 0.2 ps (DTG5274/DTG5334), 1 ps
(DTG5078), up to 600 ns of Total Delay
Modular Architecture Helps to Protect Your Investment and Allows the
Instrument to Expand With Your Growing Needs
Advanced Control Over Signal Parameters to Meet Most Current Testing
Needs, Including Stressed Eye Generation
External Jitter Injection (DTGM31, DTGM32 Modules)
Level Control with 5 mV Resolution
Easy to Use and Learn, Shortens Time to Test
Easily Configure with Plug-in Modules
Intuitive Windows User Inte rface
Benchtop Form Factor
Integrated PC Supports Network Integration and Built-in CD-ROM,
LAN, Floppy Drive, USB Ports
Up to 64 Mb Pattern Depth Per Channel for Complex Data Patterns
Semiconduct
Support for Semiconductor Technologies from TTL to LVDS
Initial Verification and Debugging, Comprehensive Characterization,
Manufacturing, and Quality C ontrol
Compliance and Interoperability Testing to Emerging Standards
PCI-Express Gen1:2.5 Gbps
Serial ATA Gen1/2:1.5 Gbps/3 Gbps
InfiniBand 2.5 Gbps
XAUI: 3.125
HDMI: Version 1.3 / DVI
Magnetic an
Research, Development, and Test of Next-generation Devices (HDD,
DC/DVD, Blu-ray)
Data Conversion Device Design
Characterization and Test of Next-generation D/A Convertors
Imaging Sensor Device Design
Characterization and Functional Testing of Next-generation Imaging
Devices (CCD/CMOS)
Jitter Transfer and Jitter Tolerance Testing
New serial data standards, expanding networks, and ubiquito us computing
continually redefine the cutting edge of technology. The design engineer is
challenged to economize without sacrificing performance.
The DTG5000 Series combines the power of a data generator with the
capabilities of a pulse generator in a versatile, b enchtop form factor,
shortening the duration of complex test procedures and simplifying the
generation of low-jitter, high-accuracy clock signals, parallel or serial
data acro
easily configure the performance of the instrument to your existing and
emerging needs to minimize equipment costs. Three mainframes and five
plug-in output m odules combine to cover a rang e of applications from
legacy devices to the latest technologies. In addition, eight low-current,
independently-controlled DC outputs can substitute for external power
supplies
and output channels to easily integrate with other instruments, such as
oscilloscopes and logic analyzers, to create a flexible and powerful lab.
or Device Functional Test and Characterization
Gbps
d Optical Storage Design
ss multiple channels. Its modular platform allows you to
. Each mainframe incorporates a full compliment of auxiliary input
Data Sheet
Characteristics
Mainframe Characteristics
Basic Features
Platform – Benchtop mainframe with cold-swappable plug-and-play plug-in output
modules. Mainframes accept any combination of output modules.
DTG5078: Up to three DTG5078 mainframes can be connected in Master-Slave
configuration.
DTG5274: Up to two DTG5274 mainframes can be connected in Master-Slave
configuration.
DTG5334: Up to two DTG5334 mainframes can be connected in Master-Slave
configuration.
Operating Modes –
Pulse Generator Mode (slots A to D only).
Data Generator Mode.
1 to 8,000 steps for main sequence.
1 to 256 steps for subsequence.
Max. Number of Blocks – 8,000.
Max. Number of Subsequences – 50.
Repeat Counter – 1 to 65,536 or infinite.
Channel Addition – AND or XOR (slots A to D only).
Note: DTG5078 slots E, F, G, and H do not support the following: RZ, R1, pulse
,
generation modes which includes controls for trail delay/duty cycle/pulse width,
channel addition, and variable cross-points.
Auxiliary Channels
Clock Out
Connector –
Complementary output (common offset and ground).
DTG5078/5274: SMA rear panel.
DTG5334: SMA front panel.
Frequency Range –
DTG5078: 50 kHz to 750 MHz.
DTG5274: 50 kHz to 2.7 GHz.
DTG5334: : 50 kHz to 3.35 GHz, settable up to 3.4 GHz.