Atec 3255B User Manual

Technical data sheet

Inductance Analyzers - 3255BL 3255B and 3255BQ

• Frequency ranges from 20 Hz to 1 MHz

• Fast measurement speed - up to 20

measurements per second

• 0.1% basic accuracy

• Up to 125 A of DC bias current

• Comprehensive measurement functions

• Straightforward intuitive operation

• Print test results

• GPIB control with LabVIEW™ driver

Completely characterize components with
comprehensive parametric tests

The 3255B range of inductance analyzers are able to
accurately characterise devices in a clear and simple manner.
The inductance analyzers are available in three versions
3255BL (200kHz), 3255B (500kHz) and 3255BQ (1 MHz).

At the design stage of component development it is very
important to analyse how components performs under
different operating conditions. This includes operation over a
range of frequencies, AC drive levels or DC bias currents.

The AC drive level can be set between 1 mV and 10 V. DC
bias current can be set from 1 mA to 1 A internally (optional).
Using the external 3265B range of DC Bias Units bias
currents can be set to a maximum of 125 A.

Specification summary

Measurement functions Z, Ø, L, C, Rac, Rdc, Q, D,

turns ratio

Frequency ranges 20 Hz to 200kHz (3255BL)

20 Hz to 500 kHz (3255B)

20 Hz to 1 MHz (3255BQ)

Basic accuracy 0.1%

Modes Impedance

Multi frequency
Bin handler (optional)

DC bias current 1 mA to 1 A - internal (optional)

Interface GPIB (option)
Measurement speed Up to 20 measurements/sec

Printed output of test results

Using the parallel Centronics interface the user can
directly print all test results for further analysis and
archiving.

In addition, via the optional GPIB interface, the instrument
can be controlled from a PC and results can be read back
for analysis and storage.

LabVIEW™ drivers are available on request or can be
downloaded from the web site, www.waynekerrtest.com,
providing a base from which a user can develop a specific
test application.

www.waynekerrtest.com [e-mail]

Technical data sheet

Bin sort

The binning function allows component manufacturers to sort
components in up to ten bins. Sorting is carried out either by
absolute values or by percentage of values.

Component tests with up to 125 A DC bias
current

The 3255B and 3255BQ enable components to be measured
at up to 125 A when optional 3265B DC Bias Units are used.
Extended DC bias capability is also available with the 3255BL
which uses the 3265B/5A or 3265B/10A to extend the DC bias
current available to a maximum of 50A.

Up to five of the DC Bias Units can be used in parallel to
give a wide range of DC bias currents.

Internal DC bias is available as an option giving DC bias
currents from 1 mA to 1 A.

The 3265B has a number of safety and protection
features including a safety interlock system to protect
users against back EMFs. It is also fully protected
against over temperature, excess voltage drop and sense
lead failure.

3265B DC Bias Unit can deliver up to 25 A of DC bias current in steps of 0.025 A

SMD inductor tests up to 50 A

With the addition of the 1009 DC Bias Fixture DC bias
currents up to 50 A can be applied to an SMD inductor during
component test in order to evaluate the devices thoroughly at
operational bias currents. The fixture operates with one or two
3265B/25A Wayne Kerr DC bias units and a 3255B
Inductance Analyzer. If two 3265B/25As are used then the
optional 5-328-2005 high current lead set will be required.

Four rear panel mounted BNC connectors and two captive
high current cables ensure simplicity and ease of use with a
3265B.

Interchangeable component test carriers ensure that the 1009
test fixture may be used with a wide variety of different
devices. Blank carriers are available which enable device
specific test fixtures to be developed or alternatively a carrier
design and manufacturing service is available.

Stable component fixturing ensures high accuracy and
repeatable measurements. Enclosed fixtures, with safety
interlocks, minimises risk to operators.

1009 DC Bias Fixture enables currents up to

50 A to be applied to an SMD inductor

www.waynekerrtest.com [e-mail]