FEATURES
Monolithic Design for Reliability and Low Cost
High Slew Rate: 0.5 V/s
Low Droop Rate
= 25ⴗC: 0.1 mV/ms
T
A
T
= 125ⴗC: 10 mV/ms
A
Low Zero-Scale Error: 4 mV
Digitally Selected Hold and Reset Modes
Reset to Positive or Negative Voltage Levels
Logic Signals TTL and CMOS Compatible
Uncommitted Comparator On-Chip
Available in Die Form
GENERAL DESCRIPTION
The PKD01 tracks an analog input signal until a maximum
amplitude is reached. The maximum value is then retained as a
peak voltage on a hold capacitor. Being a monolithic circuit, the
PKD01 offers significant performance and package density
advantages over hybrid modules and discrete designs without
sacrificing system versatility. The matching characteristics
attained in a monolithic circuit provide inherent advantages
when charge injection and droop rate error reduction are
primary goals.
Innovative design techniques maximize the advantages of monolithic technology. Transconductance (gm) amplifiers were chosen
over conventional voltage amplifier circuit building blocks. The
g
amplifiers simplify internal frequency compensation, minimize
m
acquisition time and maximize circuit accuracy. Their outputs
are easily switched by low glitch current steering circuits. The
steered outputs are clamped to reduce charge injection errors
upon entering the hold mode or exiting the reset mode. The inherently low zero-scale error is further reduced by active Zener-Zap
trimming to optimize overall accuracy.
with Reset-and-Hold Mode
PKD01
FUNCTIONAL BLOCK DIAGRAM
–IN+INOUTPUT V+V–
–
CMP
+
LOGIC
GND
DET
GATED
"
–IN
+IN
–IN
+IN
RST
RST
"g
m
–
AMP
A
+
GATED
"
"g
m
–
AMP
B
+
DET
OPERATIONAL MODE
0
0
0
1
1
PEAK DETECT
1
PEAK HOLD
1
RESET
0
INDETERMINATE
D
The output buffer amplifier features an FET input stage to
reduce droop rate error during lengthy peak hold periods. A bias
current cancellation circuit minimizes droop error at high ambient temperatures.
Through the DET control pin, new peaks may either be detected
or ignored. Detected peaks are presented as positive output
levels. Positive or negative peaks may be detected without
additional active circuits, since Amplifier A can operate as an
inverting or noninverting gain stage.
An uncommitted comparator provides many application options.
Status indication and logic shaping/shifting are typical examples.
V–
OUTPUT
BUFFER
1
–
C
+
PKD01
C
H
SWITCHES SHOWN FOR:
RST = “0,” DET = “0”
OUTPUT
REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
Zero-Scale ErrorV
Input Offset VoltageV
Input Bias CurrentI
Input Offset CurrentI
Voltage GainA
Open-Loop BandwidthBWA
Common-Mode Rejection Ratio CMRR–10 V ≤ V
Power Supply Rejection RatioPSRR± 9 V ≤ V
Input Voltage Range
Slew RateSR0.50.5V/µs
Feedthrough Error
Acquisition Time to
0.1% Accuracy
Acquisition Time tot
0.01% Accuracy
1
1
1
1
COMPARATOR
Input Offset VoltageV
Input Bias CurrentI
Input Offset CurrentI
Voltage GainA
Common-Mode Rejection Ratio CMRR–10 V ≤ V
Power Supply Rejection RatioPSRR± 9 V ≤ V
Input Voltage Range
1
Low Output VoltageV
“OFF” Output Leakage Current I
Output Short-Circuit CurrentI
Response Time
Output Voltage Swing:V
Amplifier CR
Short-Circuit Current:
Amplifier CI
Switch Aperture Timet
Switch Switching Timets5050ns
Slew Rate: Amplifier CSRR
Power Supply CurrentI
NOTES
1
Guaranteed by design.
2
DET = 1, RST = 0.
3
Due to limited production test times, the droop current corresponds to junction temperature (TJ). The droop current vs. time (after power-on) curve clarified this point. Since
most devices (in use) are on for more than 1 second, ADI specifies droop rate for ambient temperature (TA) also. The warmed-up (TA) droop current specification is correlated
to the junction temperature (T
are not subject to production testing.
Specifications subject to change without notice.
) value. ADI has a droop current cancellation circuit that minimizes droop current at high temperature. Ambient (T
J
ZS
OS
B
OS
V
V
CM
t
AQ
AQ
OS
B
OS
V
V
CM
OL
L
SC
t
S
2
H
L
INH
INL
V
DR
OP
SC
AP
SY
(@ VS = ⴞ15 V, CH = 1000 pF, TA = 25ⴗC, unless otherwise noted.)
Zero-Scale ErrorV
Input Offset VoltageV
Average Input Offset Drift
Input Bias CurrentI
Input Offset CurrentI
Voltage GainA
Common-Mode Rejection RatioCMRR–10 V ≤ V
Power Supply Rejection RatioPSRR± 9 V ≤ V
Input Voltage Range
Slew RateSR0.40.4V/µs
Acquisition Time to 0.1% Accuracy1t
COMPARATOR
Input Offset VoltageV
Average Input Offset Drift
Input Bias CurrentI
Input Offset CurrentI
Voltage GainA
Common-Mode Rejection RatioCMRR–10 V ≤ V
Power Supply Rejection RatioPSRR± 9 V ≤ V
Input Voltage Range
Low Output VoltageV
OFF Output Leakage CurrentI
Output Short-Circuit CurrentI
Response Timet
Amplifier CI
Switch Aperture Timet
Slew Rate: Amplifier CSRR
Power Supply CurrentI
NOTES
1
Guaranteed by design.
2
DET = 1, RST = 0.
3
Due to limited production test times, the droop current corresponds to junction temperature (T
point. Since most devices (in use) are on for more than 1 second, ADI specifies droop rate for ambient temperature (T
specification is correlated to the junction temperature (TJ) value. ADI has a droop current cancellation circuit that minimizes droop current at high temperature.
Ambient (TA) temperature specifications are not subject to production testing.
Specifications subject to change without notice.
1
1
1
1
TCV
B
OS
V
AQ
TCV
B
OS
V
L
SC
S
2
INH
INL
V
SC
AP
SY
PKD01EY, PKD01FY and 0ⴗC ≤ TA ≤ +70ⴗC for PKD01EP, PKD01FP, unless otherwise noted.)
Absolute maximum ratings apply to both DICE and packaged parts, unless
otherwise noted.
2
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
1
Model
ORDERING GUIDE
2
TemperaturePackagePackage
RangeDescriptionOption
PKD01AY–55°C to +85°CCerdipQ-14
PKD01EY–25°C to +85°CCerdipQ-14
PKD01FY–25°C to +85°CCerdipQ-14
PKD01EP0°C to 70°CPlastic DIPN-14
PKD01FP0°C to 70°CPlastic DIPN-14
NOTES
1
Burn-in is available on commercial and industrial temperature range parts in
cerdip, plastic DIP, and TO-can packages.
2
For devices processed in total compliance to MIL-STD-883, add /883 after
part number. Consult factory for 883 data sheet.
*θJA is specified for worst-case mounting conditions, i.e., θJA is specified for device
in socket for cerdip and PDIP packages.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the PKD01 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
DICE CHARACTERISTICS
–4–
REV. A
PKD01
WAFER TEST LIMITS
(@ VS = ⴞ15 V, CH = 1000 pF, TA = 25ⴗC, unless otherwise noted.)
Common-Mode Rejection RatioCMRR–10 V ≤ V
Power Supply Rejection RatioPSRR±9 V ≤ V
Input Voltage Range
1
V
CM
≤ +10 V74dB min
CM
≤±18 V76dB min
S
7mV max
6mV max
250nA max
75nA max
±11.5V min
Feedthrough Error∆VIN = 20 V, DET = 1, RST = 066dB min
COMPARATOR
Input Offset VoltageV
Input Bias CurrentI
Input Offset CurrentI
Voltage Gain
1
OS
B
OS
A
V
2 kΩ Pull-Up Resistor to 5 V3.5V/mV min
Common-Mode Rejection RatioCMRR–10 V ≤ V
Power Supply Rejection RatioPSRR±9 V ≤ V
Input Voltage Range
Low Output VoltageV
1
V
CM
OL
I
≤ 5 mA, Logic GND = 5 V0.4V max
SINK
≤ +10 V82dB min
CM
≤±18 V76dB min
S
3mV max
1000nA max
300nA max
±11.5V min
–0.2V min
“OFF” Output Leakage CurrentI
Output Short-Circuit CurrentI
Due to limited production test times, the droop current corresponds to junction temperature (T
point. Since most devices (in use) are on for more than 1 second, ADI specifies droop rate for ambient temperature (T
specification is correlated to the junction temperature (TJ) value. ADI has a droop current cancellation circuit that minimizes droop current at high temperature.
Ambient (TA) temperature specifications are not subject to production testing.
). The droop current vs. time (after power-on) curve clarifies this
J
) also. The warmed-up (TA) droop current
A
REV. A
–5–
PKD01
–Typical Performance Characteristics
18
14
10
6
2
–2
–6
–10
INPUT RANGE OF AMPLIFIER – V
V– SUPPLY
–14
–18
4618
SUPPLY VOLTAGE +V AND –V –V
INPUT + RANGE = V+
–55ⴗC
TA +125ⴗC
–55ⴗC
+25ⴗC
+125ⴗC
91215
TPC 1. A and B Input Range vs.
Supply Voltage
1000
100
10
INPUT NOISE VOLTAGE – nV/ Hz
RS = 10k⍀
RS = 0
6
4
2
0
–2
OFFSET VOLTAGE – mV
–4
–6
–75 –50125–25025 50 75 100
TEMPERATURE – ⴗC
TPC 2. A and B Amplifiers Offset
Voltage vs. Temperature
100
VS = 15V
T
= 25ⴗC
A
A
= +1
V
10
1
RMS NOISE – V
40
35
30
25
– nA
20
OS
A,B I
15
10
5
0
–25 0 2575 100 12550
–75 –50150
TEMPERATURE – ⴗC
TPC 3. A, B IOS vs. Temperature
1.0
0.5
0
ERROR – mV
–0.5
+125ⴗC
+25ⴗC
–55ⴗC
0
1101k100
FREQUENCY – Hz
TPC 4. Input Spot Noise vs.
Frequency
1.0
POLARITY OF
ERROR MAY BE
POSITIVE OR
NEGATIVE
0.5
0
ERROR – mV
–0.5
–1.0
–10–50510
V
IN
+125ⴗC
– V
+25ⴗC
–55ⴗC
CH = 1000pF
T
= 25ⴗC
A
TPC 7. Amplifier A Charge Injection Error vs. Input Voltage and
Temperature
0
0.1110010
BANDWIDTH – kHz
1000
TPC 5. Wideband Noise vs.
Bandwidth
18
RL = 10k⍀
14
V+ SUPPLY
10
6
2
–2
–6
OUTPUT SWING – V
–10
V– SUPPLY
–14
–18
4618
SUPPLY VOLTAGE +V AND –V – V
–55ⴗC
–55ⴗC
91215
+125ⴗC
+25ⴗC
+25ⴗC
+125ⴗC
TPC 8. Output Voltage Swing vs.
Supply Voltage (Dual Supply
Operation)
–1.0
–10–50 510
– V
V
IN
TPC 6. Amplifier B Charge Injection Error vs. Input Voltage and
Temperature
OUTPUT SWING – Volts
–10.0
–12.5
15
12.5
10.0
7.5
5.0
2.5
0
–2.5
–5.0
–7.5
–15
+25ⴗC
–55ⴗC
+125ⴗC
–55ⴗC
+25ⴗC
+125ⴗC
1.010.0
LOAD RESISTOR TO GROUND – k⍀
0.1
TPC 9. Output Voltage vs. Load
Resistance
–6–
REV. A
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