Analog Devices MAT04FS, MAT04FP, MAT04EY, MAT04FY Datasheet

Matched Monolithic
a
FEATURES Low Offset Voltage: 200 V max High Current Gain: 400 min Excellent Current Gain Match: 2% max Low Noise Voltage at 100 Hz, 1 mA: 2.5 nV/Hz max Excellent Log Conformance: rBE = 0.6 max Matching Guaranteed for All Transistors Available in Die Form

PRODUCT DESCRIPTION

The MAT04 is a quad monolithic NPN transistor that offers ex­cellent parametric matching for precision amplifier and nonlin­ear circuit applications. Performance characteristics of the MAT04 include high gain (400 minimum) over a wide range of collector current, low noise (2.5 nV/Hz maximum at 100 Hz,
= 1 mA) and excellent logarithmic conformance. The
I
C
MAT04 also features a low offset voltage of 200 µV and tight current gain matching, to within 2%. Each transistor of the MAT04 is individually tested to data sheet specifications. For matching parameters (offset voltage, input offset current, and gain match), each of the dual transistor combinations are
MAT04
PIN CONNECTIONS
14-Lead Cerdip (Y Suffix)
14-Lead Plastic DIP (P Suffix)
14-Lead SO (S Suffix)
verified to meet stated limits. Device performance is guaranteed at 25°C and over the industrial and military temperature ranges.
The long-term stability of matching parameters is guaranteed by the protection diodes across the base-emitter junction of each transistor. These diodes prevent degradation of beta and match­ing characteristics due to reverse bias base-emitter current.
The superior logarithmic conformance and accurate matching characteristics of the MAT04 makes it an excellent choice for use in log and antilog circuits. The MAT04 is an ideal choice in applications where low noise and high gain are required.
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Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 2002
MAT04–SPECIFICATIONS
ELECTRICAL CHARACTERISTICS
(@ TA = 25C unless otherwise noted. Each transistor is individually tested. For matching
parameters (VOS, IOS, ∆hFE) each dual transistor combination is verified to meet stated limits. All tests made at endpoints unless otherwise noted.)
MAT04E MAT04F
Parameter Symbol Conditions Min Typ Max Min Typ Max Unit
Current Gain h
Current Gain Match ∆h
Offset Voltage V
Offset Voltage Change vs. ∆V
FE
OS
FE
OS
/I
Collector Current V
Offset Voltage Change vs. V
Bulk Emitter Resistance r
Input Bias Current I
Input Offset Current I Breakdown Voltage BV Collector Saturation Voltage V Collector-Base Leakage Current I Noise Voltage Density e
Gain Bandwidth Product f Output Capacitance C
VOS/VCB10 µA IC 1 mA
CB
BE
B
OS
CEO
CE(SAT)
CBO
n
T
OBO
10 µA IC 1 mA 0 V ≤ V IC = 100 µA 0 V ≤ V 10 µA IC 1 mA 0 V ≤ V 10 µA IC 1 mA
C
= 0 V
CB
0 V ≤ V 10 µA IC 1 mA V
= 0 V
CB
CB
CB
CB
CB
30 V
30 V
30 V
3
30 V
4
1
2
3
400 800 300 600
0.5 2 1 4 %
50 200 100 400 µV
525 1050µV
3
50 100 100 200 µV
0.4 0.6 0.4 0.6
IC = 100 µA 0 V ≤ V
30 V 125 250 165 330 nA
CB
IC = 100 µA; VCB = 0 V 0.6 5 2 13 nA IC = 10 µA40 40 V IB = 100 µA; IC = 1 mA 0.03 0.06 0.03 0.06 V VCB = 40 V 5 5 pA VCB = 0 V; fO = 10 Hz 2 3 2 4 nV/Hz
= 1 mA; fO = 100 Hz 1.8 2.5 1.8 3 nV/Hz
I
C
f
= 1 kHz
O
5
1.8 2.5 1.8 3 nV/Hz
IC = 1 mA; VCE = 10 V 300 300 MHz VCB = 15 V; IE = 0 f = 1 MHz 10 10 pF
Input Capacitance C
EBO
VBE = 0 V; IC = 0 f = 1 MHz 40 40 pF
NOTES
1
Current gain measured at IC = 10 µA, 100 µA and 1 mA.
Ih
2
Current gain match is defined as:
3
Measured at IC = 10 µA and guaranteed by design over the specified range of IC.
4
Guaranteed by design.
5
Sample tested.
Specifications subject to change without notice.
∆∆h
100( )( )
=
FE
MIN
BFE
I
C
–2–
REV. D
MAT04
ELECTRICAL CHARACTERISTICS
(at –25C TA ⴞ 85ⴗC for MAT04E, –40ⴗC ≤ TA ⴞ 85ⴗC for MAT04F, unless
otherwise noted. Each transistor is individually tested. For matching parameters (VOS, IOS) each dual transistor combination is verified to meet stated limits. All tests made at endpoints unless otherwise noted.)
Parameter Symbol Conditions Min Typ Max Min Typ Max Unit
Current Gain h
Offset Voltage V
Average Offset TCV
FE
OS
OS
Voltage Drift V
Input Bias Current I
Input Offset Current I
Average Offset TCI
B
OS
OS
Current Drift V Breakdown Voltage BV Collector-Base I
CEO
CBO
10 µA IC 1 mA 0 V ≤ V
CB
10 µA IC 1 mA 0 V ≤ V
CB
IC = 100 µA
= 0 V
CB
30 V
30 V
3
1
2
IC = 100 µA 0 V ≤ V
30 V 160 445 200 500 nA
CB
IC = 100 µA
= 0 V 4 20 8 40 nA
V
CB
IC = 100 µA
= 0 V 50 100 pA/°C
CB
IC = 10 µA4040V VCB = 40 V
MAT04E MAT04F
225 625 200 500
60 260 120 520 µV
0.2 1 0.4 2 µV/°C
Leakage Current 0.5 0.5 nA Collector-Emitter I
CES
VCE = 40 V
Leakage Current 5 5 nA Collector-Substrate I
CS
VCS = 40 V
Leakage Current 0.7 0.7 nA
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–3–
MAT04
WARNING!
ESD SENSITIVE DEVICE

ABSOLUTE MAXIMUM RATINGS

Collector-Base Voltage (BV
CBO
Collector-Emitter Voltage (BV Collector-Collector Voltage (BV Emitter-Emitter Voltage (BV
EE
1
) . . . . . . . . . . . . . . . . . . . 40 V
) . . . . . . . . . . . . . . . . . 40 V
CEO
) . . . . . . . . . . . . . . . . . 40 V
CC
) . . . . . . . . . . . . . . . . . . . 40 V
Collector Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 mA
Emitter Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 mA
Substrate (Pin-4 to Pin-11) Current . . . . . . . . . . . . . . . 30 mA
Operating Temperature Range
MAT04EY . . . . . . . . . . . . . . . . . . . . . . . . . –25°C to +85°C
MAT04FY, FP, FS . . . . . . . . . . . . . . . . . . . –40°C to +85°C
Storage Temperature
Y Package . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to +150°C
P Package . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to +125°C
Lead Temperature (Soldering, 60 sec) . . . . . . . . . . . . +300°C
Package Type
2
JA
JC
Units
14-Lead Cerdip 108 16 °C/W 14-Lead Plastic DIP 83 39 °C/W 14-Lead SO 120 36 °C/W
NOTES
1
Absolute maximum ratings apply to both DICE and packaged parts, unless otherwise noted.
2
␪JA is specified for worst case mounting conditions, i.e., ␪JA is specified for
device in socket for cerdip and P-DIP packages; JA is specified for device soldered to printed circuit board for SO package.

DICE CHARACTERISTICS

Die Size 0.060 × 0.060 Inch, 3600 Sq. mm (1.52
×
1.52 mm, 2.31 sq. mm)
1. Q1 COLLECTOR
2. Q1 BASE
3. Q1 EMITTER
4. SUBSTRATE
5. Q2 EMITTER
6. Q2 BASE
7. Q2 COLLECTOR
8. Q3 COLLECTOR
9. Q3 BASE
10. Q3 EMITTER
11. SUBSTRATE
12. Q4 EMITTER
13. Q4 BASE
14. Q4 COLLECTOR

ORDERING GUIDE

TA = 25ⴗC Temperature Package Package
Model VOS max Range Description Option
*
MAT04EY MAT04FY
200 µV –25°C to +85°C Cerdip Q-14
*
400 µV –40°C to +85°C Cerdip Q-14 MAT04FP 400 µV –40°C to +85°C P-DIP-14 N-14 MAT04FS 400 µV –40°C to +85°C 14-Lead SO SO-14
NOTES
*
Not for new designs; obsolete April 2002.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the MAT04 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
–4–
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Typical Performance Characteristics–
MAT04
TPC 1. Current Gain vs. Collector Current
TPC 4. Base-Emitter-On-Voltage vs. Collector Current
TPC 2. Current Gain vs. Temperature
TPC 5. Small Signal Input Resistance
) vs. Collector Current
(h
ie
TPC 3. Gain Bandwidth vs. Collector Current
TPC 6. Small Signal Output Conductance vs. Collector Current
TPC 7. Saturation Voltage vs. Collector Current
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TPC 8. Noise Voltage Density vs. Frequency
–5–
TPC 9. Noise Voltage Density vs. Collector Current
MAT04
TPC 10. Total Noise vs. Collector Current
TPC 11. Collector-to-Base Capacitance vs. Collector-to­Base Voltage

APPLICATION NOTES

It is recommended that one of the substrate pins (Pins 4 and 11) be tied to the most negative circuit potential to minimize cou­pling between devices. Pins 4 and 11 are internally connected.
APPLICATIONS CURRENT SOURCES
The MAT04 can be used to implement a variety of high imped­ance current mirrors as shown in Figures 1, 2, and 3. These current mirrors can be used as biasing elements and load de­vices for amplifier stages.
TPC 12. Collector-to-Substrate Capacitance vs. Collector-to­Substrate Voltage
Figure 2. Current Mirror, I
OUT
= 2(l
REF
)
Figure 1. Unity Gain Current Mirror, I
OUT
= I
REF
The unity-gain current mirror of Figure 1 has an accuracy of better than 1% and an output impedance of over 100 M at 100 µA. Figures 2 and 3 show modified current mirrors de­signed for a current gain of two, and one-half respectively. The accuracy of these mirrors is reduced from that of the unity-gain source due to base current errors but is still better than 2%.
–6–
Figure 3. Current Mirror, I
OUT
= 1/2(I
REF
)
Figure 4 is a temperature independent current sink that has an accuracy of better than 1% at an output current of 100 µA to 1 mA. The Schottky diode acts as a clamp to ensure correct cir­cuit start-up at power on. The resistors used in this circuit should be 1% metal-film type.
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MAT04
Figure 4. Temperature Independent Current Sink, I

NONLINEAR FUNCTIONS

An application where precision matched-transistors are a power­ful tool is in the generation of nonlinear functions. These circuits are based on the transistor’s logarithmic property, which takes the following idealized form:
l
kT
V
=
BE
C
In
q
l
S
The MAT04, with its excellent logarithmic conformance, main­tains this idealized function over many decades of collector current. This, in addition to the stringent parametric matching of the MAT04, enables the implementation of extremely accu­rate log/antilog circuits.
The circuit of Figure 5 is a vector summer that adds and sub­tracts logged inputs to generate the following transfer function:
= 10 V/R
OUT
VVV
OUT A B
1
=+
22
2
This circuit uses two MAT04 and maintains an accuracy of better than 0.5% over an input range of 10 mV to 10 V. The layout of the MAT04s reduces errors due to matching and temperature differences between the two precision quad matched transistors.
Op amps A1 and A2 translate the input voltages into logarithmic valued currents (I
and IB in Figure 5) that flow through tran-
A
sistor Q3 and Q5. These currents are summed by transistor Q4
= IA + IB =
(I
O
2
ll
+
122
),
which feeds the current-to-voltage converter consisting of op amp A3. To maintain accuracy, 1% metal-film resistors should be used.
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–7–
MAT04
Figure 5. Vector Summer
LOW NOISE, HIGH SPEED INSTRUMENTATION AMPLIFIER
The circuit of Figure 6 is a very low noise, high speed amplifier, ideal for use in precision transducer and professional audio applications. The performance of the amplifier is summarized in Table I. Figure 7 shows the input referred spot noise over the 0–25 kHz bandwidth to be flat at 1.2 nV/Hz. Figure 20 high- lights the low 1/f noise corner at 2 Hz.
The circuit uses a high speed op amp, the OP17, preceded by an input amplifier. This consists of a precision dual matched­transistor, the MAT02, and a feedback V-to-I converter, the MAT04. The arrangement of the MAT04 is known as a linear­ized cross quad which performs the voltage-to-current conversion. The OP17 acts as an overall nulling amplifier to complete the feedback loop. Resistors R1, R2, and R3, R4 form voltage divid­ers that attenuate the output voltage swing since the cross quad arrangement has a limited input range. Biasing for the in­put stage is set by Zener diode Z1. At low currents, the effective zener voltage is about 3.3 V due to the soft knee characteristic of the Zener diode. This results in a bias current of 530 µA per side for the input stage. The gain of this amplifier with the val­ues shown in Figure 6 is:
V
VR
33000
OUT
=
IN G
Table I. Instrumentation Amplifier Characteristics
Input Noise G = 1000 1.2 nV/Hz Voltage Density G = 100 3.6 nV/Hz
G = 10 30 nV/Hz
Bandwidth G = 500 400 kHz
G = 100 1 MHz G = 10 1.2 MHz
Slew Rate 40 V/µs
Common-Mode Rejection G = 1000 130 dB
Distortion G = 100
f = 20 Hz to 20 kHz 0.03%
Settling Time G = 1000 10 µs
Power Consumption 350 mW
–8–
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MAT04
Figure 6. Low Noise, High-Speed Instrumentation Amplifier
Figure 7. Spot Noise of the Instrumentation Amplifier from 0–25 kHz, Gain Of 1000
Figure 8. Low Frequency Noise Spectrum Showing Low 2 Hz Noise Corner, Gain = 1000
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–9–
MAT04
Figure 9. Voltage-Controlled Attenuator

VOLTAGE-CONTROLLED ATTENUATOR

The voltage-controlled attenuator (VCA) of Figure 9, widely used in professional audio circles, can easily be implemented using a MAT04. The excellent matching characteristics of the MAT04 enables the VCA to have a distortion level of under
0.03% over a wide range of control voltages. The VCA accepts a 3 V RMS input and easily handles the full 20 Hz–20 kHz audio bandwidth as shown in Figure 10. Noise level for the VCA is more than 110 dB below maximum output.
In the voltage controlled attenuator, the input signal modulates the stage current of each differential pair. Op amps A2 and A3 in conjunction with transistors Q5 and Q6 form voltage-to-current converters that transform a single input voltage into differential currents which form the stage currents of each differential pair. The control voltage shifts the current between each side of the two differential pairs, regulating the signal level reaching the output stage which consists of op amp A1. Figure 11 shows the increase in signal attenuation as the control voltage becomes more negative.
The ideal transfer function for the voltage-controlled attenuator is:
V
/
OUT IN
=
1
exp ( )
+
V
 
CONTROL
Where k = Boltzman constant 1.38 × 10
T = temperature in °K q = electronic charge = 1.602 × 10
2
R
13 14
RRkTq
14
+
–23
J/°K
–19
 
C
From the transfer function it can be seen that the maxi­mum gain of the circuit is 2 (6 dB).
To ensure best performance, resistors R2 through R7 should be 1% metal film resistors. Since capacitor C2 can see small amounts of reverse bias when the control voltage is positive, it may be prudent to use a nonpolarized tantalum capacitor.
–10–
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MAT04
Figure 10. Voltage-Controlled Attenuator, Attenuation vs. Frequency
0.200 (5.08) MAX
0.200 (5.08)
0.125 (3.18)
14-Lead Plastic DIP
(N-14)
0.795 (20.19)
0.725 (18.42)
0.210 (5.33) MAX
0.160 (4.06)
0.115 (2.93)
14
17
PIN 1
0.022 (0.558)
0.014 (0.356)
0.100 (2.54)
BSC
8
0.280 (7.11)
0.240 (6.10)
0.060 (1.52)
0.015 (0.38)
0.070 (1.77)
0.045 (1.15)
0.130 (3.30) MIN
SEATING PLANE
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
14-Lead Cerdip
(Q-14)
0.005 (0.13) MIN
14
1
0.785 (19.94) MAX
0.023 (0.58)
0.014 (0.36)
0.325 (8.25)
0.300 (7.62)
0.015 (0.381)
0.008 (0.204)
PIN 1
0.100 (2.54)
BSC
0.195 (4.95)
0.115 (2.93)
0.098 (2.49) MAX
8
0.310 (7.87)
0.220 (5.59)
7
0.060 (1.52)
0.015 (0.38)
0.070 (1.78)
0.030 (0.76)
SEATING PLANE
Figure 11. Voltage-Controlled Attenuator, Attenuation vs. Control Voltage
0.320 (8.13)
0.290 (7.37)
0.150 (3.81) MIN
15°
0.015 (0.38)
0.008 (0.20)
0°
14-Lead Narrow-Body SO
(R-14/SO-14)
0.3444 (8.75)
0.3367 (8.55)
PLANE
14 8
PIN 1
0.0500
0.0192 (0.49)
(1.27)
0.0138 (0.35)
BSC
0.2440 (6.20)
71
0.2284 (5.80)
0.0688 (1.75)
0.0532 (1.35)
0.0099 (0.25)
0.0075 (0.19)
0.1574 (4.00)
0.1497 (3.80)
0.0098 (0.25)
0.0040 (0.10)
SEATING
0.0196 (0.50)
0.0099 (0.25)
8° 0°
0.0500 (1.27)
0.0160 (0.41)
x 45°
REV. D
–11–
MAT04

Revision History

Location Page
Data Sheet changed from REV. C to REV. D.
Edits to ABSOLUTE MAXIMUM RATINGS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Deleted ELECTRICAL CHARACTERISTICS for –55°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Deleted WAFER TEST LIMITS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Edits to TPCs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5–6
Added OUTLINE DIMENSIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
C00285-0-2/02(D)
–12–
PRINTED IN U.S.A.
REV. D
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