FEATURES
12-Bit Accuracy in an 8-Lead PDIP Package
Fast Serial Data Input
Double Data Buffers
±
1/2 LSB Max INL and DNL
Low
Max Gain Error: ±1 LSB
°
Low 5 ppm/
ESD Resistant
Low Cost
Available in Die Form
APPLICATIONS
Autocalibration Systems
Process Control and Industrial Automation
Programmable Amplifiers and Attenuators
Digitally Controlled Filters
GENERAL DESCRIPTION
The DAC8043 is a high accuracy 12-bit CMOS multiplying DAC
in a space-saving 8-lead PDIP package. Featuring serial data
input, double buffering, and excellent analog performance, the
DAC8043 is ideal for applications where PC board space is at a
premium. In addition, improved linearity and gain error performance permit reduced parts count through the elimination of
trimming components. Separate input clock and load DAC
control lines allow full user control of data loading and analog
output.
The circuit consists of a 12-bit serial-in, parallel-out shift register,
a 12-bit DAC register, a 12-bit CMOS DAC, and control logic.
Serial data is clocked into the input register on the rising edge of
the CLOCK pulse. When the new data word has been clocked
in, it is loaded into the DAC register with the LD input pin.
Data in the DAC register is converted to an output current by
the D/A converter.
The DAC8043’s fast interface timing may reduce timing design
considerations while minimizing microprocessor wait states. For
applications requiring an asynchronous CLEAR function or more
versatile microprocessor interface logic, refer to the PM-7543.
Operating from a single 5 V power supply, the DAC8043 is the
ideal low power, small size, high performance solution to many
application problems. It is available in a PDIP package that is
compatible with auto-insertion equipment.
C Max Tempco
FUNCTIONAL BLOCK DIAGRAM
PIN CONNECTIONS
8-Lead PDIP
REV. D
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective companies.
under Absolute Maximum Ratings, unless otherwise noted.)
ParameterSymbolConditionsMinTypMaxUnit
STATIC ACCURACY
ResolutionN12Bits
Nonlinearity
Differential Nonlinearity
Gain Error
Gain Tempco
(∆ Gain/∆ Temp)
Power Supply
Rejection RatioPSRR∆V
(∆ Gain/∆ V
Output Leakage Current
Zero Scale Error
Input Resistance
AC PERFORMANCE
Output Current
Settling Time
Digital to AnalogI
Glitch Energy
Feedthrough ErrorV
(V
Total Harmonic Distortion
Output Noise Voltage Density
DIGITAL INPUTS
Digital Input
HIGHV
Digital Input
LOWV
Input Leakage Current
Input Capacitance
ANALOG OUTPUTS
Output Capacitance
REF
to I
3
1
OUT
DD
6, 7
8
4, 9
4, 10
)
)
4, 11
4, 11
INLDAC8043G±1/2LSB
2
DNLDAC8043F/G±1LSB
G
FSE
DAC8043F1LSB
TA = 25°C
DAC8043F/G2LSB
= Full Temperature Range
T
A
All Grades2LSB
4
5
TC
I
LKG
GFS
= ±5%±0.0006 ±0.002%/%
DD
TA = 25°C±5nA
= Full Temperature Range
T
A
DAC8043F/G±25nA
I
ZSE
TA = 25°C0.03LSB
= Full Temperature Range
T
A
DAC8043F/G0.15LSB
R
IN
t
S
QC
TA = 25°C0.251µs
= 0 V
V
REF
Load = 100 Ω
OUT
= 13 pF220nVs
EXT
DAC Register Loaded Alternately with
All 0s and All 1s
= 20 V p-p @ f = 10 kHz
REF
FTDigital Input = 0000 0000 00000.71mV p-p
T
= 25°C
4
13
4
4, 12
THDV
e
n
IN
IL
I
IL
C
IN
C
OUT
A
= 6 V rms @ 1 kHz–85dB
REF
DAC Register Loaded with All 1s
10 Hz to 100 kHz between RFB and I
VIN = 0 V to +5 V±1µA
VIN = 0 V8pF
Digital Inputs = V
Digital Inputs = V
= +10 V; I
REF
IH
IL
= GND = 0 V; TA = Full Temperature Range specified
OUT
DAC8043
±5ppm/°C
71115kΩ
OUT
2.4V
17nV/√Hz
0.8V
110pF
80pF
REV. D–2–
DAC8043
ELECTRICAL CHARACTERISTICS
(continued)
DAC8043
ParameterSymbolConditionsMinTypMaxUnit
TIMING CHARACTERISTICS
Data Setup Timet
Data Hold Timet
Clock Pulsewidth Hight
Clock Pulsewidth Lowt
Load Pulsewidtht
LSB Clock Into Input Register
to Load DAC Register Timet
POWER SUPPLY
Supply VoltageV
Supply CurrentI
NOTES
1 1
±1/2 LSB = ±0.012% of full scale.
1 2
All grades are monotonic to 12 bits over temperature.
1 3
Using internal feedback resistor.
1 4
Guaranteed by design and not tested.
1 5
Applies to I
1 6
V
= 10 V; all digital inputs = 0 V.
REF
1 7
Calculated from worst-case R
1 8
Absolute temperature coefficient is less than 300 ppm/°C.
1 9
I
load = 100 Ω, C
OUT
constant of the final RC decay.
10
V
= 0 V, all digital inputs = 0 V to VDD or VDD to 0 V.
REF
11
All digit inputs = 0 V.
12
Calculations from en = √4K TRB where: K = Boltzmann constant, J/°K, R = resistance, Ω, T = resistor temperature, °K, B = bandwidth, Hz.
13
Digital inputs are CMOS gates; IIN is typically 1 nA at 25°C.
14
Tested at VIN = 0 V or VDD.
Specifications subject to change without notice.
; all digital inputs = 0 V.
OUT
EXT
4, 14
DS
DH
CH
CL
LD
ASB
DD
DD
: I
(in LSBs) = (R
REF
ZSE
= 13 pF, digital input = 0 V to VDD or VDD to 0 V. Extrapolated to 1/2 LSB; tS = propagation delay (tPD) + 9τ where τ = measured time
TA = Full Temperature Range40ns
TA = Full Temperature Range80ns
TA = Full Temperature Range90ns
TA = Full Temperature Range120ns
TA = Full Temperature Range120ns
TA = Full Temperature Range0ns
4.7555.25V
Digital Inputs = VIH or V
Digital Inputs = 0 V or V
× I
REF
× 4096)/V
LKG
REF
IL
DD
.
500µA max
100µA max
WAFER TEST LIMITS
(@ VDD = 5 V, V
= 10 V; I
REF
= GND = 0 V, TA = 25ⴗC.)
OUT
DAC8043GBC
ParameterSymbolConditionsLimitUnit
STATIC ACCURACY
ResolutionN12Bits min
Integral NonlinearityINL±1LSB max
Differential NonlinearityDNL±1LSB max
Gain ErrorG
FSE
Power Supply Rejection RatioPSRR∆V
Output Leakage Current (I
)I
OUT
LKG
Using Internal Feedback Resistor±2LSB max
= ±5%±0.002%/% max
DD
Digital Inputs = V
IL
±5nA max
REFERENCE INPUT
Input ResistanceR
IN
7/15kΩ min/max
DIGITAL INPUTS
Digital Input HIGHV
Digital Input LOWV
Input Leakage CurrentI
IH
IL
IL
VIN = 0 V to V
DD
2.4V min
0.8V max
±1µA max
POWER SUPPLY
Supply CurrentI
NOTE
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualifications through sample lot assembly and testing.
DD
Digital Inputs = VIN or V
Digital Inputs = 0 V or V
IL
DD
500µA max
100µA max
REV. D
–3–
DAC8043
ABSOLUTE MAXIMUM RATINGS
(TA = 25°C, unless otherwise noted.)
1
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +8 V
Lead Temperature (Soldering, 60 sec) . . . . . . . . . . . . . 300°C
Package Type
2
JA
JC
Unit
8-Lead PDIP9637°C/W
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Only one absolute maximum rating may be applied at any one time.
2
JA is specified for worst-case mounting conditions, i. e., JA is specified for device
in socket for PDIP package.
CAUTION
1. Do not apply voltages higher than VDD or less than GND
potential on any terminal except V
(Pin 1) and RFB (Pin 2).
REF
2. The digital control inputs are Zener-protected; however,
permanent damage may occur on unprotected units from
high energy electrostatic fields. Keep units in conductive
foam at all times until ready to use.
3. Use proper antistatic handling procedures.
4. Absolute Maximum Ratings apply to both packaged devices
and DICE. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device.
ORDERING GUIDE*
ModelAccuracyRangeOption
RelativeTemperaturePackage
DAC8043FP ±1 LSB–40°C to +85°C 8-Lead PDIP
DAC8043GP ±1/2 LSB 0°C to +70°C8-Lead PDIP
*All commercial and industrial temperature range parts are available with burn-in.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
DAC8043 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended
to avoid performance degradation or loss of functionality.
REV. D–4–
Typical Performance Characteristics–DAC8043
TPC 1. Gain vs. Frequency
(Output Amplifier: OP42)
TPC 4. Linearity Error vs.
Digital Code
TPC 2. Total Harmonic
Distortion vs. Frequency
(Multiplying Mode)
TPC 5. Linearity Error vs.
Reference Voltage
TPC 3. Supply Current vs.
Logic Input Voltage
ºS
TPC 6. Logic Threshold
Voltage vs. Supply Voltage
TPC 7. DNL Error vs. Reference
Voltage
REV. D
–5–
DAC8043
PARAMETER DEFINITIONS
Integral Nonlinearity (INL)
This is the single most important DAC specification. ADI measures INL as the maximum deviation of the analog output (from
the ideal) from a straight line drawn between the end points. It
is expressed as a percent of full-scale range or in terms of LSBs.
Refer to PMI 1988 Data Book Section 11 for additional digitalto-analog converter definitions.
Interface Logic Information
The DAC8043 has been designed for ease of operation. The
timing diagram illustrates the input register loading sequence.
Note that the most significant bit (MSB) is loaded first.
Once the input register is full, the data is transferred to the
DAC register by taking LD momentarily low.
DIGITAL SECTION
The DAC8043’s digital inputs, SRI, LD, and CLK, are TTL
compatible. The input voltage levels affect the amount of current drawn from the supply; peak supply current occurs as the
digital input (V
TPC 3). Maintaining the digital input voltage levels as close as
possible to the supplies, V
rent consumption.
The DAC8043’s digital inputs have been designed with ESD
resistance incorporated through careful layout and the inclusion
of input protection circuitry. Figure 1 shows the input protection
diodes and series resistor; this input structure is duplicated on
each digital input. High voltage static charges applied to the
inputs are shunted to the supply and ground rails through forward
biased diodes. These protection diodes were designed to clamp
the inputs to well below dangerous levels during static discharge
conditions.
GENERAL CIRCUIT INFORMATION
The DAC8043 is a 12-bit multiplying D/A converter with a very
low temperature coefficient. It contains an R-2R resistor ladder
network, data input, control logic, and two data registers.
) passes through the transition region (see
IN
and GND, minimizes supply cur-
DD
Figure 1. Digital Input Protection
The digital circuitry forms an interface in which serial data can be
loaded under microprocessor control into a 12-bit shift register
and then transferred, in parallel, to the 12-bit DAC register.
A simplified circuit of the DAC8043 is shown in Figure 3, which
has an inverted R-2R ladder network consisting of silicon-chrome,
highly stable (50 ppm/°C) thin-film resistors, and twelve pairs of
NMOS current-steering switches.
These switches steer binarily weighted currents into either I
OUT
or
GND; this yields a constant current in each ladder leg, regardless
of digital input code. This constant current results in a constant
input resistance at V
equal to R. The V
REF
input may be driven
REF
by any reference voltage or current, ac or dc, that is within the
limits stated in the Absolute Maximum Ratings.
The twelve output current-steering NMOS FET switches are in
series with each R-2R resistor; they can introduce bit errors if all
are of the same R
resistance value. They were designed so that
ON
the switch ON resistance is binarily scaled so that the voltage
drop across each switch remains constant. If, for example,
Switch 1 of Figure 3 were designed with an ON resistance of
10 Ω, Switch 2 for 20 Ω, and so on, a constant 5 mV drop would
be maintained across each switch.
Figure 2. Write Cycle Timing Diagram
REV. D–6–
DAC8043
To further ensure accuracy across the full temperature range,
permanently ON MOS switches were included in series with the
feedback resistor and the R-2R ladder’s terminating resistor.
The simplified DAC circuit, Figure 3, shows the location of the
series switches. These series switches are equivalently scaled to
two times Switch 1 (MSB) and to Switch 12 (LSB), respectively,
to maintain constant relative voltage drops with varying temperature. During any testing of the resistor ladder or R
FEEDBACK
(such as incoming inspection), VDD must be present to turn
ON these series switches.
DYNAMIC PERFORMANCE
Output Impedance
The DAC8043’s output resistance, as in the case of the output
capacitance, varies with the digital input code. This resistance,
looking back into the I
terminal, may be between 10 kΩ (the
OUT
feedback resistor alone when all digital inputs are low) and
7.5 kΩ (the feedback resistor in parallel with approximately 30 kΩ
of the R-2R ladder network resistance when any single bit logic
is high). Static accuracy and dynamic performance will be
affected by these variations. This variation is best illustrated by
using the circuit of Figure 5 and the equation
VV
ERROROS
=+
1
R
FB
R
O
where RO is a function of the digital code and
R
= 10 kΩ for more than four bits of Logic 1
O
= 30 kΩ for any single bit of Logic 1
R
O
Therefore, the offset gain varies as follows:
at code 0011 1111 1111,
VV
ERROR1OSOS
=+
10
10
Ω
k
=1
2
V
Ω
k
at code 0100 0000 0000,
Figure 3. Simplified DAC Circuit
EQUIVALENT CIRCUIT ANALYSIS
Figure 4 shows an equivalent analog circuit for the DAC8043.
The (D × V
current generated by the DAC. The current source I
)/R current source is code dependent and is the
REF
LKG
consists
of surface and junction leakages and doubles approximately
every 10°C. C
is the output capacitance; it is the result of
OUT
the N-channel MOS switches and varies from 80 pF to 110 pF,
depending on the digital input code. R
is the equivalent output
O
resistance that also varies with digital input code. R is the nominal
R-2R resistor ladder resistance.
Figure 4. Equivalent Analog Circuit
VV
ERROR2OSOS
=+
10
30
Ω
k
=1
43
V
Ω
k
The error difference is 2/3 VOS.
Since one LSB has a weight (for V
DAC8043, it is clearly important that V
= 10 V) of 2.4 mV for the
REF
be minimized,
OS
either by using the amplifier’s nulling pins or an external nulling
network or by selecting an amplifier with inherently low V
Amplifiers with sufficiently low V
include ADI’s OP77, OP07,
OS
OS
.
OP27, and OP42.
Figure 5. Simplified Circuit
REV. D
–7–
DAC8043
The gain and phase stability of the output amplifier, board
layout, and power supply decoupling all affect the dynamic
performance. The use of a small compensation capacitor may be
required when high speed operational amplifiers are used. It
may be connected across the amplifier’s feedback resistor to
provide the necessary phase compensation to critically damp the
output. The DAC8043’s output capacitance and the R
resistor form a pole that must be outside the amplifier’s unity gain
crossover frequency.
The considerations when using high speed amplifiers are:
1. Phase compensation (see Figures 6 and 7).
2. Power supply decoupling at the device socket and the use of
proper grounding techniques.
APPLICATIONS INFORMATION
Application Tips
In most applications, linearity depends upon the potential of
I
and GND (Pins 3 and 4) being equal to each other. In
OUT
most applications, the DAC is connected to an external op amp
with its noninverting input tied to ground (see Figures 6 and 7).
The amplifier selected should have a low input bias current and
low drift over temperature. The amplifier’s input offset voltage
should be nulled to less than 200 µV (less than 10% of 1 LSB).
The operational amplifier’s noninverting input should have a
minimum resistance connection to ground; the usual bias current
compensation resistor should not be used. This resistor can cause
a variable offset voltage appearing as a varying output error. All
grounded pins should tie to a single common ground point, avoiding ground loops. The V
power supply should have a low noise
DD
level with no transients greater than 17 V.
Unipolar Operation (2-Quadrant)
The circuit shown in Figures 6 and 7 may be used with an ac or
dc reference voltage. The circuit’s output will range between
0 V and approximately –V
(4095/4096), depending upon the
REF
digital input code. The relationship between the digital input
and the analog output is shown in Table I. The limiting
parameters for the V
range are the maximum input voltage
REF
range of the op amp or ±25 V, whichever is lowest.
Figure 6. Unipolar Operation with High Accuracy
Op Amp (2-Quadrant)
FB
Figure 7. Unipolar Operation with Fast Op Amp
and Gain Error Trimming (2-Quadrant)
Gain error may be trimmed by adjusting R1, as shown in Figure 7.
The DAC register must first be loaded with all 1s. R1 may then
be adjusted until V
adjustable V
, R1 and R2 may be omitted, with V
REF
OUT
= –V
(4095/4096). In the case of an
REF
adjusted to
REF
yield the desired full-scale output.
In most applications, the DAC8043’s negligible zero-scale error
and very low gain error permit the elimination of the trimming
components (R
and the external R2) without adversely affecting
1
on circuit performance.
Table I. Unipolar Code Table
Digital InputNominal Analog Output
MSBLSB(V
1111 1111 1111
1000 0000 0001
1000 0000 0000
0111 1111 1111
0000 0000 0001
0000 0000 0000
NOTES
1. Nominal full scale for Figures 6 and 7 circuits is given by
FSV
2. Nominal LSB magnitude for Figures 6 and 7 circuits is given by
LSB Vor V
=
as Shown in Figures 6 and 7)
OUT
V
REF
V
REF
REF
V
REF
V
REF
REF
=−
4096
4095
4096
2049
4096
2048
REF
1
=−V
40962
2047
4096
1
4096
0
=V
4096
4095
4096
V
REF
0
−
2
()
−
−
−
−
−
−
REFREF
n
REV. D–8–
DAC8043
Table II. Bipolar (Offset Binary) Code Table
Digital InputNominal Analog Output
MSBLSB(V
1111 1111 1111
1000 0000 0001
as Shown in Figure 8)
OUT
+
+
2047
V
REF
2048
REF
2048
1
V
1000 0000 00000
REF
REF
REF
2047
2048
1
2048
2047
2048
2048
2048
1
2048
−
0111 1111 1111
V
−
0000 0000 0001
V
−
0000 0000 0000
V
NOTES
1. Nominal full scale for Figure 8 circuit is given by
FS V
=
REF
2. Nominal LSB magnitude for Figure 8 circuit is given by
LSB V
=
REF
Bipolar Operation (4-Quadrant)
Figure 8 details a suggested circuit for bipolar, or offset binary,
operation. Table II shows the digital input to analog output relationship. The circuit uses offset binary coding. Twos complement
code can be converted to offset binary by software inversion of the
MSB or by the addition of an external inverter to the MSB input.
Resistors R3, R4, and R5 must be selected to match within 0.01%,
and they all must be of the same (preferably metal foil) type to
ensure temperature coefficient matching. Mismatching between
and R4 causes offset and full-scale errors, while an R5 to R
R
3
4
and R3 mismatch will result in full-scale error.
Calibration is performed by loading the DAC register with
1000 0000 0000 and adjusting R
may be omitted, adjusting the ratio of R3 to R4 to yield V
until V
1
= 0 V. R1 and R
OUT
OUT
2
=
0 V. Full scale can be adjusted by loading the DAC register with
1111 1111 1111 and either adjusting the amplitude of V
the value of R
until the desired V
5
is achieved.
OUT
REF
or
Analog/Digital Division
The transfer function for the DAC8043 connected in the multiplying mode, as shown in Figures 6, 7, and 8, is
AA AA
VV
=−+++
OIN
11223
22 22
3
...
12
12
where AX assumes a value of 1 for an ON bit and 0 for an OFF
bit.
The transfer function is modified when the DAC is connected in
the feedback of an operational amplifier, as shown in Figure 9
and becomes
V
=
O
AA AA
112
+++
233
22 22
V
−
IN
...
12
4
The above transfer function is the division of an analog voltage
) by a digital word. The amplifier goes to the rails with all
(V
REF
bits OFF since division by zero is infinity. With all bits ON the
gain is 1 (±1 LSB). The gain becomes 4096 with the LSB, bit
12, ON.
As shown in Figure 10, the DAC8043 may be interfaced to the
6800 by successively executing memory WRITE instructions
while manipulating the data between WRITEs, so that each
WRITE presents the next bit.
In this example the most significant bits are found in memory
location 0000 and 0001. The four MSBs are found in the lower
half of 0000, the eight LSBs in 0001. The data is taken from the
DB
line.
7
The serial data loading is triggered by the CLK pulse, which is
asserted by a decoded memory WRITE to memory location
2000, R/W, and φ2. A WRITE to address 4000 transfers data
from the input register to the DAC register.
DAC8043 Interface to the 8085
The DAC8043’s interface to the 8085 microprocessor is shown
in Figure 11. Note that the microprocessor’s SOD line is used
to present data serially to the DAC.
Data is clocked into the DAC8043 by executing memory WRITE
instructions. The clock input is generated by decoding address
8000 and WR. Data is loaded into the DAC register with a
memory write instruction to address A000.
Serial data supplied to the DAC8043 must be present in the right
justified format in Registers H and L of the microprocessor.
Figure 11. DAC8043 to 8085 Interface
DAC8043 to the 68000 Interface
The DAC8043 interfacing to the 68000 microprocessor is shown
in Figure 12. Again, serial data to the DAC is taken from one of
the microprocessor’s data bus lines.
Figure 10. DAC8043 to MC6800 Interface
Figure 12. DAC8043 to 68000 µP Interface
REV. D–10–
OUTLINE DIMENSIONS
8-Lead Plastic Dual In-Line Package [PDIP]
(N-8)
Dimensions shown in inches and (millimeters)
0.375 (9.53)
0.365 (9.27)
0.355 (9.02)
8
1
0.100 (2.54)
0.180
(4.57)
MAX
0.150 (3.81)
0.130 (3.30)
0.110 (2.79)
0.022 (0.56)
0.018 (0.46)
0.014 (0.36)
CONTROLLING DIMENSIONS ARE IN INCHES; MILLIMETER DIMENSIONS
(IN PARENTHESES) ARE ROUNDED-OFF INCH EQUIVALENTS FOR
REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN