Analog Devices DAC8043 d Datasheet

12-Bit Serial Input

Multiplying CMOS D/A Converter

DAC8043

FEATURES
12-Bit Accuracy in an 8-Lead PDIP Package
Fast Serial Data Input
Double Data Buffers

±

1/2 LSB Max INL and DNL

Low
Max Gain Error: ±1 LSB

°

Low 5 ppm/
ESD Resistant
Low Cost
Available in Die Form

APPLICATIONS
Autocalibration Systems
Process Control and Industrial Automation
Programmable Amplifiers and Attenuators
Digitally Controlled Filters

GENERAL DESCRIPTION

The DAC8043 is a high accuracy 12-bit CMOS multiplying DAC
in a space-saving 8-lead PDIP package. Featuring serial data
input, double buffering, and excellent analog performance, the
DAC8043 is ideal for applications where PC board space is at a
premium. In addition, improved linearity and gain error perfor­mance permit reduced parts count through the elimination of
trimming components. Separate input clock and load DAC
control lines allow full user control of data loading and analog
output.

The circuit consists of a 12-bit serial-in, parallel-out shift register,
a 12-bit DAC register, a 12-bit CMOS DAC, and control logic.
Serial data is clocked into the input register on the rising edge of
the CLOCK pulse. When the new data word has been clocked
in, it is loaded into the DAC register with the LD input pin.
Data in the DAC register is converted to an output current by
the D/A converter.

The DAC8043’s fast interface timing may reduce timing design
considerations while minimizing microprocessor wait states. For
applications requiring an asynchronous CLEAR function or more
versatile microprocessor interface logic, refer to the PM-7543.

Operating from a single 5 V power supply, the DAC8043 is the
ideal low power, small size, high performance solution to many
application problems. It is available in a PDIP package that is
compatible with auto-insertion equipment.

C Max Tempco

FUNCTIONAL BLOCK DIAGRAM

PIN CONNECTIONS

8-Lead PDIP

REV. D

Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective companies.

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: [phone] www.analog.com
Fax: [phone] © 2003 Analog Devices, Inc. All rights reserved.

DAC8043–SPECIFICATIONS

(@ VDD = +5 V; V

ELECTRICAL CHARACTERISTICS

under Absolute Maximum Ratings, unless otherwise noted.)

Parameter Symbol Conditions Min Typ Max Unit

STATIC ACCURACY

Resolution N 12 Bits
Nonlinearity

Differential Nonlinearity
Gain Error

Gain Tempco

(∆ Gain/∆ Temp)

Power Supply

Rejection Ratio PSRR ∆V
(∆ Gain/∆ V

Output Leakage Current

Zero Scale Error

Input Resistance

AC PERFORMANCE

Output Current

Settling Time

Digital to Analog I

Glitch Energy

Feedthrough Error V

(V

Total Harmonic Distortion

Output Noise Voltage Density

DIGITAL INPUTS

Digital Input

HIGH V

Digital Input

LOW V
Input Leakage Current
Input Capacitance

ANALOG OUTPUTS

Output Capacitance

REF

to I

3

1

OUT

DD

6, 7

8

4, 9

4, 10

)

)

4, 11

4, 11

INL DAC8043G ±1/2 LSB

2

DNL DAC8043F/G ±1 LSB
G

FSE

DAC8043F 1 LSB

TA = 25°C

DAC8043F/G 2 LSB

= Full Temperature Range

T

A

All Grades 2 LSB

4

5

TC

I

LKG

GFS

= ±5% ±0.0006 ±0.002 %/%

DD

TA = 25°C ±5 nA

= Full Temperature Range

T

A

DAC8043F/G ±25 nA

I

ZSE

TA = 25°C 0.03 LSB

= Full Temperature Range

T

A

DAC8043F/G 0.15 LSB

R

IN

t

S

QC

TA = 25°C 0.25 1 µs

= 0 V

V

REF

Load = 100 Ω

OUT

= 13 pF 2 20 nVs

EXT

DAC Register Loaded Alternately with
All 0s and All 1s

= 20 V p-p @ f = 10 kHz

REF

FT Digital Input = 0000 0000 0000 0.7 1 mV p-p

T

= 25°C

4

13

4

4, 12

THD V

e

n

IN

IL

I

IL

C

IN

C

OUT

A

= 6 V rms @ 1 kHz –85 dB

REF

DAC Register Loaded with All 1s
10 Hz to 100 kHz between RFB and I

VIN = 0 V to +5 V ±1 µA
VIN = 0 V 8 pF

Digital Inputs = V
Digital Inputs = V

= +10 V; I

REF

IH

IL

= GND = 0 V; TA = Full Temperature Range specified

OUT

DAC8043

±5 ppm/°C

71115kΩ

OUT

2.4 V

17 nV/√Hz

0.8 V

110 pF
80 pF

REV. D–2–

DAC8043

ELECTRICAL CHARACTERISTICS

(continued)

DAC8043

Parameter Symbol Conditions Min Typ Max Unit

TIMING CHARACTERISTICS

Data Setup Time t
Data Hold Time t
Clock Pulsewidth High t
Clock Pulsewidth Low t
Load Pulsewidth t
LSB Clock Into Input Register

to Load DAC Register Time t

POWER SUPPLY

Supply Voltage V
Supply Current I

NOTES

1 1

±1/2 LSB = ±0.012% of full scale.

1 2

All grades are monotonic to 12 bits over temperature.

1 3

Using internal feedback resistor.

1 4

Guaranteed by design and not tested.

1 5

Applies to I

1 6

V

= 10 V; all digital inputs = 0 V.

REF

1 7

Calculated from worst-case R

1 8

Absolute temperature coefficient is less than 300 ppm/°C.

1 9

I

load = 100 Ω, C

OUT

constant of the final RC decay.

10

V

= 0 V, all digital inputs = 0 V to VDD or VDD to 0 V.

REF

11

All digit inputs = 0 V.

12

Calculations from en = √4K TRB where: K = Boltzmann constant, J/°K, R = resistance, Ω, T = resistor temperature, °K, B = bandwidth, Hz.

13

Digital inputs are CMOS gates; IIN is typically 1 nA at 25°C.

14

Tested at VIN = 0 V or VDD.

Specifications subject to change without notice.

; all digital inputs = 0 V.

OUT

EXT

4, 14

DS

DH

CH

CL

LD

ASB

DD

DD

: I

(in LSBs) = (R

REF

ZSE

= 13 pF, digital input = 0 V to VDD or VDD to 0 V. Extrapolated to 1/2 LSB; tS = propagation delay (tPD) + 9τ where τ = measured time

TA = Full Temperature Range 40 ns
TA = Full Temperature Range 80 ns
TA = Full Temperature Range 90 ns
TA = Full Temperature Range 120 ns
TA = Full Temperature Range 120 ns

TA = Full Temperature Range 0 ns

4.75 5 5.25 V
Digital Inputs = VIH or V
Digital Inputs = 0 V or V

× I

REF

× 4096)/V

LKG

REF

IL

DD

.

500 µA max
100 µA max

WAFER TEST LIMITS

(@ VDD = 5 V, V

= 10 V; I

REF

= GND = 0 V, TA = 25ⴗC.)

OUT

DAC8043GBC

Parameter Symbol Conditions Limit Unit

STATIC ACCURACY

Resolution N 12 Bits min
Integral Nonlinearity INL ±1 LSB max
Differential Nonlinearity DNL ±1 LSB max
Gain Error G

FSE

Power Supply Rejection Ratio PSRR ∆V
Output Leakage Current (I

)I

OUT

LKG

Using Internal Feedback Resistor ±2 LSB max

= ±5% ±0.002 %/% max

DD

Digital Inputs = V

IL

±5 nA max

REFERENCE INPUT

Input Resistance R

IN

7/15 kΩ min/max

DIGITAL INPUTS

Digital Input HIGH V
Digital Input LOW V
Input Leakage Current I

IH

IL

IL

VIN = 0 V to V

DD

2.4 V min

0.8 V max
±1 µA max

POWER SUPPLY

Supply Current I

NOTE
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualifications through sample lot assembly and testing.

DD

Digital Inputs = VIN or V
Digital Inputs = 0 V or V

IL

DD

500 µA max
100 µA max

REV. D

–3–

DAC8043

ABSOLUTE MAXIMUM RATINGS

(TA = 25°C, unless otherwise noted.)

1

VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +8 V

to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .±18 V

V

REF

to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .±18 V

V

RFB

Digital Input Voltage Range . . . . . . . . . –0.3 V to V

to GND . . . . . . . . . . . . . . . . . . . . –0.3 V to V

V

IOUT

+ 0.3 V

DD

+ 0.3 V

DD

Operating Temperature Range

FP Versions . . . . . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C

GP Version . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C

Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 150°C

Storage Temperature . . . . . . . . . . . . . . . . . . . –65°C to +150°C

Lead Temperature (Soldering, 60 sec) . . . . . . . . . . . . . 300°C

Package Type ␪

2

JA

␪

JC

Unit

8-Lead PDIP 96 37 °C/W

NOTES

1

Stresses above those listed under Absolute Maximum Ratings may cause perma­nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute maximum rating condi­tions for extended periods may affect device reliability. Only one absolute maxi­mum rating may be applied at any one time.

2

␪JA is specified for worst-case mounting conditions, i. e., ␪JA is specified for device

in socket for PDIP package.

CAUTION

1. Do not apply voltages higher than VDD or less than GND
potential on any terminal except V

(Pin 1) and RFB (Pin 2).

REF

2. The digital control inputs are Zener-protected; however,
permanent damage may occur on unprotected units from
high energy electrostatic fields. Keep units in conductive
foam at all times until ready to use.

3. Use proper antistatic handling procedures.

4. Absolute Maximum Ratings apply to both packaged devices
and DICE. Stresses above those listed under Absolute Maxi­mum Ratings may cause permanent damage to the device.

ORDERING GUIDE*

Model Accuracy Range Option

Relative Temperature Package

DAC8043FP ±1 LSB –40°C to +85°C 8-Lead PDIP
DAC8043GP ±1/2 LSB 0°C to +70°C 8-Lead PDIP

*All commercial and industrial temperature range parts are available with burn-in.

CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
DAC8043 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended
to avoid performance degradation or loss of functionality.

REV. D–4–