Analog Devices ADXSR 614 Service Manual

Page 1
V
±50°/s Yaw Rate Gyro

FEATURES

Complete rate gyroscope on a single chip Z-axis (yaw rate) response High vibration rejection over wide frequency 2000 g powered shock survivability Ratiometric to referenced supply 5 V single-supply operation 105°C operation Self-test on digital command Ultrasmall and light (<0.15 cc, <0.5 gram) Temperature sensor output RoHS compliant

APPLICATIONS

Navigation systems Inertial measurement units Platform stabilization Robotics
ADXRS614

GENERAL DESCRIPTION

T
he ADXRS614 is a complete angular rate sensor (gyroscope) that uses the Analog Devices, Inc. surface-micromachining process to create a functionally complete and low cost angular rate sensor integrated with all required electronics on one chip. The manufacturing technique for this device is the same high volume BiMOS process used for high reliability automotive airbag accelerometers.
The output signal, RATEOUT (1B, 2A), is a voltage proportional to angular rate about the axis normal to the top surface of the package. The output is ratiometric with respect to a provided reference supply. A single external resistor between SUMJ and RATEOUT can be used to lower the scale factor. An external capacitor sets the bandwidth. Other external capacitors are required for operation.
A temperature output is provided for compensation techniques. Two digital self-test inputs electromechanically excite the sensor to test proper operation of both the sensor and the signal conditioning circuits. The ADXRS614 is available in a 7 mm × 7 mm × 3 mm BGA chip scale package.

FUNCTIONAL BLOCK DIAGRAM

+5
(ADC REF)
100nF
100nF
+5V
+5V
AV
CC
AGND
V
DD
PGND
ST2 ST1 TEMP V
SELF-TEST
AMP
22nF
MECHANICAL
SENSOR
CHARGE PUMP AND VOLTAGE
REGULATOR
22nF
DRIVE
CP1 CP2 CP3 CP4 CP5 SUM J RATEOUT
25k
@ 25°C
100nF
AC
AMP
RATIO
25k
C
OUT
Figure 1. ADXRS614 Block Diagram
VGA
200k ±5%
100nF
ADXRS614
DEMOD
06748-001
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2007 Analog Devices, Inc. All rights reserved.
Page 2
ADXRS614

TABLE OF CONTENTS

Features .............................................................................................. 1
Theory of Operation .........................................................................9
Applications....................................................................................... 1
General Description......................................................................... 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications..................................................................................... 3
Absolute Maximum Ratings............................................................ 4
Rate Sensitive Axis ....................................................................... 4
ESD Caution.................................................................................. 4
Pin Configuration and Function Descriptions............................. 5
Typical Performance Characteristics ............................................. 6

REVISION HISTORY

4/07—Revision 0: Initial Version
Setting Bandwidth.........................................................................9
Temperature Output and Calibration.........................................9
Calibrated Performance................................................................9
ADXRS614 and Supply Ratiometricity ......................................9
Null Adjustment ......................................................................... 10
Self-Test Function ...................................................................... 10
Continuous Self-Test.................................................................. 10
Outline Dimensions ....................................................................... 11
Ordering Guide .......................................................................... 11
Rev. 0 | Page 2 of 12
Page 3
ADXRS614

SPECIFICATIONS

All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed.
@T
= −40°C to +105°C, VS = AV
A
= 100 μA, ±1 g, unless otherwise noted.
I
OUT
Table 1.
Parameter Conditions
SENSITIVITY (Ratiometric)
Measurement Range
1
2
Initial and Over Temperature Temperature Drift
3
Nonlinearity Best fit straight line 0.1 % of FS
NULL (Ratiometric)
1
Null −40°C to +105°C 2.5 V Linear Acceleration Effect Any axis 0.1 °/sec/g
NOISE PERFORMANCE
Rate Noise Density
FREQUENCY RESPONSE
Bandwidth
4
Sensor Resonant Frequency 14.5 kHz
SELF-TEST (Ratiometric)1
ST1 RATEOUT Response ST2 RATEOUT Response ST2 pin from Logic 0 to Logic 1 1.9 V Logic 1 Input Voltage 0.8 × V Logic 0 Input Voltage 0.2 × V Input Impedance To common 50
TEMPERATURE SENSOR (Ratiometric)
V
at 25°C Load = 100 MΩ 2.35 2.5 2.65 V
OUT
Scale Factor Load to V
5
S
Load to Common TURN-ON TIME Power on to ±½°/sec of final 50 ms OUTPUT DRIVE CAPABILITY
Current Drive For rated specifications 200 μA
Capacitive Load Drive 1000 pF POWER SUPPLY
Operating Voltage (VS) 4.75 5.00 5.25 V
V
Input 3 V
RATIO
Supply Current 3.5 5.0 mA TEMPERATURE RANGE
Specified Performance
1
Parameter is linearly ratiometric with V
2
The maximum range possible, including output swing range, initial offset, sensitivity, offset drift, and sensitivity drift at 5 V supplies.
3
From +25°C to −40°C or from +25°C to +105°C.
4
Adjusted by external capacitor, COUT.
5
For a change in temperature from 25°C to 26°C. V
= V
CC
= 5 V, V
DD
= AVCC, angular rate = 0°/s, bandwidth = 80 Hz (C
RATIO
= 0.01 µF),
OUT
ADXRS614BBGZ
Min Typ Max
Unit
Clockwise rotation is positive output Full-scale range over specifications range ±50 ±75 °/sec
22.5 25 27.5 mV/°/sec ±3 %
T
= 25°C
A
0.04
°/sec/Hz
1 1000 Hz
ST1 pin from Logic 0 to Logic 1 −1.9 V
V
RATIO
V
RATIO
1
@25°C, V
= 5 V 9
RATIO
25 25
mV/°C
S
k k
V
–40 +105 °C
.
RATIO
is ratiometric to V
TEMP
. See the Temperature Output and Calibration section for more details.
RATIO
Rev. 0 | Page 3 of 12
Page 4
ADXRS614

ABSOLUTE MAXIMUM RATINGS

Table 2.
Parameter Rating
Acceleration (Any Axis, 0.5 ms)
Unpowered, 2000 g Powered 2000 g
V
AV
DD,
CC
V
RATIO
Output Short-Circuit Duration
–0.3 V to +6.0 V AV
CC
Indefinite
(Any Pin to Common) Operating Temperature Range –55°C to +125°C Storage Temperature –65°C to +150°C
Stresses above those listed under the Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Drops onto hard surfaces can cause shocks of greater than 2000 g and can exceed the absolute maximum rating of the device. Exercise care during handling to avoid damage.

RATE SENSITIVE AXIS

The ADXRS614 is a Z-axis rate-sensing device (also called a yaw rate sensing device). It produces a positive going output voltage for clockwise rotation about the axis normal to the package top, that is, clockwise when looking down at the package lid.
RATE
AXIS
LONGITUDI NAL
AXIS
ABCD G
A1
EF
LATERAL AXIS
Figure 2. RATEOUT Signal Increases with Clockwise Rotation

ESD CAUTION

RATE OUT
VCC = 5V
+
7
1
GND
V
RATIO
/2
4.75V
RATE IN
0.25V
06748-002
Rev. 0 | Page 4 of 12
Page 5
ADXRS614
A
V

PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

CP3CP5
NC SUMJ
CP4
CP1
CP2
AV
CC
RATEOUT
7
6
5
4
3
2
1
06748-003
V
DD
RATIO
PGND
`
ST1
ST2
TEMP
GND
GF E D C BA
Figure 3. Pin Configuration
Table 4. Pin Function Descriptions
Pin No. Mnemonic Description
6D, 7D CP5
HV Filter Capacitor (0.1 nF). 6A, 7B CP4 Charge Pump Capacitor (22 nF). 6C, 7C CP3 Charge Pump Capacitor (22 nF). 5A, 5B CP1 Charge Pump Capacitor (22 nF). 4A, 4B CP2 Charge Pump Capacitor (22 nF). 3A, 3B AV
CC
Positive Analog Supply. 1B, 2A RATEOUT Rate Signal Output. 1C, 2C SUMJ Output Amp Summing Junction. 1D, 2D NC No Connect. 1E, 2E V
RATIO
Reference Supply for Ratiometric Output. 1F, 2G AGND Analog Supply Return. 3F, 3G TEMP Temperature Voltage Output. 4F, 4G ST2 Self-Test for Sensor 2. 5F, 5G ST1 Self-Test for Sensor 1. 6G, 7F PGND Charge Pump Supply Return. 6E, 7E V
DD
Positive Charge Pump Supply.
Rev. 0 | Page 5 of 12
Page 6
ADXRS614

TYPICAL PERFORMANCE CHARACTERISTICS

N > 1000 for all typical performance plots, unless otherwise noted.
18
16
14
12
10
8
6
% OF POPULATION
4
2
0
1.4
1.5
1.6
1.7
1.8
1.9
2.0
Figure 4. Null Output at 25°C (V
30
2.1
2.2
2.3
2.4
2.5
2.6
2.7
2.8
2.9
3.0
3.1
3.2
VOLTS
RATIO
3.3
= 5 V)
06748-004
3.4
3.5
3.6
35
30
25
20
15
% OF POPULATION
10
5
0
–10–9 –8 –7 –6 –5 –4 –3 –2 –1 0 3 6 8 9512 4 7 10
DRIFT (%)
Figure 7. Sensitivity Drift over Temperature
40
06748-007
25
20
15
10
% OF POPULATION
5
0
–0.6 0.6–0.5 0.1–0.4 –0.3 0–0.2 0.50.40.30.2–0.1
Figure 5. Null Drift over Temperature (V
50
45
40
35
30
25
20
% OF POPULATION
15
10
5
0
22
22.5 23 23.5 24 24.5 25 25.5 26 26. 5 27 27. 5 28
Figure 6. Sensitivity at 25°C (V
º/s/ºC
mV/º/s
RATIO
RATIO
= 5 V)
= 5 V)
35
30
25
20
15
% OF POPULATION
10
5
06748-005
06748-006
0
–2.5 –2.4 –2.3 –2.2 –2.1 –2 –1.9 –1.8 –1.7 –1.6 –1. 5 –1.4
VOLTS
Figure 8. ST1 Output Change at 25°C (V
40
35
30
25
20
15
% OF POPULATION
10
5
0
VOLTS
Figure 9. ST2 Output Change at 25°C (V
RATIO
RATIO
= 5 V)
= 5 V)
–1.3
2.51.3 1.4 1.5 1.6 1. 7 1.8 1.9 2 2.1 2.2 2.3 2.4
06748-008
06748-009
Rev. 0 | Page 6 of 12
Page 7
ADXRS614
14
12
10
8
6
% OF POPULATION
4
2
0
50 54 58 62 66 70 74 78 82 86 90 94 98
º/s
Figure 10 .Measurement Range
2.5
2
1.5
1
0.5
0
VOLTS
–0.5
–1
–1.5
–2
–2.5
–40 120
–20 0 20 40 60 80 100
TEMPERATURE (ºC)
Figure 11. Typical Self-Test Change over Temperature
30
25
20
06748-010
06748-011
40
35
30
25
20
15
% OF POPULATION
10
5
0
2.40 2.42 2.44 2.46 2.48 2.50 2.54 2.56 2.58 2.602.52
VOLTS
Figure 13. V
3.3
3.1
2.9
2.7
2.5
2.3
VOLTS
2.1
1.9
1.7
1.5 –40 –20 0 20 40 60 100 12080
Figure 14. V
60
50
40
30
Output at 25°C (V
TEMP
TEMPERATURE ( °C)
Output over Temperature (V
TEMP
RATIO
= 5 V)
256 PARTS
RATIO
= 5 V)
REF
Y
X
+45°
–45°
06748-013
06748-014
15
10
% OF POPULATION
5
0
2.5
2.6
2.7
2.8
2.9
3.0
3.1
3.2
3.3
3.4
(mA)
Figure 12. Current Consumption at 25°C (V
20
g OR °/s
10
0
–10
06748-012
3.5
3.6
3.7
3.8
3.9
4.0
4.1
4.2
4.3
4.4
4.5
= 5 V)
RATIO
–20
750 770 810 830 850790
TIME (ms)
Figure 15. g and g × g Sensitivity for a 50 g, 10 ms Pulse
06748-015
Rev. 0 | Page 7 of 12
Page 8
ADXRS614
1.6
1.4
0.10
1.2
1.0
0.8
(°/s)
0.6
0.4
0.2
0
100 10k
1k
(Hz)
Figure 16. Typical Response to 10 g Sinusoidal Vibration
(Sensor Bandwidth = 2 kHz)
400
300
DUT1 OFFS ET BY +200°/ s
DUT2 OFFS ET BY –200°/ s
(°/s)
200
100
0
–100
–200
–300
LAT
LONG
RATE
0.05
0
(°/s)
–0.05
–0.10
0112010080604020
06748-016
TIME (Hours)
40
06748-019
Figure 19. Typical Shift in 90 sec Null Averages Accumulated
over 140 Hours
0.10
0.05
0
(°/s)
–0.05
–400
0 250150100 20050
(ms)
Figure 17. Typical High g (2500 g) Shock Response
(Sensor Bandwidth = 40 Hz)
1
0.1
(°/s rms)
0.01
0.001
0.01 0.1 100k10k1k100101
AVERAGE TIME (Seconds)
Figure 18. Typical Root Allan Deviation at 25°C vs. Averaging Time
–0.10
0 360018001200 30002400600
06748-017
TIME (S econds)
06748-020
Figure 20. Typical Shift in Short Term Null (Bandwidth = 1 Hz)
0.1
0.01
(°/s/ Hz rms)
0.001
0.0001 10 100k1k100
06748-018
(Hz)
10k
06748-021
Figure 21. Typical Noise Spectral Density (Bandwidth = 40 Hz)
Rev. 0 | Page 8 of 12
Page 9
ADXRS614
(
)
V

THEORY OF OPERATION

The ADXRS614 operates on the principle of a resonator gyro. Two polysilicon sensing structures each contain a dither frame that is electrostatically driven to resonance, producing the necessary velocity element to produce a Coriolis force during angular rate. At two of the outer extremes of each frame, orthogonal to the dither motion, are movable fingers that are placed between fixed pickoff fingers to form a capacitive pickoff structure that senses Coriolis motion. The resulting signal is fed to a series of gain and demodulation stages that produce the electrical rate signal output. The dual-sensor design rejects external g-forces and vibration. Fabricating the sensor with the signal conditioning electronics preserves signal integrity in noisy environments.
The electrostatic resonator requires 18 V to 20 V for operation. Because only 5 V are typically available in most applications, a charge pump is included on-chip. If an external 18 V to 20 V supply is available, the two capacitors on CP1 through CP4 can be omitted and this supply can be connected to CP5 (Pin 6D, Pin 7D). Note that CP5 should not be grounded when power is applied to the ADXRS614. Although no damage occurs, under certain conditions the charge pump may fail to start up after the ground is removed without first removing power from the ADXRS614.

SETTING BANDWIDTH

External Capacitor C chip R
resistor to create a low-pass filter to limit the
OUT
bandwidth of the ADXRS614 rate response. The –3 dB frequency set by R
OUT
()
and can be well controlled because R during manufacturing to be 200 kΩ ±1%. Any external resistor applied between the RATEOUT pin (1B, 2A) and SUMJ pin (1C, 2C) results in:
=
R
OUT
()
In general, an additional hardware or software filter is added to attenuate high frequency noise arising from demodulation spikes at the gyro’s 14 kHz resonant frequency (the noise spikes at 14 kHz can be clearly seen in the power spectral density curve shown in
Figure 21). Typically, this additional filter’s corner frequency is set to greater than 5× the required bandwidth to preserve good phase response.
Figure 22 shows the effect of adding a 250 Hz filter to the output of an ADXRS614 set to 40 Hz bandwidth (as shown in Figure 21). High frequency demodulation artifacts are attenuated by approximately 18 dB.
is used in combination with the on-
OUT
OUT
k200
k200
and C
1
×
+
is:
OUT
CRf×××=π2
OUTOUT
has been trimmed
OUT
R
EXT
R
EXT
0.1
0.01
0.001
0.0001
(°/s/ Hz rms)
0.00001
0.000001 10 100k1k100
(Hz)
Figure 22. Noise Spectral Density with Additional 250 Hz Filter
10k

TEMPERATURE OUTPUT AND CALIBRATION

It is common practice to temperature-calibrate gyros to improve their overall accuracy. The ADXRS614 has a temperature proportional voltage output that provides input to such a calibration method. The temperature sensor structure is shown in
Figure 23. The temperature output is characteristically nonlinear, and any load resistance connected to the TEMP output results in decreasing the TEMP output and temperature coefficient. Therefore, buffering the output is recommended.
The voltage at the TEMP pin (3F, 3G) is nominally 2.5 V at 25°C and V
= 5 V. The temperature coefficient is ~9 mV/°C
RATIO
at 25°C. Although the TEMP output is highly repeatable, it has only modest absolute accuracy.
V
RATIO
R
FIXED
Figure 23. ADXRS614 Temperature Sensor Structure
R
TEMP
TEMP
6748-023

CALIBRATED PERFORMANCE

Using a 3-point calibration technique, it is possible to calibrate the null and sensitivity drift of the ADXRS614 to an overall accuracy of nearly 200°/hour. An overall accuracy of 40°/hour or better is possible using more points.
Limiting the bandwidth of the device reduces the flat-band noise during the calibration process, improving the measurement accuracy at each calibration point.

ADXRS614 AND SUPPLY RATIOMETRICITY

The ADXRS614 RATEOUT and TEMP signals are ratiometric to the V temperature outputs are proportional to V ADXRS614 is most easily used with a supply-ratiometric ADC that results in self-cancellation of errors due to minor supply variations. There is some small error due to nonratiometric
voltage, that is, the null voltage, rate sensitivity, and
RATIO
. Thus, the
RATIO
6748-022
Rev. 0 | Page 9 of 12
Page 10
ADXRS614
behavior. Typical ratiometricity error for null, sensitivity, self­test, and temperature output is outlined in
Note that V
must never be greater than AV
RATIO
Table 3. Ratiometricity Error for Various Parameters
Parameter VS = V
= 4.75 V VS = V
RATIO
ST1
Mean −0.4% −0.3% Sigma 0.6% 0.6%
ST2
Mean −0.4% −0.3% Sigma 0.6% 0.6%
Null
Mean −0.04% −0.02% Sigma 0.3% 0.2%
Sensitivity
Mean 0.03% 0.1% Sigma 0.1% 0.1%
V
TEMP
Mean −0.3% −0.5% Sigma 0.1% 0.1%

NULL ADJUSTMENT

The nominal 2.5 V null is for a symmetrical swing range at RATEOUT (1B, 2A). However, a nonsymmetrical output swing may be suitable in some applications. Null adjustment is possible by injecting a suitable current to SUMJ (1C, 2C). Note that supply disturbances may reflect some null instability. Digital supply noise should be avoided particularly in this case.
Tabl e 3.
CC.
RATIO
= 5.25 V

SELF-TEST FUNCTION

The ADXRS614 includes a self-test feature that actuates each of the sensing structures and associated electronics as if subjected to angular rate. It is activated by standard logic high levels applied to Input ST1 (5F, 5G), Input ST2 (4F, 4G), or both. ST1 causes the voltage at RATEOUT to change about −1.9 V, and ST2 causes an opposite change of +1.9 V. The self-test response follows the viscosity temperature dependence of the package atmosphere, approximately 0.25%/°C.
Activating both ST1 and ST2 simultaneously is not damaging. ST1 and ST2 are fairly closely matched (±5%), but actuating both simultaneously may result in a small apparent null bias shift proportional to the degree of self-test mismatch.
ST1 and ST2 are activated by applying a voltage of greater than
0.8 × V deactivated by applying a voltage of less than 0.2 × V
to the ST1 and ST2 pins. ST1 and ST2 are
RATIO
RATIO
to the ST1 pin and the ST2 pin. The voltage applied to ST1 and ST2 must never be greater than AV
.
CC

CONTINUOUS SELF-TEST

The one-chip integration of the ADXRS614 gives it higher reliability than is obtainable with any other high volume manufacturing method. In addition, it is manufactured under a mature BiMOS process with field-proven reliability. As an additional failure detection measure, a power-on self-test can be performed. However, some applications may warrant continuous self-test while sensing rate. Details outlining continuous self-test techniques are also available in a separate application note.
Rev. 0 | Page 10 of 12
Page 11
ADXRS614

OUTLINE DIMENSIONS

7.05
6.85 SQ
6.70
76543
*
A1 CORNER
INDEX AREA
21
A
B
C
D
E
F
G
3.30 MAX
2.50 MIN
COPLANARIT Y
0.15
060506-A
3.80 MAX
A1 BALL PAD INDICATOR
4.80
TOP VIEW
DETAIL A
BSC SQ
0.80 BSC
(BALL PITCH)
DETAIL A
0.60
0.25
SEATING
PLANE
*
BALL A1 IDENTIFIER IS GOLD PLATED AND CONNECTED
TO THE D/A PAD INTERNALL Y VIA HOLE S.
0.60
0.55
0.50
BALL DIAMETER
T
M
O
B
T
O
W
V
IE
Figure 24. 32-Lead Ceramic Ball Grid Array [CBGA]
(BG-32-3)
Dimensions shown in millimeters

ORDERING GUIDE

Model Temperature Range Package Description Package Option
ADXRS614BBGZ ADXRS614BBGZ-RL EVAL-ADXRS614Z
1
Z = RoHS Compliant Part.
1
1
1
–40°C to +105°C 32-Lead Ceramic Ball Grid Array (CBGA) BG-32-3 –40°C to +105°C 32-Lead Ceramic Ball Grid Array (CBGA) BG-32-3 Evaluation Board
Rev. 0 | Page 11 of 12
Page 12
ADXRS614
NOTES
©2007 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D06748-0-4/07(0)
Rev. 0 | Page 12 of 12
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