Complete rate gyroscope on a single chip
Z-axis (yaw-rate) response
High vibration rejection over wide frequency
2000 g powered shock survivability
Self-test on digital command
Temperature sensor output
Precision voltage reference output
Absolute rate output for precision applications
5 V single-supply operation
Ultra small and light (< 0.15 cc, < 0.5 gram)
APPLICATIONS
GPS navigation systems
Image stabilization
Inertial measurement units
Platform stabilization
FUNCTIONAL BLOCK DIAGRAM
–
+
5V
100nF100nF
AVCC
ST1
ST2
5G
4G
SELF
TEST
3A
RATE
SENSOR
2G1F
GENERAL DESCRIPTION
The ADXRS401 is a functionally complete and low cost angular
rate sensor (gyroscope), integrated with all of the required
electronics on one chip. It is manufactured using Analog
Devices’ surface-micromachining technique, the same high
volume BIMOS process used for high reliability automotive
airbag accelerometers. It is available in a 7 mm × 7 mm × 3 mm
BGA surface-mount package.
The output signal, RATEOUT (1B, 2A), is a voltage proportional
to angular rate about the axis normal to the top surface of the
package (see Figure 2). A single external resistor can be used to
lower the scale factor. An external capacitor is used to set the
bandwidth. Other external capacitors are required for operation
(see Figure 1).
A precision reference and a temperature output are also
provided for compensation techniques. Two digital self-test
inputs electromechanically excite the sensor to test proper
operation of both sensors and the signal conditioning circuits.
AGND
CORIOLIS SIGNAL CHANNEL
π
DEMOD
RESONATOR LOOP
≈
Gyro with Signal Conditioning
ADXRS401
C
OUT
SEN
SUMJ
1C
R
OUT
2
180kΩ 1%
1B
RATEOUT
2A
CMID
1D
R
SEN
9kΩ±35%≈9kΩ±35%
S
1
CHARGE PUMP/REG.
CP1
PDD
PGND
100nF
4A5A7E6G
CP2
22nF
ADXRS401
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
SENSITIVITY Top view clockwise rotation is positive output
Dynamic Range
1
Scale Factor
Nonlinearity Best fit straight line 0.1 % of FS
NULL
Initial Null 2.50 V
Turn-On Time Power on to ± ½°/s of final 35 ms
Linear Acceleration Effect Any axis 0.2 °/s/g
NOISE PERFORMANCE
Rate Noise @ 10 Hz bandwidth 3 mV (rms)
FREQUENCY RESPONSE
3 dB Bandwidth2 (User Selectable) 22 nF as C
Sensor Resonant Frequency 14 kHz
SELF TEST
ST1 RATEOUT Response
3
ST2 RATEOUT Response3 ST2 pin from Logic 0 to 1 +800 mV
Logic 1 Input Voltage Standard high logic level definition 3.3 V
Logic 0 Input Voltage Standard low logic level definition 1.7 V
Input Impedance To common 50
TEMPERATURE SENSOR
V
at 298K 2.50 V
OUT
Max Current Load on Pin Source to common 50 µA
Scale Factor Proportional to absolute temperature 8.4 mV/K
OUTPUT DRIVE CAPABILITY
Output Voltage Swing I
Capacitive Load Drive 1000 pF
2.5 V REFERENCE
Voltage Value 2.5 V
Load Drive to Ground Source 200 µA
Load Regulation 0 < I
POWER SUPPLY
Operating Voltage Range 4.75 5.00 5.25 V
Quiescent Supply Current 6.0 8.0 mA
Dynamic range is the maximum full-scale measurement range possible, including output swing range, initial offset, sensitivity, offset drift, and sensitivity drift at 5 V
supplies.
2
Frequency at which response is 3 dB down from dc response with specified compensation capacitor value. Internal pole forming resistor is 180 kΩ. See the S
Bandwidth
3
Self-test response varies with temperature. See the section for details. Self-Test Function
section.
etting
Rev. 0 | Page 3 of 12
ADXRS401
A
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
Acceleration (Any Axis, Unpowered, 0.5 ms) 2000 g
Acceleration (Any Axis, Powered, 0.5 ms) 2000 g
+V
S
Output Short-Circuit Duration (Any Pin to
Common)
Operating Temperature Range
Storage Temperature
−0.3 V to +6.0 V
Indefinite
−55°C to +125°C
−65°C to +150°C
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Stresses above those listed under the Absolute Maximum
Ratings may cause permanent damage to the device. This is a
stress rating only; functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Applications requiring more than 200 cycles to MIL-STD-883
Method 1010 Condition B (–55°C to +125°C) require underfill
or other means to achieve this requirement.
Drops onto hard surfaces can cause shocks of greater than
2000 g and exceed the absolute maximum rating of the device.
Care should be exercised in handling to avoid damage.
RATE-SENSITIVE AXIS
This Z-axis rate-sensing device is also called a yaw-rate sensing
device. It produces a positive-going output voltage for clockwise
rotation about the axis normal to the package top (clockwise
when looking down at the package lid).
RATE
AXIS
LONGITUDINAL
AXIS
ABCDEFG
1
LATERAL AXIS
Figure 2. RATEOUT Signal Increases with Clockwise Rotation
VCC= 5V
7
1
GND
RATEOUT
2.5V
4.75V
RATE IN
0.25V
04992-002
Rev. 0 | Page 4 of 12
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