±70 g, ±250 g, and ±500 g wideband ranges available
22 kHz resonant frequency structure
High linearity: 0.2% of full scale
Low noise: 4 mg/√Hz
Sensitive axis in the plane of the chip
Frequency response down to dc
Full differential signal processing
High resistance to EMI/RFI
Complete electromechanical self-test
Output ratiometric to supply
Velocity preservation during acceleration input overload
Low power consumption: 2.5 mA typical
8-terminal, hermetic ceramic, LCC package
The ADXL001 is a major advance over previous generations of
accelerometers providing high performance and wide bandwidth.
This part is ideal for industrial, medical, and military applications
where wide bandwidth, small size, low power, and robust
performance are essential.
FUNCTIONAL BLOCK DIAGRAM
S
V
DD
TIMING
V
DD2
GENERATOR
Wide Bandwidth Accelerometer
ADXL001
Using the Analog Devices, Inc. proprietary fifth-generation
iMEMs® process enables the ADXL001 to provide the desired
dynamic range that extends from ±70 g to ±500 g in combination with 22 kHz of bandwidth. The accelerometer output
channel passes through a wide bandwidth differential-to-singleended converter, which allows access to the full mechanical
performance of the sensor.
The part can operate on voltage supplies from 3.3 V to 5 V.
The ADXL001 also has a self-test (ST) pin that can be asserted to
verify the full electromechanical signal chain for the accelerometer
channel.
The ADXL001 is available in the industry-standard 8-terminal
LCC and is rated to work over the extended industrial temperature
range (−40°C to +125°C).
15
12
9
6
3
0
–3
RESPONSE (d B)
–6
–9
–12
–15
1101001k10k100k
Figure 1. Sensor Frequency Response
ADXL001
FREQUENCY (Hz)
07510-102
DIFFERENTIAL
MOD
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Noise 10 Hz to 400 Hz 55 60 70 mg rms
Noise Density 10 Hz to 400 Hz 2.15 2.35 2.76 mg/√Hz
FREQUENCY RESPONSE
−3 dB Frequency 32 32 32 kHz
−3 dB Frequency Drift
2 2 2 %
Over Temperature
SELF-TEST
Output Voltage Change 1435 445 217 mV
Logic Input High 3.3 3.3 3.3 V
Logic Input Low 0.66 0.66 0.66 V
Input Resistance To ground 30 50 30 50 30 50 kΩ
OUTPUT AMPLIFIER
Output Swing I
= ±100 μA 0.2 VS − 0.2 0.2 VS − 0.2 0.2 VS − 0.2 V
OUT
Capacitive Load 1000 1000 1000 pF
PSRR (CFSR) DC to 1 MHz 0.9 0.9 0.9 V/V
POWER SUPPLY (VS)
Functional Range 3.135 6 3.135 6 3.135 6 V
I
4.5 9 4.5 9 4.5 9 mA
SUPPLY
Turn-On Time 10 10 10 ms
2 2 2 %
g
Rev. A | Page 4 of 16
ADXL001
RECOMMENDED SOLDERING PROFILE
Table 3. Soldering Profile Parameters
Profile Feature Sn63/Pb37 Pb-Free
Average Ramp Rate (TL to TP) 3°C/sec maximum 3°C/sec maximum
Preheat
Minimum Temperature (T
Maximum Temperature (T
Time (T
T
SMAX
to T
SMIN
), ts 60 sec to 120 sec 60 sec to 150 sec
SMAX
to TL
Ramp-Up Rate 3°C/sec 3°C/sec
Time Maintained Above Liquidous (tL)
Liquidous Temperature (TL) 183°C 217°C
Liquidous Time (tL) 60 sec to 150 sec 60 sec to 150 sec
Peak Temperature (TP) 240°C + 0°C/−5°C 260°C + 0°C/−5°C
Time Within 5°C of Actual Peak Temperature (tP) 10 sec to 30 sec 20 sec to 40 sec
Ramp-Down Rate 6°C/sec maximum 6°C/sec maximum
Time 25°C to Peak Temperature (t
Soldering Profile Diagram
) 100°C 150°C
SMIN
) 150°C 200°C
SMAX
) 6 minute maximum 8 minute maximum
PEAK
CRITICAL ZONE
TO T
t
T
P
T
L
T
SMAX
RAMP-UP
P
T
L
P
t
L
T
SMIN
t
TEMPERATURE (T)
S
PREHEAT
t
PEAK
TIME (t)
RAMP-DOWN
07510-022
Figure 3. Soldering Profile Diagram
Rev. A | Page 5 of 16
ADXL001
ABSOLUTE MAXIMUM RATINGS
Table 4.
Parameter Rating
Acceleration (Any Axis, Unpowered and
Powered)
Supply Voltage, VS −0.3 V to +7.0 V
Output Short-Circuit Duration (V
Storage Temperature Range −65°C to +150°C
Operating Temperature Range −55°C to +125°C
Soldering Temperature (Soldering, 10 sec) 245°C
to GND) Indefinite
OUT
4000 g
Drops onto hard surfaces can cause shocks of greater than
4000 g and can exceed the absolute maximum rating of the
device. Exercise care during handling to avoid damage.
ESD CAUTION
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Rev. A | Page 6 of 16
ADXL001
V
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
DD2
8
DNC = DO NOT CONNE CT
Table 5. Pin Function Descriptions
Pin No. Mnemonic Description
1, 2, 5 DNC Do Not Connect.
3 COM Common.
4 ST Self-Test Control (Logic Input).
6 X
7 VDD 3.135 V to 6 V. Connect to V
8 V
X-Axis Acceleration Output.
OUT
3.135 V to 6 V. Connect to VDD.
DD2
DD2
1
DNC
2
DNC
3
COM
ADXL001
(Not to Scale)
Figure 4. Pin Configuration
.
4
ST
TOP VIEW
7
V
DD
6
X
OUT
5
DNC
07510-004
Rev. A | Page 7 of 16
ADXL001
TYPICAL PERFORMANCE CHARACTERISTICS
VS = 3.3 V, TA = 25°C, unless otherwise noted.
60
25
50
40
30
20
PERCENT OF POPULATI ON
10
0
–0.07
–0.06
–0.05
–0.04
–0.03
–0.02
–0.01
VOLTS
0
0.01
0.02
0.03
Figure 5. Zero-g Bias Deviation from Ideal
45
40
35
30
25
20
15
PERCENT OF POPULATI ON
10
5
0
–0.07
–0.06
–0.05
–0.04
–0.03
–0.02
–0.01
VOLTS
0
0.01
0.02
0.03
Figure 6. Zero-g Bias Deviation from Ideal (TA = 125°C)
25
20
15
10
PERCENT OF POPULATION
5
07510-005
0.04
0.05
0.06
0.07
0
15.2
15.3
15.4
15.5
15.6
15.7
15.8
16.0
15.9
16.1
16.2
16.3
16.4
(mV/g)
16.5
07510-008
16.6
16.8
16.7
Figure 8. ADXL001-70, Sensitivity Distribution (TA = 125°C)
35
30
25
20
15
10
PERCENT OF PO P UL ATION
5
07510-006
0.04
0.05
0.06
0.07
0
4.32
4.34
4.36
4.38
4.42
4.44
4.46
4.30
4.40
(mV/g)
4.48
4.50
07510-024
4.52
4.54
Figure 9: ADXL001-250, Sensitivity Distribution
30
20
15
10
PERCENT OF PO P UL ATION
5
0
15.2
15.3
15.4
15.5
15.6
15.7
15.8
15.9
(mV/g)
Figure 7. ADXL001-70, Sensitivity Distribution
25
20
15
10
PERCENT OF POPULATION
5
07510-007
16.0
16.1
16.2
16.3
16.4
16.6
16.5
16.8
16.7
0
4.32
4.34
4.36
4.38
4.42
4.44
4.46
4.48
4.30
4.40
(mV/g)
4.52
4.50
07510-025
4.56
4.54
Figure 10: ADXL001-250, Sensitivity Distribution (TA = 125°C)
Rev. A | Page 8 of 16
ADXL001
30
30
25
20
15
10
PERCENT OF POPULATION
5
0
2.17
2.18
2.19
2.21
2.22
2.23
2.24
2.25
2.20
(mV/g)
2.26
Figure 11. ADXL001-500, Sensitivity Distribution
30
25
20
15
10
PERCENT OF POPULATION
5
0
2.17
2.18
2.19
2.21
2.22
2.23
2.24
2.25
2.26
2.28
2.20
(mV/g)
2.27
Figure 12. ADXL001-500, Sensitivity Distribution (TA = 125°C)
25
25
20
15
10
PERCENT OF POPULATION
5
07510-026
2.27
0
110
112
114
116
118
120
122
126
124
128
130
132
134
138
(mV)
136
07510-028
142
140
Figure 14. ADXL001-250, Self-Test Delta
40
35
30
25
20
15
10
PERCENT OF POPULATION
5
07510-027
2.29
0
55 56 57 58 59 60 61 62 63 64 65 66 67
(mV)
07510-029
Figure 15. ADXL001-500, Self-Test Delta
30
20
15
10
PERCENT OF PO P UL ATION
5
435
07510-009
440
0
360
365
370
375
380
385
390
400
395
405
410
415
420
430
425
(mV)
Figure 13. ADXL001-70, Self-Test Delta
25
20
15
10
PERCENT OF PO P UL ATION
5
0
2.000
2.075
2.150
2.225
2.300
2.375
2.450
2.600
2.525
2.675
2.750
Figure 16. I
(mA)
Distribution
SUPPLY
07510-010
2.825
2.900
Rev. A | Page 9 of 16
ADXL001
40
35
30
25
20
15
10
PERCENT OF POPULATION
5
07510-012
2.925
3.000
07510-011
CH1 500mV
B
CH2 500mV
W
B
M10.0µsA CH2 1. 38V
W
T 42.80%
Figure 18. Turn-On Characteristic (10 μs per DIV)
0
2.100
2.175
2.250
2.325
2.400
2.475
2.550
2.700
2.625
2.775
(mA)
Figure 17. I
SUPPLY
at 125°C
2.850
Rev. A | Page 10 of 16
ADXL001
THEORY OF OPERATION
DESIGN PRINCIPLES
The ADXL001 accelerometer provides a fully differential sensor
structure and circuit path for excellent resistance to EMI/RFI
interference.
This latest generation SOI MEMS device takes advantage
of mechanically coupled but electrically isolated differential
sensing cells. This improves sensor performance and size
because a single proof mass generates the fully differential
signal. The sensor signal conditioning also uses electrical
feedback with zero-force feedback for improved accuracy
and stability. This force feedback cancels out the electrostatic
forces contributed by the sensor circuitry.
Figure 19 is a simplified view of one of the differential sensor
cell blocks. Each sensor block includes several differential
capacitor unit cells. Each cell is composed of fixed plates attached
to the device layer and movable plates attached to the sensor
frame. Displacement of the sensor frame changes the differential
capacitance. On-chip circuitry measures the capacitive change.
MECHANICAL SENSOR
The ADXL001 is built using the Analog Devices SOI MEMS
sensor process. The sensor device is micromachined in-plane
in the SOI device layer. Trench isolation is used to electrically
isolate, but mechanically couple, the differential sensing elements.
Single-crystal silicon springs suspend the structure over the
handle wafer and provide resistance against acceleration forces.
ANCHOR
MOVABLE
PLATE
CAPACITORS
UNIT
SENSING
CELL
ACCELERATION
Figure 19. Simplified View of Sensor Under Acceleration
MOVING
PLATE
FIXED
PLATES
ANCHOR
FRAME
UNIT
FORCING
CELL
07510-019
Rev. A | Page 11 of 16
ADXL001
V
APPLICATIONS INFORMATION
APPLICATION CIRCUIT
Figure 20 shows the standard application circuit for the ADXL001.
Note that V
and V
DD
should always be connected together.
DD2
The output is shown connected to a 1000 pF output capacitor
for improved EMI performance and can be connected directly
to an ADC input. Use standard best practices for interfacing
with an ADC and do not omit an appropriate antialiasing filter.
S
C
VDD
0.1µF
DNC
DNC
COM
ST
DNC = DO NOT CONNE CT
1
2
3
Figure 20. Application Circuit
V
DD2
8
ADXL001
TOP VIEW
(Not to Scale)
4
ST
V
DD
7
X
OUT
6
C
OUT
5
1nF
DNC
X
OUT
07510-023
SELF-TEST
The fixed fingers in the forcing cells are normally kept at the
same potential as that of the movable frame. When the digital
self-test input is activated, the ADXL001 changes the voltage on
the fixed fingers in these forcing cells on one side of the moving
plate. This potential creates an attractive electrostatic force, causing
the sensor to move toward those fixed fingers. The entire signal
channel is active; therefore, the sensor displacement causes a
change in X
operation of the sensor, interface electronics, and accelerometer
channel electronics.
Do not expose the ST pin to voltages greater than V
this cannot be guaranteed due to the system design (for instance, if
there are multiple supply voltages), then a low V
diode between ST and V
. The ADXL001 self-test function verifies proper
OUT
+ 0.3 V. If
S
clamping
F
is recommended.
S
ACCELERATION SENSITIVE AXIS
The ADXL001 is an x-axis acceleration and vibration-sensing
device. It produces a positive-going output voltage for vibration
toward its Pin 8 marking.
PIN 8
07510-002
Figure 21. X
Increases with Acceleration in the Positive X-Axis Direction
OUT
OPERATING VOLTAGES OTHER THAN 5 V
The ADXL001 is specified at VS = 3.3 V and VS = 5 V. Note that
some performance parameters change as the voltage is varied.
In particular, the X
sensitivity with supply. The output sensitivity (or scale factor) scales
proportionally to the supply voltage. At V
sensitivity is typically 16 mV/g. At V
is nominally 24.2 mV/g. X
V
/2 at all supply voltages.
S
3.5
3.0
2.5
2.0
ZERO-g BIAS (V)
1.5
1.0
3.23.74.24.75.25.7
Figure 22. Typical Zero-g Bias Levels Across Varying Supply Voltages
Self-test response in gravity is roughly proportional to the cube
of the supply voltage. For example, the self-test response for the
ADXL001-70 at V
the self-test response for the ADXL001-70 is approximately
400 mV. To calculate the self-test value at any operating voltage
other than 3.3 V or 5 V, the following formula can be applied:
(STΔ @ V
where:
V
is the desired supply voltage.
X
is 3.3 V or 5 V.
V
S
output exhibits ratiometric offset and
OUT
= 3.3 V, the output
S
= 5 V, the output sensitivity
S
zero-g bias is nominally equal to
OUT
NOMINAL ZERO-g
HIGH LIM IT
LOW LIMIT
SUPPLY VOLT AG E ( V)
= 5 V is approximately 1.4 V. At VS = 3.3 V,
S
) = (STΔ @ VS) × (VX/VS)3
X
07510-016
Rev. A | Page 12 of 16
ADXL001
LAYOUT, GROUNDING, AND BYPASSING CONSIDERATIONS
CLOCK FREQUENCY SUPPLY RESPONSE
In any clocked system, power supply noise near the clock
frequency may have consequences at other frequencies. An
internal clock typically controls the sensor excitation and the
signal demodulator for micromachined accelerometers.
If the power supply contains high frequency spikes, they may be
demodulated and interpreted as acceleration signals. A signal
appears at the difference between the noise frequency and the
demodulator frequency. If the power supply noise is 100 Hz
away from the demodulator clock, there is an output term at
100 Hz. If the power supply clock is at exactly the same frequency
as the accelerometer clock, the term appears as an offset. If the
difference frequency is outside the signal bandwidth, the output
filter attenuates it. However, both the power supply clock and
the accelerometer clock may vary with time or temperature,
which can cause the interference signal to appear in the output
filter bandwidth.
The ADXL001 addresses this issue in two ways. First, the high
clock frequency, 125 kHz for the output stage, eases the task of
choosing a power supply clock frequency such that the difference
between it and the accelerometer clock remains well outside the
filter bandwidth. Second, the ADXL001 has a fully differential
signal path, including a pair of electrically isolated, mechanically
coupled sensors. The differential sensors eliminate most of the
power supply noise before it reaches the demodulator. Good
high frequency supply bypassing, such as a ceramic capacitor
close to the supply pins, also minimizes the amount of interference.
The clock frequency supply response (CFSR) is the ratio of the
response at the output to the noise on the power supply near the
accelerometer clock frequency or its harmonics. A CFSR of 0.9 V/V
means that the signal at the output is half the amplitude of the
supply noise. This is analogous to the power supply rejection
ratio (PSRR), except that the stimulus and the response are at
different frequencies.
POWER SUPPLY DECOUPLING
For most applications, a single 0.1 μF capacitor, CDC, adequately
decouples the accelerometer from noise on the power supply.
However, in some cases, particularly where noise is present at
the 1 MHz internal clock frequency (or any harmonic thereof),
noise on the supply can cause interference on the ADXL001
output. If additional decoupling is needed, a 50 Ω (or smaller)
resistor or ferrite bead can be inserted in the supply line.
Additionally, a larger bulk bypass capacitor (in the 1 μF to
4.7 μF range) can be added in parallel to C
DC
.
ELECTROMAGNETIC INTERFERENCE
The ADXL001 can be used in areas and applications with high
amounts of EMI or with components susceptible to EMI emissions.
The fully differential circuitry of the ADXL001 is designed to be
robust to such interference. For improved EMI performance,
especially in automotive applications, a 1000 pF output capacitor is
recommended on the X