ANALOG DEVICES ADXL001 Service Manual

High Performance,
V

FEATURES

High performance accelerometer
±70 g, ±250 g, and ±500 g wideband ranges available 22 kHz resonant frequency structure High linearity: 0.2% of full scale
Low noise: 4 mg/√Hz Sensitive axis in the plane of the chip Frequency response down to dc Full differential signal processing High resistance to EMI/RFI Complete electromechanical self-test Output ratiometric to supply Velocity preservation during acceleration input overload Low power consumption: 2.5 mA typical 8-terminal, hermetic ceramic, LCC package

APPLICATIONS

Vibration monitoring Shock detection Sports diagnostic equipment Medical instrumentation Industrial monitoring

GENERAL DESCRIPTION

The ADXL001 is a major advance over previous generations of accelerometers providing high performance and wide bandwidth. This part is ideal for industrial, medical, and military applications where wide bandwidth, small size, low power, and robust performance are essential.

FUNCTIONAL BLOCK DIAGRAM

S
V
DD
TIMING
V
DD2
GENERATOR
Wide Bandwidth Accelerometer
ADXL001
Using the Analog Devices, Inc. proprietary fifth-generation iMEMs® process enables the ADXL001 to provide the desired dynamic range that extends from ±70 g to ±500 g in combin­ation with 22 kHz of bandwidth. The accelerometer output channel passes through a wide bandwidth differential-to-single­ended converter, which allows access to the full mechanical performance of the sensor.
The part can operate on voltage supplies from 3.3 V to 5 V.
The ADXL001 also has a self-test (ST) pin that can be asserted to verify the full electromechanical signal chain for the accelerometer channel.
The ADXL001 is available in the industry-standard 8-terminal LCC and is rated to work over the extended industrial temperature range (−40°C to +125°C).
15
12
9
6
3
0
–3
RESPONSE (d B)
–6
–9
–12
–15
1 10 100 1k 10k 100k
Figure 1. Sensor Frequency Response
ADXL001
FREQUENCY (Hz)
07510-102
DIFFERENTIAL
MOD
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
SENSOR
SELF-TEST
ST
DEMOD
AMP
COM
Figure 2.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2010 Analog Devices, Inc. All rights reserved.
OUTPUT
AMPLIFIER
X
OUT
07510-001
ADXL001

TABLE OF CONTENTS

Features .............................................................................................. 1
Applications ....................................................................................... 1
General Description ......................................................................... 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications ..................................................................................... 3
Specifications for 3.3 V Operation ............................................. 3
Specifications for 5 V Operation ................................................ 4
Recommended Soldering Profile ............................................... 5
Absolute Maximum Ratings ............................................................ 6
ESD Caution .................................................................................. 6
Pin Configuration and Function Descriptions ............................. 7
Typical Performance Characteristics ............................................. 8
Theory of Operation ...................................................................... 11
Design Principles ........................................................................ 11
Mechanical Sensor ..................................................................... 11
Applications Information .............................................................. 12
Application Circuit ..................................................................... 12
Self-Test ....................................................................................... 12
Acceleration Sensitive Axis ....................................................... 12
Operating Voltages Other Than 5 V ........................................ 12
Layout, Grounding, and Bypassing Considerations .................. 13
Clock Frequency Supply Response .......................................... 13
Power Supply Decoupling ......................................................... 13
Electromagnetic Interference ................................................... 13
Outline Dimensions ....................................................................... 14
Ordering Guide .......................................................................... 14

REVISION HISTORY

2/10—Rev. 0 to Rev. A
Added -250 and -500 models ............................................ Universal
Changes to Table 1 ............................................................................ 3
Changes to Table 2 ............................................................................ 4
Added Figure 9 through Figure 18 ................................................. 8
Changes to Ordering Guide .......................................................... 14
1/09—Revision 0: Initial Version
Rev. A | Page 2 of 16
ADXL001

SPECIFICATIONS

SPECIFICATIONS FOR 3.3 V OPERATION

TA = −40°C to +125°C, VS = 3.3 V ± 5% dc, acceleration = 0 g, unless otherwise noted.
Table 1.
ADXL001-70 ADXL001-250 ADXL001-500 Parameter Conditions Min Typ Max Min Typ Max Min Typ Max Unit
SENSOR
Nonlinearity 0.2 2 0.2 2 0.2 2 %
Cross-Axis Sensitivity
Resonant Frequency 22 22 22 kHz
Quality Factor 2.5 2.5 2.5
SENSITIVITY
Full-Scale Range I
Sensitivity 100 Hz 16.0 4.4 2.2 mV/g
OFFSET Ratiometric
Zero-g Output 1.35 1.65 1.95 1.35 1.65 1.95 1.35 1.65 1.95 V
NOISE
Noise 10 Hz to 400 Hz 85 95 105 mg rms
Noise Density 10 Hz to 400 Hz 3.3 3.65 4.25 mg/√Hz
FREQUENCY RESPONSE
−3 dB Frequency 32 32 32 kHz
−3 dB Frequency Drift Over Temperature
SELF-TEST
Output Voltage Change 400 125 62 mV Logic Input High 2.1 2.1 2.1 V Logic Input Low 0.66 0.66 0.66 V Input Resistance To ground 30 50 30 50 30 50
OUTPUT AMPLIFIER
Output Swing I
Capacitive Load 1000 1000 1000 pF PSRR (CFSR) DC to 1 MHz 0.9 0.9 0.9 V/V POWER SUPPLY (VS)
Functional Range 3.135 6 3.135 6 3.135 6 V
I
2.5 5 2.5 5 2.5 5 mA
SUPPLY
Turn-On Time 10 10 10 ms
Includes package alignment
≤ ±100 μA −70 +70 −250 +250 −500 +500
OUT
2 2 2 %
= ±100 μA 0.2 VS − 0.2 0.2 VS − 0.2 0.2 VS − 0.2 V
OUT
2 2 2 %
g
Rev. A | Page 3 of 16
ADXL001

SPECIFICATIONS FOR 5 V OPERATION

TA = -40°C to +125°C, VS = 5 V ± 5% dc, acceleration = 0 g, unless otherwise noted.
Table 2.
ADXL001-70 ADXL001-250 ADXL001-500 Parameter Conditions Min Typ Max Min Typ Max Min Typ Max Unit
SENSOR
Nonlinearity 0.2 2 0.2 2 0.2 2 % Cross-Axis Sensitivity
Includes package
alignment Resonant Frequency 22 22 22 kHz Quality Factor 2.5 2.5 2.5
SENSITIVITY
Full-Scale Range I
≤ ±100 μA −70 +70 −250 +250 −500 +500
OUT
Sensitivity 100 Hz 24.2 6.7 3.3 mV/g
OFFSET Ratiometric
Zero-g Output 2.00 2.5 3.00 2.00 2.5 3.00 2.00 2.5 3.00 V
NOISE
Noise 10 Hz to 400 Hz 55 60 70 mg rms Noise Density 10 Hz to 400 Hz 2.15 2.35 2.76 mg/√Hz
FREQUENCY RESPONSE
−3 dB Frequency 32 32 32 kHz
−3 dB Frequency Drift
2 2 2 %
Over Temperature
SELF-TEST
Output Voltage Change 1435 445 217 mV Logic Input High 3.3 3.3 3.3 V Logic Input Low 0.66 0.66 0.66 V Input Resistance To ground 30 50 30 50 30 50
OUTPUT AMPLIFIER
Output Swing I
= ±100 μA 0.2 VS − 0.2 0.2 VS − 0.2 0.2 VS − 0.2 V
OUT
Capacitive Load 1000 1000 1000 pF
PSRR (CFSR) DC to 1 MHz 0.9 0.9 0.9 V/V POWER SUPPLY (VS)
Functional Range 3.135 6 3.135 6 3.135 6 V I
4.5 9 4.5 9 4.5 9 mA
SUPPLY
Turn-On Time 10 10 10 ms
2 2 2 %
g
Rev. A | Page 4 of 16
ADXL001

RECOMMENDED SOLDERING PROFILE

Table 3. Soldering Profile Parameters
Profile Feature Sn63/Pb37 Pb-Free
Average Ramp Rate (TL to TP) 3°C/sec maximum 3°C/sec maximum Preheat
Minimum Temperature (T
Maximum Temperature (T Time (T T
SMAX
to T
SMIN
), ts 60 sec to 120 sec 60 sec to 150 sec
SMAX
to TL
Ramp-Up Rate 3°C/sec 3°C/sec Time Maintained Above Liquidous (tL)
Liquidous Temperature (TL) 183°C 217°C
Liquidous Time (tL) 60 sec to 150 sec 60 sec to 150 sec Peak Temperature (TP) 240°C + 0°C/−5°C 260°C + 0°C/−5°C Time Within 5°C of Actual Peak Temperature (tP) 10 sec to 30 sec 20 sec to 40 sec Ramp-Down Rate 6°C/sec maximum 6°C/sec maximum Time 25°C to Peak Temperature (t

Soldering Profile Diagram

) 100°C 150°C
SMIN
) 150°C 200°C
SMAX
) 6 minute maximum 8 minute maximum
PEAK
CRITICAL ZONE
TO T
t
T
P
T
L
T
SMAX
RAMP-UP
P
T
L
P
t
L
T
SMIN
t
TEMPERATURE (T)
S
PREHEAT
t
PEAK
TIME (t)
RAMP-DOWN
07510-022
Figure 3. Soldering Profile Diagram
Rev. A | Page 5 of 16
ADXL001

ABSOLUTE MAXIMUM RATINGS

Table 4.
Parameter Rating
Acceleration (Any Axis, Unpowered and
Powered) Supply Voltage, VS −0.3 V to +7.0 V Output Short-Circuit Duration (V Storage Temperature Range −65°C to +150°C Operating Temperature Range −55°C to +125°C Soldering Temperature (Soldering, 10 sec) 245°C
to GND) Indefinite
OUT
4000 g
Drops onto hard surfaces can cause shocks of greater than 4000 g and can exceed the absolute maximum rating of the device. Exercise care during handling to avoid damage.

ESD CAUTION

Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Rev. A | Page 6 of 16
ADXL001
V

PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

DD2
8
DNC = DO NOT CONNE CT
Table 5. Pin Function Descriptions
Pin No. Mnemonic Description
1, 2, 5 DNC Do Not Connect. 3 COM Common. 4 ST Self-Test Control (Logic Input). 6 X 7 VDD 3.135 V to 6 V. Connect to V 8 V
X-Axis Acceleration Output.
OUT
3.135 V to 6 V. Connect to VDD.
DD2
DD2
1
DNC
2
DNC
3
COM
ADXL001
(Not to Scale)
Figure 4. Pin Configuration
.
4
ST
TOP VIEW
7
V
DD
6
X
OUT
5
DNC
07510-004
Rev. A | Page 7 of 16
ADXL001

TYPICAL PERFORMANCE CHARACTERISTICS

VS = 3.3 V, TA = 25°C, unless otherwise noted.
60
25
50
40
30
20
PERCENT OF POPULATI ON
10
0
–0.07
–0.06
–0.05
–0.04
–0.03
–0.02
–0.01
VOLTS
0
0.01
0.02
0.03
Figure 5. Zero-g Bias Deviation from Ideal
45
40
35
30
25
20
15
PERCENT OF POPULATI ON
10
5
0
–0.07
–0.06
–0.05
–0.04
–0.03
–0.02
–0.01
VOLTS
0
0.01
0.02
0.03
Figure 6. Zero-g Bias Deviation from Ideal (TA = 125°C)
25
20
15
10
PERCENT OF POPULATION
5
07510-005
0.04
0.05
0.06
0.07
0
15.2
15.3
15.4
15.5
15.6
15.7
15.8
16.0
15.9
16.1
16.2
16.3
16.4
(mV/g)
16.5
07510-008
16.6
16.8
16.7
Figure 8. ADXL001-70, Sensitivity Distribution (TA = 125°C)
35
30
25
20
15
10
PERCENT OF PO P UL ATION
5
07510-006
0.04
0.05
0.06
0.07
0
4.32
4.34
4.36
4.38
4.42
4.44
4.46
4.30
4.40
(mV/g)
4.48
4.50
07510-024
4.52
4.54
Figure 9: ADXL001-250, Sensitivity Distribution
30
20
15
10
PERCENT OF PO P UL ATION
5
0
15.2
15.3
15.4
15.5
15.6
15.7
15.8
15.9
(mV/g)
Figure 7. ADXL001-70, Sensitivity Distribution
25
20
15
10
PERCENT OF POPULATION
5
07510-007
16.0
16.1
16.2
16.3
16.4
16.6
16.5
16.8
16.7
0
4.32
4.34
4.36
4.38
4.42
4.44
4.46
4.48
4.30
4.40
(mV/g)
4.52
4.50
07510-025
4.56
4.54
Figure 10: ADXL001-250, Sensitivity Distribution (TA = 125°C)
Rev. A | Page 8 of 16
ADXL001
30
30
25
20
15
10
PERCENT OF POPULATION
5
0
2.17
2.18
2.19
2.21
2.22
2.23
2.24
2.25
2.20
(mV/g)
2.26
Figure 11. ADXL001-500, Sensitivity Distribution
30
25
20
15
10
PERCENT OF POPULATION
5
0
2.17
2.18
2.19
2.21
2.22
2.23
2.24
2.25
2.26
2.28
2.20
(mV/g)
2.27
Figure 12. ADXL001-500, Sensitivity Distribution (TA = 125°C)
25
25
20
15
10
PERCENT OF POPULATION
5
07510-026
2.27
0
110
112
114
116
118
120
122
126
124
128
130
132
134
138
(mV)
136
07510-028
142
140
Figure 14. ADXL001-250, Self-Test Delta
40
35
30
25
20
15
10
PERCENT OF POPULATION
5
07510-027
2.29
0
55 56 57 58 59 60 61 62 63 64 65 66 67
(mV)
07510-029
Figure 15. ADXL001-500, Self-Test Delta
30
20
15
10
PERCENT OF PO P UL ATION
5
435
07510-009
440
0
360
365
370
375
380
385
390
400
395
405
410
415
420
430
425
(mV)
Figure 13. ADXL001-70, Self-Test Delta
25
20
15
10
PERCENT OF PO P UL ATION
5
0
2.000
2.075
2.150
2.225
2.300
2.375
2.450
2.600
2.525
2.675
2.750
Figure 16. I
(mA)
Distribution
SUPPLY
07510-010
2.825
2.900
Rev. A | Page 9 of 16
ADXL001
40
35
30
25
20
15
10
PERCENT OF POPULATION
5
07510-012
2.925
3.000
07510-011
CH1 500mV
B
CH2 500mV
W
B
M10.0µs A CH2 1. 38V
W
T 42.80%
Figure 18. Turn-On Characteristic (10 μs per DIV)
0
2.100
2.175
2.250
2.325
2.400
2.475
2.550
2.700
2.625
2.775
(mA)
Figure 17. I
SUPPLY
at 125°C
2.850
Rev. A | Page 10 of 16
ADXL001

THEORY OF OPERATION

DESIGN PRINCIPLES

The ADXL001 accelerometer provides a fully differential sensor structure and circuit path for excellent resistance to EMI/RFI interference.
This latest generation SOI MEMS device takes advantage of mechanically coupled but electrically isolated differential sensing cells. This improves sensor performance and size because a single proof mass generates the fully differential signal. The sensor signal conditioning also uses electrical feedback with zero-force feedback for improved accuracy and stability. This force feedback cancels out the electrostatic forces contributed by the sensor circuitry.
Figure 19 is a simplified view of one of the differential sensor cell blocks. Each sensor block includes several differential capacitor unit cells. Each cell is composed of fixed plates attached to the device layer and movable plates attached to the sensor frame. Displacement of the sensor frame changes the differential capacitance. On-chip circuitry measures the capacitive change.

MECHANICAL SENSOR

The ADXL001 is built using the Analog Devices SOI MEMS sensor process. The sensor device is micromachined in-plane in the SOI device layer. Trench isolation is used to electrically isolate, but mechanically couple, the differential sensing elements. Single-crystal silicon springs suspend the structure over the handle wafer and provide resistance against acceleration forces.
ANCHOR
MOVABLE
PLATE
CAPACITORS
UNIT
SENSING
CELL
ACCELERATION
Figure 19. Simplified View of Sensor Under Acceleration
MOVING
PLATE
FIXED PLATES
ANCHOR
FRAME
UNIT FORCING CELL
07510-019
Rev. A | Page 11 of 16
ADXL001
V

APPLICATIONS INFORMATION

APPLICATION CIRCUIT

Figure 20 shows the standard application circuit for the ADXL001. Note that V
and V
DD
should always be connected together.
DD2
The output is shown connected to a 1000 pF output capacitor for improved EMI performance and can be connected directly to an ADC input. Use standard best practices for interfacing with an ADC and do not omit an appropriate antialiasing filter.
S
C
VDD
0.1µF
DNC
DNC
COM
ST
DNC = DO NOT CONNE CT
1
2
3
Figure 20. Application Circuit
V
DD2
8
ADXL001
TOP VIEW
(Not to Scale)
4
ST
V
DD
7
X
OUT
6
C
OUT
5
1nF
DNC
X
OUT
07510-023

SELF-TEST

The fixed fingers in the forcing cells are normally kept at the same potential as that of the movable frame. When the digital self-test input is activated, the ADXL001 changes the voltage on the fixed fingers in these forcing cells on one side of the moving plate. This potential creates an attractive electrostatic force, causing the sensor to move toward those fixed fingers. The entire signal channel is active; therefore, the sensor displacement causes a change in X operation of the sensor, interface electronics, and accelerometer channel electronics.
Do not expose the ST pin to voltages greater than V this cannot be guaranteed due to the system design (for instance, if there are multiple supply voltages), then a low V diode between ST and V
. The ADXL001 self-test function verifies proper
OUT
+ 0.3 V. If
S
clamping
F
is recommended.
S

ACCELERATION SENSITIVE AXIS

The ADXL001 is an x-axis acceleration and vibration-sensing device. It produces a positive-going output voltage for vibration toward its Pin 8 marking.
PIN 8
07510-002
Figure 21. X
Increases with Acceleration in the Positive X-Axis Direction
OUT

OPERATING VOLTAGES OTHER THAN 5 V

The ADXL001 is specified at VS = 3.3 V and VS = 5 V. Note that some performance parameters change as the voltage is varied.
In particular, the X sensitivity with supply. The output sensitivity (or scale factor) scales proportionally to the supply voltage. At V sensitivity is typically 16 mV/g. At V is nominally 24.2 mV/g. X V
/2 at all supply voltages.
S
3.5
3.0
2.5
2.0
ZERO-g BIAS (V)
1.5
1.0
3.2 3.7 4.2 4.7 5.2 5.7
Figure 22. Typical Zero-g Bias Levels Across Varying Supply Voltages
Self-test response in gravity is roughly proportional to the cube of the supply voltage. For example, the self-test response for the ADXL001-70 at V the self-test response for the ADXL001-70 is approximately 400 mV. To calculate the self-test value at any operating voltage other than 3.3 V or 5 V, the following formula can be applied:
(STΔ @ V
where:
V
is the desired supply voltage.
X
is 3.3 V or 5 V.
V
S
output exhibits ratiometric offset and
OUT
= 3.3 V, the output
S
= 5 V, the output sensitivity
S
zero-g bias is nominally equal to
OUT
NOMINAL ZERO-g
HIGH LIM IT
LOW LIMIT
SUPPLY VOLT AG E ( V)
= 5 V is approximately 1.4 V. At VS = 3.3 V,
S
) = (STΔ @ VS) × (VX/VS)3
X
07510-016
Rev. A | Page 12 of 16
ADXL001

LAYOUT, GROUNDING, AND BYPASSING CONSIDERATIONS

CLOCK FREQUENCY SUPPLY RESPONSE

In any clocked system, power supply noise near the clock frequency may have consequences at other frequencies. An internal clock typically controls the sensor excitation and the signal demodulator for micromachined accelerometers.
If the power supply contains high frequency spikes, they may be demodulated and interpreted as acceleration signals. A signal appears at the difference between the noise frequency and the demodulator frequency. If the power supply noise is 100 Hz away from the demodulator clock, there is an output term at 100 Hz. If the power supply clock is at exactly the same frequency as the accelerometer clock, the term appears as an offset. If the difference frequency is outside the signal bandwidth, the output filter attenuates it. However, both the power supply clock and the accelerometer clock may vary with time or temperature, which can cause the interference signal to appear in the output filter bandwidth.
The ADXL001 addresses this issue in two ways. First, the high clock frequency, 125 kHz for the output stage, eases the task of choosing a power supply clock frequency such that the difference between it and the accelerometer clock remains well outside the filter bandwidth. Second, the ADXL001 has a fully differential signal path, including a pair of electrically isolated, mechanically coupled sensors. The differential sensors eliminate most of the power supply noise before it reaches the demodulator. Good high frequency supply bypassing, such as a ceramic capacitor close to the supply pins, also minimizes the amount of interference.
The clock frequency supply response (CFSR) is the ratio of the response at the output to the noise on the power supply near the accelerometer clock frequency or its harmonics. A CFSR of 0.9 V/V means that the signal at the output is half the amplitude of the supply noise. This is analogous to the power supply rejection ratio (PSRR), except that the stimulus and the response are at different frequencies.

POWER SUPPLY DECOUPLING

For most applications, a single 0.1 μF capacitor, CDC, adequately decouples the accelerometer from noise on the power supply. However, in some cases, particularly where noise is present at the 1 MHz internal clock frequency (or any harmonic thereof), noise on the supply can cause interference on the ADXL001 output. If additional decoupling is needed, a 50 Ω (or smaller) resistor or ferrite bead can be inserted in the supply line. Additionally, a larger bulk bypass capacitor (in the 1 μF to
4.7 μF range) can be added in parallel to C
DC
.

ELECTROMAGNETIC INTERFERENCE

The ADXL001 can be used in areas and applications with high amounts of EMI or with components susceptible to EMI emissions. The fully differential circuitry of the ADXL001 is designed to be robust to such interference. For improved EMI performance, especially in automotive applications, a 1000 pF output capacitor is recommended on the X
output.
OUT
Rev. A | Page 13 of 16
ADXL001

OUTLINE DIMENSIONS

0.031
0.025
0.019
7
5 BOTTOM VIEW
DETAIL A
0.183
0.177 SQ
0.171
R 0.008
(4 PLCS)
0.208
0.197 SQ
0.188
TOP VIEW
0.22
0.15
0.08
(R 4 PLCS)
0.010
0.006
0.002
0.094
0.078
0.062
0.082
0.070
0.058
0.075 REF R 0.008
(8 PLCS)
0.055
0.050
0.045
(OPTION 2)
Figure 23. 8-Terminal Ceramic Leadless Chip Carrier [LCC]
(E-8-1)
Dimensions shown in inches

ORDERING GUIDE

Model1 Temperature Range g Range Package Description Package Option
ADXL001-70BEZ −40°C to +125°C ±70 g 8-Terminal LCC E-8-1 ADXL001-70BEZ-R7 −40°C to +125°C ±70 g 8-Terminal LCC E-8-1 ADXL001-250BEZ ADXL001-250BEZ-R7 −40°C to +125°C ±250 g 8-Terminal LCC E-8-1 ADXL001-500BEZ −40°C to +125°C ±500 g 8-Terminal LCC E-8-1 ADXL001-500BEZ-R7 −40°C to +125°C ±500 g 8-Terminal LCC E-8-1 EVAL-ADXL001-250Z Evaluation Board EVAL-ADXL001-500Z Evaluation Board EVAL-ADXL001-70Z Evaluation Board
1
Z = RoHS Compliant Part.
−40°C to +125°C ±250 g 8-Terminal LCC E-8-1
1
3
0.019 SQ
(PLATING OPTION 1, SEE DET AI L A FOR OPTIO N 2)
0.030
0.020 DIA
0.010
0.108
0.100
0.092
111808-C
Rev. A | Page 14 of 16
ADXL001
NOTES
Rev. A | Page 15 of 16
ADXL001
NOTES
©2010 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D07510-0-2/10(A)
Rev. A | Page 16 of 16
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