Enhanced system-level ESD performance per IEC 61000-4-x
High temperature operation: 125°C
Default low output
Narrow body, RoHS-compliant, 8-lead SOIC
Low power operation
5 V operation
1.7 mA per channel maximum @ 0 Mbps to 2 Mbps
3.7 mA per channel maximum @ 10 Mbps
7.0 mA per channel maximum @ 25 Mbps
3 V operation
1.5 mA per channel maximum @ 0 Mbps to 2 Mbps
2.5 mA per channel maximum @ 10 Mbps
4.7 mA per channel maximum @ 25 Mbps
3 V/5 V level translation
High data rate: dc to 25 Mbps (NRZ)
Precise timing characteristics
3 ns maximum pulse-width distortion at 5 V operation
3 ns maximum channel-to-channel matching
High common-mode transient immunity: >25 kV/μs
Safety and regulatory approvals
UL recognition: 2500 V rms for 1 minute per UL 1577
CSA Component Acceptance Notice #5A
VDE Certificate of Conformity
DIN V VDE V 0884-10 (VDE V 0884-10): 2006-12
V
= 560 V peak
IORM
Qualified for automotive applications
APPLICATIONS
Size-critical multichannel isolation
SPI interface/data converter isolation
RS-232/RS-422/RS-485 transceiver isolation
Digital field bus isolation
Gate drive interfaces
Hybrid electric vehicles, battery monitor, and motor drive
ADuM3210/ADuM3211
GENERAL DESCRIPTION
The ADuM3210/ADuM3211 are dual-channel, digital isolators
based on Analog Devices, Inc., iCoupler® technology. Combining
high speed CMOS and monolithic transformer technology, this
isolation component provides outstanding performance characteristics superior to alternatives such as optocoupler devices.
By avoiding the use of LEDs and photodiodes, iCoupler devices
remove the design difficulties commonly associated with optocouplers. The typical optocoupler concerns regarding uncertain
current transfer ratios, nonlinear transfer functions, and temperature
and lifetime effects are eliminated with the simple iCoupler digital
interfaces and stable performance characteristics. The need for
external drivers and other discrete components is eliminated
with these iCoupler products. Furthermore, iCoupler devices
consume one-tenth to one-sixth the power of optocouplers at
comparable signal data rates.
The ADuM3210/ADuM3211 isolators provide two independent
isolation channels in two channel configurations with data rates
up to 25 Mbps (see the Ordering Guide). They operate with 3.3 V
or 5 V supply voltages on either side, providing compatibility
with lower voltage systems as well as enabling voltage translation
functionality across the isolation barrier. The ADuM3210/
ADuM3211 isolators have a default output low characteristic in
comparison to the ADuM3200/ADuM3201 modelsXIJDI have a
default output high characteristic. ADuM3210W and ADuM3211W
are automotive grade versions qualified for 125°C operation.
In comparison to the ADuM120x isolator, the ADuM3210/
ADuM3211 isolators contain various circuit and layout changes
providing increased capability relative to system-level IEC 61000-4-x
testing (ESD, burst, and surge). The precise capability in these tests
for either the ADuM120x or ADuM3210/ADuM3211 products is
strongly determined by the design and layout of the user’s board or
module. For more information, see the AN-793 Application Note,
ESD/Latch-Up Considerations with iCoupler Isolation Products.
Protected by U.S. Patents 5,952,849; 6,873,065; and 7,075,239.
Rev. F
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Changes to Power Consumption Section.................................... 23
Changes to Ordering Guide.......................................................... 25
9/08—Revision A: Initial Version
Rev. F | Page 2 of 20
Data Sheet ADuM3210/ADuM3211
SPECIFICATIONS
ELECTRICAL CHARACTERISTICS—5 V, 105°C OPERATION
All typical specifications are at TA = 25°C, V
operation range: 4.5 V ≤ V
are tested with C
= 15 pF and CMOS signal levels, unless otherwise noted.
L
≤ 5.5 V, 4.5 V ≤ V
DD1
Table 1.
A Grade B Grade
Parameter Symbol Min Typ Max Min Typ Max Unit Test Conditions
SWITCHING SPECIFICATIONS
Data Rate 1 10 Mbps Within PWD limit
Propagation Delay t
PHL
, t
Pulse Width Distortion PWD 5 3 ns |t
Change vs. Temperature 6 5 ps/°C
Pulse Width PW Within PWD limit
ADuM3210 1000 22 ns
ADuM3211 1000 33 ns
Propagation Delay Skew t
20 18 ns Between any two units
PSK
Channel Matching
Codirectional t
Opposing-Direction t
PSKCD
PSKOD
Output Rise/Fall Time tR/tF 2.5 2.5 ns 10% to 90%
= V
DD1
20 50 20 50 ns 50% input to 50% output
PLH
= 5 V. Minimum/maximum specifications apply over the entire recommended
DD2
≤ 5.5 V, and −40°C ≤ TA ≤ +105°C, unless otherwise noted. Switching specifications
DD2
− t
PHL
|
PLH
5 3 ns
20 18 ns
Table 2.
1 Mbps—A Grade, B Grade 10 Mbps—B Grade
Parameter Symbol
Min Typ Max Min Typ Max
Unit Test Conditions
SUPPLY CURRENT
ADuM3210 I
I
ADuM3211 I
I
1.3 1.7 3.5 4.6 mA
DD1
1.0 1.6 1.7 2.8 mA
DD2
1.1 1.5 2.6 3.4 mA
DD1
1.3 1.8 3.1 4.0 mA
DD2
Table 3. For All Models
Parameter Symbol Min Typ Max Unit Test Conditions
DC SPECIFICATIONS
Logic High Input Threshold VIH 0.7 V
Logic Low Input Threshold VIL 0.3 V
Logic High Output Voltages VOH V
V
Logic Low Output Voltages VOL 0.0 0.1 V IOx = 20 μA, VIx = V
0.2 0.4 V IOx = 4 mA, VIx = V
Input Current per Channel II −10 +0.01 +10 μA 0 V ≤ VIx ≤ V
V
DDX
V
DDX
− 0.1 5.0 V IOx = −20 μA, VIx = V
DDX
− 0.5 4.8 V IOx = −4 mA, VIx = V
DDX
DDX
IxH
IxH
IxL
IxL
Supply Current per Channel
Quiescent Input Supply Current I
Quiescent Output Supply Current I
Dynamic Input Supply Current I
Dynamic Output Supply Current I
0.4 0.8 mA
DDI(Q)
0.4 0.8 mA
DDO(Q)
0.19 mA/Mbps
DDI(D)
0.05 mA/Mbps
DDO(D)
AC SPECIFICATIONS
Common-Mode Transient Immunity1 |CM| 25 35 kV/μs
= V
Ix
DDX
, VCM = 1000 V,
V
transient magnitude = 800 V
Refresh Rate fr 1.2 Mbps
1
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
rising and falling common-mode voltage edges.
Rev. F | Page 3 of 20
ADuM3210/ADuM3211 Data Sheet
ELECTRICAL CHARACTERISTICS—3 V, 105°C OPERATION
All typical specifications are at TA = 25°C, V
operation range: ADuM3210 supply voltages 2.7 V ≤ V
3.0 V ≤ V
≤ 3.6 V, and −40°C ≤ TA ≤ +105°C, unless otherwise noted. Switching specifications are tested with CL = 15 pF and CMOS
DD2
signal levels, unless otherwise noted.
Table 4.
A Grade B Grade
Parameter Symbol Min Typ Max Min Typ Max Unit Test Conditions
SWITCHING SPECIFICATIONS
Data Rate 1 10 Mbps Within PWD limit
Propagation Delay t
PHL
, t
Pulse Width Distortion PWD
ADuM3210 5 3 ns |t
ADuM3211 6 4 ns |t
Change vs. Temperature 6 5 ps/°C
Pulse Width PW Within PWD limit
ADuM3210 1000 22 ns
ADuM3211 1000 33 ns
Propagation Delay Skew t
29 22 ns Between any two units
PSK
Channel Matching
Codirectional t
Opposing-Direction t
PSKCD
PSKOD
Output Rise/Fall Time tR/tF 3.0 3.0 ns 10% to 90%
= V
DD1
20 60 20 60 ns 50% input to 50% output
PLH
= 3.0 V. Minimum/maximum specifications apply over the entire recommended
DD2
≤ 3.6 V, 2.7 V ≤ V
DD1
≤ 3.6 V; ADuM3211 supply voltages 3.0 V ≤ V
DD2
− t
PLH
PHL
− t
PLH
PHL
DD1
|
|
5 3 ns
29 20 ns
≤ 3.6 V,
Table 5.
1 Mbps—A Grade, B Grade 10 Mbps—B Grade
Parameter Symbol
Min Typ Max Min Typ Max
Unit Test Conditions
SUPPLY CURRENT
ADuM3210 I
I
ADuM3211 I
I
0.8 1.3 2.0 3.2 mA
DD1
0.7 1.0 1.1 1.7 mA
DD2
0.7 1.3 1.5 2.1 mA
DD1
0.8 1.6 1.9 2.4 mA
DD2
Table 6. For All Models
Parameter Symbol Min Typ Max Unit Test Conditions
DC SPECIFICATIONS
Logic High Input Threshold VIH 0.7 V
Logic Low Input Threshold VIL 0.3 V
Logic High Output Voltages VOH V
V
Logic Low Output Voltages VOL 0.0 0.1 V IOx = 20 μA, VIx = V
0.2 0.4 V IOx = 4 mA, VIx = V
Input Current per Channel II −10 +0.01 +10 μA
V
DDX
V
DDX
− 0.1 3.0 V IOx = −20 μA, VIx = V
DDX
− 0.5 2.8 V IOx = −4 mA, VIx = V
DDX
0 V
≤ V
≤ V
Ix
DDX
IxH
IxH
IxL
IxL
Supply Current per Channel
Quiescent Input Supply Current I
Quiescent Output Supply Current I
Dynamic Input Supply Current I
Dynamic Output Supply Current I
0.3 0.5 mA
DDI(Q)
0.3 0.5 mA
DDO(Q)
0.10 mA/Mbps
DDI(D)
0.03 mA/Mbps
DDO(D)
AC SPECIFICATIONS
Common-Mode Transient Immunity1 |CM| 25 35 kV/μs VIx = V
, VCM = 1000 V,
DDX
transient magnitude = 800 V
Refresh Rate fr 1.1 Mbps
1
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
All typical specifications are at TA = 25°C, V
recommended operation range: ADuM3210 supply voltages 4.5 V ≤ V
4.5 V ≤ V
C
= 15 pF, and CMOS signal levels, unless otherwise noted.
L
≤ 5.5 V, 3.0 V ≤ V
DD1
≤ 3.6 V, and −40°C ≤ TA ≤ +105°C, unless otherwise noted. Switching specifications are tested with
DD2
Table 7.
A Grade B Grade
Parameter Symbol Min Typ Max Min Typ Max Unit Test Conditions
SWITCHING SPECIFICATIONS
Data Rate 1 10 Mbps Within PWD limit
Propagation Delay t
PHL
, t
Pulse Width Distortion PWD 5 3 ns |t
Change vs. Temperature 6 5 ps/°C
Pulse Width PW Within PWD limit
ADuM3210 1000 22 ns
ADuM3211 1000 33 ns
Propagation Delay Skew t
29 22 ns Between any two units
PSK
Channel Matching
Codirectional t
Opposing-Direction t
PSKCD
PSKOD
Output Rise/Fall Time tR/tF 3.0 3.0 ns 10% to 90%
= 5 V, V
DD1
15 55 15 55 ns 50% input to 50% output
PLH
= 3.0 V. Minimum/maximum specifications apply over the entire
DD2
≤ 5.5 V, 2.7 V ≤ V
DD1
≤ 3.6 V; ADuM3211 supply voltages
DD2
− t
PLH
PHL
|
5 3 ns
29 20 ns
Table 8.
1 Mbps—A Grade, B Grade 10 Mbps—B Grade
Parameter Symbol
Min Typ Max Min Typ Max
Unit Test Conditions
SUPPLY CURRENT
ADuM3210 I
I
ADuM3211 I
I
1.3 1.7 3.5 4.6 mA
DD1
0.7 1.0 1.1 1.7 mA
DD2
1.1 1.5 2.6 3.4 mA
DD1
0.8 1.6 1.9 2.4 mA
DD2
Table 9. For All Models
Parameter Symbol Min Typ Max Unit Test Conditions
DC SPECIFICATIONS
Logic High Input Threshold VIH 0.7 V
Logic Low Input Threshold VIL 0.3 V
Logic High Output Voltages VOH V
V
Logic Low Output Voltages VOL 0.0 0.1 V IOx = 20 μA, VIx = V
0.2 0.4 V IOx = 4 mA, VIx = V
Input Current per Channel II −10 +0.01 +10 μA 0 V ≤ VIx ≤ V
V
DDX
V
DDX
− 0.1 V
DDX
− 0.5 V
DDX
V IOx = −20 μA, VIx = V
DDX
− 0.2 V IOx = −4 mA, VIx = V
DDX
DDX
IxH
IxH
IxL
IxL
Supply Current per Channel
Quiescent Input Supply Current I
Quiescent Output Supply Current I
Dynamic Input Supply Current I
Dynamic Output Supply Current I
0.4 0.8 mA
DDI(Q)
0.3 0.5 mA
DDO(Q)
0.19 mA/Mbps
DDI(D)
0.03 mA/Mbps
DDO(D)
AC SPECIFICATIONS
Common-Mode Transient Immunity1 |CM| 25 35 kV/μs
= V
Ix
DDX
, VCM = 1000 V,
V
transient magnitude = 800 V
Refresh Rate fr 1.2 Mbps
1
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
All typical specifications are at TA = 25°C, V
recommended operation range: ADuM3210 supply voltages 2.7 V ≤ V
3.0 V ≤ V
C
= 15 pF and CMOS signal levels, unless otherwise noted.
L
≤ 3.6 V, 4.5 V ≤ V
DD1
≤ 5.5 V, and −40°C ≤ TA ≤ +105°C, unless otherwise noted. Switching specifications are tested with
DD2
Table 10.
A Grade B Grade
Parameter Symbol Min Typ Max Min Typ Max Unit Test Conditions
SWITCHING SPECIFICATIONS
Data Rate 1 10 Mbps Within PWD limit
Propagation Delay t
PHL
, t
Pulse Width Distortion PWD
ADuM3210 5 3 ns |t
ADuM3211 6 4 ns |t
Change vs. Temperature 6 5 ps/°C
Pulse Width PW Within PWD limit
ADuM3210 1000 22 ns
ADuM3211 1000 33 ns
Propagation Delay Skew t
29 20 ns Between any two units
PSK
Channel Matching
Codirectional t
Opposing-Direction t
PSKCD
PSKOD
Output Rise/Fall Time tR/tF 2.5 2.5 ns 10% to 90%
= 3 V, V
DD1
15 55 15 55 ns 50% input to 50% output
PLH
= 5.0 V. Minimum/maximum specifications apply over the entire
DD2
≤ 3.6 V, 4.5 V ≤ V
DD1
≤ 5.5 V; ADuM3211 supply voltages
DD2
− t
PLH
PHL
− t
PLH
PHL
|
|
15 3 ns
29 22 ns
Table 11.
1 Mbps—A Grade, B Grade 10 Mbps—B Grade
Parameter Symbol
Min Typ Max Min Typ Max
Unit Test Conditions
SUPPLY CURRENT
ADuM3210 I
I
ADuM3211 I
I
0.8 1.3 2.0 3.2 mA
DD1
1.0 1.6 1.7 2.8 mA
DD2
0.7 1.3 1.5 2.1 mA
DD1
1.3 1.8 3.1 4.0 mA
DD2
Table 12. For All Models
Parameter Symbol Min Typ Max Unit Test Conditions
DC SPECIFICATIONS
Logic High Input Threshold VIH 0.7 V
Logic Low Input Threshold VIL 0.3 V
Logic High Output Voltages VOH V
V
Logic Low Output Voltages VOL 0.0 0.1 V IOx = 20 μA, VIx = V
0.2 0.4 V IOx = 4 mA, VIx = V
Input Current per Channel II −10 +0.01 +10 μA
Supply Current per Channel
Quiescent Input Supply Current I
Quiescent Output Supply Current I
Dynamic Input Supply Current I
Dynamic Output Supply Current I
0.4 0.8 mA
DDI(Q)
0.5 0.8 mA
DDO(Q)
0.10 mA/Mbps
DDI(D)
0.05 mA/Mbps
DDO(D)
AC SPECIFICATIONS
Common-Mode Transient Immunity1 |CM| 25 35 kV/μs VIx = V
Refresh Rate fr 1.1 Mbps
1
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
rising and falling common-mode voltage edges.
V
DDX
V
DDX
− 0.1 V
DDX
− 0.5 V
DDX
V IOx = −20 μA, VIx = V
DDX
− 0.2 V IOx = −4 mA, VIx = V
DDX
IxH
IxH
IxL
IxL
0 V
≤ V
≤ V
Ix
DDX
, VCM = 1000 V,
DDX
transient magnitude = 800 V
Rev. F | Page 6 of 20
Data Sheet ADuM3210/ADuM3211
ELECTRICAL CHARACTERISTICS—5 V, 125°C OPERATION
All typical specifications are at TA = 25°C, V
operation range: 4.5 V ≤ V
are tested with C
= 15 pF and CMOS signal levels, unless otherwise noted.
L
≤ 5.5 V, 4.5 V ≤ V
DD1
Table 13.
A Grade
Parameter Symbol Min Typ Max Min Typ Max Min Typ Max Unit Test Conditions
SWITCHING SPECIFICATIONS
Data Rate 1 10 25 Mbps Within PWD limit
Propagation Delay t
, t
20 50 20 50 20 50 ns 50% input to 50% output
PHL
PLH
Pulse Width Distortion PWD 5 3 3 ns |t
Change vs. Temperature 6 5 5 ps/°C
Pulse Width PW 1000 100 40 ns Within PWD limit
Propagation Delay Skew t
20 18 18 ns Between any two units
PSK
Channel Matching
Codirectional t
Opposing-Direction t
5 3 3 ns
PSKCD
20 18 18 ns
PSKOD
Output Rise/Fall Time tR/tF
Table 14.
1 Mbps—A Grade,
B Grade, and C Grade
Parameter Symbol
SUPPLY CURRENT
ADuM3210 I
I
ADuM3211 I
I
1.3 1.7 3.5 4.6 6.6 9.0 mA
DD1
1.0 1.6 1.7 2.8 3.7 4.5 mA
DD2
1.1 1.5 2.6 3.4 5.3 7.5 mA
DD1
1.3 1.8 3.1 4.0 5.9 8.0 mA
DD2
= V
DD1
= 5 V. Minimum/maximum specifications apply over the entire recommended
DD2
≤ 5.5 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching specifications
DD2
B Grade and
T Grade C Grade
− t
PLH
2.5 2.5 2.5
ns 10% to 90%
10 Mbps—B Grade,
C Grade, and T Grade 25 Mbps—C Grade
Unit Test Conditions Min Typ Max Min Typ Max Min Typ Max
PHL
|
Table 15. For All Models
Parameter Symbol Min Typ Max Unit Test Conditions
DC SPECIFICATIONS
Logic High Input Threshold VIH 0.7 V
Logic Low Input Threshold VIL 0.3 V
Logic High Output Voltages VOH V
V
Logic Low Output Voltages VOL 0.0 0.1 V IOx = 20 μA, VIx = V
0.2 0.4 V IOx = 4 mA, VIx = V
Input Current per Channel II −10 +0.01 +10 μA 0 V ≤ VIx ≤ V
V
DDX
V
DDX
− 0.1 5.0 V IOx = −20 μA, VIx = V
DDX
− 0.5 4.8 V IOx = −4 mA, VIx = V
DDX
DDX
IxH
IxH
IxL
IxL
Supply Current per Channel
Quiescent Input Supply Current I
Quiescent Output Supply Current I
Dynamic Input Supply Current I
Dynamic Output Supply Current I
0.4 0.8 mA
DDI(Q)
0.4 0.8 mA
DDO(Q)
0.19 mA/Mbps
DDI(D)
0.05 mA/Mbps
DDO(D)
AC SPECIFICATIONS
Common-Mode Transient Immunity1 |CM| 25 35 kV/μs
= V
Ix
DDX
, VCM = 1000 V,
V
transient magnitude = 800 V
Refresh Rate fr 1.2 Mbps
1
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
rising and falling common-mode voltage edges.
Rev. F | Page 7 of 20
ADuM3210/ADuM3211 Data Sheet
ELECTRICAL CHARACTERISTICS—3 V, 125°C OPERATION
All typical specifications are at TA = 25°C, V
operation range: 3.0 V ≤ V
are tested with C
= 15 pF and CMOS signal levels, unless otherwise noted.
L
≤ 3.6 V, 3.0 V ≤ V
DD1
Table 16.
A Grade
Parameter Symbol Min Typ Max Min Typ Max Min Typ Max Unit Test Conditions
SWITCHING SPECIFICATIONS
Data Rate 1 10 25 Mbps Within PWD limit
Propagation Delay t
, t
20 60 20 60 20 60 ns 50% input to 50% output
PHL
PLH
Pulse Width Distortion PWD 6 4 4 ns |t
Change vs. Temperature 6 5 5 ps/°C
Pulse Width PW 1000 100 40 ns Within PWD limit
Propagation Delay Skew t
29 22 22 ns Between any two units
PSK
Channel Matching
Codirectional t
Opposing-Direction t
Output Rise/Fall Time tR/tF
5 3 3 ns
PSKCD
29 20 20 ns
PSKOD
Table 17.
1 Mbps—A Grade,
B Grade, and C Grade
Parameter Symbol
Min Typ Max Min Typ Max Min Typ Max
SUPPLY CURRENT
ADuM3210 I
I
ADuM3211 I
I
0.8 1.3 2.0 3.2 3.9 5.5 mA
DD1
0.7 1.0 1.1 1.7 2.4 3.0 mA
DD2
0.7 1.3 1.5 2.1 3.1 4.5 mA
DD1
0.8 1.6 1.9 2.4 3.5 5.0 mA
DD2
= V
DD1
= 3.0 V. Minimum/maximum specifications apply over the entire recommended
DD2
≤ 3.6 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching specifications
DD2
B Grade and
T Grade C Grade
3.0 3.0 3.0
10 Mbps—B Grade,
C Grade, and T Grade
25 Mbps—C Grade
− t
PHL
|
PLH
ns 10% to 90%
Unit Test Conditions
Table 18. For All Models
Parameter Symbol Min Typ Max Unit Test Conditions
DC SPECIFICATIONS
Logic High Input Threshold VIH 0.7 V
Logic Low Input Threshold VIL 0.3 V
Logic High Output Voltages VOH V
V
Logic Low Output Voltages VOL 0.0 0.1 V IOx = 20 μA, VIx = V
0.2 0.4 V IOx = 4 mA, VIx = V
Input Current per Channel II −10 +0.01 +10 μA 0 V ≤ VIx ≤ V
V
DDX
V
DDX
− 0.1 3.0 V IOx = −20 μA, VIx = V
DDX
− 0.5 2.8 V IOx = −4 mA, VIx = V
DDX
DDX
IxH
IxH
IxL
IxL
Supply Current per Channel
Quiescent Input Supply Current I
Quiescent Output Supply Current I
Dynamic Input Supply Current I
Dynamic Output Supply Current I
0.3 0.5 mA
DDI(Q)
0.3 0.5 mA
DDO(Q)
0.10 mA/Mbps
DDI(D)
0.03 mA/Mbps
DDO(D)
AC SPECIFICATIONS
Common-Mode Transient Immunity1 |CM| 25 35 kV/μs
= V
Ix
, VCM = 1000 V,
DDX
V
transient magnitude = 800 V
Refresh Rate fr 1.1 Mbps
1
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
= 15 pF and CMOS signal levels, unless otherwise noted.
L
≤ 5.5 V, 3.0 V ≤ V
DD1
Table 19.
Parameter Symbol Min Typ Max Min Typ Max Min Typ Max Unit Test Conditions
SWITCHING SPECIFICATIONS
Data Rate 1 10 25 Mbps Within PWD limit
Propagation Delay t
, t
15 55 15 55 15 55 ns 50% input to 50% output
PHL
PLH
Pulse Width Distortion PWD 5 3 3 ns |t
Change vs. Temperature 6 5 5 ps/°C
Pulse Width PW 1000 100 40 ns Within PWD limit
Propagation Delay Skew t
29 22 22 ns Between any two units
PSK
Channel Matching
Codirectional t
Opposing-Direction t
5 3 3 ns
PSKCD
29 20 20 ns
PSKOD
Output Rise/Fall Time tR/tF
Table 20.
1 Mbps—A Grade,
B Grade, and C Grade
Parameter Symbol
Min Typ Max Min Typ Max Min Typ Max
SUPPLY CURRENT
ADuM3210 I
I
ADuM3211 I
I
1.3 1.7 3.5 4.6 6.6 9.0 mA
DD1
0.7 1.0 1.1 1.7 2.4 3.0 mA
DD2
1.1 1.5 2.6 3.4 5.3 7.5 mA
DD1
0.8 1.6 1.9 2.4 3.5 5.0 mA
DD2
= 5 V, V
DD1
DD2
= 3.0 V. Minimum/maximum specifications apply over the entire recommended
DD2
≤ 3.6 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching specifications
B Grade and
A Grade
T Grade C Grade
3.0 3.0 3.0
10 Mbps—B Grade,
C Grade, and T Grade 25 Mbps—C Grade
− t
|
PLH
PHL
ns 10% to 90%
Unit Test Conditions
Table 21. For All Models
Parameter Symbol Min Typ Max Unit Test Conditions
DC SPECIFICATIONS
Logic High Input Threshold VIH 0.7 V
Logic Low Input Threshold VIL 0.3 V
Logic High Output Voltages VOH V
V
Logic Low Output Voltages VOL 0.0 0.1 V IOx = 20 μA, VIx = V
0.2 0.4 V IOx = 4 mA, VIx = V
Input Current per Channel II −10 +0.01 +10 μA 0 V ≤ VIx ≤ V
V
DDX
V
DDX
− 0.1 V
DDX
− 0.5 V
DDX
V IOx = −20 μA, VIx = V
DDX
− 0.2 V IOx = −4 mA, VIx = V
DDX
DDX
IxH
IxH
IxL
IxL
Supply Current per Channel
Quiescent Input Supply Current I
Quiescent Output Supply Current I
Dynamic Input Supply Current I
Dynamic Output Supply Current I
0.4 0.8 mA
DDI(Q)
0.3 0.5 mA
DDO(Q)
0.19 mA/Mbps
DDI(D)
0.03 mA/Mbps
DDO(D)
AC SPECIFICATIONS
Common-Mode Transient Immunity1 |CM| 25 35 kV/μs
= V
Ix
DDX
, VCM = 1000 V,
V
transient magnitude = 800 V
Refresh Rate fr 1.2 Mbps
1
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
All typical specifications are at TA = 25°C, V
operation range: 3.0 V ≤ V
are tested with C
= 15 pF and CMOS signal levels, unless otherwise noted.
L
≤ 3.6 V, 4.5 V ≤ V
DD1
Table 22.
Parameter Symbol Min Typ Max Min Typ Max Min Typ Max Unit Test Conditions
SWITCHING SPECIFICATIONS
Data Rate 1 10 25 Mbps Within PWD limit
Propagation Delay t
, t
15 55 15 55 15 55 ns 50% input to 50% output
PHL
PLH
Pulse Width Distortion PWD 6 4 4 ns |t
Change vs. Temperature 6 5 5 ps/°C
Pulse Width PW 1000 100 40 ns Within PWD limit
Propagation Delay Skew t
29 22 22 ns Between any two units
PSK
Channel Matching
Codirectional t
Opposing-Direction t
Output Rise/Fall Time tR/tF
15 3 3 ns
PSKCD
29 20 20 ns
PSKOD
Table 23.
1 Mbps—A Grade,
B Grade, and C Grade
Parameter Symbol
Min Typ Max Min Typ Max Min Typ Max
SUPPLY CURRENT
ADuM3210 I
I
ADuM3211 I
I
0.8 1.3 2.0 3.2 3.9 5.5 mA
DD1
1.0 1.6 1.7 2.8 3.7 4.5 mA
DD2
0.7 1.3 1.5 2.1 3.1 4.5 mA
DD1
1.3 1.8 3.1 4.0 5.9 8.0 mA
DD2
= 3 V, V
DD1
DD2
= 5.0 V. Minimum/maximum specifications apply over the entire recommended
DD2
≤ 5.5 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching specifications
B Grade and
A Grade
T Grade
C Grade
2.5 2.5 2.5
10 Mbps—B Grade,
C Grade, and T Grade 25 Mbps—C Grade
− t
PHL
|
PLH
ns 10% to 90%
Unit Test Conditions
Table 24. For All Models
Parameter Symbol Min Typ Max Unit Test Conditions
DC SPECIFICATIONS
Logic High Input Threshold VIH 0.7 V
Logic Low Input Threshold VIL 0.3 V
Logic High Output Voltages VOH V
V
Logic Low Output Voltages VOL 0.0 0.1 V IOx = 20 μA, VIx = V
0.2 0.4 V IOx = 4 mA, VIx = V
Input Current per Channel II −10 +0.01 +10 μA 0 V ≤ VIx ≤ V
V
DDX
V
DDX
− 0.1 V
DDX
− 0.5 V
DDX
V IOx = −20 μA, VIx = V
DDX
− 0.2 V IOx = −4 mA, VIx = V
DDX
DDX
IxH
IxH
IxL
IxL
Supply Current per Channel
Quiescent Input Supply Current I
Quiescent Output Supply Current I
Dynamic Input Supply Current I
Dynamic Output Supply Current I
0.4 0.8 mA
DDI(Q)
0.5 0.8 mA
DDO(Q)
0.10 mA/Mbps
DDI(D)
0.05 mA/Mbps
DDO(D)
AC SPECIFICATIONS
Common-Mode Transient Immunity1 |CM| 25 35 kV/μs
= V
Ix
, VCM = 1000 V,
DDX
V
transient magnitude = 800 V
Refresh Rate fr 1.1 Mbps
1
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
rising and falling common-mode voltage edges.
Rev. F | Page 10 of 20
Data Sheet ADuM3210/ADuM3211
PACKAGE CHARACTERISTICS
Table 25.
Parameter Symbol Min Typ Max Unit Test Conditions
Resistance (Input-to-Output)1 R
Capacitance (Input-to-Output)1 C
Input Capacitance CI 4.0 pF
IC Junction-to-Case Thermal Resistance, Side 1 θ
IC Junction-to-Case Thermal Resistance, Side 2 θ
1
The device is considered a 2-terminal device; Pin 1 through Pin 4 are shorted together, and Pin 5 through Pin 8 are shorted together.
REGULATORY INFORMATION
The ADuM3210/ADuM3211 are approved by the organizations listed in Tabl e 26.
Table 26.
UL CSA VDE
Recognized under UL 1577
Component Recognition
Program
1
Single/basic 2500 V rms
isolation voltage
File E214100 File 205078 File 2471900-4880-0001
1
In accordance with UL 1577, each ADuM3210/ADuM3211 is proof tested by applying an insulation test voltage ≥ 3000 V rms for 1 second (current leakage detection
limit = 5 μA).
2
In accordance with DIN V VDE V 0884-10, each ADuM3210/ADuM3211 is proof tested by applying an insulation test voltage ≥ 1050 V peak for 1 second (partial
discharge detection limit = 5 pC). An asterisk (*) marking on the component designates DIN V VDE V 0884-10approval.
Approved under CSA Component Acceptance Notice #5A
Basic insulation per CSA 60950-1-03 and IEC 60950-1,
400 V rms (566 V peak) maximum working voltage
Functional insulation per CSA 60950-1-03 and IEC 60950-1,
800 V rms(1131 V peak) maximum working voltage
1012 Ω
I-O
1.0 pF f = 1 MHz
I-O
46 °C/W
JCI
Thermocouple located at center
of package underside
41 °C/W
JCO
Certified according to DIN V VDE V 0884-10
(VDE V 0884-10): 2006-12
Reinforced insulation, 560 V peak
2
INSULATION AND SAFETY-RELATED SPECIFICATIONS
Table 27.
Parameter Symbol Value Unit Conditions
Rated Dielectric Insulation Voltage 2500 V rms 1-minute duration
Minimum External Air Gap (Clearance) L(I01) 4.90 min mm
Minimum External Tracking (Creepage) L(I02) 4.01 min mm
Minimum Internal Gap (Internal Clearance) 0.017 min mm Insulation distance through insulation
Tracking Resistance (Comparative Tracking Index) CTI >175 V DIN IEC 112/VDE 0303 Part 1
Isolation Group IIIa Material Group (DIN VDE 0110, 1/89, Table 1)
Measured from input terminals to output terminals,
shortest distance through air
Measured from input terminals to output terminals,
shortest distance path along body
Rev. F | Page 11 of 20
ADuM3210/ADuM3211 Data Sheet
DIN V VDE V 0884-10 (VDE V 0884-10) INSULATION CHARACTERISTICS
These isolators are suitable for reinforced isolation only within the safety limit data. Maintenance of the safety data is ensured by
protective circuits. The asterisk (*) marking on the package denotes DIN V VDE V 0884-10 approval for a 560 V peak working voltage.
Table 28.
Description Conditions Symbol Characteristic Unit
Installation Classification per DIN VDE 0110
For Rated Mains Voltage ≤ 150 V rms I to IV
For Rated Mains Voltage ≤ 300 V rms I to III
For Rated Mains Voltage ≤ 400 V rms I to II
Climatic Classification 40/105/21
Pollution Degree per DIN VDE 0110, Table 1
Maximum Working Insulation Voltage V
Input-to-Output Test Voltage, Method B1
Input-to-Output Test Voltage, Method A V
After Environmental Tests Subgroup 1 896 V peak
After Input and/or Safety Test Subgroup 2
× 1.2 = VPR, tm = 60 sec, partial discharge < 5 pC 672 V peak
V
IORM
Maximum value allowed in the event of a failure
(see Figure 3)
RECOMMENDED OPERATING CONDITIONS
Table 29.
Parameter Symbol Rating
Operating Temperature TA
ADuM3210A/ADuM3211A −40°C to +105°C
ADuM3210B/ADuM3211B −40°C to +105°C
ADuM3210T/ADuM3211T −40°C to +125°C
ADuM3210WA/ADuM3211WA −40°C to +125°C
ADuM3210WB/ADuM3211WB −40°C to +125°C
ADuM3210WC/ADuM3211WC −40°C to +125°C
Supply Voltages1 V
ADuM3210A/ADuM3211A 2.7 V to 5.5 V
06866-002
ADuM3210B/ADuM3211B 2.7 V to 5.5 V
ADuM3210T/ADuM3211T 3 V to 5.5 V
ADuM3210WA/ADuM3211WA 3 V to 5.5 V
ADuM3210WB/ADuM3211WB 3 V to 5.5 V
ADuM3210WC/ADuM3211WC 3 V to 5.5 V
Maximum Input Signal Rise and
Fall Times
1
All voltages are relative to their respective ground. See the
and Magnetic Field Immunity
magnetic fields.
section for information on immunity to external
, V
DD1
DD2
1 ms
DC Correctness
Ω
Rev. F | Page 12 of 20
Data Sheet ADuM3210/ADuM3211
ABSOLUTE MAXIMUM RATINGS
Ambient temperature = 25°C, unless otherwise noted.
Table 30.
Parameter Symbol Rating
Storage Temperature TST −55°C to +150°C
−40°C to +125°C
Ambient Operating
T
A
Temperature
Supply Voltages1 V
Input Voltage
Output Voltage
Average Output Current
per Pin
Common-Mode
Transie nts
1
All voltages are relative to their respective ground.
2
V
and V
DDI
given channel, respectively.
3
See Figure 3 for information on maximum allowable current for various
temperatures.
4
Refers to common-mode transients across the insulation barrier. Common-
mode transients exceeding the Absolute Maximum Rating can cause
latch-up or permanent damage.
1, 2
V
1, 2
V
3
4
refer to the supply voltages on the input and output sides of a
DDO
, V
−0.5 V to +7.0 V
DD1
DD2
, VIB −0.5 V to V
IA
, VOB −0.5 V to V
OA
−22 mA to +22 mA
I
O
, CML −100 kV/μs to +100 kV/μs
CM
H
+ 0.5 V
DDI
+ 0.5 V
DDO
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Table 31. Maximum Continuous Working Voltage
Parameter Max Unit Constraint
AC Voltage,
Bipolar Waveform
AC Voltage,
565 V peak
50-year minimum
lifetime
Unipolar Waveform
Functional Insulation 1131 V peak
Maximum approved
working voltage per
IEC 60950-1
Basic Insulation 560 V peak
Maximum approved
working voltage per
IEC 60950-1 and
VDE V 0884-10
DC Voltage
Functional Insulation 1131 V peak
Maximum approved
working voltage per
IEC 60950-1
Basic Insulation 560 V peak
Maximum approved
working voltage per
IEC 60950-1 and
VDE V 0884-10
1
Refers to continuous voltage magnitude imposed across the isolation
barrier. See the Insulation Lifetime TFDUJPOfor more details.
ESD CAUTION
1
Rev. F | Page 13 of 20
ADuM3210/ADuM3211 Data Sheet
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
1
V
DD1
ADuM3210
2
V
IA
3
V
TOP VIEW
IB
(Not to S cale)
4
GND
1
Figure 4. ADuM3210 Pin Configuration
8
V
DD2
7
V
OA
6
V
OB
5
GND
2
06866-003
V
V
GND
DD1
V
OA
IB
1
1
ADuM3211
2
3
TOP VIEW
(Not to S cale)
4
8
V
DD2
7
V
IA
6
V
OB
5
GND
2
06866-016
Figure 5. ADuM3211 Pin Configuration
Table 32. ADuM3210 Pin Function Descriptions
Pin No. Mnemonic Description
1 V
DD1
Supply Voltage for Isolator Side 1,
Table 33. ADuM3211 Pin Function Descriptions
Pin No. Mnemonic Description
1 V
DD1
2.7 V to 5.5 V.
2 VIA Logic Input A.
3 VIB Logic Input B.
4 GND1
Ground 1. Ground reference for
2 VOA Logic Output A.
3 VIB Logic Input B.
4 GND1
Isolator Side 1.
5 GND2
Ground 2. Ground reference for
5 GND2
Isolator Side 2.
6 VOB Logic Output B.
7 VOA Logic Output A.
8 V
DD2
Supply Voltage for Isolator Side 2,
6 VOB Logic Output B.
7 VIA Logic Input A.
8 V
DD2
2.7 V to 5.5 V.
TRUTH TABLES
Table 34. ADuM3210 Truth Table (Positive Logic)
VIA Input1 VIB Input1 V
H H Powered Powered H H
L L Powered Powered L L
H L Powered Powered H L
L H Powered Powered L H
X X Unpowered Powered L L
X X Powered Unpowered Indeterminate Indeterminate
1
H refers to a high logic, and L refers to a low logic.
State V
DD1
State VOA Output1 VOB Output1 Notes
DD2
Supply Voltage for Isolator Side 1,
2.7 V to 5.5 V.
Ground 1. Ground reference for
Isolator Side 1.
Ground 2. Ground reference for
Isolator Side 2.
Supply Voltage for Isolator Side 2,
2.7 V to 5.5 V.
Outputs return to the input state within
1 μs of V
power restoration
DDI
Outputs return to the input state within
1 μs of V
power restoration
DDO
Table 35. ADuM3211 Truth Table (Positive Logic)
VIA Input1 VIB Input1 V
State V
DD1
State VOA Output1 VOB Output1 Notes
DD2
H H Powered Powered H H
L L Powered Powered L L
H L Powered Powered H L
L H Powered Powered L H
X X Unpowered Powered Indeterminate L
X X Powered Unpowered L Indeterminate
1
H refers to a high logic, L refers to a low logic, and X refers to high or low logic, don’t care.
Rev. F | Page 14 of 20
Outputs return to the input state within
1 μs of V
power restoration
DDI
Outputs return to the input state within
1 μs of V
power restoration
DDO
Data Sheet ADuM3210/ADuM3211
TYPICAL PERFORMANCE CHARACTERISTICS
10
20
8
6
4
CURRENT/CHANNEL (mA)
2
0
0
5V
3V
102030
DATA RATE (Mb ps)
Figure 6. Typical Input Supply Current per Channel vs. Data Rate
for 5 V and 3 V Operation
4
3
2
5V
1
CURRENT/CHANNEL (mA)
3V
0
0
102030
DATA RATE (Mb ps)
Figure 7. Typical Output Supply Current per Channel vs. Data Rate
for 5 V and 3 V Operation (No Output Load)
15
10
CURRENT (mA)
5
0
6866-004
0
102030
DATA RATE (Mb ps)
Figure 9. ADuM3210 Typical I
5V
3V
Supply Current vs. Data Rate
DD1
06866-007
for 5 V and 3 V Operation
4
3
5V
2
CURRENT (mA)
1
0
6866-005
0
102030
DATA RATE (Mbps)
Figure 10. ADuM3210 Typical I
3V
Supply Current vs. Data Rate
DD2
06866-008
for 5 V and 3 V Operation
4
3
2
1
CURRENT/CHANNEL (mA)
0
0
5V
3V
102030
DATA RATE (Mb ps)
Figure 8. Typical Output Supply Current per Channel vs. Data Rate
for 5 V and 3 V Operation (15 pF Output Load)
06866-006
Rev. F | Page 15 of 20
10
8
6
4
CURRENT (mA)
2
0
0
102030
DATA RATE (Mbps)
Figure 11. ADuM3211 Typical I
for 5 V and 3 V Operation
5V
3V
06866--015
or I
Supply Current vs. Data Rate
DD1
DD2
ADuM3210/ADuM3211 Data Sheet
V
APPLICATIONS INFORMATION
PC BOARD LAYOUT
The ADuM3210/ADuM3211 digital isolators require no external
interface circuitry for the logic interfaces. Power supply bypassing
is strongly recommended at the input and output supply pins.
The capacitor value should be between 0.01 μF and 0.1 μF. The
total lead length between both ends of the capacitor and the
input power supply pin should not exceed 20 mm.
See the AN-1109 Application Note for board layout guidelines.
SYSTEM-LEVEL ESD CONSIDERATIONS AND
ENHANCEMENTS
System-level ESD reliability (for example, per IEC 61000-4-x)
is highly dependent on system design, which varies widely by
application. The ADuM3210/ADuM3211 incorporate many
enhancements to make ESD reliability less dependent on system
design. The enhancements include:
ESD protection cells were added to all input/output interfaces.
Key metal trace resistances reduced using wider geometry
and paralleling of lines with vias.
The SCR effect inherent in CMOS devices is minimized
by use of a guarding and isolation technique between the
PMOS and NMOS devices.
Areas of high electric field concentration are eliminated
using 45° corners on metal traces.
Supply pin overvoltage is prevented with larger ESD
clamps between each supply pin and its respective ground.
While the ADuM3210/ADuM3211 improve system-level ESD
reliability, they are no substitute for a robust system-level
design. For detailed recommendations on board layout and
system-level design, see the AN-793 Application Note,
ESD/Latch-Up Considerations with iCoupler Isolation Products.
PROPAGATION DELAY-RELATED PARAMETERS
Propagation delay is a parameter that describes the time it takes
a logic signal to propagate through a component. The propagation
delay to a logic low output can differ from the propagation
delay to a logic high output.
INPUT (
)
Ix
OUTPUT (V
t
PLH
)
Ox
Figure 12. Propagation Delay Parameters
t
PHL
Pulse width distortion is the maximum difference between
these two propagation delay values and is an indication of
how accurately the input signal timing is preserved.
Channel-to-channel matching refers to the maximum amount
that the propagation delay differs between channels within a
single ADuM3210/ADuM3211 component.
50%
50%
Rev. F | Page 16 of 20
06866-009
Propagation delay skew refers to the maximum amount that
the propagation delay differs between multiple ADuM3210/
ADuM3211 components operating under the same conditions.
DC CORRECTNESS AND MAGNETIC FIELD IMMUNITY
Positive and negative logic transitions at the isolator input cause
narrow (~1 ns) pulses to be sent to the decoder via the transformer.
The decoder is bistable and is, therefore, either set or reset by
the pulses, indicating input logic transitions. In the absence of
logic transitions of more than 2 μs at the input, a periodic set of
refresh pulses indicative of the correct input state are sent to
ensure dc correctness at the output. If the decoder receives
no internal pulses for more than approximately 5 μs, the input
side is assumed to be unpowered or nonfunctional, in which
case, the isolator output is forced to a default state (see Table 34
and Table 35) by the watchdog timer circuit.
The ADuM3210/ADuM3211 are immune to external magnetic
fields. The limitation on the ADuM3210/ADuM3211 magnetic
field immunity is set by the condition in which induced voltage
in the transformer receiving coil is sufficiently large to either
falsely set or reset the decoder. The following analysis defines
the conditions under which this can occur. The 3 V operating
condition of the ADuM3210/ADuM3211 is examined because
it represents the most susceptible mode of operation.
The pulses at the transformer output have an amplitude greater
than 1.0 V. The decoder has a sensing threshold at about 0.5 V,
therefore establishing a 0.5 V margin in which induced voltages
can be tolerated. The voltage induced across the receiving coil is
given by
V = (−dβ/dt) ∑π r
where:
β is the magnetic flux density (gauss).
N is the number of turns in the receiving coil.
r
is the radius of the nth turn in the receiving coil (cm).
n
Given the geometry of the receiving coil in the ADuM3210/
ADuM3211 and an imposed requirement that the induced voltage
is at most 50% of the 0.5 V margin at the decoder, a maximum
allowable magnetic field is calculated as shown in Figure 13.
100
10
1
0.1
DENSITY (kgauss)
0.01
MAXIMUM ALLOWABLE MAGNETIC FLUX
0.001
1k10k10M
Figure 13. Maximum Allowable External Magnetic Flux Density
2
, n = 1, 2, ... , N
n
MAGNETIC FIELD FREQUENCY (Hz)
1M
100M100k
06866-010
Data Sheet ADuM3210/ADuM3211
For example, at a magnetic field frequency of 1 MHz, the
maximum allowable magnetic field of 0.2 kgauss induces a
voltage of 0.25 V at the receiving coil. This is about 50% of the
sensing threshold and does not cause a faulty output transition.
Similarly, if such an event were to occur during a transmitted
pulse (and had the worst-case polarity), it would reduce the
received pulse from >1.0 V to 0.75 V, which is still well above
the 0.5 V sensing threshold of the decoder.
The preceding magnetic flux density values correspond to
specific current magnitudes at given distances away from the
these allowable current magnitudes as a function of frequency
for selected distances. As shown, the ADuM3210/ADuM3211
are immune and can be affected only by extremely large currents
operated at a high frequency and very close to the component.
For the 1 MHz example, a 0.5 kA current would have to be placed
5 mm away from the ADuM3210/ADuM3211 to affect the
operation of the component.
1000
DISTANCE = 1m
100
10
DISTANCE = 100mm
1
DISTANCE = 5mm
0.1
MAXIMUM ALL OWABLE CURRENT (kA)
0.01
1k10k100M100k1M10M
MAGNETIC F I ELD FREQUENCY (Hz)
Figure 14. Maximum Allowable Current for Various
Current-to-ADuM3210/ADuM3211 Spacings
Note that at combinations of strong magnetic fields and high
frequencies, any loops formed by the printed circuit board
(PCB) traces may induce sufficiently large error voltages to
trigger the threshold of succeeding circuitry. Care should be
taken in the layout of such traces to avoid this possibility.
06866-011
POWER CONSUMPTION
The supply current at a given channel of the ADuM3210/
ADuM3211 isolator is a function of the supply voltage, channel
data rate, and channel output load.
For each input channel, the supply current is given by
I
= I
DDI
DDI (Q)
I
DDI
= I
× (2f − fr) + I
DDI (D)
DDI (Q)
For each output channel, the supply current is given by
I
I
DDO
DDO
= I
= (I
f ≤ 0.5fr
DDO (Q)
+ (0.5 × 10−3) × CLV
DDO (D)
) × (2f − fr) + I
DDO
where:
I
, I
DDI (D)
are the input and output dynamic supply currents
DDO (D)
per channel (mA/Mbps).
I
, I
DDI (Q)
are the specified input and output quiescent
DDO (Q)
supply currents (mA).
C
is the output load capacitance (pF).
L
is the output supply voltage (V).
V
DDO
f is the input logic signal frequency (MHz, half of the input data
rate, NRZ signaling).
f
is the input stage refresh rate (Mbps).
r
To calculate the total I
DD1
and I
supply current, the supply
DD2
currents for each input and output channel corresponding to
and I
I
DD1
are calculated and totaled.
DD2
Figure 6 provides the input supply currents per channel as a
function of data rate. Figure 7 and Figure 8 provide the output
supply currents per channel as a function of data rate for an
unloaded output condition and for a 15 pF output condition,
respectively. Figure 9 through Figure 11 provide total I
supply current as a function of data rate for the ADuM3210
I
DD2
and ADuM3211 channel configurations.
f ≤ 0.5fr
f > 0.5fr
DDO (Q)
f > 0.5fr
and
DD1
Rev. F | Page 17 of 20
ADuM3210/ADuM3211 Data Sheet
INSULATION LIFETIME
All insulation structures eventually break down when subjected to
voltage stress over a sufficiently long period. The rate of insulation
degradation is dependent on the characteristics of the voltage
waveform applied across the insulation. In addition to the testing
performed by the regulatory agencies, Analog Devices carries
out an extensive set of evaluations to determine the lifetime of
the insulation structure within the ADuM3210/ADuM3211.
Analog Devices performs accelerated life testing using voltage
levels higher than the rated continuous working voltage.
Acceleration factors for several operating conditions are
determined. These factors allow calculation of the time to
failure at the actual working voltage.
The values shown in Tabl e 31 summarize the peak voltage for
50 years of service life for a bipolar ac operating condition and
the maximum CSA/VDE approved working voltages. In many
cases, the approved working voltage is higher than the 50-year
service life voltage. Operation at these high working voltages
can lead to shortened insulation life in some cases.
The insulation lifetime of the ADuM3210/ADuM3211 depends
on the voltage waveform type imposed across the isolation barrier.
The iCoupler insulation structure degrades at different rates
depending on whether the waveform is bipolar ac, unipolar ac, or
dc. Figure 15, Figure 16, and Figure 17 illustrate these different
isolation voltage waveforms.
A bipolar ac voltage environment is the most stringent. The
goal of a 50-year operating lifetime under the ac bipolar
condition determines the Analog Devices recommended
maximum working voltage.
In the case of unipolar ac or dc voltage, the stress on the insulation
is significantly lower. This allows operation at higher working
voltages while still achieving a 50-year service life. The working
voltages listed in Tabl e 31 can be applied while maintaining the
50-year minimum lifetime provided that the voltage conforms
to either the unipolar ac or dc voltage cases. Any cross-insulation
voltage waveform that does not conform to Figure 16 or Figure 17
should be treated as a bipolar ac waveform, and its peak voltage
should be limited to the 50-year lifetime voltage value listed
in Tab l e 3 1 .
Note that the voltage presented in Figure 16 is shown as sinusoidal
for illustration purposes only. It is meant to represent any voltage
waveform varying between 0 V and some limiting value. The
limiting value can be positive or negative, but the voltage cannot
cross 0 V.
RATED PEAK VOL TAGE
0V
Figure 15. Bipolar AC Waveform
06866-012
RATED PEAK VOL TAGE
0V
Figure 16. Unipolar AC Waveform
06866-013
RATED PEAK VOL TAGE
0V
Figure 17. DC Waveform
06866-014
Rev. F | Page 18 of 20
Data Sheet ADuM3210/ADuM3211
OUTLINE DIMENSIONS
5.00 (0.1968)
4.80 (0.1890)
4.00 (0.1574)
3.80 (0.1497)
0.25 (0.0098)
0.10 (0.0040)
COPLANARITY
0.10
CONTROLLING DIMENSIONS ARE IN MILLIMETERS; INCH DIMENSIONS
(IN PARENTHESES) ARE ROUNDED-OFF MILLIMETER EQUIVALENTS FOR
REFERENCE ONLYAND ARE NOT APPROPRIATE FOR USE IN DESIGN.
85
1
1.27 (0.0500)
SEATING
PLANE
COMPLIANT TO JEDEC STANDARDS MS-012-AA
BSC
6.20 (0.2441)
5.80 (0.2284)
4
1.75 (0.0688)
1.35 (0.0532)
0.51 (0.0201)
0.31 (0.0122)
8°
0°
0.25 (0.0098)
0.17 (0.0067)
0.50 (0.0196)
0.25 (0.0099)
1.27 (0.0500)
0.40 (0.0157)
45°
012407-A
Figure 18. 8-Lead Standard Small Outline Package [SOIC_N]
Narrow Body (R-8)
Dimensions shown in millimeters and (inches)
Rev. F | Page 19 of 20
ADuM3210/ADuM3211 Data Sheet
ORDERING GUIDE
Number
of Inputs,
V
Side
DD1
Model
1, 2
ADuM3210ARZ 2 0 1 50 5 −40°C to +105°C R-8
ADuM3210ARZ-RL7 2 0 1 50 5 −40°C to +105°C R-8
ADuM3210BRZ 2 0 10 50 3 −40°C to +105°C R-8
ADuM3210BRZ-RL7 2 0 10 50 3 −40°C to +105°C R-8
ADuM3210TRZ 2 0 10 50 3 −40°C to +125°C R-8
ADuM3210TRZ-RL7 2 0 10 50 3 −40°C to +125°C R-8
ADuM3210WARZ 2 0 1 50 5 −40°C to +125°C R-8
ADuM3210WARZ-RL7 2 0 1 50 5 −40°C to +125°C R-8
ADuM3210WBRZ 2 0 10 50 3 −40°C to +125°C R-8
ADuM3210WBRZ-RL7 2 0 10 50 3 −40°C to +125°C R-8
ADuM3210WCRZ 2 0 25 50 3 −40°C to +125°C R-8
ADuM3210WCRZ-RL7 2 0 25 50 3 −40°C to +125°C R-8
ADuM3211ARZ 1 1 1 50 6 −40°C to +105°C R-8
ADuM3211ARZ-RL7 1 1 1 50 6 −40°C to +105°C R-8
ADuM3211BRZ 1 1 10 50 4 −40°C to +105°C R-8
ADuM3211BRZ-RL7 1 1 10 50 4 −40°C to +105°C R-8
ADuM3211TRZ 1 1 10 50 4 −40°C to +125°C R-8
ADuM3211TRZ-RL7 1 1 10 50 4 −40°C to +125°C R-8
ADuM3211WARZ 1 1 1 50 6 −40°C to +125°C R-8
ADuM3211WARZ-RL7 1 1 1 50 6 −40°C to +125°C R-8
ADuM3211WBRZ 1 1 10 50 4 −40°C to +125°C R-8
ADuM3211WBRZ-RL7 1 1 10 50 4 −40°C to +125°C R-8
ADuM3211WCRZ 1 1 25 50 4 −40°C to +125°C R-8
ADuM3211WCRZ-RL7 1 1 25 50 4 −40°C to +125°C R-8
1
Z = RoHS Compliant Part.
2
W = Qualified for Automotive Applications.
3
R-8 = 8-lead, narrow body SOIC_N.
Number
of Inputs,
V
Side
DD2
Maximum
Data Rate
(Mbps)
Maximum
Propagation
Delay, 5 V (ns)
Maximum
Pulse Width
Distortion (ns) Temperature Range
Package
Option3
AUTOMOTIVE PRODUCTS
The ADuM3210W/ADuM3211W models are available with controlled manufacturing to support the quality and reliability requirements
of automotive applications. Note that these automotive models may have specifications that differ from the commercial models; therefore,
designers should review the Specifications section of this data sheet carefully. Only the automotive grade products shown are available for
use in automotive applications. Contact your local Analog Devices account representative for specific product ordering information and
to obtain the specific Automotive Reliability reports for these models.