Enhanced system-level ESD performance per IEC 61000-4-x
High temperature operation: 125°C
Narrow body, RoHS-compliant, 8-lead SOIC
Low power operation
5 V operation
1.7 mA per channel maximum @ 0 Mbps to 2 Mbps
3.7 mA per channel maximum @ 10 Mbps
7.0 mA per channel maximum @ 25 Mbps
3 V operation
1.5 mA per channel maximum @ 0 Mbps to 2 Mbps
2.5 mA per channel maximum @ 10 Mbps
4.7 mA per channel maximum @ 25 Mbps
Bidirectional communication
3 V/5 V level translation
High data rate: dc to 25 Mbps (NRZ)
Precise timing characteristics
3 ns maximum pulse width distortion
3 ns maximum channel-to-channel matching
High common-mode transient immunity: >25 kV/μs
Safety and regulatory approvals
UL recognition: 2500 V rms for 1 minute per UL 1577
CSA Component Acceptance Notice #5A
VDE Certificate of Conformity
DIN V VDE V 0884-10 (VDE V 0884-10): 2006-12
V
= 560 V peak
IORM
Qualified for automotive applications
APPLICATIONS
Size-critical multichannel isolation
SPI interface/data converter isolation
RS-232/RS-422/RS-485 transceiver isolation
Digital field bus isolation
Hybrid electric vehicles, battery monitor
ADuM3200/ADuM3201
GENERAL DESCRIPTION
The ADuM3200/ADuM32011 are dual-channel, digital isolators based on the Analog Devices, Inc., iCoupler® technology.
Combining high speed CMOS and monolithic transformer
technology, these isolation components provide outstanding
performance characteristics superior to alternatives such as
optocoupler devices.
By avoiding the use of LEDs and photodiodes, iCoupler
devices remove the design difficulties commonly associated
with optocouplers. The typical optocoupler concerns regarding
uncertain current transfer ratios, nonlinear transfer functions,
and temperature and lifetime effects are eliminated with the
simple iCoupler digital interfaces and stable performance char-
acteristics. The need for external drivers and other discrete
components is eliminated with these iCoupler products. Furthermore, iCoupler devices consume one-tenth to one-sixth the
power of optocouplers at comparable signal data rates.
The ADuM3200/ADuM3201 isolators provide two independent
isolation channels in a variety of channel configurations and
data rates (see the Ordering Guide). They operate with 3.3 V
or 5 V supply voltages on either side, providing compatibility
with lower voltage systems as well as enabling voltage translation
functionality across the isolation barrier. The ADuM3200W
and ADuM3201W are automotive grade versions qualified
for 125°C operation.
In comparison to the ADuM120x isolators, the ADuM3200/
ADuM3201 isolators contain various circuit and layout changes
to provide increased capability relative to system-level IEC
61000-4-x testing (ESD, burst, and surge). The precise capability
in these tests for either the ADuM120x or ADuM3200/
ADuM3201 products is strongly determined by the design and
layout of the user’s board or module. For more information, see
the AN-793 Application Note, ESD/Latch-Up Considerations with
iCoupler Isolation Products.
1
Protected by U.S. Patents 5,952,849; 6,873,065; 7,075,329.
FUNCTIONAL BLOCK DIAGRAMS
1
V
DD1
ENCODEDECODE
2
V
IA
3
ENCODEDECODE
4
ND
V
IB
1
Figure 1. ADuM3200 Functional Block Diagram
Rev. C
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
All typical specifications are at TA = 25°C, V
operation range: 4.5 V ≤ V
are tested with C
= 15 pF and CMOS signal levels, unless otherwise noted.
L
≤ 5.5 V, 4.5 V ≤ V
DD1
Table 1.
Parameter Symbol Min Typ Max Min Typ Max Min Typ Max Unit Test Conditions
SWITCHING SPECIFICATIONS
Data Rate 1 10 25 Mbps Within PWD limit
Propagation Delay t
, t
20 150 20 50 20 45 ns 50% input to 50% output
Pulse Width Distortion PWD 40 3 3 ns |t
Change vs. Temperature 6 5 5 ps/°C
Pulse Width PW 1000 100 40 ns Within PWD limit
Propagation Delay Skew t
100 15 15 ns Between any two units
Channel Matching
Codirectional t
Opposing-Direction t
Output Rise/Fall Time tR/tF 10 2.5 2.5 ns 10% to 90%
50 3 3 ns 50 15 15 ns
= V
DD1
= 5 V. Minimum/maximum specifications apply over the entire recommended
DD2
≤ 5.5 V, and −40°C ≤ TA ≤ +105°C, unless otherwise noted. Switching specifications
DD2
− t
|
Table 2.
1 Mbps—A Grade,
B Grade, and C Grade
Parameter Symbol
10 Mbps—B Grade and
C Grade
25 Mbps—C Grade
Unit Test Conditions Min Typ Max Min Typ Max Min Ty p Max
SUPPLY CURRENT
ADuM3200I
I
ADuM3201I
I
1.3 1.7 3.5 4.6 7.7 10.0 mA No load
1.0 1.6 1.7 2.8 3.1 3.9 mA No load
1.1 1.5 2.6 3.4 5.3 6.8 mA No load
1.3 1.8 3.1 4.0 6.4 8.3 mA No load
DD2
Table 3. For All Models
Parameter Symbol Min Typ Max Unit Test Conditions
DC SPECIFICATIONS
Logic High Input Threshold VIH 0.7 V
Logic Low Input Threshold VIL 0.3 V
Logic High Output Voltages VOH V
V
V
V
− 0.1 5.0 V IOx = −20 µA, VIx = V
− 0.5 4.8 V IOx = −4 mA, VIx = V
Logic Low Output Voltages VOL 0.0 0.1 V IOx = 20 µA, VIx = V
0.2 0.4 V IOx = 4 mA, VIx = V
Quiescent Input Supply Current I
Quiescent Output Supply Current I
Dynamic Input Supply Current I
Dynamic Output Supply Current I
0.4 0.8 mA VIA = VIB = 0 V
0.5 0.6 mA VIA = VIB = 0 V
0.19 mA/Mbps
0.05 mA/Mbps
AC SPECIFICATIONS
Common-Mode Transient Immunity1 |CM| 25 35 kV/µs VIx = V
, VCM = 1000 V,
DDX
transient magnitude = 800 V
1
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
rising and falling common-mode voltage edges.
Rev. C | Page 3 of 20
ADuM3200/ADuM3201 Data Sheet
PHL
PLH
PLH
PHL
PLH
PHL
PSK
PSKCD
PSKOD
DD1
DD2
DD1
DC SPECIFICATIONS
DDx
DDx
DDx
IxH
DDx
IxH
Logic Low Output Voltages
VOL 0.0
0.1 V IOx = 20 µA, VIx = V
IxL
IxL
DDX
DDI(Q)
DDO(Q)
DDI(D)
DDO(D)
Common-Mode Transient Immunity1
|CM|
25
35 kV/µs
VIx = V
, VCM = 1000 V,
ELECTRICAL CHARACTERISTICS—3 V, 105°C OPERATION
All typical specifications are at TA = 25°C, V
operation range: 2.7 V ≤ V
are tested with C
= 15 pF and CMOS signal levels, unless otherwise noted.
L
≤ 3.6 V, 2.7 V ≤ V
DD1
Table 4.
A Grade B Grade C Grade
Parameter Symbol Min Typ Max Min Typ Max Min Typ Max Unit Test Conditions
SWITCHING SPECIFICATIONS
Data Rate 1 10 25 Mbps Within PWD limit
Propagation Delay t
, t
20 150 20 60 20 55 ns 50% input to 50% output
Pulse Width Distortion PWD
ADuM320040 3 3 ns |t
ADuM320140 4 4 ns |t
Change vs. Temperature 6 5 5 ps/°C
Pulse Width PW 1000 100 40 ns Within PWD limit
Propagation Delay Skew t
100 22 16 ns Between any two units
Channel Matching
Codirectional t
Opposing-Direction t
Output Rise/Fall Time tR/tF 3.0 3.0 3.0 ns 10% to 90%
50 3 3 ns 50 22 16 ns
= V
DD1
= 3.0 V. Minimum/maximum specifications apply over the entire recommended
DD2
≤ 3.6 V, and −40°C ≤ TA ≤ +105°C, unless otherwise noted. Switching specifications
DD2
− t
− t
|
|
Table 5.
1 Mbps—A Grade,
B Grade, and C Grade
Parameter Symbol
10 Mbps—B Grade and
C Grade 25 Mbps—C Grade
Unit Test Conditions Min Typ Max Min Typ Max Min Ty p Max
SUPPLY CURRENT
ADuM3200I
I
ADuM3201I
I
0.8 1.3 2.0 3.2 4.3 6.4 mA No load
0.7 1.0 1.1 1.7 1.8 2.4 mA No load
0.7 1.3 1.5 2.1 3.0 4.2 mA No load
0.8 1.6 1.9 2.4 3.6 5.1 mA No load
DD2
Table 6. For All Models
Parameter Symbol Min Typ Max Unit Test Conditions
Logic High Input Threshold VIH 0.7 V
Logic Low Input Threshold VIL 0.3 V
Logic High Output Voltages VOH V
V
0.2 0.4 V IOx = 4 mA, VIx = V
Input Current per Channel II −10 +0.01 +10 µA 0 V ≤ VIx ≤ V
V
V
− 0.1 3.0 V IOx = −20 µA, VIx = V
− 0.5 2.8 V IOx = −4 mA, VIx = V
Supply Current per Channel
Quiescent Input Supply Current I
Quiescent Output Supply Current I
Dynamic Input Supply Current I
Dynamic Output Supply Current I
0.3 0.5 mA VIA = VIB = 0 V
0.3 0.5 mA VIA = VIB = 0 V
0.10 mA/Mbps
0.03 mA/Mbps
AC SPECIFICATIONS
DDX
transient magnitude = 800 V
Refresh Rate fr 1.1 Mbps
1
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
= 15 pF, and CMOS signal levels, unless otherwise noted.
L
≤ 5.5 V, 2.7 V ≤ V
DD1
Table 7.
A Grade B Grade C Grade
Parameter Symbol Min Typ Max Min Typ Max Min Typ Max Unit Test Conditions
SWITCHING SPECIFICATIONS
Data Rate 1 10 25 Mbps Within PWD limit
Propagation Delay t
, t
15 150 15 55 15 50 ns 50% input to 50% output
Pulse Width Distortion PWD 40 3 3 ns |t
Change vs. Temperature 6 5 5 ps/°C
Pulse Width PW 1000 100 40 ns Within PWD limit
Propagation Delay Skew t
50 22 15 ns Between any two units
= 5 V, V
DD1
DD2
= 3 .0 V. Minimum/maximum specifications apply over the entire recommended
DD2
≤ 3.6 V, and −40°C ≤ TA ≤ +105°C, unless otherwise noted. Switching specifications
− t
|
Codirectional t
Opposing-Direction t
50 3 3 ns 50 22 15 ns
Output Rise/Fall Time tR/tF 3.0 3.0 3.0 ns 10% to 90%
Table 8.
Parameter Symbol
B Grade, and C Grade
Min Typ Max Min Typ Max Min Ty p Max
C Grade 25 Mbps—C Grade
Unit Test Conditions
SUPPLY CURRENT
ADuM3200I
I
I
1.3 1.7 3.5 4.6 7.7 10.0 mA No load
0.7 1.0 1.1 1.7 1.8 2.4 mA No load
0.8 1.6 1.9 2.4 3.6 5.1 mA No load
DD2
Table 9. For All Models
Parameter Symbol Min Typ Max Unit Test Conditions
DC SPECIFICATIONS
Logic High Input Threshold VIH 0.7 V
Logic Low Input Threshold VIL 0.8 0.3 V
Logic High Output Voltages VOH V
V
V
V
− 0.1 V
− 0.5 V
V IOx = −20 µA, VIx = V
− 0.2 V IOx = −4 mA, VIx = V
Logic Low Output Voltages VOL 0.0 0.1 V IOx = 20 µA, VIx = V
0.2 0.4 V IOx = 4 mA, VIx = V
Input Current per Channel II −10 +0.01 +10 µA 0 V ≤ VIx ≤ V
Supply Current per Channel
Quiescent Input Supply Current I
0.4 0.8 mA VIA = VIB = 0 V
Dynamic Output Supply Current I
AC SPECIFICATIONS
Common-Mode Transient Immunity1 |CM| 25 35 kV/µs VIx = V
Refresh Rate fr 1.2 Mbps
1
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
All typical specifications are at TA = 25°C, V
operation range: 2.7 V ≤ V
are tested with C
= 15 pF and CMOS signal levels, unless otherwise noted.
L
≤ 3.6 V, 4.5 V ≤ V
DD1
Table 10.
A Grade B Grade C Grade
Parameter Symbol Min Typ Max Min Typ Max Min Typ Max Unit Test Conditions
SWITCHING SPECIFICATIONS
Data Rate 1 10 25 Mbps Within PWD limit
Propagation Delay t
, t
Pulse Width Distortion PWD
ADuM320040 3 3 ns |t
ADuM320140 4 4 ns |t
Change vs. Temperature 6 5 5 ps/°C
Pulse Width PW 1000 100 40 ns Within PWD limit
Propagation Delay Skew t
50 22 15 ns Between any two units
Channel Matching
Codirectional t
Opposing-Direction t
Output Rise/Fall Time tR/tF 2.5 2.5 2.5 ns 10% to 90%
50 3 3 ns
50 22 15 ns
= 3 V, V
DD1
DD2
= 5 .0 V. Minimum/maximum specifications apply over the entire recommended
DD2
≤ 5.5 V, and −40°C ≤ TA ≤ +105°C, unless otherwise noted. Switching specifications
15 150 15 55 15 50 ns 50% input to 50% output
− t
|
− t
|
Table 11.
1 Mbps—A Grade,
B Grade, and C Grade
Parameter Symbol
10 Mbps—B Grade and
C Grade 25 Mbps—C Grade
Unit Test Conditions Min Typ Max Min Typ Max Min Ty p Max
SUPPLY CURRENT
ADuM3200I
I
ADuM3201I
I
0.8 1.3 2.0 3.2 4.3 6.4 mA No load
1.0 1.6 1.7 2.8 3.1 3.9 mA No load
0.7 1.3 1.5 2.1 3.0 4.2 mA No load
1.3 1.8 3.1 4.0 6.4 8.3 mA No load
DD2
Table 12. For All Models
Parameter Symbol Min Typ Max Unit Test Conditions
Logic High Input Threshold VIH 0.7 V
Logic Low Input Threshold VIL 0.4 0.3 V
Logic High Output Voltages VOH V
V
0.2 0.4 V IOx = 4 mA, VIx = V
Input Current per Channel II −10 +0.01 +10 µA 0 V ≤ VIx ≤ V
V
V
− 0. 1 V
− 0.5 V
V IOx = −20 µA, VIx = V
− 0.2 V IOx = −4 mA, VIx = V
Supply Current per Channel
Quiescent Input Supply Current I
Quiescent Output Supply Current I
Dynamic Input Supply Current I
Dynamic Output Supply Current I
0.3 0.5 mA VIA = VIB = 0 V
0.5 0.6 mA VIA = VIB = 0 V
0.10 mA/Mbps
0.05 mA/Mbps
AC SPECIFICATIONS
DDX
transient magnitude = 800 V
Refresh Rate fr 1.1 Mbps
1
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
rising and falling common-mode voltage edges.
Rev. C | Page 6 of 20
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