16-element FIFO for event recording
19 configurable I/Os allowing functions such as
Keypad decoding for matrix up to 11 × 8
Key press/release interrupts
Key pad lock/unlock
GPIO functions
GPI with selectable interrupt level
100 kΩ or 300 kΩ pull-up resistors
300 kΩ pull-down resistors
GPO with push-pull or open drain
Dual programmable logic blocks
PWM generator
Internal PWM generation
External PWM with internal PWM AND function
Clock divider
Reset generators
2
I
C interface with fast-mode plus (Fm+) support up to 1 MHz
Open-drain interrupt output
24-lead LFCSP 3.5 mm × 3.5 mm
25-ball WLCSP 1.99 mm × 1.99 mm
APPLICATIONS
Devices requiring keypad entry and I/O expansion
capabilities
GENERAL DESCRIPTION
The ADP5589 is a 19 I/O port expander with built-in keypad
matrix decoder, programmable logic, reset generator, and
PWM generator. I/O expander ICs are used in portable devices
(phones, remote controls, and cameras) and nonportable
applications (healthcare, industrial, and instrumentation). I/O
expanders can be used to increase the number of I/Os available
to a processor or to reduce the number of I/Os required
through interface connectors for front panel designs.
The ADP5589, which handles all key scanning and decoding,
can flag the main processor via an interrupt line when new key
events have occurred. In addition, GPI changes and logic
changes can be tracked as events via the FIFO, eliminating the
ADP5589
FUNCTIONAL BLOCK DIAGRAM
DD
ADP5589
RST
SD
SCL
C10
UVLO
POR
I2C INTERFACE
R0
R1
R2
R3
R4
R5
R6
R7
C0
C1
C2
C3
C4
C5
C6
C7
C8
C9
I/O
CONFIG
KEY SCAN
AND
DECODE
GPI SCAN
AND
DECODE
LOGIC 1
LOGIC 2
CLK DIV
PWM
RESET 1
GEN
RESET 2
GEN
OSCILLAT OR
Figure 1.
need to monitor different registers for event changes. The
ADP5589 is equipped with a FIFO to store up to 16 events.
Events can be read back by the processor via an I
interface.
The ADP5589 frees up the main processor from having to
monitor the keypad, thereby reducing power consumption
and/or increasing processor bandwidth for performing other
functions.
The programmable logic functions allow common logic
requirements to be integrated as part of the GPIO expander,
saving board area and cost.
GND
REGISTERS
2
C compatible
INT
09714-001
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Logic Low Input Voltage VIL 0.3 × VDD V
Logic High Input Voltage VIH 0.7 × VDD V
Input Leakage Current (Per Pin) V
PUSH-PULL OUTPUT LOGIC LEVEL (R0, R1, R2, R3, R4,
R5, R6, R7, C0, C1, C2, C3, C4, C5, C6, C7, C8, C9, C10)
Logic Low Output Voltage2 V
Logic Low Output Voltage3 V
Logic High Output Voltage VOH Source current = 5 mA 0.7 × VDD V
Logic High Leakage Current (Per Pin) V
INT
INT
, SDA)
)
OPEN-DRAIN OUTPUT LOGIC LEVEL (
Logic Low Output Voltage (
Logic Low Output Voltage (SDA) VOL I
Logic High Leakage Current (Per Pin) V
Logic Propagation Delay 125 300 ns
FF1 Hold Time4 0 ns
FF1 Setup Time4 175 ns
FF2 Hold Time
Delay from UVLO/Reset Inactive to I2C Access 60 µs
SCL Clock Frequency f
SCL High Time t
SCL Low Time t
Data Setup Time t
Data Hold Time t
Setup Time for Repeated Start t
UVLO active, VDD falling 1.2 1.3 V
VDD
UVLO inactive, VDD rising 1.4 1.6 V
VDD = 1.65 V 1 4 A
STNBY
CORE_FREQ = 50 kHz, scan active,
SCAN = 10 ms
30 40 µA
300 kΩ pull-up, VDD = 1.65 V
CORE_FREQ = 50 kHz, scan active,
SCAN = 10 ms
35 45 µA
100 kΩ pull-up, VDD = 1.65 V
CORE_FREQ = 50 kHz, scan active,
SCAN = 10 ms
75 85 A
300 kΩ pull-up, VDD = 3.3 V
CORE_FREQ = 50 kHz, scan active,
SCAN = 10 ms
80 90 A
100 kΩ pull-up, VDD = 3.3 V
0.1 1 µA
I-Leak
Sink current = 10 mA 0.4 V
OL
Sink current = 10 mA 0.5 V
OL
0.1 1 µA
OH-Leak
I
V
OL
0.1 1 µA
OH-Leak
= 10 mA 0.4 V
SINK
= 20 mA 0.4 V
SINK
0 ns
900 1000 1100 kHz
FREQ
0 1000 kHz
SCL
0.26 µs
HIGH
0.5 µs
LOW
50 ns
SU; DAT
0
HD; DAT
0.26 µs
SU; STA
µs
Rev. A | Page 3 of 48
ADP5589
Parameter Symbol Test Conditions/Comments Min Typ Max Unit
Hold Time for Start/Repeated Start t
Bus Free Time for Stop and Start Condition t
Setup Time for Stop Condition t
Data Valid Time t
Data Valid Acknowledge t
Rise Time for SCL and SDA tR 120 ns
Fall Time for SCL and SDA tF 120 ns
Pulse Width of Suppressed Spike tSP 0 50 ns
Capacitive Load for Each Bus Line C
1
All limits at temperature extremes are guaranteed via correlation using standard statistical quality control (SQC). Typical values are at TA = 25°C, VDD = 1.8 V.
2
Maximum of five GPIOs active simultaneously.
3
All GPIOs active simultaneously.
4
Guaranteed by design.
5
All timers are referenced from the base oscillator and have the same ±10% accuracy.
6
CB is the total capacitance of one bus line in picofarads.
SDA
SCL
SDA
70%
30%
t
F
S
t
R
t
t
F
HD; DAT
70%
30%
t
HD; STA
f
1/
SCL
FIRST CL OCK CYCLE
70%
30%
70%
30%
0.26 µs
HD; STA
0.5 µs
BUF
0.26 µs
SU; STO
0.45 µs
VD; DAT
0.45 µs
VD; ACK
B
t
SU; DAT
6
550 pF
t
70%
30%
VD; DAT
NINTH CLOCK
t
BUF
t
t
R
70%
30%
t
LOW
HIGH
SCL
VIL = 0.3VDD
V
= 0.7VDD
IH
t
SU; STA
t
HD; STA
t
SP
SrPS
Figure 2. I
2
C Interface Timing Diagram
70%
30%
t
VD; ACK
t
SU; STO
NINTH CLOCK
09714-002
Rev. A | Page 4 of 48
ADP5589
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
VDD to Ground –0.3 V to 4 V
SCL, SDA, RST, INT, R0, R1, R2,
Temperature Range
Storage Temperature Range −65°C to +150°C
Soldering Conditions JEDEC J-STD-020
1
In applications where high power dissipation and poor thermal resistance
are present, the maximum ambient temperature may have to be derated.
Maximum ambient temperature (T
operating junction temperature (T
dissipation of the device (P
resistance of the part/package in the application (θ
equation: T
A(MAX)
= T
J(MAXOP)
D(MAX)
− (θJA × P
) is dependent on the maximum
A(MAX)
= 125°C), the maximum power
J(MAXOP)
), and the junction-to-ambient thermal
).
D(MAX)
), using the following
JA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Absolute maximum ratings apply individually only, not in
combination. Unless otherwise specified, all other voltages are
referenced to ground.
THERMAL RESISTANCE
θJA is specified for the worst-case conditions, that is, a device
soldered in a circuit board for surface-mount packages.
Table 3.
Thermal Resistance θJA Unit
24-Lead LFCSP 43.83 C/W
Maximum Power Dissipation 120 mW
25-Ball WLCSP 43 C/W
Maximum Power Dissipation 120 mW
When sufficient voltage is applied to VDD and the
driven with a logic high level, the starts up in standby
ADP5589
mode with all settings at default. The user can configure the
device via the I
ADP5589
The
enters a reset state and all settings return to default.
RST
pin features a debounce filter.
2
C interface. When the
RST
pin is low, the
DEVICE OVERVIEW
The ADP5589 contains 19 multiconfigurable input/output pins.
Each pin can be programmed to enable the device to carry out
its various functions, as follows:
•Keypad matrix decoding (11-column by 8-row matrix
maximum).
• General-purpose I/O expansion (up to 19 inputs/outputs).
• PWM generation.
• Clock division of externally supplied source.
• Dual logic function building blocks (up to three inputs,
one output).
•Two re s et generators.
All 19 input/output pins have an I/O structure, as shown in
Figure 6.
DD
100kΩ
300kΩ
I/O
DRIVE
300kΩ
Each I/O can be pulled up with a 100 kΩ or 300 kΩ resistor or
pulled down with a 300 kΩ resistor. For logic output drive, each
I/O has a 5 mA PMOS source and a 10 mA NMOS sink for
push-pull type output. For open-drain output situations, the
5 mA PMOS source is not enabled. For logic input applications,
each I/O can be sampled directly or, alternatively, sampled
through a debounce filter.
The I/O structure shown in Figure 6 allows for all GPI and GPO
functions, as well as PWM and clock divide functions. For key
matrix scan and decode, the scanning circuit uses the 100 kΩ or
300 kΩ resistor for pulling up keypad row pins and the 10 mA
NMOS sinks for grounding keypad column pins (see the Key
Scan Control section for details about key decoding).
Configuration of the device is carried out by programming an
array of internal registers via the I
2
C interface. Feedback of
device status and pending interrupts can be flagged to an
external processor via the
INT
pin.
The ADP5589 is offered with three feature sets. Ta b le 5 lists the
options that are available for each model of the ADP5589.
Table 5. Available Options
Models Description
ADP5589ACPZ-00-R7
All GPIOs pulled up (default option)
ADP5589ACBZ-00-R7
ADP5589ACPZ-01-R7
Reset pass-through1
ADP5589ACBZ-01-R7
ADP5589ACPZ-02-R7
ADP5589ACBZ-02-R7
1
Reset pass-through implies that the RESET1 output (R4) follows the logic
level of the reset input pin,
2
Special function pins are defined as R0 (Row 0), R3 (Row 3), R4 (Row 4), C4
(Column 4), C6 (Column 6), and C9 (Column 9).
Pull-down on special function pins
RST
, after the oscillator has been enabled.
2
DEBOUNCE
Figure 6. I/O Structure
09714-005
Rev. A | Page 8 of 48
ADP5589
DETAILED DESCRIPTION
EVENT FIFO
It is important to understand the function of the event FIFO.
The ADP5589 features an event FIFO that can record as many
as 16 events. By default, the FIFO primarily records key events,
such as key press and key release. However, it is possible to
configure the general-purpose input (GPI) and logic activity
to generate event information on the FIFO as well. An event
count, EC[4:0], is composed of five bits and works in tandem
with the FIFO so that the user knows how much of the FIFO
must be read back at any given time.
The FIFO is composed of 16 eight-bit sections that the user
accesses by reading the FIFO_x registers. The actual FIFO
is not in user accessible registers until a read occurs. The
FIFO can be thought of as a “first in, first out” buffer used
to fill Register 0x03 to Register 0x12.
The event FIFO is made up of 16 eight-bit registers. In each
register, Bits[6:0] hold the event identifier, and Bit 7 holds the
event state. With seven bits, 127 different events can be identified.
See Tab le 1 1 for event decoding.
OVRFLOW_INT
KEY EVENTS
GPI EVENTS
LOGIC EVENTS
When events are available on the FIFO, the user should first
read back the event count, EC[4:0], to determine how many
events must be read back. Events can be read from the top of
the FIFO only. When an event is read back, all remaining events
in the FIFO are shifted up one location, and the EC[4:0] count
is decremented.
FIFO
UPDATE
EVENT1[7:0]
EVENT2[7:0]
EVENT3[7:0]
EVENT4[7:0]
EVENT5[7:0]
EVENT6[7:0]
EVENT7[7:0]
EVENT8[7:0]
EVENT9[7:0]
EVENT10[7:0]
EVENT11[7:0]
EVENT12[7:0]
EVENT13[7:0]
EVENT14[7:0]
EVENT15[7:0]
EVENT16[7:0]
Figure 7. Breakdown of Eventx[7:0] Bits
EC[4:0]
7
6543210
EVENT8_ID ENTIF IER[6:0]
EVENT8_STATE
FIRST
READ
The FIFO registers (0x03 to 0x12) always point to the top of the
FIFO (that is, the location of EVENT1[7:0]). If the user tries to
read back from any location in a FIFO, data is always obtained
from the top of that FIFO. This ensures that events can only be
read back in the order in which they occurred, thus ensuring
the integrity of the FIFO system.
Some of the onboard functions of ADP5589 can be programmed to generate events on the FIFO. A FIFO update control
block manages updates to the FIFO. If an I
accessing any of the FIFO address locations, updates are paused
until the I
A FIFO overflow event occurs when more than 16 events are
generated prior to an external processor reading a FIFO and
clearing it.
If an overflow condition occurs, the overflow status bit is set.
An interrupt is generated if overflow interrupt is enabled,
signaling to the processor that more than 16 events have
occurred.
KEY SCAN CONTROL
General
The 19 input/output pins can be configured to decode a keypad
09714-006
matrix up to a maximum size of 88 switches (11 × 8 matrix).
Smaller matrices can also be configured, freeing up the unused
row and column pins for other I/O functions.
The R0 through R7 I/O pins comprise the rows of the keypad
matrix. The C0 through C10 I/O pins comprise the columns of
the keypad matrix. Pins used as rows are pulled up via the internal
300 k (or 100 k) resistors. Pins used as columns are driven
low via the internal NMOS current sink.
EC = 3
KEY 3 PRESSED
KEY 3 RELEASED
GPI 7 ACTIVE
SECOND
READ
2
C transaction has completed.
EC = 2
KEY 3 RELEASED
GPI 7 ACTIVE
THIRD
READ
Figure 8. FIFO Operation
EC = 1
GPI 7 ACTIVE
2
C transaction is
EC = 0
09714-007
Rev. A | Page 9 of 48
ADP5589
1
23
4
56
7
89
Figure 9. Simplified Key Scan Block
VDD
KEY
SCAN
CONTROL
R0R1R2C2C0C1
3 × 3 KEYPAD MATRIX
09714-008
Figure 9 shows a simplified representation of the key scan block
using three row and three column pins connected to a small
3 × 3, nine-switch keypad matrix. When the key scanner is idle,
the row pins are pulled high and the column pins are driven
low. The key scanner operates by checking the row pins to see
if they are low.
If Switch 6 in the matrix is pressed, R1 connects to C2. The key
scan circuit senses that one of the row pins is pulled low, and a
key scan cycle begins. Key scanning involves driving all column
pins high, then driving each column pin, one at a time, low and
sensing whether a row pin is low or not. All row/column pairs are
scanned; therefore, if multiple keys are pressed, they are
detected.
To prevent glitches or narrow press times being registered as a
valid key press, the key scanner requires the key be pressed for
two scan cycles. The key scanner has a wait time between each
scan cycle; therefore, the key must be pressed and held for at
least this wait time to register as being pressed. If the key is
continuously pressed, the key scanner continues to scan, wait,
scan, wait, and so forth.
If Switch 6 is released, the connection between R1 and C2
breaks, and R1 is pulled up high. The key scanner requires that
the key be released for two scan cycles because the release of a
key is not necessarily in sync with the key scanner, it may take
up to two full wait/scan cycles for a key to register as released.
When the key is registered as released, and no other keys are
pressed, the key scanner returns to idle mode.
For the remainder of this document, the press/release status of a
key is represented as simply a logic signal in the figures. A logic
high level represents the key status as pressed, and a logic low
represents released. This eliminates the need to draw individual
row/column signals when describing key events.
Figure 11 shows a detailed representation of the key scan block
and its associated control and status signals. When all row and
column pins are used, a matrix of 88 unique keys can be
scanned.
Use Registers PIN_CONFIG_A[7:0] (0x49),
PIN_CONFIG_B[7:0] (0x4A), and PIN_CONFIG_C[2:0]
(0x4B) to configure I/Os for keypad decoding. The number
label on each key switch represents the event identifier that
is recorded if that switch is pressed. If all row/column pins
are configured, it is possible to observe all 88 key identifiers on
the FIFO.
If a smaller 3 × 3 matrix is configured, for example, using the
C5, C6, and C7 column pins and the R1, R2, and R3 row pins,
only the nine event identifiers (17, 18, 19, 28, 29, 30, 39, 40,
and 41) can possibly be observed on the FIFO, as shown in
Figure 11.
By default, the ADP5589 records key presses and releases on the
FIFO. Figure 12 illustrates what happens when a single key is
pressed and released. Initially, the key scanner is idle. When
Key 32 is pressed, the scanner begins scanning through all
configured row/column pairs. After the scan wait time, the
scanner again scans through all configured row/column pairs
and detects that Key 32 has remained pressed, which sets the
EVENT_INT interrupt. The event counter, EC[4:0], is incremented to 1, EVENT1[7:0] of the FIFO is updated with its event
identifier set to 32, and its Event1_State bit is set to 1, indicating
a press.
The key scanner continues the scan/wait cycles while the key
remains pressed. If the scanner detects that the key has been
released for two consecutive scan cycles, the event counter
EC[4:0] is incremented to 2, and EVENT2[7:0] of the FIFO is
updated with its event identifier set to 32. Its Event2_State bit is
set to 0, indicating a release. The key scanner goes back to idle
mode because no other keys are pressed.
The EVENT_INT interrupt can be triggered by both press and
release key events. As shown in Figure 13, if Key 32 is pressed,
EVENT_INT is asserted, EC[4:0] is updated, and the FIFO is
updated. During the time that the key is still pressed, it is
possible for the FIFO to be read, the event counter decremented
to 0, and EVENT_INT cleared. When the key is finally released,
EVENT_INT is asserted, the event counter incremented, and
the FIFO updated with the release event information.
09714-011
Rev. A | Page 11 of 48
ADP5589
KEY 32
KEY SCAN
EVENT_INT
EC[4:0]
KEY 32 PRESSKEY 32 RELEASE
Figure 13. Asserting the EVENT_INT Interrupt
101
FIFO
1
32
0
0
0
0
FIFO
READ
0
0
EVENT_INT CLEARED
FIFO
0
0
0
0
0
0
0
0
FIFO
0
0
0
0
32
0
0
0
Key Pad Extension
As shown in Figure 11, the keypad can be extended if each row
is connected directly to ground by a switch. If the switch placed
between R0 and ground is pressed, the whole row is grounded.
When the key scanner completes scanning, it normally detects
Key 1 to Key 11 as being pressed; however, this unique condition is decoded by the ADP5589, and Key Event 89 is assigned
to it. Up to eight more key event assignments are possible, allowing
the keypad size to extend up to 96. However, if one of the
extended keys is pressed, none of the keys on that row is
detectable. Activation of a ground key causes all other keys
sharing that row to be undetectable.
Ghosting
Ghosting is an occurrence where, given certain key press combinations on a keypad matrix, a false positive reading of an
additional key is detected. Ghosting is created when three or
more keys are pressed simultaneously on multiple rows or
columns (see Figure 14). Key combinations that form a right
angle on the keypad matrix can cause ghosting.
The solution to ghosting is to select a keypad matrix layout that
takes into account three key combinations that are most likely
to be pressed together. Multiple keys pressed across one row or
across one column do not cause ghosting. Staggering keys so that
they do not share a column also avoids ghosting. The most
common practice is to place keys that are likely to be pressed
together in the same row or column. Some examples of keys
that are likely to be pressed together are as follows:
• The navigation keys in combination with Select.
• The navigation keys in combination with the space bar.
• The reset combination keys, such as CTRL + ALT + DEL.
COL0
ROW0
ROW1
ROW2
09714-012
Figure 14. COL0-ROW3 is a Ghost Key Due to Short Between ROW0, COL0,
ROW3
PRESS
GHOST
COL2 and ROW3 During Key Press
COL1COL2
PRESS
PRESS
09714-013
FIFO Lock/Unlock
The ADP5589 features a lock mode, whereby events are prevented from updating the FIFO or the event counter or from
generating EVENT_INT interrupts until an unlock event is
detected.
The lock feature is enabled by setting the LOCK_EN (0x37[0])
bit or, alternatively, by a user programmable key or GPI event
(set via EXT_LOCK_EVENT[7:0], Address 0x35). If the lock
feature is enabled by the LOCK_EN bit, the LOCK_STAT
(0x02[5]) bit is set. If the lock feature is enabled by an external
event, then the LOCK_STAT bit is set, and a LOCK_INT
interrupt is generated.
Unlock events are programmed via the UNLOCK1[7:0] (0x33)
and UNLOCK2[7:0] (0x34) registers. Bits[6:0] comprise the
even number. Bit 7 determines the active/inactive event (see the
UNLOCK1 Register 0x33 (Tabl e 59 ) and the UNLOCK2
Register 0x34 (Tabl e 60 ).
If the user chooses to use only one unlock event, only the
UNLOCK1[7:0] register should be programmed. Unlock events
can be key press events (Event 1 to Event 88). Key release events
are ignored when the keypad is locked and should not be used as
unlock events.
GPIs configured to generate FIFO updates can also be used as
unlock events (Event 97 to Event 115, either active or inactive).
If either UNLOCKx register is programmed with Value 127
(Event 127), this means that any allowable event (key or
GPI) is the unlock event. For example, if UNLOCK1[6:0] is
programmed with 17, and UNLOCK2[6:0] is programmed with
127, the unlock sequence is Key 17 press followed by any other
allowable event.
If the first unlock event is detected, partial unlock has occurred.
If the next event after the first unlock event is not the second
unlock event, then a full lock state is entered again. If the next
event after the first unlock event is the second unlock event,
then LOCK_STAT is cleared, and a LOCK_INT interrupt is
generated. The user can at any stage clear LOCK_EN. This
clears the LOCK_STAT bit but does not cause a LOCK_INT
interrupt to be generated.
Rev. A | Page 12 of 48
ADP5589
When full unlock is achieved, FIFO and event count updates
resume. Note that if a key press is used as the second unlock
event, the release of that key is captured on the FIFO after
unlocking is completed.
The ADP5589 features an unlock timer, UNLOCK_TIMER[2:0]
(0x36[2:0]). When enabled, after the first unlock event occurs,
the unlock timer begins counting, and the second unlock event
must occur before the unlock timer expires. If the unlock timer
expires, the first unlock event must occur again to restart the
unlock process. Figure 15 shows a simple state diagram of the
unlocking process.
NO
UNLOCK EVENT
LOCKED
EVENT
DETECTED?
YES
FIRST
UNLOCK
EVENT?
YES
SECOND
REQUIR ED?
YES
NO
NO
LOCK_STAT = 1
LOCK_STAT = 1
When lock mode is enabled, no EVENT_INT interrupts can be
generated until the unlock events occur.
The ADP5589 features an interrupt mask timer, INT_MASK_
TIMER[4:0] (0x36[7:3]). When this timer and lock mode are
enabled, a single EVENT_INT is generated if any key is pressed
or any GPI (programmed to update the FIFO) is active. When
the EVENT_INT is generated, the mask timer begins counting.
No additional EVENT_INT interrupts are generated until
the mask timer expires and a new key is pressed or any GPI
(programmed to update the FIFO) is active, unless the unlock
events occur, in which case, normal operation is resumed.
Allowing a single EVENT_INT interrupt is useful to alert the
processor to turn on its screen and display an unlock message
to the user. Blanking out additional key presses ensures that the
processor is not unnecessarily interrupted until the unlock
events occur. Figure 16 shows the unlock sequence when the
interrupt mask timer is enabled.
UNLOCK
NO
TIMER
ENABLED?
EVENT
DETECTED?
YES
NO
LOCK_STAT = 0
START UNLOCK TIMER
YES
EVENT
DETECTED?
YES
UNLOCK
TIMER
EXPIRED?
NO
SECOND
UNLOCK EVEN T?
YES
UNLOCK
NO
YES
NO
09714-014
Figure 15. State Diagram of Unlocking Process
Rev. A | Page 13 of 48
ADP5589
LOCKED
EVENT
DETECTED?
YES
MASK
TIMER ENABLED?
NO
NO
FIRST
UNLOCK
EVENT?
YES
SECOND
NO
UNLOCK EVENT
REQUIRED ?
YES
UNLOCK
NO
TIMER
ENABLED?
YES
START UNLOCK TIMER
NO
NO
EVENT
DETECTED?
YES
SET
EVENT_INT = 1
START MASK TIMER
NO
LOCK_STAT = 1
YES
YES
MASK
TIMER EXPI RED?
LOCK_STAT = 1
SET
EVENT_INT = 1
START MASK TIMER
YES
YESNO
TIMER EX PIRED?
TIMER E NABLED?
MASK
Figure 16. Unlock Sequence
MASK
NO
EVENT_INT = 1
START MASK TIM ER
YESNO
SET
LOCK_STAT = 0
YES
MASK
TIMER E XPIRED?
EVENT
DETECTED?
YES
MASK
TIMER ENABLED?
NO
UNLOCK
TIMER
EXPIRED?
NO
SECOND
UNLOCK EVENT ?
YES
UNLOCK
NO
YES
NO
09714-015
Rev. A | Page 14 of 48
ADP5589
G
GPI Input
Each of the 19 I/O lines can be configured as a general-purpose
logic input line. Figure 17 shows a detailed representation of the
GPI scan and detect block and all its associated control and
status signals.
PIN_CONFIG _A[7:0]
PIN_CONFIG _B[7:0]
PIN_CONFIG _C[2:0]
EXT_LOCK_EVENT[7:0]
INT_MASK_TIMER[4:0]
GPIO_DIRECTION_A[7:0]
GPIO_DIRECTION_B[7:0]
GPIO_DIRECTION_C[2:0]
GPI_INT_LEVEL_A[7:0]
GPI_INT_LEVEL_B[7:0]
GPI_INT_LEVEL_C[2:0]
GPI_I NTERRUPT_EN_A[7:0]
GPI_I NTERRUPT_EN_B[7:0]
GPI_I NTERRUPT_EN_C[2:0]
GPI_EVENT_EN_A[ 7:0]
GPI_EVENT_EN_B[ 7:0]
GPI_EVENT_EN_C[ 2:0]
RESET_TRIGGER_TIME[2:0]
RESET1_EVENT_A[7: 0]
RESET1_EVENT_B[7: 0]
RESET1_EVENT_C[7: 0]
RESET2_EVENT_A[7: 0]
RESET2_EVENT_B[7: 0]
LOCK_EN
UNLOCK1[7:0]
UNLOCK2[7:0]
UNLOCK_T IMER[2:0 ]
LCK_TRK_GPI
GPIO 1
(R0)
GPIO 2
(R1)
GPIO 3
(R2)
GPIO 4
(R3)
GPIO 5
(R4)
GPIO 6
(R5)
GPIO 7
(R6)
GPIO 8
(R7)
GPIO 9
(C0)
GPIO 10
(C1)
GPIO 11
(C2)
GPIO 12
(C3)
GPIO 13
(C4)
GPIO 14
(C5)
GPIO 15
(C6)
GPIO 16
(C7)
GPIO 17
(C8)
GPIO 18
(C9)
GPIO 19
(C10)
GPI SCAN
CONTROL
LOCK_STAT
LOCK_INT
EVENT_INT
GPI_INT
GPI_INT_STAT_A[7:0]
GPI_INT_STAT_B[7:0]
GPI_INT_STAT_C[2:0]
GPI_ STATUS_A[7:0 ]
GPI_ STATUS_B[7:0 ]
GPI_ STATUS_C[2:0 ]
2
I
C BUSY?
KEY EVENT
GPI EVENT
LOGI C EVENT
FIFO
UPDATE
OVRFLOW_INT
EC[4:0]
FIFO
Figure 17. GPI Scan and Detect Block
The current input state of each GPI can be read back using the
GPI_STATUS_x registers. Each GPI can be programmed to
generate an interrupt via the GPI_INTERRUPT_EN_x registers.
The interrupt status is stored in the GPI_INT_STAT_x registers.
GPI interrupts can be programmed to trigger on inputs being
high or on inputs being low via the GPI_INT_LEVEL_x
registers. If any of the GPI interrupts is triggered, the master
GPI_INT interrupt is also triggered.
Figure 18 demonstrates a single GPI and how it affects its
corresponding status and interrupt status bits.
GPI 6
GPI_INT_LEVEL_A[5]
PI_INTERRUPT_ EN_A[5]
GPI_STATUS_A[ 5]
GPI_INT_STAT_A[5]
GPI_INT
CLEARED
BY READ
CLEARED
BY WRITE ‘1’
09714-017
Figure 18. Single GPI Example
GPIs can be programmed to generate FIFO events via the
GPI_EVENT_EN_x registers. GPIs in this mode do not generate GPI_INT interrupts and instead generate EVENT_INT
interrupts. Figure 19 shows several GPI lines and their effects
on the FIFO and event count, EC[4:0].
GPI 6
GPI 14
GPI 2
GPI SCAN
EVENT_INT
EC[4:0]
GPI 2 ACTIVE
GPI 6 ACTIVE
GPI 14 ACTIVE
GPI 14 INACT IVE
GPI 6 ACTIVE
GPI 2 ACTIVE
16
FIFO
1
101
105
1
113
1
113
0
105
0
101
0
234 5
09714-018
Figure 19. Multiple GPI Lines Example
The GPI scanner is idle until it detects a level transition. It scans
the GPI inputs and updates accordingly. It then returns to idle
immediately; it does not scan/wait, like the key scanner. As
such, the GPI scanner can detect narrow pulses once they get
past the 50 s input debounce filter.
09714-016
GPIs (programmed for FIFO updating) can be used as keypad
unlock events via the UNLOCKx registers (see the FIFO
Lock/Unlock section). The LCK_TRK_GPI bit can be used to
allow GPIs (programmed for FIFO updating) to be tracked
when the keypad is locked.
GPO OUTPUT
Each of the 19 I/O lines can be configured as a general-purpose
output (GPO) line. Figure 6 shows a detailed diagram of the I/O
structure. See the Detailed Register Descriptions section for
GPO configuration and usage.
Rev. A | Page 15 of 48
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