All-in-one synchronous buck driver
Bootstrapped high-side drive
One PWM signal generates both drives
Anticross-conduction protection circuitry
Output disable control turns off both MOSFETs to float
output per Intel® VRM 10 specification
APPLICATIONS
Multiphase desktop CPU supplies
Single-supply synchronous buck converters
Driver with Output Disable
ADP3110
GENERAL DESCRIPTION
The ADP3110 is a dual, high voltage MOSFET driver optimized
for driving two N-channel MOSFETs, which are the two
switches in a nonisolated synchronous buck power converter.
Each of the drivers is capable of driving a 3000 pF load with a
25 ns propagation delay and a 30 ns transition time. One of the
drivers can be bootstrapped and is designed to handle the high
voltage slew rate associated with floating high-side gate drivers.
The ADP3110 includes overlapping drive protection to prevent
shoot-through current in the external MOSFETs.
OD
The
MOSFETs to prevent rapid output capacitor discharge during
system shutdown.
The ADP3110 is specified over the commercial temperature
range of 0°C to 85°C and is available in an 8-lead SOIC_N
package.
pin shuts off both the high-side and the low-side
OD
IN
2
3
ADP3110
SIMPLIFIED FUNCTIONAL BLOCK DIAGRAM
12V
C
BST1
D1
C
BST2
R
G
R
BST
Q1
TO
INDUCTOR
Q2
05514-001
VCC
4
BST
1
DRVH
8
DELAY
SW
7
CMP
VCC
6
CMP
1V
DELAY
CONTROL
LOGIC
Figure 1.
5
6
DRVL
PGND
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
VCC = 12 V, BST = 4 V to 26 V, TA = 25°C, unless otherwise noted.
Table 1.
Parameter Symbol Conditions Min Typ Max Unit
PWM INPUT
OD INPUT
HIGH-SIDE DRIVER
LOW-SIDE DRIVER
SUPPLY
1
2
3
1
Input Voltage High
Input Voltage Low
Input Current
Hysteresis
2
2
2
2
2.0 V
0.8 V
−1 +1 μA
90 250 mV
Input Voltage High
Input Voltage Low
Input Current
Hysteresis
2
Propagation Delay Times
2
2
2
2.0 V
0.8 V
−1 +1 μA
90 250 mV
3
See Figure 3 20 35 ns
tpdl
OD
See
tpdh
OD
Figure 3 40 55 ns
Output Resistance, Sourcing Current BST to SW = 12 V 3.8 4.4 Ω
Output Resistance, Sinking Current R
DRV + SW
BST to SW = 12 V 1.4 1.8 Ω
Output Resistance, Unbiased BST to SW = 0 V 10 kΩ
Transition Times
tf
Propagation Delay Times
tpdl
SW Pull Down Resistance R
3
tr
DRVH
DRVH
tpdh
SW − PGND
DRVH
DRVH
BST to SW = 12 V, C
BST to SW = 12 V, C
BST to SW = 12 V, C
BST to SW = 12 V, C
= 3 nF, see Figure 4 40 55 ns
LOAD
= 3 nF, see Figure 4 30 45 ns
LOAD
= 3 nF,see Figure 4 45 65 ns
LOAD
= 3 nF, see Figure 4 25 35 ns
LOAD
SW to PGND 10 kΩ
Output Resistance, Sourcing Current 3.4 4.0 Ω
Output Resistance, Sinking Current R
DRVL − PGND
1.4 1.8 Ω
Output Resistance, Unbiased VCC = PGND 10 kΩ
Transition Times tr
tf
Propagation Delay Times
Supply Voltage Range
Supply Current
UVLO Voltage
Hysteresis
All limits at temperature extremes are guaranteed via correlation using standard statistical quality control (SQC) methods.
Specifications apply over the full operating temperature range TA = 0°C to 85°C.
For propagation delays, tpdh refers to the specified signal going high, and tpdl refers to it going low.
2
2
2
2
V
CC
I
SYS
4.15 13.2 V
BST = 12 V, IN = 0 V 2 5 mA
VCC rising 1.5 3.0 V
350 mV
Rev. 0 | Page 3 of 12
ADP3110
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
VCC –0.3 V to +15 V
BST –0.3 V to VCC + 15 V
BST to SW –0.3 V to +15 V
SW
DC –5 V to +15 V
<200 ns –10 V to +25 V
DRVH
DC SW – 0.3 V to BST + 0.3 V
<200 ns SW – 2 V to BST + 0.3 V
DRVL
DC –0.3 V to VCC + 0.3 V
<200 ns –2 V to VCC + 0.3 V
OD
IN,
θJA, SOIC_N
2-Layer Board 123°C/W
4-Layer Board 90°C/W
Operating Ambient Temperature
Range
Junction Temperature Range 0°C to 150°C
Storage Temperature Range –65°C to +150°C
Lead Temperature Range
Soldering (10 sec) 300°C
Vapor Phase (60 sec) 215°C
Infrared (15 sec) 260°C
–0.3 V to 6.5 V
0°C to 85°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability. Unless otherwise specified all other voltages
are referenced to PGND.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. 0 | Page 4 of 12
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