Power input voltage as low as 2.75 V to 20 V
Bias supply voltage range: 2.75 V to 5.5 V
Minimum output voltage: 0.8 V
0.8 V reference voltage with ±1.0% accuracy
Supports all N-channel MOSFET power stages
Available in 300 kHz, 600 kHz, and 1.0 MHz options
No current-sense resistor required
Power saving mode (PSM) for light loads (ADP1883 only)
Resistor-programmable current-sense gain
Thermal overload protection
Short-circuit protection
Precision enable input
Integrated bootstrap diode for high-side drive
140 μA shutdown supply current
Starts into a precharged load
Small, 10-lead MSOP package
APPLICATIONS
Telecom and networking systems
Mid to high end servers
Set-top boxes
DSP core power supplies
R
TOP
OUT
VDD= 2.75V TO 5.5V
100
95
90
85
80
75
70
65
60
55
EFFICIENCY (%)
50
45
40
35
30
25
1001k10k100k
Figure 2. ADP1882/ADP1883 Efficiency vs. Load Current
The ADP1882/ADP1883 are versatile current-mode, synchronous
step-down controllers that provide superior transient response,
optimal stability, and current-limit protection by using a constant
on-time, pseudo-fixed frequency with a programmable currentlimit, current-control scheme. In addition, these devices offer
optimum performance at low duty cycles by using valley currentmode control architecture. This allows the ADP1882/ADP1883
to drive all N-channel power stages to regulate output voltages
as low as 0.8 V.
The ADP1883 is the power saving mode (PSM) version of the
device and is capable of pulse skipping to maintain output
regulation while achieving improved system efficiency at light
loads (see the Power Saving Mode (PSM) Version (ADP1883)
section for more information).
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Available in three frequency options (300 kHz, 600 kHz, and
1.0 MHz, plus the PSM option), the ADP1882/ADP1883 are
well suited for a wide range of applications. These ICs not only
operate from a 2.75 V to 5.5 V bias supply, but they also can
accept a power input as high as 20 V.
In addition, an internally fixed soft start period is included to limit
input in-rush current from the input supply during startup and
to provide reverse current protection during soft start for a precharged output. The low-side current-sense, current-gain scheme
and integration of a boost diode, along with the PSM/forced
pulse-width modulation (PWM) option, reduce the external
part count and improve efficiency.
The ADP1882/ADP1883 operate over the −40°C to +125°C
junction temperature range and are available in a 10-lead MSOP.
All limits at temperature extremes are guaranteed via correlation using standard statistical quality control (SQC). VDD = 5 V, BST − SW = 5 V,
V
= 13 V. The specifications are valid for TJ = −40°C to +125°C, unless otherwise specified.
IN
Table 1.
Parameter Symbol Conditions Min Typ Max Unit
POWER SUPPLY CHARACTERISTICS
High Input Voltage Range VIN ADP1882ARMZ-0.3/ADP1883ARMZ-0.3 (300 kHz) 2.75 12 20 V
ADP1882ARMZ-0.6/ADP1883ARMZ-0.6 (600 kHz) 2.75 12 20 V
ADP1882ARMZ-1.0/ADP1883ARMZ-1.0 (1.0 MHz) 3.0 12 20 V
Low Input Voltage Range VDD C
ADP1882ARMZ-0.3/ADP1883ARMZ-0.3 (300 kHz) 2.75 5 5.5 V
ADP1882ARMZ-0.6/ADP1883ARMZ-0.6 (600 kHz) 2.75 5 5.5 V
ADP1882ARMZ-1.0/ADP1883ARMZ-1.0 (1.0 MHz) 3.0 5 5.5 V
Quiescent Current I
Shutdown Current I
Q_DD
DD, SD
+ I
+ I
Q_BST
BST, SD
Undervoltage Lockout UVLO Rising VDD (see Figure 35 for temperature variation) 2.65 V
UVLO Hysteresis Falling VDD from operational state 190 mV
SOFT START
Soft Start Period See Figure 58 3.0 ms
ERROR AMPLIFIER
FB Regulation Voltage VFB T
T
T
Transconductance GM 300 520 730 μs
FB Input Leakage Current I
FB = 0.8 V, COMP/EN = released 1 50 nA
FB, LEAK
CURRENT-SENSE AMPLIFIER GAIN
Programming Resistor (RES)
RES = 47 kΩ ± 1% 2.98 3.4 3.7 V/V
Value from DRVL to PGND
RES = 22 kΩ ± 1% 6 6.6 7.4 V/V
RES = none 24.1 26.7 29.3 V/V
RES = 100 kΩ ± 1% 12.1 13.4 14.7 V/V
SWITCHING FREQUENCY
ADP1882ARMZ-0.3/
300 kHz
ADP1883ARMZ-0.3 (300 kHz)
On Time VIN = 5 V, V
Minimum On Time VIN = 20 V 145 190 ns
Minimum Off Time 84% duty cycle (maximum) 340 400 ns
ADP1882ARMZ-0.6/
600 kHz
ADP1883ARMZ-0.6 (600 kHz)
On Time VIN = 5 V, V
Minimum On Time VIN = 20 V, V
Minimum Off Time 65% duty cycle (maximum) 340 400 ns
ADP1882ARMZ-1.0/
1.0 MHz
ADP1883ARMZ-1.0 (1.0 MHz)
On Time VIN = 5 V, V
Minimum On Time VIN = 20 V 60 85 ns
Minimum Off Time 45% duty cycle (maximum) 340 400 ns
= 1 μF to PGND, CIN = 0.22 μF to GND
IN
FB = 1.5 V, no switching 1.1 mA
COMP/EN < 285 mV 140 215 μA
= 25°C 800 mV
J
= −40°C to +85°C 795.3 800 805.5 mV
J
= −40°C to +125°C 792.8 800 808.0 mV
J
Typical values measured at 50% time points with
0 nF at DRVH and DRVL; maximum values are
guaranteed by bench evaluation
= 2 V, TJ = 25°C 1115 1200 1285 ns
OUT
= 2 V, TJ = 25°C 490 540 585 ns
OUT
= 0.8 V 82 110 ns
OUT
= 2 V, TJ = 25°C 280 312 340 ns
OUT
1
Rev. 0 | Page 3 of 40
ADP1882/ADP1883
Parameter Symbol Conditions Min Typ Max Unit
OUTPUT DRIVER CHARACTERISTICS
High-Side Driver
Output Source Resistance I
Output Sink Resistance I
Rise Time
Fall Time
Output Source Resistance I
Output Sink Resistance I
2
Rise Time
Fall Time
2
t
t
V
R, DRVL
V
F, D RV L
Propagation Delays
DRVL Fall to DRVH Rise
DRVH Fall to DRVL Rise
SW Leakage Current I
2
2
t
t
BST − SW = 4.4 V (see Figure 60) 22 ns
TPDH, DRVH
BST − SW = 4.4 V (see Figure 61) 24 ns
TPDH, DRVL
BST = 25 V, SW = 20 V, VDD = 5.5 V 110 μA
SW, LEAK
Integrated Rectifier
Channel Impedance I
PRECISION ENABLE THRESHOLD
Logic High Level VIN = 2.75 V to 20 V, VDD = 2.75 V to 5.5 V 235 285 330 mV
Enable Hysteresis VIN = 2.75 V to 20 V, VDD = 2.75 V to 5.5 V 35 mV
COMP VOLTAGE
COMP Clamp Low Voltage V
COMP Clamp High Voltage V
COMP Zero Current Threshold V
THERMAL SHUTDOWN T
COMP(LOW )
2.75 V ≤ VDD ≤ 5.5 V 2.55 V
COMP(H IGH)
2.75 V ≤ VDD ≤ 5.5 V 0.95 V
COMP_ZC T
TMSD
Thermal Shutdown Threshold Rising temperature 155 °C
Thermal Shutdown Hysteresis 15 °C
Hiccup Current Limit Timing 6 ms
1
The maximum specified values are with the closed loop measured at 10% to 90% time points (see and , C
MOSFETs specified as Infineon BSC042N030MSG.
2
Not automatic test equipment (ATE) tested.
= 1.5 A, 100 ns, positive pulse (0 V to 5 V) 2 3.5 Ω
SOURCE
= 1.5 A, 100 ns, negative pulse (5 V to 0 V) 0.8 2 Ω
SINK
= 1.5 A, 100 ns, positive pulse (0 V to 5 V) 1.7 3 Ω
SOURCE
= 1.5 A, 100 ns, negative pulse (5 V to 0 V) 0.75 2 Ω
SINK
= 5.0 V, CIN = 4.3 nF (see Figure 61) 18 ns
DD
= 5.0 V, CIN = 4.3 nF (see Figure 60) 16 ns
DD
= 10 mA 22 Ω
SINK
From disable state, release COMP/EN pin to enable
device; 2.75 V ≤ V
≤ 5.5 V
DD
Figure 60 Figure 61)
0.47 V
= 4.3 nF, and the upper-side and lower-si
GATE
de
Rev. 0 | Page 4 of 40
ADP1882/ADP1883
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
VDD to GND −0.3 V to +6 V
VIN to PGND −0.3 V to +28 V
FB, COMP/EN to GND −0.3 V to (VDD + 0.3 V)
DRVL to PGND −0.3 V to (VDD + 0.3 V)
SW to PGND −2.0 V to +28 V
BST to SW −0.8 V to (VDD + 0.3 V)
BST to PGND −0.3 V to 28 V
DRVH to SW −0.3 V to VDD
PGND to GND
θJA (10-Lead MSOP)
2-Layer Board 213.1°C/W
4-Layer Board 171.7°C/W
Operating Junction Temperature Range −40°C to +125°C
Storage Temperature Range −65°C to +150°C
Soldering Conditions JEDEC J-STD-020
Maximum Soldering Lead Temperature
(10 sec)
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Absolute maximum ratings apply individually only, not in
combination. Unless otherwise specified, all other voltages are
referenced to PGND.
±0.3 V
300°C
THERMAL RESISTANCE
θJA is specified for the worst-case conditions, that is, a device
soldered in a circuit board for surface-mount packages.
Table 3. Thermal Resistance
Package Type θ
θJA (10-Lead MSOP)
2-Layer Board 213.1 °C/W
4-Layer Board 171.7 °C/W
1
θJA is specified for the worst-case conditions; that is, θJA is specified for device
soldered in a circuit board for surface-mount packages.
1
Unit
JA
BOUNDARY CONDITION
In determining the values given in Ta b le 2 and Tabl e 3, natural
convection was used to transfer heat to a 4-layer evaluation board.
ESD CAUTION
Rev. 0 | Page 5 of 40
ADP1882/ADP1883
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
VIN
1
ADP1882/
FB
GND
VDD
2
ADP1883
3
TOP VIEW
4
(Not to S cale)
5
COMP/EN
Figure 3. Pin Configuration
Table 4. Pin Function Descriptions
Pin No. Mnemonic Description
1 VIN High Input Voltage. Connect VIN to the drain of the upper-side MOSFET.
2 COMP/EN Output of the Internal Error Amplifier/IC Enable. When this pin functions as EN, applying 0 V to this pin disables the IC.
3 FB Noninverting Input of the Internal Error Amplifier. This is the node where the feedback resistor is connected.
4 GND
Analog Ground Reference Pin of the IC. All sensitive analog components should be connected to this ground
plane (see the Layout Considerations section).
5 VDD
Bias Voltage Supply for the ADP1882/ADP1883 Controller, Including the Output Gate Drivers. A bypass capacitor
of 1 μF directly from this pin to PGND and a 0.1 μF across VDD and GND are recommended.
6 DRVL
Drive Output for the External Lower-Side N-Channel MOSFET. This pin also serves as the current-sense gain
setting pin (see Figure 69).
7 PGND Power GND. Ground for the lower-side gate driver and lower-side N-channel MOSFET.
8 DRVH Drive Output for the External Upper-Side, N-Channel MOSFET.
9 SW Switch Node Connection.
10 BST
Bootstrap for the Upper-Side MOSFET Gate Drive Circuitry. An internal boot rectifier (diode) is connected
between VDD and BST. A capacitor from BST to SW is required. An external Schottky diode can also be
connected between VDD and BST for increased gate drive capability.
BST
10
9
SW
8
DRVH
PGND
7
DRVL
6
08901-003
Rev. 0 | Page 6 of 40
ADP1882/ADP1883
TYPICAL PERFORMANCE CHARACTERISTICS
100
VDD = 5.5V, VIN = 5.5V (PSM)
95
V
= 5.5V, VIN = 13V (PSM )
DD
90
VDD = 5.5V, VIN = 5.5V
85
80
75
70
65
60
55
EFFICIENCY (%)
50
45
40
35
30
1001k10k100k
V
V
DD
VDD = 3.6V, VIN = 5.5V (PSM)
WURTH IND: 744355147, L = 0.47 µH, DCR: 0.80M
INFENION FETs: BSC042N03MS G ( UPPER/LOWER)
TA = 25°C
= 5.5V,
V
DD
V
= 13V
IN
(PSM)
= 5.5V, VIN = 16.5V ( PSM)
DD
= 3.6V, VIN = 16.5V (PSM)
VDD = 3.6V,
V
= 13V
IN
(PSM)
LOAD CURRENT (mA)
Figure 4. Efficiency—300 kHz, V
OUT
= 0.8 V
08901-004
100
95
VDD = 5.5V,
V
= 13V (PSM)
90
IN
85
80
75
70
65
60
55
50
EFFICIE NCY ( %)
45
40
35
VDD = 3.6V, VIN = 5.5V
30
25
20
15
100100k10k1k
Figure 7. Efficiency—600 kHz, V
VDD = 5.5V, VIN = 5.5V (PSM)
VDD = 5.5V, VIN = 13V
VDD = 5.5V, VIN = 16.5V
WURTH INDUCTOR: 744355072, L = 0.72µH, DCR: 1.65m
INFINEON FETS: BSC042N03MS G (UPPER/LOWER)
R
: 5.4m
ON
T
= 25°C
A
VDD = 5.5V, VIN = 5.5V
= 5.5V, VIN = 16.5V ( PSM)
V
DD
LOAD CURRENT (mA)
= 0.8 V
OUT
08901-007
100
95
VDD = 5.5V, VIN = 5.5V
VDD = 5.5V, VIN = 5.5V (PSM)
90
85
80
75
VDD = 5.5V,
V
= 13V
IN
VDD = 5.5V, VIN = 16.5V
VDD = 5.5V, VIN = 13V (PSM)
VDD = 5.5V, VIN = 16.5V (PSM)
70
65
VDD = 3.6V, VIN = 5.5V
60
55
EFFICIENCY (%)
50
45
40
35
30
25
1001k10k100k
WURTH INDUCTOR: 7443252100, L = 1.0µH, DCR: 3.3m
INFINEON M OSFETS: BSC042N03MS G (UPPER/ LOWER)
R
: 5.4m
ON
T
= 25°C
A
LOAD CURRENT (mA)
Figure 5. Efficiency—300 kHz, V
100
VDD = 5.5V, VIN = 16.5V (PSM)
95
OUT
= 1.8 V
90
85
VDD = 2.7V, VIN = 16.5V (PSM)
80
75
70
65
60
55
EFFICIENCY (%)
50
45
40
35
30
1001k10k100k
VDD = 2.7V, VIN = 13V
VDD = 5.5V, VIN = 13V
VDD = 3.6V, VIN = 13V
VDD = 5.5V, VIN = 16.5V
VDD = 3.6V, VIN = 16.5V
TA = 25°C
V
OUT
F
SW
WURTH INDUCTOR:
744355200, L = 2µH, DCR: 2.5m
INFINEON M OSFETS:
BSC042N03MS G (UPPER/LOWER)
= 1.8V
= 300kHz
LOAD CURRENT (mA)
Figure 6. Efficiency—300 kHz, V
OUT
= 7 V
100
VDD = 5.5V, VIN = 5.5V
95
90
85
80
75
70
65
60
55
EFFICIENCY (%)
50
45
40
35
30
25
1001k10k100k
8901-005
VDD = 5.5V, VIN = 13V
WURTH INDUCTOR: 744325072, L = 0.72µH, DCR: 1.65m
INFINEON FETS: BSC042N03MS G ( UPPER/LO W ER)
R
T
VDD = 5.5V, VIN = 16.5V (PSM)
VDD = 5.5V, VIN = 13V (PSM)
VDD = 5.5V, VIN = 16.5V
: 5.4m
ON
= 25°C
A
LOAD CURRENT (mA)
Figure 8. Efficiency—600 kHz, V
100
VDD = 5.5V/VIN = 13V (PSM)
VDD = 3.6V, VIN = 5.5V
VDD = 5.5V, VIN = 5.5V (PSM)
= 1.8 V
OUT
8901-008
95
90
VDD = 3.6V/VIN = 13V
85
80
VDD = 5.5V/VIN = 16.5V
75
= 5.5V/VIN = 13V
V
70
EFFICIENCY (%)
65
60
55
50
1001k10k100k
8901-006
DD
TA = 25°C
V
= 5V, VIN = 13V
OUT
F
= 600kHz
SW
WURTH INDUCT OR:
7443552100, L = 1.0µH, DCR: 3.3m
INFINEON MOSFETS:
BSC042N03MS G (UPPER/LOWER)
LOAD CURRENT (mA)
Figure 9. Efficiency—600 kHz, V
OUT
= 5 V
901-009
08
Rev. 0 | Page 7 of 40
ADP1882/ADP1883
T
100
VDD = 5.5V/VIN = 5.5V (PSM)
95
90
VDD = 3.6V/VIN = 3.6V
V
= 5.5V/VIN = 5.5V
DD
85
80
75
70
65
60
55
50
EFFICIENCY (%)
45
40
35
30
25
20
1001k10k100k
VDD = 5.5V/VIN = 16.5V
VDD = 5.5V/VIN = 13V
TA = 25°C
V
OUT
F
SW
WURTH INDUCTOR:
744303022, L = 0.22µH, DCR: 0.33m
INFINEON M OSFETS:
BSC042N03MS G ( UPPER/LOWER)
VDD = 3.6V/VIN = 13V
= 0.8V, VIN = 5.5V
= 1MHz
LOAD CURRENT (mA)
100
VDD = 5.5V/VIN = 5.5V (PSM)
95
90
Figure 10. Efficiency—1.0 MHz, V
VDD = 5.5V/VIN = 5.5V
= 0.8 V
OUT
VDD = 5.5V/VIN = 13V
85
80
75
70
65
60
VDD = 3.6V/VIN = 13V
VDD = 3.6V/VIN = 16.5V
VDD = 5.5V/VIN = 16.5V
55
50
EFFICIENCY (%)
45
40
35
30
25
20
100
1k10k100k
TA = 25°C
V
= 1.8V, VIN = 5.5V
OUT
F
= 1MHz
SW
WURTH INDUCTOR:
744303022, L = 0.22µH, DCR: 0.33m
INFINEON M OSFETS:
BSC042N03MS G (UPPER/LOWER)
LOAD CURRENT (mA)
Figure 11. Efficiency—1.0 MHz, V
OUT
= 1.8 V
100
95
VDD = 5.5V/VIN = 16.5V (PSM)
90
85
80
75
70
65
60
55
EFFICIENCY (%)
50
45
40
35
30
1001k10k
VDD = 5.5V/VIN = 16.5V
VDD = 5.5V/VIN = 13V
= 25°C
T
A
V
= 4V, VIN = 16.5V
OUT
F
= 1MHz
SW
WURTH INDUCTOR:
744318180, L = 1.4µH, DCR: 3.2m
INFINEON M OSFETS:
BSC042N03MS G ( UPPER/LOWER)
Figure 37. Maximum Duty Cycle vs. High Voltage Input (V
08297-036
)
IN
2.658
2.657
2.656
2.655
2.654
2.653
UVLO (V)
2.652
2.651
2.650
2.649
–40120100806040200–20
TEMPERATURE ( °C)
Figure 35. UVLO vs. Temperature
100
95
90
85
80
75
70
65
60
55
MAXIMUM DUTY CY CLE (%)
50
45
40
3004005006007008009001000
FREQUENCY (kHz)
VDD=2.7V
VDD=3.6V
VDD=5.5V
Figure 36. Maximum Duty Cycle vs. Frequency
+125°C
+25°C
–40°C
680
630
580
530
480
430
380
330
MINUMUM OFF TIME (ns)
280
230
180
–40120100806040200–20
08901-034
V
= 2.7V
REG
= 3.6V
V
REG
V
= 5.5V
REG
TEMPERATURE (°C)
08901-037
Figure 38. Minimum Off Time vs. Temperature
680
630
580
530
480
430
380
330
MINUMUM OFF TIME (ns)
280
230
180
2.75.55.14.74.33.93.53.1
08901-035
VREG (V)
+125°C
+25°C
–40°C
08901-038
Figure 39. Minimum Off Time vs. VDD (Low Input Voltage)
Rev. 0 | Page 12 of 40
ADP1882/ADP1883
800
720
640
560
480
400
320
RECTIFI ER DROP (mV)
240
160
80
3004005006007008009001000
V
= 2.7V
REG
V
= 3.6V
REG
V
= 5.5V
REG
+125°C
+25°C
–40°C
FREQUENCY (kHz)
Figure 40. Internal Rectifier Drop vs. Frequency
08901-039
80
72
64
56
48
40
32
24
BODY DIODE CO NDUCTION TIME (ns)
16
8
2.73.13.53.94.34.75.15.5
300kHz+125°C
1MHz
VREG (V)
+25°C
–40°C
08901-042
Figure 43. Lower-Side MOSFET Body Conduction Time vs. VDD (Low Input Voltage)
1280
1200
1120
1040
960
880
800
720
640
560
480
RECTIFI ER DROP (mV)
400
320
240
160
80
2.73.13.53.94.34.75.15.5
VIN = 5.5V
VIN = 13V
VIN = 16.5V
1MHz
300kHz
VREG (V)
TA = 25°C
Figure 41. Internal Boost Rectifier Drop vs. VDD (Low Input Voltage)
Variation
over V
IN
720
640
560
480
400
300kHz+125°C
1MHz
+25°C
–40°C
OUTPUT VOLTAGE
1
2
3
4
CH1 50mV
08901-040
CH3 10V
B
CH2 5A
W
B
CH4 5V
W
INDUCTOR CURRENT
SW NODE
LOW SIDE
M400nsA CH2 3.90A
T 35.8%
08901-043
Figure 44. Power Saving Mode (PSM) Operational Waveform, 100 mA
OUTPUT VOLTAGE
1
INDUCTOR CURRENT
2
320
RECTIFI ER DROP (mV)
240
160
80
2.73.13.53.94.34.75.15.5
VREG (V)
Figure 42. Internal Boost Rectifier Drop vs. VDD
08901-041
Rev. 0 | Page 13 of 40
3
4
CH1 50mV
CH3 10V
B
CH2 5A
W
B
CH4 5V
W
M4.0µsA CH2 3.90A
T 35.8%
Figure 45. PSM Waveform at Light Load, 500 mA
SW NODE
LOW SIDE
08901-044
ADP1882/ADP1883
OUTPUT VOLTAGE
4
INDUCTOR CURRENT
2
OUTPUT VO LTAGE
1
SW NODE
3
CH1 5A M400nsA CH3 2.20V
CH3 10VCH4 100m V
B
W
T 30.6%
Figure 46. CCM Operation at Heavy Load, 18 A
(See Figure 92 for Applications Circuit)
OUTPUT VOLTAGE
2
12A STEP
1
SW NODE
3
4
CH1 10A CH2 200mV
CH3 20VCH4 5V
B
M2msA CH1 3.40A
W
T 75.6%
LOW SIDE
Figure 47. Load Transient Step—PSM Enabled, 20 A
(See Figure 92 for Applications Circuit)
1
3
SW NODE
LOW SIDE
12A NEGATIVE STEP
4
04508901-
CH1 10A CH2 200mV
CH3 20VCH4 5V
B
M20µsA CH1 3.40A
W
T 48.2%
08901-048
Figure 49. Negative Step During Heavy Load Transient Behavior—PSM Enabled,
20 A (See Figure 92 for Applications Circuit)
4
OUTPUT VO LTAGE
12A STEP
1
2
3
CH1 10A CH2 5V
08901-046
CH3 20VCH4 200m V
LOW SIDE
SW NODE
M2msA CH1 6.20A
B
T 15.6%
W
08901-049
Figure 50. Load Transient Step—Forced PWM at Light Load, 20 A
(See Figure 92 for Applications Circuit)
2
12A POSITIVE ST EP
OUTPUT VOLTAGE
1
3
SW NODE
LOW SIDE
4
CH1 10A CH2 200mV
CH3 20VCH4 5V
B
M20µsA CH1 3.40A
W
T 30.6%
08901-047
Figure 48. Positiv e Step During Heavy Load Trans ient Behavior—PSM Enabled,
20 A, V
= 1.8 V (See Figure 92 for Applications Circuit)
OUT
Rev. 0 | Page 14 of 40
OUTPUT VOLTAGE
4
12A POSITIVE STEP
1
2
3
SW NODE
CH1 10A CH2 5V
CH3 20VCH4 200mV
M20µsA CH1 6.20A
B
T 43.8%
W
LOW SIDE
08901-050
Figure 51. Positive Step During Heavy Load Transient Behavior—Forced PWM
at Light Load, 20 A, V
= 1.8 V (See Figure 92 for Applications Circuit)
OUT
ADP1882/ADP1883
2
OUTPUT VO LTAGE
12A NEGATIVE STEP
1
SW NODE
3
LOW
4
CH1 10A CH2 200mV
CH3 20VCH4 5V
SIDE
B
M10µsA CH1 5.60A
W
T 23.8%
5108901-0
Figure 52. Negative Step During Heavy Load Transient Behavior—Forced PWM
at Light Load, 20 A (See Figure 92 for Applications Circuit)
1
2
4
OUTPUT VOLTAGE
INDUCTOR CURRENT
LOW SIDE
OUTPUT VOLTAGE
1
INDUCTOR CURRENT
2
LOW SIDE
4
SW NODE
3
B
CH1 2V
CH3 10VCH4 5V
CH2 5A
W
M2msA CH1 720mV
T 32.8%
Figure 55. Start-Up Behavior at Heavy Load, 18 A, 300 kHz
(See Figure 92 for Applications Circuit)
1
2
4
OUTPUT VOLTAGE
INDUCTOR CURRENT
LOW SIDE
08901-054
SW NODE
3
B
CH1 2V
CH3 10VCH4 5V
CH2 5A
W
M4msA CH1 920mV
T 49.4%
Figure 53. Output Short-Circuit Behavior Leading to Hiccup Mode
1
OUTPUT VOLTAGE
INDUCTOR CURRENT
2
SW NODE
3
LOW SIDE
4
B
CH1 5V
CH3 10VCH4 5V
CH2 10A
W
M10µsA CH2 8.20A
T 36.2%
Figure 54. Magnified Waveform During Hiccup Mode
SW NODE
3
08901-052
B
CH1 2V
CH3 10VCH4 5V
CH2 5A
W
M4msA CH1 720mV
T 41.6%
08901-055
Figure 56. Power-Down Waveform During Heavy Load
OUTPUT VOLTAGE
1
INDUCTOR CURRENT
2
SW NODE
3
LOW SIDE
4
CH1 50mV
08901-053
CH3 10V
B
W
B
W
CH2 5A
CH4 5V
M2µsA CH2 3.90A
T 35.8%
08901-056
Figure 57. Output Voltage Ripple Waveform During PSM Operation
at Light Load, 2 A
Rev. 0 | Page 15 of 40
ADP1882/ADP1883
18ns (
t
OUTPUT VO LTAGE
1
LOW SIDE
4
SW NODE
3
INDUCTOR CURRENT
2
CH1 1V
CH3 10V
B
W
B
W
CH2 5A
CH4 2V
M1msA CH1 1.56V
T 63.2%
Figure 58. Soft Start and RES Detect Waveform
LOW SIDE
TA = 25°C
)
r
,DRVL
4
HIGH SIDE
HS MINUS
SW
3
2
M
TA = 25°C
08901-057
CH3 5V
MATH 2V 20ns
CH2 5V
CH4 2V
24ns (
t
pdh
11ns (
t
f
,DRVH
M20nsA CH2 4.20V
T 39.2%
Figure 61. Upper-Side Driver Falling and Lower-Side Rising Edge Waveforms
= 4.3 nF (Upper-Side/Lower-Side MOSFET),
(C
IN
Q
= 27 nC (VGS = 4.4 V (Q1), VGS = 5 V (Q3))
TOTAL
570
550
,DRVL
)
LOW SIDE
)
SW NODE
V
V
V
REG
REG
REG
= 5.5V
= 3.6V
= 2.7V
08901-060
4
HIGH SIDE
SW NODE
3
2
M
HS MINUS
SW
CH3 5V
MATH 2V 40ns
CH2 5V
CH4 2V
M40nsA CH2 4.20V
T 29.0%
08901-058
Figure 59. Output Drivers and SW Node Waveforms
HIGH SIDE
t
r
,DRVH
TA = 25°C
)
08901-059
LOW SIDE
4
22ns (
SW NODE
3
2
HS MINUS
M
SW
CH3 5V
MATH 2V 40ns
t
pdh
DRVH
CH2 5V
CH4 2V
16ns (
t
)
f
,DRVL
)
25ns (
M40nsA CH2 4.20V
T 29.0%
Figure 60. Upper-Side Driver Rising and Lower-Side Falling Edge Waveforms
= 4.3 nF (Upper-Side/Lower-Side MOSFET),
(C
IN
Q
= 27 nC (VGS = 4.4 V (Q1), VGS = 5 V (Q3))
TOTAL
530
510
490
470
TRANSCONDUCTANCE (µS)
450
430
–40–20120100806040200
Figure 62. Transconductance (G
680
630
580
530
480
430
TRANSCONDUCTANCE (µS)
380
330
2.73.05.44.85.14.54.23.93.63.3
Figure 63. Transconductance (G
TEMPERATURE ( °C)
) vs. Temperature
M
VREG (V)
) vs. VDD
M
+125°C
+25°C
–40°C
08901-061
08901-062
Rev. 0 | Page 16 of 40
ADP1882/ADP1883
1.30
1.25
1.20
1.15
1.10
1.05
1.00
0.95
0.90
0.85
QUIESCENT CURRENT (mA)
0.80
0.75
0.70
2.75.55.14.74.33.93.53.1
Figure 64. Quiescent Current vs. VDD (VIN = 13 V)
+125°C
+25°C
–40°C
VREG (V)
08901-063
Rev. 0 | Page 17 of 40
ADP1882/ADP1883
ADP1882/ADP1883 BLOCK DIAGRAM
ADP1882/ADP1883
V
DD
R (TRIMMED)
SW-FILTER
LEVEL
SHIFT
t
HS
LS
= 2RC (V
ON
VREG
OUT/VIN
8k
VIN
)
BST
DRVH
300k
SW
DRVL
PGND
VDD
COMP/EN
FB
PRECISION
ENABLE BLOCK
I
SS
C
SS
SS_REF
BIAS BLOCK
AND REF
REF_ZERO
SS
COMP
ERROR
AMP
0.8V
TO ENABLE
ALL BLOCKS
PFM
PWM
t
-TIMER
ON
STAT E
MACHINE
t
ON
BG_REF
PSM
IN_SS
PWM
I
REV
VDD
DH_LO
DRVH
DRVL
DL_LO
C
SW
INFORMATION
SW
I
REV
COMP
LOWER
COMP
CLAMP
REF_ZERO
GND
CS
AMP
CS GAIN SET
ADC
RES DETECT
AND
GAIN SET
0.4V
800k
64
08901-0
Figure 65. Block Diagram
Rev. 0 | Page 18 of 40
ADP1882/ADP1883
THEORY OF OPERATION
The ADP1882/ADP1883 are versatile current-mode, synchronous
step-down controllers that provide superior transient response,
optimal stability, and current limit protection by using a constant
on-time, pseudo-fixed frequency with a programmable currentsense gain, current-control scheme. In addition, these devices offer
optimum performance at low duty cycles by using valley currentmode control architecture. This allows the ADP1882/ADP1883
to drive all N-channel power stages to regulate output voltages
as low as 0.8 V.
STARTUP
The ADP1882/ADP1883 have an input low voltage pin (VDD) for
biasing and supplying power for the integrated MOSFET drivers. A
bypass capacitor should be located directly across the VDD (Pin 5)
and PGND (Pin 7) pins. Included in the power-up sequence is
the biasing of the current-sense amplifier, the current-sense gain
circuit (see the Programming Resistor (RES) Detect Circuit
section), the soft start circuit, and the error amplifier.
The current-sense blocks provide valley current information
(see the Programming Resistor (RES) Detect Circuit section)
and are a variable of the compensation equation for loop stability
(see the Compensation Network section). The valley current
information is extracted by forcing 0.4 V across the DRVL output
and the PGND pin, which generates a current depending on the
resistor across DRVL and PGND in a process performed by the
RES detect circuit. The current through the resistor is used to set
the current-sense amplifier gain. This process takes approximately
800 µs, after which the drive signal pulses appear at the DRVL
and DRVH pins synchronously and the output voltage begins to
rise in a controlled manner through the soft start sequence.
The rise time of the output voltage is determined by the soft
start and error amplifier blocks (see the Soft Start section).
At the beginning of a soft start, the error amplifier charges the
external compensation capacitor, causing the COMP/EN pin to
rise above the enable threshold of 285 mV, thus enabling the
ADP1882/ADP1883.
SOFT START
The ADP1882/ADP1883 have digital soft start circuitry, which
involves a counter that initiates an incremental increase in current,
by 1 µA, via a current source on every cycle through a fixed internal
capacitor. The output tracks the ramping voltage by producing
PWM output pulses to the upper-side MOSFET. The purpose is to
limit the in-rush current from the high voltage input supply (VIN)
to the output (V
OUT
).
PRECISION ENABLE CIRCUITRY
The ADP1882/ADP1883 employ precision enable circuitry. The
enable threshold is 285 mV typical with 35 mV of hysteresis.
The devices are enabled when the COMP/EN pin is released,
allowing the error amplifier output to rise above the enable
threshold (see Figure 66). Grounding this pin disables the
ADP1882/ADP1883, reducing the supply current of the devices
to approximately 140 µA. For more information, see Figure 67.
ADP1882/ADP1883
FB
VDD
SS
ERROR
COMP/EN
C
C
C
C2
R
C
Figure 66. Release COMP/EN Pin to Enable the ADP1882/ADP1883
COMP/EN
>2.4V
2.4V
0.9V
500mV
285mV
0V
Figure 67. COMP/EN Voltage Range
AMPLIFIER
PRECISION
ENABLE
250mV
HICCUP MODE INITIALIZED
MAXIMUM CURRENT (UPPE R CL AMP )
ZERO CURRENT
USABLE RANGE ONLY AFTER SOFT START
PERIOD IF CONTUNUOUS CONDUCTION
MODE OF OPERATION IS SELECTED.
LOWER CLAM P
PRECISION ENABL E T HRES HOLD
35mV HYSTERESIS
0.8V
TO ENABLE
ALL BLOCKS
08901-065
08901-066
UNDERVOLTAGE LOCKOUT
The undervoltage lockout (UVLO) feature prevents the part
from operating both the upper-side and lower-side MOSFETs
at extremely low or undefined input voltage (V
) ranges.
DD
Operation at an undefined bias voltage may result in the
incorrect propagation of signals to the high-side power
switches. This, in turn, results in invalid output behavior that
can cause damage to the output devices, ultimately destroying
the device tied at the output. The UVLO level has been set at
2.65 V (nominal).
THERMAL SHUTDOWN
The thermal shutdown is a self-protection feature to prevent the
IC from damage due to a very high operating junction temperature.
If the junction temperature of the device exceeds 155°C, the part
enters the thermal shutdown state. In this state, the device shuts off
both the upper-side and lower-side MOSFETs and disables the
entire controller immediately, thus reducing the power consumption of the IC. The part resumes operation after the junction
temperature of the part cools to less than 140°C.
Rev. 0 | Page 19 of 40
ADP1882/ADP1883
PROGRAMMING RESISTOR (RES) DETECT CIRCUIT
Upon startup, one of the first blocks to become active is the RES
detect circuit. This block powers up before a soft start begins. It
forces a 0.4 V reference value at the DRVL output (see Figure 68)
and is programmed to identify four possible resistor values:
47 kΩ, 22 kΩ, open, and 100 kΩ.
ADP1882
DRVH
SW
DRVL
CS GAIN
PROGRAMMING
Figure 68. Programming Resistor Location
The RES detect circuit digitizes the value of the resistor at the
DRVL pin (Pin 6). An internal ADC outputs a 2-bit digital code
that is used to program four separate gain configurations in the
current-sense amplifier (see Figure 69). Each configuration
corresponds to a current-sense gain (A
and 24 V/V, respectively (see Table 5 and Table 6 ). This variable
is used for the valley current-limit setting, which sets up the
appropriate current-sense signal gain for a given application
and sets the compensation necessary to achieve loop stability
(see the Valley Current-Limit Setting and Compensation
Network sections).
CS
AMP
CS GAIN SET
DRVL
Figure 69. RES Detect Circuit for Current-Sense Gain Programming
ADC
RES
Table 5. Current-Sense Gain Programming
Resistor (kΩ) ACS (V/V)
47 3.25
22 6.5
Open 26
100 13
Q1
Q2
RES
08901-067
) of 3 V/V, 6 V/V, 12 V/V,
CS
SW
PGND
0.4V
08901-068
VALLEY CURRENT-LIMIT SETTING
The architecture of the ADP1882/ADP1883 is based on valley
current-mode control. The current limit is determined by three
components: the R
fier output voltage swing (COMP), and the current-sense gain.
The COMP range is internally fixed at 1.5 V. The current-sense
gain is programmable via an external resistor at the DRVL pin
(see the Programming Resistor (RES) Detect Circuit section).
The R
of the lower-side MOSFET can vary over temperature
ON
and usually has a positive T
temperature); therefore, it is recommended that the currentsense gain resistor be programmed based on the rated R
the MOSFET at 125°C.
Because the ADP1882/ADP1883 are based on valley current
control, the relationship between I
= I
I
CLIM
where:
is the desired valley current limit.
I
CLIM
I
is the current load.
LOAD
is the ratio between the inductor ripple current and the
K
I
desired average load current (see Figure 10).
Establishing K
Inductor Selection section), but in most cases, K
Figure 70. Valley Current Limit to Average Current Relation
When the desired valley current limit (I
the current-sense gain can be calculated by using the following
expression:
=
I
CLIM
where:
ACS is the current-sense gain multiplier (see Tab le 5 and Tab l e 6 ).
R
is the channel impedance of the lower-side MOSFET.
ON
of the lower-side MOSFET, the error ampli-
ON
(meaning that it increases with
C
and I
CLIM
K
⎞
⎛
×
LOAD
helps to determine the inductor value (see the
I
LOAD CURRENT
I
−21
⎟
⎜
⎠
⎝
RIPPLE CURRENT =
VALLEY CURRENT L I M I T
V5.1
RA ×
ONCS
CLIM
is as follows:
LOAD
= 0.33.
I
I
LOAD
3
) has been determined,
ON
of
8901-069
Rev. 0 | Page 20 of 40
ADP1882/ADP1883
A
Although the ADP1882/ADP1883 have only four discrete currentsense gain settings for a given R
variable, Tab le 6 and Figure 71
ON
outline several available options for the valley current setpoint
based on various R
Refer to Figure 71 for more information and a graphical representation.
39
37
35
33
31
29
27
25
23
21
19
17
15
13
VALLEY CURRENT L IMIT (A)
11
RES = OPEN
9
= 26.7V/V
A
CS
7
5
3
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18
Figure 71. Valley Current-Limit Value vs. R
RES = 100k
= 13.4V/V
A
CS
RON (m)
of the Lower-Side MOSFET
ON
for Each Programming Resistor (RES)
RES = 47k
= 6.6V/V
A
CS
RES = 22k
= 3.4V/V
A
CS
08901-070
The valley current limit is programmed as outlined in Tabl e 6
and Figure 71. The inductor chosen must be rated to handle the
peak current, which is equal to the valley current from Tabl e 6
plus the peak-to-peak inductor ripple current (see the Inductor
Selection section). In addition, the peak current value must be
used to compute the worst-case power dissipation in the
MOSFETs (see Figure 72).
49
MAXIMUM DC LOAD
CURRENT
INDUCTOR
CURRENT
I = 33%
OF 30A
39.5A
35A
I = 45%
30A
VALLEY CURRENT - LIMIT
THRESHOLD (SET FOR 25A)
OF 32.25A
32.25A
I = 65%
OF 37A
37A
COMP
OUTPUT
SWING
COMP
OUTPUT
2.4V
0.9V0A
Figu re 72. Valley Current-Limit Threshold in Relation to Inductor Ripple Current
HICCUP MODE DURING SHORT CIRCUIT
A current-limit violation occurs when the current across
the source and drain of the lower-side MOSFET exceeds the
current-limit setpoint. When 32 current-limit violations are
detected, the controller enters the idle mode and turns off the
MOSFETs for 6 ms, allowing the converter to cool down. Then,
the controller reestablishes soft start and begins to cause the
output to ramp up again (see Figure 73). While the output
ramps up, COMP is monitored to determine if the violation is
still present. If it is still present, the idle event occurs again,
followed by the full-chip power-down sequence. This cycle
continues until the violation no longer exists. If the violation
disappears, the converter is allowed to switch normally,
maintaining regulation.
08901-071
REPEATED CURRENT-L I M I T
VIOLAT ION DETECTED
HS
TERMINED NUMBER
CLIM
ZERO
CURRENT
A PREDE
OF PULS
ALLO
TO
ES IS COUNTED TO
W THE CONVERTER
COOL DOWN
SOFT START IS
REINITIALIZED TO
MONITO R IF THE
VIOLATION
STILL EXISTS
08901-072
Figure 73. Idle Mode Entry Sequence Due to Current-Limit Violations
Rev. 0 | Page 21
of 40
ADP1882/ADP1883
SYNCHRONOUS RECTIFIER
The ADP1882/ADP1883 employ an internal lower-side MOSFET
driver to drive the external upper-side and lower-side MOSFETs.
The synchronous rectifier not only improves overall conduction
efficiency but also ensures proper charging to the bootstrap
capacitor located at the upper-side driver input. This is beneficial
during startup to provide a sufficient drive signal to the external
upper-side MOSFET and attain a fast turn on response, which is
essential for minimizing switching losses. The integrated upperside and lower-side MOSFET drivers operate in complementary
fashion with built-in anticross conduction circuitry to prevent
unwanted shoot-through current that may potentially damage the
MOSFETs or reduce efficiency as a result of excessive power loss.
POWER SAVING MODE (PSM) VERSION (ADP1883)
The ADP1883 is the power saving mode version of the ADP1882.
The ADP1883 operates in the discontinuous conduction mode
(DCM) and pulse skips at light load to midload currents. It outputs
pulses, as necessary, to maintain output regulation. Unlike the
continuous conduction mode (CCM), DCM operation prevents
negative current, thus allowing improved system efficiency at
light loads. Current in the reverse direction through this pathway,
however, results in power dissipation and, therefore, a decrease
in efficiency.
HS
LS
I
LOAD
0A
To minimize the chance of negative inductor current buildup,
an on-board, zero-cross comparator turns off all upper-side and
lower-side switching activities when the inductor current
approaches the zero current line, causing the system to enter
idle mode, where the upper-side and lower-side MOSFETs are
turned off. To ensure idle mode entry, a 10 mV offset, connected
in series at the SW node, is implemented (see Figure 75).
t
ON
HS AND LS ARE OFF
t
OFF
OR IN IDLE MODE
AS THE INDUCTOR
CURRENT APPROACHES
ZERO CURRENT, THE STATE
MACHINE TURNS OFF THE
LOWER-SIDE MOSFET.
Figure 74. Discontinuous Mode of Operation (DCM)
ZERO-CROSS
COMPARATOR
10mV
SW
I
Q2
08901-073
As soon as the forward current through the lower-side
MOSFET decreases to a level where
10 mV = I
the zero-cross comparator (or I
Q2
× R
ON(Q2)
comparator) emits a signal to
REV
turn off the lower-side MOSFET. From this point, the slope of the
inductor current ramping down becomes steeper (see Figure 76)
as the body diode of the lower-side MOSFET begins to conduct
current and continues conducting current until the remaining
energy stored in the inductor has been depleted.
ANOTHER
TRIGGERE D WHEN V
FALLS BELOW REGULATION
SW
LS
I
LOAD
0A
Figure 76. 10 mV Offset to Ensure Prevention of Negative Inductor Current
t
EDGE IS
ON
OUT
HS AND LS
IN IDLE MODE
ZERO-CROSS COMPARATOR
DETECTS 10mV OFFSET AND
TURNS OFF L S
10mV = R
× I
ON
LOAD
t
ON
08901-075
The system remains in idle mode until the output voltage drops
from within regulation. A PWM pulse is then produced, turning
on the upper-side MOSFET to maintain system regulation. The
ADP1883 does not have an internal clock; therefore, it switches
purely as a hysteretic controller as described in this section.
TIMER OPERATION
The ADP1882/ADP1883 employ a constant on-time architecture
that provides a variety of benefits, including improved load and
line transient responses when compared with a constant (fixed)
frequency current-mode control loop of a comparable loop design.
The constant on-time timer, or t
voltage (V
) and the output voltage (V
IN
information to produce an adjustable one-shot PWM pulse that
varies the on time of the upper-side MOSFET in response to
dynamic changes in input voltage, output voltage, and load current
conditions to maintain regulation. It then generates an on-time
(t
) pulse that is inversely proportional to VIN.
ON
V
= K ×
t
ON
where
K is a constant that is trimmed using an RC timer product
V
OUT
IN
for the 300 kHz, 600 kHz, and 1.0 MHz frequency options.
timer, senses the high input
ON
) using SW waveform
OUT
LS
Q2
08901-074
Figure 75. Zero-Cross Comparator with 10 mV of Offset
Rev. 0 | Page 22 of 40
ADP1882/ADP1883
K
t
ON
INFORMATION
Figure 77. Constant On-Time Timer
VREG
C
I
SW
R (TRIMMED)
V
IN
08901-076
The constant on time (tON) is not strictly constant because it
varies with V
and V
IN
. However, this variation occurs in such
OUT
a way as to keep the switching frequency virtually independent
of V
and V
IN
The t
timer uses a feedforward technique, applied to the constant
ON
OUT
.
on-time control loop, making it pseudo-fixed frequency to a first
order. Second-order effects, such as dc losses in the external power
MOSFETs (see the Efficiency Consideration section), cause some
variation in frequency vs. load current and line voltage. These
effects are shown in Figure 23 to Figure 34. The variations in
frequency are much reduced, compared with the variations
generated when the feedforward technique is not used.
The feedforward technique establishes the following relationship:
f
= 1
SW
where f
is the controller switching frequency (300 kHz,
SW
600 kHz, and 1.0 MHz).
The t
timer senses VIN and V
ON
variation with V
and V
IN
OUT
to minimize frequency
OUT
as previously explained. This
provides a pseudo fixed frequency that is explained in the
Pseudo-Fixed Frequency section. To allow headroom for V
and V
For typical applications where V
not relevant; however, for lower V
sensing, adhere to the following two equations:
OUT
V
≥ VIN/8 + 1.5
DD
V
≥ V
OUT
/4
= 5 V, these equations are
DD
inputs, care may be
DD
DD
IN
required.
To illustrate this feature more clearly, this section describes
one such load transient event—a positive load step—in detail.
During load transient events, the high-side driver output pulse
width stays relatively consistent from cycle to cycle; however,
the off time (DRVL on time) dynamically adjusts according to
the instantaneous changes in the external conditions mentioned.
When a positive load step occurs, the error amplifier (out of
phase of the output, V
) produces new voltage information
OUT
at its output (COMP). In addition, the current-sense amplifier
senses new inductor current information during this positive
load transient event. The error amplifier’s output voltage
reaction is compared to the new inductor current information
that sets the start of the next switching cycle. Because current
information is produced from valley current sensing, it is
sensed at the down ramp of the inductor current, whereas the
voltage loop information is sensed through the counter action
upswing of the error amplifier’s output (COMP).
The result is a convergence of these two signals (see Figure 78),
which allows an instantaneous increase in switching frequency
during the positive load transient event. In summary, a positive
load step causes V
to transient down, which causes COMP to
OUT
transient up and, therefore, shortens the off time. This resultant
increase in frequency during a positive load transient helps to
quickly bring V
back up in value and within the regulation
OUT
window.
Similarly, a negative load step causes the off time to lengthen in
response to V
demagnetizing phase, helping to bring V
rising. This effectively increases the inductor
OUT
within regulation.
OUT
In this case, the switching frequency decreases, or experiences
a foldback, to help facilitate output voltage recovery.
Because the ADP1882/ADP1883 can respond rapidly to sudden
changes in load demand, the recovery period in which the output
voltage settles back to its original steady state operating point is
much quicker than it would be for a fixed-frequency equivalent
Therefore, using a pseudo-fixed frequency results in significantly better load transient performance than using a fixed
frequency.
.
PSEUDO-FIXED FREQUENCY
The ADP1882/ADP1883 employ a constant on-time control
scheme. During steady state operation, the switching frequency
stays relatively constant, or pseudo-fixed. This is due to the oneshot t
timer, which produces a high-side PWM pulse with
ON
a fixed duration, given that external conditions such as input
voltage, output voltage, and load current are also at steady state.
During load transients, the frequency momentarily changes for
the duration of the transient event so that the output comes back
within regulation more quickly than if the frequency were fixed
PWM OUTPUT
or if it were to remain unchanged. After the transient event is
complete, the frequency returns to a pseudo-fixed value to
a first-order.
Rev. 0 | Page 23 of 40
LOAD CURRENT
DEMAND
CS AMP
OUTPUT
ERROR AMP
OUTPUT
f
SW
Figure 78. Load Transient Response Operation
VALLEY
TRIP POINTS
>
f
SW
08901-077
ADP1882/ADP1883
I
I
Δ
APPLICATIONS INFORMATION
FEEDBACK RESISTOR DIVIDER
The required resistor divider network can be determined for
a given V
is fixed at 0.8 V. Selecting values for R
value because the internal band gap reference (V
OUT
and RB determines the
T
REF
minimum output load current of the converter. Therefore, for
a given value of R
, the RT value can be determined using the
B
following expression:
R
= RB ×
T
V
OUT
V)8.0(−
V8.0
INDUCTOR SELECTION
The inductor value is inversely proportional to the inductor
ripple current. The peak-to-peak ripple current is given by
LOAD
IKI≈×=Δ
IL
LOAD
where K
is typically 0.33.
I
The equation for the inductor value is given by
IN
L×
=
×Δ
L
SW
where:
is the high voltage input.
V
IN
is the desired output voltage.
V
OUT
is the controller switching frequency (300 kHz, 600 kHz, and
f
SW
1.0 MHz).
When selecting the inductor, choose an inductor saturation
rating that is above the peak current level, and then calculate
the inductor current ripple (see the Valley Current-Limit
Setting section and Figure 79).
The output ripple voltage is the ac component of the dc output
voltage during steady state. For a ripple error of 1.0%, the output
capacitor value needed to achieve this tolerance can be determined using the following equation. Note that an accuracy of
1.0% is possible only during steady state conditions, not during
load transients.
= (0.01) × V
V
RR
OUT
OUTPUT CAPACITOR SELECTION
The primary objective of the output capacitor is to facilitate the
reduction of the output voltage ripple; however, the output
capacitor also assists in the output voltage recovery during load
transient events. For a given load current step, the output
voltage ripple generated during this step event is inversely
proportional to the value chosen for the output capacitor. The
speed at which the output voltage settles during this recovery
period depends on where the crossover frequency (loop
bandwidth) is set. This crossover frequency is determined by
the output capacitor, the equivalent series resistance (ESR) of
the capacitor, and the compensation network.
To calculate the small-signal voltage ripple (output ripple
voltage) at the steady state operating point, use the following
equation:
OUT
⎛
⎜
IC
×Δ=
L
⎜
SW
⎝
1
[]
LRIPPLE
where ESR is the equivalent series resistance of the output
capacitors.
To calculate the output load step, use the following equation:
C
where
×=
2
OUT
V
is the amount that V
DROOP
a given positive load current step (I
LOAD
ESRIVf
×Δ−Δ×
LOADDROOPSW
is allowed to deviate for
OUT
).
LOAD
⎞
⎟
⎟
)(8
ESRIVF
×Δ−Δ××
⎠
))((
Rev. 0 | Page 24 of 40
ADP1882/ADP1883
Ceramic capacitors are known to have low ESR. However, the
trade-off of using X5R technology is that up to 80% of its capacitance may be lost due to derating as the voltage applied across
the capacitor is increased (see Figure 80). Although X7R series
capacitors can also be used, the available selection is limited to
only up to 22 µF.
20
10
0
–10
–20
–30
–40
–50
–60
–70
CAPACITANCE CHARGE ( %)
–80
10µF TDK 25V, X7R, 1210 C3225X7R1E106M
22µF MURATA 25V , X7R, 1210 GRM 32 E R71E 226 KE 15L
–90
47µF MURATA 16V, X5R, 1210 G R M 32E R61C47 6KE15 L
–100
051015202530
Figure 80. Capacitance vs. DC Voltage Characteristics for Ceramic Capacitors
X5R (16V)
X7R (50V)
X5R (25V)
DC VOLTAGE (V
)
DC
08901-079
Electrolytic capacitors satisfy the bulk capacitance requirements
for most high current applications. Because the ESR of electrolytic
capacitors is much higher than that of ceramic capacitors, when
using electrolytic capacitors, several MLCCs should be mounted
in parallel to reduce the overall series resistance.
COMPENSATION NETWORK
Due to its current-mode architecture, the ADP1882/ADP1883
require Type II compensation. To determine the component values
needed for compensation (resistance and capacitance values),
it is necessary to examine the overall loop gain (H) of the converter at the unity gain frequency (f
as follows:
H = 1 V/V = G
× ACS ×
M
Examining each variable at high frequency enables the unitygain transfer function to be simplified to provide expressions
for the R
COMP
and C
component values.
COMP
Output Filter Impedance (Z
Examining the transfer function of the filter at high frequencies
simplifies to
=
sC
1
OUT
Z
FILT
at the crossover frequency (s = 2πf
/10) when H = 1 V/V,
SW
V
OUT
× Z
)
CROSS
COMP
).
V
REF
FILT
× Z
FILT
Error Amplifier Output Impedance (Z
Assuming CC2 is significantly smaller than C
COMP
)
, CC2 can be
COMP
omitted from the output impedance equation of the error
amplifier. The transfer function simplifies to
ffR
Z
COMP
=
CROSSCOMP
f
CROSS
ZERO
)(+
and
1
ff×=
SWCROSS
12
where f
, the zero frequency, is set to be 1/4 of the crossover
ZERO
frequency for the ADP1882.
Error Amplifier Gain (GM)
The error amplifier gain (transconductance) is
= 500 µA/V
G
M
Current-Sense Loop Gain (GCS)
The current-sense loop gain is
1
=
CS
(A/V)
RAG×
ONCS
where:
(V/V) is programmable for 3 V/V, 6 V/V, 12 V/V, and 24 V/V
A
CS
(see the Programming Resistor (RES) Detect Circuit and Val l e y
Current-Limit Setting sections).
is the channel impedance of the lower-side MOSFET.
R
ON
Crossover Frequency
The crossover frequency is the frequency at which the overall
loop (system) gain is 0 dB (H = 1 V/V). For current-mode
converters such as the ADP1882, it is recommended that the
user set the crossover frequency between 1/10 and 1/15 of the
switching frequency.
1
ff
=
SWCROSS
12
The relationship between C
COMP
and f
(zero frequency) is as
ZERO
follows:
ZERO
1
)
CRf××π=2
COMPCOMP
The zero frequency is set to 1/4 of the crossover frequency.
Combining all of the above parameters results in
R
COMP
COMP
π
ff
1
ZERO
×
fRC××π×=2
ZERO
2
CROSS
AG
M
f
CROSS
=
CROSS
+
COMP
V
Cf
CS
OUT
OUT
×
V
REF
Rev. 0 | Page 25 of 40
ADP1882/ADP1883
EFFICIENCY CONSIDERATIONS
One of the important criteria to consider in constructing a dc-to-dc
converter is efficiency. By definition, efficiency is the ratio of the
output power to the input power. For high power applications at
load currents up to 20 A, the following are important MOSFET
parameters that aid in the selection process:
• V
• R
• Q
• C
• C
The following are the losses experienced through the external
component during normal switching operation:
• Channel conduction loss (both MOSFETs)
• MOSFET driver loss
• MOSFET switching loss
• Body diode conduction loss (lower-side MOSFET)
• Inductor loss (copper and core loss)
Channel Conduction Loss
During normal operation, the bulk of the loss in efficiency is
due to the power dissipated through MOSFET channel conduction. Power loss through the upper-side MOSFET is directly
proportional to the duty cycle (D) for each switching period,
and the power loss through the lower-side MOSFET is directly
proportional to 1 − D for each switching period. The selection
of MOSFETs is governed by the amount of maximum dc load
current that the converter is expected to deliver. In particular,
the selection of the lower-side MOSFET is dictated by the
maximum load current because a typical high current application
employs duty cycles of less than 50%. Therefore, the lower-side
MOSFET is in the on state for most of the switching period.
MOSFET Driver Loss
Other dissipative elements are the MOSFET drivers. The contributing factors are the dc current flowing through the driver
during operation and the Q
, the MOSFET support voltage applied between the
GS (TH)
gate and the source
, the MOSFET on resistance during channel
DS (ON)
conduction
, the total gate charge
G
, the input capacitance of the upper-side switch
N1
, the input capacitance of the lower-side switch
N2
[]
()
1
parameter of the external MOSFETs.
GATE
N2(ON)N1(ON)N1,N2(CL)
2
IRDRDP××−+×=
LOAD
800
720
640
560
480
400
320
RECTIFI ER DROP (mV)
240
160
80
3001000900800700600500400
Figure 81. Internal Rectifier Voltage Drop vs. Switching Frequency
VDD = 2.7V
VDD = 3.6V
VDD = 5.5V
SWITCHI NG FREQUENCY (kHz)
+125°C
+25°C
–40°C
08901-080
Switching Loss
The SW node transitions as a result of the switching activities
of the upper-side and lower-side MOSFETs. This causes removal
and replenishing of charge to and from the gate oxide layer of
the MOSFET, as well as to and from the parasitic capacitance that
is associated with the gate oxide edge overlap and the drain and
source terminals. The current that enters and exits these charge
paths presents additional loss during these transition times. This
loss can be approximately quantified by using the following equation, which represents the time in which charge enters and exits
these capacitive regions:
t
= R
SW-TRANS
GATE
× C
TOTAL
where:
R
is the gate input resistance of the MOSFET.
GATE
is the CGD + CGS of the external MOSFET used.
C
TOTAL
The ratio of this time constant to the period of one switching cycle
is the multiplying factor to be used in the following expression:
t
TRANSSW
P
LOSSSW
-
)(
t
SW
LOAD
2
×××=
VI
IN
or
P
SW(LOSS)
= fSW × R
GATE
× C
TOTAL
× I
× VIN × 2
LOAD
()
[]
DR
SW
)(
LOSSDR
()
[]
DD
SW
lowerFET
upperFET
+×+
DD
IVCfV
BIAS
DR
IVCfVP
+×=
BIAS
where:
V
is the driver bias voltage (that is, the low input voltage (VDD)
DR
minus the rectifier drop (see Figure 81)).
C
is the input gate capacitance of the upper-side MOSFET.
upperFET
is the input gate capacitance of the lower-side MOSFET.
C
lowerFET
I
is the dc current flowing into the upper and lower-side drivers.
BIAS
is the bias voltage.
V
DD
Rev. 0 | Page 26 of 40
ADP1882/ADP1883
t
I
Diode Conduction Loss
The ADP1882/ADP1883 employ anticross conduction circuitry
that prevents the upper-side and lower-side MOSFETs from
conducting current simultaneously. This overlap control is
beneficial, avoiding large current flow that may lead to
irreparable damage to the external components of the power
stage. However, this blanking period comes with the trade-off of
a diode conduction loss occurring immediately after the
MOSFETs change states and continuing well into idle mode.
The amount of loss through the body diode of the lower-side
MOSFET during the antioverlap state is given by the following
expression:
LOSSBODY
P
LOSSBODY
)(
)(
t
SW
LOAD
2
×××=
VI
F
where:
t
is the body conduction time (refer to Figure 82 for
BODY(LOSS)
dead time periods).
t
is the period per switching cycle.
SW
is the forward drop of the body diode during conduction
V
F
(refer to the selected external MOSFET data sheet for more
information about the V
80
72
64
56
48
40
32
24
BODY DIODE CO NDUCTION TI M E ( ns)
16
8
2.75.54.84.13.4
Figure 82. Body Diode Conduction Time vs. Low Voltage Input (V
parameter).
F
1MHz
300kHz
(V)
V
DD
+125°C
+25°C
–40°C
08901-081
)
DD
Inductor Loss
During normal conduction mode, further power loss is caused
by the conduction of current through the inductor windings,
which have dc resistance (DCR). Typically, larger sized inductors
have smaller DCR values.
The inductor core loss is a result of the eddy currents generated
within the core material. These eddy currents are induced by the
changing flux, which is produced by the current flowing through
the windings. The amount of inductor core loss depends on the
core material, the flux swing, the frequency, and the core volume.
Ferrite inductors have the lowest core losses, whereas powdered
iron inductors have higher core losses. It is recommended to use
shielded ferrite core material type inductors with the ADP1882/
ADP1883 for a high current, dc-to-dc switching application
to achieve minimal loss and negligible electromagnetic
interference (EMI).
P
DCR(LOSS)
= DCR × I
2
+ Core Loss
LOAD
INPUT CAPACITOR SELECTION
The goal in selecting an input capacitor is to reduce or minimize
input voltage ripple and to reduce the high frequency source
impedance, which is essential for achieving predictable loop
stability and transient performance.
The problem with using bulk capacitors, other than their
physical geometries, is their large equivalent series resistance
(ESR) and large equivalent series inductance (ESL). Aluminum
electrolytic capacitors have such high ESR that they cause
undesired input voltage ripple magnitudes and are generally not
effective at high switching frequencies.
If bulk capacitors are to be used, it is recommended that multilayered ceramic capacitors (MLCC) be used in parallel, due to
their low ESR values. This dramatically reduces the input voltage
ripple amplitude as long as the MLCCs are mounted directly across
the drain of the upper-side MOSFET and the source terminal of
the lower-side MOSFET (see the Layout Considerations section).
Improper placement and mounting of these MLCCs may cancel
their effectiveness due to stray inductance and an increase in
trace impedance.
()
VVV
−×
IN
OUT
OUT
II
,,
MAXLOADRMSCIN
OUT
×=
V
The maximum input voltage ripple and maximum input capacitor
rms current occur at the end of the duration of 1 − D while the
upper-side MOSFET is in the off state. The input capacitor rms
current reaches its maximum at Time D. When calculating the
maximum input voltage ripple, account for the ESR of the input
capacitor as follows:
V
MAX,RIPPLE
RIPP
+ (I
LOAD,MAX
× ESR)
= V
where:
is usually 1% of the minimum voltage input.
V
RIPP
I
is the maximum load current.
LOAD,MAX
ESR is the equivalent series resistance rating of the input
capacitor used.
Inserting V
MAX,RIPPLE
into the charge balance equation to
calculate the minimum input capacitor requirement gives
C
IN,min
I
MAXLOAD
,
V
,
−
DD
)1(
×=
f
SWRIPPLEMAX
or
C
IN,min
=
4
,
Vf
RIPPLEMAXSW
,
MAXLOAD
where D = 50%.
Rev. 0 | Page 27 of 40
ADP1882/ADP1883
I
THERMAL CONSIDERATIONS
The ADP1882/ADP1883 are used for dc-to-dc, step down, high
current applications that have an on-board controller and on-board
MOSFET drivers. Because applications may require up to 20 A
of load current delivery and be subjected to high ambient
temperature surroundings, the selection of external upper-side
and lower-side MOSFETs must be associated with careful thermal
consideration to not exceed the maximum allowable junction
temperature of 125°C. To avoid permanent or irreparable damage
if the junction temperature reaches or exceeds 155°C, the part
enters thermal shutdown, turning off both external MOSFETs,
and does not reenable until the junction temperature cools to
140°C (see the Thermal Shutdown section).
The maximum junction temperature allowed for the ADP1882/
ADP1883 ICs is 125°C. This means that the sum of the ambient
temperature (T
is caused by the thermal impedance of the package and the internal
power dissipation, should not exceed 125°C, as dictated by the
following expression:
= TR × TA
T
J
where:
is the ambient temperature.
T
A
is the maximum junction temperature.
T
J
T
is the rise in package temperature due to the power
R
dissipated from within.
The rise in package temperature is directly proportional to its
thermal impedance characteristics. The following equation
represents this proportionality relationship:
= θJA × P
T
R
where:
is the thermal resistance of the package from the junction to
θ
JA
the outside surface of the die, where it meets the surrounding air.
P
is the overall power dissipated by the IC.
DR(LOSS)
The bulk of the power dissipated is due to the gate capacitance
of the external MOSFETs. The power loss equation of the MOSFET
drivers (see the MOSFET Driver Loss section in the Efficiency
Consideration section) is
P
DR(LOSS)
+ [V
where:
is the input gate capacitance of the upper-side MOSFET.
C
upperFET
is the input gate capacitance of the lower-side MOSFET.
C
lowerFET
I
is the dc current (2 mA) flowing into the upper-side and
BIAS
lower-side drivers.
V
is the driver bias voltage (that is, the low input voltage (VDD)
DR
minus the rectifier drop (see Figure 81)).
is the bias voltage
V
DD
) and the rise in package temperature (TR), which
A
DR(LOSS)
= [VDR × (fSWC
× (fSWC
DD
upperFETVDR
lowerFETVDD
+ I
BIAS
)]
+ I
BIAS
)]
For example, if the external MOSFET characteristics are θ
(10-lead MSOP) = 171.2°C/W, f
C
upperFET
= 3.3 nF, C
= 3.3 nF, VDR = 5.12 V, and VDD = 5.5 V,
lowerFET
= 300 kHz, I
SW
= 2 mA,
BIAS
then the power loss is
= [VDR × (fSWC
P
DR(LOSS)
+ [V
× (fSWC
DD
lowerFETVDD
= [5.12 × (300 × 10
+ [5.5 × (300 × 10
upperFETVDR
3
× 3.3 × 10−9 × 5.12 + 0.002)]
3
×3.3 × 10−9 × 5.5 + 0.002)]
+ I
BIAS
)]
+ I
BIAS
)]
= 77.13 mW
The rise in package temperature is
T
= θJA × P
R
DR(LOSS)
= 171.2°C × 77.13 mW
= 13.2°C
Assuming a maximum ambient temperature environment of 85°C,
the junction temperature is
= TR × TA = 13.2°C + 85°C = 98.2°C
T
J
which is below the maximum junction temperature of 125°C.
DESIGN EXAMPLE
The ADP1882/ADP1883 are easy to use, requiring only a few
design criteria. For example, the example outlined in this section
uses only four design criteria: V
= 12 V (typical), and fSW = 300 kHz.
V
IN
Input Capacitor
The maximum input voltage ripple is usually 1% of the
minimum input voltage (11.8 V × 0.01 = 120 mV).
= 120 mV
V
RIPP
= V
V
MAX,RIPPLE
RIPP
− (I
= 120 mV − (15 A × 0.001) = 45 mV
MAXLOAD
C
IN,min
,
4
Vf
,
RIPPLEMAXSW
= 120 µF
Choose five 22 µF ceramic capacitors. The overall ESR of five
22 µF ceramic capacitors is less than 1 m.
I
= I
RMS
P
CIN
/2 = 7.5 A
LOAD
= (I
)2 × ESR = (7.5A)2 × 1 m = 56.25 mW
RMS
OUT
LOAD,MAX
==
= 1.8 V, I
× ESR)
= 15 A (pulsing),
LOAD
A15
3
mV105103004
×××
JA
Rev. 0 | Page 28 of 40
ADP1882/ADP1883
I
−
Inductor
Determine the inductor ripple current amplitude as follows:
LOAD
I ≈Δ
L
= 5 A
3
then calculate for the inductor value
−
VV
)(
,
MAXIN
=
L
=
OUT
×Δ
fI
L
SW
−
)V8.1V2.13(
3
××
10300V5
V
OUT
×
V
IN,MAX
V8.1
×
V2.13
= 1.03 µH
The inductor peak current is approximately
15 A + (5 A × 0.5) = 17.5 A
Therefore, an appropriate inductor selection is 1.0 µH with
DCR = 3.3 m (7443552100) from Tabl e 8, with peak current
handling of 20 A.
P
DCR(LOSS)
= DCR × = 0.003 × (15 A)2 = 675 mW
2
I
L
Current Limit Programming
The valley current is approximately
15 A − (5 A × 0.5) = 12.5 A
Assuming a lower-side MOSFET R
of 4.5 m, choosing 13 A
ON
as the valley current limit from Tabl e 7 and Figure 71 indicates
that a programming resistor (RES) of 100 k corresponds to an
of 24 V/V.
A
CS
Choose a programmable resistor of R
= 100 kΩ for a current-
RES
sense gain of 24 V/V.
Output Capacitor
Assume a load step of 15 A occurs at the output, and no more
than 5% is allowed for the output to deviate from the steady
state operating point. Because the frequency is pseudo-fixed,
the advantage of the ADP1882 is that the converter is able to
respond quickly because of the immediate, though temporary,
increase in switching frequency.
V
= 0.05 × 1.8 V = 90 mV
DROOP
Assuming the overall ESR of the output capacitor ranges from
5 m to 10 m,
Δ×=I
15
LOAD
Vf
Δ×
A
3
××
)(
DROOPSW
)mV90(10300
OUT
2
2
×=
C
= 1.11 mF
Therefore, an appropriate inductor selection is five 270 µF
polymer capacitors with a combined ESR of 3.5 m.
Assuming an overshoot of 45 mV, determine if the output
capacitor that was calculated previously is adequate.
2
IL
)(
×
C
=
OUT
()
−
=
××
LOAD
2
)(
26
)A15(101
22
)8.1()mV458.1(
−−
2
()
VVV
−Δ−
OUTOVSHTOUT
= 1.4 mF
Choose five 270 µF polymer capacitors.
The rms current through the output capacitor is
)(
−
RMS
1
2
×=
2
3
1
×=
3
−
I
1
1
VV
,
MAXIN
×
fL
SW
)V8.1V2.13(
3
10300F1
××
OUT
V
OUT
×
V
,
MAXIN
V8.1
=×
V2.13
A49.1
The power loss dissipated through the ESR of the output
capacitor is
= (I
P
COUT
)2 × ESR = (1.5 A)2 × 1.4 m = 3.15 mW
RMS
Feedback Resistor Network Setup
It is recommended that RB = 15 k be used. Calculate RT as
follows:
= 15 kΩ ×
R
T
V6.0
V)6.0V8.1(
= 30 kΩ
Compensation Network
To c al c ul ate R
COMP
, C
COMP
, and C
, the transconductance
PAR
parameter and the current-sense gain variable are required. The
transconductance parameter (G
) is 500 µA/V, and the current-
M
sense loop gain is
G
where A
=
CS
RA
ONCS
and RON are taken from setting up the current limit
CS
11
=
=
005.026
×
A/V7.7
(see the Programming Resistor (RES) Detect Circuit and Val l e y
Current-Limit Setting sections).
The crossover frequency is 1/12 of the switching frequency:
300 kHz/12 = 25 kHz
The zero frequency is 1/4 of the crossover frequency:
25 kHz/4 = 6.25 kHz
π
33
CROSS
M
Cf
AG
CS
OUT
OUT
×
V
REF
6
−
3.810500
××
33
−
1011.11025141.32
×××××
×
C
=
R
=
COMP
8.1
COMP
=
= 75 k
8.0
=
2
CROSS
1025
×
π
f
CROSS
3
COMP
1
2
×
ff
+
ZERO
×
33
1025.61025
×+×
1
fR
ZERO
1025.6107514.32
×××××
V
= 340 pF
Rev. 0 | Page 29 of 40
ADP1882/ADP1883
[
[
]
t
(
)
]
=×+
[
(
)
]
P
Loss Calculations
Duty cycle = 1.8/12 V = 0.15.
R
= 5.4 m.
ON (N2)
t
BODY(LOSS)
V
C
Q
R
= 20 ns (body conduction time).
= 0.84 V (MOSFET forward voltage).
F
= 3.3 nF (MOSFET gate input capacitance).
IN
= 17 nC (total MOSFET gate charge).
N1,N2
= 1.5 (MOSFET gate input resistance).
GATE
()
RDRDP×−+×=
= (0.15 × 0.0054 + 0.85 × 0.0054) × (15 A)
= 1.215 W
10.2 82 30 1.6 10 PG-TDSON8 Infineon BSC080N030MS G
6.0 19 30 35 SO-8 Vishay Si4842DY
Rev. 0 | Page 32 of 40
ADP1882/ADP1883
LAYOUT CONSIDERATIONS
The performance of a dc-to-dc converter depends highly on how
the voltage and current paths are configured on the printed
circuit board (PCB). Optimizing the placement of sensitive
analog and power components are essential to minimize output
ripple, maintain tight regulation specifications, and reduce
PWM jitter and electromagnetic interference.
HIGH VOLTAGE INPUT
V
= 5V
DD
JP1
HIGH VOLTAGE INPUT
V
IN
= 12V
Figure 83 shows the schematic of a typical ADP1882/ADP1883
used for a high power application. Blue traces denote high current
pathways. VIN, PGND, and V
traces should be wide and
OUT
possibly replicated, descending down into the multiple layers.
Vias should populate, mainly around the positive and negative
terminals of the input and output capacitors, alongside the
source of Q1/Q2, the drain of Q3/Q4, and the inductor.
C3
22µFC422µFC522µFC622µFC722µFC8N/A
1.0µH
R6
2
C13
1.5nF
MURATA: (HIGH VOLTAGE INPUT CAPACITORS)
22µF, 25V, X7R, 1210 GRM32ER71E226KE15 L
PANASONIC: (OUTPUT CAPACITORS)
270µF SP- S E R IES, 4V, 7m EEFUE0G271LR
INFINEON MOSFETs (NO CONNECTION FOR Q2/Q4:
BSC042N03MS G (LOWER SI DE)
BSC080N03MS G (UPP E R S IDE)
WURTH INDUCTO RS:
1µH, 3.3m, 20A 7443552100
C20
270µF
+
C14 TO C19
N/A
+
270µF
C21
V
OUT
+
270µF
= 1.8V, 15A
+
C22
270µF
C23
+
C24
270µF
+
08901-082
70pF
V
C
OUT
F
R1 18.75k
15k
C2
0.1µF
C
C
700pF
R
C
38.1k
R2
C1
1µF
ADP1882/
ADP1883
1
VIN
2
COMP/EN9SW
3
FB
4
GND
5
VDD
BST
DRVH
PGND
DRVL
10
8
7
6
100k
C12
100nF
R4
0
R5
Q1Q2
Q3Q4
Figure 83. ADP1882 High Current Evaluation Board Schematic (Blue Traces Indicate High Current Paths)
Rev. 0 | Page 33 of 40
ADP1882/ADP1883
SENSITIVE ANALOG
COMPONENTS
LOCATED FAR
FROM THE NOISY
POWER S ECTION.
SEPARATE A NALOG GROUND
PLANE FO R THE ANALOG
COMPONE NTS (THAT I S ,
COMPENSATION AND
FEEDBACK RES ISTORS ).
OUTPUT CAP ACITORS
ARE MOUNTED ON THE
BYPASS POWER CAPACIT OR (C1)
FOR VDD BIAS DE COUPLING AND
HIGH FREQUENCY CAPACITOR
(C2) AS CLOSE AS POSSIBLE TO
THE IC.
INPUT CAPACITORS
ARE MOUNTED CLOSE
TO DRAIN O F Q1/Q 2
AND SOURCE OF Q3/ Q4.
RIGHTMOST AREA OF
THE EVB, WRAPPING
BACK AROUND TO THE
MAIN POWER GROUND
PLANE, WHERE IT MEETS
WITH THE NEGATIVE
TERMINALS OF T HE
INPUT CAPACITORS.
08901-083
Figure 84. Overall Layout of the ADP1882 High Current Evaluation Board
Figure 85. Layer 2 of Evaluation Board
Rev. 0 | Page 34 of 40
08901-084
ADP1882/ADP1883
T
G
V
T
T
A
T
G
BOTTO M RE S I STOR
AP TO THE ANALO
GROUND PLANE.
OUT SENSE TAP LINE
EXTENDING BACK TO THE TO P
RESISTOR IN THE FEEDBACK
DIVIDER NE T WORK (SEE F IGURE 82).
HIS OVERLAPS WITH PGND SENSE
AP LINE EX TENDING BACK TO THE
NALOG PLANE (SEE FIGURE 86,
LAYER 4 FOR PGND TAP) .
Figure 86. Layer 3 of Evaluation Board
08901-085
BOTTO M RE S I STOR
AP TO THE ANALO
GROUND PLANE.
PGND SENSE TAP FROM
NEGATI V E TERMINALS OF
OUTPUT BULK CAPACITORS.
THIS TRA CK P LACEMENT S HOULD
BE DIRECTLY BELOW THE VOUT
SENSE LINE FROM FIGURE 84.
8901-086
Figure 87. Layer 4 (Bottom Layer) of Evaluation Board
Rev. 0 | Page 35 of 40
ADP1882/ADP1883
IC SECTION (LEFT SIDE OF EVALUATION BOARD)
A dedicated plane for the analog ground plane (GND) should
be separate from the main power ground plane (PGND). With
the shortest path possible, connect the analog ground plane to
the GND pin (Pin 4). This plane should be on only the top layer
of the evaluation board. To avoid crosstalk interference, there
should not be any other voltage or current pathway directly
below this plane on Layer 2, Layer 3, or Layer 4. Connect the
negative terminals of all sensitive analog components to the
analog ground plane. Examples of such sensitive analog components include the bottom resistor of the resistor divider, the
high frequency bypass capacitor for biasing (0.1 µF), and the
compensation network.
Mount a 1 µF bypass capacitor directly across VDD (Pin 5) and
PGND (Pin 7). In addition, a 0.1 µF should be tied across VDD
(Pin 5) and GND (Pin 4).
POWER SECTION
As shown in Figure 84, an appropriate configuration to localize
large current transfer from the high voltage input (V
put (V
), and then back to the power ground, puts the VIN
OUT
plane on the left, the output plane on the right, and the main power
ground plane in between the two. Current transfers from the
input capacitors to the output capacitors, through Q1/Q2, during
the on state (see Figure 88). The direction of this current (yellow
arrow) is maintained as Q1/Q2 turns off and Q3/Q4 turns on.
When Q3/Q4 turns on, the current direction continues to be
maintained (red arrow) as it circles from the power ground
terminal of the bulk capacitor to the output capacitors, through
the Q3/Q4. Arranging the power planes in this manner minimizes
the area in which changes in flux occur if the current through
Q1/Q2 stops abruptly. Sudden changes in flux, usually at the
source terminals of Q1/Q2 and the drain terminals of Q3/Q4,
cause large dV/dt’s at the SW node.
) to the out-
IN
The SW node is near the top of the evaluation board. The SW
node should use the least amount of area possible and be kept
away from any sensitive analog circuitry and components because
this is where most sudden changes in flux density occur. When
possible, replicate this pad onto Layer 2 and Layer 3 for thermal
relief and eliminate any other voltage and current pathways directly
beneath the SW node plane. Populate the SW node plane with
vias, mainly around the exposed pad of the inductor terminal and
around the perimeter of the source of Q1/Q2 and the drain of
Q3/Q4. The output voltage power plane (V
) is at the right-
OUT
most end of the evaluation board. This plane should be replicated,
descending down to multiple layers with vias surrounding the
inductor terminal and the positive terminals of the output bulk
capacitors. Ensure that the negative terminals of the output
capacitors are placed close to the main power ground (PGND),
as previously mentioned. All of these points form a tight circle
(component geometry permitting) that minimizes the area of
flux change as the event switches between D and 1 − D.
DIFFERENTIAL SENSING
Because the ADP1882/ADP1883 operate in valley currentmode control, a differential voltage reading is taken across the
drain and source of the lower-side MOSFET. The drain of the
lower-side MOSFET should be connected as close as possible to
Pin 9 (SW) of the IC. Likewise, connect the source as close as
possible to Pin 7 (PGND) of the IC. When possible, both of
these track lines should be narrow and away from any other
active device or voltage/current paths.
SW
PGND
SW
VOUT
VINPGND
Figure 88. Primary Current Pathways During the On State of the Upper-Side
MOSFET (Left Arrow) and the On State of the Lower-Side MOSFET (Right Arrow)
08901-087
Rev. 0 | Page 36 of 40
LAYER 1: SENSE LINE FOR S W
(DRAIN OF LO W E R MO SF E T )
Figure 89. Drain/Source Tracking Tapping of the Lower-Side MOSFET for
CS Amp Differential Sensing (Yellow Sense Line on Layer 2)
LAYER 1: SENSE LINE FO R P GND
(SOURCE OF L O W E R MO S F ET )
Differential sensing should also be applied between the outermost
output capacitor to the feedback resistor divider (see Figure 86
and Figure 87). Connect the positive terminal of the output
capacitor to the top resistor (R
). Connect the negative terminal
T
of the output capacitor to the negative terminal of the bottom
resistor, which connects to the analog ground plane, as well.
Both of these track lines, as previously mentioned, should be
narrow and away from any other active device or voltage/
current paths.
08901-088
ADP1882/ADP1883
TYPICAL APPLICATIONS CIRCUITS
DUAL-INPUT, 300 kHz HIGH CURRENT APPLICATIONS CIRCUIT
HIGH VOLTAGE INPUT
V
= 5V
DD
JP1
HIGH VOLTAGE INPUT
= 12V
V
IN
70pF
V
C
OUT
F
R1 18.75k
15k
C2
0.1µF
C
C
700pF
R
C
38.1k
R2
C1
1µF
ADP1882/
ADP1883
1
VIN
2
COMP/EN9SW
3
FB
4
GND
5
VDD
BST
DRVH
PGND
DRVL
10
8
7
6
100k
C12
100nF
R4
0
R5
Figure 90. Applications Circuit for 12 V Input, 1.8 V Output, 15 A, 300 kHz (Q2/Q4 No Connect)
SINGLE-INPUT, 600 kHz APPLICATIONS CIRCUIT
HIGH VOLTAGE INPUT
JP1
C
C
F
R1 31.6k
C2
0.1µF
33.4pF
R
38.3k
R2
15k
C
1µF
C1
34pF
V
C
OUT
Figure 91. Applications Circuit for 5.5 V Input, 2.5 V Output, 15 A, 600 kHz (Q2/Q4 No Connect)
ADP1882/
ADP1883
1
VIN
2
COMP/EN9SW
3
FB
4
GND
5
VDD
BST
DRVH
PGND
DRVL
10
8
7
6
C12
100nF
R4
0
OPEN
R5
Q1Q2
Q3Q4
V
= 5.5V
IN
Q1Q2
Q3Q4
C3
22µFC422µFC522µFC622µFC722µFC8N/A
1.0µH
R6
2
C13
1.5nF
MURATA: (HIGH VOLTAGE INPUT CAPACITORS)
22µF, 25V, X7R, 1210 GRM32ER71E226KE15 L
PANASONIC: (OUTPUT CAPACITORS)
270µF SP- S E R IES, 4V, 7m EEFUE0G271LR
INFINEON MOSFETs (NO CONNECTION FOR Q2/Q4:
BSC042N03MS G (LO WER SIDE)
BSC080N03MS G (UPPE R SI DE )
WURTH INDUCTO RS:
1µH, 3.3m, 20A 7443552100
C3
22µFC422µFC522µFC622µFC722µFC8N/A
0.47µH
R6
2
C13
1.5nF
MURATA: (HIGH VOLTAGE INPUT CAPACITORS)
22µF, 25V, X7R, 1210 GRM32ER71E226KE15 L
PANASONIC: (OUTPUT CAPACITORS)
180µF SP-S E R IES, 4V, 10m EEFUE0G181XR
INFINEO N M OSFETs ( NO CONNECTION FOR Q2/ Q4:
BSC042N03MS G (L OWER SIDE )
BSC080N03MS G (UPPER SIDE)
WURTH INDUCTO RS :
0.47µH, 0. 8m , 50A 74435514 7
C20
270µF
+
C14 TO C19
N/A
C20
180µF
+
C14 TO C1 9
N/A
+
270µF
+
180µF
C21
C21
V
V
OUT
+
270µF
OUT
+
180µF
= 1.8V, 15A
+
C22
270µF
= 1.8V, 15A
+
C22
C23
C23
N/A
+
+
C24
270µF
C24
N/A
+
08901-089
+
08901-090
Rev. 0 | Page 37 of 40
ADP1882/ADP1883
DUAL-INPUT, 300 kHz HIGH CURRENT APPLICATIONS CIRCUIT
HIGH VOLTAGE INPUT
V
= 5V
DD
JP1
HIGH VOLTAGE INPUT
V
= 13V
IN
70pF
V
OUT
C
F
0.1µF
R1 7.5k
15k
C2
C
C
1000pF
R
C
24.9k
R2
C1
1µF
ADP1882/
ADP1883
1
VIN
2
COMP/EN9SW
3
FB
4
GND
5
VDD
BST
DRVH
PGND
DRVL
10
8
7
6
100k
C12
100nF
R5
Q1Q2
Q3Q4
C3
22µFC422µFC522µFC622µFC722µFC822µF
0.8µH
R6
2
C13
1.5nF
MURATA: (HIGH VOLTAGE INPUT CAPACITORS)
22µF, 25V, X7R, 1210 GRM32ER71E226KE15 L
PANASONIC: (OUTPUT CAPACITORS)
270µF SP- S E R IES, 4V, 7m EEFUE0G271LR
INFINEON MOSFETs (NO CONNECTION FOR Q2/Q4:
BSC042N03MS G (LOWER SI DE)
BSC080N03MS G (UPP E R S IDE)
WURTH INDUCTO RS:
0.8µH, 27.5m, SUMIDA CEP 125U- 0 R8
C20
270µF
+
C14 TO C19
N/A
+
C21
270µF
V
OUT
+
Figure 92. Applications Circuit for 13 V Input, 1.8 V Output, 20 A, 300 kHz (Q2/Q4 No Connect)
= 1.8V, 20A
C22
270µF
+
C23
270µF
+
C24
270µF
+
08901-091
Rev. 0 | Page 38 of 40
ADP1882/ADP1883
OUTLINE DIMENSIONS
3.10
3.00
2.90
10
6
3.10
3.00
2.90
PIN 1
IDENTIFIER
0.95
0.85
0.75
0.15
0.05
COPLANARITY
1
0.50 BSC
0.10
COMPLIANT TO JEDEC STANDARDS MO-187-BA
Figure 93. 10-Lead Mini Small Outline Package [MSOP]
ORDERING GUIDE
1
Model
ADP1882ARMZ-0.3-R7 −40°C to +125°C 10-Lead Mini Small Outline Package [MSOP] RM-10 LGF
ADP1882ARMZ-0.6-R7 −40°C to +125°C 10-Lead Mini Small Outline Package [MSOP] RM-10 LGG
ADP1882ARMZ-1.0-R7 −40°C to +125°C 10-Lead Mini Small Outline Package [MSOP] RM-10 LGH
ADP1882ARMZ-0.3-EVALZ Forced PWM, 300 kHz Evaluation Board
ADP1882ARMZ-0.6-EVALZ Forced PWM, 600 kHz Evaluation Board
ADP1882ARMZ-1.0-EVALZ Forced PWM, 1.0 MHz Evaluation Board
ADP1883ARMZ-0.3-R7 −40°C to +125°C 10-Lead Mini Small Outline Package [MSOP] RM-10 LGJ
ADP1883ARMZ-0.6-R7 −40°C to +125°C 10-Lead Mini Small Outline Package [MSOP] RM-10 LGK
ADP1883ARMZ-1.0-R7 −40°C to +125°C 10-Lead Mini Small Outline Package [MSOP] RM-10 LGL
ADP1883ARMZ-0.3-EVALZ Power Saving Mode, 300 kHz Evaluation Board
ADP1883ARMZ-0.6-EVALZ Power Saving Mode, 600 kHz Evaluation Board
ADP1883ARMZ-1.0-EVALZ Power Saving Mode, 1.0 MHz Evaluation Board