FEATURES
Bias Current Range 4 mA to 200 mA
Monitor Photodiode Current 50 A to 1200 A
Closed-Loop Control of Average Power
Laser FAIL and Laser DEGRADE Alarms
Automatic Laser Shutdown, ALS
Full Current Parameter Monitoring
5 V Operation
–40C to +85C Temperature Range
5 mm 5 mm 32-Lead LFCSP Package
APPLICATIONS
Fiber Optic Communication
Average Power Controller
ADN2830
GENERAL DESCRIPTION
The ADN2830 provides closed-loop control of the average
optical power of a continuous wave (CW) laser diode (LD)
after initial factory setup. The control loop adjusts the laser
IBIAS to maintain a constant back facet monitor photodiode
(MPD) current and thus a constant laser optical power. The
external PSET resistor is adjusted during factory setup to set
the desired optical power. R
is the MPD current corresponding to the desired optical power.
Programmable alarms are provided for laser fail (end of life)
and laser degrade (impending fail).
To provide monitoring of the MPD current, the MPD can be
connected to the IMPD pin. In this case, the MPD current is
mirrored to the IMPDMON pin to provide a monitor and
internally to the PSET pin to close the control loop.
By closing the feedback using IBMON rather than an MPD
connected to PSET, the device is configured to control a constant
current in the laser rather than a constant optical output power.
is set at 1.23/IAV, where I
PSET
AV
R
MPD
PSET
V
GND
CC
FUNCTIONAL BLOCK DIAGRAM
IBMONIMPDMONALS FAI LDEGRADE
IMPD
GND
PSET
GND
PAV CAP
CONTROL
MODE
V
GND
CC
IBIAS
ASET
LD
GND
V
CC
R
ASET
REV. AREV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective companies.
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
2
θJA is defined when the part is soldered onto a 4-layer board.
Storage Temperature Range . . . . . . . . . . –65°Cto+150°C
Lead Temperature (Soldering 10 sec) . . . . . . . . . . . . . . 300°C
ORDERING GUIDE
ModelTemperature RangePackage Description
ADN2830ACP32–40°C to +85°C32-Lead LFCSP
ADN2830ACP32-REEL7–40°C to +85°C32-Lead LFCSP
ADN2830ACP32-REEL–40°C to +85°C32-Lead LFCSP
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the ADN2830 features proprietary ESD protection circuitry, permanent damage may occur on
devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
REV. A
–3–
ADN2830
PIN CONFIGURATION
3
CC
24 IBMON
23 IBMON
22 GND3
21 V
20 ALS
19 FAIL
18 DEGRADE
17 MODE
25
2
V
CC
NC 26
GND2 27
IBIAS 28
GND2 29
GND2 30
IBIAS 31
NC 32
NC = NO CONNECT
ADN2830
TOP VIEW
PIN 1
INDICATOR
NC 3
GND 1
ASET 2
IMPD 5
PSET 4
PIN FUNCTION DESCRIPTIONS
Pin No.MnemonicFunction
1GNDSupply Ground
2ASETAlarm Current Threshold Set Pin
3NCNo Connect
4PSETAverage Optical Power Set Pin
5IMPDMonitor Photodiode Input
6IMPDMONMirrored Current from Monitor Photodiode—Current Source
7GND4Supply Ground
8V
4Supply Voltage
CC
9PAVCAPAverage Power Loop Capacitor
10PAVCAPAverage Power Loop Capacitor
11V
12V
1Supply Voltage
CC
5Supply Voltage
CC
13NCNo Connect
14GND1Supply Ground
15NCNo Connect
16NCNo Connect
17MODEMode Select: Tied to ALS = Standalone, High = Parallel Current Booster
18DEGRADEDEGRADE Alarm Output
19FAILFAIL Alarm Output
20ALSAutomatic Laser Shutdown
21V
3Supply Voltage
CC
22GND3Supply Ground
23IBMONBias Current Monitor Output—Current Source
24IBMONBias Current Monitor Output—Current Source
25V
2Supply Voltage
CC
26NCNo Connect
27GND2Supply Ground
28IBIASLaser Diode Bias Current
29GND2Supply Ground
30GND2Supply Ground
31IBIASLaser Diode Bias Current
32NCNo Connect
8
4
CC
V
GND4 7
IMPDMON 6
16 NC
15 NC
14 GND1
13 NC
12 V
5
CC
11
V
1
CC
10 PAVCAP
9 PAVCAP
–4–
REV. A
ADN2830
GENERAL
Laser diodes have current-in to light-out transfer functions as
shown in Figure 1. Two key characteristics of this transfer function are the threshold current, I
, and slope in the linear region
TH
beyond the threshold current, referred to as slope efficiency (LI).
P
OPTICAL POWER
AV
⌬P
⌬P
LI =
⌬I
I
TH
⌬ I
CURRENT
Figure 1. Laser Transfer Function
CONTROL
A monitor photodiode (MPD) is required to control the laser
diode. The MPD current is fed into the ADN2830 to control
the power, continuously adjusting the bias current in response
to the laser’s changing threshold current and light to current
(LI) slope (slope efficiency).
The ADN2830 uses automatic power control (APC) to maintain
a constant power over time and temperature.
The average power is controlled by the R
PSET
resistor
connected between the PSET pin and ground. The PSET pin
is kept 1.23 V above GND. For an initial setup, the R
PSET
resis-
tor can be calculated using the following formula.
PSET
123.
=
I
AV
where I
AV
Note the I
R
is average MPD current.
will change from device to device. It is not
PSET
V
required to know exact values for LI and MPD optical coupling.
LOOP BANDWIDTH SELECTION
Capacitor values greater than 22 nF are used to set the actual
loop bandwidth. This capacitor is placed between the PAVCAP
pin and ground. It is important that the capacitor is a low leakage multilayer ceramic with an insulation resistance greater than
100 GΩ or a time constant of 1000 sec, whichever is less.
ALARMS
The ADN2830 has two active high alarms, DEGRADE and
FAIL. A resistor between ground and the ASET pin is used to
set the current at which these alarms are raised. The current
through the ASET resistor is a ratio of (N ⫻200):1 to the FAIL
alarm threshold (N is the number of ADN2830s in parallel).
The DEGRADE alarm will be raised at 90% of this level.
Example:
ImANImA
==∴=50145,
FAILDEGRADE
I
*R
I
BIASTRIP
=
ASET
ASET
×
20050200
N
V
123123
..
== =
IA
ASET
mA
==µ
250
250
492
.µΩ
A
k
The laser degrade alarm, DEGRADE, gives a warning of imminent
laser failure if the laser diode degrades further or environmental conditions continue to stress the laser diode, e.g., increasing temperature.
The laser fail alarm, FAIL, is activated when:
•
The ASET threshold is reached.
•
The ALS pin is set high. This shuts off the modulation and
bias currents to the laser diode, resulting in the MPD current
dropping to zero.
DEGRADE will only be raised when the bias current exceeds
90% of the ASET current.
MONITOR CURRENTS
IBMON and IMPDMON are current controlled current sources
from V
. They mirror the bias and MPD current for increased
CC
monitoring functionality. An external resistor to GND gives a
voltage proportional to the current monitored. If the IMPDMON
function is not used, the IMPD pin must be grounded and the
monitor photodiode must be tied directly to the PSET pin.
AUTOMATIC LASER SHUTDOWN
When ALS is logic high, the bias current is turned off. Correct
operation of ALS can be confirmed by the fail alarm being
raised when ALS is asserted. Note that this is the only time
DEGRADE will be low while FAIL is high.
MODE
The MODE feature on the ADN2830 allows the user to operate
more than one ADN2830 in parallel current boosting mode to
achieve up to N ⫻200 mA of bias current (N is the number of
ADN2830s in parallel). When using parallel boosting mode,
device is run as the master, the other as the slave. The
one
MODE
pin on the master is tied to ALS and the MODE pin on the
slave is tied high (see Figure 3 for reference circuit).
ALARM INTERFACES
The FAIL and DEGRADE outputs have an internal 30 kΩ
pull-up resistor that is used to pull the digital high value to V
CC.
However, the alarm output may be overdriven with an external
resistor allowing the alarm interfacing to non-V
Non-V
alarm output levels must be below the VCC used for
CC
levels.
CC
the ADN2830.
*The smallest value for R
maximum of N ⫻ 200 mA.
REV. A
is 1.2 kΩ, as this corresponds to the IBIAS
ASET
–5–
ADN2830
POWER CONSUMPTION
The ADN2830 die temperature must be kept below 125°C.
The exposed paddle should be connected in such a manner that
it is at the same potential as the ADN2830 ground pins. Power
consumption can be calculated using the following formulas.
TTP
=+×θ
DIEAMBIENTA
II
=
CCCCMIN
PVIIBIAS V
=×+×
CCCCBIAS PIN
()
MPD
J
_
V
CC
LD
32
NC = NO CONNECT
V
24
IBMON
VCC2
NC
GND2
IBIAS
GND2
GND2
IBIAS
NC
GND
18
3
CC
V
GND3
IBMON
ADN2830
ASETNCPSET
CC
ALS
IMPD
FAIL
DEGRADE
IMPDMON
GND4
MODE
NC
NC
GND1
NC
VCC5
VCC1
PAV CAP
PAV CAP
4
CC
V
FAIL
DEGRADE
16
1F
V
100nF10F
PLACE 100nF CAP
CLOSE TO PIN 8
CC
GND
Figure 2. Test Circuit, Standalone Mode, IMPD Input Not Used
–6–
REV. A
V
CC
MPD
NC = NO CONNECT
ADN2830
V
CC
FAIL
DEGRADE
LD
24
IBMON
VCC2
NC
GND2
IBIAS
GND2
GND2
IBIAS
NC
32
GND
18
3
CC
V
GND3
IBMON
ADN2830
ASETNCPSET
ALS
IMPD
FAIL
DEGRADE
IMPDMON
GND4
MODE
NC
NC
GND1
NC
VCC5
VCC1
PAV CAP
PAV CAP
4
CC
V
16
100nF
PLACE 100nF CAP
CLOSE TO PIN 8
V
CC
100nF10F
GND
NC = NO CONNECT
24
IBMON
VCC2
NC
GND2
IBIAS
GND2
GND2
IBIAS
NC
32
GND
18
3
CC
V
GND3
IBMON
ADN2830
ASETNCPSET
ALS
IMPD
FAIL
DEGRADE
IMPDMON
GND4
MODE
NC
NC
GND1
NC
VCC5
VCC1
PAV CAP
PAV CAP
4
CC
V
16
Figure 3. Test Circuit, Second ADN2830 Used in Parallel Current Boosting Mode to Achieve 400 mA Max IBIAS
REV. A
–7–
ADN2830
V
CC
FAIL
DEGRADE
V
CC
MPD
NOTES
1.FOR DIGITAL CONTROL, REPLACE R
ADN2850 10-BIT RESOLUTION, 35 ppm/C TC, EEPROM; AD5242 8-BIT RESOLUTION, 30 ppm/C TC.
2.TOTAL CURRENT TO LASER = IBIAS + IBIAS R1/R2.
3.FOR BEST ACCURACY, SIZE R1 TO HAVE A MAXIMUM VOLTAGE DROP ACROSS IT WITHIN THE HEADROOM
CONSTRAINTS.
4.FOR 250 mA EXTRA IBIAS (450 mA TOTAL) FROM AMP1, USE AD8591 AMPLIFIER. AMP1 IS THE OPERATIONAL AMPLIFIER
SHOWN IN THIS FIGURE.
5.FOR 350 mA EXTRA IBIAS (550 mA TOTAL) FROM AMP1, USE ANALOG DEVICES’ SSM2211 AMPLIFIER. AMP1 IS THE
OPERATIONAL AMPLIFIER SHOWN IN THIS FIGURE.
V
CC
LD
R1R2
32
NC = NO CONNECT
24
IBMON
VCC2
NC
GND2
IBIAS
GND2
GND2
IBIAS
NC
GND
18
WITH A DIGITAL POTENTIOMETER FROM ANALOG DEVICES:
PSET
3
CC
V
GND3
IBMON
ADN2830
ASETNCPSET
ALS
IMPD
FAIL
DEGRADE
IMPDMON
GND4
MODE
NC
NC
GND1
NC
VCC5
VCC1
PAV CAP
PAV CAP
4
CC
V
16
100nF10F
V
CC
GND
PLACE 100nF CAP
CLOSE TO PIN 8
CURRENT GAIN =
V
CC
R2
LD
Figure 4. The ADN2830 Configured with Current Multiplier
V
CC
FAIL
DEGRADE
R1
R2
R1
V
CC
AD820
V
CC
MPD
NC = NO CONNECT
V
CC
24
IBMON
VCC2
NC
GND2
IBIAS
GND2
GND2
IBIAS
NC
32
GND
18
3
CC
V
GND3
IBMON
ADN2830
ASETNCPSET
ALS
IMPD
FAIL
DEGRADE
IMPDMON
GND4
MODE
NC
NC
GND1
NC
VCC5
VCC1
PAV CAP
PAV CAP
4
CC
V
16
100nF10F
PLACE 100nF CAP
CLOSE TO PIN 8
V
CC
GND
Figure 5. The ADN2830 Configured as Average Power Controller (Bias Current Sourced)
–8–
REV. A
V
CC
LD
VCC2
NC
GND2
IBIAS
GND2
GND2
IBIAS
NC
32
NC = NO CONNECT
V
CC
FAIL
DEGRADE
24
IBMON
GND
18
3
CC
V
GND3
IBMON
ADN2830
ASETNCPSET
ALS
IMPD
FAIL
DEGRADE
IMPDMON
GND4
MODE
NC
NC
GND1
NC
VCC5
V
CC
PAV CAP
PAV CAP
4
CC
V
16
1
V
CC
100nF10F
PLACE 100nF CAP
CLOSE TO PIN 8
ADN2830
GND
Figure 6. The ADN2830 Configured as a Controlled Current
Source by Feeding Back the Bias Monitor Current to R