ANALOG DEVICES ADN2804 Service Manual

622 Mbps Clock and Data Recovery IC
www.BDTIC.com/ADI

FEATURES

Exceeds SONET requirements for jitter transfer/
generation/tolerance Quantizer sensitivity: 3.3 mV typical Adjustable slice level: ±95 mV Patented clock recovery architecture Loss-of-signal (LOS) detect range: 2.6 mV to 18.4 mV Independent slice level adjust and LOS detector No reference clock required Loss-of-lock indicator I2C® interface to access optional features Single-supply operation: 3.3 V Low power: 423 mW typical 5 mm × 5 mm, 32-lead LFCSP, Pb free

APPLICATIONS

BPON ONT SONET OC-12 WDM transponders Regenerators/repeaters Test equipment Broadband cross-connects and routers
with Integrated Limiting Amplifier
ADN2804

GENERAL DESCRIPTION

The ADN2804 provides the receiver functions of quantization, signal level detect, clock and data recovery, and data retiming for 622 Mbps NRZ data. The ADN2804 automatically locks to 622 Mbps data without the need for an external reference clock or programming. In the absence of input data, the output clock drifts no more than ±5%. All SONET jitter requirements are met, including jitter transfer, jitter generation, and jitter tolerance. All specifications are quoted for −40°C to +85°C ambient temperature, unless otherwise noted.
This device, together with a PIN diode and a TIA preamplifier,
n implement a highly integrated, low cost, low power fiber
ca optic receiver.
The receiver’s front-end loss-of-signal (LOS) detector circuit
dicates when the input signal level falls below a user-adjustable
in threshold. The LOS detect circuit has hysteresis to prevent chatter at the output.
The ADN2804 is available in a compact 5 mm × 5 mm, 32-lead LFCS
P.

FUNCTIONAL BLOCK DIAGRAM

REFCLKP/REFCLKN
(OPTIO NAL)
SLICEP/SLICEN
PIN
NIN
VREF
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
2
QUANTIZER
LOS
DETECT
LOSTHRADJ CLKOUTP/
PHASE
SHIFTER
RE-TIMING
DATAOUTP/ DATAOUTN
DATA
2
Figure 1.
LOL
FREQUENCY
DETECT
PHASE
DETECT
CLKOUTN
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2006 Analog Devices, Inc. All rights reserved.
LOOP
FILTER
LOOP
FILTER
2
VCC VEECF1 CF2
ADN2804
VCO
5801-001
ADN2804
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TABLE OF CONTENTS

Features.............................................................................................. 1
Jitter Specifications......................................................................... 13
Applications....................................................................................... 1
General Description ......................................................................... 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications..................................................................................... 3
Jitter Specifications....................................................................... 4
Output and Timing Specifications ............................................. 5
Absolute Maximum Ratings............................................................ 6
Thermal Characteristics .............................................................. 6
ESD Caution.................................................................................. 6
Timing Characteristics..................................................................... 7
Pin Configuration and Function Descriptions............................. 8
Typical Performance Characteristics ............................................. 9
2
I
C Interface Timing and Internal Register Description........... 10
Terminology .................................................................................... 12
Theory of Operation ...................................................................... 14
Functional Description.................................................................. 16
Frequency Acquisition............................................................... 16
Limiting Amplifier ..................................................................... 16
Slice Adjust.................................................................................. 16
Loss-of-Signal (LOS) Detector ................................................. 16
Lock Detector Operation .......................................................... 17
SQUELCH Modes...................................................................... 17
2
I
C Interface ................................................................................ 17
Reference Clock (Optional) ...................................................... 19
Applications Information.............................................................. 21
PCB Design Guidelines ............................................................. 21
DC-Coupled Application.......................................................... 23
Outline Dimensions....................................................................... 24
Ordering Guide .......................................................................... 24

REVISION HISTORY

2/06—Revision 0: Initial Version
Rev. 0 | Page 2 of 24
ADN2804
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SPECIFICATIONS

TA = T unless otherwise noted.
Table 1.
Parameter Conditions Min Typ Max Unit
QUANTIZER—DC CHARACTERISTICS
QUANTIZER—AC CHARACTERISTICS
QUANTIZER—SLICE ADJUSTMENT
LOSS-OF-SIGNAL (LOS) DETECT
R
R R
LOSS-OF-LOCK (LOL) DETECT
ACQUISITION TIME
DATA RATE READBACK ACCURACY
POWER SUPPLY VOLTAGE 3.0 3.3 3.6 V POWER SUPPLY CURRENT Locked to 622.08 Mbps 128 mA OPERATING TEMPERATURE RANGE –40 +85 °C
1
PIN and NIN should be differentially driven and ac-coupled for optimum sensitivity.
2
When ac-coupled, the LOS assert and deassert times are dominated by the RC time constant of the ac coupling capacitor and the 50 Ω input termination of the
ADN2804 input stage.
MIN
to T
, VCC = V
MAX
MIN
to V
, VEE = 0 V, CF = 0.47 μF, SLICEP = SLICEN = VEE, input data pattern: PRBS 223 − 1,
MAX
Input Voltage Range @ PIN or NIN, dc-coupled 1.8 2.8 V Peak-to-Peak Differential Input PIN − NIN 2.0 V Input Common-Mode Level DC-coupled (see Figure 27, Figure 28, and Figure 29) 2.3 2.5 2.8 V Differential Input Sensitivity 223 − 1 PRBS, ac-coupled,1 BER = 1 × 10
–10
6 3.3 mV p-p Input Offset 500 μV Input RMS Noise BER = 1 × 10
–10
290 μV rms
Data Rate 622 Mbps Output Clock Range Absence of input data 622 ± 5% MHz S11 @ 622 MHz −15 dB Input Resistance Differential 100 Ω Input Capacitance 0.65 pF
Gain SLICEP − SLICEN = ±0.5 V 0.10 0.11 0.13 V/V Differential Control Voltage Input SLICEP − SLICEN −0.95 +0.95 V Control Voltage Range DC level @ SLICEP or SLICEN VEE 0.95 V Slice Threshold Offset 1 mV
Loss-of-Signal Detect Range (see Figure 6) R
= 0 Ω 14.9 16.7 18.4 mV
THRESH
= 100 kΩ 2.6 3.5 4.4 mV
THRESH
Hysteresis (Electrical) OC-12
= 0 Ω 6.2 6.9 7.7 dB
THRESH
= 100 kΩ 4.1 6.1 8.1 dB
THRESH
LOS Assert Time DC-coupled LOS Deassert Time DC-coupled
2
2
500 ns 400 ns
VCO Frequency Error for LOL Assert With respect to nominal 1000 ppm VCO Frequency Error for LOL Deassert With respect to nominal 250 ppm LOL Response Time OC-12 200 μs
Lock to Data Mode OC-12 2.0 ms Optional Lock to REFCLK Mode 20.0 ms
Fine Readback In addition to REFCLK accuracy OC-12 100 ppm
Rev. 0 | Page 3 of 24
ADN2804
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JITTER SPECIFICATIONS

TA = T unless otherwise noted.
Table 2.
Parameter Conditions Min Typ Max Unit
PHASE-LOCKED LOOP CHARACTERISTICS
30 Hz 300 Hz 25 kHz 2.5 UI p-p 250 kHz
1
Jitter tolerance of the ADN2804 at these jitter frequencies is better than what the test equipment is able to measure.
to T
MIN
Jitter Transfer Bandwidth OC-12 75 130 kHz Jitter Peaking OC-12 0 0.03 dB Jitter Generation OC-12, 12 kHz to 5 MHz 0.001 0.003 UI rms
0.011 0.026 UI p-p Jitter Tolerance OC-12, 223 − 1 PRBS
, VCC = V
MAX
MIN
to V
, VEE = 0 V, CF = 0.47 μF, SLICEP = SLICEN = VEE, input data pattern: PRBS 223 − 1,
MAX
1
1
1
100 UI p-p 44 UI p-p
1.0 UI p-p
Rev. 0 | Page 4 of 24
ADN2804
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OUTPUT AND TIMING SPECIFICATIONS

Table 3.
Parameter Conditions Min Typ Max Unit
LVDS OUTPUT CHARACTERISTICS
(CLKOUTP/CLKOUTN, DATAOUTP/DATAOUTN)
Output Voltage High VOH (see Figure 3) 1475 mV Output Voltage Low VOL (see Figure 3) 925 mV Differential Output Swing VOD (see Figure 3) 250 320 400 mV
Output Offset Voltage VOS (see Figure 3) 1125 1200 1275 mV Output Impedance Differential 100 Ω
LVDS Outputs’ Timing
Rise Time 20% to 80% 115 220 ps Fall Time 80% to 20% 115 220 ps Setup Time TS (see Figure 2), OC-12 760 800 840 ps Hold Time TH (see Figure 2), OC-12 760 800 840 ps
I2C INTERFACE DC CHARACTERISTICS LVCMOS
Input High Voltage VIH 0.7 VCC V Input Low Voltage VIL 0.3 VCC V Input Current VIN = 0.1 VCC or VIN = 0.9 VCC −10.0 +10.0 μA Output Low Voltage VOL, IOL = 3.0 mA 0.4 V
I2C INTERFACE TIMING See Figure 11
SCK Clock Frequency 400 kHz SCK Pulse Width High t SCK Pulse Width Low t Start Condition Hold Time t Start Condition Setup Time t Data Setup Time t Data Hold Time t SCK/SDA Rise/Fall Time TR/TF 20 + 0.1 Cb Stop Condition Setup Time t Bus Free Time Between a Stop and a Start t
REFCLK CHARACTERISTICS Optional lock to REFCLK mode
Input Voltage Range @ REFCLKP or REFCLKN V V Minimum Differential Input Drive 100 mV p-p Reference Frequency 10 160 MHz Required Accuracy 100 ppm
LVTTL DC INPUT CHARACTERISTICS
Input High Voltage VIH 2.0 V Input Low Voltage VIL 0.8 V Input High Current IIH, VIN = 2.4 V 5 μA Input Low Current IIL, VIN = 0.4 V −5 μA
LVTTL DC OUTPUT CHARACTERISTICS
Output High Voltage VOH, IOH = −2.0 mA 2.4 V Output Low Voltage VOL, IOL = +2.0 mA 0.4 V
1
Cb = total capacitance of one bus line in picofarads. If used with Hs-mode devices, faster fall times are allowed.
600 ns
HIGH
1300 ns
LOW
600 ns
HD;STA
600 ns
SU;STA
100 ns
SU;DAT
300 ns
HD;DAT
600 ns
SU;STO
1300 ns
BUF
0 V
IL
VCC V
IH
1
300 ns
Rev. 0 | Page 5 of 24
ADN2804
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ABSOLUTE MAXIMUM RATINGS

TA = T
0.47 μF, SLICEP = SLICEN = VEE, unless otherwise noted.
Table 4.
Parameter Rating
Supply Voltage (VCC) 4.2 V Minimum Input Voltage (All Inputs) VEE − 0.4 V Maximum Input Voltage (All Inputs) VCC + 0.4 V Maximum Junction Temperature 125°C Storage Temperature Range −65°C to +150°C
MIN
to T
, VCC = V
MAX
MIN
to V
, VEE = 0 V, CF =
MAX
Stress above those listed under Absolute Maximum Ratings may ca
use permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

THERMAL CHARACTERISTICS

Thermal Resistance

32-lead LFCSP, 4-layer board with exposed paddle soldered to VEE, θ
= 28°C/W.
JA

ESD CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although this product features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
Rev. 0 | Page 6 of 24
ADN2804
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TIMING CHARACTERISTICS

CLKOUTP
T
T
S
DATAOUTP/
DATAOUTN
V
OH
H
Figure 2. Output Timing
DIFFERENTIAL CLKOUTP/ N, DATAOUTP/N
05801-002
V
OS
V
OL
|VOD|
5801-032
Figure 3. Differential Output Specifications
5mA
R
LOAD
V
100
5mA
SIMPLIFIED LVDS
OUTPUT STAGE
100
DIFF
05801-033
Figure 4. Differential Output Stage
Rev. 0 | Page 7 of 24
ADN2804
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PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

32 TEST2
31 VCC
30 VEE
29 DATAOUTP
28 DATAOUTN
27 SQUELCH
26 CLKOUTP
25 CLKOUTN
TEST1 1
VCC 2
VREF 3
NIN 4
PIN 5 SLICEP 6 SLICEN 7
VEE 8
* THERE IS AN EXPOSED PAD ON THE BOTTOM OF
THE PACKAGE THAT MUST BE CONNECT ED TO GND.
PIN 1 INDICATOR
ADN2804*
TOP VIEW
(Not to Scale)
VCC 12
THRADJ 9
REFCLKP 10
REFCLKN 11
CF2 14
VEE 13
CF1 15
LOL 16
24 VCC 23 VEE 22 LOS 21 SDA 20 SCK 19 SADDR5 18 VCC 17 VEE
05801-004
Figure 5. Pin Configuration
Table 5. Pin Function Descriptions
Pin No. Mnemonic Type
1 TEST1 Connect to VCC. 2 VCC P Power for Limiting Amplifier, LOS. 3 VREF AO Internal VREF Voltage. Decouple to GND with a 0.1 μF capacitor. 4 NIN AI Differential Data Input. CML. 5 PIN AI Differential Data Input. CML. 6 SLICEP AI Differential Slice Level Adjust Input. 7 SLICEN AI Differential Slice Level Adjust Input. 8 VEE P GND for Limiting Amplifier, LOS. 9 THRADJ AI LOS Threshold Setting Resistor. 10 REFCLKP DI Differential REFCLK Input. 10 MHz to 160 MHz. 11 REFCLKN DI Differential REFCLK Input. 10 MHz to 160 MHz. 12 VCC P VCO Power. 13 VEE P VCO GND. 14 CF2 AO Frequency Loop Capacitor. 15 CF1 AO Frequency Loop Capacitor. 16 LOL DO Loss-of-Lock Indicator. LVTTL active high. 17 VEE P FLL Detector GND. 18 VCC P FLL Detector Power. 19 SADDR5 DI Slave Address Bit 5. 20 SCK DI I2C Clock Input. 21 SDA DI I2C Data Input. 22 LOS DO Loss-of-Signal Detect Output. Active high. LVTTL. 23 VEE P Output Buffer, I2C GND. 24 VCC P Output Buffer, I2C Power. 25 CLKOUTN DO Differential Recovered Clock Output. LVDS. 26 CLKOUTP DO Differential Recovered Clock Output. LVDS. 27 SQUELCH DI Disable Clock and Data Outputs. Active high. LVTTL. 28 DATAOUTN DO Differential Recovered Data Output. LVDS. 29 DATAOUTP DO Differential Recovered Data Output. LVDS. 30 VEE P Phase Detector, Phase Shifter GND. 31 VCC P Phase Detector, Phase Shifter Power. 32 TEST2 Connect to VCC. Exposed Pad Pad P Connect to GND.
1
Type: P = power, AI = analog input, AO = analog output, DI = digital input, DO = digital output.
1
Description
Rev. 0 | Page 8 of 24
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