−40°C to +100°C operation
Very low power: I
Typical 26 ps rise/fall times
Full back-termination of output transmission lines
Crosspoint adjust function
PECL-/CML-compatible data inputs
Bias current range: 2 mA to 25 mA
Differential modulation current range: 2.2 mA to 23 mA
Automatic laser shutdown (ALS)
3.3 V operation
Compact 3 mm × 3 mm LFCSP
Voltage-input control for bias and modulation currents
XFP-compliant bias current monitor
The ADN2530 laser diode driver is designed for direct modulation of packaged VCSELs with a differential resistance ranging
from 35 Ω to 140 Ω. The active back-termination technique
provides excellent matching with the output transmission lines
while reducing the power dissipation in the output stage. The
back-termination in the ADN2530 absorbs signal reflections
from the TOSA end of the output transmission lines, enabling
excellent optical eye quality to be achieved even when the
TOSA end of the output transmission lines is significantly
misterminated. The small package provides the optimum
solution for compact modules where laser diodes are packaged
in low pin count optical subassemblies.
The modulation and bias currents are programmable via the
MSET and BSET control pins. By driving these pins with
control voltages, the user has the flexibility to implement
various average power and extinction ratio control schemes,
including closed-loop control and look-up tables. The eye
crosspoint in the output eye diagram is adjustable via the
crosspoint adjust (CPA) control voltage input. The automatic
laser shutdown (ALS) feature allows the user to turn on/off the
bias and modulation currents by driving the ALS pin with the
proper logic levels. The product is available in a space-saving
3 mm × 3 mm LFCSP specified from −40°C to +100°C.
FUNCTIONAL BLOCK DIAGRAM
CP
VCC
50Ω50Ω
GND
DATAP
DATAN
800Ω
200Ω
MSETGNDBSET
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
5.8 8.2 ps p-p 11.3 Gbps, CPA 35% to 65%
Differential |S22| −5 dB 5 GHz < f < 10 GHz, Z0 = 100 Ω differential
−13.6 dB f < 5 GHz, Z0 = 100 Ω differential
Compliance Voltage
DATA INPUTS (DATAP, DATAN)
Input Data Rate 11.3 Gbps NRZ
Differential Input Swing 0.4 1.6 V p-p diff Differential ac-coupled
Differential |S11| −15 dB f < 10 GHz, Z0 = 100 Ω differential
Input Termination Resistance 85 100 115 Ω Differential
BIAS CONTROL INPUT (BSET)
BSET Voltage to IBIAS Gain 15 20 24 mA/V
BSET Input Resistance 800 1000 1200 Ω
MODULATION CONTROL INPUT (MSET)
MSET Voltage to IMOD Gain 14 19 23 mA/V
MSET Input Resistance 800 1000 1200 Ω
BIAS MONITOR (IBMON)
IBMON to IBIAS Ratio 50 μA/mA
Accuracy of IBIAS to IBMON Ratio −5.0 +5.0 % IBIAS = 2 mA, R
−4.3 +4.3 % IBIAS = 4 mA, R
−3.5 +3.5 % IBIAS = 8 mA, R
−3.0 +3.0 % IBIAS = 14 mA, R
−2.5 +2.5 % IBIAS = 25 mA, R
AUTOMATIC LASER SHUTDOWN (ALS)
VIH 2.4 V
VIL 0.8 V
IIL −20 +20 μA
IIH 0 200 μA
to VCC
MIN
2, 3, 4
, TA = −40°C to +100°C, 100 Ω differential load impedance, crosspoint adjust disabled, unless otherwise noted.
MAX
1
2
2, 3 , 4
2, 3, 4
0.55 VCC – 1.3 V IBIAS = 25 mA
= 35 Ω to 100 Ω differential
LOAD
= 140 Ω differential
LOAD
35 65 %
26 32.5 ps CPA disabled
26 32.5 ps CPA disabled
<0.5 ps rms CPA disabled
2, 4, 5
2, 4, 6
1
5.4 8.2 ps p-p 10.7 Gbps, CPA disabled
5.4 8.2 ps p-p 11.3 Gbps, CPA disabled
VCC − 0.7 VCC + 0.7 V
= 750 Ω
IBMON
= 750 Ω
IBMON
= 750 Ω
IBMON
= 750 Ω
IBMON
= 750 Ω
IBMON
Rev. A | Page 3 of 20
ADN2530
Parameter Min Typ Max Unit Test Conditions/Comments
ALS Assert Time 2 μs
ALS Negate Time 10 μs
POWER SUPPLY
VCC 3.07 3.3 3.53 V
7
I
CC
8
I
SUPPLY
1
The voltage between the pin with the specified compliance voltage and GND.
2
Specified for TA = −40°C to +85°C due to test equipment limitation. See the Typical Performance Characteristics section for data on performance for TA = −40°C to +100°C.
3
The pattern used is composed of a repetitive sequence of eight 1s followed by eight 0s at 10.7 Gbps.
4
Measured using the high speed characterization circuit shown in Figure 3.
5
The pattern used is K28.5 (00111110101100000101) at 10.7 Gbps rate.
6
The pattern used is K28.5 (00111110101100000101) at 11.3 Gbps rate.
7
Only includes current in the ADN2530 VCC pins.
8
Includes current in ADN2530 VCC pins and dc current in IMODP and IMODN pull-up inductors. See the Power Consumption section for total supply current calculation.
27 32 mA V
65 76 mA V
PACKAGE THERMAL SPECIFICATIONS
Table 2.
Parameter Min Typ Max Unit Conditions/Comments
θ
65 72.2 79.4 °C/W Thermal resistance from junction to top of package.
J-TOP
θ
2.6 5.8 10.7 °C/W Thermal resistance from junction to bottom of exposed pad.
J-PAD
IC Junction Temperature 125 °C
ALS
ALS
NEGATE TIME
Rising edge of ALS to fall of IBIAS and IMOD
below 10% of nominal; see
Figure 2
Falling edge of ALS to rise of IBIAS and IMOD
above 90% of nominal; see
Supply Voltage—VCC to GND −0.3 V to +4.2 V
IMODP, IMODN to GND VCC − 1.5 V to +4.5 V
DATAP, DATAN to GND VCC − 1.8 V to VCC − 0.4 V
All Other Pins −0.3 V to VCC + 0.3 V
Junction Temperature 150°C
Storage Temperature Range −65°C to +150°C
Soldering Temperature
(Less than 10 sec)
300°C
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Rev. A | Page 5 of 20
ADN2530
E
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
VCC
DATAN
DATAP
VCC
161514
13
12
1
MSET
CPA
ALS
GND
NOTES:
THERE IS AN EXPOSED PAD ON THE
BOTTOM OF THE PACKAGE THAT MUST B
CONNECTED TO THE VCC OR GND PLANE.
2
3
4
PIN 1
INDICATOR
ADN2530
TOP VIEW
(Not to Scale)
5
678
VCC
IMODP
IMODN
Figure 4. Pin Configuration
Table 4. Pin Function Descriptions
Pin No. Mnemonic I/O Description
1 MSET Input Modulation Current Control Input
2 CPA Input Crosspoint Adjust Control Input
3 ALS Input Automatic Laser Shutdown
4 GND Power Negative Power Supply
5 VCC Power Positive Power Supply
6 IMODN Output Modulation Current Negative Output
7 IMODP Output Modulation Current Positive Output
8 VCC Power Positive Power Supply
9 GND Power Negative Power Supply
10 IBIAS Output Bias Current Output
11 IBMON Output Bias Current Monitoring Output
12 BSET Input Bias Current Control Input
13 VCC Power Positive Power Supply
14 DATAP Input Data Signal Positive Input
15 DATAN Input Data Signal Negative Input
16 VCC Power Positive Power Supply
Exposed Pad Pad Power Connect to GND or VCC
BSET
11
IBMON
10
IBIAS
9
GND
VCC
05457-004
Rev. A | Page 6 of 20
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