Isolated RS-485/RS-422 transceiver, configurable as half or
full duplex
isoPower® integrated isolated dc-to-dc converter
±15 kV ESD protection on RS-485 input/output pins
Complies with ANSI/TIA/EIA-485-A-98 and ISO 8482:1987(E)
ADM2582E data rate: 16 Mbps
ADM2587E data rate: 500 kbps
5 V or 3.3 V operation
Connect up to 256 nodes on one bus
Open- and short-circuit, fail-safe receiver inputs
High common-mode transient immunity: >25 kV/μs
Thermal shutdown protection
Safety and regulatory approvals (pending)
UL recognition: 2500 V rms for 1 minute per UL 1577
VDE Certificates of Conformity
DIN V VDE V 0884-10 (VDE V 0884-10):2006-12
V
= 560 V peak
IORM
Operating temperature range: −40°C to +85°C
Highly integrated, 20-lead, wide-body SOIC package
APPLICATIONS
Isolated RS-485/RS-422 interfaces
Industrial field networks
Multipoint data transmission systems
DIGITAL ISOLATION iCoupler
TxD
DE
RxD
RE
ADM2582E/ADM2587E
FUNCTIONAL BLOCK DIAGRAM
CC
isoPower DC-TO-DC CONVER TER
OSCILLATOR
ENCODE
ENCODE
DECODE
GND
1
ISOLATION
BARRIER
RECTIF IER
REGULATOR
TRANSCEIVER
DECODED
DECODE
ENCODE
ADM2582E/ADM2587E
GND
Figure 1.
ISOOUT
2
V
ISOIN
Y
Z
R
A
B
08111-001
GENERAL DESCRIPTION
The ADM2582E/ADM2587E are fully integrated signal and
power isolated data transceivers with ±15 kV ESD protection
and are suitable for high speed communication on multipoint
transmission lines. The ADM2582E/ADM2587E include an
integrated isolated dc-to-dc power supply, which eliminates the
need for an external dc-to-dc isolation block.
They are designed for balanced transmission lines and comply
with ANSI/TIA/EIA-485-A-98 and ISO 8482:1987(E).
The devices integrate Analog Devices, Inc., iCoupler® technology to
combine a 3-channel isolator, a three-state differential line driver, a
differential input receiver, and Analog Devices isoPower dc-todc converter into a single package. The devices are powered by a
single 5 V or 3.3 V supply, realizing a fully integrated signal and
power isolated RS-485 solution.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
The ADM2582E/ADM2587E driver has an active high enable.
An active low receiver enable is also provided that causes the
receiver output to enter a high impedance state when disabled.
The devices have current limiting and thermal shutdown
features to protect against output short circuits and situations
where bus contention may cause excessive power dissipation.
The parts are fully specified over the industrial temperature
range and are available in a highly integrated, 20-lead, widebody SOIC package.
The ADM2582E/ADM2587E contain isoPower technology that
uses high frequency switching elements to transfer power through
the transformer. Special care must be taken during printed circuit
board (PCB) layout to meet emissions standards. Refer to
Application Note AN-0971, Control of Radiated Emissions with isoPower Devices, for details on board layout considerations.
All voltages are relative to their respective ground; 3.0 ≤ VCC ≤ 5.5 V. All minimum/maximum specifications apply over the entire
recommended operation range, unless otherwise noted. All typical specifications are at T
Table 1.
Parameter Symbol Min Typ Max Unit Test Conditions
ADM2587E SUPPLY CURRENT ICC
Data Rate ≤ 500 kbps 90 mA VCC = 3.3 V, 100 Ω load between Y and Z
72 mA VCC = 5 V, 100 Ω load between Y and Z
125 mA VCC = 3.3 V, 54 Ω load between Y and Z
98 mA VCC = 5 V, 54 Ω load between Y and Z
120 mA 120 Ω load between Y and Z
ADM2582E SUPPLY CURRENT ICC
Data Rate = 16 Mbps 150 mA 120 Ω load between Y and Z
230 mA 54 Ω load between Y and Z
ISOLATED SUPPLY VOLTAGE V
3.3
ISOUT
DRIVER
Differential Outputs
Differential Output Voltage, Loaded |V
| 2.0 5.0 V RL = 100 Ω (RS-422), see Figure 23
OD2
1.5 5.0 V RL = 54 Ω (RS-485), see Figure 23
|V
| 1.5 5.0 V −7 V ≤ V
OD3
Δ|VOD| for Complementary Output States Δ|VOD| 0.2 V RL = 54 Ω or 100 Ω, see Figure 23
Common-Mode Output Voltage VOC 3.0 V RL = 54 Ω or 100 Ω, see Figure 23
Δ|VOC| for Complementary Output States Δ|VOC| 0.2 V RL = 54 Ω or 100 Ω, see Figure 23
Short-Circuit Output Current IOS 200 mA
Output Leakage Current (Y, Z) IO 30 μA
−30 μA
Logic Inputs DE, RE, TxD
Input Threshold Low VIL 0.3 × VCC V
Input Threshold High VIH 0.7 × VCC V
Input Current II −10 0.01 10 μA
RECEIVER
Differential Inputs
Differential Input Threshold Voltage VTH −200 −125 −30 mV −7 V < VCM < +12 V
Input Voltage Hysteresis V
15 mV VOC = 0 V
HYS
Input Current (A, B) II 125 μA DE = 0 V, VCC = 0 V or 3.6 V, VIN = 12 V
−100 μA DE = 0 V, VCC = 0 V or 3.6 V, VIN = -7 V
Line Input Resistance RIN 96 kΩ −7 V < VCM < +12 V
Logic Outputs
Output Voltage Low VOL 0.2 0.4 V IO = 1.5 mA, VA − VB = −0.2 V
Output Voltage High VOH V
CM is the maximum common-mode voltage slew rate that can be sustained while maintaining specification-compliant operation. VCM is the common-mode potential
difference between the logic and bus sides. The transient magnitude is the range over which the common-mode is slewed. The common-mode voltage slew rates
apply to both rising and falling common-mode voltage edges.
= 25°C, VCC = 5 V unless otherwise noted.
A
≤ 12 V, see Figure 24
TEST1
DE = 0 V, RE
= 0 V, VCC = 0 V or 3.6 V,
VIN = 12 V
DE = 0 V, RE
= 0 V, VCC = 0 V or 3.6 V,
VIN = −7 V
, TxD
DE, RE
, TxD
DE, RE
, TxD
DE, RE
Rev. 0 | Page 3 of 20
ADM2582E/ADM2587E
ADM2582E TIMING SPECIFICATIONS
TA = −40°C to +85°C.
Table 2.
Parameter Symbol Min Typ Max Unit Test Conditions
DRIVER
Maximum Data Rate 16 Mbps
Propagation Delay, Low to High t
Propagation Delay, High to Low t
Output Skew t
Rise Time/Fall Time tDR, tDF 15 ns RL = 54 Ω, CL1 = CL2 = 100 pF, see Figure 25 and Figure 29
Enable Time tZL, tZH 120 ns RL = 110 Ω, CL = 50 pF, see Figure 26 and Figure 31
Disable Time tLZ, tHZ 150 ns RL = 110 Ω, CL = 50 pF, see Figure 26 and Figure 31
RECEIVER
Propagation Delay, Low to High t
Propagation Delay, High to Low t
Output Skew1 t
Enable Time tZL, tZH 15 ns RL = 1 kΩ, CL = 15 pF, see Figure 28 and Figure 32
Disable Time tLZ, tHZ 15 ns RL = 1 kΩ, CL = 15 pF, see Figure 28 and Figure 32
1
Guaranteed by design.
ADM2587E TIMING SPECIFICATIONS
TA = −40°C to +85°C.
63 100 ns RL = 54 Ω, CL1 = C
DPLH
64 100 ns RL = 54 Ω, CL1 = C
DPHL
1 8 ns RL = 54 Ω, CL1 = CL2 = 100 pF, see Figure 25 and Figure 29
SKEW
94 110 ns CL = 15 pF, see Figure 27 and Figure 30
RPLH
95 110 ns CL = 15 pF, see Figure 27 and Figure 30
RPHL
1 12 ns CL = 15 pF, see Figure 27 and Figure 30
SKEW
= 100 pF, see Figure 25 and Figure 29
L2
= 100 pF, see Figure 25 and Figure 29
L2
Table 3.
Parameter Symbol Min Typ Max Unit Test Conditions
DRIVER
Maximum Data Rate 500 kbps
Propagation Delay, Low to High t
Propagation Delay, High to Low t
Output Skew t
250 503 700 ns RL = 54 Ω, CL1 = C
DPLH
250 510 700 ns RL = 54 Ω, CL1 = C
DPHL
7 100 ns RL = 54 Ω, CL1 = CL2 = 100 pF, see Figure 25 and Figure 29
SKEW
= 100 pF, see Figure 25 and Figure 29
L2
= 100 pF, see Figure 25 and Figure 29
L2
Rise Time/Fall Time tDR, tDF 200 1100 ns RL = 54 Ω, CL1 = CL2 = 100 pF, see Figure 25 and Figure 29
Enable Time tZL, tZH 2.5 μs RL = 110 Ω, CL = 50 pF, see Figure 26 and Figure 31
Disable Time tLZ, tHZ 200 ns RL = 110 Ω, CL = 50 pF, see Figure 26 and Figure 31
RECEIVER
Propagation Delay, Low to High t
Propagation Delay, High to Low t
Output Skew t
91 200 ns CL = 15 pF, see Figure 27 and Figure 30
RPLH
95 200 ns CL = 15 pF, see Figure 27 and Figure 30
RPHL
4 30 ns CL = 15 pF, see Figure 27 and Figure 30
SKEW
Enable Time tZL, tZH 15 ns RL = 1 kΩ, CL = 15 pF, see Figure 28 and Figure 32
Disable Time tLZ, tHZ 15 ns RL = 1 kΩ, CL = 15 pF, see Figure 28 and Figure 32
ADM2582E/ADM2587E PACKAGE CHARACTERISTICS
Table 4.
Parameter Symbol Min Typ Max Unit Test Conditions
Resistance (Input-to-Output)1 R
Capacitance (Input-to-Output)1 C
Input Capacitance2 C
Input IC Junction-to-Case Thermal Resistance θ
Output IC Junction-to-Case Thermal Resistance θ
1
Device considered a 2-terminal device: short together Pin 1 to Pin 10 and short together Pin 11 to Pin 20.
2
Input capacitance is from any input data pin to ground.
10
I-O
3 pF f = 1 MHz
I-O
4 pF
I
33 °C/W
JCI
28 °C/W
JCO
Rev. 0 | Page 4 of 20
12
Ω
Thermocouple located at center of
package underside
Thermocouple located at center of
package underside
ADM2582E/ADM2587E
ADM2582E/ADM2587E REGULATORY INFORMATION
Table 5. Pending ADM2582E/ADM2587E Approvals
Organization Approval Type Notes
UL
VDE
ADM2582E/ADM2587E INSULATION AND SAFETY-RELATED SPECIFICATIONS
Table 6.
Parameter Symbol Value Unit Conditions
Rated Dielectric Insulation Voltage 2500 V rms 1-minute duration
Minimum External Air Gap (Clearance) L(I01) >8.0 mm
Minimum External Tracking (Creepage) L(I02) >8.0 mm
Minimum Internal Gap (Internal Clearance) 0.017 min mm Insulation distance through insulation
Tracking Resistance (Comparative Tracking Index) CTI >175 V DIN IEC 112/VDE 0303-1
Isolation Group IIIa Material Group (DIN VDE 0110: 1989-01, Table 1)
To be recognized under the Component
Recognition Program of Underwriters
Laboratories, Inc.
To be certified according to
DIN V VDE V 0884-10 (VDE V 0884-10):2006-12
In accordance with UL 1577, each ADM2582E/ADM2587E is proof tested
by applying an insulation test voltage ≥ 3000 V rms for 1 second.
In accordance with VDE 0884-10, each ADM2582E/ADM2587E is proof
tested by applying an insulation test voltage ≥ 1050 V
for 1 second.
PEAK
Measured from input terminals to output terminals,
shortest distance through air
Measured from input terminals to output terminals,
shortest distance along body
This isolator is suitable for basic electrical isolation only within the safety limit data. Maintenance of the safety data must be ensured by
means of protective circuits.
Table 7.
Description Conditions Symbol Characteristic Unit
CLASSIFICATIONS
Installation Classification per DIN VDE 0110 for
Rated Mains Voltage
≤150 V rms I to IV
≤300 V rms I to III
≤400 V rms I to II
Climatic Classification 40/85/21
Pollution Degree DIN VDE 0110, see Table 1 2
VOLTAGE
Maximum Working Insulation Voltage V
Input-to-Output Test Voltage VPR
Method b1
Method a
After Environmental Tests, Subgroup 1 V
After Input and/or Safety Test,
SAFETY-LIMITING VALUES Maximum value allowed in the event of a failure
Case Temperature TS 150 °C
Input Current IS,
Output Current IS,
Insulation Resistance at TS V
560 V peak
IORM
× 1.875 = VPR, 100% production tested,
V
IORM
= 1 sec, partial discharge < 5 pC
t
m
× 1.6 = VPR, tm = 60 sec, partial discharge < 5 pC 896 V peak
IORM
× 1.2 = VPR, tm = 60 sec, partial discharge < 5 pC 672 V peak
V
IORM
= 500 V RS >109 Ω
IO
1050 V peak
265 mA
INPUT
335 mA
OUTPUT
Rev. 0 | Page 5 of 20
ADM2582E/ADM2587E
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted. All voltages are relative to
their respective ground.
Table 8.
ParameterRating
VCC −0.5 V to +7 V
Digital Input Voltage (DE, RE, TxD)
Digital Output Voltage (RxD) −0.5 V to VDD + 0.5 V
Driver Output/Receiver Input Voltage −9 V to +14 V
Operating Temperature Range −40°C to +85°C
Storage Temperature Range −55°C to +150°C
ESD (Human Body Model) on
A, B, Y, and Z pins
ESD (Human Body Model) on Other Pins
Lead Temperature
Soldering (10 sec) 260°C
Vapor Phase (60 sec) 215°C
Infrared (15 sec) 220°C
−0.5 V to VDD + 0.5 V
±15 kV
±2 kV
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Table 9. Maximum Continuous Working Voltage
Parameter Max Unit Reference Standard
AC Voltage
Bipolar Waveform 424 V peak
Unipolar Waveform
Basic Insulation 600 V peak
Reinforced Insulation 560 V peak
DC Voltage
Basic Insulation 600 V peak
Reinforced Insulation 560 V peak
1
Refers to continuous voltage magnitude imposed across the isolation
barrier. See the Insulation Lifetime section for more details.
50-year minimum
lifetime
Maximum approved
working voltage per
IEC 60950-1 (pending)
Maximum approved
working voltage per
IEC 60950-1 and
VDE V 0884-10
(pending)
Maximum approved
working voltage per
IEC 60950-1(pending)
Maximum approved
working voltage per
IEC 60950-1 and
VDE V 0884-10
(pending)
ESD CAUTION
1
Rev. 0 | Page 6 of 20
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