RS-485 transceiver with electrical data isolation
Complies with ANSI TIA/EIA RS-485-A and ISO 8482: 1987(E)
500 kbps data rate
Slew rate-limited driver outputs
Low power operation: 2.5 mA max
Suitable for 5 V or 3 V operations (V
High common-mode transient immunity: >25 kV/μs
True fail-safe receiver inputs
Chatter-free power-up/power-down protection
256 nodes on bus
Thermal shutdown protection
Safety and regulatory approvals
UL recognition: 2500 V
for 1 minute per UL 1577
rms
CSA Component Acceptance Notice #5A
VDE Certificate of Conformity
DIN EN 60747-5-2 (VDE 0884 Rev. 2): 2003-01
DIN EN 60950 (VDE 0805): 2001-12; EN 60950: 2000
= 560 V peak
V
IORM
Operating temperature range: −40°C to +85°C
DD1
)
Isolated RS-485 Transceiver
ADM2483
FUNCTIONAL BLOCK DIAGRAM
V
DD1
DE
TxD
PV
RxD
RE
GND
1
GALVANIC ISOLATION
Figure 1.
V
DD2
ADM2483
GND
2
A
B
04736-001
APPLICATIONS
Low power RS-485/RS-422 networks
Isolated interfaces
Building control networks
Multipoint data transmission systems
GENERAL DESCRIPTION
The ADM2483 differential bus transceiver is an integrated,
galvanically isolated component designed for bidirectional data
communication on balanced, multipoint bus transmission lines.
It complies with ANSI EIA/TIA-485-A and ISO 8482: 1987(E).
Using Analog Devices’ iCoupler technology, the ADM2483
combines a 3-channel isolator, a three-state differential line
driver, and a differential input receiver into a single package.
The logic side of the device is powered with either a 5 V or 3 V
supply, and the bus side uses a 5 V supply only.
The ADM2483 is slew-limited to reduce reflections with
improperly terminated transmission lines. The controlled slew
rate limits the data rate to 500 kbps. The device’s input impedance
is 96 kΩ, allowing up to 256 transceivers on the bus. Its driver
has an active-high enable feature. The driver differential outputs
and receiver differential inputs are connected internally to form
a differential I/O port. When the driver is disabled or when
V
DD1
or V
= 0 V, this imposes minimal loading on the bus.
DD2
An active-high receiver disable feature, which causes the receive
output to enter a high impedance state, is provided as well.
The receiver inputs have a true fail-safe feature that ensures a
logic-high receiver output level when the inputs are open or
shorted. This guarantees that the receiver outputs are in a
known state before communication begins and at the point
when communication ends.
Current limiting and thermal shutdown features protect against
output short circuits and bus contention situations that might
cause excessive power dissipation. The part is fully specified
over the industrial temperature range and is available in a
16-lead, wide body SOIC package.
Rev. B
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
Changes to ESD maximum rating specification........................... 5
10/04—Revision 0: Initial Version
Rev. B | Page 2 of 20
ADM2483
www.BDTIC.com/ADI
SPECIFICATIONS
2.7 ≤ V
Table 1.
Parameter Min Typ Max Unit Test Conditions/Comments
DRIVER
RECEIVER
POWER SUPPLY CURRENT
COMMON-MODE TRANSIENT IMMUNITY
1
Common-mode transient immunity is the maximum common-mode voltage slew rate that can be sustained while maintaining specification-compliant operation.
V
CM
common-mode voltage slew rates apply to both rising and falling common-mode voltage edges.
≤ 5.5 V, 4.75 V ≤ V
DD1
≤ 5.25 V, TA = T
DD2
MIN
to T
, unless otherwise noted.
MAX
Differential Outputs
Differential Output Voltage, VOD 5 V R = ∞, see Figure 3
2.0 5 V R = 50 Ω (RS-422), see Figure 3
1.5 5 V R = 27 Ω (RS-485), see Figure 3
1.5 5 V
= −7 V to +12 V, V
V
TST
≥ 4.75,
DD1
see Figure 4
∆ |VOD| for Complementary Output States 0.2 V R = 27 Ω or 50 Ω, see Figure 3
Common-Mode Output Voltage, VOC 3 V R = 27 Ω or 50 Ω, see Figure 3
∆ |VOC| for Complementary Output States 0.2 V R = 27 Ω or 50 Ω, see Figure 3
Output Short-Circuit Current, V
Output Short-Circuit Current, V
= High −250 +250 mA −7 V ≤ V
OUT
= Low −250 +250 mA −7 V ≤ V
OUT
≤ +12 V
OUT
≤ +12 V
OUT
Logic Inputs
Input High Voltage 0.7 V
Input Low Voltage 0.25 V
CMOS Logic Input Current (TxD, DE, RE, PV)
V
DD1
V
DD1
−10 +0.01 +10 µA
TxD, DE, RE
TxD, DE, RE
TxD, DE, RE, PV = V
, PV
, PV
DD1
or 0 V
Differential Inputs
Differential Input Threshold Voltage, VTH −200 −125 −30 mV −7 V ≤ VCM ≤ +12 V
Input Hysteresis 20 mV −7 V ≤ VCM ≤ +12 V
Input Resistance (A, B) 96 150 kΩ −7 V ≤ VCM ≤ +12 V
Input Current (A, B)
0.125 mA VIN = +12 V
−0.1 mA VIN = −7 V
RxD Logic Output
Output High Voltage V
V
Output Low Voltage 0.1 V I
0.4 V I
Output Short-Circuit Current 7 85 mA V
Three-State Output Leakage Current ±1 µA 0.4 V ≤ V
Logic Side 2.5 mA
1.3 mA
− 0.1 V I
DD1
− 0.4 V
DD1
− 0.2 V I
DD1
= 20 µA, VA − VB = 0.2 V
OUT
= 4 mA, VA − VB = 0.2 V
OUT
= −20 µA, VA − VB = −0.2 V
OUT
= −4 mA, VA − VB = −0.2 V
OUT
= GND or VCC
OUT
OUT
4.5 V ≤ V
RE
2.7 V ≤ V
RE
DD1
= 0 V
DD1
= 0 V
≤ 2.4 V
≤ 5.5 V, outputs unloaded,
≤ 3.3 V, outputs unloaded,
Bus Side 2.0 mA Outputs unloaded, DE = 5 V
1.7 mA Outputs unloaded, DE = 0 V
1
25 kV/µs
TxD = V
or 0 V, VCM = 1 kV,
DD1
transient magnitude = 800 V
is the common-mode potential difference between the logic and bus sides. The transient magnitude is the range over which the common mode is slewed. The
Rev. B | Page 3 of 20
ADM2483
www.BDTIC.com/ADI
TIMING SPECIFICATIONS
2.7 ≤ V
Table 2.
Parameter Min Typ Max Unit Test Conditions/Comments
DRIVER
RECEIVER
POWER VALID INPUT
≤ 5.5 V, 4.75 V ≤ V
DD1
≤ 5.25 V, TA = T
DD2
MIN
to T
, unless otherwise noted.
MAX
Maximum Data Rate 500 kbps
Propagation Delay, t
Skew, t
40 ns R
SKEW
Rise/Fall Time, tR, tF 200 600 ns R
, t
250 620 ns R
PLH
PHL
= 54 Ω, CL1 = CL2 = 100 pF, see Figure 5 and Figure 9
LDIFF
= 54 Ω, CL1 = CL2 = 100 pF, see Figure 5 and Figure 9
LDIFF
= 54 Ω, CL1 = CL2 = 100 pF, see Figure 5 and Figure 9
LDIFF
Enable Time 1050 ns RL = 500 Ω, CL = 100 pF, see Figure 6 and Figure 11
Disable Time 1050 ns RL = 500 Ω, CL = 15 pF, see Figure 6 and Figure 11
Propagation Delay, t
Differential Skew, t
, t
400 1050 ns CL = 15 pF, see Figure 7 and Figure 10
PLH
PHL
250 ns CL = 15 pF, see Figure 7 and Figure 10
SKEW
Enable Time 25 70 ns RL = 1 kΩ, CL = 15 pF, see Figure 8 and Figure 12
Disable Time 40 70 ns RL = 1 kΩ, CL = 15 pF, see Figure 8 and Figure 12
Enable Time 1 2 µs
Disable Time 3 5 µs
Rev. B | Page 4 of 20
ADM2483
www.BDTIC.com/ADI
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted. All voltages are relative to
their respective ground.
Table 3.
ParameterRating
V
−0.5 V to +7 V
DD1
V
−0.5 V to +6 V
DD2
Digital Input Voltage (DE, RE, TxD)
Digital Output Voltage
RxD −0.5 V to V
Driver Output/Receiver Input Voltage −9 V to +14 V
ESD Rating: Contact (Human Body
Model) (A, B Pins)
Operating Temperature Range −40°C to +85°C
Storage Temperature Range −55°C to +150°C
Average Output Current per Pin −35 mA to +35 mA
θJA Thermal Impedance 73°C/W
Lead Temperature
Soldering (10 sec) 260°C
Vapor Phase (60 sec) 215°C
Infrared (15 sec) 220°C
−0.5 V to V
±2 kV
DD1
DD1
+ 0.5 V
+ 0.5 V
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
Rev. B | Page 5 of 20
ADM2483
www.BDTIC.com/ADI
PACKAGE CHARACTERISTICS
Table 4.
Parameter Symbol Min Typ Max Unit Test Conditions
Resistance (Input-Output)1 R
Capacitance (Input-Output)1 C
Input Capacitance2 C
Input IC Junction-to-Case Thermal Resistance θ
Output IC Junction-to-Case Thermal Resistance θ
1
Device considered a 2-terminal device: Pins 1, 2, 3, 4, 5, 6, 7, and 8 shorted together, and Pins 9, 10, 11, 12, 13, 14, 15, and 16 shorted together.
2
Input capacitance is from any input data pin to ground.
REGULATORY INFORMATION
The ADM2483 has been approved by the following organizations:
Table 5.
UL1 CSA VDE2
Recognized under 1577 component
recognition program
File E214100 File 205078 File 2471900-4880-0001
1
In accordance with UL1577, each ADM2483 is proof tested by applying an insulation test voltage ≥3000 V rms for 1 sec (current leakage detection limit = 5 µA).
2
In accordance with VDE 0884, each ADM2483 is proof tested by applying an insulation test voltage ≥1050 V
1012 Ω
I-O
3 pF f = 1 MHz
I-O
4 pF
I
33 °C/W
JCI
Thermocouple located at center of package
underside
28 °C/W
JCO
Thermocouple located at center of package
underside
Approved under CSA Component
Acceptance Notice #5A
for 1 sec (partial discharge detection limit = 5 pC).
PEAK
Certified according to DIN EN 60747-5-2
(VDE 0884 Part 2): 2003-01
Complies with DIN EN 60747-5-2
(VDE 0884 Part 2): 2003-01,
DIN EN 60950 (VDE 0805): 2001-12;
EN 60950:2000
INSULATION AND SAFETY-RELATED SPECIFICATIONS
Table 6.
Parameter Symbol Value Unit Conditions
Rated Dielectric Insulation Voltage 2500 V rms 1-minute duration
Minimum External Air Gap (Clearance) L(I01) 7.45 min mm
Minimum External Tracking (Creepage) L(I02) 8.1 min mm
Minimum Internal Gap (Internal Clearance) 0.017 min mm Insulation distance through insulation
Tracking Resistance (Comparative Tracking Index) CTI >175 V DIN IEC 112/VDE 0303 Part 1
Isolation Group IIIa Material Group (Table 1 in DIN VDE 0110,1/89)
Measured from input terminals to output
terminals, shortest distance through air
Measured from input terminals to output
terminals, shortest distance along body
Rev. B | Page 6 of 20
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