RS-485 transceiver with electrical data isolation
Complies with ANSI TIA/EIA-485-A and ISO 8482: 1987(E)
500 kbps data rate
Slew rate-limited driver outputs
Low power operation: 2.5 mA maximum
Suitable for 5 V or 3.3 V operations (V
High common-mode transient immunity: >25 kV/μs
True fail-safe receiver inputs
Chatter-free power-up/power-down protection
256 nodes on bus
Thermal shutdown protection
Safety and regulatory approvals
UL recognition: 2500 V rms for 1 minute per
UL 1577
VDE certificates of conformity
DIN V VDE V 0884-10 (VDE V 0884-10): 2006-12
V
= 560 V peak
IORM
Operating temperature range: −40°C to +85°C
DD1
)
Half-Duplex, iCoupler
FUNCTIONAL BLOCK DIAGRAM
Figure 1.
APPLICATIONS
Low power RS-485/RS-422 networks
Isolated interfaces
Building control networks
Multipoint data transmission systems
GENERAL DESCRIPTION
The ADM2481 differential bus transceiver is an integrated,
galvanically isolated component designed for bidirectional data
communication on balanced, multipoint bus transmission lines.
It complies with ANSI EIA/TIA-485-A and ISO 8482: 1987(E).
Using iCoupler® technology from Analog Devices, Inc., the
ADM2481 combines a 3-channel isolator, a three-state differential line driver, and a differential input receiver into a single
package. The logic side of the device is powered with either a
5 V or 3 V supply, and the bus side uses a 5 V supply only.
The ADM2481 is slew-limited to reduce reflections with improperly terminated transmission lines. The controlled slew rate
limits the data rate to 500 kbps. The input impedance of the
device is 96 kΩ, allowing up to 256 transceivers on the bus. Its
driver has an active-high enable feature. The driver differential
outputs and receiver differential inputs are connected internally
to form a differential I/O port. When the driver is disabled or
when V
DD1
or V
= 0 V, this imposes minimal loading on
DD2
the bus. An active-high receiver disable feature, which causes
the receiver output to enter a high impedance state, is provided
as well.
The receiver inputs have a true fail-safe feature that ensures a
logic-high receiver output level when the inputs are open or
shorted. This guarantees that the receiver outputs are in a
known state before communication begins and at the point
when communication ends.
Current limiting and thermal shutdown features protect against
output short circuits and bus contention situations that might
cause excessive power dissipation. The part is fully specified
over the industrial temperature range of −40°C to +85°C and is
available in a 16-lead, wide body SOIC package.
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license i s granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
ADM2481 Data Sheet
TABLE OF CONTENTS
Features .............................................................................................. 1
Changes to Ordering Guide .......................................................... 17
7/10—Revision 0: Initial Version
Rev. A | Page 2 of 20
Data Sheet ADM2481
SPECIFICATIONS
3.0 V ≤ V
Table 1.
Parameter Symbol Min Typ Max Unit Test Conditions/Comments
DRIVER
Differential Outputs
Logic Inputs
RECEIVER
Differential Inputs
RxD Logic Output
POWER SUPPLY CURRENT
Logic Side I
1.3 mA 3.0 V ≤ V
Bus Side I
1.7 mA Outputs unloaded, DE = 0 V
COMMON-MODE TRANSIENT IMMUNITY
1
Common-mode transient immunity is the maximum common-mode voltage slew rate that can be sustained while maintaining specification-compliant operation.
is the common-mode potential difference between the logic and bus sides. The transient magnitude is the range over which the common mode is slewed. The
V
CM
common-mode voltage slew rates apply to both rising and falling common-mode voltage edges.
≤ 5.5 V, 4.75 V ≤ V
DD1
≤ 5.25 V, TA = T
DD2
MIN
to T
, unless otherwise noted.
MAX
Differential Output Voltage 5 V RL = ∞, see Figure 16
V
V
V
2.0 5 V RL = 50 Ω (RS-422), see Figure 16
OD
1.5 5 V RL = 27 Ω (RS-485), see Figure 16
OD
1.5 5 V V
OD3
= −7 V to +12 V, V
TEST
≥ 4.75,
DD1
see Figure 17
Δ |VOD| for Complementary Output States 0.2 V RL = 27 Ω or 50 Ω, see Figure 16
Common-Mode Output Voltage VOC 3 V RL = 27 Ω or 50 Ω, see Figure 16
Δ |VOC| for Complementary Output States 0.2 V RL = 27 Ω or 50 Ω, see Figure 16
Output Short-Circuit Current, ISC
V
= High −250 +250 mA −7 V ≤ V
OUT
V
= Low −250 +250 mA −7 V ≤ V
OUT
Input High Voltage VIH 0.7 V
Input Low Voltage VIL 0.25 V
−10 +0.01 +10 μA
CMOS Logic Input Current (TxD, DE, RE)
I
I
V
DD1
V
DD1
TxD, DE,
TxD, DE,
TxD, DE,
≤ +12 V
OUT
≤ +12 V
OUT
RE
RE
RE
= V
DD1
or 0 V
Differential Input Threshold Voltage VTH −200 −125 −30 mV −7 V ≤ VCM ≤ +12 V
Input Hysteresis V
20 mV −7 V ≤ VCM ≤ +12 V
HYS
Input Resistance (A, B) 96 150 kΩ −7 V ≤ VCM ≤ +12 V
Input Current (A, B)
Output High Voltage VOH V
V
Output Low Voltage VOL 0.1 V I
0.4 V I
Output Short-Circuit Current ISC 7 85 mA V
Three-State Output Leakage Current ±1 μA 0.4 V ≤ V
0.125 mA VIN = 12 V
−0.1 mA VIN = −7 V
− 0.1 V I
DD1
− 0.4 V
DD1
1
2.5 mA 4.5 V ≤ V
DD1
2.0 mA Outputs unloaded, DE = 5 V
DD2
VCM 25 kV/μs TxD = V
− 0.2 V I
DD1
= 20 μA, VA − VB = 0.2 V
OUT
= 4 mA, VA − VB = 0.2 V
OUT
= −20 μA, VA − VB = −0.2 V
OUT
= −4 mA, VA − VB = −0.2 V
OUT
= GND or VCC
OUT
≤ 2.4 V
OUT
≤ 5.5 V, outputs
DD1
RE
unloaded,
unloaded,
= 0 V
≤ 3.6 V, outputs
DD1
RE
= 0 V
or 0 V, VCM = 1 kV,
DD1
transient magnitude = 800 V
Rev. A | Page 3 of 20
ADM2481 Data Sheet
Propagation Delay
t
, t
400 1050
ns
CL = 15 pF, see Figure 20 and Figure 23
Parameter
Symbol
Value
Unit
Conditions
Rated Dielectric Insulation Voltage
2500
V rms
1-minute duration
TIMING SPECIFICATIONS
3.0 V ≤ V
Table 2.
Parameter Symbol Min Typ Max Unit Test Conditions/Comments
DRIVER
Maximum Data Rate 500 kbps
Propagation Delay t
Skew t
Rise/Fall Time tR, tF 200 600 ns RL = 54 Ω, CL1 = CL2 = 100 pF, see Figure 18 and Figure 22
Enable Time 1050 ns RL = 500 Ω, CL = 100 pF, see Figure 19 and Figure 24
Disable Time 1050 ns RL = 500 Ω, CL = 15 pF, see Figure 19 and Figure 24
RECEIVER
Differential Skew t
Enable Time 25 70 ns RL = 1 kΩ, CL = 15 pF, see Figure 21 and Figure 25
Disable Time 40 70 ns RL = 1 kΩ, CL = 15 pF, see Figure 21 and Figure 25
PACKAGE CHARACTERISTICS
Table 3.
Parameter Symbol Min Typ Max Unit Test Conditions
Resistance (Input-Output)1 R
Capacitance (Input-Output)1 C
Input Capacitance2 CI 4 pF
1
Device is considered a 2-terminal device: Pin 1 to Pin 8 are shorted together, and Pin 9 to Pin16 are shorted together.
2
Input capacitance is from any input data pin to ground.
≤ 5.5 V, 4.75 V ≤ V
DD1
≤ 5.25 V, TA = T
DD2
, t
250 620 ns RL = 54 Ω, CL1 = CL2 = 100 pF, see Figure 18 and Figure 22
PLH
PHL
40 ns RL = 54 Ω, CL1 = CL2 = 100 pF, see Figure 18 and Figure 22
SKEW
PLH
PHL
250 ns CL = 15 pF, see Figure 20 and Figure 23
SKEW
1012 Ω
I-O
3 pF f = 1 MHz
I-O
MIN
to T
, unless otherwise noted.
MAX
REGULATORY INFORMATION
Table 4. ADM2481 Approvals
Organization Approval Type Notes
UL Recognized under the Component Recognition
Program of Underwriters Laboratories, Inc.
In accordance with UL 1577, each ADM2481 is proof tested by
applying an insulation test voltage of ≥ 3000 V rms for 1 second
(current leakage detection limit = 5 µA).
VDE Certified according to DIN V VDE V 0884-10
(VDE V 0884-10): 2006-12
In accordance with DIN V VDE V 0884-10, each ADM2481 is proof
tested by applying an insulation test voltage of ≥ 1050 V peak for
1 second (partial discharge detection limit = 5 pC).
INSULATION AND SAFETY-RELATED SPECIFICATIONS
Table 5.
Minimum External Air Gap (Clearance) L(I01) 7.7 mm Measured from input terminals to output
terminals, shortest distance through air
Minimum External Tracking (Creepage) L(I02) 7.6 mm Measured from input terminals to output
terminals, shortest distance along body
Minimum Internal Gap (Internal Clearance) 0.017 min mm Insulation distance through insulation
Tracking Resistance (Comparative Tracking Index) CTI >175 V DIN IEC 112/VDE 0303 Part 1
Isolation Group IIIa Material Group (Table 1 in DIN VDE 0110,1/89)
Rev. A | Page 4 of 20
Data Sheet ADM2481
Input-to-Output Test Voltage, Method a
VDE 0884 INSULATION CHARACTERISTICS
This isolator is suitable for basic electrical isolation only within this safety limit data. Maintenance of this safety data shall be ensured by
means of protective circuits.
Table 6.
Description Symbol Characteristic Unit
Installation Classification per DIN VDE 0110 for Rated Mains Voltage
≤150 V rms I to IV
≤300 V rms I to III
≤400 V rms I to II
Climatic Classification 40/85/21
Pollution Degree (Table 1 in DIN VDE 0110) 2
Maximum Working Insulation Voltage V
Input to Output Test Voltage, Method b1 VPR 1050 V
V
× 1.875 = VPR, 100% Production Tested
IORM
tm = 1 sec, Partial Discharge of < 5 pC
(After Environmental Tests, Subgroup 1)
V
× 1.6 = VPR, tm = 60 sec, Partial Discharge of < 5 pC 896 V
IORM
(After Input and/or Safety Test, Subgroup 2/3)
V
× 1.2 = VPR, tm = 60 sec, Partial Discharge of < 5 pC VPR 672 V
IORM
Highest Allowable Overvoltage
(Transient Overvoltage, tTR = 10 sec) VTR 4000 V
Safety-Limiting Values (Maximum Value Allowed in the Event of a Failure; see Figure 13)
Case Temperature TS 150 °C
Input Current I
Output Current I
Insulation Resistance at TS, VIO = 500 V RS >109 Ω
560 V
IORM
265 mA
S, INPUT
335 mA
S, OUTPUT
PEAK
PEAK
PEAK
PEAK
PEAK
Rev. A | Page 5 of 20
ADM2481 Data Sheet
V
−0.5 V to +7 V
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted. All voltages are relative to
their respective ground.
Table 7.
ParameterRating
DD1
V
−0.5 V to +6 V
DD2
Digital Input Voltage (DE, RE, TxD) −0.5 V to V
Digital Output Voltage (RxD) −0.5 V to V
Driver Output/Receiver Input Voltage −9 V to +14 V
ESD Rating: Contact (Human Body
Model) (A, B Pins)
Operating Temperature Range −40°C to +85°C
Storage Temperature Range −55°C to +150°C
Average Output Current per Pin −35 mA to +35 mA
θJA Thermal Impedance 65°C/W
Lead Temperature
Soldering (10 sec) 260°C
Vapor Phase (60 sec) 215°C
Infrared (15 sec) 220°C
±2 kV
DD1
DD1
+ 0.5 V
+ 0.5 V
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
Rev. A | Page 6 of 20
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