Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Anal og Devices. Trademarks and
registered trademarks are the property of their respective owners.
Parameter Min Typ Max Test Conditions/Comments Unit
POWER SUPPLY
Supply Voltage, 3.3 V STBY, 3.3 V MAIN 3.0 3.3 5.5 V
Supply Current, I
2.5 4.0 Interface inactive, ADC active mA
CC
TEMPERATURE-TO-DIGITAL CONVERTER
Internal Sensor Accuracy ±3 °C
Resolution ±1 °C
External Diode Sensor Accuracy ±3 0°C < TD < 100°C °C
Resolution ±1 °C
Remote Sensor Source Current 90 High level µA
5.5 Low level µA
ANALOG-TO-DIGITAL CONVERTER (including MUX and attenuators)
Total Unadjusted Error (TUE)4 ±2 %
Differential Nonlinearity (DNL) ±1 LSB
Power Supply Sensitivity ±0.1 %/V
Conversion Time (Analog Input or Internal Temperature)5 11.38 12.06 ms
Conversion Time (External Temperature)5 34.13 36.18 ms
Input Resistance (+5 VIN, V
CCP
, A
− A
IN0
) 80 100 120 kΩ
IN5
Input Resistance of +12 VIN pin 70 100 115 kΩ
Input Resistance of −12 VIN pin 8 10 12 kΩ
Input Resistance (A
Input Resistance of V
V
Current Drain (when measured) 80 100 CR2032 battery life >10 years nA
BAT
V
Current Drain (when not measured) 6 nA
BAT
− A
) 5 MΩ
IN6
IN9
pin4 80 100 120 kΩ
BAT
ANALOG OUTPUT (DAC)
Output Voltage Range 0–2.5 V
Total Unadjusted Error (TUE) ±5 IL = 2 mA %
Zero Error 1 No load LSB
Differential Nonlinearity (DNL) ±1 Monotonic by design LSB
Integral Nonlinearity ±0.5 LSB
Output Source Current 2 mA
Output Sink Current 1 mA
REFERENCE OUTPUT
Output Voltage 1.8 1.82 1.84 Bit 2 of Register 07h = 0 V
Output Voltage 2.47 2.50 2.53 Bit 2 of Register 07h = 1 V
Load Regulation (I
Load Regulation (I
= 2 mA) 0.15 %
SINK
= 2 mA) 0.15 %
SOURCE
Short Circuit Current 25 VCC = 3.3 V mA
Output Current Source 2 mA
Output Current Sink 2 mA
FAN RPM-TO-DIGITAL CONVERTER6
Accuracy ±12 %
Full-Scale Count 255
FAN0 to FAN7 Nominal Input RPM5 8800 Divisor = 1, fan count = 153 RPM
4400 Divisor = 2, fan count = 153 RPM
2200 Divisor = 4, fan count = 153 RPM
1100 Divisor = 8, fan count = 153 RPM
Internal Clock Frequency 20 22.5 25 kHz
OPEN DRAIN O/Ps, PWM, GPIO0 to 16
Output High Voltage, VOH 2.4 I
= 3.0 mA, VCC = 3.3 V V
OUT
Rev. A | Page 3 of 56
ADM1026
Parameter Min Typ Max Test Conditions/Comments Unit
High Level Output Leakage Current, IOH 0.1 1 V
Output Low Voltage, VOL 0.4 I
PWM Output Frequency 75 Hz
DIGITAL OUTPUTS (INT, RESETMAIN, RESETBY)
Output Low Voltage, VOL 0.4 I
RESET Pulse Width
140 180 240 ms
OPEN DRAIN SERIAL DATABUS OUTPUT (SDA)
Output Low Voltage, VOL 0.4 I
High Level Output Leakage Current, IOH 0.1 1 V
SERIAL BUS DIGITAL INPUTS (SCL, SDA)
Input High Voltage, VIH 2.2 V
Input Low Voltage, VIL 0.8 V
Hysteresis 500 mV
DIGITAL INPUT LOGIC LEVELS (ADD, CI, FAN 0 to 7, GPIO 0 to 16)7, 8
Input High Voltage, VIH 2.4 VCC = 3.3 V V
Input Low Voltage, VIL 0.8 VCC = 3.3 V V
Hysteresis (Fan 0 to 7) 250 VCC = 3.3 V mV
RESETMAIN, RESETSTBY
RESETMAIN Threshold
RESETSBY Threshold
RESETMAIN Hysteresis
RESETSTBY Hysteresis
2.89 2.94 2.97 Falling voltage V
3.01 3.05 3.10 Falling voltage V
60 mV
70 mV
DIGITAL INPUT CURRENT
Input High Current, IIH –1 VIN = VCC µA
Input Low Current, IIL 1 V
Input Capacitance, CIN 20 pF
EEPROM RELIABILITY
Endurance9 100 700 kcycles
Data Retention10 10 Years
SERIAL BUS TIMING See Figure 2 for all parameters.
Clock Frequency, f
400 kHz
SCLK
Glitch Immunity, tSW 50 ns
Bus Free Time, t
Start Setup Time, t
Start Hold Time, t
SCL Low Time, t
SCL High Time, t
4.7 µs
BUF
4.7 µs
SU; STA
4 µs
HD; STA
4.7 µs
LOW
4 µs
HIGH
SCL, SDA Rise Time, tr 1000 ns
SCL, SDA Fall Time, tf 300 ns
Data Setup Time, t
Data Hold Time, t
250 ns
SU; DAT
300 ns
HD; DAT
1
All voltages are measured with respect to GND, unless otherwise specified.
2
Typicals are at TA = 25°C and represent the most likely parametric norm. Shutdown current typ is measured with VCC = 3.3 V.
3
Timing specifications are tested at logic levels of VIL = 0.8 V for a falling edge and VIH = 2.1 V for a rising edge.
4
Total unadjusted error (TUE) includes offset, gain, and linearity errors of the ADC, multiplexer, and on-chip input attenuators. V
greater than 1.5 V (see Figure 15).
5
Total analog monitoring cycle time is nominally 273 ms, made up of 18 ms × 11.38 ms measurements on analog input and internal temperature channels, and
2 ms × 34.13 ms measurements on external temperature channels.
6
The total fan count is based on two pulses per revolution of the fan tachometer output. The total fan monitoring time depends on the number of fans connected and
the fan speed. See the Fan Speed Measurement section for more details.
7
ADD is a three-state input that may be pulled high, low, or left open-circuit.
8
Logic inputs accept input high voltages up to 5 V even when device is operating at supply voltages below 5 V.
9
Endurance is qualified to 100,000 cycles as per JEDEC Std. 22 method A117, and measured at −40°C, +25°C, and +85°C. Typical endurance at +25°C is 700,000 cycles.
10
Retention lifetime equivalent at junction temperature (TJ ) = 55°C as per JEDEC Std. 22 method A117. Retention lifetime based on an activation energy of 0.6 V
derates with junction temperature as shown in Figure 16.
= VCC µA
OUT
= −3.0 mA, VCC = 3.3 V V
OUT
= −3.0 mA, VCC = 3.3 V V
OUT
= –3.0 mA, VCC = 3.3 V V
OUT
= VCC µA
OUT
= 0 µA
IN
is accurate only for V
BAT
voltages
BAT
Rev. A | Page 4 of 56
ADM1026
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
Positive Supply Voltage (VCC) 6.5 V
Voltage on +12 V VIN Pin +20 V
Voltage on −12 V VIN Pin −20 V
Voltage on Analog Pins −0.3 V to (VCC + 0.3 V)
Voltage on Open Drain Digital Pins −0.3 V to +6.5 V
Input Current at any Pin ±5 mA
Package Input Current ±20 mA
Maximum Junction Temperature (T
) 150°C
J MAX
Storage Temperature Range −65°C to +150°C
Lead Temperature, Soldering
Vapor Phase (60 sec) 215°C
Infrared (15 sec) 200°C
ESD Rating, −12 VIN Pin 1000 V
ESD Rating, All Other Pins 2000 V
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL CHARACTERISTICS
• 48-Lead LQFP package
• θ
= 50°C/W, θJC = 10°C/W
JA
t
F
t
HIGH
Figure 2. Serial Bus Timing Diagram
t
SU; DAT
S
t
SU; STA
t
HD; STA
SCL
SDA
t
BUF
PS
t
LOW
t
HD; STA
t
R
t
HD; DAT
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
t
SU; STO
P
02657-A-002
Rev. A | Page 5 of 56
ADM1026
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
(0V – 3V)
(0V – 3V)
(0V – 3V)
(0V – 3V)
GPIO10
GPIO11
GPIO12
GPIO13
4847464544434241403938
GPIO14
GPIO15
A
GPIO16/THERM
IN0
(0V – 3V)
IN1
IN2
IN3
A
A
A
A
37
IN4
GPIO9
GPIO8
FAN0/GPIO0
FAN1/GPIO1
FAN2/GPIO2
FAN3/GPIO3
3.3V MAIN
DGND
FAN4/GPIO4
FAN5/GPIO5
FAN6/GPIO6
FAN7/GPIO7
1
PIN 1 IDENTIFIER
2
3
4
5
6
7
8
9
10
11
12
1314151617181920212223
SCL
SDA
ADM1026
TOP VIEW
(Not to Scale)
CI
ADD/NTESTOUT
INT
PWM
RESETSTBY
DAC
AGND
3.3V STBY
RESETMAIN
24
REF
V
A
36
IN5
A
35
IN6
A
34
IN7
+V
33
CCP
+12 V
32
–12 V
31
+5 V
30
V
BAT
29
D2+/A
28
D2–/A
27
D1+
26
D1–/NTESTIN
25
(0V – 3V)
(0V – 2.5V)
(0V – 2.5V)
IN
IN
IN
(0V – 2.5V)
IN8
(0V – 2.5V)
IN9
02657-A-003
Figure 3. Pin Configuration
Table 3.
Pin No. Mnemonic Type Description
1 GPIO9 Digital I/O1 General-purpose I/O pin that can be configured as digital inputs or outputs.
2 GPIO8 Digital I/O1 General-purpose I/O pin that can be configured as digital inputs or outputs.
3 FAN0/GPIO0 Digital I/O
Fan tachometer input with internal 10 kΩ pull-up resistor to 3.3 V STBY. Can be
reconfigured as a general-purpose, open drain, digital I/O pin.
4 FAN1/GPIO1 Digital I/O
Fan tachometer input with internal 10 kΩ pull-up resistor to 3.3 V STBY. Can be
reconfigured as a general-purpose, open drain, digital I/O pin.
5 FAN2/GPIO2 Digital I/O
Fan tachometer input with internal 10 kΩ pull-up resistor to 3.3 V STBY. Can be
reconfigured as a general-purpose, open drain, digital I/O pin.
6 FAN3/GPIO3 Digital I/O
Fan tachometer input with internal 10 kΩ pull-up resistor to 3.3 V STBY. Can be
reconfigured as a general-purpose, open drain, digital I/O pin.
7 3.3 V MAIN Analog Input Monitors the main 3.3 V system supply. Does not power the device.
8 DGND Ground Ground pin for digital circuits.
9 FAN4/GPIO4 Digital I/O
Fan tachometer input with internal 10 kΩ pull-up resistor to 3.3 V STBY. Can be
reconfigured as a general-purpose, open drain, digital I/O pin.
10 FAN5/GPIO5 Digital I/O
Fan tachometer input with internal 10 kΩ pull-up resistor to 3.3 V STBY. Can be
reconfigured as a general-purpose, open drain, digital I/O pin.
11 FAN6/GPIO6 Digital I/O
Fan tachometer input with internal 10 kΩ pull-up resistor to 3.3 V STBY. Can be
reconfigured as a general-purpose, open drain, digital I/O pin.
12 FAN7/GPIO7 Digital I/O
Fan tachometer input with internal 10 kΩ pull-up resistor to 3.3 V STBY. Can be
reconfigured as a general-purpose, open drain, digital I/O pin.
13 SCL Digital Input Open Drain Serial Bus Clock. Requires a 2.2 kΩ pull-up resistor.
14 SDA Digital I/O Serial Bus Data. Open drain I/O. Requires a 2.2 kΩ pull-up resistor.
15 ADD/NTESTOUT Digital Input
This is a three-state input that controls the two LSBs of the serial bus address. It also
functions as the output for NAND tree testing.
16 CI Digital Input
An active high input that captures a chassis intrusion event in Bit 6 of Status Register 4.
This bit remains set until cleared, as long as battery voltage is applied to the V
even when the ADM1026 is powered off.
17
INT
Digital Output
Interrupt Request (Open Drain). The output is enabled when Bit 1 of the configuration
register is set to 1. The default state is disabled. It has an on-chip 100 kΩ pull-up resistor.
BAT
input,
Rev. A | Page 6 of 56
ADM1026
Pin No. Mnemonic Type Description
18 PWM Digital Output
19
20
RESETSTBY
RESETMAIN
Digital Output
Digital I/O
21 AGND Ground Ground pin for analog circuits.
22 3.3 V STBY Power Supply Supplies 3.3 V power. Also monitors the 3.3 V standby power rail.
23 DAC Analog Output 0 V to 2.5 V output for analog control of the fan speed.
24 V
Analog Output Reference Voltage Output. Can be selected as 1.8 V (default) or 2.5 V.
REF
25 D1–/NTESTIN Analog Input
26 D1+ Analog Input Connected to the anode of the first remote temperature sensing diode.
27 D2–/A
28 D2+/A
29 V
Programmable
IN9
Programmable
IN8
Analog Input Monitors battery voltage, nominally +3 V.
BAT
30 +5 VIN Analog Input Monitors the +5 V supply.
31
−12 V
IN
Analog Input
32 +12 VIN Analog Input Monitors the +12 V supply.
33 +V
34 A
35 A
36 A
37 A
38 A
39 A
40 A
41 A
42
Analog Input Monitors the processor core voltage (0 V to 3.0 V).
CCP
Analog Input General-purpose 0 V to 2.5 V analog inputs.
IN7
Analog Input General-purpose 0 V to 2.5 V analog inputs.
IN6
Analog Input General-purpose 0 V to 3 V analog inputs.
IN5
Analog Input General-purpose 0 V to 3 V analog inputs.
IN4
Analog Input General-purpose 0 V to 3 V analog inputs.
IN3
Analog Input General-purpose 0 V to 3 V analog inputs.
IN2
Analog Input General-purpose 0 V to 3 V analog inputs.
IN1
Analog Input General-purpose 0 V to 3 V analog inputs.
IN0
GPIO16/THERM
Digital I/O
1
43 GPIO15 Digital I/O1 General-purpose I/O pin that can be configured as a digital input or output.
44 GPIO14 Digital I/O1 General-purpose I/O pin that can be configured as a digital input or output.
45 GPIO13 Digital I/O1 General-purpose I/O pin that can be configured as a digital input or output.
46 GPIO12 Digital I/O1 General-purpose I/O pin that can be configured as a digital input or output.
47 GPIO11 Digital I/O1 General-purpose I/O pin that can be configured as a digital input or output.
48 GPIO10 Digital I/O1 General-purpose I/O pin that can be configured as a digital input or output.
Open drain pulse width modulated output for control of the fan speed. This pin defaults
to high for the 100% duty cycle for use with NMOS drive circuitry. If a PMOS device is used
to drive the fan, the PWM output may be inverted by setting Bit 1 of Test Register 1 = 1.
Power-On Reset. 5 mA driver (weak 100 kΩ pull-up), active low output (100 kΩ pull-up)
with a 180 ms typical pulse width. RESETSTBY
is asserted whenever 3.3 V STBY is below
the reset threshold. It remains asserted for approximately 180 ms after 3.3 V STBY rises
above the reset threshold.
Power-On Reset. 5 mA driver (weak 100 kΩ pull-up), active low output (100 kΩ pull-up)
with a 180 ms typical pulse width. RESETMAIN
is asserted whenever 3.3 V MAIN is below
the reset threshold. It remains asserted for approximately 180 ms after 3.3 V MAIN rises
above the reset threshold. If, however, 3.3 V STBY rises with or before 3.3 V MAIN, then
RESETMAIN
remains asserted for 180 ms after RESETSTBY is deasserted. Pin 20 also
functions as an active low RESET input.
Connected to a cathode of the first remote temperature sensing diode. If it is held high at
power-on, it activates the NAND tree test mode.
Connected to the cathode of the second remote temperature sensing diode, or the
analog input may be reconfigured as a 0 V− 2.5 V analog input.
Connected to the anode of the second remote temperature sensing diode, or the analog
input may be reconfigured as a 0 V − 2.5 V analog input.
Monitors the −12 V supply.
General-purpose I/O pin that can be configured as a digital input or output. Can also be
configured as a bidirectional THERM
pin (100 kΩ pull-up).
1
GPIO pins are open drain and require external pull-up resistors. Fan inputs have integrated 10 kΩ pull-ups, but these pins become open drain when reconfigured as
GPIOs.
Rev. A | Page 7 of 56
ADM1026
TYPICAL PERFORMANCE CHARACTERISTICS
25
20
15
10
D+ TO GND
5
0
–5
D+ TO V
–10
TEMPERATURE ERROR (°C)
–15
–20
–25
CC
30601200
LEAKAGE RESISTANCE (MΩ)
90
02657-A-004
110
100
90
80
70
60
50
READING (°C)
40
30
20
10
0
010 20 3040 5060 70 8090 100 110
PIII TEMPERATURE (°C)
02657-A-007
Figure 4. Temperature Error vs. PCB Track Resistance
14
12
10
8
250mV
6
4
TEMPERATURE ERROR (°C)
100mV
2
0
100200300400500
0
FREQUENCY (MHz)
Figure 5. Temperature Error vs. Power Supply Noise Frequency
12
10
8
100mV
60mV
40mV
600
Figure 7. Pentium® III Temperature vs. ADM1026 Reading
5
0
–5
–10
–15
TEMPERATURE ERROR (°C)
–20
–25
02657-A-005
01020304050
CAPACITANCE (nF)
02657-A-008
Figure 8. Temperature Error vs. Capacitance Between D+ and D–
80
70
60
50
6
4
TEMPERATURE ERROR (°C)
2
0
100
0200300400500600
FREQUENCY (MHz)
Figure 6. Temperature Error vs. Common-Mode Noise Frequency
02657-A-006
Rev. A | Page 8 of 56
40
30
20
TEMPERATURE ERROR (°C)
10
0
100
100mV
60mV
40mV
200300400500
FREQUENCY (MHz)
600
Figure 9. Temperature Error vs. Differential-Mode Noise Frequency
The ADM1026 is a complete system hardware monitor for
microprocessor-based systems, providing measurement and
limit comparison of various system parameters. The ADM1026
has up to 19 analog measurement channels. Fifteen analog
voltage inputs are provided, five of which are dedicated to
monitoring +3.3 V, +5 V, and ±12 V power supplies, and the
processor core voltage. The ADM1026 can monitor two other
power supply voltages by measuring its own V
system supply. One input (two pins) is dedicated to a remote
temperature-sensing diode. Two additional pins can be
configured as general-purpose analog inputs to measure
0 V to 2.5 V, or as a second temperature sensing input. The eight
remaining inputs are general-purpose analog inputs with a
range of 0 V to 2.5 V or 0 V to 3 V. The ADM1026 also has an
on-chip temperature sensor.
The ADM1026 has eight pins that can be configured for fan
speed measurement or as general-purpose logic I/O pins.
Another eight pins are dedicated to general-purpose logic I/O.
An additional pin can be configured as a general-purpose I/O
or as the bidirectional
Measured values can be read out via a 2-wire serial system
management bus, and values for limit comparisons can be
programmed over the same serial bus. The high speed,
successive approximation ADC allows frequent sampling of all
analog channels to ensure a fast interrupt response to any outof-limit measurement.
THERM
pin.
FUNCTIONAL DESCRIPTION
The ADM1026 is a complete system hardware monitor for
microprocessor-based systems. The device communicates with
the system via a serial system management bus. The serial bus
controller has a hardwired address line for device selection
(ADD, Pin 15), a s erial data line for reading and writing
addresses and data (SDA, Pin 14), and an input line for the
serial clock (SCL, Pin 13). All control and programming
functions of the ADM1026 are performed over the serial bus.
Measurement Inputs
Programmability of the analog and digital measurement inputs
makes the ADM1026 extremely flexible and versatile. The
device has an 8-bit A/D converter, and 17 analog measurement
input pins that can be configured in different ways.
Pins 25 and 26 are dedicated temperature inputs and may be
connected to the cathode and anode of a remote temperaturesensing diode.
and the main
CC
Pins 29 to 33 are dedicated analog inputs with on-chip
attenuators configured to monitor V
and the processor core voltage V
Pins 34 to 41 are general-purpose analog inputs with a range
of 0 V to 2.5 V or 0 V to 3 V. These are mainly intended for
monitoring SCSI termination voltages, but may be used for
other purposes.
The ADC also accepts input from an on-chip band gap
temperature sensor that monitors system ambient temperature.
In addition, the ADM1026 monitors the supply from which it is
powered, 3.3 V STBY, so there is no need for a separate pin to
monitor the power supply voltage.
The ADM1026 has eight pins that are general-purpose logic
I/O pins (Pins 1, 2, and 43 to 48), a pin that can be configured
as GPIO or as a bidirectional thermal interrupt (
(Pin 42), and eight pins that can be configured for fan speed
measurement or as general-purpose logic pins (Pins 3 to 6 and
Pins 9 to 12).
, +5 V, −12 V, +12 V,
BAT
, respectively.
CCP
THERM
) pin
Sequential Measurement
When the ADM1026 monitoring sequence is started, it cycles
sequentially through the measurement of analog inputs and the
temperature sensor, while at the same time the fan speed inputs
are independently monitored. Measured values from these
inputs are stored in value registers. These can be read over the
serial bus, or can be compared with programmed limits stored
in the limit registers. The results of out-of-limit comparisons are
stored in the interrupt status registers. An out-of-limit event
generates an interrupt on the
Any or all of the interrupt status bits can be masked by
appropriate programming of the interrupt mask registers.
line (Pin 17).
INT
Chassis Intrusion
A chassis intrusion input (Pin 16) is provided to detect
unauthorized tampering with the equipment. This event is
latched in a battery-backed register bit.
Resets
The ADM1026 has two power-on reset outputs,
and
RESETSTBY
STBY fall below the reset threshold. These give a 180 ms reset
pulse at power-up.
RESET input.
, that are asserted when 3.3 V MAIN or 3.3 V
RESETMAIN
also functions as an active-low
RESETMAIN
Pins 27 and 28 may be configured as temperature inputs and
connected to a second temperature-sensing diode, or may be
reconfigured as analog inputs with a range of 0 V to 2.5 V.
Rev. A | Page 10 of 56
ADM1026
Fan Speed Control Outputs
The ADM1026 has two outputs intended to control fan speed,
though they can also be used for other purposes. Pin 18 is an
open drain, pulse width modulated (PWM) output with a
programmable duty cycle and an output frequency of 75 Hz.
Pin 23 is connected to the output of an on-chip, 8-bit, digital-toanalog converter with an output range of 0 V to 2.5 V.
Either or both of these outputs may be used to implement a
temperature-controlled fan by controlling the speed of a fan
using the temperature measured by the on-chip temperature
sensor or remote temperature sensors.
INTERNAL REGISTERS
Table 4 describes the principal registers of the ADM1026. For
more detailed information, see Table 11 to Table 124.
Tabl e 4 . Prin c ip a l Re g ist e r s
Type Description
Address Pointer
Configuration
Registers
Fan Divisor
Registers
DAC/PWM
Control Registers
GPIO Configuration
Registers
Value and Limit
Registers
Status Registers
Mask Registers
Contains the address that selects one of
the other internal registers. When writing
to the ADM1026, the first byte of data is
always a register address, and is written
to the address pointer register.
Provide control and configuration for
various operating parameters.
Contain counter prescaler values for fan
speed measurement.
Contain speed values for PWM and DAC
fan drive outputs.
Configure the GPIO pins as input or
output and for signal polarity.
Store the results of analog voltage inputs,
temperature, and fan speed
measurements, along with their limit
values.
Store events from the various interrupt
sources.
Allow masking of individual interrupt
sources.
•Writing to the EEPROM should be restricted because its
typical cycle life is 100,000 write operations, due to the
usual EEPROM wear-out mechanisms.
The EEPROM in the ADM1026 has been qualified for two key
EEPROM memory characteristics: memory cycling endurance
and memory data retention.
Endurance qualifies the ability of the EEPROM to be cycled
through many program, read, and erase cycles. In real terms,
a single endurance cycle is composed of four independent,
sequential events, as follows:
1. Initial page erase sequence
2. Read/verify sequence
3. Program sequence
4. Second read/verify sequence
In reliability qualification, every byte is cycled from 00h to FFh
until a first fail is recorded, signifying the endurance limit of the
EEPROM memory.
Retention quantifies the ability of the memory to retain its
programmed data over time. The EEPROM in the ADM1026
has been qualified in accordance with the formal JEDEC
Retention Lifetime Specification (A117) at a specific junction
temperature (T
= 55°C) to guarantee a minimum of 10 years
J
retention time. As part of this qualification procedure, the
EEPROM memory is cycled to its specified endurance limit
described above before data retention is characterized. This
means that the EEPROM memory is guaranteed to retain its
data for its full specified retention lifetime every time the
EEPROM is reprogrammed. Note that retention lifetime based
on an activation energy of 0.6 V derates with T
, as shown in
J
Figure 16.
300
250
200
EEPROM
The ADM1026 has 8 kB of nonvolatile, electrically erasable,
programmable read-only memory (EEPROM) from register
Addresses 8000h to 9FFFh. This may be used for permanent
storage of data that is not lost when the ADM1026 is powered
down, unlike the data in the volatile registers. Although referred
to as read-only memory, the EEPROM can be written to (as well
as read from) via the serial bus in exactly the same way as the
other registers. The main differences between the EEPROM and
other registers are
•An EEPROM location must be blank before it can be
written to. If it contains data, it must first be erased.
•Writing to EEPROM is slower than writing to RAM.
Rev. A | Page 11 of 56
150
100
RETENTION (Years)
50
0
50
6070809010040
JUNCTION TEMPERATURE (°C)
Figure 16. Typical EEPROM Memory Retention
110
120
02657-A-016
ADM1026
Serial Bus Interface
Control of the ADM1026 is carried out via the serial system
management bus (SMBus). The ADM1026 is connected to this
bus as a slave device, under the control of a master device.
The ADM1026 has a 7-bit serial bus slave address. When the
device is powered on, it does so with a default serial bus address.
The 5 MSBs of the address are set to 01011, and the 2 LSBs are
determined by the logical states of Pin 15 ADD/NTESTOUT.
This pin is a three-state input that can be grounded, connected
, or left open-circuit to give three different addresses.
to V
CC
Table 5. Address Pin Truth Table
ADD Pin A1 A0
GND 0 0
No Connect 1 0
V
0 1
CC
If ADD is left open-circuit, the default address is 0101110
(5Ch). ADD is sampled only at power-up on the first valid
SMBus transaction, so any changes made while the power is on
(and the address is locked) have no effect.
The facility to make hardwired changes to device addresses
allows the user to avoid conflicts with other devices sharing the
same serial bus, for example if more than one ADM1026 is used
in a system.
General SMBus Timing
Figure 17 and Figure 18 show timing diagrams for general read
and write operations using the SMBus. The SMBus specification
defines specific conditions for different types of read and write
operations, which are discussed later in this section.
1
The general SMBus protocol
1. The master initiates data transfer by establishing a start
condition, defined as a high-to-low transition on the serial
data line (SDA) while the serial clock line SCL remains
high. This indicates that a data stream follows. All slave
peripherals connected to the serial bus respond to the start
condition and shift in the next 8 bits, consisting of a 7-bit
slave address (MSB first) and an R/
the direction of the data transfer, that is, whether data is
written to or read from the slave device
(0 = write, 1 = read).
operates as follows:
bit, which determine
W
The peripheral whose address corresponds to the transmitted address responds by pulling the data line low during
the low period before the ninth clock pulse, known as the
acknowledge bit, and holding it low during the high period
of this clock pulse. All other devices on the bus remain idle
while the selected device waits for data to be read from or
written to it. If the R/
slave device. If the R/
bit is 0, the master writes to the
W
bit is 1, the master reads from the
W
slave device.
2. Data is sent over the serial bus in sequences of nine clock
pulses, 8 bits of data followed by an acknowledge bit from
the slave device. Data transitions on the data line must
occur during the low period of the clock signal and remain stable during the high period, because a low-to-high
transition when the clock is high may be interpreted as
a stop signal.
If the operation is a write operation, the first data byte after
the slave address is a command byte. This tells the slave
device what to expect next. It may be an instruction telling
the slave device to expect a block write, or it may simply be
a register address that tells the slave where subsequent data
is to be written.
Because data can flow in only one direction as defined by
the R/
bit, it is not possible to send a command to a slave
W
device during a read operation. Before doing a read operation, it may first be necessary to do a write operation to
tell the slave what type of read operation to expect and/or
the address from which data is to be read.
3. When all data bytes have been read or written, stop
conditions are established. In write mode, the master pulls
the data line high during the 10th clock pulse to assert a
stop condition. In read mode, the master
device releases the SDA line during the low period before
the ninth clock pulse, but the slave device does not pull
it low (called No Acknowledge). The master takes the data
line low during the low period before the 10th clock pulse,
then high during the 10th clock pulse to assert a stop
condition.
1
If it is required to perform several read or write operations in succession, the
master can send a repeat start condition instead of a stop condition to begin
a new operation.
Rev. A | Page 12 of 56
ADM1026
191
SCL
9
SDA
START BY
MASTER
SCL
(CONTINUED)
SDA
(CONTINUED)
SCL
SDA
START BY
MASTER
SCL
(CONTINUED)
0
1011
FRAME 1
SLAVE ADDRESS
1
D7D6D5D4D3D2D1D0
FRAME 3
DATA BYTE
A0
A1
R/W
ACK. BY
SLAVE
D7
ACK. BY
SLAVE
D6
D4
D5
FRAME 2
COMMAND CODE
199
D7D6D5D4D3D2D1D0
D2
D3
D1
FRAME N
DATA BYTE
D0
ACK. BY
Figure 17. General SMBus Write Timing Diagram
191
0
10
1
1
1
FRAME 1
SLAVE ADDRESS
A0
A1
R/W
ACK. BY
SLAVE
D6
D7
D4
D5
FRAME 2
DATA BYTE
199
D2
D3
D1
D0
ACK. BY
MASTER
SLAVE
9
ACK. BY
SLAVE
STOP BY
MASTER
02657-A-017
SDA
(CONTINUED)
D7D6D5D4D3D2D1D0
FRAME 3
DATA BYTE
ACK. BY
MASTER
Figure 18. General SMBus Read Timing Diagram
SMBus PROTOCOLS FOR RAM AND EEPROM
The ADM1026 contains volatile registers (RAM) and nonvolatile EEPROM. RAM occupies Addresses 00h to 6Fh, while
EEPROM occupies Addresses 8000h to 9FFFh.
Data can be written to and read from both RAM and EEPROM
as single data bytes and as block (sequential) read or write
operations of 32 data bytes, the maximum block size allowed by
the SMBus specification.
Data can only be written to unprogrammed EEPROM locations.
To write new data to a programmed location, it is first necessary
to erase it. EEPROM erasure cannot be done at the byte level;
the EEPROM is arranged as 128 pages of 64 bytes, and an entire
page must be erased. Note that of these 128 pages, only 124
pages are available to the user. The last four pages are reserved
for manufacturing purposes and cannot be erased/rewritten.
The EEPROM has three RAM registers associated with it,
EEPROM Registers 1, 2, and 3 at Addresses 06h, 0Ch, and 13h.
D7D6D5D4D3D2D1D0
STOP BY
MASTER
02657-A-018
FRAME N
DATA BYTE
NO ACK.
EEPROM Registers 1 and 2 are for factory use only. EEPROM
Register 3 sets up the EEPROM operating mode. Setting Bit 0 of
EEPROM Register 3 puts the EEPROM into read mode. Setting
Bit 1 puts it into programming mode. Setting Bit 2 puts it into
erase mode.
Only one of these bits must be set before the EEPROM may be
accessed. Setting no bits or more than one of them causes the
device to respond with No Acknowledge if an EEPROM read,
program, or erase operation is attempted.
It is important to distinguish between SMBus write operations, such as sending an address or command, and EEPROM
programming operations. It is possible to write an EEPROM
address over the SMBus, whatever the state of EEPROM
Register 3. However, EEPROM Register 3 must be correctly set
before a subsequent EEPROM operation can be performed. For
example, when reading from the EEPROM, Bit 0 of EEPROM
Register 3 can be set, even though SMBus write operations are
required to set up the EEPROM address for reading.
Rev. A | Page 13 of 56
ADM1026
Bit 3 of EEPROM Register 3 is used for EEPROM write protection. Setting this bit prevents accidental programming or erasure of the EEPROM. If an EEPROM write or erase operation
is attempted when this bit is set, the ADM1026 responds with
No Acknowledge. This bit is write-once and can only be cleared
by a power-on reset.
EEPROM Register 3 Bit 7 is used for clock extend. Programming an EEPROM byte takes approximately 250 µs, which
would limit the SMBus clock for repeated or block write operations. Because EEPROM block read/write access is slow, it is
recommended that this clock extend bit typically be set to 1.
This allows the ADM1026 to pull SCL low and extend the
clock pulse when it cannot accept any more data.
ADM1026 SMBus Operations
The SMBus specification defines several protocols for different
types of read and write operations. The ones used in the
ADM1026 are discussed below. The following abbreviations are
used in the diagrams:
S Start
W Write
P Stop
A Acknowledge
R Read
A
No Acknowledge
ADM1026 Write Operations
Send Byte
In this operation, the master device sends a single command
byte to a slave device, as follows:
1. The master device asserts a start condition on the SDA.
2. The master sends the 7-bit slave address followed by the
write bit (low).
3. The addressed slave device asserts an ACK on the SDA.
4. The master sends a command code.
5. The slave asserts ACK on the SDA.
6. The master asserts a stop condition on the SDA and the
transaction ends.
In the ADM1026, the send byte protocol is used to write a
register address to RAM for a subsequent single-byte read from
the same address or block read or write starting at that address.
This is illustrated in Figure 19.
123 4 56
SLAVE
S
ADDRESS
Figure 19. Setting a RAM Address for Subsequent Read
W
If it is required to read data from the RAM immediately after
setting up the address, the master can assert a repeat start
condition immediately after the final ACK and carry out a
single byte read, block read, or block write operation without
asserting an intermediate stop condition.
RAM
ADDRESS
(00h TO 6Fh)
AAP
02657-A-019
Writ e B yte / Word
In this operation, the master device sends a command byte and
one or two data bytes to the slave device as follows:
1. The master device asserts a start condition on the SDA.
2. The master sends the 7-bit slave address followed by the
write bit (low).
3. The addressed slave device asserts an ACK on the SDA.
4. The master sends a command code.
5. The slave asserts an ACK on the SDA.
6. The master sends a data byte.
7. The slave asserts an ACK on the SDA.
8. The master sends a data byte (or may assert stop here.)
9. The slave asserts an ACK on the SDA.
10. The master asserts a stop condition on the SDA to end the
transaction.
In the ADM1026, the write byte/word protocol is used for four
purposes. The ADM1026 knows how to respond by the value of
the command byte and EEPROM Register 3.
The first purpose is to write a single byte of data to RAM. In
this case, the command byte is the RAM address from 00h to
6Fh and the (only) data byte is the actual data. This is illustrated
in Figure 20.
12 3 4 56
SLAVE
S
ADDRESS
WA
Figure 20. Single Byte Write to RAM
RAM
ADDRESS
(00h TO 6Fh)
A
DATA
78
AP
02657-A-020
The protocol is also used to set up a 2-byte EEPROM address
for a subsequent read or block read. In this case, the command
byte is the high byte of the EEPROM address from 80h to 9Fh.
The (only) data byte is the low byte of the EEPROM address.
This is illustrated in Figure 21.
13456
2
EEPROM
W
ADDRESS
A
HIGH BYTE
(80h TO 9Fh)
SLAVE
S
ADDRESS
Figure 21. Setting an EEPROM Address
EEPROM
ADDRESS
A
LOW BYTE
(00h TO FFh)
7
8
A
P
02657-A-021
If it is required to read data from the EEPROM immediately
after setting up the address, the master can assert a repeat start
condition immediately after the final ACK and carry out a
single-byte read or block read operation without asserting an
intermediate stop condition. In this case, Bit 0 of EEPROM
Register 3 should be set.
The third use is to erase a page of EEPROM memory. EEPROM
memory can be written to only if it is previously erased. Before
writing to one or more EEPROM memory locations that are
already programmed, the page or pages containing those
locations must first be erased. EEPROM memory is erased by
writing an EEPROM page address plus an arbitrary byte of data
with Bit 2 of EEPROM Register 3 set to 1.
Rev. A | Page 14 of 56
ADM1026
Because the EEPROM consists of 128 pages of 64 bytes, the
EEPROM page address consists of the EEPROM address high
byte (from 80h to 9Fh) and the two MSBs of the low byte. The
lower six bits of the EEPROM address (low byte only) specify
addresses within a page and are ignored during an erase
operation.
123 4 5 6
SLAVE
S
ADDRESS
WA
EEPROM
ADDRESS
HIGH BYTE
(80h TO 9Fh)
EEPROM
ADDRESS
A
LOW BYTE
(00h TO FFh)
Figure 22. EEPROM Page Erasure
78
ARBITRARY
A
DATA
9
10
AY
02657-A-022
Page erasure takes approximately 20 ms. If the EEPROM is
accessed before erasure is complete, the ADM1026 responds
with No Acknowledge.
Last, this protocol is used to write a single byte of data to
EEPROM. In this case, the command byte is the high byte of the
EEPROM address from 80h to 9Fh. The first data byte is the low
byte of the EEPROM address, and the second data byte is the
actual data. Bit 1 of EEPROM Register 3 must be set. This is
illustrated in Figure 23.
9. The slave asserts an ACK on the SDA after each data byte.
10. The master sends a packet error checking (PEC ) byte.
11. The ADM1026 checks the PEC byte and issues an ACK if
correct. If incorrect (NACK), the master resends the data
bytes.
12. The master asserts a stop condition on the SDA to end the
transaction.
WA
COMMAND
A0h BLOCK
WRITE
BYTE
AA DATA 1
COUNT
Figure 24. Block Write to EEPROM or RAM
AA
DATA
32
PEC
APDATA 2 A
SLAVE
S
ADDRESS
When performing a block write to EEPROM, Bit 1 of EEPROM
Register 3 must be set.
Unlike some EEPROM devices that limit block writes to within
a page boundary, there is no limitation on the start address
when performing a block write to EEPROM, except:
•There must be at least 32 locations from the start address
to the highest EEPROM address (9FFF) to avoid writing to
invalid addresses.
02857-A-024
123 4 5 6
SLAVE
S
ADDRESS
WA
EEPROM
ADDRESS
HIGH BYTE
(80h TO 9Fh)
EEPROM
ADDRESS
A
LOW BYTE
(00h TO FFh)
78
DATA
A
910
AY
02657-A-023
Figure 23. Single-Byte Write to EEPROM
Block Write
In this operation, the master device writes a block of data to a
slave device. The start address for a block write must have been
set previously. In the case of the ADM1026, this is done by a
Send Byte operation to set a RAM address or by a write
byte/word operation to set an EEPROM address.
1. The master device asserts a start condition on the SDA.
2. The master sends the 7-bit slave address followed by the
write bit (low).
3. The addressed slave device asserts an ACK on the SDA.
4. The master sends a command code that tells the slave
device to expect a block write. The ADM1026 command
code for a block write is A0h (10100000).
5. The slave asserts an ACK on the SDA.
6. The master sends a data byte (20h) that tells the slave
device that 32 data bytes are being sent to it. The master
should always send 32 data bytes to the ADM1026.
7. The slave asserts an ACK on the SDA.
8. The master sends 32 data bytes.
•If the addresses cross a page boundary, both pages must be
erased before programming.
ADM1026 Read Operations
The ADM1026 uses the SMBus read protocols described here.
Receive Byte
In this operation, the master device receives a single byte from a
slave device as follows:
1. The master device asserts a start condition on the SDA.
2. The master sends the 7-bit slave address followed by the
read bit (high).
3. The addressed slave device asserts an ACK on the SDA.
4. The master receives a data byte.
5. The master asserts a NO ACK on the SDA.
6. The master asserts a stop condition on the SDA to end the
transaction.
In the ADM1026, the receive byte protocol is used to read a
single byte of data from a RAM or EEPROM location whose
address has previously been set by a send byte or write
byte/word operation. Figure 25 shows this. When reading from
EEPROM, Bit 0 of EEPROM Register 3 must be set.
123456
SLAVE
S
ADDRESS
RA
Figure 25. Single-Byte Read from EEPROM or RAM
DATA
A
P
02657-A-025
Rev. A | Page 15 of 56
ADM1026
Block Read
In this operation, the master device reads a block of data from a
slave device. The start address for a block read must have been
set previously. In the case of the ADM1026 this is done by a
send byte operation to set a RAM address, or by a write
byte/word operation to set an EEPROM address. The block read
operation consists of a send byte operation that sends a block
read command to the slave, immediately followed by a repeated
start and a read operation that reads out multiple data bytes as
follows:
1. The master device asserts a start condition on the SDA.
2. The master sends the 7-bit slave address followed by the
write bit (low).
3. The addressed slave device asserts an ACK on the SDA.
4. The master sends a command code that tells the slave
device to expect a block read. The ADM1026 command
code for a block read is A1h (10100001).
5. The slave asserts an ACK on the SDA.
6. The master asserts a repeat start condition on the SDA.
7. The master sends the 7-bit slave address followed by the
read bit (high).
8. The slave asserts an ACK on the SDA.
9. The ADM1026 sends a byte count data byte that tells the
master how many data bytes to expect. The ADM1026
always returns 32 data bytes (20h), the maximum allowed
by the SMBus 1.1 specification.
10. The master asserts an ACK on the SDA.
11. The master receives 32 data bytes.
12. The master asserts an ACK on the SDA after each data byte.
13. The ADM1026 issues a PEC byte to the master. The master
should check the PEC byte and issue another block read if
the PEC byte is incorrect.
14. A NACK is generated after the PEC byte to signal the end
of the read.
15. The master asserts a stop condition on the SDA to end the
transaction.
WA
A DATA 1
COMMAND
A1h BLOCK
READ
A
SLAVE
A SR
ADDRESS
DATA
A
32
PEC
P
A
02657-A-026
SLAVE
S
ADDRESS
BYTE
A
COUNT
Figure 26. Block Read from EEPROM or RAM
When block reading from EEPROM, Bit 0 of EEPROM
Register 3 must be set.
Note that although the ADM1026 supports packet error
checking (PEC), its use is optional. The PEC byte is calculated
using CRC-8. The frame check sequence (FCS) conforms to
CRC-8 by the polynomial:
8
C(x) = x
+ x2 + x1 + 1
Consult the SMBus 1.1 Specification for more information.
MEASUREMENT INPUTS
The ADM1026 has 17 external analog measurement pins that
can be configured to perform various functions. It also measures two supply voltages, 3.3 V MAIN and 3.3 V STBY, and the
internal chip temperature.
Pins 25 and 26 are dedicated to remote temperature measurement, while Pins 27 and 28 can be configured as analog inputs
with a range of 0 V to 2.5 V, or as inputs for a second remote
temperature sensor.
Pins 29 to 33 are dedicated to measuring V
+12 V supplies, and the processor core voltage V
remaining analog inputs, Pins 34 to 41, are general-purpose
analog inputs with a range of 0 V to 2.5 V (Pins 34 and 35) or
0 V to 3 V (Pins 36 to 41).
A-to-D Converter (ADC)
These inputs are multiplexed into the on-chip, successive
approximation, analog-to-digital converter. The ADC has a
resolution of 8 bits. The basic input range is 0 V to 2.5 V, which
to A
is the input range of A
IN6
, but five of the inputs have
IN9
built-in attenuators to allow measurement of V
+12 V, and the processor core voltage V
components. To allow the tolerance of these supply voltages, the
ADC produces an output of 3/4 full scale (decimal 192) for the
nominal input voltage, and so has adequate headroom to cope
with over voltages. Table 6 shows the input ranges of the analog
inputs and output codes of the ADC.
When the ADC is running, it samples and converts an analog
or local temperature input every 711 µs (typical value). Each
input is measured 16 times and the measurements are averaged
to reduce noise, so the total conversion time for each input is
11.38 ms.
Measurements on the remote temperature (D1 and D2) inputs
take 2.13 ms. These are also measured 16 times and are
averaged, so the total conversion time for a remote temperature
input is 34.13 ms.