ANALOG DEVICES ADIS16334 Service Manual

Low Profile

Six Degree of Freedom Inertial Sensor

FEATURES

Triaxis digital gyroscope with digital range scaling

±75°/sec, ±150°/sec, ±300°/sec settings

Tight orthogonal alignment: <0.05°
Triaxis digital accelerometer: ±5 g
Wide sensor bandwidth: 330 Hz
Autonomous operation and data collection

No external configuration commands required

Start-up time: 180 ms
Factory-calibrated sensitivity, bias, and axial alignment

Calibration temperature range: −20°C to +70°C
SPI-compatible serial interface
Embedded temperature sensor
Programmable operation and control

Automatic and manual bias correction controls

Bartlett window FIR filter length, number of taps

Digital I/O: data ready, alarm indicator, general-purpose

Alarms for condition monitoring

Enable external sample clock input: up to 1.2 kHz

Single-command self-test
Single-supply operation: 4.75 V to 5.25 V
2000 g shock survivability
22 mm × 33 mm × 11 mm module with connector interface
Operating temperature range: −40°C to +105°C

ADIS16334

GENERAL DESCRIPTION

The ADIS16334 iSensor® is a complete inertial system that includes
a triaxis gyroscope and triaxis accelerometer. Each sensor in the
ADIS16334 combines industry-leading iMEMS® technology
with signal conditioning that optimizes dynamic performance.
The factory calibration characterizes each sensor for sensitivity,
bias, alignment, and linear acceleration (gyro bias). As a result,
each sensor has its own dynamic compensation formulas that
provide accurate sensor measurements over a temperature
range of −20°C to +70°C.

The ADIS16334 provides a simple, cost-effective method for
integrating accurate, multiaxis, inertial sensing into industrial
systems, especially when compared with the complexity and
investment associated with discrete designs. All necessary motion
testing and calibration are part of the production process at the
factory, greatly reducing system integration time. Tight orthogonal
alignment simplifies inertial frame alignment in navigation systems.
An improved SPI interface and register structure provide faster
data collection and configuration control.

This compact module is approximately 22 mm × 33 mm × 11 mm
and provides a compact connector interface.

APPLICATIONS

Medical instrumentation
Robotics
Platform controls
Navigation

FUNCTIONAL BLOCK DIAGRAM

DIOx RST VCC

SELF-TEST I/O

TRIAXIAL

ACCEL

TRIAXIAL

GYRO

TEMP

Rev. A

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rights of third parties that may result from its use. Specifications subject to change without notice. No
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Trademarks and registered trademarks are the property of their respective owners.

CONTROLLER

DIGITAL

FILTER

ALARMS

CALIBRATION
CORRECTION

Figure 1.

POWER

MANAGEMENT

CONTROL

REGISTERS

OUTPUT

REGISTERS

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: [phone] www.analog.com
Fax: [phone] ©2011 Analog Devices, Inc. All rights reserved.

SPI

PORT

ADIS16334

GND

CS
SCLK
DIN

DOUT

09362-001

ADIS16334

TABLE OF CONTENTS

Features.............................................................................................. 1

Applications....................................................................................... 1

General Description ......................................................................... 1

Functional Block Diagram .............................................................. 1

Revision History ............................................................................... 2

Specifications..................................................................................... 3

Timing Specifications .................................................................. 5

Timing Diagrams.......................................................................... 5

Absolute Maximum Ratings............................................................ 6

ESD Caution.................................................................................. 6

Pin Configuration and Function Descriptions............................. 7

Typical Performance Characteristics ............................................. 8

Theory of Operation ........................................................................ 9

Gyroscopes .................................................................................... 9

Accelerometers.............................................................................. 9

Data Sampling and Processing ................................................... 9

Calibration..................................................................................... 9

User Interface................................................................................ 9

Basic Operation............................................................................... 10

Reading Sensor Data.................................................................. 10

Memory Map ..............................................................................11

Output Data Registers................................................................ 12

Device Configuration ................................................................ 13

Digital Processing Configuration................................................. 14

Sample Rate................................................................................. 14

Input Clock Configuration ....................................................... 14

Digital Filtering........................................................................... 14

Dynamic Range .......................................................................... 14

Optimizing Accuracy..................................................................... 15

Automatic Bias Correction ....................................................... 15

Manual Bias Correction ............................................................ 15

Restoring Factory Calibration .................................................. 15

Point-of-Percussion/Linear-g Compensation............................ 15

System Tools.................................................................................... 16

Global Commands ..................................................................... 16

Device Identification.................................................................. 17

Flash Memory Management..................................................... 17

Alarms.............................................................................................. 18

Static Alarm Use ......................................................................... 18

Dynamic Alarm Use .................................................................. 18

Alarm Reporting ........................................................................ 18

Applications Information.............................................................. 19

ADIS16334/PCBZ ...................................................................... 19

Outline Dimensions....................................................................... 20

Ordering Guide .......................................................................... 20

REVISION HISTORY

6/11—Rev. 0 to Rev. A

Changes to In-Run Bias Stability Parameter, Table 1................... 3

Changes to Figure 23...................................................................... 19

1/11—Revision 0: Initial Version

Rev. A | Page 2 of 20

ADIS16334

SPECIFICATIONS

TA = 25°C, VCC = 5.0 V, angular rate = 0°/sec, dynamic range = ±300°/sec ± 1 g, unless otherwise noted.

Table 1.

Parameter Test Conditions/Comments Min Typ Max Unit

GYROSCOPES

Dynamic Range ±300 ±350 °/sec

Initial Sensitivity Dynamic range = ±300°/sec 0.0495 0.05 0.0505 °/sec/LSB

Dynamic range = ±150°/sec 0.025 °/sec/LSB

Dynamic range = ±75°/sec 0.0125 °/sec/LSB

Sensitivity Temperature Coefficient −20°C ≤ TA ≤ +70°C ±40 ppm/°C

Nonlinearity Best-fit straight line ±0.1 % of FS

Misalignment Axis to axis ±0.05 Degrees

Axis-to-frame (package) ±0.5 Degrees

Initial Bias Error ±1 σ ±3 °/sec

In-Run Bias Stability 1 σ, SMPL_PRD = 0x0001 0.0072 °/sec

Angular Random Walk 1 σ, SMPL_PRD = 0x0001 2 °/√hr

Bias Temperature Coefficient −20°C ≤ TA ≤ +70°C ±0.005 °/sec/°C

Linear Acceleration Effect on Bias Any axis, 1 σ (MSC_CTRL[7] = 1) ±0.05 °/sec/g

Bias Voltage Sensitivity VCC = 4.75 V to 5.25 V ±0.3 °/sec/V

Output Noise ±300°/sec range, no filtering 0.75 °/sec rms

Rate Noise Density f = 25 Hz, ±300°/sec range, no filtering 0.044 °/sec/√Hz rms

3 dB Bandwidth 330 Hz

Sensor Resonant Frequency 14.5 kHz

ACCELEROMETERS Each axis

Dynamic Range ±5 ±5.25

Initial Sensitivity 0.99 1.00 1.01 mg/LSB

Sensitivity Temperature Coefficient −20°C ≤ TA ≤ +70°C ±40 ppm/°C

Misalignment Axis-to-axis ±0.1 Degrees

Axis-to-frame (package) ±0.5 Degrees

Nonlinearity Best-fit straight line ±0.1 % of FS

Initial Bias Error ±1 σ ±12 mg

In-Run Bias Stability 1 σ 100 μg

Velocity Random Walk 1 σ 0.11 m/sec/√hr

Bias Temperature Coefficient −20°C ≤ T

Bias Voltage Sensitivity VCC = 4.75 V to 5.25 V ±5 mg/V

Output Noise No filtering 4 mg rms

Noise Density No filtering 221 μg/√Hz rms

3 dB Bandwidth 330 Hz

Sensor Resonant Frequency 5.5 kHz

TEMPERATURE SENSOR

Scale Factor Output = 0x0000 at 25°C (±5°C) 0.0678 °C/LSB

≤ +70°C ±0.06 mg/°C

A

g

Rev. A | Page 3 of 20

ADIS16334

Parameter Test Conditions/Comments Min Typ Max Unit

LOGIC INPUTS1

Input High Voltage, VIH 2.0 V
Input Low Voltage, VIL 0.8 V

CS Wake-Up Pulse Width
Logic 1 Input Current, IIH V
Logic 0 Input Current, IIL V

All Pins Except RST
RST Pin

signal to wake up from sleep mode

CS
20 μs

= 3.3 V ±0.2 ±10 μA

IH

= 0 V

IL

40 60 μA
1 mA

Input Capacitance, CIN 10 pF

DIGITAL OUTPUTS1

Output High Voltage, VOH I
Output Low Voltage, VOL I

= 1.6 mA 2.4 V

SOURCE

= 1.6 mA 0.4 V

SINK

FLASH MEMORY Endurance2 10,000 Cycles

Data Retention3 T

= 85°C 20 Years

J

FUNCTIONAL TIMES4 Time until data is available

Power-On Start-Up Time Normal mode 180 ms
Reset Recovery Time Normal mode 60 ms
Flash Memory Test Time Normal mode 20 ms
Self-Test Time SMPL_PRD = 0x0001 14 ms

CONVERSION RATE

Internal Sample Rate SMPL_PRD = 0x0001 819.2 SPS
Tolerance ±3 %
Sync Input Clock5 SMPL_PRD = 0x0000 0.8 1.2 kHz

POWER SUPPLY

Supply Voltage 4.75 5.0 5.25 V
Power Supply Current 47 mA

1

The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant.

2

Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.

3

The data retention lifetime equivalent is at a junction temperature (TJ) of 85°C as per JEDEC Standard 22, Method A117. Data retention lifetime decreases with junction

temperature.

4

These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may affect overall accuracy.

5

The sync input clock functions below the specified minimum value, at reduced performance levels.

0.55 V

Rev. A | Page 4 of 20

ADIS16334

TIMING SPECIFICATIONS

TA = 25°C, VCC = 5.0 V, unless otherwise noted.

Table 2.

Normal Read Burst Read1
Parameter Description Min2 Typ Max M in2 Typ Max Unit

f

Serial clock 0.01 2.0 0.01 1.0 MHz

SCLK

t

Stall period between data 9 1/f

STALL

t

Read rate 40 μs

READRATE

tCS Chip select to SCLK edge 48.8 48.8 ns
t

DOUT valid after SCLK edge 100 100 ns

DAV

t

DIN setup time before SCLK rising edge 24.4 24.4 ns

DSU

t

DIN hold time after SCLK rising edge 48.8 48.8 ns

DHD

t

, t

SCLKR

SCLK rise/fall times 5 12.5 5 12.5 ns

SCLKF

tDR, tDF DOUT rise/fall times 5 12.5 5 12.5 ns
t

SFS

t

1

high after SCLK edge

CS
Input sync positive pulse width 5 5 μs

5 5 ns

tx Input sync low time 100 100 μs
t

2

t

3

1

t

does not apply to burst read.

READRATE

2

Guaranteed by design and characterization, but not tested in production.

Input sync to data ready output 600 600 μs
Input sync period 833 833 μs

μs

SCLK

TIMING DIAGRAMS

CS

SCLK

DOUT

DIN

CS

SCLK

t

CS

1 2 3 4 5 6 15 16

t

DAV

MSB DB14

R/W A5A6 A4 A3 A2

DB13 DB12 DB10DB11 DB2 LSBDB1

t

DSU

t

DHD

D2

Figure 2. SPI Timing and Sequence

t

READRATE

t

STALL

Figure 3. Stall Time and Data Rate

t

3

t

2

t

X

SYNC

CLOCK (DIO 4)

DATA

READY

t

1

Figure 4. Input Clock Timing Diagram

Rev. A | Page 5 of 20

D1 LSB

09362-004

t

SFS

09362-002

09362-003

ADIS16334

ABSOLUTE MAXIMUM RATINGS

Table 3.

Parameter Rating

Acceleration

Any Axis, Unpowered 2000 g

Any Axis, Powered 2000 g
VCC to GND −0.3 V to +6.0 V
Digital Input Voltage to GND −0.3 V to +5.3 V
Digital Output Voltage to GND −0.3 V to VCC + 0.3 V
Analog Input to GND −0.3 V to +3.6 V
Operating Temperature Range −40°C to +105°C
Storage Temperature Range −65°C to +125°C

1

Extended exposure to temperatures outside the specified temperature

range of −40°C to +105°C can adversely affect the accuracy of the factory
calibration. For best accuracy, store the parts within the specified operating
range of −40°C to +105°C.

2

Although the device is capable of withstanding short-term exposure to

150°C, long-term exposure threatens internal mechanical integrity.

1, 2

Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.

Table 4. Package Characteristics

Package Type θJA θ

20-Lead Module

36.5°C 16.9°C 12.5 grams

Device Weight

JC

(ML-20-1)

ESD CAUTION

Rev. A | Page 6 of 20