ANALOG DEVICES ADIS16305 Service Manual

A

Precision Four Degrees of Freedom Sensor

FEATURES

Digital gyroscope with range scaling

±75°/sec, ±150°/sec, ±300°/sec settings Triaxis digital accelerometer: ±3 g Wide sensor bandwidth: 330 Hz Autonomous operation and data collection

No external configuration commands required

Start-up time: 180 ms

Sleep mode recovery time: 4 ms Factory-calibrated sensitivity, bias, and alignment Calibration temperature range: −40°C to +85°C SPI-compatible serial interface Embedded temperature sensor Programmable operation and control

Automatic and manual bias correction controls

Bartlett window FIR filter length, number of taps

Digital I/O: data-ready, alarm indicator, general-purpose

Alarms for condition monitoring

Sleep mode for power management

DAC output voltage

Enable external sample clock input: up to 1.2 kHz

Single-command self-test Single-supply operation: 4.75 V to 5.25 V 2000 g shock survivability Operating temperature range: −40°C to +85°C

FUNCTIONAL BLOCK DIAGRAM

TEMPERATURE

SENSOR

MEMS

ANGULAR RATE

SENSOR

TRIAXIS MEMS

ACCELERATION

SENSOR

SELF-TEST

ADIS16305

UX_

AUX_

ADC

DAC

SIGNAL

CONDITIONING

AND

CONVERSION

DIGITAL

CONTROL

RST

CALIBRATION

DIGITAL

PROCESSING

ALARMS

DIO3DIO2DIO1

Figure 1.

ADIS16305

AND

DIO4

OUTPUT

REGISTERS

AND SPI

INTERFACE

POWER

MANAGEMENT

CS SCLK DIN DOUT

VCC

GND

9020-001

APPLICATIONS

Medical instrumentation Robotics Platform controls Navigation

GENERAL DESCRIPTION

The iSensor® ADIS16305 is a complete inertial system that includes a gyroscope and triaxis accelerometer. Each sensor in the ADIS16305 combines industry-leading iMEMS® technology with signal conditioning that optimizes dynamic performance. The factory calibration characterizes each sensor for sensitivity, bias, alignment, and linear acceleration (gyro bias). As a result, each sensor has its own dynamic compensation formulas that provide accurate sensor measurements over a variety of conditions.

The ADIS16305 provides a simple, cost-effective method for integrating accurate, multiaxis, inertial sensing into industrial systems, especially when compared with the complexity and investment associated with discrete designs. All necessary motion

Rev. 0

Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.

testing and calibration are part of the production process at the factory, greatly reducing system integration time. Tight orthogonal alignment simplifies inertial frame alignment in navigation systems. An improved SPI interface and register structure provide faster data collection and configuration control. The ADIS16305 uses a pinout that is compatible with the ADIS1635x, ADIS1636x, and ADIS1640x families, when used with an interface flex connector.

This compact module is approximately 23 mm × 31 mm × 8 mm and provides a standard connector interface, which enables horizontal or vertical mounting.

ADIS16305

REVISION HISTORY

7/10—Revision 0: Initial Version

Rev. 0 | Page 2 of 20

ADIS16305

SPECIFICATIONS

TA = 25°C, VCC = 5.0 V, angular rate = 0°/sec, dynamic range = ±300°/sec ± 1 g, unless otherwise noted.

Table 1.

Parameter Test Conditions Min Typ Max Unit

GYROSCOPE

Dynamic Range ±300 ±350 °/sec

Initial Sensitivity TA = 25°C, dynamic range = ±300°/sec 0.0495 0.05 0.0505 °/sec/LSB

T

Sensitivity Temperature Coefficient −40°C ≤ TA ≤ +85°C 20 ppm/°C

Misalignment Reference to z-axis accelerometer, TA = 25°C ±0.1 Degrees

Nonlinearity Best-fit straight line 0.1 % of FS

Initial Bias Error TA = 25°C, ±1 σ ±3 °/sec

In-Run Bias Stability TA = 25°C, 1 σ, SMPL_PRD = 0x01 0.006 °/sec

Angular Random Walk TA = 25°C, 1 σ, SMPL_PRD = 0x01 1.85 °/√hr

Bias Temperature Coefficient −40°C ≤ TA ≤ +85°C 0.006 °/sec/°C

Linear Acceleration Effect on Bias Any axis, 1 σ (MSC_CTRL Bit[7] = 1) 0.02 °/sec/g

Voltage Sensitivity VCC = 4.75 V to 5.25 V 0.32 °/sec/V

Output Noise TA = 25°C, ±300°/sec range, no filtering 0.73 °/sec rms

Rate Noise Density TA = 25°C, f = 25 Hz, ±300°/sec, no filtering 0.04 °/sec/√Hz rms

3 dB Bandwidth 330 Hz

Sensor Resonant Frequency 14.5 kHz

Self-Test Change in Output Response ±300°/sec range setting ±696 ±1400 ±2449 LSB

ACCELEROMETERS Each axis

Dynamic Range ±3 ±3.6

Initial Sensitivity 25°C 0.594 0.6 0.606 mg/LSB

Sensitivity Temperature Coefficient −40°C ≤ TA ≤ +85°C 25 ppm/°C

Misalignment Axis-to-axis, TA = 25°C, Δ = 90° ideal ±0.1 Degrees

Axis-to-frame (package), TA = 25°C ±0.5 Degrees

Nonlinearity Best-fit straight line ±0.3 % of FS

Initial Bias Error TA = 25°C, ±1 σ ±60 mg

In-Run Bias Stability TA = 25°C, 1 σ, SMPL_PRD = 0x01 0.037 mg

Velocity Random Walk TA = 25°C, 1 σ, X axis and Y axis 0.1 m/sec/√hr

T

Bias Temperature Coefficient −40°C ≤ TA ≤ +85°C 0.3 mg/°C

Output Noise TA = 25°C, no filtering, X axis and Y axis 4.25 mg rms

T

Noise Density TA = 25°C, no filtering, X axis and Y axis 225 μg/√Hz rms

T

3 dB Bandwidth 330 Hz

Sensor Resonant Frequency 5.5 kHz

Self-Test Change in Output Response X axis and Y axis 500 1100 1700 LSB

Z axis 90 450 860 LSB

ADC INPUT

Resolution 12 Bits

Integral Nonlinearity ±2 LSB

Differential Nonlinearity ±1 LSB

Offset Error ±4 LSB

Gain Error ±2 LSB

Input Range 0 3.3 V

Input Capacitance During acquisition 20 pF

= 25°C, dynamic range = ±150°/sec 0.025 °/sec/LSB

A

= 25°C, dynamic range = ±75°/sec 0.0125 °/sec/LSB

A

g

= 25°C, 1 σ, Z axis 0.16 m/sec/√hr

A

= 25°C, no filtering, Z axis 6.5 mg rms

A

= 25°C, no filtering, Z axis 340 μg/√Hz rms

A

Rev. 0 | Page 3 of 20

ADIS16305

Parameter Test Conditions Min Typ Max Unit

DAC OUTPUT 5 kΩ/100 pF to GND

Resolution 12 Bits Relative Accuracy For Code 101 to Code 4095 ±4 LSB Differential Nonlinearity ±1 LSB Offset Error ±5 mV Gain Error ±0.5 % Output Range 0 3.3 V Output Impedance 2 Ω Output Settling Time 10 μs

LOGIC INPUTS1

Input High Voltage, V Input Low Voltage, V

CS Wake-Up Pulse Width Logic 1 Input Current, I Logic 0 Input Current, I

All Pins Except RST RST Pin

Input Capacitance, CIN 10 pF

DIGITAL OUTPUTS1

Output High Voltage, VOH I Output Low Voltage, VOL I

FLASH MEMORY Endurance2 10,000 Cycles

Data Retention3 T

FUNCTIONAL TIMES4 Time until data is available

Power-On Start-Up Time Normal mode, SMPL_PRD ≤ 0x09 180 ms Low power mode, SMPL_PRD ≥ 0x0A 250 ms Reset Recovery Time Normal mode, SMPL_PRD ≤ 0x09 55 ms Low power mode, SMPL_PRD ≥ 0x0A 120 ms Sleep Mode Recovery Time 4 ms Flash Memory Test Time Normal mode, SMPL_PRD ≤ 0x09 20 ms Low power mode, SMPL_PRD ≥ 0x0A 90 ms Automatic Self-Test Time 12 ms

CONVERSION RATE SMPL_PRD = 0x01 to 0xFF 0.413 819.2 SPS

Clock Accuracy ±3 % Sync Input Clock 1.2 kHz

POWER SUPPLY Operating voltage range, VCC 4.75 5.0 5.25 V

Power Supply Current Low power mode at 25°C 18 mA Normal mode at 25°C 42 mA Sleep mode at 25°C 500 μA

1

The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant.

2

Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.

3

The retention lifetime equivalent is at a junction temperature (TJ) of 85°C as per JEDEC Standard 22, Method A117. Retention lifetime decreases with junction temperature.

4

These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may impact overall accuracy.

2.0 V

INH

0.8 V

INL

signal to wake up from sleep mode

CS

0.55 V

20 μs

V

INH

V

INL

= 3.3 V ±0.2 ±10 μA

IH

= 0 V

IL

−40 −60 μA

−1 mA

= 1.6 mA 2.4 V

SOURCE

= 1.6 mA 0.4 V

SINK

= 85°C 20 Years

J

Rev. 0 | Page 4 of 20

ADIS16305

TIMING SPECIFICATIONS

TA = 25°C, VCC = 5 V, unless otherwise noted.

Table 2.

Normal Mode

(SMPL_PRD ≤ 0x09)

Parameter Description Min1 Typ Max Min1 Typ Max Min1 Typ Max Unit

f

Serial clock 0.01 2.0 0.01 0.3 0.01 1.0 MHz

SCLK

t

Stall period between data 9 75 1/f

STALL

t

Read rate 40 100 μs

READRATE

tCS Chip select to clock edge 48.8 48.8 48.8 ns t

DOUT valid after SCLK edge 100 100 100 ns

DAV

t

DIN setup time before SCLK rising edge 24.4 24.4 24.4 ns

DSU

t

DIN hold time after SCLK rising edge 48.8 48.8 48.8 ns

DHD

t

, t

SCLKR

SCLK rise/fall times (not shown in figures) 5 12.5 5 12.5 5 12.5 ns

SCLKF

tDR, tDF DOUT rise/fall times (not shown in figures) 5 12.5 5 12.5 5 12.5 ns t

SFS

t

1

high after SCLK edge

CS Input sync positive pulse width 5 5 μs

5 5 5 ns

tx Input sync low time 100 100 μs t

2

t

3

1

Guaranteed by design and characterization, but not tested in production.

Input sync to data-ready output 600 600 μs Input sync period 833 833 μs

Timing Diagrams

Low Power Mode

(SMPL_PRD ≥ 0x0A) Burst Read

μs

SCLK

CS

SCLK

DOUT

DIN

t

CS

1 2 3 4 5 6 15 16

t

DAV

MSB DB14

R/W A5A6 A4 A3 A2

DB13 DB12 DB10DB11 DB2 LSBDB1

t

DSU

t

DHD

D2

D1 LSB

t

SFS

09020-002

Figure 2. SPI Timing and Sequence

t

READRATE

t

STALL

CS

SCLK

09020-003

Figure 3. Stall Time and Data Rate

t

3

t

2

t

X

09020-004

SYNC

CLOCK (DIO 4)

DATA

READY

t

1

Figure 4. Input Clock Timing Diagram

Rev. 0 | Page 5 of 20

ADIS16305

ABSOLUTE MAXIMUM RATINGS

Table 3.

Parameter Rating

Acceleration

Any Axis, Unpowered 2000 g

Any Axis, Powered 2000 g VCC to GND −0.3 V to +6.0 V Digital Input Voltage to GND −0.3 V to +5.3 V Digital Output Voltage to GND −0.3 V to VCC + 0.3 V Analog Input to GND −0.3 V to +3.6 V Operating Temperature Range −40°C to +85°C Storage Temperature Range −65°C to +125°C

1

Extended exposure to temperatures outside the specified temperature

range of −40°C to +85°C can adversely affect the accuracy of the factory calibration. For best accuracy, store the parts within the specified operating range of −40°C to +85°C.

2

Although the device is capable of withstanding short-term exposure to

150°C, long-term exposure threatens internal mechanical integrity.

1, 2

Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

Table 4. Package Characteristics

Package Type θJA θ

24-Lead Module 39.8°C/W 14.2°C/W 6.1 grams (max)

ESD CAUTION

Device Weight

JC

Rev. 0 | Page 6 of 20

ANALOG DEVICES ADIS16305 Service Manual

Specifications and Main Features

Frequently Asked Questions

User Manual

FEATURES

FUNCTIONAL BLOCK DIAGRAM

APPLICATIONS

GENERAL DESCRIPTION

TABLE OF CONTENTS

REVISION HISTORY

SPECIFICATIONS

TIMING SPECIFICATIONS

Timing Diagrams

ABSOLUTE MAXIMUM RATINGS

ESD CAUTION