ANALOG DEVICES ADIS16240 Service Manual

Impact Sensor and Recorder

ADIS16240

Rev. A

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Fax: [phone] ©2009-2011 Analog Devices, Inc. All rights reserved.

TRIPLE-AXIS

MEMS

ACCELEROMETER

TEMPERATURE

SENSOR

ANALOG-

TO-DIGITAL

CONVERSION

AND

PROCESSING

DIGITAL

CONTROL

AND

SPI

INTERFACE

POWER

MANAGEMENT

EVENT

CAPTURE

BUFFER

ALARM

DETECTION

EVENT TRIGGER

CS
SCLK
DIN
DOUT

DIO2

DIO1

RST

VDDAN

XA
YA
ZA

CMP1

ADIS16240

CMP2

08133-001

Data Sheet

FEATURES

Digital triple-axis accelerometer, ±19 g
Programmable event recorder

Internal and external trigger inputs

Low power operation

Sleep mode current: 100 µA
Continuous sampling current: 1 mA, 1 kSPS

Wake -up and record function

External trigger input and SPI trigger command
Peak acceleration sample-and-hold
Peak XYZ sum-of-squares output
1600 Hz (X, Y) and 550 Hz (Z) sensor bandwidth
Digitally controlled bias correction
Digitally controlled sample rate, up to 4096 SPS
Programmable alarms for condition monitoring
Programmable digital input/output lines

Data-ready output and alarm indicator output
Real-time clock
Digitally activated self-test
Embedded temperature sensor
Programmable power management
SPI-compatible serial interface
Auxiliary 10-bit ADC input
Two analog trigger inputs with programmable threshold
Single-supply operation: 2.4 V to 3.6 V
>4000 g powered shock survivability

APPLICATIONS

Crash or impact detection
Condition monitoring of valuable goods
Safety, shut-off sensing
Impact event recording
Security sensing and tamper detection

Low Power, Programmable

FUNCTIONAL BLOCK DIAGRAM

Figure 1.

GENERAL DESCRIPTION

The ADIS16240 is a fully integrated digital shock detection and
recorder system. It combines industry-leading iMEMS® technology
with a signal processing solution that optimizes dynamic perfor­mance for low power applications. The triple-axis sensing element
enables shock measurement in all directions, eliminating the need
for additional sensors and complex mechanical structures for
many applications. The digital serial peripheral interface (SPI)
uses four wires and is compatible with most processor platforms.
The SPI interface provides access to sensor data and a set of config­uration registers that control such operational parameters as
offset bias correction, sample rate, sleep mode, peak detection,
and event capture.

Information furnished by Anal og Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analo g Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications su bject to change without notice. No
license is granted by implication or ot herwise under any patent or patent rights of An alog Devices.

The programmable event recorder offers two trigger modes. The
internal mode monitors continuous sampled data and triggers the
capture, based on the user-defined threshold. The external mode
uses the two comparator inputs and a user-defined threshold to
trigger the event captures. This function also provides user configu­ration controls for capture length, pretrigger data, and data storage.
Each event is stored with a header that captures temperature, power
supply, and time. Several power management features, including
sleep mode and a wake-up function, enable power optimization
with respect to specific mechanical system requirements.

The ADIS16240 is available in a 12 mm × 12 mm laminate-based
ball grid array (BGA) that meets IPC/JEDEC standards for Pb-free
solder reflow processing (J-STD-020C and J-STD-033).

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: [phone] www.analog.com

ADIS16240 Data Sheet

TABLE OF CONTENTS

Features .............................................................................................. 1

Applications ....................................................................................... 1

Functional Block Diagram .............................................................. 1

General Description ......................................................................... 1

Revision History ............................................................................... 2

Specifications ..................................................................................... 3

Timing Specifications .................................................................. 4

Absolute Maximum Ratings ............................................................ 5

ESD Caution .................................................................................. 5

Pin Configuration and Function Descriptions ............................. 6

Typical Performance Characteristics ............................................. 7

Theory of Operation ........................................................................ 8

Sensing Element ........................................................................... 8

Data Sampling and Processing ................................................... 8

REVISION HISTORY

10/11—Rev. 0 to Rev. A

Added Applications Information Section, Figure 23, Figure 24,

Figure 25, Renumbered Sequentially ........................................... 16

Updated Outline Dimensions ....................................................... 18

Changes to Ordering Guide .......................................................... 18

4/09—Revision 0: Initial Version

User Interface .................................................................................8

Capture ...........................................................................................8

Basic Operation .................................................................................9

Memory Map .............................................................................. 10

Output Data Registers ............................................................... 11

Event Recorder ........................................................................... 12

Operational Control ................................................................... 14

Applications Information .............................................................. 16

Assembly ...................................................................................... 16

Interface Printed Circuit Board (PCB) .................................... 16

Outline Dimensions ....................................................................... 17

Ordering Guide .......................................................................... 17

Rev. A | Page 2 of 20

Data Sheet ADIS16240

Nonlinearity

Compare with best fit line

±2 % FS

No external capacitance

Z 550 Hz

Sleep Mode Current

100 µA

SPECIFICATIONS

TA = 25°C, VDD = 2.4 V to 3.6 V unless otherwise noted.

Table 1.

Parameter Conditions Axis Min Typ Max Unit

ACCELEROMETER

Dynamic Range ±16 ±19

Initial Sensitivity 51.4 mg/LSB

Sensitivity Temperature Coefficient −40°C to +85°C ±0.01 %

Sensitivity Change with Supply Voltage 2.4 V < VDD < 3.6 V X, Y 6 %

Sensor-to-Sensor Alignment Error ±0.1 Degrees

Cross-Axis Sensitivity ±1 %

Initial Bias Error −2.7 +2.7

Bias Temperature Coefficient ±1 mg/°C

Bias Voltage Sensitivity TBD mg/V

Output Noise 24 mg rms

Noise Density 480

Bandwidth No external capacitance X, Y 1600 Hz

Sensor Resonant Frequency 5.5 kHz

Self-Test Change in Output Response X −10 −21 −39 LSB

Y +10 +21 +39 LSB

Z +10 +36 +65 LSB

TEMPERATURE SENSOR SCALE FACTOR TEMP_OUT = 0x0133 (307) at 25°C 0.244 °C/LSB
ADC INPUT

Input Range 0 VDD V

Resolution 10 Bits

Integral Nonlinearity, INL ±1 ±2 LSB

Differential Nonlinearity, DNL ±1 ±1.25 LSB

Offset Error ±1 ±2 LSB

Gain Error ±1 ±3 LSB

Input Capacitance 11 pF

LOGIC INPUTS1

Input High Voltage, V

Input Low Voltage, V

Logic 1 Input Current, I

Logic 0 Input Current, I

2.0 V

INH

0.8 V

INL

VIH = VDD ±0.2 ±1 µA

INH

VIL = 0 V −40 −60 μA

INL

Input Capacitance, CIN 10 pF

DIGITAL OUTPUTS

Output High Voltage, VOH I

Output Low Voltage, VOL I

= 1.6 mA 2.4 V

SOURCE

= 1.6 mA 0.4 V

SINK

START-UP TIME

Initial, Reset Recovery 32 ms

FLASH MEMORY

Endurance2 10,000 Cycles

Data Retention3 TJ = 85°C 20 Years

CONVERSION RATE SETTING 4096 SPS
POWER SUPPLY 2.4 3.6 V

Average Supply Current4 SMPL_PRD = 0x1F, VDD = 2.5 V 1 mA

g

g

µg/√Hz

1

Note that the inputs are 5 V tolerant.

2

Endurance is qualified as per JEDEC Standard 22, Method A117 and measured at −40°C, +25°C, +85°C, and +105°C.

3

Retention lifetime equivalent at junction temperature (TJ) of 55°C as per JEDEC Standard 22, Method A117. Retention lifetime decreases with junction temperature.

4

Instantaneous current has periodic peaks at the sample rate that can reach 30 mA.

Rev. A | Page 3 of 20

ADIS16240 Data Sheet

t

Data input hold time after SCLK rising edge

20

ns

CS

SCLK

t

DATARATE

08133-002

CS

SCLK

DOUT

DIN

1 2 3 4 5 6 15 16

W/R A5A6 A4 A3 A2

D2

MSB

DB14

D1 LSB

DB13 DB12 DB10DB11 DB2 LSBDB1

t

CS

t

SFS

t

DAV

t

DHD

t

DSU

08133-003

TIMING SPECIFICATIONS

TA = 25°C, VDD = 3.3 V, unless otherwise noted.

Table 2.

Parameter Description Min1 Typ Max1 Unit

f

Serial clock rate2 0.01 2.5 MHz

SCLK

t

Chip select period

DATA RATE

tCS Chip select to clock edge 120 ns
t

Data output valid after SCLK edge 30 ns

DAV

t

Data input setup time before SCLK rising edge 20 ns

DSU

DHD

tDF Data output fall time 10 25 ns
tDR Data output rise time 10 25 ns
t

SFS

1

Guaranteed by design; typical specifications are not tested or guaranteed.

2

Based on sample rate selection.

CS high after SCLK edge

Timing Diagrams

2

60 μs

430 ns

Figure 2. SPI Chip Select Timing

Figure 3. SPI Timing (Utilizing SPI Settings Typically Identified as Phase = 1, Polarity = 1)

Rev. A | Page 4 of 20

Data Sheet ADIS16240

Parameter

Rating

Storage Temperature Range

−65°C to +150°C

ABSOLUTE MAXIMUM RATINGS

Table 3.

Acceleration

Any Axis, Unpowered 2000 g

Any Axis, Powered 2000 g

VDD to GND −0.3 V to +3.6 V
Digital Input Voltage to GND −0.3 V to VDD + 0.3 V
Analog Inputs to GND −0.3 V to VDD + 0.3 V
Operating Temperature Range −40°C to +85°C

Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.

ESD CAUTION

Rev. A | Page 5 of 20

ADIS16240 Data Sheet

08133-004

21 4

5

6

9

10

11

3

7

8

A
B

TOP VIEW

NOTES

1. THE ACTUAL PI NS ARE NOT
VISIBLE FROM T HE TO P VIEW.

C
D
E
F
G

J

H

K
L

A

Z

A1

A

Y

A

X

A

Z

A

Y

A

X

08133-005

X

E10, E11

SCLK

I

SPI Serial Clock

K8, L8

AN I Analog Input Channel

H1, H2

YA O Y-Axis Accelerometer Filter Pin

NC No Connect

PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

Figure 4. Pin Configuration (Top View)

Figure 5. Axis Orientation of Device (Top View)

Table 4. Pin Function Descriptions

Pin No. Mnemonic Type1 Description

F10, F11

CS

I SPI Chip Select, Active Low

G10, G11 DIN I SPI Data Input
H10, H11 DOUT O SPI Data Output
J10, J11 DIO2 I/O Multifunction Digital Input/Output 2
K9, L9 DIO1 I/O Multifunction Digital Input/Output 1

K7, L7 CMP2 I Analog Comparator Input 2
K6, L6 CMP1 I Analog Comparator Input 1
K3, L3

J1, J2 XA O X-Axis Accelerometer Filter Pin

G1, G2 ZA O Z-Axis Accelerometer Filter Pin
A5, B5 ST I Self-Test Input Control Line
D4 to D8, E4, E8, F4, F8, G4, G8, H4 to H8 VDD S Power Supply, 3.3 V
A1, A2, A10, A11, B1, B2, B10, B11, C3 to C9, D3, D9, E3, E9, F3, F9,

G3, G9, H3, H9, J3 to J9, K1, K2, K10, K11, L1, L2, L10, L11
A3, A4, A6 to A9, B3, B4, B6 to B9, C1, C2, C10, C11, D1, D2, D10,

D11, E1, E2, F1, F2, K4, K5, L4, L5

1

I = input, O = output, I/O = input/output, S = supply.

RST

I Reset, Active Low, No Pull-Up Resistor

GND S Ground

Rev. A | Page 6 of 20