ANALOG DEVICES ADIS16130 Service Manual

Digital Output, High Precision

www.BDTIC.com/ADI

FEATURES

Low noise density: 0.0125o/sec/√Hz Industry-standard serial peripheral interface (SPI) 24-bit digital resolution Dynamic range: ±250 Z-axis, yaw rate response Bandwidth, adjustable: 300 Hz Turn-on time: 35 ms Digital self-test High vibration rejection High shock survivability Embedded temperature sensor output Precision voltage reference output 5 V single-supply operation

−40°C to +85°C

APPLICATIONS

Guidance and control Instrumentation Inertial measurement units (IMU) Platform stabilization Navigation

o

/sec

Angular Rate Sensor

ADIS16130

GENERAL DESCRIPTION

The ADIS16130 is a low noise, digital output angular rate sensor (gyroscope) that provides an output response over the complete dynamic range of ±250

Its industry-standard serial interface and register structure provide

ple interface that is supported by most MCU, DSP, and FPGA

a sim platforms.

By implementing a unique design, the device provides superior

ability over variations in temperature, voltage, linear acceleration,

st vibration, and next-level assembly. In addition, the surface-micromachining technology used to manufacture the device is the same high volume BiMOS process used by Analog Devices, Inc., for its high reliability automotive sensor products.

Features include a temperature output that provides critical info

rmation for system-level calibrations and a digital self-test feature that exercises the mechanical structure of the sensor and enables system-level diagnostics.

The package configuration is a 36 mm × 44 mm × 16 mm mo

dule with a standard 24-lead connector interface.

o

/sec.

FUNCTIONAL BLOCK DIAGRAM

SYNC

ADIS16130

TEMPERATURE

SENSOR

MEMS

ANGULAR

RATE

SENSOR

SELF-TEST

ST ROA1 ROA2 VCC GND

REFERENCE

2:1

MUX

Figure 1.

SYNC

24-BIT

Σ-Δ ADC

SERIAL

INTERFACE

CS SCLK SDI SDO

RDY

07238-001

Rev. A

Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.

ADIS16130

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REVISION HISTORY

3/08—Rev. 0 to Rev. A

Changes to Figure 15...................................................................... 10

Changes to Ordering Guide.......................................................... 13

1/08—Revision 0: Initial Version

Typical Perf or m an c e Chara c t e risti c s ..............................................8

Basic Operation .................................................................................9

Quick Start .....................................................................................9

Configuration Options .............................................................. 10

Control Registers............................................................................ 11

Control Register Details ............................................................ 11

Applications Information.............................................................. 12

Achieving Optimal Noise Performance .................................. 12

Second-Level Assembly ............................................................. 12

Outline Dimensions ....................................................................... 13

Ordering Guide .......................................................................... 13

Rev. A | Page 2 of 16

ADIS16130

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SPECIFICATIONS

TA = 25°C, VCC = 5 V, angular rate = 0°/sec, C

= 0 μF, ±1 g, unless otherwise noted.

OUT

Table 1.

Parameter Conditions Min

1

Typ Max

1

Unit

SENSITIVITY Clockwise rotation is positive output (see Figure 5)

Dynamic Range

2

Full-scale range over specified operating conditions ±250 °/sec Initial 22,548 23,488 24,428 LSB/°/sec Nonlinearity Best-fit straight line 0.04 % of FS

NULL

Initial Null ±1σ ±3 °/sec In-Run Bias Stability 1σ 0.0016 °/sec Angle Random Walk 1σ 0.56 °/√Hr Turn-On Time Power on to ±0.5°/sec of final value, 80 Hz bandwidth 35 ms Linear Acceleration Effect Any axis 0.05 °/sec/g Voltage Sensitivity VCC = 4.75 V to 5.25 V 0.2 °/sec/V

NOISE PERFORMANCE

Rate Noise Density

3

0.0125 °/sec/√Hz

FREQUENCY RESPONSE

Bandwidth −3 dB frequency with no external capacitance 300 Hz Sensor Resonant Frequency 14 kHz

SELF-TEST INPUTS

ST RATEOUT Response

4

ST pins from Logic 0 to Logic 1 65 75 85 °/sec Logic 1 Input Voltage Standard high logic level definition 3.3 V Logic 0 Input Voltage Standard low logic level definition 1.7 V Input Impedance To GND 3.13 kΩ

TEMPERATURE SENSOR

Output at 298 K (25°C) 8,388,608 LSB Scale Factor 14,093 LSB/°C

DIGITAL OUTPUTS

Output Low Voltage (VOL) 0.4 V Output High Voltage (VOH) 4 V

DIGITAL INPUTS

Input Current

CS

10 μA

All others 1 μA Input Capacitance 5 pF VT+ 1.4 2 V VT− 0.8 1.4 V (VT+) – (VT−) 0.3 0.85 V

POWER SUPPLY

Operating Voltage Range 4.75 5.00 5.25 V Quiescent Supply Current I

= 0 mA, 5 V 73 85 mA

OUT

TEMPERATURE RANGE

Operating Range –40 +85 °C

1

All minimum and maximum specifications are guaranteed. Typical specifications are not tested or guaranteed.

2

Dynamic range is the maximum full-scale measurement range possible, including output swing range, initial offset, sensitivity, offset drift, and sensitivity drift at 4.75 V

to 5.25 V supplies.

3

Resulting bias stability is <0.01°/sec.

4

Self-test response varies with temperature, see Figure 12.

Rev. A | Page 3 of 16

ADIS16130

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TIMING SPECIFICATIONS

All input signals are specified with 10% to 90% rise and fall times of less than 5 ns.

Table 2.

Parameter Min Typ Max Unit Test Conditions/Comments

t

1

Read Operation

t

4

1

t

SCLK falling edge to data valid delay

5

0 60 ns DVDD of 4.75 V to 5.25 V

1, 2

t

5A

0 60 ns DVDD of 4.75 V to 5.25 V t

6

t

7

t

8

3

t

9

Write Operation

t

11

t

12

t

13

t

14

t

15

t

16

1

These numbers are measured with the load circuit shown in Figure 4 and defined as the time required for the output to cross the VOL or VOH limits.

2

This specification is relevant only if CS goes low while SCLK is low.

3

These numbers are derived from the measured time taken by the data output to change 0.5 V when loaded with the circuit shown in Figure 4. The measured number

is then extrapolated back to remove effects of charging or discharging the 50 pF capacitor. Therefore, the times quoted are the true bus relinquish times of the part and as such are independent of external bus loading capacitances.

50 ns

0 ns

pulse width

SYNC

falling edge to SCLK falling edge setup time

CS

falling edge to data valid delay

CS

50 ns SCLK high pulse width 50 ns SCLK low pulse width 0 ns

rising edge after SCLK rising edge hold time

CS

10 80 ns Bus relinquish time after SCLK rising edge

0 ns

falling edge to SCLK falling edge setup

CS 30 ns Data valid to SCLK rising edge setup time 25 ns Data valid after SCLK rising edge hold time 50 ns SCLK high pulse width 50 ns SCLK low pulse width 0 ns

rising edge after SCLK rising edge hold time

CS

Rev. A | Page 4 of 16

ADIS16130

SCLK

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CS

t

11

SCLK

t

12

t

13

SDI MSB LSB

t

14

t

15

t

16

07238-002

Figure 2. Input Timing for Write Operation

CS

t

8

t

9

07238-003

SDO

t

4

t

5

t

5A

MSB LSB

t

6

t

7

Figure 3. Output Timing for Read Operation

(800µA AT DVDD = 5V

I

SINK

100µA AT DV

DD

= 3V)

TO OUTPUT

50pF

I

SOURCE

1.6V

(200µA AT DVDD = 5V

100µA AT DV

DD

= 3V)

07328-024

Figure 4. Load Circuit for Access Time and Bus Relinquish Time

Rev. A | Page 5 of 16

ANALOG DEVICES ADIS16130 Service Manual

FEATURES

APPLICATIONS

GENERAL DESCRIPTION

FUNCTIONAL BLOCK DIAGRAM

TABLE OF CONTENTS

REVISION HISTORY

SPECIFICATIONS

TIMING SPECIFICATIONS