The ADIS16006 is a low cost, low power, complete dual-axis
accelerometer with an integrated serial peripheral interface
(SPI). An integrated temperature sensor is also available on the
SPI interface. The ADIS16006 measures acceleration with a fullscale range of ±5 g (minimum). The ADIS16006 can measure both
dynamic acceleration (vibration) and static acceleration (gravity).
The typical noise floor is 200 μg/
1.9 mg (60 Hz bandwidth) to be resolved.
The bandwidth of the accelerometer is set with optional
ca
pacitors, C
and CY, at the XFILT pin and the YFILT pin.
X
Digital output data for both axes is available via the serial interface.
An externally driven self-test pin (ST) allows the user to verify
th
e accelerometer functionality.
The ADIS16006 is available in a 7.2 mm × 7.2 mm × 3.7 mm,
12-t
erminal LGA package.
√Hz, allowing signals below
FUNCTIONAL BLOCK DIAGRAM
V
CC
ADIS16006
DUAL-AXIS
±5g
ACCELEROMETER
C
DC
COMST
YFILT
C
XFILT
Y
Figure 1.
C
X
SERIAL
INTERFACE
TEMP
SENSOR
SCLK
DIN
DOUT
CS
TCS
05975-001
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
TA = −40°C to +125°C, VCC = 5 V, CX = CY = 0 μF, acceleration = 0 g, unless otherwise noted. All minimum and maximum specifications
are guaranteed. Typical specifications are not guaranteed.
Table 1.
Parameter Conditions Min Typ Max Unit
ACCELEROMETER SENSOR INPUT Each axis
Measurement Range
Nonlinearity % of full scale ±0.5 ±2.5 %
Package Alignment Error ±1.5 Degrees
Alignment Error X sensor to Y sensor ±0.1 Degrees
Cross-Axis Sensitivity ±1.5 ±3 %
ACCELEROMETER SENSITIVITY Each axis
Sensitivity at XFILT, YFILT 242 256 272 LSB/g
Sensitivity Change due to Temperature
ZERO g BIAS LEVEL Each axis
0 g Voltage at XFILT, YFILT 1905 2048 2190 LSB
0 g Offset vs. Temperature ±0.1 LSB/°C
Logic Input Low 0.2 × VCCV
Logic Input High 0.8 × V
ST Input Resistance to COM 30 50 kΩ
Output Change at X
TEMPERATURE SENSOR
Accuracy VCC = 3 V to 5.25 V ±2 °C
Resolution 10 Bits
Update Rate 400 μs
Temperature Conversion Time 25 μs
DIGITAL INPUT
Input High Voltage (V
V
Input Low Voltage (V
Input Current VIN = 0 V or V
Input Capacitance 10 pF
DIGITAL OUTPUT
Output High Voltage (VOH) I
Output Low Voltage (VOL) I
1
2
3, 4
5
, Y
T
OUT
OUT
) VCC = 4.75 V to 5.25 V 2.4 V
INH
) VCC = 3.0 V to 5.25 V 0.8 V
INL
±5
Delta from 25°C ±0.3 %
V
CC
Self-Test 0 to Self-Test 1 102 205 307 LSB
= 3.0 V to 3.6 V 2.1 V
CC
CC
= 200 μA, VCC = 3.0 V to 5.25 V VCC − 0.5 V
SOURCE
= 200 μA 0.4 V
SINK
−10 +1 +10 μA
Rev. A | Page 3 of 16
g
ADIS16006
www.BDTIC.com/ADI
Parameter Conditions Min Typ Max Unit
POWER SUPPLY
Operating Voltage Range 3.0 5.25 V
Quiescent Supply Current f
Power-Down Current 1.0 mA
Turn-On Time
1
Guaranteed by measurement of initial offset and sensitivity.
2
Defined as the output change from ambient-to-maximum temperature or ambient-to-minimum temperature.
3
Actual bandwidth response controlled by user-supplied external capacitor (CX, CY).
4
See the Setting the Bandwidth section for more information on how to reduce the bandwidth.
5
Self-test response changes as the square of VCC.
6
Larger values of CX and CY increase turn-on time. Turn-on time is approximately (160 × (0.0022 + CX or CY) + 4) in milliseconds, where CX and CY are in μF.
6
TIMING SPECIFICATIONS
TA = −40°C to +125°C, acceleration = 0 g, unless otherwise noted.
= 50 kSPS 1.5 1.9 mA
SCLK
CX, CY = 0.1 μF 20 ms
Table 2.
Parameter
f
SCLK
1, 2
3
VCC = 3.3 V VCC = 5 V Unit Description
10 10 kHz min
2 2 MHz max
t
CONVER T
t
ACQ
t
1
4
t
2
4
t
3
t
4
t
5
t
6
t
7
5
t
8
6
t
9
1
Guaranteed by design. All input signals are specified with tR and tF = 5 ns (10% to 90% of VCC) and timed from a voltage level of 1.6 V. The 3.3 V operating range spans
from 3.0 V to 3.6 V. The 5 V operating range spans from 4.75 V to 5.25 V.
2
See Figure 3 and Figure 4.
3
Mark/space ratio for the SCLK input is 40/60 to 60/40.
4
Measured with the load circuit in Figure 2 and defined as the time required for the output to cross 0.4 V or 2.0 V with VCC = 3.3 V and time for an output to cross 0.8 V or
2.4 V with V
5
t8 is derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit in Figure 2. The measured number is then extrapolated
back to remove the effects of charging or discharging the 50 pF capacitor. This means that the time, t8, quoted in the Timing Specifications is the true bus relinquish
time of the part and is independent of the bus loading.
6
Shut-down recovery time denotes the time it takes to start producing samples and does not account for the recovery time of the sensor, which is dependent on the
overall bandwidth.
= 5.0 V.
CC
14.5 × t
SCLK
1.5 × t
SCLK
10 10 ns min
60 30 ns max
14.5 × t
1.5 × t
SCLK
SCLK
Throughput time = t
/CS to SCLK setup time
TCS
Delay from TCS
+ t
CONVER T
= 16 × t
ACQ
/CS until DOUT three-state disabled
100 75 ns max Data access time after SCLK falling edge
20 20 ns min Data setup time prior to SCLK rising edge
20 20 ns min Data hold time after SCLK rising edge
0.4 × t
SCLK
0.4 × t
SCLK
80 80 ns max
0.4 × t
0.4 × t
SCLK
SCLK
ns min SCLK high pulse width
ns min SCLK low pulse width
/CS rising edge to DOUT high impedance
TCS
5 5 μs typ Power-up time from shutdown
SCLK
Rev. A | Page 4 of 16
ADIS16006
www.BDTIC.com/ADI
CIRCUIT AND TIMING DIAGRAMS
200µAI
TO OUTPUT
PIN
C
L
50pF
200µAI
Figure 2. Load Circuit for Digital Out
OL
1.6V
OH
05975-002
put Timing Specifications
t
ACQ
CS
t
1
SCLK
THREE-STATETHREE-STATE
DOUT
DIN
1
t
2
t
4
t
5
DON’T
CARE
t
6
234
t
7
4 LEADING Z E ROS
ZEROZEROZEROADD0ONEZEROPM0
5615
Figure 3. Accelerometer Serial Interface Timing Diagram
t
3
DB11
t
CONVERT
DB10
16
DB9DB0
t
8
5975-003
TCS
t
1
SCLK
THREESTATETHREE-STATE
DOUT
1
LEADING
ZERO
t
6
234
t
3
t
7
DB9DB8
1115
DB0
16
t
8
DIN
5975-004
Figure 4. Temperature Serial Interface Timing Diagram
Rev. A | Page 5 of 16
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