Datasheet ADIS16006 Datasheet (ANALOG DEVICES)

Dual-Axis ±5 g Accelerometer

www.BDTIC.com/ADI

FEATURES

Dual-axis accelerometer
SPI digital output interface
Internal temperature sensor
Highly integrated; minimal external components
Bandwidth externally selectable

1.9 mg resoluti
Externally controlled electrostatic self-test

3.0 V to 5.25 V single-supply operation
Low power: <2 mA
3500 g shock s

7.2 mm × 7.2 mm × 3.7 mm package

APPLICATIONS

Industrial vibration/motion sensing
Platform stabilization
Dual-axis tilt sensing
Tracking, recording, analysis devices
Alarms and security devices

on at 60 Hz

urvival

with SPI Interface

ADIS16006

GENERAL DESCRIPTION

The ADIS16006 is a low cost, low power, complete dual-axis
accelerometer with an integrated serial peripheral interface
(SPI). An integrated temperature sensor is also available on the
SPI interface. The ADIS16006 measures acceleration with a full­scale range of ±5 g (minimum). The ADIS16006 can measure both
dynamic acceleration (vibration) and static acceleration (gravity).

The typical noise floor is 200 μg/

1.9 mg (60 Hz bandwidth) to be resolved.
The bandwidth of the accelerometer is set with optional

ca

pacitors, C

and CY, at the XFILT pin and the YFILT pin.

X

Digital output data for both axes is available via the serial interface.
An externally driven self-test pin (ST) allows the user to verify

th

e accelerometer functionality.

The ADIS16006 is available in a 7.2 mm × 7.2 mm × 3.7 mm,
12-t

erminal LGA package.

√Hz, allowing signals below

FUNCTIONAL BLOCK DIAGRAM

V

CC

ADIS16006

DUAL-AXIS

±5g

ACCELEROMETER

C

DC

COM ST

YFILT

C

XFILT

Y

Figure 1.

C

X

SERIAL

INTERFACE

TEMP

SENSOR

SCLK
DIN
DOUT
CS
TCS

05975-001

Rev. A

Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: [phone] www.analog.com
Fax: [phone] ©2007 Analog Devices, Inc. All rights reserved.

ADIS16006

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TABLE OF CONTENTS

Features .............................................................................................. 1

Applications....................................................................................... 1

General Description......................................................................... 1

Functional Block Diagram .............................................................. 1

Revision History ............................................................................... 2

Specifications..................................................................................... 3

Timing Specifications .................................................................. 4

Circuit and Timing Diagrams..................................................... 5

Absolute Maximum Ratings............................................................ 6

ESD Caution.................................................................................. 6

Pin Configuration and Function Descriptions............................. 7

Typical Performance Characteristics............................................. 8

Theory of Operation ...................................................................... 11

REVISION HISTORY

10/07—Rev. 0 to Rev. A

Changes to Features and General Description .............................1

Added Note 6 to Table 2 .................................................................. 4

Changes to Figure 5.......................................................................... 6

Changes to Accelerometer Control Register Section................. 11

Changes to Layout.......................................................................... 13

Changes to Layout.......................................................................... 14

Deleted Figure 24 and Table 11..................................................... 14

Edited Second-Level Assembly Section....................................... 15

Updated Outline Dimensions....................................................... 16

Changes to Ordering Guide.......................................................... 16

3/06—Revision 0: Initial Version

Self-Test .......................................................................................11

Serial Interface............................................................................ 11

Accelerometer Serial Interface.................................................. 11

Temperature Sensor Serial Interface........................................ 12

Power Supply Decoupling .........................................................12

Setting the Bandwidth ...............................................................13

Selecting Filter Characteristics:

The Noise/Bandwidth Trade-Off .............................................. 13

Applications..................................................................................... 15

Second Level Assembly ............................................................. 15

Outline Dimensions .......................................................................16

Ordering Guide .......................................................................... 16

Rev. A | Page 2 of 16

ADIS16006

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SPECIFICATIONS

TA = −40°C to +125°C, VCC = 5 V, CX = CY = 0 μF, acceleration = 0 g, unless otherwise noted. All minimum and maximum specifications
are guaranteed. Typical specifications are not guaranteed.

Table 1.

Parameter Conditions Min Typ Max Unit

ACCELEROMETER SENSOR INPUT Each axis

Measurement Range
Nonlinearity % of full scale ±0.5 ±2.5 %
Package Alignment Error ±1.5 Degrees
Alignment Error X sensor to Y sensor ±0.1 Degrees
Cross-Axis Sensitivity ±1.5 ±3 %

ACCELEROMETER SENSITIVITY Each axis

Sensitivity at XFILT, YFILT 242 256 272 LSB/g
Sensitivity Change due to Temperature

ZERO g BIAS LEVEL Each axis

0 g Voltage at XFILT, YFILT 1905 2048 2190 LSB
0 g Offset vs. Temperature ±0.1 LSB/°C

ACCELEROMETER NOISE PERFORMANCE

Noise Density At 25°C 200 μg/√Hz rms

ACCELEROMETER FREQUENCY RESPONSE

CX, CY Range 0 10 μF
R

Tolerance 24 32 40 kΩ

FILT

Sensor Bandwidth CX = 0 μF, CY = 0 μF 2.26 kHz
Sensor Resonant Frequency 5.5 kHz

ACCELEROMETER SELF-TEST

Logic Input Low 0.2 × VCCV
Logic Input High 0.8 × V
ST Input Resistance to COM 30 50 kΩ
Output Change at X

TEMPERATURE SENSOR

Accuracy VCC = 3 V to 5.25 V ±2 °C
Resolution 10 Bits
Update Rate 400 μs
Temperature Conversion Time 25 μs

DIGITAL INPUT

Input High Voltage (V
V
Input Low Voltage (V
Input Current VIN = 0 V or V
Input Capacitance 10 pF

DIGITAL OUTPUT

Output High Voltage (VOH) I
Output Low Voltage (VOL) I

1

2

3, 4

5

, Y

T

OUT

OUT

) VCC = 4.75 V to 5.25 V 2.4 V

INH

) VCC = 3.0 V to 5.25 V 0.8 V

INL

±5

Delta from 25°C ±0.3 %

V

CC

Self-Test 0 to Self-Test 1 102 205 307 LSB

= 3.0 V to 3.6 V 2.1 V

CC

CC

= 200 μA, VCC = 3.0 V to 5.25 V VCC − 0.5 V

SOURCE

= 200 μA 0.4 V

SINK

−10 +1 +10 μA

Rev. A | Page 3 of 16

g

ADIS16006

www.BDTIC.com/ADI

Parameter Conditions Min Typ Max Unit

POWER SUPPLY

Operating Voltage Range 3.0 5.25 V

Quiescent Supply Current f

Power-Down Current 1.0 mA

Turn-On Time

1

Guaranteed by measurement of initial offset and sensitivity.

2

Defined as the output change from ambient-to-maximum temperature or ambient-to-minimum temperature.

3

Actual bandwidth response controlled by user-supplied external capacitor (CX, CY).

4

See the Setting the Bandwidth section for more information on how to reduce the bandwidth.

5

Self-test response changes as the square of VCC.

6

Larger values of CX and CY increase turn-on time. Turn-on time is approximately (160 × (0.0022 + CX or CY) + 4) in milliseconds, where CX and CY are in μF.

6

TIMING SPECIFICATIONS

TA = −40°C to +125°C, acceleration = 0 g, unless otherwise noted.

= 50 kSPS 1.5 1.9 mA

SCLK

CX, CY = 0.1 μF 20 ms

Table 2.

Parameter

f

SCLK

1, 2

3

VCC = 3.3 V VCC = 5 V Unit Description

10 10 kHz min
2 2 MHz max
t

CONVER T

t

ACQ

t

1

4

t

2

4

t

3

t

4

t

5

t

6

t

7

5

t

8

6

t

9

1

Guaranteed by design. All input signals are specified with tR and tF = 5 ns (10% to 90% of VCC) and timed from a voltage level of 1.6 V. The 3.3 V operating range spans

from 3.0 V to 3.6 V. The 5 V operating range spans from 4.75 V to 5.25 V.

2

See Figure 3 and Figure 4.

3

Mark/space ratio for the SCLK input is 40/60 to 60/40.

4

Measured with the load circuit in Figure 2 and defined as the time required for the output to cross 0.4 V or 2.0 V with VCC = 3.3 V and time for an output to cross 0.8 V or

2.4 V with V

5

t8 is derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit in Figure 2. The measured number is then extrapolated

back to remove the effects of charging or discharging the 50 pF capacitor. This means that the time, t8, quoted in the Timing Specifications is the true bus relinquish
time of the part and is independent of the bus loading.

6

Shut-down recovery time denotes the time it takes to start producing samples and does not account for the recovery time of the sensor, which is dependent on the

overall bandwidth.

= 5.0 V.

CC

14.5 × t

SCLK

1.5 × t

SCLK

10 10 ns min

60 30 ns max

14.5 × t

1.5 × t

SCLK

SCLK

Throughput time = t

/CS to SCLK setup time

TCS
Delay from TCS

+ t

CONVER T

= 16 × t

ACQ

/CS until DOUT three-state disabled
100 75 ns max Data access time after SCLK falling edge
20 20 ns min Data setup time prior to SCLK rising edge
20 20 ns min Data hold time after SCLK rising edge

0.4 × t

SCLK

0.4 × t

SCLK

80 80 ns max

0.4 × t

0.4 × t

SCLK

SCLK

ns min SCLK high pulse width
ns min SCLK low pulse width

/CS rising edge to DOUT high impedance

TCS

5 5 μs typ Power-up time from shutdown

SCLK

Rev. A | Page 4 of 16

ADIS16006

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CIRCUIT AND TIMING DIAGRAMS

200µA I

TO OUTPUT

PIN

C

L

50pF

200µA I

Figure 2. Load Circuit for Digital Out

OL

1.6V

OH

05975-002

put Timing Specifications

t

ACQ

CS

t

1

SCLK

THREE-STATE THREE-STATE

DOUT

DIN

1

t

2

t

4

t

5

DON’T

CARE

t

6

234

t

7

4 LEADING Z E ROS

ZERO ZERO ZERO ADD0 ONE ZERO PM0

56 15

Figure 3. Accelerometer Serial Interface Timing Diagram

t

3

DB11

t

CONVERT

DB10

16

DB9 DB0

t

8

5975-003

TCS

t

1

SCLK

THREE­STATE THREE-STATE

DOUT

1

LEADING

ZERO

t

6

234

t

3

t

7

DB9 DB8

11 15

DB0

16

t

8

DIN

5975-004

Figure 4. Temperature Serial Interface Timing Diagram

Rev. A | Page 5 of 16

ADIS16006

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ABSOLUTE MAXIMUM RATINGS

Table 3.

Parameter Rating

Acceleration (Any Axis, Unpowered) 3500 g
Acceleration (Any Axis, Powered) 3500 g
V

CC

−0.3 V to +7.0 V
All Other Pins (COM − 0.3 V) to (VCC + 0.3 V)
Output Short-Circuit Duration

Indefinite

(Any Pin to Common)
Operating Temperature Range −40°C to +125°C
Storage Temperature Range −65°C to +150°C

Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.

Table 4. Package Characteristics

Package Type θ

JA

θ

JC

Device Weight

12-Terminal LGA 200°C/W 25°C/W 0.3 grams

3.1865

1.797
8×

3.594

6.373
4×

2×

1.127
12×

7.2mm × 7.2mm S TACKED LGA. ALL DIMENSIONS IN mm.

Figure 5. Second-Level Assembly Pad Layout

8×

0.670
8×

0.500
12×

05975-005

ESD CAUTION

Rev. A | Page 6 of 16

ADIS16006

K

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PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

CC

V

ADIS16006

TOP VIEW

(Not to S cale)

NC

CS

1012 11

9

XFILT

82

YFILT

7

NC

65

ST

05975-006

1

TCS

DOUT

3

DIN

NC = NO CONNECT

SCL

4

COM

Figure 6. Pin Configuration

Table 5. Pin Function Descriptions

Pin No. Mnemonic Description

1

TCS

Temperature Chip Select. Active low logic input. This input frames the serial data transfer for the temperature
sensor output.

2 DOUT

Data Out, Logic Output. The conversion of the ADIS16006 is pr

ovided on this output as a serial data stream.

The bits are clocked out on the falling edge of the SCLK input.

3 DIN

Data In, Logic Input. Data to be written into the control r

egister of the ADIS16006 is provided on this input and

is clocked into the register on the rising edge of SCLK.
4 COM Common. Reference point for all circuitry on the ADIS16006.
5, 7 NC No Connect.
6 ST Self-Test Input. Active high logic input. Simulates a nominal 0.75 g test input for diagnostic purpose.
8 YFILT

Y-Channel Filter Node. Used in conjunction with an optiona

l external capacitor to band limit the noise

contribution from the accelerometer.
9 XFILT

X-Channel Filter Node. Used in conjunction with an optiona

l external capacitor to band limit the noise

contribution from the accelerometer.
10

CS

Chip Select. Active low logic input. This input provides the dual function of initiating the accelerometer

conversions on the ADIS16006 and framing the serial data transfer for the accelerometer output.
11 V

CC

12 SCLK

Power Supply Input. The VCC range for the ADIS16006 is 3.0 V to 5.25 V.

Serial Clock, Logic Input. SCLK provides the serial clock for ac

cessing data from the part and writing serial data to

the control register. This clock input is also used as the clock source for the conversion process of the ADIS16006.

Rev. A | Page 7 of 16

ADIS16006

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TYPICAL PERFORMANCE CHARACTERISTICS

25

262

261

260

259

258

257

SENSITIVITY (LSB/g)

256

255

254

–50 –25 0 25 50 75 100 125 150

TEMPERATURE (° C)

Figure 7. Sensitivity vs. Temperature (±1 g Stimulus)

2048

2046

2044

AVG AT 3.60V

5.25V
AVG AT 5.25V

AVG AT 4.75V

B3-Y
B3-X
B1-Y

B5-X
B2-X

B1-X

B5-Y
B4-X

B2-Y
B4-Y

05975-007

AVERAGE = 2040. 6 6
STANDARD DEVIAT ION = 23.19

20

15

10

5

PERCENT OF POPULATION (%)

0

1995

2000

2005

2010

Figure 10. X-Axis 0 g B

40

AVERAGE = 2055. 8 75
STANDARD DEVIAT ION = 6.464

35

30

25

20

2015

2020

2025

2030

2035

2040

2045

OUTPUT (LSB)

ias at 25°C

2050

2055

2060

2065

2070

2075

2080

2085

2090

05975-010

2042

BIAS LEVEL (L SB)

2040

2038

–40 –20 0 20 40 60 80 100 120

TEMPERATURE (°C)

Figure 8. X-Axis 0 g

AVG AT 3.00V

Bias vs. Temperature

2048

2047

2046

2045

2044

2043

2042

BIAS LEVEL (L S B)

2041

2040

2039

2038

3.0 5.55.04.54.03.5

Figure 9. X-Axis 0 g

+125°C

+25°C

–40°C

VCC (V)

Bias vs. Supply Voltage

AVG AT 3. 30V

15

10

PERCENT OF POPULATION (%)

5

0

1995

2000

2005

2010

2015

2020

2025

2030

2035

2040

2045

2050

2055

2060

2065

2070

2075

2080

2085

05975-008

Figure 11. Y-Axis 0 g B

OUTPUT (LSB)

ias at 25°C

2090

05975-011

60

50

40

30

20

PERCENT OF POPULATION (%)

10

0

80 85 90 95 100 105 110 115 120 125 130 135 140

05975-009

Figure 12. Noise (X-Axis) at V

NOISE (µg/ Hz)

= 5 V, 25°C

CC

05975-012

Rev. A | Page 8 of 16

ADIS16006

www.BDTIC.com/ADI

45

40

35

30

25

20

15

10

PERCENT OF POPULATION (%)

5

0

80 85 90 95 100 105 110 115 120 125 130 135 140

Figure 13. Noise (Y-Axis) at V

NOISE (µg/ Hz)

= 5 V, 25°C

CC

40

AVERAGE = 202. 21 37
STANDARD DEVIATION = 12.09035

35

30

25

20

15

10

PERCENT OF POPULATION (%)

5

0

110 130 150 170 190 210 230 250 270 290

Figure 14. X-Axis Self-Test at V

OUTPUT (LSB)

= 5 V, 25°C

CC

40

AVERAGE = 82.8928 1
STANDARD DEVIATION = 4. 9080 12

35

30

25

20

15

10

PERCENT OF POPULATION (%)

5

0

OUTPUT (LSB)

Figure 15. X-Axis Self-Test at V

= 3.3 V, 25°C

CC

05975-013

05975-014

110105100959085807570656055504540

05975-015

250

200

150

100

SELF TEST (L SB)

50

0

AVG AT 5.25V

AVG AT 5.00V

AVG AT 4.75V

AVG AT 3.60V
AVG AT 3.30V

AVG AT 3.00V

TEMPERATURE (° C)

15050 1000–50

05975-016

Figure 16. Self-Test X-Axis vs. Temperature

250

230

210

190

170

150

130

SELF TEST (LSB)

110

90

70

50

4.0 4.5 5.03.53.0
VCC (V)

+125°C

–40°C

+25°C

5.5

05975-017

Figure 17. Self-Test X-Axis vs. Supply Voltage

1.8

1.7

1.6

1.5

1.4

1.3

SUPPLY CURRENT (mA)

1.2

1.1

1.0

VCC (V)

+125°C

+25°C

–40°C

5.54.0 4.5 5.03.53.0

05975-018

Figure 18. Supply Current vs. Supply Voltage

Rev. A | Page 9 of 16

ADIS16006

www.BDTIC.com/ADI

45

35

25

15

5

PERCENT OF POPULATION (%)

–5

VCC = 5.0V
VCC = 3.3V

CURRENT (mA)

1.591.15 1.19 1.23 1.27 1.31 1.35 1.39 1.43 1.47 1.51 1.55

05975-023

Figure 19. Supply Current at 25°C

60

50

40

VCC = 5.0V
VCC = 3.3V

1.3

1.2

1.1
+125°C

1.0

0.9

0.8

0.7

POWER-DO W N SUPPLY CURRENT ( mA)

0.6

+25°C

–40°C

VCC (V)

Figure 21. Power-Down Supply Current vs. Supply Voltage

0.6

0.4

0.2

0

5.55.04.54.03.53.0

05975-020

30

20

PERCENT OF POPULATION (%)

10

0

CURRENT (mA)

1.100.70 0.74 0.78 0.82 0.86 0.90 0.94 0.98 1.02 1.06

05975-019

Figure 20. Power-Down Supply Current

–0.2

–0.4

SAMPLING ERROR (dB)

–0.6

–0.8

–1.0

SAMPLE RATE (kSPS)

Figure 22. Sampling Error vs. Sampling Frequency

100110

05975-024

Rev. A | Page 10 of 16

ADIS16006

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THEORY OF OPERATION

The ADIS16006 is a low cost, low power, complete dual-axis
accelerometer with an integrated serial peripheral interface
(SPI) and an integrated temperature sensor whose output is
also available on the SPI interface. The ADIS16006 is capable of
measuring acceleration with a full-scale range of ±5 g (minimum).
The ADIS16006 can measure both dynamic acceleration
(vibration) and static acceleration (gravity).

SELF-TEST

The ST pin controls the self-test feature. When this pin is set to

, an electrostatic force is exerted on the beam of the acceler-

V

CC

ometer. The resulting movement of the beam allows the user to
test if the accelerometer is functional. The typical change in
output is 801 mg (corresponding to 205 LSB) for V
This pin can be left open-circuit or connected to common in
normal use. The ST pin should never be exposed to voltage
greater than V
condition cannot be guaranteed (for example, multiple supply
voltages are present), a low V
V

is recommended.

CC

+ 0.3 V. If the system design is such that this

CC

clamping diode between ST and

F

= 5.0 V.

CC

SERIAL INTERFACE

The serial interface on the ADIS16006 consists of five wires: CS,
TCS

, SCLK, DIN, and DOUT. Both accelerometer axes and the

temperature sensor data are available on the serial interface.

TCS

CS

The

and
perature sensor outputs, respectively.
active at the same time.

The SCLK input accesses data from the internal data registers.

are used to select the accelerometer or tem-

CS

TCS

and

cannot be

ACCELEROMETER SERIAL INTERFACE

Figure 3 shows the detailed timing diagram for serial interfacing to
the accelerometer in the ADIS16006. The serial clock provides
the conversion clock.
data transfer and also frames the serial data transfer for the
accelerometer output. The accelerometer output is sampled on
the second rising edge of the SCLK input after the falling edge

CS

of

. The conversion requires 16 SCLK cycles to complete. The
rising edge of
low, the next digital conversion is initiated. The details for the

control register bit functions are shown in Tabl e 6.

CS

CS

initiates the conversion process and

puts the bus back into three-state. If CS remains

Accelerometer Control Register

MSB LSB

DONTC ZERO ZERO ZERO ADD0 ONE ZERO PM0

Table 6. Accelerometer Control Register Bit Functions

Bit Mnemonic Comments

7 DONTC Don’t care. Can be 1 or 0.
6, 5, 4 ZERO These bits should be held low.
3 ADD0

2 ONE This bit should be held high.
1 ZERO This bit should be held low.
0 PM0

This address bit selects the x-axis or y-axis

. A 0 selects the x-axis; a 1 selects

outputs
the y-axis.

This bit selects the operation mode for

celerometer; set to 0 for normal

the ac
operation and 1 for power-down mode.

Power-Down

By setting PM0 to 1 when updating the accelerometer
control register, the ADIS16006 goes into shutdown mode.
The information stored in the control register is maintained
during shutdown. The ADIS16006 changes modes as soon as the
control register is updated. If the part is in shutdown mode and
PM0 is changed to 0, the part powers up on the 16th SCLK
rising edge.

ADD0

By setting ADD0 to 0 when updating the accelerometer control
register, the x-axis output is selected. By setting ADD0 to 1, the
y-axis output is selected.

ZERO

ZERO is defined as the Logic low level.

ONE

ONE is defined as the Logic high level.

DONTC

DONTC is defined as don’t care and can be a low or high
logic level.

Accelerometer Conversion Details

Every time the accelerometer is sampled, the sampling function
discharges the internal C
of their initial values (assuming no additional external filtering
capacitors are added). The recovery time for the filter capacitor
to recharge is approximately 10 μs. Therefore, sampling the
accelerometer at a rate of 10 kSPS or less does not induce a
sampling error. However, as sampling frequencies increase
above 10 kSPS, one can expect sampling errors to attenuate
the actual acceleration levels.

or CY filtering capacitors by up to 2%

X

Rev. A | Page 11 of 16

ADIS16006

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TEMPERATURE SENSOR SERIAL INTERFACE

Read Operation

Figure 4 shows the timing diagram for a serial read from the

TCS

temperature sensor. The
Ten bits of data and a leading zero are transferred during a read
operation. Read operations occur during streams of 16 clock
pulses. The serial data can be received into two bytes to
accommodate the entire 10-bit data stream. If only eight bits
of resolution are required, the data can be received into a single
byte. At the end of the read operation, the DOUT line remains
in the state of the last bit of data clocked out until
high, at which time the DOUT line from the temperature
sensor goes three-state.

Write Operation

Figure 4 also shows the timing diagram for the serial write
to the temperature sensor. The write operation takes place at
the same time as the read operation. Data is clocked into the
control register on the rising edge of SCLK. DIN should remain
low for the entire cycle.

Temperature Sensor Control Register

MSB LSB

ZERO ZERO ZERO ZERO ZERO ZERO ZERO ZERO

Table 7. Temperature Sensor Control Register Bit Functions

Bit Mnemonic Comments

7 to 0 ZERO All bits should be held low.

ZERO

ZERO is defined as the Logic low level.

Output Data Format

The output data format for the temperature sensor is twos
complement. Tabl e 8 shows the relationship between the

emperature and the digital output.

t

Table 8. Temperature Sensor Data Format

Temperature Digital Output (DB9 … DB0)

−40°C 11 0110 0000

−25°C 11 1001 1100

−0.25°C 11 1111 1111
0°C 00 0000 0000
+0.25°C 00 0000 0001
+10°C 00 0010 1000
+25°C 00 0110 0100
+50°C 00 1100 1000
+75°C 01 0010 1100
+100°C 01 1001 0000
+125°C 01 1111 0100

line enables the SCLK input.

TCS

goes

Temperature Sensor Conversion Details

The ADIS16006 features a 10-bit digital temperature sensor that
allows an accurate measurement of the ambient device temperature
to be made.

The conversion clock for the temperature sensor is internally

enerated; therefore, no external clock is required except when

g
reading from and writing to the serial port. In normal mode, an
internal clock oscillator runs the automatic conversion sequence. A
conversion is initiated approximately every 350 μs. At this time,
the temperature sensor wakes up and performs a temperature
conversion. This temperature conversion typically takes 25 μs,
at which time the temperature sensor automatically shuts down.
The result of the most recent temperature conversion is avail­able in the serial output register at any time. Once the conversion is
finished, an internal oscillator starts counting and is designed to
time out every 350 μs. The temperature sensor then powers up
and does a conversion.

TCS

If the
temperature value is output onto the DOUT line every time
without changing. It is recommended that the
be brought low every 350 μs (±30%) or less. The ±30% covers
process variation. The
outside this range.

The device is designed to autoconvert every 350 μs. If the
t

emperature sensor is accessed during the conversion process,
an internal signal is generated to prevent any update of the
temperature value register during the conversion. This prevents
the user from reading back spurious data. The design of this
feature results in this internal lockout signal being reset only at
the start of the next autoconversion. Therefore, if the
goes active before the internal lockout signal is reset to its inactive
mode, the internal lockout signal is not reset. To ensure that no
lockout signal is set, bring
(±30%). As a result, the temperature sensor is not interrupted
during a conversion process.

In the automatic conversion mode, every time a read or write
o

peration takes place, the internal clock oscillator is restarted at
the end of the read or write operation. The result of the conversion
is typically available 25 μs later. Reading from the device before
conversion is complete provides the same set of data.

is brought low every 350 μs (±30%) or less, the same

TCS

line not

TCS

should become active (high to low)

TCS

line

TCS

low at a greater time than 350 μs

POWER SUPPLY DECOUPLING

The ADIS16006 integrates two decoupling capacitors that are

0.047 μF in value. For local operation of the ADIS16006, no
additional power supply decoupling capacitance is required.
However, if the system power supply presents a substantial
amount of noise, additional filtering can be required. If additional
capacitors are required, connect the ground terminal of each
of these capacitors directly to the underlying ground plane.
Finally, note that all analog and digital grounds should be
referenced to the same system ground reference point.

Rev. A | Page 12 of 16

ADIS16006

www.BDTIC.com/ADI

SETTING THE BANDWIDTH

The ADIS16006 has provisions for band limiting the acceler­ometer. Capacitors can be added at the XFILT pin and the
YFILT pin to implement further low-pass filtering for
antialiasing and noise reduction. The equation for the 3 dB
bandwidth is

= 1/(2π(32 kΩ) × (C

f

−3dB

(XFILT, YFILT)

or more simply,

f

= 5 μF/(C

−3dB

(XFILT, YFILT)

+ 2200 pF)

The tolerance of the internal resistor (R
much as ±25% of its nominal value (32 kΩ); thus, the bandwidth
varies accordingly.

A minimum capacitance of 0 pF for C

Table 9. Filter Capacitor Selection, C

Bandwidth (Hz) Capacitor (μF)

1 4.7
10 0.47
50 0.10
100 0.047
200 0.022
400 0.01
2250 0

+ 2200 pF))

) can vary typically as

FILT

XFILT

and C

XFILT

YFILT

and C

is allowable.

YFILT

SELECTING FILTER CHARACTERISTICS: THE NOISE/BANDWIDTH TRADE-OFF

The accelerometer bandwidth selected ultimately determines
the measurement resolution (smallest detectable acceleration).
Filtering can be used to lower the noise floor, which improves
the resolution of the accelerometer. Resolution is dependent on
the analog filter bandwidth at XFILT and YFILT.

The ADIS16006 has a typical bandwidth of 2.25 kHz with no
ext

ernal filtering. The analog bandwidth can be further

decreased to reduce noise and improve resolution.
The ADIS16006 noise has the characteristics of white Gaussian

oise, which contributes equally at all frequencies and is described

n
in terms of μg/√Hz (that is, the noise is proportional to the
square root of the bandwidth of the accelerometer). The user
should limit bandwidth to the lowest frequency needed by the
application to maximize the resolution and dynamic range of
the accelerometer.

With the single-pole, roll-off characteristic, the typical noise of

e ADIS16006 is determined by

th

rmsNoise = (200 μ

At 100 Hz, the noise is

rmsNoise = (200 μ

Often, the peak value of the noise is desired. Peak-to-peak noise
ca

n only be estimated by statistical methods.

fo

r estimating the probabilities of exceeding various peak

values, given the rms value.

g/√Hz) × (√(BW × 1.57))

g/√Hz) × (√(100 × 1.57)) = 2.5 mg

Table 1 0 is useful

Table 10. Estimation of Peak-to-Peak Noise

Percentage of Time Noise Exceeds

Peak-to-Peak Value

2 × rms 32
4 × rms 4.6
6 × rms 0.27
8 × rms 0.006

Nominal P

eak-to-Peak Value (%)

Rev. A | Page 13 of 16

ADIS16006

www.BDTIC.com/ADI

12

DIGITAL OUTPUT (IN LSBs)

X-AXIS: 1792
Y-AXIS: 2048

3 2 1

1011

8 97

89 7

1011

DIGITAL OUTPUT (IN LSBs)

X-AXIS: 2048
Y-AXIS: 2304

12

4

65

Top View

Not to Scale

4

321

6 5

DIGITAL OUTPUT (IN LSBs)

89 7

X-AXIS: 23 04
Y-AXIS: 20 48

10 11

Figure 23. Output Respons

65

4

65

4

321

12

e vs. Orientation

3 2 1

DIGITAL OUTPUT ( IN LSBs)

X-AXIS: 2048
Y-AXIS: 1792

8 97

DIGITAL OUTPUT (IN LSBs)

X-AXIS: 2 048
Y-AXIS: 2 048

12

11

10

05975-021

Rev. A | Page 14 of 16

ADIS16006

www.BDTIC.com/ADI

APPLICATIONS

SECOND LEVEL ASSEMBLY

The ADIS16006 can be attached to the second level assembly
board using SN63 (or equivalent) or lead-free solder. IPC/
JEDEC J-STD-020 and J-STD-033 provide standard handling
procedures for these types of packages.

Rev. A | Page 15 of 16

ADIS16006

www.BDTIC.com/ADI

OUTLINE DIMENSIONS

3.594
BSC

7.35

MAX

7.20
TYP

6 .373

BSC

(2×)

1.797
BSC

(8×)

9

(4×)

10 12

1

PIN 1
INDICATOR

1.00 BSC
(12×)

TOP VIEW

5.00
TYP

SIDE VIEW

3.70

MAX

0.200
MIN

(ALL SIDES)

7

BOTTOM VIEW

3

46

0.797 BSC
(8×)

0.373 BSC
(12×)

092407-C

Figure 24. 12-Terminal Land Grid Array [LGA]

(CC-12-1)

Dim

ensions shown in millimeters

ORDERING GUIDE

Model Temperature Range Package Description Package Option

ADIS16006CCCZ
ADIS16006/PCBZ

1

Z = RoHS Compliant Part.

1

1

−40°C to +125°C 12-Terminal Land Grid Array (LGA) CC-12-1
Evaluation Board

©2007 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D05975-0-10/07(A)

Rev. A | Page 16 of 16