Analog Devices ADG774ABRQ Datasheet

Low Voltage 400 MHz Quad 2:1 Mux
1 OF 2
DECODER
ADG774A
EN
IN
S1A
S1B
S2A
S2B
S3A
S3B
S4A
S4B
D1
D2
D3
D4
a
FEATURES Bandwidth >400 MHz Low Insertion Loss and On Resistance: 2.2 Typical On-Resistance Flatness 0.3 Typical Single 3 V/5 V Supply Operation Very Low Distortion: <0.3% Low Quiescent Supply Current (1 nA Typical) Fast Switching Times
6 ns
t
ON
3 ns
t
OFF
TTL/CMOS Compatible
GENERAL DESCRIPTION
The ADG774A is a monolithic CMOS device comprising four 2:1 multiplexer/demultiplexers with high impedance outputs. The CMOS process provides low power dissipation yet gives high switching speed and low on resistance. The on-resistance variation is typically less than 0.5 over the input signal range.
The bandwidth of the ADG774A is typically 400 MHz and this, coupled with low distortion (typically 0.3%), makes the part suitable for switching of high-speed data signals.
The on-resistance profile is very flat over the full analog input range ensuring excellent linearity and low distortion. CMOS con­struction ensures ultralow power dissipation.
The ADG774A operates from a single 3.3 V/5 V supply and is TTL logic compatible. The control logic for each switch is shown in the Truth Table.
These switches conduct equally well in both directions when ON. In the OFF condition, signal levels up to the supplies are blocked. The ADG774A switches exhibit break-before-make switching action.
with 3 ns Switching Time
ADG774A

FUNCTIONAL BLOCK DIAGRAM

PRODUCT HIGHLIGHTS

1. Wide bandwidth data rates >400 MHz.
2. Ultralow Power Dissipation.
3. Low leakage over temperature.
4. Break-Before-Make Switching. This prevents channel shorting when the switches are config­ured as a multiplexer.
5. Crosstalk is typically –70 dB @ 10 MHz.
6. Off isolation is typically –65 dB @ 10 MHz.
REV. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 2001
ADG774A–SPECIFICATIONS
1
SINGLE SUPPLY
(VDD = 5 V 10%, GND = 0 V. All specifications T
B Version
to
T
Parameter 25CT
MIN
MAX
ANALOG SWITCH
Analog Signal Range 0 to 2.5 V On Resistance (R
) 2.2 typ VD = 0 V to 1 V; IS = –10 mA
ON
3.5 4 max
On Resistance Match Between
Channels (∆R
)0.15 typ VD = 0 V to 1 V; IS = –10 mA
ON
0.5 max
On Resistance Flatness (R
FLAT(ON)
) 0.3 typ VD = 0 V to 1 V; IS = –10 mA
0.6 max
LEAKAGE CURRENTS
Source OFF Leakage IS (OFF) ± 0.001 nA typ VD = 3 V, VS = 1 V; VD = 1 V, VS = 3 V;
± 0.1 ± 0.25 nA max Test Circuit 2
Drain OFF Leakage I
(OFF) ± 0.001 nA typ VD = 3 V, VS = 1 V; VD = 1 V, VS = 3 V;
D
± 0.1 ± 0.25 nA max Test Circuit 2
Channel ON Leakage I
, IS (ON) ±0.001 nA typ VD = VS = 3 V; VD = VS = 1 V; Test Circuit 3
D
± 0.1 ± 0.25 nA max
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V
INL
INH
2.4 V min
0.8 V max
Input Current
I
INL
or I
INH
0.001 µA typ VIN = V ± 0.1 µA max
CIN, Digital Input Capacitance 3 pF typ
DYNAMIC CHARACTERISTICS
2
tON, tON (EN) 6 ns typ CL = 35 pF, RL = 50 Ω;
12 ns max V
, t
t
OFF
(EN) 3 ns typ CL = 35 pF, RL = 50 Ω;
OFF
6 ns max V
Break-Before-Make Time Delay, t
D
3 ns typ CL = 35 pF, RL = 50 Ω; 1 ns min V
Off Isolation –65 dB typ f = 10 MHz; R Channel-to-Channel Crosstalk –70 dB typ f = 10 MHz; R Bandwidth –3 dB 400 MHz typ Test Circuit 6, R Distortion 0.3 % typ R Charge Injection 6 pC typ C
(OFF) 5 pF typ
C
S
C
(OFF) 7.5 pF typ
D
CD, CS (ON) 12 pF typ
POWER REQUIREMENTS V
I
DD
1 µA max
0.001 µA typ
NOTES
1
Temperature ranges are as follows: B Version, –40°C to +85°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
to T
MIN
unless otherwise noted.)
MAX
Unit Test Conditions/Comments
or V
INL
= 2 V; Test Circuit 4
S
= 2 V; Test Circuit 4
S
= VS2 = 2 V; Test Circuit 5
S1
= 100
L
= 1 nF; Test Circuit 9, VS = 0 V
L
= 5.5 V
DD
Digital Inputs = 0 V or V
INH
= 50 Ω; Test Circuit 7
L
= 50 Ω; Test Circuit 8
L
= 50 Ω;
L
DD
–2–
REV. 0
SINGLE SUPPLY
(VDD = 3 V 10%, GND = 0 V. All specifications T
MIN
to T
unless otherwise noted.)
MAX
1
B Version
T
to
Parameter 25CT
MIN
MAX
Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 to 1.5 V On Resistance (R
)4 typ VD = 0 V to 1 V; IS = –10 mA
ON
67 max
On Resistance Match Between
Channels (∆R
)0.15 typ VD = 0 V to 1 V; IS = –10 mA
ON
0.5 max
On Resistance Flatness (R
FLAT(ON)
) 1.5 typ VD = 0 V to 1 V; IS = –10 mA
3 max
LEAKAGE CURRENTS
Source OFF Leakage IS (OFF) ± 0.001 nA typ VD = 2 V, VS = 1 V; VD = 1 V, VS = 2 V;
± 0.1 ± 0.25 nA max Test Circuit 2
Drain OFF Leakage I
(OFF) ± 0.001 nA typ VD = 2 V, VS = 1 V; VD = 1 V, VS = 2 V;
D
± 0.1 ± 0.25 nA max Test Circuit 2
Channel ON Leakage I
, IS (ON) ±0.001 nA typ VD = VS = 2 V; VD = VS = 1 V; Test Circuit 3
D
± 0.1 ± 0.25 nA max
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V
INL
INH
2.0 V min
0.4 V max
Input Current
I
INL
or I
INH
0.001 µA typ VIN = V
INL
or V
INH
± 0.1 µA max
CIN, Digital Input Capacitance 3 pF typ
DYNAMIC CHARACTERISTICS
2
tON, tON (EN) 7 ns typ CL = 35 pF, RL = 50 Ω;
14 ns max V
t
, t
OFF
(EN) 4 ns typ CL = 35 pF, RL = 50 Ω;
OFF
8 ns max V
Break-Before-Make Time Delay, t
D
3 ns typ CL = 35 pF, RL = 50 Ω;
1 ns min V Off Isolation –65 dB typ f = 10 MHz; R Channel-to-Channel Crosstalk –70 dB typ f = 10 MHz; R Bandwidth –3 dB 400 MHz typ Test Circuit 6; R Distortion 1.5 % typ R Charge Injection 4 pC typ C C
(OFF) 5 pF typ
S
(OFF) 7.5 pF typ
C
D
= 1.5 V; Test Circuit 4
S
= 1.5 V; Test Circuit 4
S
= VS2 = 1.5 V; Test Circuit 5
S1
= 100
L
= 1 nF; Test Circuit 9, VS = 0 V
L
= 50 , Test Circuit 7
L
= 50 , Test Circuit 8
L
= 50
L
CD, CS (ON) 12 pF typ
POWER REQUIREMENTS V
I
DD
1 µA max
= 3.3 V
DD
Digital Inputs = 0 V or V
DD
0.001 µA typ
NOTES
1
Temperature ranges are as follows: B Version, –40°C to +85°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
ADG774A
Table I. Truth Table
EN IN D1 D2 D3 D4 Function
1 X Hi-Z Hi-Z Hi-Z Hi-Z DISABLE 0 0 S1A S2A S3A S4A IN = 0 0 1 S1B S2B S3B S4B IN = 1
–3–REV. 0
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