Analog Devices ADG752 Datasheet

CMOS, Low Voltage
a
FEATURES High Off Isolation –80 dB at 30 MHz –3 dB Signal Bandwidth 250 MHz +1.8 V to +5.5 V Single Supply Low On-Resistance (15 Typically) Low On-Resistance Flatness Fast Switching Times
t
Typically 8 ns
ON
t
Typically 3 ns
OFF
Typical Power Consumption < 0.01 ␮W TTL/CMOS Compatible
APPLICATIONS Audio and Video Switching RF Switching Networking Applications Battery Powered Systems Communication Systems Relay Replacement Sample-and-Hold Systems
RF/ Video, SPDT Switch
ADG752
FUNCTIONAL BLOCK DIAGRAM
ADG752
S1
D
S2
IN
SWITCH SHOWN FOR A LOGIC "1" INPUT
GENERAL DESCRIPTION
The ADG752 is a low voltage SPDT (single pole, double throw) switch. It is constructed using switches in a T-switch configura­tion, which results in excellent Off Isolation while maintaining good frequency response in the ON condition.
High off isolation and wide signal bandwidth make this part suitable for switching RF and video signals. Low power con­sumption and operating supply range of +1.8 V to +5.5 V make it ideal for battery powered, portable instruments.
The ADG752 is designed on a submicron process that provides low power dissipation yet gives high switching speed and low on resistance. This part is a fully bidirectional switch and can handle signals up to and including the supply rails. Break-before-make switching action ensures the input signals are protected against momentary shorting when switching between channels.
The ADG752 is available in 6-lead SOT-23 and 8-lead µSOIC
packages.
PRODUCT HIGHLIGHTS
1. High Off Isolation –80 dB at 30 MHz.
2. –3 dB Signal Bandwidth 250 MHz.
3. Low On Resistance (15 Ω).
4. Low Power Consumption, typically <0.01 µW.
5. Break-Before-Make Switching Action.
6. Tiny 6-lead SOT-23 and 8-lead µSOIC packages.
REV. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 World Wide Web Site: http://www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 1999
ADG752–SPECIFICATIONS
(VDD = +5 V 10%, GND = 0 V, unless otherwise noted.)
B Version
–40ⴗC
Parameter +25ⴗC to +85ⴗC Units Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 V to V On-Resistance (R
)15 typ V
ON
DD
V
= 0 V to VDD, IDS = 10 mA;
S
18 20 max Test Circuit 1
On-Resistance Match Between 0.1 typ V
Channels (∆R
On-Resistance Flatness (R
) 0.6 0.6 max
ON
FLAT(ON)
)2 typ V
3 max V
= 0 V to VDD, IDS = 10 mA
S
= 0 V to 2.5 V, IDS = 10 mA
S
= + 4.5 V
DD
LEAKAGE CURRENTS
Source OFF Leakage I
(OFF) ±0.01 nA typ V
S
= 4.5 V/1 V, VS = 1 V/4.5 V;
D
±0.25 ±3.0 nA max Test Circuit 2
Channel ON Leakage I
(ON) ±0.01 nA typ V
D
S
= VS = 1 V, or 4.5 V;
D
, I
±0.25 ±3.0 nA max Test Circuit 3
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V
INL
INH
2.4 V min
0.8 V max
Input Current
I
INL
or I
INH
0.001 µA typ V
IN
= V
INL
or V
INH
±0.5 µA max
CIN, Digital Input Capacitance 2 pF typ
DYNAMIC CHARACTERISTICS
t
ON
t
OFF
Break-Before-Make Time Delay 6 ns typ R
Off Isolation –80 dB typ R
1
8 ns typ R
13 ns max V
3 ns typ R
5 ns max V
1 ns min V
= 300 , C
L
= 3 V, Test Circuit 4
S
= 300 , C
L
= 3 V, Test Circuit 4
S
= 300 , C
L
= 3 V, Test Circuit 5
S
= 50 , C
L
= 35 pF;
L
= 35 pF;
L
= 35 pF;
L
= 5 pF, f = 30 MHz;
L
Test Circuit 6
Crosstalk –80 dB typ R
= 50 , C
L
= 5 pF, f = 30 MHz;
L
Test Circuit 7
–3 dB Bandwidth 250 MHz typ R
(OFF) 4 pF typ
C
S
= 50 , C
L
= 5 pF, Test Circuit 8
L
CD, CS (ON) 15 pF typ
POWER REQUIREMENTS V
I
DD
0.001 µA typ Digital Inputs = 0 V or +5.5 V
= +5.5 V
DD
0.1 0.5 µA max
NOTES
1
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
REV. 0–2–
SPECIFICATIONS
(VDD = +3 V 10%, GND = 0 V, unless otherwise noted.)
ADG752
B Version
–40ⴗC
Parameter +25ⴗC to +85ⴗC Units Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 V to V On-Resistance (R
)35 typ V
ON
DD
V
= 0 V to VDD, IDS = 10 mA;
S
50 max Test Circuit 1
On-Resistance Match Between 0.2 typ V
Channels (∆R
) 2.5 2.5 max
ON
LEAKAGE CURRENTS V
Source OFF Leakage I
(OFF) ±0.01 nA typ V
S
= 0 V to VDD, IDS = 10 mA
S
= +3.3 V
DD
= 3 V/1 V, VD = 1 V/3 V;
S
±0.25 ±3.0 nA max Test Circuit 2
Channel ON Leakage I
(ON) ±0.01 nA typ V
D
S
= VD = 1 V or 3 V;
S
, I
±0.25 ±3.0 nA max Test Circuit 3
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V
INL
INH
2.0 V min
0.4 V max
Input Current
I
INL
or I
INH
0.001 µA typ V
IN
= V
INL
or V
INH
±0.5 µA max
CIN, Digital Input Capacitance 2 pF typ
DYNAMIC CHARACTERISTICS
t
ON
t
OFF
Break-Before-Make Time Delay 6 ns typ R
Off Isolation –80 dB typ R
1
10 ns typ R
18 ns max V
4 ns typ R
8 ns max V
1 ns min V
= 300 , C
L
= 2 V, Test Circuit 4
S
= 300 , C
L
= 2 V, Test Circuit 4
S
= 300 , C
L
= 2 V, Test Circuit 5
S
= 50 , C
L
= 35 pF;
L
= 35 pF;
L
= 35 pF;
L
= 5 pF, f = 30 MHz;
L
Test Circuit 6
Crosstalk –80 dB typ R
= 50 , C
L
= 5 pF, f = 30 MHz;
L
Test Circuit 7
–3 dB Bandwidth 250 MHz typ R
(OFF) 4 pF typ
C
S
= 50 , C
L
= 5 pF, Test Circuit 8
L
CD, CS (ON) 15 pF typ
POWER REQUIREMENTS V
I
DD
0.001 µA typ Digital Inputs = 0 V or +3.3 V
= +3.3 V
DD
0.1 0.5 µA max
NOTES
1
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
REV. 0 –3–
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