Analog Devices ADG709, ADG708 Datasheet

CMOS, 3 Low Voltage
S1
S8
A0
D
A1
A2
ADG708
S1A
A0
DA
S4A
S1B
S4B
DB
EN
ADG709
1 OF 4
DECODER
EN
1 OF 8
DECODER
A1
a
FEATURES
1.8 V to 5.5 V Single Supply 3 V Dual Supply 3 On-Resistance
0.75 On-Resistance Flatness 100 pA Leakage Currents 14 ns Switching Times Single 8-to-1 Multiplexer ADG708 Differential 4-to-1 Multiplexer ADG709 16-Lead TSSOP Package Low Power Consumption TTL/CMOS-Compatible Inputs
APPLICATIONS Data Acquisition Systems Communication Systems Relay Replacement Audio and Video Switching Battery-Powered Systems
4-/8-Channel Multiplexers
ADG708/ADG709
FUNCTIONAL BLOCK DIAGRAMS
GENERAL DESCRIPTION
The ADG708 and ADG709 are low voltage, CMOS analog multiplexers comprising eight single channels and four differential channels respectively. The ADG708 switches one of eight inputs (S1–S8) to a common output, D, as determined by the 3-bit binary address lines A0, A1, and A2. The ADG709 switches one of four differential inputs to a common differential output as determined by the 2-bit binary address lines A0 and A1. An EN input on both devices is used to enable or disable the device. When disabled, all channels are switched OFF.
PRODUCT HIGHLIGHTS
1. Single/Dual Supply Operation. The ADG708 and ADG709 are fully specified and guaranteed with 3 V and 5 V single
supply and ±3 V dual supply rails.
2. Low R
(3 Ω Typical).
ON
3. Low Power Consumption (<0.01 µW).
4. Guaranteed Break-Before-Make Switching Action.
5. Small 16-Lead TSSOP Package.
Low power consumption and operating supply range of 1.8 V to
5.5 V make the ADG708 and ADG709 ideal for battery-powered, portable instruments. All channels exhibit break-before-make switching action preventing momentary shorting when switch­ing channels.
These switches are designed on an enhanced submicron process that provides low power dissipation yet gives high switching speed, very low on-resistance and leakage currents. On-resistance is in the region of a few ohms and is closely matched between switches and very flat over the full signal range. These parts can operate equally well as either Multiplexers or Demultiplexers, and have an input signal range that extends to the supplies.
The ADG708 and ADG709 are available in a 16-lead TSSOP package.
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Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 World Wide Web Site: http://www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 2000
1
ADG708/ADG709–SPECIFICATIONS
B Version C Version
–40C –40ⴗC
Parameter +25ⴗC to +85ⴗC +25ⴗC to +85ⴗC Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 V to V On-Resistance (R
)3 3 typ V
ON
4.5 5 4.5 5 max Test Circuit 1
On-Resistance Match Between 0.4 0.4 typ
Channels (∆R
On-Resistance Flatness (R
) 0.8 0.8 max V
ON
) 0.75 0.75 typ V
FLAT(ON)
LEAKAGE CURRENTS V
Source OFF Leakage I
Drain OFF Leakage I
Channel ON Leakage I
(OFF) ±0.01 ±0.01 nA typ V
S
(OFF) ±0.01 ±0.01 nA typ V
D
, I
(ON) ±0.01 ±0.01 nA typ V
D
S
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V
INH
INL
Input Current
I
INL
or I
INH
0.005 0.005 µA typ V
CIN, Digital Input Capacitance 2 2 pF typ
DYNAMIC CHARACTERISTICS
t
TRANSITION
Break-Before-Make Time Delay, t
t
(EN) 14 14 ns typ R
ON
t
(EN) 7 7 ns typ R
OFF
2
14 14 ns typ R
8 8 ns typ R
D
Charge Injection ±3 ±3 pC typ V
Off Isolation –60 –60 dB typ R
–80 –80 dB typ R
Channel-to-Channel Crosstalk –60 –60 dB typ R
–80 –80 dB typ R
–3 dB Bandwidth 55 55 MHz typ R C
(OFF) 13 13 pF typ
S
C
(OFF)
D
ADG708 85 85 pF typ ADG709 42 42 pF typ
C
, CS (ON)
D
ADG708 96 96 pF typ ADG709 48 48 pF typ
POWER REQUIREMENTS V
I
DD
NOTES
1
Temperature range is as follows: B and C Versions: –40°C to +85°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
0.001 0.001 µA typ Digital Inputs = 0 V or 5.5 V
DD
1.2 1.2 max
±20 ±0.1 ±0.3 nA max Test Circuit 2 ±20 ±0.1 ±0.75 nA max Test Circuit 3 ±20 ±0.1 ±0.75 nA max
2.4 2.4 V min
0.8 0.8 V max
±0.1 ±0.1 µA max
25 25 ns max V
1 1 ns min V
25 25 ns max V
12 12 ns max V
1.0 1.0 µA max
(VDD = 5 V 10%, VSS = 0 V, GND = 0 V, unless otherwise noted)
0 V to VDDV
= 0 V to VDD, IDS = 10 mA;
S
= 0 V to VDD, IDS = 10 mA
S
= 0 V to VDD, IDS = 10 mA
S
= 5.5 V
DD
= 4.5 V/1 V, VS = 1 V/4.5 V;
D
= 4.5 V/1 V, VS = 1 V/4.5 V;
D
= VS = 1 V, or 4.5 V, Test Circuit 4
D
= V
IN
= 300 , C
L
S1
= 300 , C
L
= 3 V, Test Circuit 6
S
= 300 , C
L
= 3 V, Test Circuit 7
S
= 300 , C
L
= 3 V, Test Circuit 7
S
= 2.5 V, R
S
Test Circuit 8
= 50 , C
L
= 50 , C
L
Test Circuit 9
= 50 , C
L
= 50 , C
L
Test Circuit 10
= 50 , C
L
DD
or V
INL
INH
= 35 pF, Test Circuit 5
L
= 3 V/0 V, VS8 = 0 V/3 V
= 35 pF
L
= 35 pF
L
= 35 pF
L
= 0 , C
S
= 5 pF, f = 10 MHz
L
= 5 pF, f = 1 MHz;
L
= 5 pF, f = 10 MHz
L
= 5 pF, f = 1 MHz;
L
= 5 pF, Test Circuit 9
L
= 1 nF;
L
= 5.5 V
–2–
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ADG708/ADG709
SPECIFICATIONS
Parameter +25ⴗC to +85ⴗC +25ⴗC to +85ⴗC Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 V to V On-Resistance (R
On-Resistance Match Between 0.4 0.4 typ V
Channels (∆RON) 1.2 1.2 max
LEAKAGE CURRENTS V
Source OFF Leakage I
Drain OFF Leakage I
Channel ON Leakage I
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V Input Current
or I
I
INL
INH
CIN, Digital Input Capacitance 2 2 pF typ
DYNAMIC CHARACTERISTICS
t
TRANSITION
Break-Before-Make Time Delay, t
(EN) 18 18 ns typ R
t
ON
(EN) 8 8 ns typ R
t
OFF
Charge Injection ±3 ±3 pC typ V
Off Isolation –60 –60 dB typ R
Channel-to-Channel Crosstalk –60 –60 dB typ R
–3 dB Bandwidth 55 55 MHz typ R
(OFF) 13 13 pF typ
C
S
(OFF)
C
D
ADG708 85 85 pF typ ADG709 42 42 pF typ
, CS (ON)
C
D
ADG708 96 96 pF typ ADG709 48 48 pF typ
POWER REQUIREMENTS V
I
DD
NOTES
1
Temperature ranges are as follows: B and C Versions: –40°C to +85°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
)8 8Ω typ V
ON
S
(OFF) ±0.01 ±0.01 nA typ V
D
D
INH
INL
1
(VDD = 3 V 10%, VSS = 0 V, GND = 0 V, unless otherwise noted)
B Version C Version
–40C –40ⴗC
DD
11 12 11 12 max Test Circuit 1
(OFF) ±0.01 ±0.01 nA typ V
±20 ±0.1 ±0.3 nA max Test Circuit 2 ±20 ±0.1 ±0.75 nA max Test Circuit 3
, I
(ON) ±0.01 ±0.01 nA typ V
S
±20 ±0.1 ±0.75 nA max
2.0 2.0 V min
0.4 0.4 V max
0.005 0.005 µA typ V ±0.1 ±0.1 µA max
2
18 18 ns typ R
30 30 ns max V
8 8 ns typ R
D
1 1 ns min V
30 30 ns max V
15 15 ns max V
–80 –80 dB typ R
–80 –80 dB typ R
0.001 0.001 µA typ Digital Inputs = 0 V or 3.3 V
1.0 1.0 µA max
0 V to VDDV
= 0 V to VDD, IDS = 10 mA;
S
= 0 V to V
S
= 3.3 V
DD
= 3 V/1 V, VD = 1 V/3 V;
S
= 3 V/1 V, VD = 1 V/3 V;
S
= VD = 1 V or 3 V, Test Circuit 4
S
= V
IN
INL
= 300 , C
L
= 2 V/0 V, VS2 = 0 V/2 V
S1
= 300 , C
L
= 2 V, Test Circuit 6
S
= 300 , C
L
= 2 V, Test Circuit 7
S
= 300 , C
L
= 2 V, Test Circuit 7
S
= 1.5 V, R
S
, IDS = 10 mA
DD
or V
INH
= 35 pF, Test Circuit 5
L
= 35 pF
L
= 35 pF
L
= 35 pF
L
= 0 , C
S
= 1 nF;
L
Test Circuit 8
= 50 , C
L
= 50 , C
L
= 5 pF, f = 10 MHz
L
= 5 pF, f = 1 MHz;
L
Test Circuit 9
= 50 , C
L
= 50 , C
L
= 5 pF, f = 10 MHz
L
= 5 pF, f = 1 MHz;
L
Test Circuit 10
= 50 , C
L
= 3.3 V
DD
= 5 pF, Test Circuit 9
L
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–3–
ADG708/ADG709–SPECIFICATIONS
1
DUAL SUPPLY
(VDD = +3 V 10%, VSS = –3 V 10%, GND = 0 V)
B Version C Version
–40C –40ⴗC
Parameter +25ⴗC to +85ⴗC +25ⴗC to +85ⴗC Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range V On-Resistance (R
) 2.5 2.5 typ V
ON
SS
to V
DD
VSS to VDDV
= VSS to VDD, IDS = 10 mA;
S
4.5 5 4.5 5 max Test Circuit 1
On-Resistance Match Between 0.4 0.4 typ
Channels (∆R
) 0.8 0.8 max V
ON
On-Resistance Flatness (R
) 0.6 0.6 typ V
FLAT(ON)
= VSS to VDD, IDS = 10 mA
S
= VSS to VDD, IDS = 10 mA
S
1.0 1.0 max
LEAKAGE CURRENTS V
Source OFF Leakage I
(OFF) ±0.01 ±0.01 nA typ V
S
= +3.3 V, VSS = –3.3 V
DD
= +2.25 V/–1.25 V, VD = –1.25 V/+2.25 V;
S
±20 ±0.1 ±0.3 nA max Test Circuit 2
Drain OFF Leakage I
(OFF) ±0.01 ±0.01 nA typ V
D
= +2.25 V/–1.25 V, VD = –1.25 V/+2.25 V;
S
±20 ±0.1 ±0.75 nA max Test Circuit 3
Channel ON Leakage I
(ON) ±0.01 ±0.01 nA typ V
D
S
= VD = +2.25 V/–1.25 V, Test Circuit 4
S
, I
±20 ±0.1 ±0.75 nA max
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V
INL
INH
2.0 2.0 V min
0.4 0.4 V max
Input Current
I
INL
or I
INH
0.005 0.005 µA typ V
IN
= V
INL
or V
INH
±0.1 ±0.1 µA max
CIN, Digital Input Capacitance 2 2 pF typ
DYNAMIC CHARACTERISTICS
t
TRANSITION
Break-Before-Make Time Delay, t
(EN) 14 14 ns typ R
t
ON
(EN) 8 8 ns typ R
t
OFF
Charge Injection ±3 ±3 pC typ V
2
14 14 ns typ R
25 25 ns max V
8 8 ns typ R
D
1 1 ns min V
25 25 ns max V
15 15 ns max V
= 300 , C
L
= 1.5 V/0 V, Test Circuit 5
S
= 300 , C
L
= 1.5 V, Test Circuit 6
S
= 300 , C
L
= 1.5 V, Test Circuit 7
S
= 300 , C
L
= 1.5 V, Test Circuit 7
S
= 0 V, R
S
= 35 pF, Test Circuit 5
L
= 35 pF
L
= 35 pF
L
= 35 pF
L
= 0 , C
S
= 1 nF;
L
Test Circuit 8
Off Isolation –60 –60 dB typ R
–80 –80 dB typ R
= 50 , C
L
= 50 , C
L
= 5 pF, f = 10 MHz
L
= 5 pF, f = 1 MHz;
L
Test Circuit 9
Channel-to-Channel Crosstalk –60 –60 dB typ R
–80 –80 dB typ R
= 50 , C
L
= 50 , C
L
= 5 pF, f = 10 MHz
L
= 5 pF, f = 1 MHz;
L
Test Circuit 10
–3 dB Bandwidth 55 55 MHz typ R
(OFF) 13 13 pF typ
C
S
(OFF)
C
D
= 50 , C
L
= 5 pF, Test Circuit 9
L
ADG708 85 85 pF typ ADG709 42 42 pF typ
, CS (ON)
C
D
ADG708 96 96 ` pF typ ADG709 48 48 pF typ
POWER REQUIREMENTS V
I
DD
0.001 0.001 µA typ Digital Inputs = 0 V or 3.3 V
= 3.3 V
DD
1.0 1.0 µA max
I
SS
0.001 0.001 µA typ V
= –3.3 V
SS
1.0 1.0 µA max Digital Inputs = 0 V or 3.3 V
NOTES
1
Temperature range is as follows: B and C Versions: –40°C to +85°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
–4–
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