CMOS, 3 ⍀ Low Voltage
S1
S8
A0
D
A1
A2
ADG708
S1A
A0
DA
S4A
S1B
S4B
DB
EN
ADG709
1 OF 4
DECODER
EN
1 OF 8
DECODER
A1
a
FEATURES
1.8 V to 5.5 V Single Supply
ⴞ 3 V Dual Supply
3 ⍀ On-Resistance
0.75 ⍀ On-Resistance Flatness
100 pA Leakage Currents
14 ns Switching Times
Single 8-to-1 Multiplexer ADG708
Differential 4-to-1 Multiplexer ADG709
16-Lead TSSOP Package
Low Power Consumption
TTL/CMOS-Compatible Inputs
APPLICATIONS
Data Acquisition Systems
Communication Systems
Relay Replacement
Audio and Video Switching
Battery-Powered Systems
4-/8-Channel Multiplexers
ADG708/ADG709
FUNCTIONAL BLOCK DIAGRAMS
GENERAL DESCRIPTION
The ADG708 and ADG709 are low voltage, CMOS analog
multiplexers comprising eight single channels and four differential
channels respectively. The ADG708 switches one of eight inputs
(S1–S8) to a common output, D, as determined by the 3-bit
binary address lines A0, A1, and A2. The ADG709 switches one
of four differential inputs to a common differential output as
determined by the 2-bit binary address lines A0 and A1. An EN
input on both devices is used to enable or disable the device. When
disabled, all channels are switched OFF.
PRODUCT HIGHLIGHTS
1. Single/Dual Supply Operation. The ADG708 and ADG709
are fully specified and guaranteed with 3 V and 5 V single
supply and ± 3 V dual supply rails.
2. Low R
(3 Ω Typical).
ON
3. Low Power Consumption (<0.01 µW).
4. Guaranteed Break-Before-Make Switching Action.
5. Small 16-Lead TSSOP Package.
Low power consumption and operating supply range of 1.8 V to
5.5 V make the ADG708 and ADG709 ideal for battery-powered,
portable instruments. All channels exhibit break-before-make
switching action preventing momentary shorting when switching channels.
These switches are designed on an enhanced submicron process
that provides low power dissipation yet gives high switching
speed, very low on-resistance and leakage currents. On-resistance
is in the region of a few ohms and is closely matched between
switches and very flat over the full signal range. These parts can
operate equally well as either Multiplexers or Demultiplexers,
and have an input signal range that extends to the supplies.
The ADG708 and ADG709 are available in a 16-lead TSSOP
package.
REV. 0
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700 World Wide Web Site: http://www.analog.com
Fax: 781/326-8703 © Analog Devices, Inc., 2000
1
ADG708/ADG709–SPECIFICATIONS
B Version C Version
–40ⴗ C –40ⴗC
Parameter +25ⴗC to +85ⴗC +25ⴗC to +85ⴗ C Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 V to V
On-Resistance (R
)3 3 Ω typ V
ON
4.5 5 4.5 5 Ω max Test Circuit 1
On-Resistance Match Between 0.4 0.4 Ω typ
Channels (∆R
On-Resistance Flatness (R
) 0.8 0.8 Ω max V
ON
) 0.75 0.75 Ω typ V
FLAT(ON)
LEAKAGE CURRENTS V
Source OFF Leakage I
Drain OFF Leakage I
Channel ON Leakage I
(OFF) ±0.01 ± 0.01 nA typ V
S
(OFF) ±0.01 ± 0.01 nA typ V
D
, I
(ON) ±0.01 ± 0.01 nA typ V
D
S
DIGITAL INPUTS
Input High Voltage, V
Input Low Voltage, V
INH
INL
Input Current
I
INL
or I
INH
0.005 0.005 µ A typ V
CIN, Digital Input Capacitance 2 2 pF typ
DYNAMIC CHARACTERISTICS
t
TRANSITION
Break-Before-Make Time Delay, t
t
(EN) 14 14 ns typ R
ON
t
(EN) 7 7 ns typ R
OFF
2
14 14 ns typ R
8 8 ns typ R
D
Charge Injection ±3 ± 3 pC typ V
Off Isolation –60 –60 dB typ R
–80 –80 dB typ R
Channel-to-Channel Crosstalk –60 –60 dB typ R
–80 –80 dB typ R
–3 dB Bandwidth 55 55 MHz typ R
C
(OFF) 13 13 pF typ
S
C
(OFF)
D
ADG708 85 85 pF typ
ADG709 42 42 pF typ
C
, CS (ON)
D
ADG708 96 96 pF typ
ADG709 48 48 pF typ
POWER REQUIREMENTS V
I
DD
NOTES
1
Temperature range is as follows: B and C Versions: –40° C to +85° C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
0.001 0.001 µ A typ Digital Inputs = 0 V or 5.5 V
DD
1.2 1.2 Ω max
±20 ±0.1 ±0.3 nA max Test Circuit 2
±20 ±0.1 ±0.75 nA max Test Circuit 3
±20 ±0.1 ±0.75 nA max
2.4 2.4 V min
0.8 0.8 V max
± 0.1 ± 0.1 µ A max
25 25 ns max V
1 1 ns min V
25 25 ns max V
12 12 ns max V
1.0 1.0 µ A max
(VDD = 5 V ⴞ 10%, VSS = 0 V, GND = 0 V, unless otherwise noted)
0 V to VDDV
= 0 V to VDD, IDS = 10 mA;
S
= 0 V to VDD, IDS = 10 mA
S
= 0 V to VDD, IDS = 10 mA
S
= 5.5 V
DD
= 4.5 V/1 V, VS = 1 V/4.5 V;
D
= 4.5 V/1 V, VS = 1 V/4.5 V;
D
= VS = 1 V, or 4.5 V, Test Circuit 4
D
= V
IN
= 300 Ω , C
L
S1
= 300 Ω , C
L
= 3 V, Test Circuit 6
S
= 300 Ω , C
L
= 3 V, Test Circuit 7
S
= 300 Ω , C
L
= 3 V, Test Circuit 7
S
= 2.5 V, R
S
Test Circuit 8
= 50 Ω , C
L
= 50 Ω , C
L
Test Circuit 9
= 50 Ω , C
L
= 50 Ω , C
L
Test Circuit 10
= 50 Ω , C
L
DD
or V
INL
INH
= 35 pF, Test Circuit 5
L
= 3 V/0 V, VS8 = 0 V/3 V
= 35 pF
L
= 35 pF
L
= 35 pF
L
= 0 Ω , C
S
= 5 pF, f = 10 MHz
L
= 5 pF, f = 1 MHz;
L
= 5 pF, f = 10 MHz
L
= 5 pF, f = 1 MHz;
L
= 5 pF, Test Circuit 9
L
= 1 nF;
L
= 5.5 V
–2–
REV. 0
ADG708/ADG709
SPECIFICATIONS
Parameter +25ⴗC to +85ⴗC +25ⴗC to +85ⴗ C Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 V to V
On-Resistance (R
On-Resistance Match Between 0.4 0.4 Ω typ V
Channels (∆R ON) 1.2 1.2 Ω max
LEAKAGE CURRENTS V
Source OFF Leakage I
Drain OFF Leakage I
Channel ON Leakage I
DIGITAL INPUTS
Input High Voltage, V
Input Low Voltage, V
Input Current
or I
I
INL
INH
CIN, Digital Input Capacitance 2 2 pF typ
DYNAMIC CHARACTERISTICS
t
TRANSITION
Break-Before-Make Time Delay, t
(EN) 18 18 ns typ R
t
ON
(EN) 8 8 ns typ R
t
OFF
Charge Injection ±3 ± 3 pC typ V
Off Isolation –60 –60 dB typ R
Channel-to-Channel Crosstalk –60 –60 dB typ R
–3 dB Bandwidth 55 55 MHz typ R
(OFF) 13 13 pF typ
C
S
(OFF)
C
D
ADG708 85 85 pF typ
ADG709 42 42 pF typ
, CS (ON)
C
D
ADG708 96 96 pF typ
ADG709 48 48 pF typ
POWER REQUIREMENTS V
I
DD
NOTES
1
Temperature ranges are as follows: B and C Versions: –40° C to +85° C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
)8 8Ω typ V
ON
S
(OFF) ±0.01 ± 0.01 nA typ V
D
D
INH
INL
1
(VDD = 3 V ⴞ 10%, VSS = 0 V, GND = 0 V, unless otherwise noted)
B Version C Version
–40ⴗ C –40ⴗC
DD
11 12 11 12 Ω max Test Circuit 1
(OFF) ±0.01 ± 0.01 nA typ V
±20 ±0.1 ±0.3 nA max Test Circuit 2
±20 ±0.1 ±0.75 nA max Test Circuit 3
, I
(ON) ±0.01 ± 0.01 nA typ V
S
± 20 ± 0.1 ± 0.75 nA max
2.0 2.0 V min
0.4 0.4 V max
0.005 0.005 µ A typ V
± 0.1 ± 0.1 µ A max
2
18 18 ns typ R
30 30 ns max V
8 8 ns typ R
D
1 1 ns min V
30 30 ns max V
15 15 ns max V
–80 –80 dB typ R
–80 –80 dB typ R
0.001 0.001 µ A typ Digital Inputs = 0 V or 3.3 V
1.0 1.0 µA max
0 V to VDDV
= 0 V to VDD, IDS = 10 mA;
S
= 0 V to V
S
= 3.3 V
DD
= 3 V/1 V, VD = 1 V/3 V;
S
= 3 V/1 V, VD = 1 V/3 V;
S
= VD = 1 V or 3 V, Test Circuit 4
S
= V
IN
INL
= 300 Ω , C
L
= 2 V/0 V, VS2 = 0 V/2 V
S1
= 300 Ω , C
L
= 2 V, Test Circuit 6
S
= 300 Ω , C
L
= 2 V, Test Circuit 7
S
= 300 Ω , C
L
= 2 V, Test Circuit 7
S
= 1.5 V, R
S
, IDS = 10 mA
DD
or V
INH
= 35 pF, Test Circuit 5
L
= 35 pF
L
= 35 pF
L
= 35 pF
L
= 0 Ω , C
S
= 1 nF;
L
Test Circuit 8
= 50 Ω , C
L
= 50 Ω , C
L
= 5 pF, f = 10 MHz
L
= 5 pF, f = 1 MHz;
L
Test Circuit 9
= 50 Ω , C
L
= 50 Ω , C
L
= 5 pF, f = 10 MHz
L
= 5 pF, f = 1 MHz;
L
Test Circuit 10
= 50 Ω , C
L
= 3.3 V
DD
= 5 pF, Test Circuit 9
L
REV. 0
–3–
ADG708/ADG709–SPECIFICATIONS
1
DUAL SUPPLY
(VDD = +3 V ⴞ 10%, VSS = –3 V ⴞ 10%, GND = 0 V)
B Version C Version
–40ⴗ C –40ⴗC
Parameter +25ⴗC to +85ⴗC +25ⴗC to +85ⴗ C Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range V
On-Resistance (R
) 2.5 2.5 Ω typ V
ON
SS
to V
DD
VSS to VDDV
= VSS to VDD, IDS = 10 mA;
S
4.5 5 4.5 5 Ω max Test Circuit 1
On-Resistance Match Between 0.4 0.4 Ω typ
Channels (∆R
) 0.8 0.8 Ω max V
ON
On-Resistance Flatness (R
) 0.6 0.6 Ω typ V
FLAT(ON)
= VSS to VDD, IDS = 10 mA
S
= VSS to VDD, IDS = 10 mA
S
1.0 1.0 Ω max
LEAKAGE CURRENTS V
Source OFF Leakage I
(OFF) ±0.01 ± 0.01 nA typ V
S
= +3.3 V, VSS = –3.3 V
DD
= +2.25 V/–1.25 V, VD = –1.25 V/+2.25 V;
S
± 20 ± 0.1 ± 0.3 nA max Test Circuit 2
Drain OFF Leakage I
(OFF) ±0.01 ± 0.01 nA typ V
D
= +2.25 V/–1.25 V, VD = –1.25 V/+2.25 V;
S
± 20 ± 0.1 ± 0.75 nA max Test Circuit 3
Channel ON Leakage I
(ON) ±0.01 ± 0.01 nA typ V
D
S
= VD = +2.25 V/–1.25 V, Test Circuit 4
S
, I
± 20 ± 0.1 ± 0.75 nA max
DIGITAL INPUTS
Input High Voltage, V
Input Low Voltage, V
INL
INH
2.0 2.0 V min
0.4 0.4 V max
Input Current
I
INL
or I
INH
0.005 0.005 µ A typ V
IN
= V
INL
or V
INH
± 0.1 ± 0.1 µ A max
CIN, Digital Input Capacitance 2 2 pF typ
DYNAMIC CHARACTERISTICS
t
TRANSITION
Break-Before-Make Time Delay, t
(EN) 14 14 ns typ R
t
ON
(EN) 8 8 ns typ R
t
OFF
Charge Injection ±3 ± 3 pC typ V
2
14 14 ns typ R
25 25 ns max V
8 8 ns typ R
D
1 1 ns min V
25 25 ns max V
15 15 ns max V
= 300 Ω , C
L
= 1.5 V/0 V, Test Circuit 5
S
= 300 Ω , C
L
= 1.5 V, Test Circuit 6
S
= 300 Ω , C
L
= 1.5 V, Test Circuit 7
S
= 300 Ω , C
L
= 1.5 V, Test Circuit 7
S
= 0 V, R
S
= 35 pF, Test Circuit 5
L
= 35 pF
L
= 35 pF
L
= 35 pF
L
= 0 Ω , C
S
= 1 nF;
L
Test Circuit 8
Off Isolation –60 –60 dB typ R
–80 –80 dB typ R
= 50 Ω , C
L
= 50 Ω , C
L
= 5 pF, f = 10 MHz
L
= 5 pF, f = 1 MHz;
L
Test Circuit 9
Channel-to-Channel Crosstalk –60 –60 dB typ R
–80 –80 dB typ R
= 50 Ω , C
L
= 50 Ω , C
L
= 5 pF, f = 10 MHz
L
= 5 pF, f = 1 MHz;
L
Test Circuit 10
–3 dB Bandwidth 55 55 MHz typ R
(OFF) 13 13 pF typ
C
S
(OFF)
C
D
= 50 Ω , C
L
= 5 pF, Test Circuit 9
L
ADG708 85 85 pF typ
ADG709 42 42 pF typ
, CS (ON)
C
D
ADG708 96 96 ` pF typ
ADG709 48 48 pF typ
POWER REQUIREMENTS V
I
DD
0.001 0.001 µ A typ Digital Inputs = 0 V or 3.3 V
= 3.3 V
DD
1.0 1.0 µ A max
I
SS
0.001 0.001 µ A typ V
= –3.3 V
SS
1.0 1.0 µ A max Digital Inputs = 0 V or 3.3 V
NOTES
1
Temperature range is as follows: B and C Versions: –40° C to +85° C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
–4–
REV. 0