Analog Devices ADG620BRT, ADG620BRM, ADG619BRT, ADG619BRM Datasheet

CMOS 5 V/+5 V
a
FEATURES 6 (Max) On Resistance
0.8 (Max) On-Resistance Flatness
2.7 V to 5.5 V Single Supply 2.7 V to 5.5 V Dual Supply Rail-to-Rail Operation 8-Lead SOT-23 Package, 8-Lead Micro-SOIC Package Typical Power Consumption (<0.1 W) TTL/CMOS Compatible Inputs
APPLICATIONS Automatic Test Equipment Power Routing Communication Systems Data Acquisition Systems Sample and Hold Systems Avionics Relay Replacement Battery-Powered Systems
4 Single SPDT Switches
ADG619/ADG620

FUNCTIONAL BLOCK DIAGRAM

ADG619/ADG620
S2
S1
IN
SWITCHES SHOWN FOR A LOGIC "1" INPUT
D
GENERAL DESCRIPTION
The ADG619 and the ADG620 are monolithic, CMOS SPDT (single pole, double throw) switches. Each switch conducts equally well in both directions when on.
The ADG619/ADG620 offers low On-Resistance of 4 , which is matched to within 0.7 between channels. These switches also provide low power dissipation yet give high switching speeds.The ADG619 exhibits break-before-make switching action, thus preventing momentary shorting when switching channels. The ADG620 exhibits make-before-break action.
The ADG619/ADG620 are available in 8-lead SOT-23 pack­ages and 8-lead Micro-SOIC packages.
Table I. Truth Table for the ADG619/ADG620
IN Switch S1 Switch S2
0 ON OFF 1 OFF ON

PRODUCT HIGHLIGHTS

1. Low On Resistance (RON) (4 typ)
2. Dual ±2.7 V to ± 5.5 V or Single 2.7 V to 5.5 V
3. Low Power Dissipation. CMOS construction ensures low power dissipation.
4. Fast t
5.
ON/tOFF
Tiny 8-Lead SOT-23 Package and 8-Lead Micro-SOIC Package
REV. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 2001
ADG619/ADG620–SPECIFICATIONS
DUAL SUPPLY
1
(V
= +5 V 10%, V
DD
= –5 V 10%, GND = 0 V. All specifications –40C to +85C unless otherwise noted.)
SS
B Version
–40C to
Parameter +25C +85C Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range V On Resistance (R
)4 typ VS = ± 4.5 V, IS = –10 mA,
ON
SS
to V
DD
VV
= +4.5 V, VSS = –4.5 V
DD
68 max Test Circuit 1
On Resistance Match Between
Channels (∆R
) 0.7 typ VS = ± 4.5 V, IS = –10 mA
ON
1.1 1.35 max
On-Resistance Flatness (R
FLAT(ON)
) 0.7 0.8 typ VS = ± 3.3 V, IS = –10 mA
1.2 max
LEAKAGE CURRENTS V
Source OFF Leakage I
(OFF) ± 0.01 nA typ VS = ± 4.5 V, VD = ⫿4.5 V,
S
= +5.5 V, VSS = –5.5 V
DD
± 0.25 ± 1 nA max Test Circuit 2
Channel ON Leakage I
, IS (ON) ± 0.01 nA typ VS = VD = ± 4.5 V, Test Circuit 3
D
± 0.25 ± 1 nA max
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V
INL
INH
2.4 V min
0.8 V max
Input Current
I
INL
or I
INH
0.005 µA typ VIN = V
INL
or V
INH
± 0.1 µA max
CIN, Digital Input Capacitance 2 pF typ
DYNAMIC CHARACTERISTICS
2
ADG619
t
ON
t
OFF
Break-Before-Make Time Delay, t
80 ns typ RL = 300 , CL = 35 pF 120 155 ns max V
= 3.3 V, Test Circuit 4
S
45 ns typ RL = 300 , CL = 35 pF 75 90 ns max V 40 ns typ RL = 300 , CL = 35 pF
BBM
10 ns min V
= 3.3 V, Test Circuit 4
S
= VS2 = 3.3 V, Test Circuit 5
S1
ADG620
t
ON
t
OFF
Make-Before-Break Time Delay, t
Charge Injection 110 pC typ V
40 ns typ RL = 300 , CL = 35 pF 65 85 ns max V
= 3.3 V, Test Circuit 4
S
200 ns typ RL = 300 , CL = 35 pF 330 400 ns max V 160 ns typ RL = 300 , CL = 35 pF
MBB
10 ns min V
= 3.3 V, Test Circuit 4
S
= 0 V, Test Circuit 6
S
= 0 V, RS = 0 Ω, CL = 1 nF,
S
Test Circuit 7
Off Isolation –67 dB typ R
= 50 , CL = 5 pF, f = 1 MHz,
L
Test Circuit 8
Channel-to-Channel Crosstalk –67 dB typ R
= 50 , CL = 5 pF, f = 1 MHz,
L
Test Circuit 10 Bandwidth –3 dB 190 MHz typ R C
(OFF) 25 pF typ f = 1 MHz
S
C
(ON) 95 pF typ f = 1 MHz
D, CS
POWER REQUIREMENTS V
I
DD
0.001 µA typ Digital Inputs = 0 V or 5.5 V
= 50 , CL = 5 pF, Test Circuit 9
L
= +5.5 V, VSS = –5.5 V
DD
1.0 µA max
I
SS
0.001 µA typ Digital Inputs = 0 V or 5.5 V
1.0 µA max
NOTES
1
Temperature ranges are as follows: B Version, –40°C to +85°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
–2–
REV. 0
ADG619/ADG620
1
SINGLE SUPPLY
Parameter +25C +85C Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 V to V On Resistance (R
On Resistance Match Between
Channels (∆R
On-Resistance Flatness (R
LEAKAGE CURRENTS V
Source OFF Leakage I
Channel ON Leakage I
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V Input Current
or I
I
INL
CIN, Digital Input Capacitance 2 pF typ
DYNAMIC CHARACTERISTICS
ADG619
t
ON
t
OFF
Break-Before-Make Time Delay, t
ADG620
t
ON
t
OFF
Make-Before-Break Time Delay, t
Charge Injection 6 pC typ V
Off Isolation –67 dB typ R
Channel-to-Channel Crosstalk –67 dB typ R
Bandwidth –3 dB 190 MHz typ R C
(OFF) 25 pF typ f = 1 MHz
S
CD, CS (ON) 95 pF typ f = 1 MHz
POWER REQUIREMENTS V
I
DD
NOTES
1
Temperature ranges are as follows: B Version, –40°C to +85°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
ON
INH
(VDD = +5 V 10%, VSS = 0 V, GND = 0 V. All specifications –40C to +85C unless otherwise noted.)
B Version
–40C to
VV
)7 typ VS = 0 V to 4.5 V, IS = –10 mA,
ON
DD
= 4.5 V, VSS = 0 V
DD
ß10 12.5 max Test Circuit 1
) 0.8 typ VS = 0 V to 4.5 V, IS = –10 mA
1 1.2 max
FLAT(ON)
) 0.5 0.5 typ VS = 1.5 V to 3.3 V, IS = –10 mA
0.8 max
= 5.5 V
(OFF) ±0.01 nA typ VS = 1 V/4.5 V, VD = 4.5 V/1 V,
S
DD
± 0.25 ± 1 nA max Test Circuit 2
, IS (ON) ± 0.01 nA typ VS = VD = 1 V/4.5 V,
D
± 0.25 ± 1 nA max Test Circuit 3
INH
INL
0.005 µA typ VIN = V
2.4 V min
0.8 V max
INL
or V
INH
± 0.1 µA max
2
120 ns typ RL = 300 , CL = 35 pF 220 280 ns max V
= 3.3 V, Test Circuit 4
S
50 ns typ RL = 300 , CL = 35 pF
= 3.3 V, Test Circuit 4
S
= VS2 = 3.3 V, Test Circuit 5
S1
BBM
75 110 ns max V 70 ns typ RL = 300 , CL = 35 pF,
10 ns min V
50 ns typ RL = 300 , CL = 35 pF 85 110 ns max V
= 3.3 V, Test Circuit 4
S
210 ns typ RL = 300 , CL = 35 pF
MBB
340 420 ns max V 170 ns typ RL = 300 , CL = 35 pF
10 ns min V
= 3.3 V, Test Circuit 4
S
= 3.3 V, Test Circuit 6
S
= 0 V, RS = 0 Ω, CL = 1 nF,
S
Test Circuit 7
= 50 , CL = 5 pF, f = 1 MHz,
L
Test Circuit 8
= 50 , CL = 5 pF, f = 1 MHz,
L
Test Circuit 10
= 50 , CL = 5 pF, Test Circuit 9
L
= 5.5 V
DD
0.001 µA typ Digital Inputs = 0 V or 5.5 V
1.0 µA max
REV. 0
–3–
ADG619/ADG620
WARNING!
ESD SENSITIVE DEVICE
TOP VIEW
(Not to Scale)
8
7
6
5
1
2
3
4
NC = NO CONNECT
D
S1
NC
V
DD
S2
GND
IN
V
SS
ADG619/
ADG620
TOP VIEW
(Not to Scale)
8
7
6
5
1
2
3
4
NC = NO CONNECT
D
S1
NC
V
DD
S2
GND
IN
V
SS
ADG619/
ADG620

ABSOLUTE MAXIMUM RATINGS

(TA = 25°C unless otherwise noted)
1
VDD to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 V
V
to GND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +6.5 V
DD
to GND . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –6.5 V
V
SS
Analog Inputs Digital Inputs
2
. . . . . . . . . . . . . . . . VSS –0.3 V to VDD +0.3 V
2
. . . . . . . . . . . . . . . . . –0.3 V to VDD +0.3 V or
30 mA, Whichever Occurs First
Peak Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . 100 mA
(Pulsed at 1 ms, 10% Duty Cycle max)
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . 50 mA
Operating Temperature Range
Industrial (B Version) . . . . . . . . . . . . . . . –40°C to +85°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . 150°C
Micro-SOIC Package
Thermal Impedance . . . . . . . . . . . . . . . . . . . . 206°C/W
JA
Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 44°C/W
JC
SOT-23 Package
Thermal Impedance . . . . . . . . . . . . . . . . . . 229.6°C/W
JA
Thermal Impedance . . . . . . . . . . . . . . . . . . 91.99°C/W
JC
Lead Temperature, Soldering (10 seconds) . . . . . . . . . 300°C
IR Reflow, Peak Temperature . . . . . . . . . . . . . . . . . . . 220°C
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Only one absolute maximum rating may be applied at any one time.
2
Overvoltages at IN, S or D will be clamped by internal diodes. Current should be
limited to the maximum ratings given.
PIN CONFIGURATIONS
8-Lead SOT-23
(RT-8)
8-Lead Micro-SOIC
(RM-8)

ORDERING GUIDE

Branding
Model Temperature Range Information*Package Description Package Option
ADG619BRM –40°C to +85°C SVB Micro-SOIC (microSmall Outline IC) RM-8 ADG619BRT –40°C to +85°C SVB SOT-23 (Plastic Surface Mount) RT-8 ADG620BRM –40°C to +85°C SWB Micro-SOIC (microSmall Outline IC) RM-8 ADG620BRT –40°C to +85°C SWB SOT-23 (Plastic Surface Mount) RT-8
*Branding on SOT-23 and Micro-SOIC packages is limited to three characters due to space constraints.

CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the ADG619/ADG620 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
–4–
REV. 0
ADG619/ADG620

TERMINOLOGY

Mnemonic Description
V
DD
V
SS
GND Ground (0 V) Reference I
DD
I
SS
S Source Terminal. May be an input or output. D Drain Terminal. May be an input or output. IN Logic Control Input R
ON
DR
ON
R
FLAT(ON)
(OFF) Source Leakage Current With the Switch “OFF”
I
S
I
, IS (ON) Channel Leakage Current With the Switch “ON”
D
) Analog Voltage on Terminals D, S
V
D (VS
V
INL
V
INH
I
INL(IINH
C C t
ON
t
OFF
t
MBB
t
BBM
) Input Current of the Digital Input
(OFF) “OFF” Switch Source Capacitance
S
, CS (ON) “ON” Switch Capacitance
D
Charge Injection A Measure of the Glitch Impulse Transfered From the Digital Input to the Analog Output During Switching Crosstalk A Measure of Unwanted Signal that is Coupled Through From One Channel to Another as a Result of
Off Isolation A Measure of Unwanted Signal Coupling Through an “OFF” Switch Bandwidth The Frequency Response of the “ON” Switch Insertion Loss The Loss Due to the ON Resistance of the Switch
Most Positive Power Supply Potential Most Negative Power Supply in a Dual Supply Application. In single supply applications, this should be tied to ground at the device.
Positive Supply Current Negative Supply Current
Ohmic Resistance Between D and S On Resistance Match Between Any Two Channels, i.e., RON Max – R
ON
Min. Flatness is Defined as the Difference Between the Maximum and Minimum Value of On Resistance as Measured Over the Specified Analog Signal Range.
Maximum Input Voltage for Logic “0” Minimum Input Voltage for Logic “1”
Delay Between Applying the Digital Control Input and the Output Switching On Delay Between Applying the Digital Control Input and the Output Switching Off “ON” Time, Measured Between the 80% Points of Both Switches, When Switching From One Address State to Another “OFF” Time or “ON” Time Measured Between the 90% Points of Both Switches, When Switching from One Address State to Another
Parasitic Capacitance
Typical Performance Characteristics
18
16
14
12
10
8
6
ON RESISTANCE –
4
2
0
0
TPC 2. On Resistance vs. VD (VS) – Single Supply
ON RESISTANCE –
8
7
6
5
4
3
2
1
0
–5
TA = 25C
VDD, VSS = 4.5V
–4
VDD, VSS = 2.5V
VDD, VSS = 3V
VDD, VSS = 3.3V
VDD, VSS = 5V
–3 513
–1
–2 2 4
0
VD, VS – V
TPC 1. On Resistance vs. VD (VS) – Dual Supply
REV. 0
VDD = 2.7V
VDD = 3V
VDD = 3.3V
VDD = 4.5V
VDD = 5V
15
2 VD, VS – V
TA = 25C
= 0V
V
SS
34
6
5
4
3
2
ON RESISTANCE –
V
= +5V
DD
1
= –5V
V
SS
0
35
5
224
4
TPC 3. On Resistance vs. VD (VS) for
Different Temperatures – Dual Supply
–5–
TA = +85C
TA = +25C
TA = –40C
–1
0
VD, VS – V
13
ADG619/ADG620–Typical Performance Characteristics
10
9
8
7
6
5
4
3
ON RESISTANCE –
VDD = 5V
2
= 0V
V
SS
1
0
0
TA = +85C
TA = +25C
TA = –40C
2 VD, VS – V
34
15
TPC 4. On Resistance vs. VD (VS) for
Different Temperatures – Single Supply
250
TA = 25C
CHARGE INJECTION – pC
200
150
100
50
0
5
4
VDD +5V
–5V
V
SS
VDD 5V
0V
V
SS
2 1
35
01234
VS – V
TPC 7. Charge Injection vs. Source Voltage
0.5 VDD = +5V
0.4
= –5V
V
SS
= 4.5V
V
D
0.3
= 4.5V
V
S
0.2
0.1
0
0.1
0.2
LEAKAGE CURRENTS nA
0.3
0.4
0.5
10
0
20 60 70 8050
30 40
TEMPERATURE – C
TPC 5. Leakage Currents vs. Temperature – Dual Supply
180
160
140
120
100
80
TIME – ns
60
40
20
0 –40 –20
TPC 8. tON/t
VDD 5V
0V
V
SS
t
ON
t
OFF
VDD 5V
0V
V
SS
020
TEMPERATURE – C
Times vs. Temperature
OFF
IS (OFF)
40
ID, IS (ON)
VDD +5V
–5V
V
SS
+5V
V
DD
–5V
V
SS
60
0.5 VDD = 5V
0.4
= 0V
V
SS
= 4.5V/1V
V
D
0.3
= 1V/4.5V
V
S
0.2
0.1
0
0.1
0.2
LEAKAGE CURRENTS nA
0.3
0.4
0
–0.5
10
0
20 60 70 8050
ID, IS (ON)
IS (OFF)
30 40
TEMPERATURE – C
0
TPC 6. Leakage Currents vs. Temperature – Single Supply
10
20
30
40
50
60
70
ALTERNATION dB
80
90
100
80
0.03
1 10 100
FREQUENCY – MHz
VDD = +5V
= –5V
V
SS
= 25C
T
A
TPC 9. Off Isolation vs. Frequency
10
20
30
40
50
60
ATTENUATION dB
70
80
0.2 10010
1
FREQUENCY – MHz
VDD = +5V
= –5V
V
SS
= 25C
T
A
TPC 10. Crosstalk vs. Frequency
0
VDD = +5V
–2
= –5V
V
SS
= 25C
T
A
4
6
8
ATTENUATION dB
10
12
0.2 1000
10
1 100
FREQUENCY – MHz
TPC 11. On Response vs. Frequency
–6–
REV. 0

TEST CIRCUITS

ADG619/ADG620
I
DS
V1
SD
V
S
RON = V1/ I
DS

Test Circuit 1. On Resistance

0.1F
SD
V
S
V
S1
V
S2
V
IN
V
0.1F
V
S1
S2
IN
IN
V
V
DD
DD
GND
DD
DD
GND
IS (OFF) ID (OFF)
V
S

Test Circuit 2. Off Leakage

V
SS
0.1F
V
SS
R
L
300
SD
V
OUT
C
L
35pF
V
D
NC
SD

Test Circuit 3. On Leakage

V
IN
V
OUT
50% 50%
90%
t
ON
90%
t
OFF
ID (ON)
A
V
D

Test Circuit 4. Switching Times

V
SS
0.1F
V
V
SS
D2
D
R
L2
300
C
L2
35pF
V
OUT
IN
V
OUT
50% 50%
0V
90% 90%
0V
t
BBM
t
BBM
Test Circuit 5. Break-Before-Make Time Delay, t
V
V
DD
0.1F
V
D
IN
V
IN
SS
0.1F
V
V
DD
GND
SS
R
V
L1
S1
R
L2
300
C
35pF
300
L2
C
L1
35pF
V
S1
Test Circuit 6. Make-Before-Break Time Delay, t
V
V
DD
SS
V
V
DD
SS
R
S
V
S
DS
IN
C 1nF
L
GND
V
IN
V
S2
OUT
V
OUT
S1
(ADG619 Only)
BBM
V
IN
0V
V
S1
80%V
V
S2
(ADG620 Only)
MBB
Q
= CL V
INJ
50% 50%
80%V
D
t
MBB
V
OUT
V
OUT
OUT
D

Test Circuit 7. Charge Injection

REV. 0
–7–
ADG619/ADG620
V
DD
0.1F
V
DD
IN
V
IN
S
GND
OFF ISOLATION = 20 LOG

Test Circuit 8. Off Isolation

V
DD
0.1F
V
DD
IN
V
IN
S
GND
V
SS
0.1F
V
SS
50
D
V
OUT
V
S
NETWORK
ANALYZER
50
V
S
V
OUT
R
L
50
NETWORK
ANALYZER
V
OUT
CHANNEL-TO-CHANNEL CROSSTALK = 20 LOG
R 50
50
V
S
V
V
DD
0.1F
V
IN
SS
0.1F
V
SS
DD
S1
S2
GND
D
R 50
V
OUT
V
S
C02617–.8–10/01(0)

Test Circuit 10. Channel-to-Channel Crosstalk

V
SS
0.1F
V
SS
D
NETWORK
ANALYZER
50
V
S
V
OUT
R
L
50
INSERTION LOSS = 20 LOG
8-Lead Micro-SOIC Package
0.122 (3.10)
0.114 (2.90)
PIN 1
0.0256 (0.65) BSC
SEATING
PLANE
85
0.120 (3.05)
0.112 (2.84)
0.122 (3.10)
0.114 (2.90)
0.006 (0.15)
0.002 (0.05)
V
WITH SWITCH
OUT
WITHOUT SWITCH
V
S

Test Circuit 9. Bandwidth

(RM-8)
0.199 (5.05)
0.187 (4.75)
41
0.120 (3.05)
0.112 (2.84)
33 27
0.018 (0.46)
0.008 (0.20)
0.043 (1.09)
0.037 (0.94)
0.011 (0.28)
0.003 (0.08)
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
8-Lead Plastic Surface Mount Package
0.071 (1.80)
0.059 (1.50)
PIN 1
0.051 (1.30)
0.028 (0.71)
0.016 (0.41)
0.035 (0.90)
0.006 (0.15)
0.000 (0.00)
0.122 (3.10)
0.110 (2.80)
8
7
1 3
2
0.077 (1.95)
BSC
0.015 (0.38)
0.009 (0.22)
5 6
4
0.026 (0.65) BSC
(RT-8)
0.057 (1.45)
0.035 (0.90)
SEATING PLANE
0.009 (0.23)
0.003 (0.08)
10
PRINTED IN U.S.A.
0
0.022 (0.55)
0.014 (0.35)
–8–
REV. 0
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