Analog Devices ADG613YRU, ADG612YRU, ADG611YRU Datasheet

1 pC Charge Injection, 100 pA Leakage,
IN1
IN2
IN3
IN4
S1
D1
S2
D2
S3
D3
S4
D4
ADG611
IN1
IN2
IN3
IN4
S1
D1
S2
D2
S3
D3
S4
D4
ADG612
IN1
IN2
IN3
IN4
S1
D1
S2
D2
S3
D3
S4
D4
ADG613
SWITCHES SHOWN FOR A LOGIC “1” INPUT
a
CMOS 5 V/+5 V/+3 V Quad SPST Switches
FEATURES 1 pC Charge Injection 2.7 V to 5.5 V Dual Supply +2.7 V to +5.5 V Single Supply Automotive Temperature Range –40C to +125ⴗC 100 pA Max @ 25C Leakage Currents 85 On-Resistance Rail-to-Rail Switching Operation Fast Switching Times 16-Lead TSSOP Packages Typical Power Consumption (<0.1 W) TTL/CMOS-Compatible Inputs
APPLICATIONS Automatic Test Equipment Data Acquisition Systems Battery-Powered Systems Communication Systems Sample and Hold Systems Audio Signal Routing Relay Replacement Avionics
ADG611/ADG612/ADG613
FUNCTIONAL BLOCK DIAGRAMS
GENERAL DESCRIPTION
The ADG611, ADG612, and ADG613 are monolithic CMOS devices containing four independently selectable switches. These switches offer ultralow charge injection of 1 pC over full input signal range and typical leakage currents of 10 pA at 25°C.
They are fully specified for ±5 V, +5 V, and +3 V supplies. They contain four independent single-pole/single-throw (SPST) switches. The ADG611 and ADG612 differ only in that the digital control logic is inverted. The ADG611 switches are turned on with a logic low on the appropriate control input, while a logic high is required to turn on the switches of the ADG612. The ADG613 contains two switches whose digital control logic is similar to the ADG611, while the logic is inverted on the other two switches.
Each switch conducts equally well in both directions when ON and has an input signal range that extends to the supplies. The ADG613 exhibits break-before-make switching action. The ADG611/ADG612/ADG613 are available in small 16-lead TSSOP packages.
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PRODUCT HIGHLIGHTS
1. Ultralow Charge Injection (1 pC typically)
2. Dual ± 2.7 V to ± 5.5 V or Single +2.7 V to +5.5 V Operation.
3. Automotive Temperature Range, –40°C to +125°C
4. Small 16-lead TSSOP package.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 2002
ADG611/ADG612/ADG613–SPECIFICATIONS
1
DUAL SUPPLY
Parameter 25ⴗC to +85ⴗC to +125ⴗC Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range V On-Resistance (R
On-Resistance Match Between 2 typ
Channels (∆R
On-Resistance Flatness (R
LEAKAGE CURRENTS V
Source OFF Leakage I
Drain OFF Leakage I
Channel ON Leakage I
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V Input Current
or I
I
INL
INH
CIN, Digital Input Capacitance 2 pF typ
DYNAMIC CHARACTERISTICS
t
ON
t
OFF
Break-Before-Make Time Delay, t
Charge Injection –0.5 pC typ V
Off Isolation –65 dB typ R
Channel-to-Channel Crosstalk –90 dB typ R
–3 dB Bandwidth 680 MHz typ R
C
(OFF) 5 pF typ f = 1 MHz
S
(OFF) 5 pF typ f = 1 MHz
C
D
CD, CS (ON) 5 pF typ f = 1 MHz
POWER REQUIREMENTS V
I
DD
I
SS
NOTES
1
Temperature range is as follows. Y Version: –40°C to +125°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
(VDD = +5 V 10%, VSS = –5 V 10%, GND = 0 V, unless otherwise noted.)
Y Version –40C –40ⴗC
to V
SS
)85 typ VS = ± 3 V, IS = –1 mA
ON
DD
V
115 140 160 max Test Circuit 1
) 4 5.5 6.5 max VS = ± 3 V, IS = –1 mA
ON
FLAT(ON)
)25 typ VS = ± 3 V, IS = –1 mA
40 55 60 max
= +5.5 V, VSS = –5.5 V
(OFF) ± 0.01 nA typ VD = ± 4.5 V, VS = ⫿4.5 V;
S
DD
± 0.1 ±0.25 ± 2 nA max Test Circuit 2
(OFF) ± 0.01 nA typ VD = ± 4.5 V, VS = ⫿4.5 V;
D
± 0.1 ±0.25 ± 2 nA max Test Circuit 2
, IS (ON) ± 0.01 nA typ VD = VS = ± 4.5 V, Test Circuit 3
D
± 0.1 ±0.25 ± 6 nA max
INH
INL
0.005 µA typ VIN = V
2.4 V min
0.8 V max
INL
or V
INH
± 0.1 µA max
2
45 ns typ RL = 300 , CL = 35 pF 65 75 90 ns max V
= 3.0 V, Test Circuit 4
S
25 ns typ RL = 300 , CL = 35 pF 40 45 50 ns max V
D
15 ns typ RL = 300 , CL = 35 pF
10 ns min V
= 3.0 V, Test Circuit 4
S
= VS2 = 3.0 V, Test Circuit 5
S1
= 0 V, RS = 0 Ω,
S
C
= 1 nF, Test Circuit 6
L
= 50 , CL = 5 pF,
L
f = 10 MHz, Test Circuit 7
= 50 , CL = 5 pF,
L
f = 10 MHz, Test Circuit 8
= 50 , CL = 5 pF,
L
Test Circuit 9
= +5.5 V, VSS = –5.5 V
DD
0.001 µA typ Digital Inputs = 0 V or 5.5 V
1.0 µA max
0.001 µA typ Digital Inputs = 0 V or 5.5 V
1.0 µA max
–2–
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ADG611/ADG612/ADG613
1
SINGLE SUPPLY
Parameter 25ⴗC to +85ⴗC to +125ⴗC Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range On-Resistance (R
On-Resistance Match Between 3 typ V
Channels (∆RON)101213Ω max
LEAKAGE CURRENTS V
Source OFF Leakage I
Drain OFF Leakage I
Channel ON Leakage I
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V Input Current
or I
I
INL
INH
CIN, Digital Input Capacitance
DYNAMIC CHARACTERISTICS
t
ON
t
OFF
Break-Before-Make Time Delay, t
Charge Injection 1 pC typ V
Off Isolation –62 dB typ R
Channel-to-Channel Crosstalk –90 dB typ R
–3 dB Bandwidth 680 MHz typ R C
(OFF) 5 pF typ f = 1 MHz
S
(OFF) 5 pF typ f = 1 MHz
C
D
CD, CS (ON) 5 pF typ f = 1 MHz
POWER REQUIREMENTS V
I
DD
NOTES
1
Temperature ranges are as follows. Y Version: –40°C to +125°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
(VDD = 5 V 10%, VSS = 0 V, GND = 0 V, unless otherwise noted.)
Y Version
C –40ⴗC
–40
0 V to VDDV
) 210 typ VS = 3.5 V, IS = –1 mA;
ON
290 350 380 max Test Circuit 1
= 3.5 V , IS = –1 mA
S
= 5.5 V
(OFF) ± 0.01 nA typ VS = 1 V/4.5 V, VD = 4.5 V/1 V;
S
DD
± 0.1 ± 0.25 ±2 nA max Test Circuit 2
(OFF) ±0.01 nA typ VS = 1 V/4.5 V, VD = 4.5 V/1 V;
D
± 0.1 ± 0.25 ±2 nA max Test Circuit 2
, IS (ON) ± 0.01 nA typ VS = VD = 1 V or 4.5 V, Test Circuit 3
D
± 0.1 ± 0.25 ±6 nA max
INH
INL
0.005 µA typ VIN = V
2
2
2 pF typ
2.4 V min
0.8 V max
± 0.1 µA max
INL
or V
INH
70 ns typ RL = 300 , CL = 35 pF 100 130 150 ns max V
= 3.0 V, Test Circuit 4
S
25 ns typ RL = 300 , CL = 35 pF 40 45 50 ns max V
D
25 ns typ RL = 300 , CL = 35 pF
10 ns min V
= 3.0 V, Test Circuit 4
S
= VS2 = 3.0 V, Test Circuit 5
S1
= 0 V, RS = 0 , CL = 1 nF;
S
Test Circuit 6
= 50 , CL = 5 pF, f = 10 MHz
L
Test Circuit 7
= 50 , CL = 5 pF, f = 10 MHz
L
Test Circuit 8
= 50 , CL = 5 pF, Test Circuit 9
L
= 5.5 V
DD
0.001 µA typ Digital Inputs = 0 V or 5.5 V
1.0 µA max
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–3–
ADG611/ADG612/ADG613–SPECIFICATIONS
1
SINGLE SUPPLY
Parameter 25ⴗC to +85ⴗC to +125ⴗC Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range On-Resistance (R
LEAKAGE CURRENTS V
Source OFF Leakage I
Drain OFF Leakage I
Channel ON Leakage I
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V Input Current
or I
I
INL
INH
CIN, Digital Input Capacitance 2 pF typ
DYNAMIC CHARACTERISTICS
t
ON
t
OFF
Break-Before-Make Time Delay, t
Charge Injection 1.5 pC typ V
Off Isolation –62 dB typ R
Channel-to-Channel Crosstalk –90 dB typ R
–3 dB Bandwidth 680 MHz typ R C
(OFF) 5 pF typ f = 1 MHz
S
(OFF) 5 pF typ f = 1 MHz
C
D
CD, CS (ON) 5 pF typ f = 1 MHz
POWER REQUIREMENTS V
I
DD
NOTES
1
Temperature ranges are as follows. Y Version: –40°C to +125°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
(VDD = 3 V 10%, VSS = 0 V, GND = 0 V, unless otherwise noted.)
Y Version
–40
C –40ⴗC
0 V to VDDV
) 380 420 460 typ VS = 1.5 V, IS = –1 mA;
ON
Test Circuit 1
= 3.3 V
(OFF) ± 0.01 nA typ VS = 1 V/3 V, VD = 3 V/1 V;
S
DD
± 0.1 ± 0.25 ± 2 nA max Test Circuit 2
(OFF) ±0.01 nA typ VS = 1 V/3 V, VD = 3 V/1 V;
D
± 0.1 ± 0.25 ± 2 nA max Test Circuit 2
, IS (ON) ± 0.01 nA typ VS = VD = 1 V or 3 V, Test Circuit 3
D
± 0.1 ± 0.25 ± 6 nA max
INH
INL
0.005 µA typ VIN = V
2.0 V min
0.8 V max
INL
or V
INH
± 0.1 µA max
2
130 ns typ RL = 300 , CL = 35 pF 185 230 260 ns max V
= 2 V, Test Circuit 4
S
40 ns typ RL = 300 , CL = 35 pF 55 60 65 ns max V
D
50 ns typ RL = 300 , CL = 35 pF
10 ns min V
= 2 V, Test Circuit 4
S
= VS2 = 2 V, Test Circuit 5
S1
= 0 V, RS = 0 , CL = 1 nF;
S
Test Circuit 6
= 50 , CL = 5 pF, f = 10 MHz
L
Test Circuit 7
= 50 , CL = 5 pF, f = 10 MHz
L
Test Circuit 8
= 50 , CL = 5 pF, Test Circuit 9
L
= 3.3 V
DD
0.001 µA typ Digital Inputs = 0 V or 3.3 V
1.0 µA max
–4–
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