FEATURES
Low On Resistance (300 ⍀ typ)
Fast Switching Times
250 ns max
t
ON
250 ns max
t
OFF
Low Power Dissipation (3.3 mW max)
Fault and Overvoltage Protection (–40 V to +55 V)
All Switches OFF with Power Supply OFF
Analog Output of ON Channel Clamped Within Power
Supplies If an Overvoltage Occurs
Latch-Up Proof Construction
Break Before Make Construction
TTL and CMOS Compatible Inputs
and Nonfault-Protected)
New Designs Requiring Multiplexer Functions
GENERAL DESCRIPTION
The ADG508F, ADG509F and ADG528F are CMOS analog
multiplexers, the ADG508F and ADG528F comprising eight
single channels and the ADG509F comprising four differential
channels. These multiplexers provide fault protection. Using a
series n-channel, p-channel, n-channel MOSFET structure,
both device and signal source protection is provided in the event
of an overvoltage or power loss. The multiplexer can withstand
continuous overvoltage inputs from –40 V to +55 V. During
fault conditions, the multiplexer input (or output) appears as an
open circuit and only a few nanoamperes of leakage current will
flow. This protects not only the multiplexer and the circuitry
driven by the multiplexer, but also protects the sensors or signal
sources that drive the multiplexer.
The ADG508F and ADG528F switch one of eight inputs to a
common output as determined by the 3-bit binary address lines
A0, A1 and A2. The ADG509F switches one of four differential
inputs to a common differential output as determined by the 2bit binary address lines A0 and A1. The ADG528F has on-chip
address and control latches that facilitate microprocessor interfacing. An EN input on each device is used to enable or disable
the device. When disabled, all channels are switched OFF.
PRODUCT HIGHLIGHTS
1. Fault Protection.
The ADG508F/ADG509F/ADG528F can withstand continuous voltage inputs from –40 V to +55 V. When a fault
occurs due to the power supplies being turned off, all the
channels are turned off and only a leakage current of a few
nanoamperes flows.
*Patent Pending.
Analog Multiplexers
ADG508F/ADG509F/ADG528F*
FUNCTIONAL BLOCK DIAGRAMS
ADG508F/ADG528F
S1
D
S8
ONLY
WR
RS
1 OF 8
DECODER
A0
A1 A2 EN
ADG528F
2. ON channel turns off while fault exists.
3. Low R
ON.
4. Fast Switching Times.
5. Break-Before-Make Switching.
Switches are guaranteed break-before-make so that input
signals are protected against momentary shorting.
6. Trench Isolation Eliminates Latch-up.
A dielectric trench separates the p and n-channel MOSFETs
thereby preventing latch-up.
ORDERING GUIDE
1
Model
Temperature RangePackage Option
ADG508FBN–40°C to +85°CN-16
ADG508FBRN–40°C to +85°CR-16N
ADG508FBRW–40°C to +85°CR-16W
ADG508FTQ–55°C to +125°CQ-16
ADG509FBN–40°C to +85°CN-16
ADG509FBRN–40°C to +85°CR-16N
ADG509FBRW–40°C to +85°CR-16W
ADG509FTQ–55°C to +125°CQ-16
ADG528FBN–40°C to +85°CN-18
ADG528FBP–40°C to +85°CP-20A
ADG528FTQ–55°C to +125°CQ-18
NOTES
1
To order MIL-STD-883, Class B processed parts, add /883B to T grade part
numbers.
2
N = Plastic DIP; P = Plastic Leaded Chip Carrier (PLCC); Q = Cerdip;
RN = 0.15" Small Outline IC (SOIC), RW = 0.3" Small Outline IC (SOIC).
S1A
S4A
S1B
S4B
ADG509F
1 OF 4
DECODER
A1
A0
EN
DA
DB
2
REV. C
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
X XXXg1Retains Previous Switch Condition
X XXXX0 NONE (Address and Enable Latches Cleared)
XXX001NONE
0 001011
0 011012
0 101013
0 111014
1 001015
1 011016
1 101017
1 111018
X = Don’t Care
Table II. ADG509F Truth Table
A1A0ENON SWITCH PAIR
XX0NONE
0011
0112
1013
1114
X = Don’t Care
ON
TIMING DIAGRAMS (ADG528F)
3V
WR
A0, A1, A2
EN
50%
0V
3V
0V
t
W
2V
50%
t
S
t
0.8V
H
Figure 1.
Figure 1 shows the timing sequence for latching the switch
address and enable inputs. The latches are level sensitive; therefore, while WR is held low, the latches are transparent and the
switches respond to the address and enable inputs. This input
data is latched on the rising edge of WR.
3V
RS
SWITCH
OUTPUT
0V
V
O
0V
50%
50%
t
RS
t
(RS)
OFF
0.8V
O
Figure 2.
Figure 2 shows the Reset Pulsewidth, tRS, and the Reset Turnoff Time, t
OFF
(RS).
Note: All digital input signals rise and fall times are measured
from 10% to 90% of 3 V. t
*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability. Only one absolute
maximum rating may be applied at any one time.
ADG508F/ADG509F PIN CONFIGURATIONS
DIP/SOIC DIP/SOIC
1
A0
2
EN
3
V
SS
ADG508F
4
S1
TOP VIEW
5
S2
(Not to Scale)
6
S3
7
S4
DS8
89
16
A1
15
A2
14
GND
13
V
DD
12
S5
11
S6
10
S7
1
A0
2
EN
3
V
SS
ADG509F
S1A
4
TOP VIEW
5
S2A
(Not to Scale)
6
S3A
7
S4A
89
DADB
16
15
14
13
12
11
10
ADG528F PIN CONFIGURATIONS
DIP PLCC
A1
GND
V
DD
S1B
S2B
S3B
S4B
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although these devices feature proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
–4–
REV. C
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