Datasheet ADG507ATE, ADG507AKR, ADG507AKP, ADG507AKN, ADG507ABQ Datasheet (Analog Devices)

...
CMOS
a
FEATURES 44 V Supply Maximum Rating
to VDD Analog Signal Range
V
SS
Single/Dual Supply Specifications Wide Supply Ranges (10.8 V to 16.5 V) Extended Plastic Temperature Range
(–40C to +85C) Low Power Dissipation (28 mW max) Low Leakage (20 pA typ) Available in 28-Lead DIP, SOIC, PLCC, TSSOP and LCCC
Packages Superior Alternative to:
DG506A, Hl-506
DG507A, Hl-507
GENERAL DESCRIPTION
The ADG506A and ADG507A are CMOS monolithic analog multiplexers with 16 channels and dual 8 channels, respectively. The ADG506A switches one of 16 inputs to a common output, depending on the state of four binary addresses and an enable input. The ADG507A switches one of eight differential inputs to a common differential output, depending on the state of three binary addresses and an enable input. Both devices have TTL and 5 V CMOS logic compatible digital inputs.
The ADG506A and ADG507A are designed on an enhanced
2
LC
MOS process, which gives an increased signal capability of
to VDD and enables operation over a wide range of supply
V
SS
voltages. The devices can operate comfortably anywhere in the
10.8 V to 16.5 V single or dual supply range. These multiplexers also feature high switching speeds and low R

PRODUCT HIGHLIGHTS

1. Single/Dual Supply Specifications with a Wide Tolerance The devices are specified in the 10.8 V to 16.5 V range for both single and dual supplies.
2. Extended Signal Range The enhanced LC down and an increased analog signal range of V
3. Break-Before-Make Switching Switches are guaranteed break-before-make so input signals are protected against momentary shorting.
4. Low Leakage Leakage currents in the range of 20 pA make these multiplexers suitable for high precision circuits.
2
MOS processing results in a high break-
ON
.
to VDD.
SS
8-/16-Channel Analog Multiplexers
ADG506A/ADG507A

FUNCTIONAL BLOCK DIAGRAM

ORDERING GUIDE

1
Model
ADG506AKN –40°C to +85°C N-28 ADG506AKR –40°C to +85°C R-28 ADG506AKP –40°C to +85°C P-28A ADG506ABQ –40°C to +85°C Q-28 ADG506ATQ –55°C to +125°C Q-28 ADG506ATE –55°C to +125°C E-28A
ADG507AKN –40°C to +85°C N-28 ADG507AKR –40°C to +85°C R-28 ADG507AKP –40°C to +85°C P-28A ADG507AKRU –40°C to +85°C RU-28 ADG507ABQ –40°C to +85°C Q-28 ADG507ATQ –55°C to +125°C Q-28 ADG507ATE –55°C to +125°C E-28A
NOTES
1
To order MIL-STD-883, Class B processed parts, add /883B to part number. See Analog Devices’ Military/Aerospace Reference Manual (1994) for military data sheet.
2
E = Leadless Ceramic Chip Carrier (LCCC); N = Plastic DIP; P = Plastic Leaded Chip Carrier (PLCC); Q = Cerdip; R = 0.3" Small Outline IC (SOIC); RU = Thin Shrink Small Outline Package (TSSOP).
Temperature Package Range Option
2
REV. C
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 World Wide Web Site: http://www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 1998
ADG506A/ADG507A–SPECIFICATIONS

Dual Supply

(VDD = +10.8 V to +16.5 V, VSS = –10.8 V to –16.5 V unless otherwise noted)
ADG506A ADG506A ADG506A ADG507A ADG507A ADG507A K Version B Version T Version
–40ⴗC to –40ⴗC to –55ⴗC to
Parameter +25ⴗC +85ⴗC +25ⴗC +85ⴗC +25ⴗC +125ⴗC Units Comments
ANALOG SWITCH
Analog Signal Range V
R
ON
V
SS
DD
SS
V
DD
V
280 280 280 typ –10 V VS +10 V, I
V V
SS
DD
V
SS
V
DD
V
SS
V
DDVDD
V
SS
V min V max
450 600 450 600 450 600 max
= 1 mA; Test Circuit 1
DS
300 400 300 400 max VDD = 15 V (±10%), VSS = –15 V (±10%)
300 400 max VDD = 15 V (±5%), VSS = –15 V (±5%)
R
Drift 0.6 0.6 0.6 %/°C typ –10 V ≤ VS +10 V, I
ON
R
Match 5 5 5 % typ –10 V ≤ VS +10 V, I
ON
I
(OFF), Off Input Leakage 0.02 0.02 0.02 nA typ V1 = ±10 V, V2 = ⫿10 V; Test Circuit 2
S
I
(OFF), Off Output Leakage 0.04 0.04 0.04 nA typ V1 = ±10 V, V2 = ⫿10 V; Test Circuit 3
D
ADG506A 1 200 1 200 1 200 nA max
1 50 1 50 1 50 nA max
= 1 mA
DS
= 1 mA
DS
ADG507A 1 100 1 100 1 100 nA max
I
(ON), On Channel Leakage 0.04 0.04 0.04 nA typ V1 = ±10 V, V2 = ⫿10 V; Test Circuit 4
D
ADG506A 1 200 1 200 1 200 nA max ADG507A 1 100 1 100 1 100 nA max
I
, Differential Off Output
DIFF
Leakage (ADG507A Only) 25 25 25 nA max V1 = ±10 V, V2 = ⫿10 V; Test Circuit 5
DIGITAL CONTROL
V
, Input High Voltage 2.4 2.4 2.4 V min
INH
V
, Input Low Voltage 0.8 0.8 0.8 V max
INL
I
or I
INL
INH
CIN Digital Input Capacitance 8 8 8 pF max
DYNAMIC CHARACTERISTICS
t
TRANSITION
t
OPEN
tON (EN)
t
OFF
1
(EN)
1
1
1
OFF Isolation 68 68 68 dB typ VEN = 0.8 V, R
111µA max V
= 0 to V
IN
DD
200 200 200 ns typ V1 = ±10 V, V2 = +10 V; Test Circuit 6
300 400 300 400 300 400 ns max 50 50 50 ns typ Test Circuit 7 25 10 25 10 25 10 ns min 200 200 200 ns typ Test Circuit 8 300 400 300 400 300 400 ns max 200 200 200 ns typ Test Circuit 8 300 400 300 400 300 400 ns max
= 1 k, C
50 50 50 dB min VS = 7 V rms, f = 100 kHz
L
= 15 pF,
L
CS (OFF) 5 5 5 pF typ VEN = 0.8 V CD (OFF)
ADG506A 44 44 44 pF typ VEN = 0.8 V ADG507A 22 22 22 pF typ
Q
, Charge Injection 4 4 4 pC typ R
INJ
= 0 , V
S
= 0 V; Test Circuit 9
S
POWER SUPPLY
I
DD
I
SS
0.6 0.6 0.6 mA typ VIN = V
1.5 1.5 1.5 mA max
20 20 20 µA typ V
0.2 0.2 0.2 mA max
= VIN or V
IN
INL
or V
lNH
INH
Power Dissipation 10 10 10 mW typ
28 28 28 mW max
NOTES
1
Sample tested at +25°C to ensure compliance.
Specifications subject to change without notice.
–2–
REV. C
ADG506A/ADG507A

Single Supply

Parameter +25ⴗC +85ⴗC +25ⴗC +85ⴗC +25ⴗC +125ⴗC Units Comments
ANALOG SWITCH
Analog Signal Range V
R
ON
R
Drift 0.6 0.6 0.6 %/°C typ 0 V ≤ VS +10 V, I
ON
R
Match 5 5 5 % typ 0 V ≤ VS +10 V, I
ON
IS (OFF), Off Input Leakage 0.02 0.02 0.02 nA typ V1 = +10 V/0 V, V2 = 0 V/ +10 V;
ID (OFF), Off Output Leakage 0.04 0.04 0.04 nA typ V1 = +10 V/0 V, V2 = 0 V/ +10 V;
ADG506A 1 200 1 200 1 200 nA max Test Circuit 3 ADG507A 1 100 1 100 1 100 nA max
ID (ON), On Channel Leakage 0.04 0.04 0.04 nA typ V1 = +10 V/0 V, V2 = 0 V/ +10 V;
ADG506A 1 200 1 200 1 200 nA max Test Circuit 4 ADG507A 1 100 1 100 1 100 nA max
I
, Differential Off Output V1 = +10 V/0 V, V2 = 0 V/ +10 V;
DIFF
Leakage (ADG507A Only) 25 25 25 nA max Test Circuit 5
DIGITAL CONTROL
V
, Input High Voltage 2.4 2.4 2.4 V min
INH
V
, Input Low Voltage 0.8 0.8 0.8 V max
INL
I
or I
INL
INH
CIN Digital Input Capacitance 8 8 8 pF max
DYNAMIC CHARACTERISTICS
t
TRANSITION
t
OPEN
tON (EN)
t
OFF
OFF Isolation 68 68 68 dB typ VEN = 0.8 V, R
CS (OFF) 5 5 5 pF typ VEN = 0.8 V CD (OFF)
Q
INJ
POWER SUPPLY
I
DD
Power Dissipation 10 10 10 mW typ
NOTES
1
Sample tested at +25°C to ensure compliance.
Specifications subject to change without notice.
1
1
1
1
(EN)
ADG506A 44 44 44 pF typ VEN = 0.8 V ADG507A 22 22 22 pF typ
, Charge Injection 4 4 4 pC typ R
(VDD = +10.8 V to +16.5 V, VSS = GND = 0 V unless otherwise noted)
ADG506A ADG506A ADG506A ADG507A ADG507A ADG507A K Version B Version T Version
–40ⴗC to –40ⴗC to –55ⴗC to
V
SS
DD
SS
V
DD
V
500 500 500 typ 0 V VS +10 V, I
V V
SS
DD
V
SS
V
DD
V
SS
V
DDVDD
V
SS
700 1000 700 1000 700 1000 max
1 50 1 50 1 50 nA max Test Circuit 2
111µA max V
300 300 300 ns typ V1 = +10 V/0 V, V2 = +10 V; Test Circuit 6 450 600 450 600 450 600 ns max 50 50 50 ns typ Test Circuit 7 25 10 25 10 25 10 ns min 250 250 250 ns typ Test Circuit 8 450 600 450 600 450 600 ns max 250 250 250 ns typ Test Circuit 8 450 600 450 600 450 600 ns max
50 50 50 dB min VS = 3.5 V rms, f = 100 kHz
0.6 0.6 0.6 mA typ VIN = V
1.5 1.5 1.5 mA max
25 25 25 mW max
Truth Table (ADG506A)
A3 A2 A1 A0 EN On Switch
XXXX0 NONE 000011 000112 001013 001114 010015 010116 011017 011118 100019 1001110 1010111 1011112 1100113 1101114 1110115
1111116
V min V max
X = Don’t Care
= 0.5 mA; Test Circuit 1
DS
= 0.5 mA
DS
= 0.5 mA
DS
= 0 to V
IN
= 0 , V
S
DD
= 1 k, C
L
= 0 V; Test Circuit 9
S
or V
INL
lNH
= 15 pF,
L
Truth Table (ADG507A)
A2 A1 A0 EN On Switch Pair
XXX0 NONE 00011 00112 01013 01114 10015 10116 11017 11118
REV. C
–3–
ADG506A/ADG507A

ABSOLUTE MAXIMUM RATINGS

(T
= 25°C unless otherwise noted)
A
1
VDD to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44 V
V
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 V
DD
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –25 V
V
SS
Analog Inputs
2
Voltage at S, D . . . . . . . . . . . . . . . . . . . . . . . VSS – 2 V to V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . + 2 V or
. . . . . . . . . . . . . . . . . . . . . . 20 mA, Whichever Occurs First
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . . 20 mA
Pulsed Current S or D
1 ms Duration, 10% Duty Cycle . . . . . . . . . . . . . . . . 40 mA
Digital Inputs
2
Voltage at A, EN . . . . . . . . . . . . . . . . . . . . . . . . . . VSS – 4 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . to V
+ 4 V or
DD
. . . . . . . . . . . . . . . . . . . . . . 20 mA, Whichever Occurs First
Power Dissipation (Any Package)
Up to +75°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 470 mW
Derates above +75°C by . . . . . . . . . . . . . . . . . . 6 mW/°C
Operating Temperature
Commercial (K Version) . . . . . . . . . . . . . . –40°C to +85°C
Industrial (B Version) . . . . . . . . . . . . . . . . – 40°C to +85°C
DD
Extended (T Version) . . . . . . . . . . . . . . . –55°C to +125°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . . +300°C
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
2
Overvoltage at A, EN, S or D will be clamped by diodes. Current should be limited
to the Maximum Rating above.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the ADG506A/ADG507A feature proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
PIN CONFIGURATIONS
DIP, SOIC
WARNING!
ESD SENSITIVE DEVICE
V
1
DD
NC
2
NC
3
S16
4
S15
5
S14
6
(Not to Scale)
S13
7 8
S12
9
S11 S10
10 11
S9
GND
12
NC
13
A3
14
NC = NO CONNECT
ADG506A
TOP VIEW
28 27 26 25 24 23 22 21 20 19 18 17 16 15
DIP, SOIC, TSSOP
1
V
DD
DB
2
NC
3
S8B
4
S7B
5
S6B
6
(Not to Scale)
S5B
7 8
S4B
9
S3B S2B
10 11
S1B
GND
12
NC
13
NC
14
NC = NO CONNECT
ADG507A
TOP VIEW
28 27 26 25 24 23 22 21 20 19 18 17 16 15
D V S8 S7 S6 S5 S4 S3 S2 S1 EN A0 A1 A2
DA V S8A S7A S6A S5A S4A S3A S2A S1A EN A0 A1 A2
LCCC
SS
S15 S14 S13 S12 S11 S10
S9
S16
5 6 7 8
9 10 11
12
GND
DD
SS
D
S8
NCNCV
3426
2
ADG506A
TOP VIEW
(Not to Scale)
13 14 15 16 17 18
NC
NC = NO CONNECT
V
28 271
25
S7
24
S6
23
S5
22
S4
21
S3
20
S2
19
S1
A0
A1
A2
A3
EN
S15 S14 S13 S12 S11 S10
5 6 7 8 9
10
S9
11
LCCC
SS
S7B S6B S5B S4B S3B S2B S1B
S8B
5 6 7 8
9 10 11
12
GND
DD
SS
DA
S8A
NC
V
28 271
25
S7A
24
S6A
23
S5A
22
S4A
21
S3A
20
S2A
19
S1A
A0
A1
A2
EN
NCDBV
3426
2
ADG507A
TOP VIEW
(Not to Scale)
13 14 15 16 17 18
NC
NC = NO CONNECT
S7B S6B S5B S4B S3B S2B S1B
5 6 7 8
9 10 11
–4–
PLCC
DD
V
NC
NC
V
D
28 27 261234
PIN 1 IDENTIFIER
S16
ADG506A
TOP VIEW
(Not to Scale)
121314 15 16 17 18
NC = NO CONNECT
A1
A3
A2
NC
GND
A0
PLCC
SS
DD
V
S8B
121314 15 16 17 18
NC = NO CONNECT
GND
V
DB
NC
28 27 261234
PIN 1 IDENTIFIER
ADG507A
TOP VIEW
(Not to Scale)
A2
NC
NC
DA
A1
A0
SS
S8
25 24 23 22 21 20 19
EN
S8A
25 24 23 22 21 20 19
EN
REV. C
S7 S6 S5 S4 S3 S2 S1
S7A S6A S5A S4A S3A S2A S1A
Typical Performance Characteristics–
ADG506A/ADG507A
The multiplexers are guaranteed functional with reduced single or dual supplies down to 4.5 V.
Figure 1. RON as a Function of VD (VS): Dual Supply Voltage, T
= +25°C
A
Figure 2. Leakage Current as a Function of Temperature (Note: Leakage Currents Reduce as the Supply Voltages Reduce)
Figure 4. RON as a Function of VD (VS) Single Supply Voltage, T
= +25°C
A
Figure 5. Trigger Levels vs. Power Supply Voltage, Dual or Single Supply, T
= +25°C
A
Figure 3. t Supplies, T V
, V2 = VSS/VDD. See Test Circuit 6)
DD/VSS
REV. C
TRANSITION
A
vs. Supply Voltage: Dual and Single
= + 25°C (Note: For VDD and /VSS/ < 10 V; V1 =
Figure 6. IDD vs. Supply Voltage: Dual or Single Supply,
= +25°C
T
A
–5–
ADG506A/ADG507A
–Test Circuits
Note: All Digital Input Signal Rise and Fall Times Measured from 10% to 90% of 3 V. t
Test Circuit 1. R
ON
Test Circuit 2. IS (OFF)
= tF = 20 ns.
R
Test Circuit 3. ID (OFF)
Test Circuit 4. ID (ON)
Test Circuit 6. Switching Time of Multiplexer, t
Test Circuit 5. I
TRANSITION
DIFF
Test Circuit 7. Break-Before-Make Delay, t
–6–
OPEN
REV. C
ADG506A/ADG507A
Test Circuit 8. Enable Delay, tON (EN), t
Test Circuit 9. Charge Injection

SINGLE SUPPLY AUTOMOTIVE APPLICATION

The excellent performance of the multiplexers under single supply conditions makes the ADG506A/ADG507A suitable in applications such as automotive and disc drives where only positive power supply voltages are normally available. The fol­lowing application circuit shows the ADG507A connected as an 8-channel differential multiplexer in an automotive, data acqui­sition application circuit.
(EN)
OFF
The AD7580 is a 10-bit successive approximation ADC, which has an on-chip sample-hold amplifier and provides a conversion
result in 20 µs. The ADC has differential analog inputs and is
configured in the application circuit for a span of 2.5 V over a common-mode range 0 V to + 5 V. Wider common-mode ranges can be accommodated. See the AD7579/AD7580 data sheet for more details. The complete system operates from +12 V (+10%) and +5 V supplies. The analog input signals to the ADG507A contain information such as temperature, pressure, speed etc.
REV. C
Figure 7. ADG507A in a Single Supply Automotive Data Acquisition Application
–7–
ADG506A/ADG507A

TERMINOLOGY

R
ON
R
Match Difference between the RON of any two channels
ON
Drift Change in RON versus temperature
R
ON
I
(OFF) Source terminal leakage current when the switch
S
Ohmic resistance between terminals D and S
is off
(OFF) Drain terminal leakage current when the switch
I
D
is off
I
(ON) Leakage current that flows from the closed switch
D
into the body
(VD) Analog voltage on terminal S or D
V
S
C
(OFF) Channel input capacitance for “OFF” condition
S
(OFF) Channel output capacitance for “OFF” condition
C
D
C
IN
t
(EN) Delay time between the 50% and 90% points of
ON
Digital input capacitance
the digital input and switch “ON” condition
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
28-Lead Plastic DIP (Suffix N)
0.550 (13.97)
0.53 (13.47)
1.45(36.83)
1.44 (36.58)
0.2
(5.08)
MAX
0.065 (1.66)
0.045 (1.15)
LEADS ARE SOLDER OR TIN PLATED KOVAR OR ALLOY 42
0.020 (0.508)
0.015 (0.381)
LEAD NO. 1 IDENTIFIED BY DOT OR NOTCH
0.105 (2.67)
0.095 (2.42)
0.175 (4.45)
0.12 (3.05)
0.606 (15.4)
0.594 (15.09)
0.012 (0.305)
0.008 (0.203)
0.16 (4.07)
0.14 (3.56)
15
0
(EN) Delay time between the 50% and 10% points of
t
OFF
the digital input and switch “OFF” condition
t
TRANSITION
Delay time between the 50% and 90% points of the digital inputs and switch “ON” condition when switching from one address state to another
t
OPEN
“OFF” time measured between 50% points of both switches when switching from one address
state to another V V I V V I I
INL
INH
INL
DD
SS
DD
SS
(I
INH
Maximum input voltage for Logic “0”
Minimum input voltage for Logic “1”
) Input current of the digital input
Most positive voltage supply
Most negative voltage supply
Positive supply current
Negative supply current
28-Lead Cerdip (Suffix Q)
1.490 (37.84) MAX
0.525 (13.33)
0.515 (13.08)
0.22 (5.59)
GLASS
MAX
SEALANT
0.11 (2.79)
0.099 (2.28) LEAD NO. 1 IDENTIFIED BY DOT OR NOTCH
LEADS ARE SOLDER OR TIN PLATED KOVAR OR ALLOY 42
0.06 (1.52)
0.05 (1.27)
0.02 (0.5)
0.016 (0.406)
0.125
(3.175)
MIN
15
°
0
°
0.62 (15.74)
0.59 (14.93)
0.18(4.57)
0.012 (0.305)
0.008 (0.203)
C1150c–0–6/98
MAX
28-Lead SOIC (Suffix R)
0.7125 (18.10)
0.6969 (17.70)
28 15
0.2992 (7.60)
0.2914 (7.40)
0.0118 (0.30)
0.0040 (0.10)
PIN 1
0.0500 (1.27)
BSC
0.0192 (0.49)
0.0138 (0.35)
141
0.1043 (2.65)
0.0926 (2.35)
SEATING
PLANE
0.4193 (10.65)
0.0125 (0.32)
0.0091 (0.23)
0.3937 (10.00)
0.0291 (0.74)
0.0098 (0.25)
0.0500 (1.27)
8° 0°
0.0157 (0.40)
28-Terminal Plastic Leaded Chip Carrier (Suffix P)
4
5
IDENTIFIER
TOP VIEW
(PINS DOWN)
11
12
0.456 (11.582)
0.450 (11.430)
0.498 (12.57)
0.485 (12.32)
PIN 1
SQ
SQ
26
25
19
18
0.180 (4.51)
0.165 (4.20)
0.050 0.005
01.27 0.13
0.021 (0.533)
0.013 (0.331)
0.032 (0.812)
0.026 (0.661)
0.120 (3.04)
0.090 (2.29)
0.430 (10.5)
0.390 (9.9)
x 45°
28-Lead TSSOP (Suffix RU)
0.386 (9.80)
0.378 (9.60)
28 15
0.177 (4.50)
0.169 (4.30)
1
0.006 (0.15)
0.002 (0.05)
SEATING
PLANE
PIN 1
0.0256 (0.65) BSC
0.0118 (0.30)
0.0075 (0.19)
14
0.256 (6.50)
0.246 (6.25)
0.0433 (1.10)
MAX
0.0079 (0.20)
0.0035 (0.090)
8° 0°
0.028 (0.70)
0.020 (0.50)
28-Terminal Leadless Ceramic Chip Carrier (Suffix E)
0.300 (7.62) BSC
R TYP
0.075 (1.91)
REF
0.075 (1.91)
REF
26
18
0.055 (1.40)
0.045 (1.14)
2 5
19
0.150 (3.51)
28
1
BOTTOM
VIEW
BSC
0.200 (5.08) BSC
5
12
11
4
45° TYP
0.015 (0.38) MIN
0.028 (0.71)
0.022 (0.56)
0.050 (1.27) BSC
0.458 (11.63)
0.442 (11.23) SQ
0.100 (2.54)
0.064 (1.63)
0.458
(11.63)
MAX
SQ
0.088 (2.24)
0.054 (1.37)
0.095 (2.41)
0.075 (1.90)
0.011 (0.28)
0.007 (0.18)
PRINTED IN U.S.A.
–8–
REV. C
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