Single/Dual Supply Specifications
Wide Supply Ranges (10.8 V to 16.5 V)
Extended Plastic Temperature Range
(–40ⴗC to +85ⴗC)
Low Power Dissipation (28 mW max)
Low Leakage (20 pA typ)
Available in 28-Lead DIP, SOIC, PLCC, TSSOP and LCCC
Packages
Superior Alternative to:
DG506A, Hl-506
DG507A, Hl-507
GENERAL DESCRIPTION
The ADG506A and ADG507A are CMOS monolithic analog
multiplexers with 16 channels and dual 8 channels, respectively.
The ADG506A switches one of 16 inputs to a common output,
depending on the state of four binary addresses and an enable
input. The ADG507A switches one of eight differential inputs to
a common differential output, depending on the state of three
binary addresses and an enable input. Both devices have TTL
and 5 V CMOS logic compatible digital inputs.
The ADG506A and ADG507A are designed on an enhanced
2
LC
MOS process, which gives an increased signal capability of
to VDD and enables operation over a wide range of supply
V
SS
voltages. The devices can operate comfortably anywhere in the
10.8 V to 16.5 V single or dual supply range. These multiplexers
also feature high switching speeds and low R
PRODUCT HIGHLIGHTS
1. Single/Dual Supply Specifications with a Wide Tolerance
The devices are specified in the 10.8 V to 16.5 V range for
both single and dual supplies.
2. Extended Signal Range
The enhanced LC
down and an increased analog signal range of V
3. Break-Before-Make Switching
Switches are guaranteed break-before-make so input signals
are protected against momentary shorting.
4. Low Leakage
Leakage currents in the range of 20 pA make these multiplexers
suitable for high precision circuits.
2
MOS processing results in a high break-
ON
.
to VDD.
SS
8-/16-Channel Analog Multiplexers
ADG506A/ADG507A
FUNCTIONAL BLOCK DIAGRAM
ORDERING GUIDE
1
Model
ADG506AKN–40°C to +85°CN-28
ADG506AKR–40°C to +85°CR-28
ADG506AKP–40°C to +85°CP-28A
ADG506ABQ–40°C to +85°CQ-28
ADG506ATQ–55°C to +125°CQ-28
ADG506ATE–55°C to +125°CE-28A
ADG507AKN–40°C to +85°CN-28
ADG507AKR–40°C to +85°CR-28
ADG507AKP–40°C to +85°CP-28A
ADG507AKRU–40°C to +85°CRU-28
ADG507ABQ–40°C to +85°CQ-28
ADG507ATQ–55°C to +125°CQ-28
ADG507ATE–55°C to +125°CE-28A
NOTES
1
To order MIL-STD-883, Class B processed parts, add /883B to part number.
See Analog Devices’ Military/Aerospace Reference Manual (1994) for military
data sheet.
2
E = Leadless Ceramic Chip Carrier (LCCC); N = Plastic DIP; P = Plastic
Leaded Chip Carrier (PLCC); Q = Cerdip; R = 0.3" Small Outline IC (SOIC);
RU = Thin Shrink Small Outline Package (TSSOP).
TemperaturePackage
RangeOption
2
REV. C
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
300400300400300400ns max
505050ns typTest Circuit 7
251025102510ns min
200200200ns typTest Circuit 8
300400300400300400ns max
200200200ns typTest Circuit 8
300400300400300400ns max
= 1 kΩ, C
505050dB minVS = 7 V rms, f = 100 kHz
L
= 15 pF,
L
CS (OFF)555pF typVEN = 0.8 V
CD (OFF)
ADG506A444444pF typVEN = 0.8 V
ADG507A222222pF typ
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . . +300°C
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
2
Overvoltage at A, EN, S or D will be clamped by diodes. Current should be limited
to the Maximum Rating above.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the ADG506A/ADG507A feature proprietary ESD protection circuitry, permanent
damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper
ESD precautions are recommended to avoid performance degradation or loss of functionality.
PIN CONFIGURATIONS
DIP, SOIC
WARNING!
ESD SENSITIVE DEVICE
V
1
DD
NC
2
NC
3
S16
4
S15
5
S14
6
(Not to Scale)
S13
7
8
S12
9
S11
S10
10
11
S9
GND
12
NC
13
A3
14
NC = NO CONNECT
ADG506A
TOP VIEW
28
27
26
25
24
23
22
21
20
19
18
17
16
15
DIP, SOIC, TSSOP
1
V
DD
DB
2
NC
3
S8B
4
S7B
5
S6B
6
(Not to Scale)
S5B
7
8
S4B
9
S3B
S2B
10
11
S1B
GND
12
NC
13
NC
14
NC = NO CONNECT
ADG507A
TOP VIEW
28
27
26
25
24
23
22
21
20
19
18
17
16
15
D
V
S8
S7
S6
S5
S4
S3
S2
S1
EN
A0
A1
A2
DA
V
S8A
S7A
S6A
S5A
S4A
S3A
S2A
S1A
EN
A0
A1
A2
LCCC
SS
S15
S14
S13
S12
S11
S10
S9
S16
5
6
7
8
9
10
11
12
GND
DD
SS
D
S8
NCNCV
3426
2
ADG506A
TOP VIEW
(Not to Scale)
13 14 15 16 17 18
NC
NC = NO CONNECT
V
28 271
25
S7
24
S6
23
S5
22
S4
21
S3
20
S2
19
S1
A0
A1
A2
A3
EN
S15
S14
S13
S12
S11
S10
5
6
7
8
9
10
S9
11
LCCC
SS
S7B
S6B
S5B
S4B
S3B
S2B
S1B
S8B
5
6
7
8
9
10
11
12
GND
DD
SS
DA
S8A
NC
V
28 271
25
S7A
24
S6A
23
S5A
22
S4A
21
S3A
20
S2A
19
S1A
A0
A1
A2
EN
NCDBV
3426
2
ADG507A
TOP VIEW
(Not to Scale)
13 14 15 16 17 18
NC
NC = NO CONNECT
S7B
S6B
S5B
S4B
S3B
S2B
S1B
5
6
7
8
9
10
11
–4–
PLCC
DD
V
NC
NC
V
D
28 27 261234
PIN 1
IDENTIFIER
S16
ADG506A
TOP VIEW
(Not to Scale)
121314 15 16 17 18
NC = NO CONNECT
A1
A3
A2
NC
GND
A0
PLCC
SS
DD
V
S8B
121314 15 16 17 18
NC = NO CONNECT
GND
V
DB
NC
28 27 261234
PIN 1
IDENTIFIER
ADG507A
TOP VIEW
(Not to Scale)
A2
NC
NC
DA
A1
A0
SS
S8
25
24
23
22
21
20
19
EN
S8A
25
24
23
22
21
20
19
EN
REV. C
S7
S6
S5
S4
S3
S2
S1
S7A
S6A
S5A
S4A
S3A
S2A
S1A
Typical Performance Characteristics–
ADG506A/ADG507A
The multiplexers are guaranteed functional with reduced single or dual supplies down to 4.5 V.
Figure 1. RON as a Function of VD (VS): Dual Supply
Voltage, T
= +25°C
A
Figure 2. Leakage Current as a Function of Temperature
(Note: Leakage Currents Reduce as the Supply Voltages
Reduce)
Figure 4. RON as a Function of VD (VS) Single Supply
Voltage, T
= +25°C
A
Figure 5. Trigger Levels vs. Power Supply Voltage, Dual
or Single Supply, T
= +25°C
A
Figure 3. t
Supplies, T
V
, V2 = VSS/VDD. See Test Circuit 6)
DD/VSS
REV. C
TRANSITION
A
vs. Supply Voltage: Dual and Single
= + 25°C (Note: For VDD and /VSS/ < 10 V; V1 =
Figure 6. IDD vs. Supply Voltage: Dual or Single Supply,
= +25°C
T
A
–5–
ADG506A/ADG507A
–Test Circuits
Note: All Digital Input Signal Rise and Fall Times Measured from 10% to 90% of 3 V. t
Test Circuit 1. R
ON
Test Circuit 2. IS (OFF)
= tF = 20 ns.
R
Test Circuit 3. ID (OFF)
Test Circuit 4. ID (ON)
Test Circuit 6. Switching Time of Multiplexer, t
Test Circuit 5. I
TRANSITION
DIFF
Test Circuit 7. Break-Before-Make Delay, t
–6–
OPEN
REV. C
ADG506A/ADG507A
Test Circuit 8. Enable Delay, tON (EN), t
Test Circuit 9. Charge Injection
SINGLE SUPPLY AUTOMOTIVE APPLICATION
The excellent performance of the multiplexers under single
supply conditions makes the ADG506A/ADG507A suitable in
applications such as automotive and disc drives where only
positive power supply voltages are normally available. The following application circuit shows the ADG507A connected as an
8-channel differential multiplexer in an automotive, data acquisition application circuit.
(EN)
OFF
The AD7580 is a 10-bit successive approximation ADC, which
has an on-chip sample-hold amplifier and provides a conversion
result in 20 µs. The ADC has differential analog inputs and is
configured in the application circuit for a span of 2.5 V over a
common-mode range 0 V to + 5 V. Wider common-mode ranges
can be accommodated. See the AD7579/AD7580 data sheet for
more details. The complete system operates from +12 V (+10%)
and +5 V supplies. The analog input signals to the ADG507A
contain information such as temperature, pressure, speed etc.
REV. C
Figure 7. ADG507A in a Single Supply Automotive Data Acquisition Application
–7–
ADG506A/ADG507A
TERMINOLOGY
R
ON
R
MatchDifference between the RON of any two channels
ON
DriftChange in RON versus temperature
R
ON
I
(OFF)Source terminal leakage current when the switch
S
Ohmic resistance between terminals D and S
is off
(OFF)Drain terminal leakage current when the switch
I
D
is off
I
(ON)Leakage current that flows from the closed switch
D
into the body
(VD)Analog voltage on terminal S or D
V
S
C
(OFF)Channel input capacitance for “OFF” condition
S
(OFF)Channel output capacitance for “OFF” condition
C
D
C
IN
t
(EN)Delay time between the 50% and 90% points of
ON
Digital input capacitance
the digital input and switch “ON” condition
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
28-Lead Plastic DIP (Suffix N)
0.550 (13.97)
0.53 (13.47)
1.45(36.83)
1.44 (36.58)
0.2
(5.08)
MAX
0.065 (1.66)
0.045 (1.15)
LEADS ARE SOLDER OR TIN PLATED KOVAR OR ALLOY 42
0.020 (0.508)
0.015 (0.381)
LEAD NO. 1 IDENTIFIED BY DOT OR NOTCH
0.105 (2.67)
0.095 (2.42)
0.175 (4.45)
0.12 (3.05)
0.606 (15.4)
0.594 (15.09)
0.012 (0.305)
0.008 (0.203)
0.16 (4.07)
0.14 (3.56)
15ⴗ
0
(EN)Delay time between the 50% and 10% points of
t
OFF
the digital input and switch “OFF” condition
t
TRANSITION
Delay time between the 50% and 90% points of
the digital inputs and switch “ON” condition
when switching from one address state to
another
t
OPEN
“OFF” time measured between 50% points of
both switches when switching from one address
state to another
V
V
I
V
V
I
I
INL
INH
INL
DD
SS
DD
SS
(I
INH
Maximum input voltage for Logic “0”
Minimum input voltage for Logic “1”
)Input current of the digital input
Most positive voltage supply
Most negative voltage supply
Positive supply current
Negative supply current
28-Lead Cerdip (Suffix Q)
1.490 (37.84) MAX
0.525 (13.33)
0.515 (13.08)
0.22 (5.59)
GLASS
MAX
SEALANT
0.11 (2.79)
0.099 (2.28)
LEAD NO. 1 IDENTIFIED BY DOT OR NOTCH