Analog Devices ADG408TQ, ADG408BRU, ADG408BR, ADG408BN, ADG409TQ Datasheet

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REV. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
a
LC2MOS 4-/8-Channel
High Performance Analog Multiplexers
ADG408/ADG409
FEATURES 44 V Supply Maximum Ratings VSS to VDD Analog Signal Range Low On Resistance (100 V max) Low Power (I
SUPPLY
< 75 mA) Fast Switching Break-Before-Make Switching Action Plug-in Replacement for DG408/DG409
APPLICATIONS Audio and Video Routing Automatic Test Equipment Data Acquisition Systems Battery Powered Systems Sample and Hold Systems Communication Systems
GENERAL DESCRIPTION
The ADG408 and ADG409 are monolithic CMOS analog multiplexers comprising eight single channels and four differen­tial channels respectively. The ADG408 switches one of eight inputs to a common output as determined by the 3-bit binary address lines A0, A1 and A2. The ADG409 switches one of four differential inputs to a common differential output as deter­mined by the 2-bit binary address lines A0 and A1. An EN input on both devices is used to enable or disable the device. When disabled, all channels are switched OFF.
The ADG408/ADG409 are designed on an enhanced LC
2
MOS process which provides low power dissipation yet gives high switching speed and low on resistance. Each channel conducts equally well in both directions when ON and has an input signal range that extends to the supplies. In the OFF condition, signal levels up to the supplies are blocked. All channels exhibit break­before-make switching action, preventing momentary shorting when switching channels. Inherent in the design is low charge injection for minimum transients when switching the digital inputs.
The ADG408/ADG409 are improved replacements for the DG408/DG409 Analog Multiplexers.
PRODUCT HIGHLIGHTS
1. Extended Signal Range The ADG408/ADG409 are fabricated on an enhanced LC
2
MOS process giving an increased signal range that
extends to the supply rails.
2. Low Power Dissipation
3 Low R
ON
4. Single Supply Operation For applications where the analog signal is unipolar, the ADG408/ADG409 can be operated from a single rail power supply. The parts are fully specified with a single +12 V power supply and will remain functional with single supplies as low as +5 V.
FUNCTIONAL BLOCK DIAGRAMS
ADG408
1 OF 8
DECODER
S1
S8
D
A0 A1 A2 EN
ADG409
1 OF 4
DECODER
S1A
S4B
DA
A0 A1 EN
DB
S4A
S1B
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 World Wide Web Site: http://www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 1998
ADG408/ADG409–SPECIFICATIONS
DUAL SUPPLY
1
B Version T Version
–408C to –558C to
Parameter +258C +858C +258C +1258C Units Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range V
SS
to V
DD
VSS to VDDV
R
ON
40 40 typ VD = ±10 V, I
S
= –10 mA
100 125 100 125 max
R
ON
15 15 max V
D
= +10 V, –10 V
LEAKAGE CURRENTS
Source OFF Leakage I
S
(OFF) ±0.5 ±50 ±0.5 ±50 nA max VD = ±10 V, V
S
= 710 V;
Test Circuit 2
Drain OFF Leakage I
D
(OFF) V
D
= ±10 V; V
S
= 710 V;
ADG408 ±1 ±100 ± 1 ±100 nA max Test Circuit 3 ADG409 ±1 ±50 ±1 ±50 nA max
Channel ON Leakage I
D
, IS (ON) VS = V
D
= ±10 V; ADG408 ±1 ±100 ± 1 ±100 nA max Test Circuit 4 ADG409 ±1 ±50 ±1 ±50 nA max
DIGITAL INPUTS
Input High Voltage, V
INH
2.4 2.4 V min
Input Low Voltage, V
INL
0.8 0.8 V max
Input Current
I
INL
or I
INH
±10 ± 10 µA max V
IN
= 0 or V
DD
CIN, Digital Input Capacitance 8 8 pF typ f = 1 MHz
DYNAMIC CHARACTERISTICS
2
t
TRANSITION
120 120 ns typ R
L
= 300 , C
L
= 35 pF;
250 250 ns max V
S1
= ±10 V, V
SS
= 710 V;
Test Circuit 5
t
OPEN
10 10 10 10 ns min R
L
= 300 , C
L
= 35 pF;
V
S
= +5 V; Test Circuit 6
t
ON
(EN) 85 125 85 125 ns typ R
L
= 300 , C
L
= 35 pF;
150 225 150 225 ns max V
S
= +5 V; Test Circuit 7
t
OFF
(EN) 65 65 ns typ R
L
= 300 , C
L
= 35 pF;
150 150 ns max V
S
= +5 V; Test Circuit 7
Charge Injection 20 20 pC typ V
S
= 0 V, R
S
= 0 , C
L
= 10 nF;
Test Circuit 8
OFF Isolation –75 –75 dB typ R
L
= 1 k, f = 100 kHz;
V
EN
= 0 V; Test Circuit 9
Channel-to-Channel Crosstalk 85 85 dB typ R
L
= 1 k, f = 100 kHz;
Test Circuit 10
C
S
(OFF) 11 11 pF typ f = 1 MHz
C
D
(OFF) f = 1 MHz ADG408 40 40 pF typ ADG409 20 20 pF typ
C
D
, CS (ON) f = 1 MHz ADG408 54 54 pF typ ADG409 34 34 pF typ
POWER REQUIREMENTS
I
DD
11µA typ V
IN
= 0 V, VEN = 0 V
55µA max
I
SS
11µA typ 55µA max
I
DD
100 100 µA typ V
IN
= 0 V, VEN = 2.4 V
200 500 200 500 µA max
NOTES
1
Temperature ranges are as follows: B Version: –40°C to +85°C; T Version: –55 °C to +125°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
REV. A
–2–
(VDD = +15 V, VSS = –15 V, GND = 0 V, unless otherwise noted)
–3–
REV. A
ADG408/ADG409
SINGLE SUPPLY
1
B Version T Version
–408C to –558C to
Parameter +258C +858C +258C +1258C Units Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 to V
DD
0 to V
DD
V
R
ON
90 90 typ V
D
= +3 V, +10 V, IS = –1 mA
LEAKAGE CURRENTS
Source OFF Leakage I
S
(OFF) ±0.5 ±50 ±0.5 ±50 nA max V
D
=8 V/0 V, VS = 0 V/8 V;
Test Circuit 2
Drain OFF Leakage I
D
(OFF) VD =8 V/0 V, VS = 0 V/8 V;
ADG408 ±1 ±100 ± 1 ±100 nA max Test Circuit 3 ADG409 ±1 ±50 ±1 ±50 nA max
Channel ON Leakage I
D
, IS (ON) VS = VD = 8 V/0 V;
ADG408 ±1 ±100 ± 1 ±100 nA max Test Circuit 4 ADG409 ±1 ±50 ±1 ±50 nA max
DIGITAL INPUTS
Input High Voltage, V
INH
2.4 2.4 V min
Input Low Voltage, V
INL
0.8 0.8 V max
Input Current
I
INL
or I
INH
±10 ± 10 µA max V
IN
= 0 or V
DD
CIN, Digital Input Capacitance 8 8 pF typ f = 1 MHz
DYNAMIC CHARACTERISTICS
2
t
TRANSITION
130 130 ns typ R
L
= 300 , C
L
= 35 pF;
V
S1
= 8 V/0 V, VS8 = 0 V/8 V;
Test Circuit 5
t
OPEN
10 10 ns typ R
L
= 300 , C
L
= 35 pF;
V
S
= +5 V; Test Circuit 6
t
ON
(EN) 140 140 ns typ R
L
= 300 , C
L
= 35 pF;
V
S
= +5 V; Test Circuit 7
t
OFF
(EN) 60 60 ns typ R
L
= 300 , C
L
= 35 pF;
V
S
= +5 V; Test Circuit 7
Charge Injection 5 5 pC typ V
S
= 0 V, R
S
= 0 , C
L
= 10 nF;
Test Circuit 8
OFF Isolation –75 –75 dB typ R
L
= 1 k, f = 100 kHz;
V
EN
= 0 V; Test Circuit 9
Channel-to-Channel Crosstalk 85 85 dB typ R
L
= 1 k, f = 100 kHz;
Test Circuit 10
C
S
(OFF) 11 11 pF typ f = 1 MHz
C
D
(OFF) f = 1 MHz ADG408 40 40 pF typ ADG409 20 20 pF typ
C
D
, CS (ON) f = 1 MHz ADG408 54 54 pF typ ADG409 34 34 pF typ
POWER REQUIREMENTS
I
DD
11µA typ V
IN
= 0 V, VEN = 0 V
55µA max
I
DD
100 100 µA typ V
IN
= 0 V, VEN = 2.4 V
200 500 200 500 µA max
NOTES
1
Temperature ranges are as follows: B Version: –40°C to +85°C; T Version: –55 °C to +125°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
(VDD = +12 V, VSS = 0 V, GND = 0 V, unless otherwise noted)
ADG408/ADG409
REV. A
–4–
ABSOLUTE MAXIMUM RATINGS
1
(T
A
= +25°C unless otherwise noted)
VDD to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +44 V
V
DD
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +25 V
V
SS
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –25 V
Analog, Digital Inputs
2
. . . . . VSS –2 V to VDD +2 V or 20 mA,
Whichever Occurs First
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . . 20 mA
Peak Current, S or D
(Pulsed at 1 ms, 10% Duty Cycle max) . . . . . . . . . . . 40 mA
Operating Temperature Range
Industrial (B Version) . . . . . . . . . . . . . . . . . –40°C to +85°C
Extended (T Version) . . . . . . . . . . . . . . . . –55°C to +125°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . +150°C
Cerdip Package, Power Dissipation . . . . . . . . . . . . . . . 900 mW
θ
JA
, Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 76°C/W
Lead Temperature, Soldering (10 sec) . . . . . . . . . . . +300°C
Plastic Package, Power Dissipation . . . . . . . . . . . . . . . 470 mW
θ
JA
, Thermal Impedance . . . . . . . . . . . . . . . . . . . . 117°C/W
Lead Temperature, Soldering (10 sec) . . . . . . . . . . . +260°C
TSSOP Package, Power Dissipation . . . . . . . . . . . . . . 450 mW
θ
JA
, Thermal Impedance . . . . . . . . . . . . . . . . . . . . 155°C/W
θ
JC
, Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 50°C/W
SOIC Package, Power Dissipation . . . . . . . . . . . . . . . . 600 mW
θ
JA
, Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 77°C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . +215°C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . +220°C
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Only one absolute maximum rating may be applied at any one time.
2
Overvoltages at A, EN, S or D will be clamped by internal diodes. Current should
be limited to the maximum ratings given.
ORDERING INFORMATION
Model
1
Temperature Range Package Option
2
ADG408BN –40°C to +85°C N-16 ADG408BR –40°C to +85°C R-16A ADG408BRU –40°C to +85°C RU-16 ADG408TQ –55°C to +125°C Q-16
ADG409BN –40°C to +85°C N-16 ADG409BR –40°C to +85°C R-16A ADG409TQ –55°C to +125°C Q-16
NOTES
1
To order MIL-STD-883, Class B processed parts, add /883B to T grade part numbers.
2
N = Plastic DIP; Q = Cerdip; R = 0.15" Small Outline IC (SOIC); RU = Think Shrink Small Outline Package (TSSOP).
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the ADG408/ADG409 feature proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
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