Analog Devices ADG408 9 b Datasheet

LC2MOS 4-/8-Channel

ADG408

1-OF-8

DECODER

S1

S8

D

A0 A1 A2 EN

ADG409

1-OF-4

DECODER

S1A

S4B

DA

A0 A1 EN

DB

S4A

S1B

a

FEATURES
44 V Supply Maximum Ratings

to VDD Analog Signal Range

V

SS

Low On Resistance (100 ⍀ max)
Low Power (I
Fast Switching
Break-Before-Make Switching Action
Plug-in Replacement for DG408/DG409

APPLICATIONS
Audio and Video Routing
Automatic Test Equipment
Data Acquisition Systems
Battery-Powered Systems
Sample-and-Hold Systems
Communication Systems

GENERAL DESCRIPTION

SUPPLY

< 75 ␮A)

High Performance Analog Multiplexers

The ADG408 and ADG409 are monolithic CMOS analog
multiplexers comprising eight single channels and four differen­tial channels, respectively. The ADG408 switches one of eight
inputs to a common output as determined by the 3-bit binary
address lines A0, A1, and A2. The ADG409 switches one of
four differential inputs to a common differential output as
determined by the 2-bit binary address lines A0 and A1. An
EN input on both devices is used to enable or disable the
device. When disabled, all channels are switched OFF.

2

The ADG408/ADG409 are designed on an enhanced LC

MOS
process that provides low power dissipation yet gives high
switching speed and low on resistance. Each channel conducts
equally well in both directions when ON and has an input signal
range that extends to the supplies. In the OFF condition, signal
levels up to the supplies are blocked. All channels exhibit break­before-make switching action, preventing momentary shorting
when switching channels. Inherent in the design is low charge
injection for minimum transients when switching the digital inputs.

The ADG408/ADG409 are improved replacements for the
DG408/DG409 analog multiplexers.

ADG408/ADG409

FUNCTIONAL BLOCK DIAGRAMS

PRODUCT HIGHLIGHTS

1. Extended Signal Range.
The ADG408/ADG409 are fabricated on an enhanced

2

MOS process, giving an increased signal range that

LC
extends to the supply rails.

2. Low Power Dissipation.

3 Low R

4. Single-Supply Operation.
For applications where the analog signal is unipolar, the
ADG408/ADG409 can be operated from a single rail power
supply. The parts are fully specified with a single 12 V power
supply and will remain functional with single supplies as
low as 5 V.

ON

.

REV. B

Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices. Trademarks and
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One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: [phone] www.analog.com
Fax: [phone] © 2003 Analog Devices, Inc. All rights reserved.

ADG408/ADG409–SPECIFICATIONS

1

DUAL SUPPLY

Parameter +25ⴗC +85ⴗC +25ⴗC +125ⴗC Unit Test Conditions/Comments

ANALOG SWITCH

Analog Signal Range V
R

ON

DR

ON

LEAKAGE CURRENTS

Source OFF Leakage I

Drain OFF Leakage I

ADG408 ± 1 ± 100 ±1 ± 100 nA max Test Circuit 3
ADG409 ± 1 ± 50 ±1 ± 50 nA max

Channel ON Leakage I

ADG408 ± 1 ± 100 ±1 ± 100 nA max Test Circuit 4
ADG409 ± 1 ± 50 ±1 ± 50 nA max

DIGITAL INPUTS

Input High Voltage, V
Input Low Voltage, V
Input Current

I

or I

INL

CIN, Digital Input Capacitance 8 8 pF typ f = 1 MHz

DYNAMIC CHARACTERISTICS

t

TRANSITION

t

OPEN

t

(EN) 85 125 85 125 ns typ RL = 300 W, CL = 35 pF;

ON

t

OFF

Charge Injection 20 20 pC typ V

OFF Isolation –75 –75 dB typ R

Channel-to-Channel Crosstalk 85 85 dB typ R

C

(OFF) 11 11 pF typ f = 1 MHz

S

C

(OFF) f = 1 MHz

D

ADG408 40 40 pF typ
ADG409 20 20 pF typ

C

, CS (ON) f = 1 MHz

D

ADG408 54 54 pF typ
ADG409 34 34 pF typ

POWER REQUIREMENTS

I

DD

I

SS

I

DD

NOTES

1

Temperature ranges are as follows: B Version: –40∞ C to +85∞C; T Version: –55∞C to +125∞C.

2

Guaranteed by design, not subject to production test.

Specifications subject to change without notice.

INH

(EN) 65 65 ns typ RL = 300 W, CL = 35 pF;

(VDD = +15 V, VSS = –15 V, GND = 0 V, unless otherwise noted.)

B Version T Version

–40ⴗC to –55ⴗC to

SS

to V

DD

VSS to VDDV

40 40 W typ VD = ± 10 V, IS = –10 mA
100 125 100 125 W max
15 15 W max VD = +10 V, –10 V

(OFF) ± 0.5 ± 50 ± 0.5 ± 50 nA max VD = ± 10 V, VS = 10 V;

S

Test Circuit 2

(OFF) VD = ± 10 V; VS = 10 V;

D

, IS (ON) VS = VD = ± 10 V;

D

INH

INL

2

2.4 2.4 V min

0.8 0.8 V max

± 10 ±10 mA max VIN = 0 or V

DD

120 120 ns typ RL = 300 W, CL = 35 pF;
250 250 ns max V

= ± 10 V, VS8 = 10 V;

S1

Test Circuit 5

10 10 10 10 ns min RL = 300 W, CL = 35 pF;

V

= 5 V; Test Circuit 6

S

150 225 150 225 ns max V

150 150 ns max V

= 5 V; Test Circuit 7

S

= 5 V; Test Circuit 7

S

= 0 V, RS = 0 W, CL = 10 nF;

S

Test Circuit 8

= 1 kW, f = 100 kHz;

L

V

= 0 V; Test Circuit 9

EN

= 1 kW, f = 100 kHz;

L

Test Circuit 10

11mA typ VIN = 0 V, VEN = 0 V
55mA max
11mA typ

55mA max
100 100 mA typ VIN = 0 V, VEN = 2.4 V
200 500 200 500 mA max

–2–

REV. B

ADG408/ADG409

1

SINGLE SUPPLY

Parameter +25ⴗC +85ⴗC +25ⴗC +125ⴗC Unit Test Conditions/Comments

ANALOG SWITCH

Analog Signal Range 0 to V
R

ON

LEAKAGE CURRENTS

Source OFF Leakage I

Drain OFF Leakage I

ADG408 ± 1 ± 100 ±1 ± 100 nA max Test Circuit 3
ADG409 ± 1 ± 50 ± 1 ± 50 nA max

Channel ON Leakage I

ADG408 ± 1 ± 100 ±1 ± 100 nA max Test Circuit 4
ADG409 ± 1 ± 50 ± 1 ± 50 nA max

DIGITAL INPUTS

Input High Voltage, V
Input Low Voltage, V
Input Current

I

or I

INL

CIN, Digital Input Capacitance 8 8 pF typ f = 1 MHz

DYNAMIC CHARACTERISTICS

t

TRANSITION

t

OPEN

t

(EN) 140 140 ns typ RL = 300 W, CL = 35 pF;

ON

t

OFF

Charge Injection 5 5 pC typ V

OFF Isolation –75 –75 dB typ R

Channel-to-Channel Crosstalk 85 85 dB typ R

C

(OFF) 11 11 pF typ f = 1 MHz

S

C

(OFF) f = 1 MHz

D

ADG408 40 40 pF typ
ADG409 20 20 pF typ

C

, CS (ON) f = 1 MHz

D

ADG408 54 54 pF typ
ADG409 34 34 pF typ

POWER REQUIREMENTS

I

DD

I

DD

NOTES

1

Temperature ranges are as follows: B Version: –40∞ C to +85∞C; T Version: –55∞C to +125∞C.

2

Guaranteed by design, not subject to production test.

Specifications subject to change without notice.

INH

(EN) 60 60 ns typ RL = 300 W, CL = 35 pF;

(VDD = 12 V, VSS = 0 V, GND = 0 V, unless otherwise noted.)

B Version T Version

–40ⴗC to –55ⴗC to

DD

0 to V

DD

V

90 90 W typ VD = 3 V, 10 V, IS = –1 mA

(OFF) ± 0.5 ± 50 ± 0.5 ± 50 nA max VD = 8 V/0 V, VS = 0 V/8 V;

S

Test Circuit 2

(OFF) VD = 8 V/0 V, VS = 0 V/8 V;

D

, IS (ON) VS = VD = 8 V/0 V;

D

INH

INL

2

2.4 2.4 V min

0.8 0.8 V max

± 10 ±10 mA max VIN = 0 or V

DD

130 130 ns typ RL = 300 W, CL = 35 pF;

V

= 8 V/0 V, VS8 = 0 V/8 V;

S1

Test Circuit 5

10 10 ns typ RL = 300 W, CL = 35 pF;

V

= 5 V; Test Circuit 6

S

V

= 5 V; Test Circuit 7

S

V

= 5 V; Test Circuit 7

S

= 0 V, RS = 0 W, CL = 10 nF;

S

Test Circuit 8

= 1 kW, f = 100 kHz;

L

V

= 0 V; Test Circuit 9

EN

= 1 kW, f = 100 kHz;

L

Test Circuit 10

11mA typ VIN = 0 V, VEN = 0 V

55mA max
100 100 mA typ VIN = 0 V, VEN = 2.4 V
200 500 200 500 mA max

REV. B

–3–

ADG408/ADG409

ABSOLUTE MAXIMUM RATINGS

(TA = 25∞C, unless otherwise noted.)

1

VDD to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44 V

to GND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +25 V

V

DD

V

to GND . . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –25 V

SS

Analog, Digital Inputs

2

. . . VSS – 2 V to VDD + 2 V or 20 mA,

Whichever Occurs First

Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . . 20 mA

Peak Current, S or D

(Pulsed at 1 ms, 10% Duty Cycle max) . . . . . . . . . . . 40 mA

Operating Temperature Range

Industrial (B Version) . . . . . . . . . . . . . . . . –40∞C to +85∞C

Extended (T Version) . . . . . . . . . . . . . . . –55∞C to +125∞C

Storage Temperature Range . . . . . . . . . . . –65∞C to +150∞C

Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 150∞C

CERDIP Package, Power Dissipation . . . . . . . . . . . . 900 mW

, Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 76∞C/W

q

JA

Lead Temperature, Soldering (10 sec) . . . . . . . . . . . . 300∞C

PDIP Package, Power Dissipation . . . . . . . . . . . . . . . 470 mW

, Thermal Impedance . . . . . . . . . . . . . . . . . . . . 117∞C/W

q

JA

Lead Temperature, Soldering (10 sec) . . . . . . . . . . . . 260∞C

TSSOP Package, Power Dissipation . . . . . . . . . . . . . 450 mW

, Thermal Impedance . . . . . . . . . . . . . . . . . . . . 155∞C/W

q

JA

, Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 50∞C/W

q

JC

SOIC Package, Power Dissipation . . . . . . . . . . . . . . . . 600 mW

, Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 77∞C/W

q

JA

Lead Temperature, Soldering

Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . . 215∞C

Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . . 220∞C

NOTES

1

Stresses above those listed under Absolute Maximum Ratings may cause per­manent damage to the device. This is a stress rating only; functional operation
of the device at these or any other conditions above those listed in the opera­tional sections of this specification is not implied. Exposure to absolute maxi­mum rating conditions for extended periods may affect device reliability. Only
one absolute maximum rating may be applied at any one time.

2

Overvoltages at A, EN, S, or D will be clamped by internal diodes. Current
should be limited to the maximum ratings given.

ORDERING GUIDE

1

Model

Temperature Range Package Option

ADG408BN –40∞C to +85∞C N-16
ADG408BR –40∞C to +85∞C R-16A
ADG408BRU –40∞C to +85∞C RU-16
ADG408TQ –55∞C to +125∞C Q-16

ADG409BN –40∞C to +85∞C N-16
ADG409BR –40∞C to +85∞C R-16A
ADG409BRU –40∞C to +85∞C RU-16
ADG409TQ –55∞C to +125∞C Q-16

NOTES

1

To order MIL-STD-883, Class B processed parts, add /883B to T grade part
numbers.

2

N = PDIP; Q = CERDIP; R = 0.15" Small Outline IC (SOIC);
RU = Thin Shrink Small Outline Package (TSSOP).

2

CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the ADG408/ADG409 feature proprietary ESD protection circuitry, permanent
damage may occur on devices subjected to high energy electrostatic discharges. Therefore,
proper ESD precautions are recommended to avoid performance degradation or loss of functionality.

–4–

REV. B