ANALOG DEVICES ADG1408, ADG1409 Service Manual

查询ADG1408供应商查询ADG1408供应商
Preliminary Technical Data
FEATURES
5 Max On Resistance
0.5 Max On Resistance Flatness 33 V Supply Maximum Ratings Fully specified at ±15V/12V/±5V
3V Logic Compatible Inputs Rail-to-Rail Operation Break-Before-Make Switching Action 16-Lead TSSOP Packages Typical Power Consumption (< 0.03 µW)
APPLICATIONS
Relay Replacement Audio and Video Routing Automatic Test Equipment Data Acquisition Systems Battery-Powered Systems Sample-and-Hold Systems Communication Systems
GENERAL DESCRIPTION
The ADG1408 and ADG1409 are monolithic CMOS analog multiplexers comprising eight single channels and four differential channels, respectively. The ADG1408 switches one of eight inputs to a common output as determined by the 3-bit binary address lines A0, A1, and A2. The ADG1409 switches one of four differential inputs to a common differential output as determined by the 2-bit binary address lines A0 and A1. An EN input on both devices is used to enable or disable the device. When disabled, all channels are switched OFF.
5
Μ
ax Ron, 4-/8-Channel
ADG1408/ADG1409
FUNCTIONAL BLOCK DIAGRAMS
ADG1408
S1
S8
1 OF 8
DECODER
A2
EN
A1
A0
SWITCHES SHOWN FOR A “1” LOGIC INPUT
S1A
S4A
D
S1B
S4B
PRODUCT HIGHLIGHTS
1. 5 Max On Resistance
2. 0.5 Max On Resistance Flatness
3. 3V Logic Compatible Digital Input = 2.0V, VIL = 0.8V
V
IH
4. 16 Lead TSSOP package
ADG1409
1 OF 4
DECODER
A0
A1
EN
DA
DB
The ADG1408/ADG1409 are designed on an enhanced CMOS process that provides low power dissipation yet gives high switching speed and low on resistance. Each channel conducts equally well in both directions when ON and has an input signal range that extends to the supplies. In the OFF condition, signal levels up to the supplies are blocked. All channels exhibit break-before- make switching action, preventing momentary shorting when switching channels. Inherent in the design is low charge injection for minimum transients when switching the digital inputs.
RevPrA
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective companies.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.326.8703 © 2003 Analog Devices, Inc. All rights reserved.
ADG1408/ADG1409 Preliminary Technical Data
TABLE OF CONTENTS
ADG1408/ADG1409—Specifications ........................................... 3
Terminology.......................................................................................9
Dual Supply................................................................................... 3
Single Supply................................................................................. 4
Absolute Maximum Ratings............................................................ 7
ESD Caution.................................................................................. 7
Pin Configurations (TSSOP) .......................................................... 8
REVISION HISTORY
Typical Performance Characteristics........................................... 10
Test Circuits..................................................................................... 12
Outline Dimensions....................................................................... 15
Ordering Guide............................................................................... 16
RevPr. A | Page 2 of 16
Preliminary Technical Data ADG1408/ADG1409
ADG1408/ADG1409—SPECIFICATIONS
DUAL SUPPLY1
Table 1. VDD = +15 V ± 10%, VSS = –15 V ± 10%, GND = 0 V, unless otherwise noted.
−40ºC to
Parameter +25ºC
+85ºC
ANALOG SWITCH
Analog Signal Range VSS to VDD V RON 3 Ω typ 4 5 5 Ω max RON Flatness Ω typ
0.5 Ω max ∆RON 0.5 Ω typ max LEAKAGE CURRENTS
Source OFF Leakage IS (OFF) ±0.01 nA typ
±0.5 ±2.5 ±50 nA max ±0.5 Drain OFF Leakage ID (OFF) VD = ±10 V; VS = ±10 V;
ADG1408 ±1 ±100 ±100 nA max Test Circuit 3 ADG1409 ±1 ±50 ±50 nA max
Channel ON Leakage ID, IS (ON) VS = VD = ±10 V;
ADG1408 ±1 ±100 ±100 nA max Test Circuit 4 ADG1409 ±1 ±50 ±50 nA max
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V
2.0 2.0 V min
INH
0.8 0.8 V max
INL
Input Current
I
or I
±0.005 µA max VIN= V
INL
INH
±0.5 ±0.5 µA max
CIN, Digital Input Capacitance 5 pF typ
DYNAMIC CHARACTERISTICS2
t
80 120 120 ns typ RL = 300 Ω, CL = 35 pF;
TRANSITION
250 250 ns max
T
10 10 10 ns typ RL = 300 Ω, CL = 35 pF;
BBM
1 ns min VS = 10 V; Test Circuit 6 tON(EN) 85 125 125 ns typ RL = 300 Ω CL = 35 pF; 150 225 225 ns max VS = 5 V; Test Circuit 7 t
(EN) 40 65 65 ns typ RL = 300 Ω, CL = 35 pF;
OFF
150 150 ns max VS = 5 V; Test Circuit 7
Charge Injection 20 20 pC typ
OFF Isolation 75 dB typ RL = 1 kΩ, f = 100 kHz; V Channel-to-Channel Crosstalk 85 dB typ RL = 1 kΩ, f = 100 kHz; Test Circuit 10 Total Harmonic Distortion, THD +
N
0.002 % typ R
-3dB Bandwidth 50
Test Circuit 10 CS (OFF) 15 pF typ f = 1 MHz CD (OFF) f = 1 MHz
−40ºC to +125ºC Unit Test Conditions/Comments
V
= ±10 V, IS = 10 mA
D
V
= +10 V, 10 V
D
V
= +10 V, 10 V
D
VD = ±10 V, VS = 10 V; Test Circuit 2
or V
INH
INL
VS1 = ±10 V, VS8 = ±10 V; Test Circuit 5
VS = 0 V, RS = 0 Ω, CL = 10 nF; Test Circuit 8
= 0 V; Test Circuit 9
EN
= 600 Ω, 5Vrms; f=20Hz to 20kHz
L
MHz typ
RL = 300 Ω, CL = 5 pF; Test Circuit 10
Rev. B | Page 3 of 16
ADG1408/ADG1409 Preliminary Technical Data
−40ºC to
Parameter +25ºC
+85ºC
ADG1408 100 pF typ ADG1409 50 pF typ
CD, CS(ON) f = 1 MHz
ADG1408 150 pF typ ADG1409 75 pF typ
POWER REQUIREMENTS VDD = +16.5V, VSS = -16.5V
IDD 0.001 µA typ Digital Inputs= 0 V or VDD 5 5 µA max IDD 150 µA typ Digital Inputs= 5 V 300 µA max ISS 0.001 µA typ Digital Inputs= 0 V or VDD 5 5 µA max I
0.001 µA typ Digital Inputs= 0 V or VDD
GND
5 5 µA max I
150 µA typ Digital Inputs= 5 V
GND
5 300 µA max
1
Temperature ranges are as follows: B Version: 40°C to +85°C; T Version: 40°C to +125°C.
2
Guaranteed by design, not subject to production test.
1
SINGLE SUPPLY
Table 2. VDD = 12 V V ± 10%,, VSS = 0 V, GND = 0 V, unless otherwise noted.
Parameter +25ºC −40ºC to +85ºC −40ºC to +125ºC Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 to VDD V RON 6 Ω typ VD = 3 V, 10 V, IS = –1 mA 7 8 9 Ω max RON Flatness Ω typ VD = 3 V, 10 V, IS = –1 mA
1.5 Ω max ∆RON 0.5 Ω typ VD = 3 V, 10 V, IS = –1 mA max Channel ON Leakage ID, IS (ON) VS = VD = 8 V/0 V;
ADG1408 ±1 ±100 ±100 nA max Test Circuit 4 ADG1409 ±1 ±50 ±50 nA max
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V Input Current
IINL or I
INH
C
Digital Input Capacitance 8 pF typ f = 1 MHz
IN,
DYNAMIC CHARACTERISTICS2
t
T 1 ns min VS = 5 V; Test Circuit 6 tON (EN) 140 ns typ RL = 300 Ω CL = 35 pF; V t
V
Charge Injection 5 pC typ VS = 0 V, RS = 0Ω, CL = 10 nF;
130 ns typ RL = 300 Ω, CL = 35 pF;
TRANSITION
10 ns typ RL = 300 Ω, CL = 35 pF;
BBM
(EN) 60 ns typ RL = 300 Ω, CL = 35 pF;
OFF
2.0 2.0 V min
INH
0.8 0.8 V max
INL
±10 ±10 µA max VIN = 0 or VDD
−40ºC to +125ºC Unit Test Conditions/Comments
= 8 V/0 V, VS8 = 0 V/8 V;
V
S1
Test Circuit 5
= 5 V; Test Circuit 7
S
= 5 V; Test Circuit 7
S
RevPr. A | Page 4 of 16
Preliminary Technical Data ADG1408/ADG1409
Parameter +25ºC −40ºC to +85ºC −40ºC to +125ºC Unit Test Conditions/Comments
Test Circuit 8 OFF Isolation –75 dB typ RL = 1 kΩ f = 100 kHz; V Channel-to-Channel Crosstalk 85 dB typ RL = 1 kΩ, f = 100 kHz; Test Circuit 10 Total Harmonic Distortion, THD + N 0.002 % typ RL = 600 Ω, 5Vrms; f=20Hz to 20kHz
-3dB Bandwidth 50 MHz typ RL = 300 Ω, CL = 5 pF; Test Circuit 10 CS (OFF) 15 pF typ f = 1 MHz CD (OFF) f = 1 MHz
ADG1408 100 pF typ ADG1409 50 pF typ
CD, CS (ON) f = 1 MHz
ADG1408 150 pF typ ADG1409 75 pF typ
POWER REQUIREMENTS V
IDD 1 1 µA typ Digital Inputs= 0 V or VDD 5 5 µA max IDD 150 µA typ Digital Inputs= 5
300 µA max
1
Temperature ranges are as follows: B Version: –40°C to +85° ; T Version: –55°C to +125°.
2
Guaranteed by design, not subject to production test.
DUAL SUPPLY
Table 3. VDD = +5 V ± 10%, VSS = –5 V ± 10%, GND = 0 V, unless otherwise noted.
1
= 0 V; Test Circuit 9
EN
= 13.2V
DD
−40ºC to
Parameter +25ºC
+85ºC
−40ºC to +125ºC Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range VSS to VDD V RON 6 Ω typ
V
= ±3.3 V, IS = 10 mA
D
7 8 10 Ω max ∆RON 0.5 Ω max
V
= +3.3 V, 3.3 V
D
LEAKAGE CURRENTS
Source OFF Leakage IS (OFF) ±0.01 nA typ
VD = ±3.3 V, VS = 3.3 V;
Test Circuit 2 ±0.5 ±2.5 ±50 nA max Drain OFF Leakage ID (OFF) VD = ±3.3. V; VS = ±3.3 V;
ADG1408 ±1 ±100 ±100 nA max Test Circuit 3 ADG1409 ±1 ±50 ±50 nA max
Channel ON Leakage ID, IS (ON) VS = VD = ±3.3 V;
ADG1408 ±1 ±100 ±100 nA max Test Circuit 4 ADG1409 ±1 ±50 ±50 nA max
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V
2.0 2.0 V min
INH
0.8 0.8 V max
INL
Input Current
I
or I
±0.005 µA max VIN= V
INL
INH
INL
or V
INH
±0.5 ±0.5 µA max
CIN, Digital Input Capacitance 5 pF typ
DYNAMIC CHARACTERISTICS2
t
120 120 ns typ RL = 300 Ω, CL = 35 pF;
TRANSITION
Rev. B | Page 5 of 16
Loading...
+ 11 hidden pages