9.5 Ω on resistance @ 25°C
Up to 300 mA of continuous current
Fully specified at ±15 V/+12 V/±5 V
3 V logic-compatible inputs
Rail-to-rail operation
Break-before-make switching action
28-lead TSSOP and 32-lead, 5 mm × 5 mm LFCSP_VQ
APPLICATIONS
Medical equipment
Audio and video routing
Automatic test equipment
Data acquisition systems
Battery-powered systems
Sample-and-hold systems
Communication systems
GENERAL DESCRIPTION
The ADG1406 and ADG1407 are monolithic iCMOS® analog
multiplexers comprising 16 single channels and eight differential
channels, respectively. The ADG1406 switches one of 16 inputs
to a common output, as determined by the 4-bit binary address
lines (A0, A1, A2, and A3). The ADG1407 switches one of eight
differential inputs to a common differential output, as determined
by the 3-bit binary address lines (A0, A1, and A2). An EN input
on both devices enables or disables the device. When disabled,
all channels switch off. When on, each channel conducts equally
well in both directions and has an input signal range that extends
to the supplies.
The iCMOS (industrial CMOS) modular manufacturing
process combines high voltage CMOS (complementary metaloxide semiconductor) and bipolar technologies. It enables the
development of a wide range of high performance analog ICs
capable of 33 V operation in a footprint that no other generation
of high voltage parts has been able to achieve. Unlike analog ICs
using conventional CMOS processes, iCMOS components can
tolerate high supply voltages while providing increased performance, dramatically lower power consumption, and reduced
package size.
The ultralow on resistance and on-resistance flatness of these
switches make them ideal solutions for data acquisition and
gain switching applications where low distortion is critical.
iCMOS construction ensures ultralow power dissipation,
making the parts ideally suited for portable and batterypowered instruments.
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
ADG1406/ADG1407
FUNCTIONAL BLOCK DIAGRAMS
ADG1406
S1
D
16
1-OF-16
DECODER
A0 A1 A2 A3 EN
Figure 1.
ADG1407
S1A
S8A
S1B
S8B
1-OF-8
DECODER
A0 A1 A2 EN
Figure 2.
Table 1. Related Devices
Part No. Description
ADG1206/ADG1207
Low capacitance, low charge injection,
and low leakage 8-/16-channel ±15 V
multiplexers
VDD = +15 V ± 10%, VSS = –15 V ± 10%, GND = 0 V, unless otherwise noted.1
Table 2.
−40°C to
Parameter +25°C
+85°C
ANALOG SWITCH
Analog Signal Range VSS to VDD V
On Resistance (RON) 9.5 Ω typ VDD = +13.5 V, VSS = −13.5 V, VS = ±10 V,
11.5 14 16 Ω max IS = −10 mA; see Figure 27
On-Resistance Match Between 0.55 Ω typ VDD = +13.5 V, VSS = −13.5 V , VS = ±10 V, IS =
Channels (ΔRON) 1 1.5 1.7 Ω max −10 mA
On-Resistance Flatness (R
) 1.6 Ω typ VDD = +13.5 V, VSS = −13.5 V, VS = ±10 V, IS =
FLAT(ON)
1.9 2.15 2.3 Ω max −10 mA
LEAKAGE CURRENTS VDD = +16.5 V, VSS = −16.5 V
Source Off Leakage, IS (Off) ±0.01 nA typ
±0.25 ±1 ±4 nA max
Drain Off Leakage, ID (Off) ±0.01 nA typ
±0.5 ±3 ±20 nA max
Channel On Leakage, ID, IS (On) ±0.05 nA typ VS = VD = ±10 V; see Figure 29
±0.5 ±3 ±20 nA max
DIGITAL INPUTS
Input High Voltage, V
Input Low Voltage, V
2.0 V min
INH
0.8 V max
INL
Input Current ±0.002 μA typ VIN = V
±0.1 μA max
Digital Input Capacitance, CIN 3 pF typ
DYNAMIC CHARACTERISTICS2
Transition Time, t
105 ns typ RL = 100 Ω, CL = 35 pF
TRANSITION
160 200 225 ns max VS = 10 V, see Figure 30
Break-Before-Make Time Delay, t
40 ns typ RL = 100 Ω, CL = 35 pF
BBM
10 ns min VS1 = VS2 = 10 V; see Figure 31
tON (EN) 83 ns typ RL = 100 Ω, CL = 35 pF
110 140 155 ns max VS = 10 V; see Figure 32
t
(EN) 98 ns typ RL = 100 Ω, CL = 35 pF
OFF
120 145 165 ns max VS = 10 V; see Figure 32
Charge Injection 10 pC typ VS = 0 V, RS = 0 Ω, CL = 1 nF; see Figure 33
Off Isolation −73 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; see Figure 34
Channel-to-Channel Crosstalk −70 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; see Figure 35
Total Harmonic Distortion (THD + N) 0.07 % typ
−3 dB Bandwidth RL = 50 Ω, CL = 5 pF; see Figure 36
ADG1406 60 MHz typ
ADG1407 110 MHz typ
Insertion Loss 0.6 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; see Figure 36
CS (Off) 8 pF typ f = 1 MHz
CD (Off)
ADG1406 90 pF typ f = 1 MHz
ADG1407 45 pF typ f = 1 MHz
−40°C to
+125°C
1
Unit Test Conditions/Comments
VS = ±10 V, VD = ∓10 V; see Figure 28
VS = ±10 V, VD = ∓10 V; see Figure 28
or VDD
GND
= 110 Ω, 15 V p-p, f = 20 Hz to 20 kHz; see
R
L
Figure 37
Rev. A | Page 3 of 20
ADG1406/ADG1407
−40°C to
Parameter +25°C
+85°C
CD, CS (On)
ADG1406 115 pF typ f = 1 MHz
ADG1407 70 pF typ f = 1 MHz
POWER REQUIREMENTS VDD = +16.5 V, VSS = −16.5 V
IDD 0.002 μA typ Digital inputs = 0 V or VDD
1 μA max
IDD 280 μA typ Digital inputs = 5 V
475 μA max
ISS 0.002 μA typ Digital inputs = 0 V, 5 V or VDD
1 μA max
VDD/VSS ±4.5/±16.5 V min/max
1
Temperature range for B version is −40°C to +125°C.
2
Guaranteed by design, not subject to production test.
Analog Signal Range 0 to VDD V
On Resistance (RON) 18 Ω typ VDD = 10.8 V, VSS = 0 V; VS = 0 V to 10 V,
21.5 26 28.5 Ω max IS = −10 mA; see Figure 27
On-Resistance Match Between 0.55 Ω typ VDD = 10.8 V, VSS = 0 V; VS = 0 V to 10 V,
Channels (ΔRON) 1.2 1.6 1.8 Ω max IS = −10 mA
On-Resistance Flatness (R
) 5 Ω typ VDD = 10.8 V, VSS = 0 V; VS = 0 V to 10 V,
FLAT(ON)
6 6.9 7.3 Ω max IS = −10 mA
LEAKAGE CURRENTS VDD = 10.8 V
Source Off Leakage, IS (Off) ±0.01 nA typ
±0.25 ±1 ±4 nA max
Drain Off Leakage, ID (Off) ±0.01 nA typ
±0.5 ±3 ±20 nA max
Channel On Leakage, ID, IS (On) ±0.01 nA typ VS = VD = 1 V or 10 V; see Figure 29
±0.5 ±3 ±20 nA max
DIGITAL INPUTS
Input High Voltage, V
Input Low Voltage, V
2.0 V min
INH
0.8 V max
INL
Input Current ±0.002 μA typ VIN = V
±0.1 μA max
Digital Input Capacitance, CIN 4 pF typ
DYNAMIC CHARACTERISTICS
Transition Time, t
TRANSITION
2
170 ns typ RL = 100 Ω, CL = 35 pF
250 310 350 ns max VS = 8 V; see Figure 29
Break-Before-Make Time Delay, t
75 ns typ RL = 100 Ω, CL = 35 pF
BBM
30 ns min VS1 = VS2 = 8 V; see Figure 31
+85°C
−40°C to
+125°C
−40°C to
+125°C
1
Unit Test Conditions/Comments
1
Unit Test Conditions/Comments
= 1 V/10 V, VD = 10 V/1 V; see
V
S
Figure 28
V
Figure 28
= 1 V/10 V, VD = 10 V/1 V; see
S
or VDD
GND
Rev. A | Page 4 of 20
ADG1406/ADG1407
−40°C to
Parameter +25°C
+85°C
tON (EN) 145 ns typ RL = 100 Ω, CL = 35 pF
205 250 285 ns max VS = 8 V; see Figure 31
t
(EN) 112 ns typ RL = 100 Ω, CL = 35 pF
OFF
150 175 200 ns max VS = 8 V; see Figure 31
Charge Injection
10 pC typ
Off Isolation −73 dB typ
Channel-to-Channel Crosstalk −70 dB typ
−3 dB Bandwidth RL = 50 Ω, CL = 5 pF; see Figure 36
ADG1406 35 MHz typ
ADG1407 70 MHz typ
Insertion Loss 0.6 dB typ
CS (Off) 12 pF typ f = 1 MHz
CD (Off)
ADG1406 145 pF typ f = 1 MHz
ADG1407 72 pF typ f = 1 MHz
CD, CS (On)
ADG1406 166 pF typ f = 1 MHz
ADG1407 93 pF typ f = 1 MHz
POWER REQUIREMENTS VDD = 13.2 V
IDD 0.002 μA typ Digital inputs = 0 V or VDD
1 μA max
IDD 150 μA typ Digital inputs = 5 V
475 μA max
VDD 5/16.5 V min/max VSS = 0 V, GND = 0 V
1
Temperature range for B version: −40°C to +125°C.
2
Guaranteed by design, not subject to production test.
−40°C to
+125°C
1
Unit Test Conditions/Comments
= 6 V, RS = 0 Ω, CL = 1 nF; see
V
S
Figure 33
R
see Figure 34
R
see Figure 35
R
see Figure 36
= 50 Ω, CL = 5 pF, f = 1 MHz;
L
= 50 Ω, CL = 5 pF, f = 1 MHz;
L
= 50 Ω, CL = 5 pF, f = 1 MHz;
L
Rev. A | Page 5 of 20
ADG1406/ADG1407
±5 V DUAL SUPPLY
VDD = +5 V ± 10%, VSS = −5 V ± 10%, GND = 0 V, unless otherwise noted.
Table 4.
−40°C to
Parameter +25°C
+85°C
ANALOG SWITCH
Analog Signal Range VSS to VDD V
On Resistance (RON) 21 Ω typ VDD = +4.5 V, VSS = −4.5 V, VS = ±4.5 V,
25 29 32 Ω max IS = −10 mA; see Figure 27
On -Resistance Match Between 0.6 Ω typ VDD = +4.5 V, VSS = −4.5 V, VS = ±4.5V,
Channels (ΔRON) 1.3 1.7 1.9 Ω max IS = −10 mA
On -Resistance Flatness (R
) 5.2 Ω typ VDD = +4.5 V, VSS = −4.5 V, VS = ±4.5 V;
FLAT(ON)
6.4 7.3 7.6 Ω max IS = −10 mA
LEAKAGE CURRENTS VDD = +5.5 V, VSS = −5.5 V
Source Off Leakage, IS (Off) ±0.01 nA typ
±0.25 ±1 ±4 nA max
Drain Off Leakage, ID (Off) ±0.01 nA typ
±0.5 ±3 ±20 nA max
Channel On Leakage, ID, IS (On) ±0.01 nA typ VS = VD = ±4.5 V; see Figure 29
±0.5 ±3 ±20 nA max
DIGITAL INPUTS
Input High Voltage, V
Input Low Voltage, V
2.0 V min
INH
0.8 V max
INL
Input Current ±0.002 μA typ VIN = V
±0.1 μA max
Digital Input Capacitance, CIN 3.5 pF typ
DYNAMIC CHARACTERISTICS2
Transition Time, t
260 ns typ RL = 100 Ω, CL = 35 pF
TRANSITION
435 510 565 ns max VS = 5 V; see Figure 30
Break-Before-Make Time Delay, t
90 ns typ RL = 100 Ω, CL = 35 pF
BBM
30 ns min VS1 = VS2 = 5 V; see Figure 31
tON (EN) 230 ns typ RL = 100 Ω, CL = 35 pF
335 400 445 ns max VS = 5 V; see Figure 32
t
(EN) 205 ns typ RL = 100 Ω, CL = 35 pF
OFF
290 340 370 ns max VS = 5 V; see Figure 32
Charge Injection 10 pC typ VS = 0 V, RS = 0 Ω, CL = 1 nF; see Figure 33
Off Isolation –73 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; see Figure 34
Channel-to-Channel Crosstalk –70 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; see Figure 35
Total Harmonic Distortion, THD + N 0.18 % typ
−3 dB Bandwidth RL = 50 Ω, CL = 5 pF; see Figure 36
ADG1406 40 MHz typ
ADG1407 80 MHz typ
Insertion Loss 1.15 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; see Figure 36
CS (Off) 10 pF typ f = 1 MHz
CD (Off)
ADG1406 123 pF typ f = 1 MHz
ADG1407 62 pF typ f = 1 MHz
CD, CS (On)
ADG1406 148 pF typ f = 1 MHz
ADG1407 88 pF typ f = 1 MHz
−40°C to
+125°C
1
Unit Test Conditions/Comments
VS = ±4.5 V, VD = ∓4.5 V; see Figure 28
VS = ±4.5 V, VD = ∓4.5 V; see Figure 28
or VDD
GND
= 110 Ω, 5 V p-p, f = 20 Hz to 20 kHz; see
R
L
Figure 37
Rev. A | Page 6 of 20
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