ANALOG DEVICES ADG1208, ADG1209 Service Manual

查询ADG1208供应商
Low Capacitance, 4-/8-Channel
FEATURES
<1 pC charge injection over full signal range 1 pF off capacitance 33 V supply range 120 Ω on resistance Fully specified at ±15 V/+12 V 3 V logic compatible inputs Rail-to-rail operation Break-before-make switching action Available in 16-lead TSSOP and 4 mm × 4 mm LFCSP_VQ Typical power consumption < 0.03 μW
APPLICATIONS
Audio and video routing Automatic test equipment Data-acquisition systems Battery-powered systems Sample-and-hold systems Communication systems
±15 V/+12 V iCMOS™ Multiplexers
ADG1208/ADG1209
FUNCTIONAL BLOCK DIAGRAMS
ADG1208
S1
S8
1-OF-8
DECODER
S1A
S4A
D
S1B
S4B
Figure 1.
ADG1209
1-OF-4
DECODER
A0 A1 E NA0 A1 A2 EN
DA
DB
05713-001
GENERAL DESCRIPTION
The ADG1208 and ADG1209 are monolithic, iCMOS analog multiplexers comprising eight single channels and four differential channels, respectively. The ADG1208 switches one of eight inputs to a common output as determined by the 3-bit binary address lines A0, A1, and A2. The ADG1209 switches one of four differential inputs to a common differential output as determined by the 2-bit binary address lines A0 and A1. An EN input on both devices is used to enable or disable the device. When disabled, all channels are switched off. When on, each channel conducts equally well in both directions and has an input signal range that extends to the supplies.
The iCMOS (industrial CMOS) modular manufacturing process combines high voltage CMOS (complementary metal­oxide semiconductor) and bipolar technologies. It enables the development of a wide range of high performance analog ICs capable of 33 V operation in a footprint that no other generation of high voltage parts has been able to achieve. Unlike analog ICs using conventional CMOS processes, iCMOS components can tolerate high supply voltages while providing increased performance, dramatically lower power consumption, and reduced package size.
The ultralow capacitance and exceptionally low charge injection of these multiplexers make them ideal solutions for data acquisition and sample-and-hold applications, where low glitch and fast settling are required.
Figure 2 shows that there is minimum charge injection over the entire signal range of the device. iCMOS construction also ensures ultralow power dissipation, making the parts ideally suited for portable and battery powered instruments.
1.0 MUX (SOURCE TO DRAIN)
=25°C
T
A
0.9
0.8
0.7
0.6
0.5
0.4
0.3
CHARGE INJECTION (pC)
0.2
0.1
0
–15 15
Figure 2. Source to Drain Charge Injection vs. Source Voltage
VDD=+5V V
= –5V
SS
–10 –5 0 5 10
VS(V)
VDD= +15V
= –15V
V
SS
VDD= +12V V
=0V
SS
05713-051
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 © 2006 Analog Devices, Inc. All rights reserved.
ADG1208/ADG1209
TABLE OF CONTENTS
Features.............................................................................................. 1
Absolute Maximum Ratings ............................................................7
Applications....................................................................................... 1
Functional Block Diagrams............................................................. 1
General Description ......................................................................... 1
Revision History ............................................................................... 2
Specifications..................................................................................... 3
Dual Supply................................................................................... 3
Single Supply................................................................................. 5
REVISION HISTORY
4/06—Revision 0: Initial Version
ESD Caution...................................................................................7
Pin Configurations and Function Descriptions............................8
Typical Performance Characteristics........................................... 10
Terminology.................................................................................... 14
Test Circuits..................................................................................... 15
Outline Dimensions....................................................................... 17
Ordering Guide .......................................................................... 17
Rev. 0 | Page 2 of 20
ADG1208/ADG1209
SPECIFICATIONS
DUAL SUPPLY
VDD = +15 V ± 10%, VSS = –15 V ± 10%, GND = 0 V, unless otherwise noted.
Table 1.
40ºC to
Parameter +25ºC
+85ºC
40ºC to +125ºC
ANALOG SWITCH
Analog Signal Range VSS to VDD V On Resistance, RON 120 Ω typ VS = ±10 V, IS = −1 mA, see Figure 29 200 240 270 Ω max VDD = +13.5 V, VSS = −13.5 V On Resistance Match Between Channels,
∆R
ON
3.5 Ω typ V
6 10 12 Ω max On Resistance Flatness, R
(On) 20 Ω typ VS = −5 V, 0 V, +5 V, IS = −1 mA
FLAT
64 76 83 Ω max LEAKAGE CURRENTS
Source Off Leakage, IS (Off) ±0.02 nA typ VD = ±10 V, VS = −10 V, see Figure 30 ±0.1 ±0.6 ±1 nA max Drain Off Leakage, ID (Off) ±0.02 nA typ VS = 1 V, 10 V; VD = 10 V, 1 V; see Figure 30
ADG1208 ±0.1 ±0.6 ±1 nA max ADG1209 ±0.1 ±0.6 ±1 nA max
Channel On Leakage, ID, IS (On) ±0.02 nA typ VS = VD = ±10 V, see Figure 31
ADG1208 ±0.2 ±0.6 ±1 nA max ADG1209 ±0.2 ±0.6 ±1 nA max
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V Input Current, I
INL
2.0 V min
INH
0.8 V max
INL
or I
±0.005 μA max VIN = V
INH
±0.1 μA max Digital Input Capacitance, CIN 2 pF typ
DYNAMIC CHARACTERISTICS2
Transition Time, t
80 ns typ RL = 300 Ω, CL = 35 pF
TRANSITION
130 165 185 ns max VS = 10 V, see Figure 32
tON (EN) 75 ns typ RL = 300 Ω, CL = 35 pF
95 105 115 ns max VS = 10 V, see Figure 34
t
(EN) 83 ns typ RL = 300 Ω, CL = 35 pF
OFF
100 125 140 ns max VS = 10 V, see Figure 34
Break-Before-Make Time Delay, t
25 ns typ RL = 300 Ω, CL = 35 pF
BBM
10 ns min VS1 = VS2 = 10 V, see Figure 33 Charge Injection 0.4 pC typ VS = 0 V, RS = 0 Ω, CL = 1 nF, see Figure 35 Off Isolation −85 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz, see Figure 36 Channel-to-Channel Crosstalk −85 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz, see Figure 38 Total Harmonic Distortion + Noise 0.15 % typ
−3 dB Bandwidth 550 MHz typ RL = 50 Ω, CL = 5 pF, see Figure 37 CS (Off) 1 pF typ f = 1 MHz, VS = 0 V
1.5 pF max f = 1 MHz, VS = 0 V CD (Off) ADG1208 6 pF typ f = 1 MHz, VS = 0 V 7 pF max f = 1 MHz, VS = 0 V CD (Off) ADG1209 3.5 pF typ f = 1 MHz, VS = 0 V
4.5 pF max f = 1 MHz, VS = 0 V
Rev. 0 | Page 3 of 20
1
Unit Test Conditions/Comments
= ±10 V, IS = −1 mA
S
or V
INH
INL
= 10 kΩ, 5 V rms, f = 20 Hz to 20 kHz,
R
L
see
Figure 39
ADG1208/ADG1209
40ºC to
Parameter +25ºC
+85ºC
CD, CS (On) ADG1208 7 pF typ f = 1 MHz, VS = 0 V 8 pF max f = 1 MHz, VS = 0 V CD, CS (On) ADG1209 5 pF typ f = 1 MHz, VS = 0 V 6 pF max f = 1 MHz, VS = 0 V
POWER REQUIREMENTS
IDD 0.002 μA typ Digital inputs = 0 V or VDD
1.0 μA max IDD 220 μA typ Digital inputs = 5 V 320 μA max ISS 0.002 μA typ Digital inputs = 0 V or VDD
1.0 μA max ISS 0.002 μA typ Digital inputs = 5 V
1.0 μA max VDD/VSS ±5/±16.5 V min/max |V
1
Temperature range is as follows: Y version: –40°C to +125°C.
2
Guaranteed by design, not subject to production test.
40ºC to +125ºC
Unit Test Conditions/Comments
VDD = +16.5 V, VSS = 16.5 V
| = |VSS|
DD
Rev. 0 | Page 4 of 20
ADG1208/ADG1209
SINGLE SUPPLY
VDD = 12 V ± 10%, VSS = 0 V, GND = 0 V, unless otherwise noted.1
Table 2.
−40ºC to
Parameter +25ºC
+85ºC
ANALOG SWITCH
Analog Signal Range 0 to VDD V On Resistance, RON 300 Ω typ VS = 0 V to10 V, IS = −1 mA, see Figure 29 475 567 625 Ω max VDD = 10.8 V, VSS = 0 V On Resistance Match Between Channels,
∆R
ON
5 Ω typ V
16 26 27 Ω max On Resistance Flatness, R
(On) 60 Ω typ VS = 3 V, 6 V, 9 V; IS = −1 mA
FLAT
LEAKAGE CURRENTS VDD = 13.2 V
Source Off Leakage, IS (Off) ±0.02 nA typ VS = 1 V/10 V, VD = 10 V/1 V, see Figure 30 ±0.1 ±0.6 ±1 nA max Drain Off Leakage, ID (Off) ±0.02 nA typ VS = 1 V/10 V, VD = 10 V/1 V, see Figure 30
ADG1208 ±0.1 ±0.6 ±1 nA max ADG1209 ±0.1 ±0.6 ±1 nA max
Channel On Leakage ID, IS (On) ±0.02 nA typ VS = VD = 1 V or 10 V; see Figure 31
ADG1208 ±0.2 ±0.6 ±1 nA max ADG1209 ±0.2 ±0.6 ±1 nA max
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V Input Current, I
INL
2.0 V min
INH
0.8 V max
INL
or I
±0.001
INH
±0.1 μA max VIN = V
Digital Input Capacitance, CIN 3 pF typ
DYNAMIC CHARACTERISTICS
Transition Time, t
TRANSITION
2
100 ns typ RL = 300 Ω, CL = 35 pF
170 210 235 VS = 8 V, see Figure 32
tON (EN) 90 ns typ RL = 300 Ω, CL = 35 pF 110 140 160 VS = 8 V, see Figure 34 t
(EN) 105 ns typ RL = 300 Ω, CL = 35 pF
OFF
130 155 175 VS = 8 V, see Figure 34
Break-Before-Make Time Delay, t
45 ns typ RL = 300 Ω, CL = 35 pF
BBM
20 ns min VS1 = V Charge Injection −0.2 pC typ VS = 6 V, RS = 0 Ω, CL = 1 nF, see Figure 35 Off Isolation −85 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz, see Figure 36 Channel-to-Channel Crosstalk −85 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz, see Figure 38
−3 dB Bandwidth 450 MHz typ RL = 50 Ω, CL = 5 pF, see Figure 37 CS (Off) 1.2 pF typ f = 1 MHz, VS = 6 V
1.8 pF max f = 1 MHz, VS = 6 V CD (Off) ADG1208 7.5 pF typ f = 1 MHz, VS = 6 V 9 pF max f = 1 MHz, VS = 6 V CD (Off) ADG1209 4.5 pF typ f = 1 MHz, VS = 6 V
5.5 pF max f = 1 MHz, VS = 6 V CD, CS (On) ADG1208 9 pF typ f = 1 MHz, VS = 6 V
10.5 pF max f = 1 MHz, VS = 6 V CD, CS (On) ADG1209 6 pF typ f = 1 MHz, VS = 6 V
7.5 pF max f = 1 MHz, VS = 6 V
−40ºC to +125ºC
Rev. 0 | Page 5 of 20
Unit Test Conditions/Comments
= 0 V to 10 V, IS = −1 mA
S
or V
INL
S2
INH
= 8 V, see Figure 33
ADG1208/ADG1209
−40ºC to
Parameter +25ºC
+85ºC
POWER REQUIREMENTS VDD = 13.2 V
IDD 0.002 μA typ Digital inputs = 0 V or VDD
1.0 μA max IDD 220 μA typ Digital inputs = 5 V
330 μA max
VDD 5/16.5 V min/max VSS = 0 V, GND = 0 V
1
Temperature range is as follows: Y version: –40°C to +125°C.
2
Guaranteed by design, not subject to production test.
−40ºC to +125ºC Unit Test Conditions/Comments
Rev. 0 | Page 6 of 20
Loading...
+ 14 hidden pages