1.5 pF off capacitance
33 V supply range
120 Ω on resistance
Fully specified at ±15 V/+12 V
3 V logic-compatible inputs
Rail-to-rail operation
Break-before-make switching action
28-lead TSSOP and 32-lead, 5 mm × 5 mm LFCSP_VQ
APPLICATIONS
Audio and video routing
Automatic test equipment
Data acquisition systems
Battery-powered systems
Sample-and-hold systems
Communication systems
GENERAL DESCRIPTION
The ADG1206 and ADG1207 are monolithic iCMOS analog
multiplexers comprising sixteen single channels and eight
differential channels, respectively. The ADG1206 switches one
of sixteen inputs to a common output, as determined by the 4bit binary address lines A0, A1, A2, and A3. The ADG1207
switches one of eight differential inputs to a common
differential output, as determined by the 3-bit binary address
lines A0, A1, and A2. An EN input on both devices is used to
enable or disable the device. When disabled, all channels are
switched off. When on, each channel conducts equally well in
both directions and has an input signal range that extends to the
supplies.
The iCMOS (industrial CMOS) modular manufacturing
process combines high voltage CMOS (complementary metaloxide semiconductor) and bipolar technologies. It enables the
development of a wide range of high performance analog ICs
capable of 33 V operation in a footprint that no other generation
of high voltage parts has been able to achieve. Unlike analog ICs
using conventional CMOS processes, iCMOS components can
tolerate high supply voltages while providing increased performance, dramatically lower power consumption, and reduced
package size.
±15 V/+12 V iCMOS™ Multiplexers
ADG1206/ADG1207
FUNCTIONAL BLOCK DIAGRAMS
ADG1206
S1
16
1-OF-16
DECODER
A0 A1 A2 A3 EN
S1A
S8A
D
S1B
S8B
Figure 1.
The ultralow capacitance and exceptionally low charge injection
of these multiplexers make them ideal solutions for data
acquisition and sample-and-hold applications, where low glitch
and fast settling are required.
Figure 2 shows that there is
minimum charge injection over the entire signal range of the
device. iCMOS construction also ensures ultralow power
dissipation, making the parts ideally suited for portable and
battery-powered instruments.
1.0
MUX (SOURCE TO DRAIN)
T
= 25°C
A
0.9
0.8
0.7
0.6
0.5
0.4
0.3
CHARGE INJECTI ON (pC)
0.2
0.1
0
Figure 2. Source-to-Drain Charge Injection vs. Source Voltage
–10–50510
–1515
= +5V
V
DD
= –5V
V
SS
VS (V)
ADG1207
1-OF-8
DECODER
A0 A1 A2 EN
= +15V
V
DD
= –15V
V
SS
V
V
DD
SS
= +12V
= 0V
DA
DB
06119-001
6119-002
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
VDD = +15 V ± 10%, VSS = –15 V ± 10%, GND = 0 V, unless otherwise noted.
Table 1.
−40°C to
Parameter +25°C
+85°C
−40°C to
+125°C
ANALOG SWITCH
Analog Signal Range VSS to VDD V
On Resistance, RON 120 Ω typ VS = ±10 V, IS = −1 mA; see Figure 28
200 240 270 Ω max VDD = +13.5 V, VSS = −13.5 V
On Resistance Match Between
Channels, ∆R
ON
3.5 Ω typ V
6 10 12 Ω max
On Resistance Flatness, R
(On) 20 Ω typ VS = −5 V, 0 V, +5 V; IS = −1 mA
FLAT
64 76 83 Ω max
LEAKAGE CURRENTS
Source Off Leakage, IS (Off) ±0.03 nA typ
±0.2 ±0.6 ±1 nA max
Drain Off Leakage, ID (Off) ±0.05 nA typ VS = 1 V, 10 V; VD = 10 V, 1 V; see Figure 29
±0.2 ±0.6 ±2 nA max
Channel On Leakage, ID, IS (On) ±0.08 nA typ VS = VD = ±10 V; see Figure 30
±0.2 ±0.6 ±2 nA max
DIGITAL INPUTS
Input High Voltage, V
Input Low Voltage, V
Input Current, I
INL
2.0 V min
INH
0.8 V max
INL
or I
±0.005 μA typ VIN = V
INH
±0.1 μA max
Digital Input Capacitance, CIN 2 pF typ
DYNAMIC CHARACTERISTICS2
Transition Time, t
80 ns typ RL = 300 Ω, CL = 35 pF
TRANSITION
130 165 185 ns max VS = 10 V; see Figure 31
tON (EN) 75 ns typ RL = 300 Ω, CL = 35 pF
95 105 115 ns max VS = 10 V; see Figure 33
t
(EN) 85 ns typ RL = 300 Ω, CL = 35 pF
OFF
100 125 140 ns max VS = 10 V; see Figure 33
Break-Before-Make Time Delay, t
20 ns typ RL = 300 Ω, CL = 35 pF
BBM
10 ns min VS1 = VS2 = 10 V; see Figure 32
Charge Injection 0.5 pC typ VS = 0 V, RS = 0 Ω, CL = 1 nF; see Figure 34
Off Isolation −85 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; see Figure 35
Channel-to-Channel Crosstalk −85 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; see Figure 37
Total Harmonic Distortion + Noise 0.15 % typ
−3 dB Bandwidth ADG1206 280 MHz typ RL = 50 Ω, CL = 5 pF; see Figure 36
−3 dB Bandwidth ADG1207 490 MHz typ RL = 50 Ω, CL = 5 pF; see Figure 36
CS (Off) 1.5 pF typ f = 1 MHz, VS = 0 V
2 pF max f = 1 MHz, VS = 0 V
CD (Off) ADG1206 11 pF typ f = 1 MHz, VS = 0 V
12 pF max f = 1 MHz, VS = 0 V
CD (Off) ADG1207 7 pF typ f = 1 MHz, VS = 0 V
9 pF max f = 1 MHz, VS = 0 V
1
Unit Test Conditions/Comments
= ±10 V, IS = −1 mA
S
VD = ±10 V, VS = ∓10 V; see Figure 29
or V
INH
INL
= 10 kΩ, 5 V rms, f = 20 Hz to 20 kHz;
R
L
see
Figure 38
Rev. 0 | Page 3 of 20
ADG1206/ADG1207
−40°C to
Parameter +25°C
+85°C
CD, CS (On) ADG1206 13 pF typ f = 1 MHz, VS = 0 V
15 pF max f = 1 MHz, VS = 0 V
CD, CS (On) ADG1207 8 pF typ f = 1 MHz, VS = 0 V
10 pF max f = 1 MHz, VS = 0 V
POWER REQUIREMENTS VDD = +16.5 V, VSS = −16.5 V
IDD 0.002 μA typ Digital inputs = 0 V or VDD
1.0 μA max
IDD 260 μA typ Digital inputs = 5 V
420 μA max
ISS 0.002 μA typ Digital inputs = 0 V, 5 V, or VDD
1.0 μA max
VDD/VSS ±5/±16.5 V min/max GND = 0V
1
Temperature range for Y version is −40°C to +125°C.
2
Guaranteed by design, not subject to production test.
Analog Signal Range 0 to VDD V
On Resistance, RON 300 Ω typ VS = 0 V to10 V, IS = −1 mA; see Figure 28
475 567 625 Ω max VDD = 10.8 V, VSS = 0 V
On Resistance Match Between
Channels, ∆R
ON
5 Ω typ V
16 26 27 Ω max
On Resistance Flatness, R
(On) 60 Ω typ VS = 3 V, 6 V, 9 V; IS = −1 mA
FLAT
LEAKAGE CURRENTS VDD = 13.2 V
Source Off Leakage, IS (Off) ±0.02 nA typ VS = 1 V/10 V, VD = 10 V/1 V; see Figure 29
±0.2 ±0.6 ±1 nA max
Drain Off Leakage, ID (Off) ±0.05 nA typ VS = 1 V/10 V, VD = 10 V/1 V; see Figure 29
±0.2 ±0.6 ±2 nA max
Channel On Leakage, ID, IS (On) ±0.08 nA typ VS = VD = 1 V or 10 V; see Figure 30
±0.2 ±0.6 ±2 nA max
DIGITAL INPUTS
Input High Voltage, V
Input Low Voltage, V
Input Current, I
INL
2.0 V min
INH
0.8 V max
INL
or I
±0.001 μA typ
INH
±0.1 μA max VIN = V
Digital Input Capacitance, CIN 3 pF typ
DYNAMIC CHARACTERISTICS
Transition Time, t
TRANSITION
2
100 ns typ RL = 300 Ω, CL = 35 pF
140 175 200 ns max VS = 8 V; see Figure 31
tON (EN) 80 ns typ RL = 300 Ω, CL = 35 pF
100 120 130 ns max VS = 8 V; see Figure 33
t
(EN) 90 ns typ RL = 300 Ω, CL = 35 pF
OFF
110 130 155 ns max VS = 8 V; see Figure 33
Break-Before-Make Time Delay, t
25 ns typ RL = 300 Ω, CL = 35 pF
BBM
15 ns min VS1 = VS2 = 8 V; see Figure 32
Charge Injection 0.2 pC typ VS = 6 V, RS = 0 Ω, CL = 1 nF; see Figure 34
Off Isolation −85 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; see Figure 35
Channel-to-Channel Crosstalk −85 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; see Figure 37
−3 dB Bandwidth ADG1206 185 MHz typ RL = 50 Ω, CL = 5 pF; see Figure 36
−3 dB Bandwidth ADG1207 300 MHz typ RL = 50 Ω, CL = 5 pF; see Figure 36
CS (Off) 1.5 pF typ f = 1 MHz, VS = 6 V
2 pF max f = 1 MHz, VS = 6 V
CD (Off) ADG1206 13 pF typ f = 1 MHz, VS = 6 V
15 pF max f = 1 MHz, VS = 6 V
CD (Off) ADG1207 9 pF typ f = 1 MHz, VS = 6 V
11 pF max f = 1 MHz, VS = 6 V
CD, CS (On) ADG1206 15 pF typ f = 1 MHz, VS = 6 V
17 pF max f = 1 MHz, VS = 6 V
CD, CS (On) ADG1207 10 pF typ f = 1 MHz, VS = 6 V
12 pF max f = 1 MHz, VS = 6 V
−40°C to
+125°C
Unit Test Conditions/Comments
= 0 V to 10 V, IS = −1 mA
S
or V
INH
INL
Rev. 0 | Page 5 of 20
ADG1206/ADG1207
−40°C to
Parameter +25°C
+85°C
POWER REQUIREMENTS VDD = 13.2 V
IDD 0.002 μA typ Digital inputs = 0 V or VDD
1.0 μA max
IDD 260 μA typ Digital inputs = 5
420 μA max
VDD 5/16.5 V min/max VSS = 0 V, GND = 0 V
1
Temperature range for Y version is −40°C to +125°C.
2
Guaranteed by design, not subject to production test.
−40°C to
+125°C Unit Test Conditions/Comments
Rev. 0 | Page 6 of 20
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