IDD total: 7.5 mA
Bandwidth RF/IF: 2.4 GHz/1.0 GHz
2.7 V to 3.3 V power supply
Separate V
Programmable dual modulus prescaler
RF and IF: 8/9, 16/17, 32/33, 64/65
Programmable charge pump currents
3-wire serial interface
Analog and digital lock detect
Fastlock mode
Power-down mode
20-lead TSSOP and 20-lead LFCSP packages
APPLICATIONS
Wireless handsets (GSM, PCS, DCS, DSC1800, CDMA,
WCDMA)
Base stations for wireless Radio (GSM, PCS, DCS,
CDMA, WCDMA)
Wireless LANS
Cable TV tuners (CATV)
Communications test equipment
allows extended tuning voltage
P
ADF4212L
IF
IN
REF
CLK
DATA
RF
IN
LE
IN
OSCILLATOR
22-BIT
DATA
REGISTER
FUNCTIONAL BLOCK DIAGRAM
IF
PRESCALER
SDOUT
RF
PRESCALER
DGND
AGNDRFDGNDIFAGND
RF
1
DD
12-BIT IF
B-COUNTER
6-BIT IF
A-COUNTER
15-BIT IF
R-COUNTER
15-BIT RF
R-COUNTER
12-BIT RF
B-COUNTER
6-BIT RF
A-COUNTER
Figure 1.
Frequency Synthesizer
ADF4212L
GENERAL DESCRIPTION
The ADF4212L is a dual frequency synthesizer that can be used
to implement local oscillators (LO) in the up-conversion and
down-conversion sections of wireless receivers and transmitters.
It can provide the LO for both the RF and IF sections. It consists
of a low noise digital phase frequency detector (PFD), a precision
charge pump, a programmable reference divider, programmable
A and B counters, and a dual modulus prescaler (P/P + 1). The
A (6-bit) and B (12-bit) counters, in conjunction with the dual
modulus prescaler (P/P + 1), implement an N divider (N = BP +
A). In addition, the 15-bit reference counter (R counter) allows
selectable REF
locked loop (PLL) can be implemented if the synthesizer is used
with external loop filters and voltage controlled oscillators (VCOs).
Control of all the on-chip registers is via a simple 3-wire
interface with 1.8 V compatibility. The devices operate with a
power supply ranging from 2.7 V to 3.3 V and can be powered
down when not in use.
2
1
P
IF PHASE
FREQUENCY
DETECTOR
RF PHASE
FREQUENCY
DETECTOR
2
P
DD
IF
frequencies at the PFD input. A complete phase-
IN
R
SET
REFERENCE
IF
LOCK
DETECT
RF
LOCK
DETECT
CHARGE
PUMP
IF CURRENT
SETTING
IFCP3 IFCP2
OUTPUT
MUX
RFCP3 RFCP2
REFERENCE
CHARGE
PUMP
REFERENCE
R
SET
FLOSWITCH
IFCP1
RFCP1
CP
IF
MUXOUT
CP
RF
FL
O
02774-001
Rev. C
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Changes to Ordering Guide .......................................................... 25
3/03—Data Sheet changed from REV. 0 to REV. A
Changes to General Description ..................................................... 1
Changes to Specifications ................................................................. 3
Changes to Table 9 .......................................................................... 18
Changes to Table 11 ....................................................................... 20
Changes to Figure 31 ...................................................................... 23
11/02—Revision 0: Initial Version
Rev. C | Page 2 of 28
ADF4212L
SPECIFICATIONS
VDD1 = VDD2 = 2.7 V to 3.3 V; VP1, VP2 = VDD to 5.5 V; AGNDRF = DGNDRF = AGNDIF = DGNDIF = 0 V; TA = T
otherwise noted; dBm referred to 50 Ω.
Table 1.
Parameter1 B Version B Chips2 Unit Test Conditions/Comments
RF/IF CHARACTERISTICS
RF Input Frequency (RFIN) 0.2/2.4 0.2/2.4 GHz min/max For lower frequencies, ensure that slew rate (SR)
> 140 V/µs
RF Input Sensitivity −10/0 −10/0 dBm min/max VDD = 3 V
IF Input Frequency (IFIN) 100/1000 100/1000 MHz min/max
IF Input Sensitivity −10/0 −10/0 dBm min/max VDD = 3 V
MAXIMUM ALLOWABLE
Prescaler Output Frequency3 188 188 MHz max
REFIN CHARACTERISTICS
See
Figure 26 for input circuit
REFIN Input Frequency 10/150 10/150 MHz min/max
REFIN Input Sensitivity 500 mV/VDD 500 mV/VDD V p-p min/max AC-coupled; when dc-coupled, 0 V to VDD
maximum (CMOS compatible)
REFIN Input Capacitance 10 10 pF max
REFIN Input Current ±100 ±100 A max
PHASE DETECTOR
Phase Detector Frequency4 75 75 MHz max
CHARGE PUMP
ICP Sink/Source
High Value 5 5 mA typ With R
Programmable, see
= 2.7 kΩ
SET
Low Value 625 625 A typ
Absolute Accuracy 2 2 % typ With R
R
Range 1.5/5.6 1.5/5.6 kΩ min/max
SET
= 2.7 kΩ
SET
ICP Three-State Leakage Current 1 1 nA max
Sink and Source Current Matching 6 6 % typ 0.5 V < VCP < VP − 0.5 V
ICP vs. VCP 2 2 % typ 0.5 V < VCP < VP − 0.5 V
ICP vs. Temperature 2 2 % typ VCP = VP/2
LOGIC INPUTS
V
, Input High Voltage 1.4 1.4 V min
INH
V
, Input Low Voltage 0.6 0.6 V max
INL
I
, Input Current ±1 ±1 A max
INH/IINL
CIN, Input Capacitance 10 10 pF max
LOGIC OUTPUTS
VOH, Output High Voltage 1.4 1.4 V min Open-drain 1 kΩ pull-up to 1.8 V
VOL, Output Low Voltage 0.4 0.4 V max IOL = 500 A
POWER SUPPLIES
VDD1 2.7/3.3 2.7/3.3 V min/max
VDD2 VDD1 VDD1 V min/max
VP1, VP2 VDD1/5.5 VDD1/5.5 V min/max
IDD (RF and IF)5 7.5/10 7.5/10 mA typ/max
RF Only 5.0/6 5.0/6 mA typ/max
IF Only 2.5/4 2.5/4 mA typ/max
IP (IP1 + IP2) 0.6 0.6 mA typ
Low Power Sleep Mode 1 1 A typ
1
Operating temperature range is as follows: B version: −40°C to +85°C.
2
The B chip specifications are given as typical values.
3
This is the maximum operating frequency of the CMOS counters. The prescaler value should be chosen to ensure that the RF input is divided down to a frequency less
than this value.
4
Guaranteed by design. Sample tested to ensure compliance.
5
TA = 25°C. RF = 1 GHz; prescaler = 32/33. IF = 500 MHz; prescaler = 16/17.
to T
MIN
Table 10
MAX
, unless
Rev. C | Page 3 of 28
ADF4212L
VDD1 = VDD2 = 2.7 V to 3.3 V; VP1, VP2 = VDD to 5.5 V; AGNDRF = DGNDRF = AGNDIF = DGNDIF = 0 V; TA = T
otherwise noted; dBm referred to 50 V.
Table 2.
Parameter1 B Version B Chips2 Unit Test Conditions/Comments
NOISE CHARACTERISTICS
RF Phase Noise Floor3 −170 −170 dBc/Hz typ 25 kHz PFD frequency
−162 −162 dBc/Hz typ 200 kHz PFD frequency
Phase Noise Performance4 VCO output
IF: 540 MHz Output5 −89 −89 dBc/Hz typ 1 kHz offset and 200 kHz PFD frequency
IF: 900 MHz Output6 −87 −87 dBc/Hz typ 1 kHz offset and 200 kHz PFD frequency
RF: 900 MHz Output6 −89 −89 dBc/Hz typ 1 kHz offset and 200 kHz PFD frequency
RF: 1750 MHz Output7 −84 −84 dBc/Hz typ 1 kHz offset and 200 kHz PFD frequency
RF: 2400 MHz Output8 −87 −87 dBc/Hz typ 1 kHz Offset and 1 MHz PFD frequency
Spurious Signals
IF: 540 MHz Output5 −88/−90 −88/−90 dB typ 200 kHz/400 kHz and 200 kHz PFD frequency
IF: 900 MHz Output6 −90/−94 −90/−94 dB typ 200 kHz/400 kHz and 200 kHz PFD frequency
RF: 900 MHz Output6 −90/−94 −90/−94 dB typ 200 kHz/400 kHz and 200 kHz PFD frequency
RF: 1750 MHz Output7 −80/−82 −80/−82 dB typ 200 kHz/400 kHz and 200 kHz PFD frequency
RF: 2400 MHz Output8 −80/−82 −80/−82 dB typ 200 kHz/400 kHz and 200 kHz PFD frequency
1
Operating temperature range is as follows: B version: −40°C to +85°C.
2
The B Chip specifications are given as typical values.
3
The synthesizer phase noise floor is estimated by measuring the in-band phase noise at the output of the VCO and subtracting 20logN (where N is the N divider value).
See Figure 9.
4
The phase noise is measured with the EVAL-ADF4212EB and the HP8562E spectrum analyzer. The spectrum analyzer provides the REFIN for the synthesizer
(f
= 10 MHz @ 0 dBm).
REFOUT
5
f
REFIN
6
f
REFIN
7
f
REFIN
8
f
REFIN
= 10 MHz; f
= 10 MHz; f
= 10 MHz; f
= 10 MHz; f
= 200 kHz; offset frequency = 1 kHz; fIF = 540 MHz; N = 2700; loop B/W = 20 kHz
PFD
= 200 kHz; offset frequency = 1 kHz; fRF = 900 MHz; N = 4500; loop B/W = 20 kHz
PFD
= 200 kHz; offset frequency = 1 kHz; fRF = 1750 MHz; N = 8750; loop B/W = 20 kHz
PFD
= 1 MHz; offset frequency = 1 kHz; fRF = 2400 MHz; N = 9800; loop B/W = 20 kHz
PFD
MIN
to T
MAX
, unless
Rev. C | Page 4 of 28
ADF4212L
TIMING CHARACTERISTICS
VDD1 = VDD2 = 2.6 V to 3.3 V; VP1, VP2 = VDD to 5.5 V; AGNDRF = DGNDRF = AGNDIF = DGNDIF = 0 V; TA = T
otherwise noted; dBm referred to 50 Ω.
Table 3.
Parameter1 Limit at T
MIN
to T
(B Version) Unit Test Conditions/Comments
MAX
t1 20 ns min LE setup time
t2 10 ns min Data to clock setup time
t3 10 ns min Data to clock hold time
t4 25 ns min Clock high duration
t5 25 ns min Clock low duration
t6 10 ns min Clock to LE setup time
t7 20 ns min LE pulse width
1
Guaranteed by design but not production tested.
CLK
t
4
t
5
MIN
to T
MAX
, unless
DATA
LE
LE
t
2
DB23 (MSB)DB22DB2
t
1
t
3
DB1
(CONTROL BIT C2)
DB0 (LSB)
(CONTROL BIT C1)
t
7
t
6
02774-002
Figure 2. Timing Diagram
Rev. C | Page 5 of 28
ADF4212L
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 4.
Parameter
VDD1 to GND −0.3 V to +3.6 V
VDD1 to VDD2 −0.3 V to +0.3 V
VP1, VP2 to GND −0.3 V to +5.8 V
VP1, VP2 to VDD1, VDD2 −0.3 V to +5.8 V
Digital I/O Voltage to GND −0.3 V to DVDD + 0.3 V
Analog I/O Voltage to GND −0.3 V to VDD + 0.3 V
REFIN, RFIN, IFIN to GND −0.3 V to VDD + 0.3 V
Operating Temperature Range
Industrial (B Version) −40°C to +85°C
Storage Temperature Range −65°C to +150°C
Maximum Junction Temperature 150°C
TSSOP θJA Thermal Impedance 150.4°C/W
LFCSP θJA Thermal Impedance
This device is a high performance RF integrated circuit with an ESD rating of
<2 kV, and is ESD sensitive. Proper precautions should be taken for handling
and assembly.
3
GND = AGND = DGND = 0 V.
1, 2
Rating
122°C/W
216°C/W
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
Rev. C | Page 6 of 28
ADF4212L
2
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
1
1
P
V
20
1CP
RF
VDD1
VP1
CP
DGND
RF
AGND
FL
REF
DGND
MUXOUT
RF
RF
IN
RF
O
IN
IF
1
2
3
ADF4212L
4
(Not to Scale)
5
6
7
8
9
10
TOP VIEW
20
19
18
17
16
15
14
13
12
11
Figure 3. TSSOP Pin Configuration
V
DD
VP2
CP
IF
DGND
IF
IN
AGND
R
SET
LE
DATA
CLK
2
IF
IF
NOTES
1. IT I S RECOMMENDED T HAT THE EXPOSED PAD
BE THERMALLY CONNECTED TO A COPPER PLANE
FOR ENHANCED THERM A L P E RF ORMANCE. THE PAD
2774-003
SHOULD BE GRO UNDED AS WELL.
2DGND
RF
ADF4212L
3RF
IN
RF
O
4AGND
5FL
TOP VIEW
(Not to S cale)
6
IN
REF
Figure 4. LFCSP Pin Configuration
Table 5. Pin Function Descriptions
Pin No.
Mnemonic TSSOP LFCSP Description
CPRF 3 1
RF Charge Pump Output. When enabled, this provides ±I
to the external RF loop filter, which in turn
CP
drives the external RF VCO.
DGNDRF 4 2 Digital Ground Pin for the RF Digital Circuitry.
RFIN 5 3 Input to the RF Prescaler. This small signal input is normally ac-coupled from the RF VCO.
AGNDRF 6 4 Ground Pin for the RF Analog Circuitry.
FLO 7 5 Multiplexed Output of RF/IF Programmable or Reference Dividers, RF/IF Fastlock Mode. CMOS output.
REFIN 8 6
Reference Input. This is a CMOS input with a nominal threshold of V
DD
resistance of 100 kΩ. See Figure 26. This input can be driven from a TTL or CMOS crystal oscillator, or can
be ac-coupled.
DGNDIF 9, 17 7, 15 Digital Ground Pin for the IF Digital, Interface, and Control Circuitry.
MUXOUT 10 8
This multiplexer output allows either the IF/RF lock detect, the scaled RF, the scaled IF, or the scaled
reference frequency to be accessed externally.
CLK 11 9
Serial Clock Input. This serial clock is used to clock in the serial data to the registers. The data is latched
into the 24-bit shift register on the CLK rising edge. This input is a high impedance CMOS input.
DATA 12 10
Serial Data Input. The serial data is loaded MSB first with the two LSBs being the control bits. This input is
a high impedance CMOS input.
LE 13 11
Load Enable, CMOS Input. When LE goes high, the data stored in the shift registers is loaded into one of
the four latches, with the latch selected using the control bits.
R
14 12
SET
Connecting a resistor between this pin and ground sets the maximum RF and IF charge pump output
current. The nominal voltage potential at the R
pin is 0.66 V. The relationship between ICP and R
SET
therefore,
13.5
I
where R
MAXCP
= 2.7 kΩ and ICP
SET
=
R
SET
= 5 mA for both the RF and IF charge pumps.
MAX
AGNDIF 15 13 Ground Pin for the IF Analog Circuitry.
IFIN 16 14 Input to the IF Prescaler. This small signal input is normally ac-coupled from the IF VCO.
CPIF 18 16
Output from the IF Charge Pump. This is normally connected to a loop filter that drives the input to an
external VCO.
VP2 19 17
Power Supply for the IF Charge Pump. This should be greater than or equal to V
2 is 3 V, it can be set to 5.5 V and used to drive a VCO with a tuning range up to 5.5 V.
V
DD
IF
2
P
DD
DD
P
V
C
V
V
17
16
19
18
PIN 1
INDICATOR
8
7
T
IF
D
DGN
MUXOU
15 DGND
IF
14 IF
IN
13 AGND
IF
12 R
SET
11 LE
9
10
CLK
DATA
02774-004
/2 and an equivalent input
2. In systems where
DD
SET
is,
Rev. C | Page 7 of 28
ADF4212L
Pin No.
Mnemonic TSSOP LFCSP Description
VDD2 20 18
VDD1 1 19
VP1 2 20
EP
Exposed
Pad
Power Supply for the IF, Digital, and Interface Section. Decoupling capacitors to the ground plane
should be placed as close as possible to this pin. V
V
2 must have the same potential as VDD1.
DD
2 should have a value of between 2.6 V and 3.3 V.
DD
Power Supply for the RF Section. Decoupling capacitors to the ground plane should be placed as close
as possible to this pin. V
potential as V
2.
DD
Power Supply for the RF Charge Pump. This should be greater than or equal to V
1 is 3 V, it can be set to 5.5 V and used to drive a VCO with a tuning range up to 5.5 V.
V
DD
1 should have a value of between 2.6 V and 3.3 V. VDD1 must have the same
DD
1. In systems where
DD
It is recommended that the exposed pad be thermally connected to a copper plane for enhanced
thermal performance. The pad should be grounded as well.