Datasheet ADF4117 Datasheet (ANALOG DEVICES)

V
RF PLL Frequency Synthesizers

FEATURES

ADF4116: 550 MHz ADF4117: 1.2 GHz ADF4118: 3.0 GHz
2.7 V to 5.5 V power supply Separate V Y Grade: −40°C to +125°C Dual-modulus prescaler
ADF4116: 8/9
ADF4117/ADF4118: 32/33 3-wire serial interface Digital lock detect Power-down mode Fastlock mode

APPLICATIONS

Base stations for wireless radio
(GSM, PCS, DCS, CDMA, WCDMA) Wireless handsets
(GSM, PCS, DCS, CDMA, WCDMA) Wireless LANs Communications test equipment CATV equipment
allows extended tuning voltage in 3 V systems
P
AV
ADF4116/ADF4117/ADF4118

GENERAL DESCRIPTION

The ADF411x family of frequency synthesizers can be used to implement local oscillators (LO) in the upconversion and downconversion sections of wireless receivers and transmitters. They consist of a low noise digital phase frequency detector (PFD), a precision charge pump, a programmable reference divider, programmable A and B counters, and a dual-modulus prescaler (P/P + 1). The A (5-bit) and B (13-bit) counters, in conjunction with the dual-modulus prescaler (P/P + 1), implement an N divider (N = BP + A). In addition, the 14-bit reference counter (R counter) allows selectable REF at the PFD input. A complete phase-locked loop (PLL) can be implemented if the synthesizer is used with an external loop filter and voltage controlled oscillator (VCO).
All of the on-chip registers are controlled via a simple 3-wire interface. The devices operate with a power supply ranging from 2.7 V to 5.5 V and can be powered down when not in use.

FUNCTIONAL BLOCK DIAGRAM

DV
DD
DD
CPGND
P
frequencies
IN
ADF4116/ADF4117/ADF4118
REF
IN
CLK
DATA
LE
A
RF
IN
RF
B
IN
Rev. D
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
21-BIT
INPUT REGISTER
SD
FROM
FUNCTION LATCH
PRESCALER
P/P + 1
19
OUT
N = BP + A
14-BIT
R COUNTER
R COUNTER
LATCH
FUNCTION
LATCH
A, B COUNTER
LATCH
13
13-BIT
B COUNTER
LOAD
LOAD
5-BIT
A COUNTER
14
5
REFERENCE
PHASE
FREQUENCY
DETECTOR
LOCK
DETECT
18
AV
DD
SD
OUT
DGNDAGNDCE
CHARGE
PUMP
MUX
M3 M2 M1
FL
SWITCH
CP
HIGH Z
MUXOUT
O
FL
O
Figure 1.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2000–2007 Analog Devices, Inc. All rights reserved.
00392-001
ADF4116/ADF4117/ADF4118

TABLE OF CONTENTS

Features.............................................................................................. 1
Applications....................................................................................... 1
General Description ......................................................................... 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications..................................................................................... 3
Timing Characteristics ................................................................ 5
Absolute Maximum Ratings............................................................ 6
ESD Caution.................................................................................. 6
Pin Configuration and Function Descriptions............................. 7
Typical Performance Characteristics ............................................. 8
Circuit Description......................................................................... 12
Reference Input Section............................................................. 12
RF Input Stage............................................................................. 12
Prescaler (P/P + 1)...................................................................... 12
A Counter and B Counter......................................................... 12
R Counter ....................................................................................12
Phase Frequency Detector (PFD) and Charge Pump............ 13
MUXOUT and Lock Detect...................................................... 13
Input Shift Register..................................................................... 13

REVISION HISTORY

4/07—Rev. C to Rev. D
Changes to REF
Changes to Table 4............................................................................ 7
Changes to Figure 35...................................................................... 22
Changes to Ordering Guide.......................................................... 25
11/05—Rev. B to Rev. C
Changes to Table 1............................................................................ 3
Changes to Table 2............................................................................ 5
Changes to Table 3............................................................................ 6
Changes to Table 4............................................................................ 7
Changed OSC 3B1-13M0 to FOX801BH-130............................ 21
Changes to Ordering Guide.......................................................... 25
Characteristics Section..................................... 3
IN
Latch Summaries........................................................................ 14
Latch Maps.................................................................................. 15
Function Latch................................................................................ 19
Counter Reset ............................................................................. 19
Power-Down ............................................................................... 19
MUXOUT Control..................................................................... 19
Phase Detector Polarity ............................................................. 19
Charge Pump Three-State......................................................... 19
Fastlock Enable Bit..................................................................... 19
Fastlock Mode Bit....................................................................... 19
Timer Counter Control............................................................. 19
Initialization Latch..................................................................... 20
Device Programming After Initial Power-Up........................ 20
Applications Information.............................................................. 21
Local Oscillator for the GSM Base Station Transmitter........ 21
Shutdown Circuit ....................................................................... 21
Direct Conversion Modulator .................................................. 21
Interfacing ................................................................................... 24
Outline Dimensions....................................................................... 25
Ordering Guide .......................................................................... 25
9/04—Rev. A to Rev. B
Changes to Specifications.................................................................3
Changes to Ordering Guide.......................................................... 25
3/01—Rev. 0 to Rev. A
4/00—Rev. 0: Initial Version
Rev. D | Page 2 of 28
ADF4116/ADF4117/ADF4118

SPECIFICATIONS

AVDD = DVDD = 3 V ± 10%, 5 V ± 10%; AVDD ≤ VP ≤ 6.0 V; AGND = DGND = CPGND = 0 V; TA = T noted; dBm referred to 50 Ω.
MIN
to T
, unless otherwise
MAX
Table 1.
Parameter B Version
1
Y Version2Unit Test Conditions/Comments
RF CHARACTERISTICS
RF Input Sensitivity −15 to 0 −10 to 0 dBm min to max AV
−10 to 0 −10 to 0 dBm min to max AV RF Input Frequency
= 3 V
DD
= 5 V
DD
Figure 26 for input circuit
See ADF4116 80 to 550 MHz min to max 45 to 550 MHz min to max
Input level = −8 dBm; for lower frequencies,
ensure slew rate (SR) > 36 V/μs ADF4117 0.1 to 1.2 GHz min to max ADF4118 0.1 to 3.0 0.1 to 3.0 GHz min to max Input level = −10 dBm
0.2 to 3.0 GHz min to max Input level = −15 dBm
, DV , DV
DD
DD
= 3 V = 5 V
Maximum Allowable Prescaler
Output Frequency
3
165 200
165 200
MHz max MHz max
AV
AV
DD
DD
REFIN CHARACTERISTICS
Reference Input Frequency 5 to 100 5 to 100 MHz min to max For f < 5 MHz, ensure SR > 100 V/μs Reference Input Sensitivity
4, 5
0.4 to AVDD 0.4 to AVDD V p-p min to max AVDD = 3.3 V, biased at AVDD/2
0.7 to AVDD 0.7 to AVDD V p-p min to max For f ≥ 10 MHz, AVDD = 5 V, biased at AVDD/2 REFIN Input Capacitance 10 10 pF max
REFIN Input Current ±100 ±100 μA max PHASE DETECTOR FREQUENCY5 55 55 MHz max CHARGE PUMP
I
Sink/Source
CP
High Value 1 1 mA typ Low Value 250 250 μA typ
Absolute Accuracy 2.5 2.5 % typ ICP Three-State Leakage Current 3 25 nA max 1 16 nA typ Sink and Source Current Matching 3 3 % typ 0.5 V ≤ VCP ≤ VP − 0.5
ICP vs. VCP 2 2 % typ 0.5 V ≤ VCP ≤ VP − 0.5
ICP vs. Temperature 2 2 % typ VCP = VP/2
LOGIC INPUTS
V
, Input High Voltage 0.8 × DVDD 0.8 × DVDD V min
INH
V
, Input Low Voltage 0.2 × DVDD 0.2 × DVDD V max
INL
I
, Input Current ±1 ± 1 μA max
INH/IINL
CIN, Input Capacitance 10 10 pF max Reference Input Current ±100 ± 100 μA max
LOGIC OUTPUTS
VOH, Output High Voltage DVDD − 0.4 DVDD − 0.4 V min IOH = 500 μA VOL, Output Low Voltage 0.4 0.4 V max IOL = 500 μA
Rev. D | Page 3 of 28
ADF4116/ADF4117/ADF4118
Parameter B Version
1
Y Version2Unit Test Conditions/Comments
POWER SUPPLIES
AVDD 2.7 to 5.5 2.7 to 5.5 V min to V max DVDD AVDD AVDD VP AVDD to 6.0 AVDD to 6.0 V min to V max AVDD ≤ VP ≤ 6.0 V IDD (AIDD + DIDD)
6
ADF4116 5.5 mA max 4.5 mA typical ADF4117 5.5 mA max 4.5 mA typical
ADF4118 7.5 7.5 mA max 6.5 mA typical IP 0.4 0.4 mA max TA = 25°C Low-Power Sleep Mode 1 1 μA typ
NOISE CHARACTERISTICS
ADF4118 Normalized Phase Noise
7
Floor
−213 −213 dBc/Hz typ
Phase Noise Performance8 @ VCO output
ADF4116 540 MHz Output
ADF4117 900 MHz Output
ADF4118 900 MHz Output
9
10
10
−89 −89 dBc/Hz typ @ 1 kHz offset and 200 kHz PFD frequency
−87 −87 dBc/Hz typ @ 1 kHz offset and 200 kHz PFD frequency
−90 −90 dBc/Hz typ @ 1 kHz offset and 200 kHz PFD frequency ADF4117 836 MHz Output11 −78 −78 dBc/Hz typ @ 300 Hz offset and 30 kHz PFD frequency ADF4118 1750 MHz Output12 −85 −85 dBc/Hz typ @ 1 kHz offset and 200 kHz PFD frequency ADF4118 1750 MHz Output13 −65 −65 dBc/Hz typ @ 200 Hz offset and 10 kHz PFD frequency ADF4118 1960 MHz Output14 −84 −84 dBc/Hz typ @ 1 kHz offset and 200 kHz PFD frequency
Spurious Signals
ADF4116 540 MHz Output ADF4117 900 MHz Output ADF4118 900 MHz Output
10
10
10
−88/−99 −88/−99 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD frequency
−90/−104 −90/−104 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD frequency
−91/−100 −91/−100 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD frequency ADF4117 836 MHz Output11 −80/−84 −80/−84 dBc typ @ 30 kHz/60 kHz and 30 kHz PFD frequency ADF4118 1750 MHz Output ADF4118 1750 MHz Output
12
13
−88/−90 −88/−90 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD frequency
−65/−73 −65/−73 dBc typ @ 10 kHz/20 kHz and 10 kHz PFD frequency ADF4118 1960 MHz Output14 −80/−86 −80/−86 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD frequency
1
Operating temperature range for the B version is −40°C to +85°C.
2
Operating temperature range for the Y version is −40°C to +125°C.
3
This is the maximum operating frequency of the CMOS counters.
4
AC coupling ensures AVDD/2 bias. See Figure 35 for typical circuit.
5
Guaranteed by design.
6
TA = 25°C; AVDD = DVDD = 3 V; RFIN for ADF4116 = 540 MHz; RFIN for ADF4117, ADF4118 = 900 MHz.
7
The synthesizer phase noise floor is estimated by measuring the in-band phase noise at the output of the VCO, PN
: PN
= PN
divider value) and 10logF
8
The phase noise is measured with the EVAL-ADF411xEB and the HP8562E Spectrum Analyzer. The spectrum analyzer provides the REFIN for the synthesizer
= 10 MHz @ 0 dBm).
(f
REFOUT
9
f
= 10 MHz; f
REFIN
10
f
= 10 MHz; f
REFIN
11
f
= 10 MHz; f
REFIN
12
f
= 10 MHz; f
REFIN
13
f
= 10 MHz; f
REFIN
14
f
= 10 MHz; f
REFIN
PFD
SYNTH
= 200 kHz; offset frequency = 1 kHz; fRF = 540 MHz; N = 2700; loop bandwidth = 20 kHz.
PFD
= 200 kHz; offset frequency = 1 kHz; fRF = 900 MHz; N = 4500; loop bandwidth = 20 kHz.
PFD
= 30 kHz; offset frequency = 300 Hz; fRF = 836 MHz; N = 27867; loop bandwidth = 3 kHz.
PFD
= 200 kHz; offset frequency = 1 kHz; fRF = 1750 MHz; N = 8750; loop bandwidth = 20 kHz.
PFD
= 10 kHz; offset frequency = 200 Hz; fRF = 1750 MHz; N = 175000; loop bandwidth = 1 kHz.
PFD
= 200 kHz; offset frequency = 1 kHz; fRF = 1960 MHz; N = 9800; loop bandwidth = 20 kHz.
PFD
– 10logF
TOT
– 20logN.
PFD
, and subtracting 20logN (where N is the N
TOT
Rev. D | Page 4 of 28
ADF4116/ADF4117/ADF4118
A

TIMING CHARACTERISTICS

AVDD = DVDD = 3 V ± 10%, 5 V ± 10%; AVDD ≤ VP < 6.0 V; AGND = DGND = CPGND = 0 V; TA = T Guaranteed by design, but not production tested.
Table 2.
Parameter Limit at T
MIN
to T
(B, Y Version) Unit Test Conditions/Comments
MAX
t1 10 ns min DATA to CLK setup time t2 10 ns min DATA to CLK hold time t3 25 ns min CLK high duration t4 25 ns min CLK low duration t5 10 ns min CLK to LE setup time t6 20 ns min LE pulse width
t
4
CLK
t
3
MIN
to T
, unless otherwise noted.
MAX
t
2
DB1
(CONTROL BIT C2)
DB0 (LSB)
(CONTROL BIT C1)
t
5
t
6
00392-002
DAT
t
1
DB20 (MSB) DB19 DB2
LE
LE
Figure 2. Timing Diagram
Rev. D | Page 5 of 28
ADF4116/ADF4117/ADF4118

ABSOLUTE MAXIMUM RATINGS

TA = 25°C, unless otherwise noted.
Table 3.
Parameter Rating
AVDD to GND1 −0.3 V to +7 V AVDD to DVDD −0.3 V to +0.3 V VP to GND1 −0.3 V to +7 V VP to AVDD −0.3 V to +5.5 V Digital I/O Voltage to GND1 −0.3 V to VDD + 0.3 V Analog I/O Voltage to GND1 −0.3 V to VP + 0.3 V REFIN, RFINA, RFINB to GND1 −0.3 V to VDD + 0.3 V RFINA to RFINB ±320 mV Operating Temperature Range
Industrial (B Version) −40°C to +85°C
Extended (Y Version) −40°C to +125°C Storage Temperature Range −65°C to +150°C Maximum Junction Temperature 150°C TSSOP θJA Thermal Impedance 112°C/W Reflow Soldering
Peak Temperature 260°C
Time at Peak Temperature 40 sec Transistor Count
CMOS 6425
Bipolar 303
1
GND = AGND = DGND = 0 V.
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
This device is a high performance RF integrated circuit with an ESD rating of <2 kV, and it is ESD sensitive. Proper precautions should be taken for handling and assembly.

ESD CAUTION

Rev. D | Page 6 of 28
ADF4116/ADF4117/ADF4118

PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

FL
CP
CPGND
AGND
RF
IN
RFINA
AV
REF
O
B
DD
IN
1
2
ADF4116/
3
ADF4117/
4
ADF4118
5
TOP VIEW
(Not to Scale)
6
7
8
16
15
14
13
12
11
10
9
V
P
DV
DD
MUXOUT
LE
DATA
CLK
CE
DGND
00392-003
Figure 3. Pin Configuration
Table 4. Pin Function Descriptions
Pin No. Mnemonic Description
1 FLO
Fast Lock Switch Output. This can be used to switch an external resistor to change the loop filter bandwidth and speed up locking the PLL.
2 CP
Charge Pump Output. When enabled, this provides the ± I
to the external loop filter, which in turn drives the
CP
external VCO. 3 CPGND Charge Pump Ground. This is the ground return path for the charge pump. 4 AGND Analog Ground. This is the ground return path for the prescaler. 5 RFINB
Complementary Input to the RF Prescaler. This point should be decoupled to the ground plane with a small
bypass capacitor, typically 100 pF. See
Figure 26. 6 RFINA Input to the RF Prescaler. This small signal input is ac-coupled from the VCO. 7 AVDD
8 REFIN
Analog Power Supply. This can range from 2.7 V to 5.5 V. Decoupling capacitors to the analog ground plane should be placed as close as possible to this pin. AV
Reference Input. This is a CMOS input with a nominal threshold of V See
Figure 25. The oscillator input can be driven from a TTL or CMOS crystal oscillator, or it can be ac-coupled.
must have the same value as DVDD.
DD
/2 and an equivalent input resistance of 100 kΩ.
DD
9 DGND Digital Ground. 10 CE
Chip Enable. A logic low on this pin powers down the device and puts the charge pump output into three-state mode. Taking the pin high powers up the device depending on the status of the power-down bit F2.
11 CLK
Serial Clock Input. This serial clock is used to clock in the serial data to the registers. The data is latched into the 21-bit shift register on the CLK rising edge. This input is a high impedance CMOS input.
12 DATA
Serial Data Input. The serial data is loaded MSB first with the two LSBs as the control bits. This input is a high impedance CMOS input.
13 LE
Load Enable, CMOS Input. When LE goes high, the data stored in the shift registers is loaded into one of the four latches, the latch being selected using the control bits.
14 MUXOUT
This multiplexer output allows either the lock detect, the scaled RF, or the scaled reference frequency to be accessed externally.
15 DVDD
Digital Power Supply. This can range from 2.7 V to 5.5 V. Decoupling capacitors to the digital ground plane (1 μF, 1 nF) should be placed as close as possible to this pin. For best performance, the 1 μF capacitor should be placed within 2 mm of the pin. The placing of the 1 nF capacitor is less critical, but should still be within 5 mm of the pin.
must have the same value as AVDD.
DV
DD
16 VP
Charge Pump Power Supply. This should be greater than or equal to V
. In systems where VDD is 3 V, this supply can
DD
be set to 6 V and used to drive a VCO with a tuning range of up to 6 V.
Rev. D | Page 7 of 28
ADF4116/ADF4117/ADF4118

TYPICAL PERFORMANCE CHARACTERISTICS

PARAM-TYPE DATA-F ORMAT KEYWORD IMPEDANCE-
FREQ­UNIT
GHz S MA R 50
FREQ MagS11 AngS11
0.05 0.89207 –2.0571
0.10 0.8886 –4.4427
0.15 0.89022 –6.3212
0.20 0.96323 –2.1393
0.25 0.90566 –12.13
0.30 0.90307 –13.52
0.35 0.89318 –15.746
0.40 0.89806 –18.056
0.45 0.89565 –19.693
0.50 0.88538 –22.246
0.55 0.89699 –24.336
0.60 0.89927 –25.948
0.65 0.87797 –28.457
0.70 0.90765 –29.735
0.75 0.88526 –31.879
0.80 0.81267 –32.681
0.85 0.90357 –31.522
0.90 0.92954 –34.222
FREQ MagS11 AngS11
0.95 0.92087 –36.961
1.00 0.93788 –39.343
1.05 0.9512 –40.134
1.10 0.93458 –43.747
1.15 0.94782 –44.393
1.20 0.96875 –46.937
1.25 0.92216 –49.6
1.30 0.93755 –51.884
1.35 0.96178 –51.21
1.40 0.94354 –53.55
1.45 0.95189 –56.786
1.50 0.97647 –58.781
1.55 0.98619 –60.545
1.60 0.95459 –61.43
1.65 0.97945 –61.241
1.70 0.98864 –64.051
1.75 0.97399 –66.19
1.80 0.97216 –63.775
OHMS
–40
–50
–60
–70
–80
–90
–100
–110
PHASE NOISE (dBc/Hz)
–120
–130
–140
00392-004
100Hz FREQUENCY OF FSET F ROM 900MHz CARRIER 1MHz
RL= –40dBc/Hz10dB/DIVI SION RMS NOISE = 0.64°
0.64° rms
00392-007
Figure 4. S-Parameter Data for the ADF4118 RF Input (Up to 1.8 GHz)
Figure 7. ADF4118 Integrated Phase Noise
(900 MHz, 200 kHz, 35 kHz, Typical Lock Time: 200 μs)
0
–5
–10
–15
–20
–25
–30
RF INPUT POW ER (dBm)
–35
–40
–45
04
TA = –40°C
= +25°C
T
A
1.0
RF INPUT FREQUENCY (GHz)
VDD = 3V V
= 3V
P
T
= +85°C
A
00392-005
.00.5 1.5 2.0 2.5 3.0 3.5
Figure 5. Input Sensitivity (ADF4118)
–40
–50
–60
–70
–80
–90
–100
–110
PHASE NOISE (dBc/Hz)
–120
–130
–140
100Hz FREQUENCY OF FSET F ROM 900MHz CARRIER 1MH
Figure 8. ADF4118 Integrated Phase Noise
(900 MHz, 200 kHz, 20 kHz, Typical Lock Time: 400 μs)
0
–10
–20
–30
–40
–50
–60
–70
OUTPUT PO WER (dB)
–80
–90
–100
–400kHz –200kHz 900MHz 200kHz 400kHz
–10
–20
–30
–40
–50
–60
–70
OUTPUT PO WER (dB)
–80
–90
–100
0
REFERENCE LEVEL = –4.2dBm
–2kHz –1kHz 900MHz 1kHz 2kHz
= 3V, VP = 5V
V
DD
I
= 1mA
CP
PFD FREQ UENCY = 200kHz
LOOP BANDWI DTH = 20kHz
RES. BANDWIDT H = 10Hz
VIDEO BANDWIDTH = 10Hz
SWEEP = 1.9 SECO NDS
AVERAGES = 22
–90.2dBc/Hz
00392-006
Figure 6. ADF4118 Phase Noise
(900 MHz, 200 kHz, 20 kHz)
RL= –40dBc/Hz10dB/DIVI SION RMS NOISE = 0.575°
0.575° rms
REFERENCE LEVEL = –3.8dBm
V
= 3V, VP = 5V
DD
= 1mA
I
CP
PFD FREQ UENCY = 200kHz
LOOP BANDW IDTH = 20kHz
RES. BANDWIDT H = 1kHz
VIDEO BANDWI DTH = 1kHz
SWEEP = 2.5 SECONDS
AVERAGES = 4
Figure 9. ADF4118 Reference Spurs
(900 MHz, 200 kHz, 20 kHz)
–91.5dBc
00392-008
z
00392-009
Rev. D | Page 8 of 28
ADF4116/ADF4117/ADF4118
–10
–20
–30
–40
–50
–60
–70
OUTPUT POW ER (dB)
–80
–90
–100
0
REFERENCE LEVEL = –4.2dBm
–400kHz –200kHz 900MHz 200kHz 400kHz
V
= 3V, VP = 5V
DD
= 1mA
I
CP
PFD FREQ UENCY = 200kHz
LOOP BANDW IDTH = 35kHz
RES. BANDWIDTH = 1kHz
VIDEO BANDWI DTH = 1kHz
SWEEP = 2.5 SECONDS
AVERAGES = 10
–90.67dBc
Figure 10. ADF4118 Reference Spurs
(900 MHz, 200 kHz, 35 kHz)
OUTPUT PO WER (dB)
–100
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
REFERENCE LEVEL = –7.0dBm
–400kHz –200kHz 1750MHz 200kHz 400kHz
V
= 3V, VP = 5V
DD
= 1mA
I
CP
PFD FREQUENCY = 30kHz
LOOP BANDW IDTH = 5kHz
RES. BANDWIDT H = 10kHz
VIDEO BANDWI DTH = 10kHz
SWEEP = 477ms
AVERAGES = 25
–71.5dBc/Hz
Figure 11. ADF4118 Phase Noise
(1750 MHz, 30 kHz, 3 kHz)
–40
–50
–60
–70
–80
–90
–100
–110
PHASE NOISE ( dBc/Hz)
–120
–130
–140
100Hz FREQUENCY OF FSET F ROM 1.75GHz CARRIER 1MHz
RL = –40dBc/Hz10dB/DIVI SION RMS NOI SE = 2.0°
2.0° rms
Figure 12. ADF4118 Integrated Phase Noise
(1750 MHz, 30 kHz, 3 kHz)
00392-010
00392-011
00392-012
OUTPUT PO WER (dB)
–100
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
REFERENCE LEVEL = –7.0dBm
–60kHz –30k Hz 1750MHz 30kHz 60kHz
V
= 3V, VP = 5V
DD
I
= 5mA
CP
PFD FREQ UENCY = 30kHz
LOOP BANDWI DTH = 5kHz
RES. BANDWIDTH = 300Hz
VIDEO BANDWIDTH = 300Hz
SWEEP = 4.2ms
AVERAGES = 20
–72.3dBc
Figure 13. ADF4118 Reference Spurs
(1750 MHz, 30 kHz, 3 kHz)
–10
–20
–30
–40
–50
–60
–70
OUTPUT PO WER (dB)
–80
–90
–100
0
REFERENCE LEVEL = –10.3dBm
–2kHz –1kHz
VVDD = 3V, VP = 5V
= 1mA
I
CP
PFD FREQUENCY = 1MHz
LOOP BANDW IDTH = 100kHz
RES. BANDWIDT H = 10Hz
VIDEO BANDWI DTH = 10Hz
SWEEP = 1.9 SECONDS
AVERAGES = 26
–85.2dBc/Hz
2800MHz
1kHz 2kHz
Figure 14. ADF4118 Phase Noise
(2800 MHz, 1 MHz, 100 kHz)
10dB/DIVI SION RL = –40dBc/Hz RMS NOISE = 1. 552°
–40
–50
–60
–70
–80
–90
–100
–110
PHASE NOISE (dBc/Hz)
–120
–130
–140
100Hz FREQUENCY OFFS ET FROM 2.8GHz CARRIE R 1MHz
1.55° rms
Figure 15. ADF4118 Integrated Phase Noise
(2800 MHz, 1 MHz, 100 kHz)
00392-013
00392-014
00392-015
Rev. D | Page 9 of 28
ADF4116/ADF4117/ADF4118
–10
–20
–30
–40
–50
–60
–70
OUTPUT PO WER (dB)
–80
–90
–100
0
REFERENCE LEVEL = –9.3dBm
–2MHz –1M Hz 1MHz 2MHz
VDD = 3V, VP= 5V
= 1mA
I
CP
PFD FREQUENCY = 1MHz
LOOP BANDW IDTH = 100kHz
RES. BANDWIDT H = 3kHz
VIDEO BANDWI DTH = 3kHz
SWEEP = 1. 4 SECONDS
AVERAGES = 4
2800MHz
Figure 16. ADF4118 Reference Spurs
(2800 MHz, 1 MHz, 100 kHz)
130
–135
–140
–145
–150
–155
–160
PHASE NOISE (dBc/Hz)
–165
–170
–175
1 10000100 1000
10
PHASE DETECTO R FREQUENCY (kHz)
Figure 17. ADF4118 Phase Noise (Referred to CP Output) vs.
PFD Frequency
60
–70
–77.3dBc
VDD = 3V VP = 5V
VDD = 3V V
= 5V
P
60
VDD = 3V V
= 5V
P
–70
–80
–90
FIRST REF ERENCE SPUR (dBc)
00392-016
–100
–20 0 20 40 60 80 100
–40
TEMPERATURE ( °C)
00392-019
Figure 19. ADF4118 Reference Spurs vs. Temperature
(900 MHz, 200 kHz, 20 kHz)
5
–5
–15
–25
–35
–45
–55
–65
–75
FIRST REF ERENCE SPUR (dBc)
–85
–95
00392-017
–105
0
1
234
TUNING VOLTAGE
Figure 20. ADF4118 Reference Spurs (200 kHz) vs. V
VDD = 3V V
= 5V
P
TUNE
00392-020
5
(900 MHz, 200 kHz, 20 kHz)
60
–70
VDD = 3V V
= 5V
P
–80
–80
PHASE NOISE ( dBc/Hz)
–90
–100
–20 0 20 40 60 80 100
–40
TEMPERATURE ( °C)
Figure 18. ADF4118 Phase Noise vs. Temperature
(900 MHz, 200 kHz, 20 kHz)
00392-018
PHASE NOISE (dBc/Hz)
–90
020406080
TEMPERATURE ( °C)
Figure 21. ADF4118 Phase Noise vs. Temperature
(836 MHz, 30 kHz, 3 kHz)
00392-021
100
Rev. D | Page 10 of 28
ADF4116/ADF4117/ADF4118
60
–70
–80
–90
FIRST REF ERENCE SPUR (dBc)
–100
0
20 40 60 80 100
TEMPERATURE (°C)
Figure 22. ADF4118 Reference Spurs vs. Temperature
(836 MHz, 30 kHz, 3 kHz)
3.0
2.5
2.0
(mA)
1.5
DD
DI
1.0
VDD = 3V V
= 5V
P
00392-022
1.2
1.0
0.8
0.6
0.4
0.2
0
(mA)
CP
I
–0.2
–0.4
–0.6
–0.8
–1.0
–1.2
0.5 1.5 2.0 2.5 3.0 3.5 4.5 5.0
01.0 VCP (V)
VP = 5V I
SETTING: 1mA
CP
4.0
00392-024
Figure 24. Charge Pump Output Characteristics
0.5
0
0
50 100 150 200
PRESCALER OUTPUT FREQUENCY (MHz)
00392-023
Figure 23. DIDD vs. Prescaler Output Frequency
Rev. D | Page 11 of 28
ADF4116/ADF4117/ADF4118
(
[
×+×
=

CIRCUIT DESCRIPTION

REFERENCE INPUT SECTION

The reference input stage is shown in Figure 25. SW1 and SW2 are normally closed switches; SW3 is normally open. When power-down is initiated, SW3 is closed and SW1 and SW2 are opened. This ensures that there is no loading of the REF
IN
pin
on power-down.
POWE R-DOWN
CONTROL
100k
NC
REF
IN
NC
SW1
Figure 25. Reference Input Stage
SW2
SW3
NO
BUFFER
TO R COUNTER
00392-025

RF INPUT STAGE

The RF input stage is shown in Figure 26. It is followed by a 2-stage limiting amplifier to generate the CML clock levels needed for the prescaler.
1.6V AV
DD
500500
AGND
00392-026
RFINA
RF
IN
BIAS
GENERATOR
B
Figure 26. RF Input Stage

PRESCALER (P/P + 1)

The dual-modulus prescaler (P/P + 1), along with the A counter and B counter, enables the large division ratio, N, to be realized (N = PB + A). The dual-modulus prescaler takes the CML clock from the RF input stage and divides it down to a manageable frequency for the CMOS A counter and CMOS B counter. The prescaler is programmable. It can be set in software to 8/9 for the ADF4116 and to 32/33 for the ADF4117 and ADF4118. It is based on a synchronous 4/5 core.

A COUNTER AND B COUNTER

The A CMOS counter and B CMOS counter combine with the dual-modulus prescaler to allow a wide ranging division ratio in the PLL feedback counter. The counters are specified to work when the prescaler output is 200 MHz or less.

Pulse Swallow Function

The A counter and B counter, in conjunction with the dual­modulus prescaler, make it possible to generate output frequencies that are spaced only by the reference frequency divided by R. The equation for the VCO frequency is as follows:
VCO
)
REFIN
RfABPf
/
]
where:
is the output frequency of external voltage controlled
f
VCO
oscillator (VCO).
P is the preset modulus of dual-modulus prescaler. B is the preset divide ratio of binary 13-bit counter (3 to 8191).
A is the preset divide ratio of binary 5-bit swallow counter (0 to 31).
f
is the output frequency of the external reference frequency
REFIN
oscillator. R is the preset divide ratio of binary 14-bit programmable reference counter (1 to 16,383).

R COUNTER

The 14-bit R counter allows the input reference frequency to be divided down to produce the input clock to the phase frequency detector (PFD). Division ratios from 1 to 16,383 are allowed.
FROM RF
INPUT STAGE
MODULUS CONTROL
N = BP + A
13-BIT
B COUNTER
PRESCALER
P/P + 1
Figure 27. A Counter and B Counter
LOAD
LOAD
5-BIT
A COUNTER
TO PFD
00392-027
Rev. D | Page 12 of 28
ADF4116/ADF4117/ADF4118
V
A

PHASE FREQUENCY DETECTOR (PFD) AND CHARGE PUMP

The PFD takes inputs from the R counter and N counter and produces an output proportional to the phase and frequency difference between them. the PFD. The PFD includes a fixed delay element that sets the width of the antibacklash pulse. This is typically 3 ns. This pulse ensures that there is no dead zone in the PFD transfer function and gives a consistent reference spur level.
HI
R DIVIDER
HI
N DIVIDER
R DIVIDER
N DIVIDER
CP OUTPUT
Figure 28. PFD Simplified Schematic and Timing (In Lock)
CLR1
CLR2
Figure 28 is a simplified schematic of
UP
Q1D1
U1
DELAY
DOWN
Q2D2
U2
U3
CPGND
P
CHARGE PUMP
CP
00392-028

MUXOUT AND LOCK DETECT

The output multiplexer on the ADF411x family allows the user to access various internal points on the chip. The state of MUXOUT is controlled by M3, M2, and M1 in the function latch.
Figure 33 shows the full truth table. Figure 29 shows the
MUXOUT section in block diagram form.
DV
DD
NALOG LO CK DETECT
DIGITAL LOCK DET ECT
R COUNTER OUT PUT N COUNTER OUT PUT
SDOUT
CONTROLMUX
MUXOUT
DGND
Figure 29. MUXOUT Circuit

Lock Detect

MUXOUT can be programmed for both digital lock detect and analog lock detect.
Digital lock detect is active high. It is set high when the phase error on three consecutive phase detector cycles is less than 15 ns. It stays set high until a phase error greater than 25 ns is detected on any subsequent PD cycle.
The N channel, open-drain, analog lock detect should be operated with an external pull-up resistor of 10 kΩ nominal. When lock is detected, it is high with narrow low going pulses.

INPUT SHIFT REGISTER

The ADF411x family digital section includes a 21-bit input shift register, a 14-bit R counter, and an 18-bit N counter, comprising a 5-bit A counter and a 13-bit B counter. Data is clocked into the 21-bit shift register on each rising edge of CLK. The data is clocked in MSB first. Data is transferred from the shift register to one of four latches on the rising edge of LE. The destination latch is determined by the state of the two control bits (C2, C1) in the shift register. These are the two LSBs, DB1 and DB0, as shown in the timing diagram in these bits is shown in
Figure 34. Ta b le 5 summarizes how the
latches are programmed.
Figure 2. The truth table for
00392-029
Table 5. Programming Data Latches
Control Bits
C2 C1 Data Latch
0 0 R Counter 0 1 N Counter (A and B) 1 0 Function Latch 1 1 Initialization Latch
Rev. D | Page 13 of 28
ADF4116/ADF4117/ADF4118

LATCH SUMMARIES

REFERENCE COUNTER LATCH
TEST
LOCK
DETECT
PRECISION
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0DB10
LDP T4 T3 T2 T1 R14 R13 R12 R11 R10 R8 R7 R6 R5 R4 R3 R2 R1 C2 ( 0) C1 (0)R9
MODE BITS
14-BIT REFE RENCE COUNTER, R
AB COUNTER LATCH
CP GAIN
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB 11 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0DB10
G1 B13 B12 B11 B10 B9 B8 B7 B6 B5 B3 B2 B1 A5 A4 A3 A2 A1 C2 ( 0) C1 (1)B4
13-BIT B COUNT ER 5-BIT A COUNTER
FUNCTION LATCH
RESERVED
DOWN 2
POWER-
RESERVED
DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB 11 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0DB10
DB20
PD2X
XXX
TIMER COUNTER
CONTROL
TC4 TC3 TC2 TC1 F6 F4 F3 F2 M3 M2 M1 PD1 F1 C2 (1) C1 (0)
MODE
FAS TLO CK
X
CONTROL
BITS
CONTRO L
BITS
CP
STATE
PHASE
THREE-
ENABLE
RESERVED
FAS TLO CK
DETECTOR
MUXOUT
CONTROL
POLARITY
DOWN 1
POWER-
CONTRO L
BITS
RESET
COUNTER
INITIALIZATION LATCH
RESERVED
DOWN 2
POWER-
RESERVED
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB 11 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0DB10
X
XXX
PD2 TC4 TC3 TC2 TC1 F6 F4 F 3 F2 M 3 M2 M1 PD1 F 1 C2 (1) C1 (1)
TIMER COUNTER
CONTROL
MODE
FAS TLO CK
RESERVED
X
CP
STATE
PHASE
THREE-
ENABLE
FAS TLO CK
DETECTOR
Figure 30. ADF411x family Latch Summary
Rev. D | Page 14 of 28
MUXOUT
CONTROL
POLARITY
DOWN 1
POWER-
CONTROL
BITS
RESET
COUNTER
00392-030
ADF4116/ADF4117/ADF4118

LATCH MAPS

TEST
LOCK
DETECT
PRECISION
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0DB10
LDP T4 T3 T 2 T1 R14 R13 R12 R11 R10 R8 R7 R6 R5 R4 R3 R2 R1 C2 (0) C1 (0)R9
MODE BITS
TEST MODE BITS SHOULD BE SET TO 0000 FOR NORMAL OPERAT ION
14-BIT REFERE NCE COUNTER, R
R14
0
0
0
0
1
1
1
1
R13
0
0
0
0
1
1
1
1
R12
CONTROL
BITS
••••••••••
0
••••••••••
0
••••••••••
0
••••••••••
0
••••••••••
••••••••••
••••••••••
••••••••••
1
••••••••••
1
••••••••••
••••••••••
1
1
••••••••••
R3 R2 R1 DIVIDE RATIO
0
0
1
0
1
0
0
1
0
1
0
1
1
1
1
1
1
0
1
0
0
1
0
1
1
2
3
4
163 80
163 81
163 82
163 83
OPERATIONLDP
3 CONSECUTIVE CYCLES OF PHASE DELAY LESS THAN
0
15ns MUST OCCUR BEFORE LO CK DETECT IS SET. 5 CONSECUTIVE CYCLES OF PHASE DELAY LESS THAN
1
15ns MUST OCCUR BEFORE LO CK DETECT IS SET.
Figure 31. Reference Counter Latch Map
00392-031
Rev. D | Page 15 of 28
ADF4116/ADF4117/ADF4118
CP GAIN
13-BIT B COUNTE R 5-BIT A COUNTER
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0DB10
G1 B13 B12 B11 B10 B9 B8 B7 B6 B5 B3 B2 B1 A5 A4 A3 A2 A1 C2 (0) C1 (1)B4
ADF4116
ADF4117/ADF4118
CONTROL
BITS
A5
X
X
X
X
A5
0
0
0
1
1
1
A4
X
X
X
X
A4
0
0
0
1
1
1
A3
0
0
1
1
A3
0
0
0
1
1
1
A2
0
0
1
1
A2
0
0
1
0
1
1
A1
0
1
0
1
A1
0
1
0
1
0
1
A COUNTER
DIVIDE RATIO
0
1
6
7
A COUNTER
DIVIDE RATIO
0
1
2
29
30
31
••••••••••
B13
0
0
0
0
1
1
1
1
CURRENT SETTI NGSLDP
250µA
0
1
1mA
B12
0
0
0
0
1
1
1
1
B11
0
••••••••••
0
••••••••••
0
••••••••••
0
••••••••••
••••••••••
••••••••••
••••••••••
1
••••••••••
1
••••••••••
1
••••••••••
1
••••••••••
B3 B2 B1 B COUNTER DIVIDE RATI O
0
0
0
1
1
1
1
1
0
1
1
0
0
0
1
1
1
0
1
0
0
1
0
1
NOT ALLO WED
NOT ALLO WED
3
4
8188
8189
8190
8191
N = BP + A, P IS P RESCALER VALUE. B MUST BE GREATER THAN OR EQUAL T O A. FO R CONTINUOUS LY ADJACENT VALUES OF N
X FREF
, N
MIN
IS (P2 – P).
00392-032
Figure 32. A Counter/B Counter Latch Map
Rev. D | Page 16 of 28
ADF4116/ADF4117/ADF4118
RESERVED
DOWN 2
POWER-
RESERVED
DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0DB10
DB20
PD2X
XXX
CE PIN PD2 PD1 MODE
ASYNCHRONOUS POWER-DOWN
X
X
0
NORMAL OPERAT ION
0
X
1
ASYNCHRONOUS POWER-DOWN
1
0
1
SYNCHRONOUS POW ER-DOWN
1
1
1
TC4
TIMER COUNTER
CONTROL
TC4 TC3 TC2 TC1 F6 F4 F3 F2 M3 M2 M1 PD1 F1 C2 (1) C1 (0)
F4
0
1
1
TC3
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
0
0
0
0
1
1
1
1
0
0
0
0
1
1
1
1
TC2
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
TC1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
MODE
RESERVED
FASTLOCK
X
F6
FASTLOCK MODE
X
FASTLOCK DISABLED
0
FASTLOCK MODE 1
1
FASTLOCK MODE 2
TIMEOUT
(PFD CYCLES)
3
7
11
15
19
23
27
31
35
39
43
47
51
55
59
63
CP
STATE
THREE-
F3
0
1
PHASE
DETECT OR
F2
0
1
CHARGE PUMP
OUTPUT
NORMAL
THREE-STAT E
ENABLE
FASTLOCK
MUXOUT
CONTROL
POLARITY
M2
M3
0
0
0
0
1
0
1
0
0
1
0
1
1
1
1
1
PHASE DETECTOR
POLARITY
NEGATIVE
POSITIVE
DOWN 1
POWER-
COUNTER
F1
0
NORMAL
R, A, B COUNTERS
1
HELD IN RESET
M1
0
THREE-STATE OUTPUT
DIGITAL LOCK DETECT
1
(ACTIVE HIGH)
N DIVIDER OUTPUT
0
AV
1
0
1
0
1
DD
R DIVIDER OUTPUT
ANALOG LO CK DETECT (N CHANNEL OPEN DRAIN)
SERIAL DATA O UTPUT (INVERSE POLARITY OF SERIAL DATA I NPUT)
DGND
Figure 33. Function Latch Map
CONTROL
BITS
RESET
COUNTER
OPERATIO N
OUTPUT
00392-033
Rev. D | Page 17 of 28
ADF4116/ADF4117/ADF4118
RESERVED
DOWN 2
POWER-
RESERVED
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0DB10
X
CE PIN PD2 PD1 MODE
X
0
X
1
0
1
1
1
XXX
PD2 TC4 T C3 TC2 TC1 F6 F4 F3 F2 M3 M2 M1 PD1 F1 C2 (1) C1 (1)
ASYNCHRONOUS POWER-DOWN
X
NORMAL OPERATION
0
ASYNCHRONOUS POWER-DOWN
1
SYNCHRONOUS POWER-DOWN
1
TC4
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
TIMER COUNT ER
CONTRO L
TC3
0
0
0
0
1
1
1
1
0
0
0
0
1
1
1
1
TC2
F4
0
1
1
TC1
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
Figure 34. Initialization Latch Map
MODE
FAST LOCK
RESERVED
X
F6
FASTLOCK MODE
FASTLOCK DISABLED
X
FASTLOCK MODE 1
0
FASTLOCK MODE 2
1
TIMEOUT
(PFD CYCLES)
3
7
11
15
19
23
27
31
35
39
43
47
51
55
59
63
CP
STATE
PHASE
THREE-
ENABLE
FAST LOCK
F3
0
1
DETECTOR
F2
0
1
CHARGE PUMP
OUTPUT
NORMAL
THREE-STATE
MUXOUT
CONTROL
POLARITY
M2
M3
0
0
0
0
1
0
1
0
0
1
0
1
1
1
1
1
PHASE DETECTOR
POLARITY
NEGATIVE
POSITIVE
DOWN 1
POWER-
F1
0
1
M1
0
THREE-STATE OUTPUT
DIGITAL LOCK DETECT
1
(ACTIVE HIG H)
N DIVIDER OUTPUT
0
AV
1
DD
R DIVIDER OUTPUT
0
ANALOG LO CK DETECT
1
(N CHANNEL OPEN DRAIN)
SERIAL DATA OUTPUT (INVERSE POL ARITY OF
0
SERIAL DATA INPUT)
1
DGND
CONTROL
RESET
COUNTER
OPERATION
OUTPUT
BITS
COUNTER
NORMAL
R, A, B COUNTERS HELD IN RESET
00392-034
Rev. D | Page 18 of 28
ADF4116/ADF4117/ADF4118

FUNCTION LATCH

With C2 and C1 set to 1 and 0, respectively, the on-chip function latch is programmed. format for programming the function latch.
Figure 33 shows the input data

COUNTER RESET

DB2 (F1) is the counter reset bit. When this bit is set to 1, the R counter, A counter, and B counter are reset. For normal operation, this bit should be set to 0. On power-up, the F1 bit needs to be disabled, for the N counter to resume counting in “close” alignment with the R counter. (The maximum error is one prescaler cycle.)

POWER-DOWN

DB3 (PD1) and DB19 (PD2) on the ADF411x family provide programmable power-down modes. They are enabled by the CE pin.
When the CE pin is low, the device is immediately disabled regardless of the states of PD2 and PD1.
In programmed asynchronous power-down, the device powers down immediately after latching a 1 into the PD1 bit, with the condition that PD2 is loaded with a 0.
In programmed synchronous power-down, the device power­down is gated by the charge pump to prevent unwanted frequency jumps. Once power-down is enabled by writing a 1 into the PD1 bit (on condition that a 1 is also loaded to PD2), the device goes into power-down after the first successive charge pump event.
When a power-down is activated (either synchronous or asynchronous mode including CE pin-activated power-down), the following events occur:
All active dc current paths are removed.
The R counter, N counter, and timeout counter are forced
to their load state conditions.
The charge pump is forced into three-state mode.
The digital clock detect circuitry is reset.
The RF
The oscillator input buffer circuitry is disabled.
The input register remains active and capable of loading
and latching data.
input is debiased.
IN

MUXOUT CONTROL

The on-chip multiplexer is controlled by DB6 (M3), DB5 (M2), and DB4 (M1) on the ADF411x family. truth table.
Figure 33 shows the

PHASE DETECTOR POLARITY

DB7 (F2) of the function latch sets the phase detector polarity. When the VCO characteristics are positive, DB7 should be set to 1. When they are negative, it should be set to 0.

CHARGE PUMP THREE-STATE

The DB8 (F3) bit puts the charge pump into three-state mode when programmed to 1. It should be set to 0 for normal operation.

FASTLOCK ENABLE BIT

DB9 (F4) of the function latch is the fastlock enable bit. Fastlock is enabled only when DB9 is set to 1.

FASTLOCK MODE BIT

DB11 (F6) of the function latch is the fastlock mode bit. When fastlock is enabled, this bit determines which fastlock mode is used. If the fastlock mode bit is 0, Fastlock Mode 1 is selected; if the fastlock mode bit is 1, Fastlock Mode 2 is selected.
If fastlock is not enabled (DB9 = 0), DB11 (ADF4116) determines the state of the FL that programmed to DB11.
output. FLO state is the same as
O

Fastlock Mode 1

In the ADF411x family, the output level of FLO is programmed to a low state, and the charge pump current is switched to the high value (1 mA). FL filter and to ensure stability while in fastlock by altering the loop bandwidth.
The device enters fastlock by having a 1 written to the CP Gain bit in the N register. The device exits fastlock by having a 0 written to the CP Gain bit in the N register.
is used to switch a resistor in the loop
O

Fastlock Mode 2

In the ADF411x family, the output level of FLO is programmed to a low state, and the charge pump current is switched to the high value (1 mA). FL filter and to ensure stability while in fastlock by altering the loop bandwidth.
The device enters fastlock by having a 1 written to the CP gain bit in the N register. The device exits fastlock under the control of the timer counter. After the timeout period determined by the value in TC4 to TC1, the CP Gain bit in the N register is automatically reset to 0, and the device reverts to normal mode instead of fastlock.
is used to switch a resistor in the loop
O

TIMER COUNTER CONTROL

In the ADF411x family, the user has the option of switching between two charge pump current values to speed up locking to a new frequency.
When using the fastlock feature with the ADF411x family, the following should be noted:
The user must make sure that fastlock is enabled. Set DB9
to 1. The user must also choose which fastlock mode to use.
Rev. D | Page 19 of 28
ADF4116/ADF4117/ADF4118
Fastlock Mode 2 uses the values in the timer counter to
determine the timeout period before reverting to normal mode operation after fastlock. Fastlock Mode 2 is chosen by setting DB11 to 1.
The user must also decide how long to keep the high
current (1 mA) active before reverting to low current (250 μA). This is controlled by the timer counter control bits, DB14 to DB11 (TC4 to TC1), in the function latch. The truth table is given in
Figure 33.
To program a new output frequency, program the A counter
and B counter latch with new values for A and B. At the same time, set the CP Gain bit to a 1, which sets the charge pump to 1 mA for a period of time determined by TC4 to TC1. When this time is up, the charge pump current reverts to 250 μA. At the same time, the CP Gain bit in the A counter and B counter latch is reset to 0 and is ready for the next time that the user wants to change the frequency.

INITIALIZATION LATCH

When C2 and C1 are both set to 1, the initialization latch is programmed. This is essentially the same as the function latch that is programmed when C2, C1 = 1, 0.
However, when the initialization latch is programmed, an additional internal reset pulse is applied to the R counter and N counter. This pulse ensures that the N counter is at a load point when the N counter data is latched and that the device begins counting in close phase alignment.
If the latch is programmed for synchronous power-down (CE pin is high; PD1 bit is high; PD2 bit is low), the internal pulse also triggers this power-down. The prescaler reference and the oscillator input buffer are unaffected by the internal reset pulse, so close phase alignment is maintained when counting resumes.
When the first N counter data is latched after initialization, the internal reset pulse is again activated. However, successive N counter loads do not trigger the internal reset pulse.

DEVICE PROGRAMMING AFTER INITIAL POWER-UP

After initial power-up, the device can be programmed by the initialization latch method, the CE pin method, or the counter reset method.

Initialization Latch Method

1. Apply V
2. Program the initialization latch (11 in 2 LSBs of input
word). Make sure that F1 bit is programmed to 0.
3. Do an R load (00 in 2 LSBs).
DD
.
4. Do an N load (01 in 2 LSBs).
When the initialization latch is loaded, the following occurs:
The function latch contents are loaded.
An internal pulse resets the R, N, and timeout counters to
load state conditions and also three-states the charge pump. Note that the prescaler band gap reference and the oscillator input buffer are unaffected by the internal reset pulse, allowing close phase alignment when counting resumes.
Latching the first N counter data after the initialization
word activates the same internal reset pulse. Successive N loads do not trigger the internal reset pulse unless there is another initialization.

CE Pin Method

1. Apply V
DD
.
2. Bring CE low to put the device into power-down. This is an
asynchronous power-down in that it happens immediately.
3. Program the function latch (10).
4. Program the R counter latch (00).
5. Program the N counter latch (01).
6. Bring CE high to take the device out of power-down.
The R counter and N counter resume counting in close alignment.
Note that after CE goes high, a duration of 1 μs may be required for the prescaler band gap voltage and oscillator input buffer bias to reach a steady state.
CE can be used to power up and power down the device to check for channel activity. The input register does not need to be repro­grammed each time the device is disabled and enabled, as long as it is programmed at least once after V
is initially applied.
CC

Counter Reset Method

1. Apply V
DD
.
2. Do a function latch load (10 in 2 LSBs). As part of this,
load 1 to the F1 bit. This enables the counter reset.
3. Do an R counter load (00 in 2 LSBs).
4. Do an N counter load (01 in 2 LSBs).
5. Do a function latch load (10 in 2 LSBs). As part of this,
load 0 to the F1 bit. This disables the counter reset.
This sequence provides the same close alignment as the initiali­zation method. It offers direct control over the internal reset. Note that counter reset holds the counters at load point and three-states the charge pump, but it does not trigger synchro­nous power-down. The counter reset method requires an extra function latch load compared to the initialization latch method.
Rev. D | Page 20 of 28
ADF4116/ADF4117/ADF4118

APPLICATIONS INFORMATION

LOCAL OSCILLATOR FOR THE GSM BASE STATION TRANSMITTER

Figure 35 shows the ADF4117/ADF4118 being used with a VCO to produce the LO for a GSM base station transmitter.
The reference input signal is applied to the circuit at F in this case, is terminated in 50 Ω. A typical GSM system has a 13 MHz TCXO driving the reference input without a 50 Ω termination. To have a channel spacing of 200 kHz (the GSM standard), the reference input must be divided by 65, using the on-chip reference divider of the ADF4117/ADF1118.
The charge pump output of the ADF4117/ADF1118 (Pin 2) drives the loop filter. In calculating the loop filter component values, a number of items need to be considered. In this example, the loop filter was designed so that the overall phase margin for the system is 45°. Other PLL system specifications include:
= 1 mA
K
D
K
= 12 MHz/V
V
Loop bandwidth = 20 kHz
= 200 kHz
F
REF
N = 4500 Extra reference spur attenuation = 10 dB
All of these specifications are needed and are used to produce the loop filter component values shown in
Figure 36.
The loop filter output drives the VCO, which, in turn, is fed back to the RF input of the PLL synthesizer; it also drives the RF output terminal. A T-circuit configuration provides 50 Ω matching between the VCO output, the RF output, and the RF
terminal of the synthesizer.
IN
In a PLL system, it is important to know when the system is in locked mode. In
Figure 35, this is accomplished by using the MUXOUT signal from the synthesizer. The MUXOUT pin can be programmed to monitor various internal signals in the synthesizer. One of these is the LD or lock-detect signal.
REFIN
and,

SHUTDOWN CIRCUIT

The attached circuit in Figure 36 shows how to shut down both the ADF411x family and the accompanying VCO. The ADG702 switch goes open-circuit when a Logic 1 is applied to the IN input. The low cost switch is available in both SOT-23 and MSOP packages.

DIRECT CONVERSION MODULATOR

In some applications, a direct conversion architecture can be used in base station transmitters. combination available from Analog Devices, Inc. to implement this solution.
The circuit diagram shows the AD9761 being used with the AD8346. The use of dual integrated DACs, such as the AD9761 with specified ±0.02 dB and ±0.004 dB gain and offset matching characteristics, ensures minimum error contribution (over temperature) from this portion of the signal chain.
The local oscillator is implemented by using the ADF4117/ ADF4118. In this case, the FOX801BH-130 provides the stable 13 MHz reference frequency. The system is designed for 200 kHz channel spacing and an output center frequency of 1960 MHz. The target application is a WCDMA base station transmitter. Typical phase noise performance from this LO is
−85 dBc/Hz at a 1 kHz offset. The LO port of the AD8346 is driven in single-ended fashion. LOIN is ac-coupled to ground with the 100 pF capacitor, and LOIP is driven through the ac­coupling capacitor from a 50 Ω source. An LO drive level between
−6 dBm and −12 dBm is required. The circuit in typical level of −8 dBm.
The RF output is designed to drive a 50 Ω load, but it must be ac-coupled as shown in
Figure 37. If the I and Q inputs are driven in quadrature by 2 V p-p signals, the resulting output power is approximately −10 dBm.
Figure 37 shows the
Figure 37 gives a
Rev. D | Page 21 of 28
ADF4116/ADF4117/ADF4118
V
RF
18
18
FREQUENCY.
OUT
OUT
00392-035
F
REFIN
1000pF
51Ω*
SPI-COMPAT IBLE SERI AL BUS
1000pF
V
DD
71516
AVDDDV
REF
IN
8
ADF4117/ ADF4118
CE
MUXOUT
CLK DATA LE
CPGND
AGND
34 9
DD
CP
FL
RFINA
RF
IN
DGND
V
P
100pF
V
P
2
0.15nF
1
O
10k
14
LOCK DETECT
100pF
6
5
B
100pF
DECOUPLING CAPACITORS ON AVDD,DVDD, AND VPOF THE ADF4117/ADF4118 AND ON V OMITTE D FROM THE DIAGRAM F OR CLARIT Y.
3.3k
27k
1.5nF
51**
*TO BE USED WHEN GENERATOR SOURCE IMPEDANCE I S 50Ω.
**OPTIONAL MATCHING RESISTOR DEP ENDING ON RF
V
CC
VCO190-902T
620pF
OF THE VCO190-920T HAVE BEEN
CC
100pF
18
Figure 35. Local Oscillator for GSM Base Station
P
F
REFIN
V
DD
71516
AVDDDV
8
REF
IN
ADF4116/ ADF4117/ ADF4118
CPGND
AGND
349
POWER-DOW N CONTROL
V
CE
DD
P
DGND
FL
RFINA
RF
IN
CP
O
2
1
10k
100pF
6
5
B
100pF
LOOP
FILTER
51
DECOUPLING CAPACITORS AND I NTERFACE SIGNALS HAVE BEEN OMITT ED FROM T HE DIAGRAM FO R CLARITY.
Figure 36. Local Oscillator Shutdown Circuit
V
S
IN
ADG702
DGND
V
CC
VCO
GND
DD
100pF
100pF
18
18
18
RF
OUT
00392-036
Rev. D | Page 22 of 28
ADF4116/ADF4117/ADF4118
0.1µF
MODULATED
DIGITAL
DATA
FOX801BH-130
TCXO
SERIAL
DIGITAL
INTERFACE
REFIO
AD9761
TxDAC
FS ADJ
2k
REF
IN
ADF4118
IOUTA
IOUTB
QOUTA
QOUTB
CP
RFINARFINB
680pF
LOW-PASS
FILTER
LOW-PASS
FILTER
10k
1k
6.8nF
18pF
VCO190-1960T
IBBP
IBBP
AD8346
QBBP
QBBP
LOIN LOIP
100pF
18
100pF
18
100pF
18
VOUT
100pF
RF
OUT
100pF
100pF
51
POWER SUPPL Y CONNECTIONS AND DECOUPLI NG CAPACITO RS ARE OMITT ED FROM DIAGRAM FO R CLARI TY.
00392-037
Figure 37. Direct Conversion Transmitter Solution
Rev. D | Page 23 of 28
ADF4116/ADF4117/ADF4118

INTERFACING

The ADF411x family has a simple SPI®-compatible serial inter­face for writing to the device. CLK, DATA, and LE control the data transfer. When LE (latch enable) goes high, the 24 bits that are clocked into the input register on each rising edge of CLK are transferred to the appropriate latch. See timing diagram and
Tabl e 5 for the latch truth table.
The maximum allowable serial clock rate is 20 MHz. This means that the maximum update rate possible for the device is 833 kHz or one update every 1.2 μs. This is more than adequate for systems that have typical lock times in hundreds of microseconds.

ADuC812 Interface

Figure 38 shows the interface between the ADF411x family and the ADuC812 MicroConverter®. Since the ADuC812 is based on an 8051 core, this interface can be used with any 8051-based microcontroller. The MicroConverter is set up for SPI master mode with CPHA = 0. To initiate the operation, the I/O port driving LE is brought low. Each latch of the ADF411x family needs a 24-bit word. This is accomplished by writing three 8-bit bytes from the MicroConverter to the device. When the third byte has been written, the LE input should be brought high to complete the transfer.
SCLOCK
ADuC812
Figure 38. ADuC812 to ADF411x family Interface
MOSI
I/O PORTS
Figure 2 for the
CLK
DATA
ADF4116/
LE
ADF4117/ ADF4118
CE
MUXOUT (LOCK DETECT )
00392-038
On first applying power to the ADF411x family, it requires three writes (one each to the R counter latch, the N counter latch, and the initialization latch) for the output to become active.
I/O port lines on the ADuC812 are also used to control power­down (CE input) and to detect lock (MUXOUT configured as lock detect and polled by the port input).
When operating in the mode described, the maximum SCLOCK rate of the ADuC812 is 4 MHz. This means that the maximum rate at which the output frequency can be changed is 166 kHz.

ADSP-21xx Interface

Figure 39 shows the interface between the ADF411x family and the ADSP-21xx digital signal processor. The ADF411x family needs a 21-bit serial word for each latch write. The easiest way to accomplish this using the ADSP-21xx family is to use the autobuffered transmit mode of operation with alternate framing. This provides a means for transmitting an entire block of serial data before an interrupt is generated.
SCLK
ADSP-21xx
Figure 39. ADSP-21xx to ADF411x family Interface
DT
TFS
I/O FLAGS
CLK
DATA
ADF4116/
LE
ADF4117/ ADF4118
CE
MUXOUT (LOCK DE TECT)
00392-039
Set up the word length for 8 bits and use three memory locations for each 24-bit word. To program each 21-bit latch, store the three 8-bit bytes, enable the autobuffered mode, and write to the transmit register of the DSP. This last operation initiates the autobuffer transfer.
Rev. D | Page 24 of 28
ADF4116/ADF4117/ADF4118

OUTLINE DIMENSIONS

5.10
5.00
4.90
16
4.50
4.40
4.30
PIN 1
0.15
0.05
0.65
BSC
COPLANARITY
COMPLIANT TO JEDEC STANDARDS MO-153AB
Figure 40. 16-Lead Thin Shrink Small Outline Package [TSSOP]
0.10
0.30
0.19
9
81
1.20 MAX
SEATING PLANE
6.40 BSC
0.20
0.09 8°
0.75
0.60
0.45
(RU-16)
Dimensions shown in millimeters

ORDERING GUIDE

Model Temperature Range Package Description Package Option
ADF4116BRU
ADF4116BRU-REEL
ADF4116BRU-REEL7 ADF4116BRUZ
1
ADF4116BRUZ-REEL
ADF4116BRUZ-REEL7
ADF4117BRU
ADF4117BRU-REEL
ADF4117BRU-REEL7
ADF4117BRUZ
ADF4117BRUZ-RL
ADF4117BRUZ-RL7
1
1
1
ADF4118BRU
ADF4118BRU-REEL
ADF4118BRU-REEL7
ADF4118BRUZ
ADF4118BRUZ-RL ADF4118BRUZ-RL7
ADF4118YRUZ ADF4118YRUZ-RL ADF4118YRUZ-RL7
1
1
1
1
1
1
EVAL-ADF4118EBZ1
EVAL-ADF411XEBZ1
1
Z = RoHS Compliant Part.
40°C to +85°C
40°C to +85°C
40°C to +85°C
40°C to +85°C
1
40°C to +85°C
1
40°C to +85°C
40°C to +85°C
40°C to +85°C
40°C to +85°C
40°C to +85°C
40°C to +85°C
40°C to +85°C
40°C to +85°C
40°C to +85°C
40°C to +85°C
40°C to +85°C
40°C to +85°C
40°C to +85°C
−40°C to +125°C 16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
−40°C to +125°C 16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
−40°C to +125°C 16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
1
1
16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16 16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16 16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
Evaluation Board
Evaluation Board
Rev. D | Page 25 of 28
ADF4116/ADF4117/ADF4118
NOTES
Rev. D | Page 26 of 28
ADF4116/ADF4117/ADF4118
NOTES
Rev. D | Page 27 of 28
ADF4116/ADF4117/ADF4118
NOTES
Purchase of licensed I2C components of Analog Devices or one of its sublicensed Associated Companies conveys a license for the purchaser under the Philips I2C Patent Rights to use these components in an I
2
C system, provided that the system conforms to the I2C Standard Specification as defined by Philips.
© 2000–2007 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D00392-0-4/07(D)
Rev. D | Page 28 of 28
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