The ADF4116 family of frequency synthesizers can be used
to implement local oscillators in the up-conversion and downconversion sections of wireless receivers and transmitters. They
consist of a low-noise digital PFD (Phase Frequency Detector),
a precision charge pump, a programmable reference divider,
programmable A and B counters and a dual-modulus prescaler
(P/P+1). The A (5-bit) and B (13-bit) counters, in conjunction
with the dual modulus prescaler (P/P+1), implement an N
divider (N = BP+A). In addition, the 14-bit reference counter
(R Counter), allows selectable REFIN frequencies at the PFD
input. A complete PLL (Phase-Locked Loop) can be implemented if the synthesizer is used with an external loop filter and
VCO (Voltage Controlled Oscillator).
Control of all the on-chip registers is via a simple 3-wire interface.
The devices operate with a power supply ranging from 2.7 V to
5.5 V and can be powered down when not in use.
V
CPGND
P
ADF4116/ADF4117/ADF4118
REF
CLK
DATA
RF
RFINB
IN
21-BIT
LE
A
IN
INPUT REGISTER
FROM
FUNCTION LATCH
PRESCALER
P/P +1
E
SD
OUT
N = BP + A
19
14-BIT
R COUNTER
R COUNTER
LATCH
FUNCTION
LATCH
A, B COUNTER
LATCH
13-BIT
B COUNTER
LOAD
LOAD
5-BIT
A COUNTER
14
13
5
REV. 0
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
540 MHz Output–89–89dBc/Hz typ@ 1 kHz Offset and 200 kHz PFD Frequency
10
900 MHz Output–87–87dBc/Hz typNote 15
10
900 MHz Output–90–90dBc/Hz typNote 15
11
836 MHz Output–78–78dBc/Hz typ@ 300 Hz Offset and 30 kHz PFD Frequency
12
1750 MHz Output–85–85dBc/Hz typ@ 1 kHz Offset and 200 kHz PFD Frequency
13
1750 MHz Output–65–65dBc/Hz typ@ 200 Hz Offset and 10 kHz PFD Frequency
ADF4118141960 MHz Output–84–84dBc/Hz typ@ 1 kHz Offset and 200 kHz PFD Frequency
Spurious Signals
ADF41169540 MHz Output–88/–99–88/–99dBc typ@ 200 kHz/400 kHz and 200 kHz PFD Frequency
ADF4117
ADF4118
ADF4117
ADF4118
ADF4118
10
900 MHz Output–90/–104–90/–104dBc typNote 15
10
900 MHz Output–91/–100–91/–100dBc typNote 15
11
836 MHz Output–80/–84–80/–84dBc typ@ 30 kHz/60 kHz and 30 kHz PFD Frequency
12
1750 MHz Output–88/–90–88/–90dBc typ@ 200 kHz/400 kHz and 200 kHz PFD Frequency
13
1750 MHz Output–65/–73–65/–73dBc typ@ 10 kHz/20 kHz and 10 kHz PFD Frequency
ADF4118141960 MHz Output–80/–86–80/–86dBc typ@ 200 kHz/400 kHz and 200 kHz PFD Frequency
NOTES
1
Operating temperature range is as follows: B Version: –40° C to +85°C.
2
The B Chip specifications are given as typical values.
3
This is the maximum operating frequency of the CMOS counters.
4
AVDD = DVDD = 3 V; for AVDD = DVDD = 5 V, use CMOS-compatible levels.
5
Guaranteed by design. Sample tested to ensure compliance.
6
AVDD = DVDD = 3 V; RFIN for ADF4116 = 540 MHz; RFIN for ADF4117, ADF4118 = 900 MHz.
7
The synthesizer phase noise floor is estimated by measuring the in-band phase noise at the output of the VCO and subtracting 20 log N (where N is the N divider
value).
8
The phase noise is measured with the EVAL-ADF411xEB Evaluation Board and the HP8562E Spectrum Analyzer. The spectrum analyzer provides the REFIN for
the synthesizer (f
9
f
= 10 MHz; f
REFIN
10
f
= 10 MHz; f
REFIN
11
f
= 10 MHz; f
REFIN
12
f
= 10 MHz; f
REFIN
13
f
= 10 MHz; f
REFIN
14
f
= 10 MHz; f
REFIN
15
Same conditions as above.
Specifications subject to change without notice.
= 10 MHz @ 0 dBm).
REFOUT
= 200 kHz; Offset frequency = 1 kHz; fRF = 540 MHz; N = 2700; Loop B/W = 20 kHz.
PFD
= 200 kHz; Offset frequency = 1 kHz; fRF = 900 MHz; N = 4500; Loop B/W = 20 kHz.
PFD
= 30 kHz; Offset frequency = 300 Hz; fRF = 836 MHz; N = 27867; Loop B/W = 3 kHz.
PFD
= 200 kHz; Offset frequency = 1 kHz; fRF = 1750 MHz; N = 8750; Loop B/W = 20 kHz.
PFD
= 10 kHz; Offset frequency = 200 Hz; fRF = 1750 MHz; N = 175000; Loop B/W = 1 kHz.
PFD
= 200 kHz; Offset frequency = 1 kHz; fRF = 1960 MHz; N = 9800; Loop B/W = 20 kHz.
PFD
TIMING CHARACTERISTICS
Parameter(B Version)UnitTest Conditions/Comments
t
1
t
2
t
3
t
4
t
5
t
6
NOTE
1
Guaranteed by design but not production tested.
Specifications subject to change without notice.
7
8
Limit at T
–170–170dBc/Hz typ@ 25 kHz PFD Frequency
–162–162dBc/Hz typ@ 200 kHz PFD Frequency
10ns minDATA to CLOCK Setup Time
10ns minDATA to CLOCK Hold Time
25ns minCLOCK High Duration
25ns minCLOCK Low Duration
10ns minCLOCK to LE Setup Time
20ns minLE Pulsewidth
REV. 0
–3–
ADF4116/ADF4117/ADF4118
ABSOLUTE MAXIMUM RATINGS
(TA = 25°C unless otherwise noted)
1, 2
AVDD to GND3 . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
AV
to DVDD . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +0.3 V
DD
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
V
P
V
to AVDD . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +5.5 V
P
Digital I/O Voltage to GND . . . . . . . . –0.3 V to V
Analog I/O Voltage to GND . . . . . . . . . –0.3 V to V
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
2
This device is a high-performance RF integrated circuit with an ESD rating of
< 2 kV and it is ESD sensitive. Proper precautions should be taken for handling
and assembly.
3
GND = AGND = DGND = 0 V.
TRANSISTOR COUNT
6425 (CMOS) and 303 (Bipolar).
t
3
t
4
DB1
(CONTROL BIT C2)
DB0 (LSB)
(CONTROL BIT C1)
t
6
t
5
LE
Figure 1. Timing Diagram
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the
WARNING!
ADF4116/ADF4117/ADF4118 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions
are recommended to avoid performance degradation or loss of functionality.
ADF4116BRU–40°C to +85°CThin Shrink Small Outline Package (TSSOP)RU-16
ADF4116BCP–40°C to +85°CChip Scale PackageCP-20
ADF4117BRU–40°C to +85°CThin Shrink Small Outline Package (TSSOP)RU-16
ADF4117BCP–40°C to +85°CChip Scale PackageCP-20
ADF4118BRU–40°C to +85°CThin Shrink Small Outline Package (TSSOP)RU-16
ADF4118BCP–40°C to +85°CChip Scale PackageCP-20
*Contact the factory for chip availability.
–4–
REV. 0
ADF4116/ADF4117/ADF4118
PIN FUNCTION DESCRIPTIONS
Pin No.MnemonicFunction
1FL
O
2CPCharge Pump Output. When enabled, this provides the ±I
3CPGNDCharge Pump Ground. This is the ground return path for the charge pump.
4AGNDAnalog Ground. This is the ground return path for the prescaler.
5RF
6RF
7AV
8REF
BComplementary Input to the RF Prescaler. This point should be decoupled to the ground plane with a
IN
AInput to the RF Prescaler. This small signal input is normally ac-coupled from the VCO.
IN
DD
IN
9DGNDDigital Ground.
10CEChip Enable. A logic low on this pin powers down the device and puts the charge pump output into three-
11CLKSerial Clock Input. This serial clock is used to clock in the serial data to the registers. The data is latched into
12DATASerial Data Input. The serial data is loaded MSB first with the two LSBs being the control bits. This
13LELoad Enable, CMOS Input. When LE goes high, the data stored in the shift registers is loaded into one
14MUXOUTThis multiplexer output allows either the Lock Detect, the scaled RF or the scaled Reference Frequency
15DV
16V
DD
P
Fast Lock Switch Output. This can be used to switch an external resistor to change the loop filter bandwidth. This will speed up locking of the PLL.
to the external loop filter, which in turn drives
CP
the external VCO.
small bypass capacitor, typically 100 pF. See Figure 22.
Analog Power Supply. This may range from 2.7 V to 5.5 V. Decoupling capacitors to the analog ground
plane should be placed as close as possible to this pin. AV
must be the same value as DVDD.
DD
Reference Input. This is a CMOS input with a nominal threshold of VDD/2 and an equivalent input
resistance of 100 kΩ. See Figure 21. The oscillator input can be driven from a TTL or CMOS crystal
oscillator or it can be ac-coupled.
state mode. Taking the pin high will power up the device depending on the status of the power-down bit F2.
the 21-bit shift register on the CLK rising edge. This input is a high impedance CMOS input.
input is a high impedance CMOS input.
of the four latches, the latch being selected using the control bits.
to be accessed externally.
Digital Power Supply. This may range from 2.7 V to 5.5 V. Decoupling capacitors to the digital ground
plane should be placed as close as possible to this pin. DV
must be the same value as AVDD.
DD
Charge Pump Power Supply. This should be greater than or equal to VDD. In systems where VDD is 3 V,
it can be set to 5 V and used to drive a VCO with a tuning range of up to 6 V.
REV. 0
FL
CPGND
AGND
RFINB
RFINA
AV
REF
O
CP
DD
IN
TSSOP
1
2
ADF4116
3
ADF4117
ADF4118
4
TOP VIEW
5
(Not to Scale)
6
7
8
16
15
14
13
12
11
10
9
V
P
DV
DD
MUXOUT
LE
DATA
CLK
CE
DGND
PIN CONFIGURATIONS
–5–
Chip Scale Package
CP
2019181716
1
CPGND
ADF4116
2
AGND
AGND
RF
IN
RF
IN
B
A
3
4
5
6
AVDDAV
ADF4117
ADF4118
TOP VIEW
(Not to Scale)
FLOVPDVDDDV
7
8
9
10
IN
DD
REF
DGND
DGND
DD
15
14
13
12
11
MUXOUT
LE
DATA
CLK
CE
ADF4116/ADF4117/ADF4118
–Typical Performance Characteristics
Table I. S-Parameter Data for the ADF4118 RF Input
Figure 14. ADF4118 Phase Noise (Referred to CP Output) vs. PFD Frequency
–60
VDD = 3V
= 5V
V
–70
–80
–90
FIRST REFERENCE SPUR – dBc
–100
–40
–20020406080100
TEMPERATURE –
ⴗ
P
C
Figure 16. ADF4118 Reference Spurs vs. Temperature
(900 MHz, 200 kHz, 20 kHz)
–15
–25
–35
–45
–55
–65
–75
FIRST REFERENCE SPUR – dBc
–85
–95
–105
5
–5
0
1
2345
TURNING VOLTAGE
VDD = 3V
= 5V
V
P
Figure 17. ADF4118 Reference Spurs (200 kHz) vs.
(900 MHz, 200 kHz, 20 kHz)
V
TUNE
–60
VDD = 3V
= 5V
V
P
C
–70
–80
PHASE NOISE – dBc/Hz
–90
–100
–40
–200 204060 80100
TEMPERATURE –
ⴗ
Figure 15. ADF4118 Phase Noise vs. Temperature
(900 MHz, 200 kHz, 20 kHz)
–8–
–60
–70
–80
PHASE NOISE – dBc/Hz
–90
0 20406080100
TEMPERATURE –
ⴗ
C
VDD = 3V
= 5V
V
P
Figure 18. ADF4118 Phase Noise vs. Temperature
(836 MHz, 30 kHz, 3 kHz)
REV. 0
–60
0
DI
DD
– mA
0.0
PRESCALER OUTPUT FREQUENCY – MHz
50100150200
0.5
1.0
1.5
2.0
2.5
3.0
VDD = 3V
= 5V
V
P
–70
–80
–90
FIRST REFERENCE SPUR – dBc
–100
0 20406080100
TEMPERATURE –
ⴗ
C
Figure 19. ADF4118 Reference Spurs vs. Temperature
(836 MHz, 30 kHz, 3 kHz)
ADF4116/ADF4117/ADF4118
Figure 20. DIDD vs. Prescaler Output Frequency
(ADF4116, ADF4117, ADF4118)
CIRCUIT DESCRIPTION
REFERENCE INPUT SECTION
The reference input stage is shown below in Figure 21. SW1
and SW2 are normally-closed switches. SW3 is normally-open.
When power-down is initiated, SW3 is closed and SW1 and SW2
are opened. This ensures that there is no loading of the REF
IN
pin on power-down.
POWER-DOWN
CONTROL
100k⍀
NC
REF
SW1
NO
SW2
SW3
IN
NC
BUFFER
TO R COUNTER
Figure 21. Reference Input Stage
RF INPUT STAGE
The RF input stage is shown in Figure 22. It is followed by a 2stage limiting amplifier to generate the CML clock levels needed
for the prescaler.
1.6V
AV
DD
500⍀500⍀
RFINA
RF
IN
BIAS
GENERATOR
B
A AND B COUNTERS
The A and B CMOS counters combine with the dual modulus
prescaler to allow a wide ranging division ratio in the PLL
feedback counter. The counters are specified to work when the
prescaler output is 200 MHz or less.
Pulse Swallow Function
The A and B counters, in conjunction with the dual modulus
prescaler make it possible to generate output frequencies which
are spaced only by the Reference Frequency divided by R. The
equation for the VCO frequency is as follows:
f
f
VCO
= [(P × B) + A] × f
VCO
Output Frequency of external voltage controlled oscilla-
REFIN
/R
tor (VCO).
PPreset modulus of dual modulus prescaler.
BPreset Divide Ratio of binary 13-bit counter (3 to 8191).
APreset Divide Ratio of binary 5-bit swallow counter
(0 to 31).
f
Output frequency of the external reference frequency
REFIN
oscillator.
RPreset divide ratio of binary 14-bit programmable refer-
ence counter (1 to 16383).
R COUNTER
The 14-bit R counter allows the input reference frequency to be
divided down to produce the input clock to the phase frequency
detector (PFD). Division ratios from 1 to 16,383 are allowed.
AGND
Figure 22. RF Input Stage
PRESCALER (P/P + 1)
The dual modulus prescale (P/P + 1), along with the A and B
counters, enables the large division ratio, N, to be realized, (N =
FROM RF
INPUT STAGE
MODULUS
CONTROL
N = BP + A
PRESCALER
P/P + 1
13-BIT B
COUNTER
LOAD
LOAD
5-BIT A
COUNTER
TO PFD
PB + A). The dual-modulus prescaler takes the CML clock
from the RF input stage and divides it down to a manageable
frequency for the CMOS A and B counters. The prescaler is
Figure 23. A and B Counters
programmable. It can be set in software to 8/9 for the
ADF4116, and set to 32/33 for the ADF4117 and ADF4118.
It is based on a synchronous 4/5 core.
REV. 0
–9–
ADF4116/ADF4117/ADF4118
PHASE FREQUENCY DETECTOR (PFD) AND CHARGE
PUMP
The PFD takes inputs from the R counter and N counter and
produces an output proportional to the phase and frequency
difference between them. Figure 24 is a simplified schematic.
The PFD includes a fixed delay element which sets the width of
the antibacklash pulse. This is typically 3 ns. This pulse ensures
that there is no dead zone in the PFD transfer function and
gives a consistent reference spur level.
V
P
CHARGE
PUMP
UP
Q1D1
U1
CP
DELAY
DOWN
Q2D2
U2
U3
CP GND
R DIVIDER
N DIVIDER
R DIVIDER
N DIVIDER
CP OUTPUT
HI
CLR1
CLR2
HI
Figure 24. PFD Simplified Schematic and Timing (In Lock)
MUXOUT AND LOCK DETECT
The output multiplexer on the ADF4116 family allows the
user to access various internal points on the chip. The state of
MUXOUT is controlled by M3, M2 and M1 in the function
latch. Table VI shows the full truth table. Figure 25 shows the
MUXOUT section in block diagram form.
DV
DD
ANALOG LOCK DETECT
DIGITAL LOCK DETECT
R COUNTER OUTPUT
N COUNTER OUTPUT
SDOUT
CONTROLMUX
MUXOUT
DGND
Figure 25. MUXOUT Circuit
Lock Detect
MUXOUT can be programmed for two types of lock detect:
Digital Lock Detect and Analog Lock Detect.
Digital Lock Detect is active high. It is set high when the phase
error on three consecutive phase detector cycles is less than 15 ns.
It will stay set high until a phase error of greater than 25 ns is
detected on any subsequent PD cycle.
The N-channel open-drain analog lock detect should be operated with an external pull-up resistor of 10 kΩ nominal. When
lock has been detected it is high with narrow low-going pulses.
INPUT SHIFT REGISTER
The ADF4116 family digital section includes a 21-bit input shift
register, a 14-bit R counter and a˙`-bit N counter, comprising
a 5-bit A counter and a 13-bit B counter. Data is clocked into
the 21-bit shift register on each rising edge of CLK. The data is
clocked in MSB first. Data is transferred from the shift register
to one of four latches on the rising edge of LE. The destination
latch is determined by the state of the two control bits (C2, C1)
in the shift register. These are the two LSBs DB1, DB0 as
shown in the timing diagram of Figure 1. The truth table for
these bits is shown in Table VII. Table II shows a summary
of how the latches are programmed.
Table II. C2, C1 Truth Table
Control Bits
C2C1Data Latch
00R Counter
01N Counter (A and B)
10Function Latch
11Initialization Latch
With C2, C1 set to 1, 0, the on-chip function latch will be programmed. Table VI shows the input data format for programming
the Function Latch.
Counter Reset
DB2 (F1) is the counter reset bit. When this is “1,” the R counter
and the A, B counters are reset. For normal operation this bit
should be “0.” Upon powering up, the F1 bit needs to be disabled,
the N counter resumes counting in “close” alignment with the R counter.
(The maximum error is one prescaler cycle.)
Power-Down
DB3 (PD1) and DB19 (PD2) on the ADF4116 family, provide
programmable power-down modes. They are enabled by the
CE pin.
When the CE pin is low, the device is immediately disabled
regardless of the states of PD2, PD1.
In the programmed asynchronous power-down, the device powers down immediately after latching a “1” into bit PD1, with the
condition that PD2 has been loaded with a “0.”
In the programmed synchronous power-down, the device power
down is gated by the charge pump to prevent unwanted frequency jumps. Once the power-down is enabled by writing a
“1” into bit PD1 (on condition that a “1” has also been loaded
to PD2), then the device will go into power-down after the first
successive charge pump event.
When a power down is activated (either synchronous or asynchronous mode including CE-pin-activated power down), the
following events occur:
All active dc current paths are removed.
The R, N and timeout counters are forced to their load state
conditions.
The charge pump is forced into three-state mode.
The digital clock detect circuitry is reset.
The RF
input is debiased.
IN
The oscillator input buffer circuitry is disabled.
The input register remains active and capable of loading and
latching data.
MUXOUT Control
The on-chip multiplexer is controlled by M3, M2, M1 on the
ADF4116 family. Table VI shows the truth table.
Phase Detector Polarity
DB7 (F2) of the function latch sets the Phase Detector Polarity.
When the VCO characteristics are positive this should be set to
“1.” When they are negative it should be set to “0.”
Charge Pump Three-State
This bit puts the charge pump into three-state mode when programmed to a “1.” It should be set to “0” for normal operation.
Fastlock Enable Bit
DB9 of the Function Latch is the Fastlock Enable Bit. Only
when this is “1” is Fastlock enabled.
Fastlock Mode Bit
DB11 of the Function Latch is the Fastlock Mode bit. When
Fastlock is enabled, this bit determines which Fastlock Mode is
used. If the Fastlock Mode bit is “0” then Fastlock Mode 1 is
selected and if the Fastlock Mode bit is “1,” then Fastlock
Mode 2 is selected.
If Fastlock is not enabled (DB9 = “0”), then DB11 (ADF4116)
determines the state of the FLO output. FLO state will be the
same as that programmed to DB11.
Fastlock Mode 1
In the ADF4116 family, the output level of FLO is programmed
to a low state and the charge pump current is switched to the
high value (1 mA). FL
is used to switch a resistor in the loop
O
filter and ensure stability while in Fastlock by altering the loop
bandwidth.
The device enters Fastlock by having a “1” written to the CP
Gain bit in the N register. The device exits Fastlock by having a
“0” written to the CP Gain bit in the N register.
Fastlock Mode 2
In the ADF4116 family, the output level of FLO is programmed
to a low state and the charge pump current is switched to the high
value (1 mA). FL
is used to switch a resistor in the loop filter and
O
ensure stability while in Fastlock by altering the loop bandwidth.
The device enters Fastlock by having a “1” written to the CP
Gain bit in the N register. The device exits Fastlock under the
control of the Timer Counter. After the timeout period determined by the value in TC4–TC1, the CP Gain bit in the N
register is automatically reset to “0” and the device reverts to
normal mode instead of Fastlock.
Timer Counter Control
In the ADF4116 family, the user has the option of switching
between two charge pump current values to speed up locking to
a new frequency.
When using the Fastlock feature with the ADF4116 family, the
normal sequence of events is as follows:
The user must make sure that Fastlock is enabled. Set DB9 of the
ADF4116 family to “1.” The user must also choose which Fastlock
Mode to use. As discussed in the previous section, Fastlock
Mode 2 uses the values in the Timer Counter to determine the
timeout period before reverting to normal mode operation after
Fastlock. Fastlock Mode 2 is chosen by setting DB11 of the
ADF4116 family to “1.”
The user must also decide how long they want the high current
(1 mA) to stay active before reverting to low current (250 µA).
This is controlled by the Timer Counter Control Bits DB14 to
DB11 (TC4–TC1) in the Function Latch. The truth table is
given in Table VI.
Now, when the user wishes to program a new output frequency,
they can simply program the A, B counter latch with new values
for A and B. At the same time they can set the CP Gain bit to a
“1,” which sets the charge pump 1 mA for a period of time determined by TC4–TC1. When this time is up, the charge pump
current reverts to 250 µA. At the same time the CP Gain Bit in
the A, B Counter latch is reset to 0 and is now ready for the
next time that the user wishes to change the frequency again.
–16–
REV. 0
ADF4116/ADF4117/ADF4118
The Initialization Latch
When C2, C1 = 1, 1 then the Initialization Latch is programmed.
This is essentially the same as the Function Latch (programmed
when C2, C1 = 1, 0).
However, when the Initialization Latch is programmed there is a
additional internal reset pulse applied to the R and N counters.
This pulse ensures that the N counter is at load point when the
N counter data is latched and the device will begin counting in
close phase alignment.
If the Latch is programmed for synchronous power-down (CE
pin is High; PD1 bit is High; PD2 bit is Low), the internal pulse
also triggers this power-down. The prescaler reference and the
oscillator input buffer are unaffected by the internal reset pulse and
so close phase alignment is maintained when counting resumes.
When the first N counter data is latched after initialization, the
internal reset pulse is again activated. However, successive N
counter loads after this will not trigger the internal reset pulse.
Device Programming After Initial Power-Up
After initially powering up the device, there are three ways to
program the device.
Initialization Latch Method
Apply VDD.
Program the Initialization Latch (“11” in 2 LSBs of input word).
Make sure that F1 bit is programmed to “0.” Then do an R load
(“00” in 2 LSBs). Then do an N load (“01” in 2 LSBs). When the
Initialization Latch is loaded, the following occurs:
1. The function latch contents are loaded.
2. An internal pulse resets the R, N and timeout counters to
load state conditions and also three-states the charge pump.
Note that the prescaler bandgap reference and the oscillator
input buffer are unaffected by the internal reset pulse,
allowing close phase alignment when counting resumes.
3. Latching the first N counter data after the initialization word
will activate the same internal reset pulse. Successive N loads
will not trigger the internal reset pulse unless there is another
initialization.
The CE Pin Method
Apply VDD.
Bring CE low to put the device into power-down. This is an
asynchronous power-down in that it happens immediately.
Program the Function Latch (10). Program the R Counter
Latch (00). Program the N Counter Latch (01). Bring CE high
to take the device out of power-down. The R and N counter will
now resume counting in close alignment.
Note that after CE goes high, a duration of 1 µs may be required
for the prescaler bandgap voltage and oscillator input buffer bias
to reach steady state.
CE can be used to power the device up and down in order to
check for channel activity. The input register does not need to
be reprogrammed each time the device is disabled and enabled
as long as it has been programmed at least once after V
initially applied.
The Counter Reset Method
Apply VDD.
Do a Function Latch Load (“10” in 2 LSBs). As part of this,
load “1” to the F1 bit. This enables the counter reset. Do an R
Counter Load (“00” in 2 LSBs). Do an N Counter Load (“01”
in 2 LSBs). Do a Function Latch Load (“10” in 2 LSBs). As
part of this, load “0” to the F1 bit. This disables the counter reset.
This sequence provides the same close alignment as the initialization method. It offers direct control over the internal reset.
Note that counter reset holds the counters at load point and
three-states the charge pump, but does not trigger synchronous
power-down. The counter reset method requires an extra function latch load compared to the initialization latch method.
CC
was
REV. 0
–17–
ADF4116/ADF4117/ADF4118
APPLICATIONS SECTION
Local Oscillator for GSM Base Station Transmitter
Figure 26 shows the ADF4117/ADF4118 being used with a
VCO to produce the LO for a GSM base station transmitter.
The reference input signal is applied to the circuit at FREF
IN
and, in this case, is terminated in 50 Ω. Typical GSM system
would have a 13 MHz TCXO driving the Reference Input
without any 50 Ω termination. In order to have a channel
spacing of 200 kHz (the GSM standard), the reference input
must be divided by 65, using the on-chip reference divider of
the ADF4117/ADF1118.
The charge pump output of the ADF4117/ADF1118 (Pin 2)
drives the loop filter. In calculating the loop filter component
values, a number of items need to be considered. In this example,
the loop filter was designed so that the overall phase margin for
the system would be 45 degrees. Other PLL system specifications are given below:
K
= 1 mA
D
= 12 MHz/V
K
V
Loop Bandwidth = 20 kHz
F
= 200 kHz
REF
N = 4500
Extra Reference Spur Attenuation = 10 dB
All of these specifications are needed and used to come up with
the loop filter components values shown in Figure 27.
The loop filter output drives the VCO, which, in turn, is fed
back to the RF input of the PLL synthesizer and also drives
the RF Output terminal. A T-circuit configuration provides
50 Ω matching between the VCO output, the RF output and
the RF
terminal of the synthesizer.
IN
In a PLL system, it is important to know when the system is in
lock. In Figure 26, this is accomplished by using the MUXOUT
signal from the synthesizer. The MUXOUT pin can be programmed to monitor various internal signals in the synthesizer.
One of these is the LD or lock-detect signal.
SHUTDOWN CIRCUIT
The attached circuit in Figure 27 shows how to shut down both
the ADF4116 family and the accompanying VCO. The ADG702
switch goes open circuit when a Logic 1 is applied to the IN
input. The low-cost switch is available in both SOT-23 and
micro SOIC packages.
DIRECT CONVERSION MODULATOR
In some applications a direct conversion architecture can be used
in base station transmitters. Figure 28 shows the combination
available from ADI to implement this solution.
The circuit diagram shows the AD9761 being used with the
AD8346. The use of dual integrated DACs such as the AD9761
with specified ±0.02 dB and ± 0.004 dB gain and offset matching characteristics ensures minimum error contribution (over
temperature) from this portion of the signal chain.
The Local Oscillator (LO) is implemented using the ADF4117/
ADF4118. In this case, the OSC 3B1-13M0 provides the
stable 13 MHz reference frequency. The system is designed
for a 200 kHz channel spacing and an output center frequency
of 1960 MHz. The target application is a WCDMA base station transmitter. Typical phase noise performance from this LO
is –85 dBc/Hz at a 1 kHz offset. The LO port of the AD8346 is
driven in single-ended fashion. LOIN is ac-coupled to ground
with the 100 pF capacitor and LOIP is driven through the accoupling capacitor from a 50 Ω source. An LO drive level of
between –6 dBm and –12 dBm is required. The circuit of Figure
28 gives a typical level of –8 dBm.
The RF output is designed to drive a 50 Ω load but must be
ac-coupled as shown in Figure 28. If the I and Q inputs are driven
in quadrature by 2 V p-p signals, the resulting output power will
be around –10 dBm.
FREF
1000pF
IN
1000pF
51⍀
SPI-COMPATIBLE SERIAL BUS
8
V
71516
AVDDDV
REF
ADF4117/
CE
CLK
DATA
LE
CPGND
34 9
DD
DD
IN
FL
ADF4118
MUXOUT
RFINA
RFINB
AGND
V
V
P
CP
O
DGND
P
2
14
100pF
6
5
3.3k⍀
0.15nF
10k⍀
LOCK
DETECT
100pF
27k⍀
1.5nF
51⍀
DECOUPLING CAPACITORS (10F/10pF) ON AVDD, DVDD, VP OF THE
ADF4117/ADF4118 AND ON V
OMITTED FROM THE DIAGRAM TO AID CLARITY.
V
CC
VCO190-902T
620pF
OF THE VCO190-902T HAVE BEEN
CC
Figure 26. Local Oscillator for GSM Base Station
–18–
100pF
100pF
18⍀
RF
18⍀
18⍀
OUT
REV. 0
ADF4116/ADF4117/ADF4118
V
P
FREF
IN
MODULATED
DIGITAL
DATA
OSC 3B1-13M0
TCXO
SERIAL
DIGITAL
NTERFACE
REFIO
AD9761
T
FS ADJ
2k⍀
REF
V
DD
71516
AVDDDV
8
REF
IN
ADF4116/
ADF4117/
ADF4118
CPGND
349
0.1F
IOUTA
IOUTB
DAC
X
QOUTA
QOUTB
R
SET
IN
ADF4118
RFINARFINB
POWER-DOWN CONTROL
V
CE
DD
P
2
CP
1
FL
O
6
RFINA
5
RF
B
IN
DGND
AGND
LOOP
FILTER
10k⍀
100pF
51⍀
100pF
DECOUPLING CAPACITORS AND INTERFACE SIGNALS HAVE
BEEN OMITTED FROM THE DIAGRAM TO AID CLARITY.
IN
V
GND
S
ADG702
D
CC
VCO
Figure 27. Local Oscillator Shutdown Circuit
IBBP
IBBP
QBBP
QBBP
LOINLOIP
100pF
100pF
18⍀
CP
680pF
LOW-PASS
FILTER
LOW-PASS
FILTER
10k⍀
1k⍀
18pF
6.8nF
VCO190-1960T
V
DD
GND
AD8346
18⍀
100pF
100pF
18⍀
VOUT
100pF
18⍀
100pF
RF
18⍀
18⍀
OUT
RF
OUT
100pF
100pF
51⍀
POWER SUPPLY CONNECTIONS AND DECOUPLING CAPACITORS
ARE OMITTED FROM DIAGRAM FOR CLARITY.
Figure 28. Direct Conversion Transmitter Solution
INTERFACING
The ADF4116 family has a simple SPI-compatible serial interface for writing to the device. SCLK, SDATA and LE control
the data transfer. When LE (Latch Enable) goes high, the 24 bits
which have been clocked into the input register on each rising
edge of SCLK will get transferred to the appropriate latch. See
Figure 1 for the Timing Diagram and Table II for the Latch
Truth Table.
REV. 0
–19–
The maximum allowable serial clock rate is 20 MHz. This means
that the maximum update rate possible for the device is 833 kHz or
one update every 1.2 microseconds. This is certainly more than
adequate for systems which will have typical lock times in hundreds of microseconds.
ADF4116/ADF4117/ADF4118
ADuC812 Interface
Figure 29 shows the interface between the ADF4116 family and
the ADuC812 microconverter. Since the ADuC812 is based on
an 8051 core, this interface can be used with any 8051-based
microcontroller. The microconverter is set up for SPI Master
Mode with CPHA = 0. To initiate the operation, the I/O port
driving LE is brought low. Each latch of the ADF4116 family
needs a 24-bit word. This is accomplished by writing three 8-bit
bytes from the microconverter to the device. When the third
byte has been written the LE input should be brought high to
complete the transfer.
SCLK
SDATA
ADF4116/
LE
ADF4117/
ADF4118
CE
MUXOUT
(LOCK DETECT)
ADuC812
SCLOCK
MOSI
I/O PORTS
Figure 29. ADuC812 to ADF4116 Family Interface
On first applying power to the ADF4116 family, it needs three
writes (one each to the R counter latch, the N counter latch and
the initialization latch) for the output to become active.
I/O port lines on the ADuC812 are also used to control powerdown (CE input) and to detect lock (MUXOUT configured as
lock detect and polled by the port input).
When operating in the mode described, the maximum SCLOCK
rate of the ADuC812 is 4 MHz. This means that the maximum
rate at which the output frequency can be changed will be 166 kHz.
ADSP-2181 Interface
Figure 30 shows the interface between the ADF4116 family and
the ADSP-21xx Digital Signal Processor. The ADF4116 family
needs a 21-bit serial word for each latch write. The easiest way
to accomplish this using the ADSP-21xx family is to use the
Autobuffered Transmit Mode of operation with Alternate Framing. This provides a means for transmitting an entire block of
serial data before an interrupt is generated.
SCLK
SDATA
ADF4116/
LE
ADF4117/
ADF4118
CE
MUXOUT
(LOCK DETECT)
ADSP-21xx
I/O FLAGS
SCLK
DT
TFS
Figure 30. ADSP-21xx to ADF4116 Family Interface
Set up the word length for 8 bits and use three memory locations for each 24-bit word. To program each 21-bit latch, store
the three 8-bit bytes, enable the Autobuffered mode and then
write to the transmit register of the DSP. This last operation
initiates the autobuffer transfer.
C3767–5–4/00 (rev. 0)
0.159 (4.05)
0.157 (4.00)
0.156 (3.95)
0.039 (1.00)
0.035 (0.90)
0.031 (0.80)
SEATING
PLANE
Chip Scale
(CP-20)
0.159 (4.05)
0.157 (4.00)
0.156 (3.95)
TOP VIEW
0.0079 (0.20)
REF
CONTROLLING DIMENSIONS ARE IN MILLIMETERS
0.020 (0.5) REF
0.0083 (0.211)
0.0079 (0.200)
0.0077 (0.195)
0.018 (0.45)
0.016 (0.40)
0.014 (0.35)
0.016 (0.40)
0.014 (0.35)
DETAIL E
LEAD PITCH
LEAD OPTION
DETAIL E
0.011 (0.275)
0.010 (0.250)
0.009 (0.225)
0.0059 (0.15)
REF
0.079 (2.0) REF
16
15
11
BOTTOM VIEW
(ROTATED 180ⴗ)
0.0059
(0.15)
REF
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
0.014 (0.35) ⴛ 45°0.018 (0.45)
20
1
0.079
(2.0)
REF
5
610
SEATING
16
PIN 1
0.006 (0.15)
0.002 (0.05)
0.0256 (0.65)
PLANE
Thin Shrink Small Outline
(RU-16)
0.201 (5.10)
0.193 (4.90)
9
0.177 (4.50)
0.169 (4.30)
0.256 (6.50)
0.246 (6.25)
MAX
0.0079 (0.20)
0.0035 (0.090)
BSC
81
0.0433 (1.10)
0.0118 (0.30)
0.0075 (0.19)
8ⴗ
0ⴗ
0.028 (0.70)
0.020 (0.50)
PRINTED IN U.S.A.
–20–
REV. 0
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