2.7 V to 3.3 V Power Supply
Separate Charge Pump Supply (V
) Allows Extended
P
Tuning Voltage in 3 V Systems
Programmable Dual Modulus Prescaler
8/9, 16/17, 32/33, 64/65
Programmable Charge Pump Currents
Programmable Anti-Backlash Pulsewidth
3-Wire Serial Interface
Analog and Digital Lock Detect
Hardware and Software Power-Down Mode
APPLICATIONS
Broadband Wireless Access
Instrumentation
Wireless LANS
Base Stations For Wireless Radio
FUNCTIONAL BLOCK DIAGRAM
AV
DV
DD
DD
REF
IN
14-BIT
R COUNTER
14
GENERAL DESCRIPTION
The ADF4106 frequency synthesizer can be used to implement
local oscillators in the up-conversion and down-conversion
sections of wireless receivers and transmitters. It consists of a
low-noise digital PFD (Phase Frequency Detector), a precision
charge pump, a programmable reference divider, programmable
A and B counters and a dual-modulus prescaler (P/P + 1). The
A (6-bit) and B (13-bit) counters, in conjunction with the dual
modulus prescaler (P/P + 1), implement an N divider (N = BP + A).
In addition, the 14-bit reference counter (R Counter), allows
selectable REFIN frequencies at the PFD input. A complete
PLL (Phase-Locked Loop) can be implemented if the synthesizer is used with an external loop filter and VCO (Voltage
Controlled Oscillator). Its very high bandwidth means that
frequency doublers can be eliminated in many high-frequency
systems, simplifying system architecture and lowering cost.
V
P
PHASE
FREQUENCY
DETECTOR
CPGND
REFERENCE
CHARGE
PUMP
R
SET
CP
R COUNTER
LATCH
CLK
DATA
LE
RFINA
RF
B
IN
REV. 0
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices.
–174–174dBc/Hz typ@ 25 kHz PFD Frequency
–166–166dBc/Hz typ@ 200 kHz PFD Frequency
Phase Noise Performance
900 MHz Output
5800 MHz Output
5800 MHz Output
Spurious Signals
900 MHz Output
5800 MHz Output
5800 MHz Output
NOTES
1
Operating temperature range (B Version) is –40°C to +85°C.
2
The BChip specifications are given as typical values.
3
Use a square wave for lower frequencies, below the mimimum stated.
4
This is the maximum operating frequency of the CMOS counters. The prescaler value should be chosen to ensure that the RF input is divided down to a frequency
that is less than this value.
5
AVDD = DVDD = 3 V
6
Guaranteed by design. Sample tested to ensure compliance.
7
TA = 25°C; AVDD = DVDD = 3 V; P = 16; RFIN = 6.0 GHz
8
TA = 25°C; AVDD = DVDD = 3.3 V; R = 16383; A = 63; B = 891; P = 32; RFIN = 6.0 GHz
9
The synthesizer phase noise floor is estimated by measuring the in-band phase noise at the output of the VCO and subtracting 20logN (where N is the N divider value).
10
The phase noise is measured with the EVAL-ADF4106EB1 Evaluation Board and the HP8562E Spectrum Analyzer. The spectrum analyzer provides the REFIN for
the synthesizer (f
11
f
= 10 MHz; f
REFIN
12
f
= 10 MHz; f
REFIN
13
f
= 10 MHz; f
REFIN
Specifications subject to change without notice.
REFOUT
= 200 kHz; Offset Frequency = 1 kHz; fRF = 900 MHz; N = 4500; Loop B/W = 20 kHz
PFD
= 200 kHz; Offset Frequency = 1 kHz; fRF = 5800 MHz; N = 29000; Loop B/W = 20 kHz
PFD
= 1 MHz; Offset Frequency = 1 kHz; fRF = 5800 MHz; N = 5800; Loop B/W = 100 kHz
PFD
10
11
12
13
11
12
13
= 10 MHz @ 0 dBm).
–159–159dBc/Hz typ@ 1 MHz PFD Frequency
@ VCO Output
–93–93dBc/Hz typ@ 1 kHz Offset and 200 kHz PFD Frequency
–74–74dBc/Hz typ@ 1 kHz Offset and 200 kHz PFD Frequency
–84–84dBc/Hz typ@ 1 kHz Offset and 1 MHz PFD Frequency
–90/–92–90/–92dBc typ@ 200 kHz/400 kHz and 200 kHz PFD Frequency
–65/–70–65/–70dBc typ@ 200 kHz/400 kHz and 200 kHz PFD Frequency
–70/–75–70/–75dBc typ@ 1 MHz/2 MHz and 1 MHz PFD Frequency
10ns minDATA to CLOCK Setup Time
10ns minDATA to CLOCK Hold Time
25ns minCLOCK High Duration
25ns minCLOCK Low Duration
10ns minCLOCK to LE Setup Time
20ns minLE Pulsewidth
t
t
3
4
CLOCK
DATA
LE
LE
DB23 (MSB)
t
t
2
1
DB22
DB2
DB1 (CONTROL
BIT C2)
DB0 (LSB)
(CONTROL BIT C1)
t
5
t
6
REV. 0
Figure 1. Timing Diagram
–3–
ADF4106
WARNING!
ESD SENSITIVE DEVICE
ABSOLUTE MAXIMUM RATINGS
(TA = 25°C unless otherwise noted.)
1, 2
AVDD to GND3 . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +3.6 V
AV
to DVDD . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +0.3 V
DD
to GND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +5.3 V
V
P
V
to AVDD . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +5.5 V
P
Digital I/O Voltage to GND . . . . . . . . –0.3 V to V
Analog I/O Voltage to GND . . . . . . . . . –0.3 V to V
REF
, RFINA, RFINB to GND . . . . . . –0.3 V to VDD + 0.3 V
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
2
This device is a high-performance RF integrated circuit with an ESD rating of
<2 kV and it is ESD sensitive. Proper precautions should be taken for handling and
assembly.
3
GND = AGND = DGND = 0 V
ORDERING GUIDE
ModelTemperature RangePackage Option*
ADF4106BRU–40°C to +85°CRU-16
ADF4106BCP–40°C to +85°CCP-20
*RU = Thin Shrink Small Outline Package (TSSOP)
CP = Chip Scale Package
Contact the factory for chip availability.
Note that aluminum bond wire should not be used with the ADF4106 die.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
ADF4106 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are recommended
to avoid performance degradation or loss of functionality.
–4–
REV. 0
PIN CONFIGURATIONS
ADF4106
R
SET
CP
CPGND
AGND
RF
IN
RF
IN
AV
REF
B
A
DD
IN
TSSOP
1
2
3
ADF4106
4
TOP VIEW
5
(Not to Scale)
6
7
8
16
V
15
DV
14
MUXOUT
13
LE
12
DATA
11
CLK
10
CE
9
DGND
P
DD
NOTE: TRANSISTOR COUNT 6425 (CMOS), 303 (BIPOLAR)
Chip Scale Package
SET
20 CP
19 R
CPGND 1
AGND 2
AGND 3
RFINB 4
A 5
RF
IN
PIN 1
INDICATOR
ADF4106
TOP VIEW
6
7
DD
DD
AV
AV
18 VP17 DVDD16 DV
8
IN
REF
DGND 9
DD
15 MUXOUT
14 LE
13 DATA
12 CLK
11 CE
DGND 10
PIN FUNCTION DESCRIPTIONS
MnemonicFunction
R
SET
CPCharge Pump Output. When enabled this provides ±I
Connecting a resistor between this pin and CPGND sets the maximum charge pump output current. The nominal
voltage potential at the R
So, with R
= 5.1 kΩ, I
SET
pin is 0.6 V. The relationship between ICP and R
SET
25 5.
=
R
SET
to the external loop filter, which in turn drives the
CP
CPMAX
= 5 mA.
I
CP MAX
SET
is
external VCO.
CPGNDCharge Pump Ground. This is the ground return path for the charge pump.
AGNDAnalog Ground. This is the ground return path of the prescaler.
RF
BComplementary Input to the RF Prescaler. This point must be decoupled to the ground plane with a small bypass
IN
capacitor, typically 100 pF. See Figure 3.
RF
AInput to the RF Prescaler. This small signal input is ac coupled to the external VCO.
IN
AV
REF
DD
IN
Analog Power Supply. This may range from 2.7 V to 3.3 V. Decoupling capacitors to the analog ground plane
should be placed as close as possible to this pin. AV
must be the same value as DVDD.
DD
Reference Input. This is a CMOS input with a nominal threshold of VDD/2 and a dc equivalent input resistance of
100 kΩ. See Figure 2. This input can be driven from a TTL or CMOS crystal oscillator or it can be ac coupled.
DGNDDigital Ground
CEChip Enable. A logic low on this pin powers down the device and puts the charge pump output into three-state
mode. Taking the pin high will power up the device depending on the status of the power-down bit F2.
CLKSerial Clock Input. This serial clock is used to clock in the serial data to the registers. The data is latched into the
24-bit shift register on the CLK rising edge. This input is a high impedance CMOS input.
DATASerial Data Input. The serial data is loaded MSB first with the two LSBs being the control bits. This input is a
high impedance CMOS input.
LELoad Enable, CMOS Input. When LE goes high, the data stored in the shift registers is loaded into one of the four
latches, the latch being selected using the control bits.
MUXOUTThis multiplexer output allows either the Lock Detect, the scaled RF or the scaled Reference Frequency to be
accessed externally.
DV
V
P
DD
Digital Power Supply. This may range from 2.7 V to 3.3 V. Decoupling capacitors to the digital ground plane
should be placed as close as possible to this pin. DV
must be the same value as AVDD.
DD
Charge Pump Power Supply. This should be greater than or equal to VDD. In systems where VDD is 3 V, it can be
set to 5 V and used to drive a VCO with a tuning range of up to 5 V.
TPC 11. Phase Noise (referred to CP output) vs.
PFD Frequency
–60
–70
–80
PHASE NOISE – dBc/Hz
TPC 9. Phase Noise (5.8 GHz, 1 MHz, and 100 kHz) vs.
Temperature
REV. 0
–90
–100
–40100–20
020406080
TEMPERATURE – C
VDD = 3V
VP = 5V
TPC 12. AIDD vs. Prescaler Value
–7–
ADF4106
3.5
VDD = 3V
= 3V
V
P
3.0
2.5
2.0
– mA
DD
1.5
DI
1.0
0.5
0
50300100
150200250
PRESCALER OUTPUT FREQUENCY
TPC 13. DIDD vs. Prescaler Output Frequency
CIRCUIT DESCRIPTION
REFERENCE INPUT SECTION
The Reference Input stage is shown in Figure 2. SW1 and SW2
are normally-closed switches. SW3 is normally-open. When
Powerdown is initiated, SW3 is closed and SW1 and SW2 are
opened. This ensures that there is no loading of the REF
IN
pin
on power-down.
POWER-DOWN
CONTROL
100k
NC
REF
SW2
IN
NC
SW1
NO
SW3
BUFFER
NC = NO CONNECT
TO R COUNTER
Figure 2. Reference Input Stage
RF INPUT STAGE
The RF input stage is shown in Figure 3. It is followed by a 2-stage
limiting amplifier to generate the CML clock levels needed for the
prescaler.
500
1.6V
500
AV
DD
RF
RF
BIAS
GENERATOR
A
IN
B
IN
6
– mA
CP
I
–2
–4
–6
4
2
0
05.00.5
1.01.5 2.02.53.0 3.5 4.04.5
VCP – V
VP = 5V
I
= 5mA
CP
TPC 14. Charge Pump Output Characteristics
PRESCALER (P/P + 1)
The dual modulus prescaler (P/P + 1), along with the A and
B counters, enables the large division ratio, N, to be realized
(N = BP + A). The dual-modulus prescaler, operating at CML
levels, takes the clock from the RF input stage and divides it
down to a manageable frequency for the CMOS A and B
counters. The prescaler is programmable. It can be set in software to 8/9, 16/17, 32/33 or 64/65. It is based on a synchronous
4/5 core. There is a minimum divide ratio possible for fully
contiguous output frequencies. This minimum is determined by
P, the prescaler value and is given by: (P
2
– P).
A AND B COUNTERS
The A and B CMOS counters combine with the dual modulus
prescaler to allow a wide ranging division ratio in the PLL feedback counter. The counters are specified to work when the
prescaler output is 300 MHz or less. Thus, with an RF input
frequency of 4.0 GHz, a prescaler value of 16/17 is valid but a
value of 8/9 is not valid.
Pulse Swallow Function
The A and B counters, in conjunction with the dual modulus
prescaler make it possible to generate output frequencies which
are spaced only by the Reference Frequency divided by R. The
equation for the VCO frequency is as follows:
f
REFIN
R
f
VCO
fPBA
=×+×[()]
VCO
Output Frequency of external voltage controlled
oscillator (VCO).
PPreset modulus of dual modulus prescaler
(8/9, 16/17, etc.,).
BPreset Divide Ratio of binary 13-bit counter
(3 to 8191).
APreset Divide Ratio of binary 6-bit swallow
counter (0 to 63).
f
REFIN
External reference frequency oscillator.
Figure 3. RF Input Stage
AGND
–8–
REV. 0
ADF4106
N = BP + A
TO PFD
FROM RF
INPUT STAGE
PRESCALER
MODULUS
CONTROL
N DIVIDER
P/P + 1
13-BIT B
COUNTER
LOAD
LOAD
6-BIT A
COUNTER
Figure 4. A and B Counters
R COUNTER
The 14-bit R counter allows the input reference frequency to
be divided down to produce the reference clock to the phase
frequency detector (PFD). Division ratios from 1 to 16,383
are allowed.
PHASE FREQUENCY DETECTOR (PFD) AND
CHARGE PUMP
The PFD takes inputs from the R counter and N counter (N =
BP + A) and produces an output proportional to the phase and
frequency difference between them. Figure 5 is a simplified
schematic. The PFD includes a programmable delay element
which controls the width of the anti-backlash pulse. This pulse
ensures that there is no deadzone in the PFD transfer function
and minimizes phase noise and reference spurs. Two bits in the
Reference Counter Latch, ABP2 and ABP1 control the width of
the pulse. See Table III.
V
P
CHARGE
PUMP
R DIVIDER
HIHID1
U1
CLR1
Q1
UP
MUXOUT AND LOCK DETECT
The output multiplexer on the ADF4110 family allows the user
to access various internal points on the chip. The state of
MUXOUT is controlled by M3, M2, and M1 in the Function
Latch. Table V shows the full truth table. Figure 6 shows the
MUXOUT section in block diagram form.
Lock Detect
MUXOUT can be programmed for two types of lock detect:
digital lock detect and analog lock detect.
Digital lock detect is active high. When LDP in the R counter
latch is set to 0, digital lock detect is set high when the phase
error on three consecutive Phase Detector cycles is less than
15 ns. With LDP set to “1,” five consecutive cycles of less than
15 ns are required to set the lock detect. It will stay set high
until a phase error of greater than 25 ns is detected on any subsequent PD cycle.
The N-channel open-drain analog lock detect should be operated with an external pull-up resistor of 10 k⍀ nominal. When
lock has been detected this output will be high with narrow lowgoing pulses.
DV
DD
ANALOG LOCK DETECT
DIGITAL LOCK DETECT
R COUNTER OUTPUT
N COUNTER OUTPUT
SDOUT
MUX
CONTROL
MUXOUT
DGND
Figure 6. MUXOUT Circuit
N DIVIDER
R DIVIDER
N DIVIDER
CP OUTPUT
D2
CLR2
U2
Q2
PROGRAMMABLE
DELAY
ABP2
ABP1
DOWN
U3
CPGND
CP
Figure 5. PFD Simplified Schematic and Timing (In Lock)
REV. 0
INPUT SHIFT REGISTER
The ADF4110 family digital section includes a 24-bit input shift
register, a 14-bit R counter and a 19-bit N counter, comprising a
6-bit A counter and a 13-bit B counter. Data is clocked into the
24-bit shift register on each rising edge of CLK. The data is
clocked in MSB first. Data is transferred from the shift register
to one of four latches on the rising edge of LE. The destination latch is determined by the state of the two control bits
(C2, C1) in the shift register. These are the two LSBs, DB1 and
DB0, as shown in the timing diagram of Figure 1. The truth table
for these bits is shown in Table VI. Table I shows a summary
of how the latches are programmed.
Table I. C2, C1 Truth Table
Control Bits
C2C1Data Latch
00R Counter
01N Counter (A and B)
10Function Latch (Including Prescaler)
11Initialization Latch
With C2, C1 set to 1,0, the on-chip function latch will be
programmed. Table V shows the input data format for programming the Function Latch.
Counter Reset
DB2 (F1) is the counter reset bit. When this is “1,” the R counter
and the A,B counters are reset. For normal operation this bit
should be “0.” Upon powering up, the F1 bit needs to be disabled
(set to “0”). The N counter then resumes counting in “close” alignment with the R counter. (The maximum error is one prescaler cycle).
Power-Down
DB3 (PD1) and DB21 (PD2) on the ADF4110 Family, provide
programmable power-down modes. They are enabled by the CE
pin. When the CE pin is low, the device is immediately disabled
regardless of the states of PD2, PD1. In the programmed asynchronous power-down, the device powers down immediately
after latching a “1” into bit PD1, with the condition that PD2
has been loaded with a “0.” In the programmed synchronous
power-down, the device power down is gated by the charge
pump to prevent unwanted frequency jumps. Once the powerdown is enabled by writing a “1” into bit PD1 (on condition
that a “1” has also been loaded to PD2), then the device will go
into power-down on the occurrence of the next charge pump
event. When a power down is activated (either synchronous or
asynchronous mode including CE-pin-activated power down),
the following events occur:
All active dc current paths are removed.
The R, N, and timeout counters are forced to their load state
conditions.
The charge pump is forced into three-state mode.
The digital clock detect circuitry is reset.
The RF
input is debiased.
IN
The reference input buffer circuitry is disabled.
The input register remains active and capable of loading and
latching data.
MUXOUT Control
The on-chip multiplexer is controlled by M3, M2, M1 on the
ADF4110 Family. Table V shows the truth table.
Fastlock Enable Bit
DB9 of the Function Latch is the Fastlock Enable Bit. Only
when this is “1” is Fastlock enabled.
Fastlock Mode Bit
DB10 of the Function Latch is the Fastlock Mode bit. When
Fastlock is enabled, this bit determines which Fastlock Mode is
used. If the Fastlock Mode bit is “0,” Fastlock Mode 1 is
selected and if the Fastlock Mode bit is “1,” Fastlock Mode 2 is
selected.
Fastlock Mode 1
The charge pump current is switched to the contents of Current
Setting 2. The device enters Fastlock by having a “1” written to
the CP Gain bit in the AB counter latch. The device exits
Fastlock by having a “0” written to the CP Gain bit in the AB
counter latch.
Fastlock Mode 2
The charge pump current is switched to the contents of Current
Setting 2. The device enters Fastlock by having a “1” written to
the CP Gain bit in the AB counter latch. The device exits
Fastlock under the control of the Timer Counter. After the
timeout period determined by the value in TC4–TC1, the CP
Gain bit in the AB counter latch is automatically reset to “0”
and the device reverts to normal mode instead of Fastlock. See
Table V for the timeout periods.
Timer Counter Control
The user has the option of programming two charge pump currents. The intent is that the Current Setting 1 is used when the
RF output is stable and the system is in a static state. Current
Setting 2 is meant to be used when the system is dynamic and in a
state of change (i.e., when a new output frequency is programmed).
The normal sequence of events is as follows:
Users initially decide what the preferred charge pump currents
are will be. For example, they may choose 2.5 mA as Current
Setting 1 and 5 mA as the Current Setting 2. At the same time
they must also decide how long they want the secondary current to stay active before reverting to the primary current. This
is controlled by the Timer Counter Control Bits DB14 to
DB11 (TC4–TC1) in the Function Latch. The truth table is
given in Table V.
Now, when users wish to program a new output frequency, they
can simply program the AB counter latch with new values for A
and B. At the same time they can set the CP Gain bit to a “1,”
which sets the charge pump with the value in CPI6–CPI4 for a
period of time determined by TC4–TC1. When this time is up,
the charge pump current reverts to the value set by CPI3–CPI1.
At the same time the CP Gain bit in the A, B Counter latch is
reset to 0 and is now ready for the next time that the user wishes
to change the frequency again.
Note that there is an enable feature on the Timer Counter. It is
enabled when Fastlock Mode 2 is chosen by setting the Fastlock
Mode bit (DB10) in the Function Latch to “1.”
Charge Pump Currents
CPI3, CPI2, CPI1 program Current Setting 1 for the charge
pump. CPI6, CPI5, CPI4 program Current Setting 2 for the
charge pump. The truth table is given in Table V.
Prescaler Value
P2 and P1 in the Function Latch set the prescaler values. The
prescaler value should be chosen so that the prescaler output
frequency is always less than or equal to 300 MHz. Thus, with
an RF frequency of 4 GHz, a prescaler value of 16/17 is valid
but a value of 8/9 is not valid.
PD Polarity
This bit sets the Phase Detector Polarity Bit. See Table V.
CP Three-State
This bit controls the CP output pin. With the bit set high, the
CP output is put into three-state. With the bit set low, the CP
output is enabled.
REV. 0
–15–
ADF4106
THE INITIALIZATION LATCH
When C2, C1 = 1, 1, the Initialization Latch is programmed. This is
essentially the same as the Function Latch (programmed when
C2, C1 = 1, 0).
However, when the Initialization Latch is programmed there is
an additional internal reset pulse applied to the R and AB
counters. This pulse ensures that the AB counter is at load point
when the AB counter data is latched and the device will begin
counting in close phase alignment.
If the Latch is programmed for synchronous power-down (CE
pin is High; PD1 bit is High; PD2 bit is Low), the internal pulse
also triggers this powerdown. The prescaler reference and the
oscillator input buffer are unaffected by the internal reset pulse
and so close phase alignment is maintained when counting resumes.
When the first AB counter data is latched after initialization, the
internal reset pulse is again activated. However, successive AB
counter loads after this will not trigger the internal reset pulse.
DEVICE PROGRAMMING AFTER INITIAL POWER-UP
After initially powering up the device, there are three ways to
program the device.
Initialization Latch Method
• Apply VDD.
• Program the Initialization Latch (“11” in two LSBs of input
word). Make sure that F1 bit is programmed to “0.”
• Do a Function Latch load (“10” in two LSBs of the control
word), making sure that the F1 bit is programmed to a “0.”
• Do an R load (“00” in two LSBs).
• Do an AB load (“01” in two LSBs).
When the Initialization Latch is loaded, the following occurs:
1. The function latch contents are loaded.
2. An internal pulse resets the R, A, B and timeout counters to
load state conditions and also three-states the charge pump.
Note that the prescaler bandgap reference and the oscillator
input buffer are unaffected by the internal reset pulse, allowing close phase alignment when counting resumes.
3. Latching the first AB counter data after the initialization
word will activate the same internal reset pulse. Successive
AB loads will not trigger the internal reset pulse unless there
is another initialization.
CE Pin Method
• Apply VDD.
• Bring CE low to put the device into power-down. This is an
asynchronous power-down in that it happens immediately.
• Program the Function Latch (10).
• Program the R Counter Latch (00).
• Program the AB Counter Latch (01).
• Bring CE high to take the device out of power-down.
The R and AB counters will now resume counting in close
alignment. Note that after CE goes high, a duration of 1 µs may
be required for the prescaler bandgap voltage and oscillator
input buffer bias to reach steady state.
CE can be used to power the device up and down in order to
check for channel activity. The input register does not need to
be reprogrammed each time the device is disabled and enabled
as long as it has been programmed at least once after V
DD
was
initially applied.
Counter Reset Method
• Apply VDD.
• Do a Function Latch Load (“10” in two LSBs). As part of
this, load “1” to the F1 bit. This enables the counter reset.
• Do an R Counter Load (“00” in two LSBs).
• Do an AB Counter Load (“01” in two LSBs).
• Do a Function Latch Load (“10” in two LSBs). As part of
this, load “0” to the F1 bit. This disables the counter reset.
This sequence provides the same close alignment as the initialization method. It offers direct control over the internal reset.
Note that counter reset holds the counters at load point and
three-states the charge pump, but does not trigger synchronous
power-down.
APPLICATION SECTION
Local Oscillator for LMDS Base Station Transmitter
Figure 7 shows the ADF4106 being used with a VCO to produce the LO for an LMDS base station operation in the
5.4 GHz to 5.8 GHz band.
The reference input signal is applied to the circuit at FREF
IN
and, in this case, is terminated in 50 Ω. A typical base station
system would have either a TCXO or an OCXO driving the
Reference Input without any 50 Ω termination.
In order to have a channel spacing of 1 MHz at the output, the
10 MHz reference input must be divided by 10, using the on-chip
reference divider of the ADF4106.
The charge pump output of the ADF4106 (Pin 2) drives the
loop filter. In calculating the loop filter component values, a
number of items need to be considered. In this example, the
loop filter was designed so that the overall phase margin for the
system would be 45 degrees. Other PLL system specifications
are given below:
K
= 2.5 mA
D
K
= 80 MHz/V
V
Loop Bandwidth = 50 kHz
= 1 MHz
F
REF
N = 5800
Extra Reference Spur Attenuation = 10 dB
All of these specifications are needed and used to come up with
the loop filter component values shown in Figure 7.
Figure 7 gives a typical phase noise performance of –83 dBc/Hz
at 1 kHz offset from the carrier. Spurs are better than –62 dBc.
The loop filter output drives the VCO, which, in turn, is fed
back to the RF input of the PLL synthesizer and also drives the
RF Output terminal. A T-circuit configuration provides 50 Ω
matching between the VCO output, the RF output and the
RF
terminal of the synthesizer. Note that the ADF4106 RF
IN
input looks like 50 Ω at 5.8 GHz and so no terminating resistor
is needed. When operating at lower frequencies however, this is
not the case.
In a PLL system, it is important to know when the system is in
lock. In Figure 7, this is accomplished by using the MUXOUT
signal from the synthesizer. The MUXOUT pin can be programmed to monitor various internal signals in the synthesizer.
One of these is the LD or lock-detect signal.
–16–
REV. 0
ADF4106
FREF
1000pF
IN
SPI COMPATIBLE SERIAL BUS
1000pF
51
5.1k
V
DD
AV
DD
REFIN
ADF4106
CE
CLK
DATA
LE
R
SET
CPGND
DV
DD
MUXOUT
RF
RF
AGND
DGND
V
P
RF
OUT
100pF
18
18
18
V
P
CP
100pF
LOCK
DETECT
100pF
A
IN
B
IN
100pF
6.2k
4.3k
1.5nF
NOTE
DECOUPLING CAPACITORS (0.1
VP OF THE ADF4106 AND ON VCC OF THE V940ME03 HAVE
BEEN OMITTED FROM THE DIAGRAM TO AID CLARITY.
20pF
V
CC
V940ME03
1, 3, 4, 5, 7, 8,
9, 11, 12, 13
F/10pF) ON AVDD, DVDD,
100pF
Figure 7. Local Oscillator for LMDS Base Station
INTERFACING
The ADF4106 has a simple SPI-compatible serial interface for
writing to the device. SCLK, SDATA and LE control the data
transfer. When LE (Latch Enable) goes high, the 24 bits which
have been clocked into the input register on each rising edge of
SCLK will get transferred to the appropriate latch. See Figure 1
for the Timing Diagram and Table I for the Latch Truth Table.
The maximum allowable serial clock rate is 20 MHz. This means
that the maximum update rate possible for the device is 833 kHz
or one update every 1.2 µs. This is certainly more than adequate
for systems which will have typical lock times in hundreds of
microseconds.
ADuC812 Interface
Figure 8 shows the interface between the ADF4106 and the
ADuC812 microconverter. Since the ADuC812 is based on an
8051 core, this interface can be used with any 8051-based
microcontroller. The microconverter is set up for SPI Master
Mode with CPHA = 0. To initiate the operation, the I/O port
driving LE is brought low. Each latch of the ADF4106 needs a
24-bit word. This is accomplished by writing three 8-bit bytes
from the microconverter to the device. When the third byte has
been written the LE input should be brought high to complete
the transfer.
REV. 0
–17–
ADF4106
On first applying power to the ADF4106, it needs at three writes
(one each to the R counter latch, the N counter latch and the
function latch) for the output to become active.
I/O port lines on the ADuC812 are also used to control
power-down (CE input) and to detect lock (MUXOUT configured as lock detect and polled by the port input).
When operating in the mode described, the maximum SCLOCK
rate of the ADuC812 is 4 MHz. This means that the maximum
rate at which the output frequency can be changed will be 166 kHz.
SCLOCK
MOSI
ADuC812
I/O PORTS
SCLK
SDATA
LE
ADF4106
CE
MUXOUT
(LOCK DETECT)
Figure 8. ADuC812 to ADF4106 Interface
ADSP-2181 Interface
Figure 9 shows the interface between the ADF4106 and the
ADSP-21xx Digital Signal Processor. The ADF4106 needs a
24-bit serial word for each latch write. The easiest way to
accomplish this using the ADSP-21xx family is to use the
Autobuffered Transmit Mode of operation with Alternate Framing.
This provides a means for transmitting an entire block of serial
data before an interrupt is generated. Set up the word length for
8 bits and use three memory locations for each 24-bit word. To
program each 24-bit latch, store the three 8-bit bytes, enable the
Autobuffered mode and then write to the transmit register of the
DSP. This last operation initiates the autobuffer transfer.
SCLK
SDATA
LE
ADF4106
CE
MUXOUT
(LOCK DETECT)
ADSP-21xx
I/O FLAGS
SCLOCK
MOSI
TFS
Figure 9. ADSP-21xx to ADF4106 Interface
–18–
REV. 0
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
16-Lead Thin Shrink SO Package (TSSOP)
(RU-16)
0.201 (5.10)
0.193 (4.90)
ADF4106
SEATING
PIN 1
INDICATOR
0.035 (0.90) MAX
0.033 (0.85) NOM
SEATING
PLANE
PIN 1
0.006 (0.15)
0.002 (0.05)
PLANE
16
0.0256 (0.65)
BSC
9
0.177 (4.50)
0.169 (4.30)
81
0.0433 (1.10)
MAX
0.0118 (0.30)
0.0075 (0.19)
0.256 (6.50)
0.246 (6.25)
0.0079 (0.20)
0.0035 (0.090)
8
0
0.028 (0.70)
0.020 (0.50)
20-Leadless Frame Chip Scale Package (LFCSP)
(CP-20)
0.024 (0.60)
0.157 (4.0)
BSC SQ
TOP
VIEW
12 MAX
0.020 (0.50)
BSC
CONTROLLING DIMENSIONS ARE IN MILLIMETERS
0.148 (3.75)
BSC SQ
0.031 (0.80) MAX
0.026 (0.65) NOM
0.008 (0.20)
REF
0.024 (0.60)
0.017 (0.42)
0.009 (0.24)
0.012 (0.30)
0.009 (0.23)
0.007 (0.18)
0.030 (0.75)
0.022 (0.60)
0.014 (0.50)
0.002 (0.05)
0.0004 (0.01)
0.0 (0.0)
0.017 (0.42)
0.009 (0.24)
16
15
BOTTOM
VIEW
11
10
0.080 (2.00)
REF
0.010 (0.25)
MIN
20
1
5
6
0.080 (2.25)
0.083 (2.10) SQ
0.077 (1.95)
REV. 0
–19–
C02720–.8–10/01(0)
–20–
PRINTED IN U.S.A.
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