Datasheet ADF4106 Datasheet (ANALOG DEVICES)

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PLL Frequency Synthesizer

FEATURES

6.0 GHz bandwidth
2.7 V to 3.3 V power supply Separate charge pump supply (VP) allows extended
tuning voltage in 3 V systems
Programmable dual-modulus prescaler
8/9, 16/17, 32/33, 64/65 Programmable charge pump currents Programmable antibacklash pulse width 3-wire serial interface Analog and digital lock detect Hardware and software power-down mode

APPLICATIONS

Broadband wireless access Satellite systems Instrumentation Wireless LANS Base stations for wireless radios

FUNCTIONAL BLOCK DIAGRAM

DV
AV
DD
DD
ADF4106

GENERAL DESCRIPTION

The ADF4106 frequency synthesizer can be used to implement local oscillators in the up-conversion and down-conversion sections of wireless receivers and transmitters. It consists of a low noise, digital phase frequency detector (PFD), a precision charge pump, a programmable reference divider, programmable A counter and B counter, and a dual-modulus prescaler (P/P +
1). The A (6-bit) counter and B (13-bit) counter, in conjunction with the dual-modulus prescaler (P/P + 1), implement an N divider (N = BP + A). In addition, the 14-bit reference counter (R Counter) allows selectable REF input. A complete phase-locked loop (PLL) can be implemented if the synthesizer is used with an external loop filter and voltage controlled oscillator (VCO). Its very high bandwidth means that frequency doublers can be eliminated in many high frequency systems, simplifying system architecture and reducing cost.
V
CPGND
P
frequencies at the PFD
IN
R
SET
REF
IN
CLK
DATA
LE
RFINA RF
B
IN
Rev. B
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
24-BIT INPUT
REGISTER
SD
OUT
FUNCTION
PRESCALER
FROM
LATCH
P/P + 1
CE
22
N = BP + A
AGND
14-BIT
R COUNTER
14
R COUNTER
LATCH
FUNCTION
LATCH
A, B COUNTER
LATCH
13-BIT
B COUNTER
LOAD
LOAD
A COUNTER
DGND
13
6-BIT
6
19
Figure 1.
REFERENCE
PHASE
FREQUENCY
DETECTOR
LOCK
DETECT
AV
SD
CURRENT
SETTING 1
CPI3 CPI2 CPI1
DD
OUT
CHARGE
MUX
M3 M2 M1
PUMP
CURRENT
SETTING 2
CPI6 CPI5 CPI4
HIGH Z
CP
MUXOUT
ADF4106
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2005 Analog Devices, Inc. All rights reserved.
02720-001
ADF4106
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TABLE OF CONTENTS

Specifications..................................................................................... 3
Phase Frequency Detector (PFD) and Charge Pump............ 10
Timing Characterisitics ............................................................... 4
Absolute Maximum Ratings............................................................ 5
ESD Caution.................................................................................. 5
Pin Configurations and Function Descriptions ........................... 6
Typical Performance Characteristics ............................................. 7
General Description......................................................................... 9
Reference Input Section............................................................... 9
RF Input Stage............................................................................... 9
Prescaler (P/P +1)......................................................................... 9
A Counter and B Counter........................................................... 9
R Counter ...................................................................................... 9

REVISION HISTORY

6/05—Rev A to Rev. B
Updated Format..................................................................Universal
Changes to Figure 1.......................................................................... 1
Changes to Table 1............................................................................ 3
Changes to Table 2............................................................................ 4
Changes to Table 3............................................................................ 5
Changes to Figure 3 and Figure 4................................................... 6
Changes to Figure 6.......................................................................... 7
Changes to Figure 10........................................................................ 7
Deleted TPC 13 and TPC 14 ........................................................... 8
Changes to Figure 15........................................................................ 8
Changes to Figure 20 Caption....................................................... 10
Updated Outline Dimensions....................................................... 20
Changes to Ordering Guide.......................................................... 21
MUXOUT and Lock Detect...................................................... 10
Input Shift Register .................................................................... 10
The Function Latch.................................................................... 16
The Initialization Latch ............................................................. 17
Applications..................................................................................... 18
Local Oscillator for LMDS Base Station Transmitter............ 18
Interfacing ................................................................................... 19
PCB Design Guidelines for Chip Scale Package .................... 19
Outline Dimensions ....................................................................... 20
Ordering Guide .......................................................................... 21
5/03—Rev 0 to Rev. A
dits to Specifications...................................................................... 2
E
Edits to TPC 11................................................................................. 7
Updated Outline Dimensions....................................................... 19
10/01—Revision 0: Initial Revision
Rev. B | Page 2 of 24
ADF4106
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SPECIFICATIONS

AVDD = DVDD = 3 V ± 10%, AVDD ≤ VP ≤ 5.5 V, AGND = DGND = CPGND = 0 V, R unless otherwise noted.
Table 1.
Parameter B Version1B Chips2 (typ) Unit Test Conditions/Comments
RF CHARACTERISTICS See Figure 18 for input circuit
RF Input Frequency (RFIN) 0.5/6.0 0.5/6.0 GHz min/max
RF Input Sensitivity –10/0 –10/0 dBm min/max Maximum Allowable Prescaler
Output Frequency
3
300 300 MHz max P = 8
325 325 MHz P = 16
REFIN CHARACTERISTICS
REFIN Input Frequency 20/300 20/300 MHz min/max For f < 20 MHz, ensure SR > 50 V/μs REFIN Input Sensitivity
4
0.8/V
DD
0.8/V
DD
V p-p min/max Biased at AVDD/2 (see Note 55) REFIN Input Capacitance 10 10 pF max REFIN Input Current ±100 ±100 μA max
PHASE DETECTOR
Phase Detector Frequency
6
104 104 MHz max ABP = 0, 0 (2.9 ns antibacklash pulse width)
CHARGE PUMP Programmable, see Table 9
ICP Sink/Source
High Value 5 5 mA typ With R Low Value 625 625 μA typ Absolute Accuracy 2.5 2.5 % typ With R R
Range 3.0/11 3.0/11 kΩ typ See Table 9
SET
ICP Three-State Leakage 2 2 nA max 1 nA typical; TA = 25°C Sink and Source Current Matching 2 2 % typ 0.5 V ≤ VCP ≤ VP − 0.5 V
= 5.1 kΩ, dBm referred to 50 Ω, TA = T
SET
For lower frequencies, ensure slew rate (SR) > 320 V/μs
= 5.1 kΩ
SET
= 5.1 kΩ
SET
MAX
to T
MIN
,
ICP vs. V
CP
1.5 1.5 % typ 0.5 V ≤ VCP ≤ VP − 0.5 V
ICP vs. Temperature 2 2 % typ VCP = VP/2
LOGIC INPUTS
VIH, Input High Voltage 1.4 1.4 V min VIL, Input Low Voltage 0.6 0.6 V max I
, I
, Input Current ±1 ±1 μA max
INH
INL
CIN, Input Capacitance 10 10 pF max
LOGIC OUTPUTS
VOH, Output High Voltage 1.4 1.4 V min
Open-drain output chosen, 1 kΩ pull-up
resistor to 1.8 V VOH, Output High Voltage VDD − 0.4 VDD − 0.4 V min CMOS output chosen I
OH
100 100 μA max
VOL, Output Low Voltage 0.4 0.4 V max IOL = 500 μA
POWER SUPPLIES
AV
DD
DV
DD
V
P
7
I
(AI
DD
I
DD
I
DD
I
P
+ DI ) 11 9.0 mA max 9.0 mA typ
DD DD
8
(AI
+ DI ) 11.5 9.5 mA max 9.5 mA typ
DD DD
9
(AI
+ DI ) 13 10.5 mA max 10.5 mA typ
DD DD
Power-Down Mode10
+ DIDD)
(AI
DD
2.7/3.3 2.7/3.3 V min/V max AV
DD
AV
DD
AVDD/5.5 AVDD/5.5 V min/V max AVDD ≤ VP ≤ 5.5V
0.4 0.4 mA max TA = 25°C 10 10 μA typ
Rev. B | Page 3 of 24
ADF4106
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Parameter B Version1B Chips2 (typ) Unit Test Conditions/Comments
NOISE CHARACTERISTICS
ADF4106 Normalized
Phase Noise Floor
Phase Noise Performance
900 MHz
13
5800 MHz 5800 MHz
11
12
14
15
Spurious Signals
900 MHz 5800 MHz 5800 MHz
1
Operating temperature range (B Version) is –40°C to +85°C.
2
The B chip specifications are given as typical values.
3
This is the maximum operating frequency of the CMOS counters. The prescaler value should be chosen to ensure that the RF input is divided down to a frequency that
is less than this value.
4
AVDD = DVDD = 3 V.
5
AC coupling ensures AVDD/2 bias.
6
Guaranteed by design. Sample tested to ensure compliance.
7
TA = 25°C; AVDD = DVDD = 3 V; P = 16; RFIN = 900 MHz.
8
TA = 25°C; AVDD = DVDD = 3 V; P = 16; RFIN = 2.0 GHz.
9
TA = 25°C; AVDD = DVDD = 3 V; P = 32; RFIN = 6.0 GHz.
10
TA = 25°C; AVDD = DVDD = 3.3 V; R = 16383; A = 63; B = 891; P = 32; RFIN = 6.0 GHz.
11
The synthesizer phase noise floor is estimated by measuring the in-band phase noise at the output of the VCO and subtracting 20 log N (where N is the N divider value) and 10 log F
12
The phase noise is measured with the EVAL-ADF4106EB1 evaluation board and the Agilent E4440A Spectrum Analyzer. The spectrum analyzer provides the REFIN for the synthesizer (f
13
f
= 10 MHz; f
REFIN
14
f
= 10 MHz; f
REFIN
15
f
= 10 MHz; f
REFIN
13
14
15
. PN
= PN
PFD
SYNTH
= 10 MHz @ 0 dBm).
REFOUT
= 200 kHz; Offset Frequency = 1 kHz; fRF = 900 MHz; N = 4500; Loop B/W = 20 kHz.
PFD
= 200 kHz; Offset Frequency = 1 kHz; fRF = 5800 MHz; N = 29000; Loop B/W = 20 kHz.
PFD
= 1 MHz; Offset Frequency = 1 kHz; fRF = 5800 MHz; N = 5800; Loop B/W = 100 kHz.
PFD
− 10 log F
TOT

TIMING CHARACTERISITICS

AVDD = DVDD = 3 V ± 10%, AVDD ≤ VP ≤ 5.5 V, AGND = DGND = CPGND = 0 V, R unless otherwise noted.
Table 2.
Parameter Limit1 (B Version) Unit Test Conditions/Comments
t
1
t
2
t
3
t
4
t
5
t
6
1
Operating temperature range (B Version) is –40°C to +85°C.
–219 –219 dBc/Hz typ
@ VCO output –92.5 −92.5 dBc/Hz typ @ 1 kHz offset and 200 kHz PFD frequency
−76.5 −76.5 dBc/Hz typ @ 1 kHz offset and 200 kHz PFD frequency
−83.5 −83.5 dBc/Hz typ @ 1 kHz offset and 1 MHz PFD frequency
–90/–92 –90/–92 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD frequency –65/–70 –65/–70 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD frequency –70/–75 –70/–75 dBc typ @ 1 MHz/2 MHz and 1 MHz PFD frequency
− 20 log N.
PFD
= 5.1 kΩ, dBm referred to 50 Ω, TA = T
SET
10 ns min DATA to CLOCK Setup Time 10 ns min DATA to CLOCK Hold Time 25 ns min CLOCK High Duration 25 ns min CLOCK Low Duration 10 ns min CLOCK to LE Setup Time 20 ns min LE Pulse Width
t
t
3
4
MAX
to T
MIN
,
CLOCK
DATA
DB23 (MSB)
LE
LE
t
t
1
2
DB22
DB2
Figure 2. Timing Diagram
Rev. B | Page 4 of 24
DB1 (CONTROL
BIT C2)
DB0 (LSB)
(CONTROL BIT C1)
t
5
t
6
02720-002
ADF4106
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ABSOLUTE MAXIMUM RATINGS

TA = 25°C, unless otherwise noted.
Table 3.
Parameter Rating
AVDD to GND1 –0.3 V to + 3.6 V AVDD to DVDD –0.3 V to + 0.3 V VP to GND –0.3 V to + 5.8 V VP to AVDD –0.3 V to + 5.8 V Digital I/O Voltage to GND –0.3 V to VDD + 0.3 V Analog I/O Voltage to GND –0.3 V to VP + 0.3 V REFIN, RFINA, RFINB to GND –0.3 V to VDD + 0.3 V Operating Temperature Range
Industrial (B Version) –40°C to +85°C
Storage Temperature Range –65°C to +125°C Maximum Junction Temperature 150°C TSSOP θJA Thermal Impedance 112°C/W LFCSP θJA Thermal Impedance
(Paddle Soldered)
Reflow Soldering
Peak Temperature 260°C Time at Peak Temperature 40 sec
Transistor Count
CMOS 6425 Bipolar 303
1
GND = AGND = DGND = 0 V.
30.4°C/W
S
tresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
This device is a high performance RF integrated circuit with an ES
D rating of <2 kV, and it is ESD sensitive. Proper precautions
should be taken for handling and assembly.

ESD CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although this product features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
Rev. B | Page 5 of 24
ADF4106
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PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS

DD
P
1
R
SET
2
CP
AGND RFINB RF
IN
AV
DD
REF
3
4
5
6
A
7
8
IN
ADF4106
TOP VIEW
(Not to Scale)
CPGND
NOTE: TRANSISTOR COUNT 6425 (CMOS), 303 (BIPOLAR).
Figure 3. 16-Lead TSSOP Pin Configuration
16
V
15
DV
14
MUXOUT
13
LE
12
DATA
11
CLK
10
CE
9
DGND
P
DD
CPGND 1
AGND 2 AGND 3 RFINB 4 RF
A 5
IN
02720-003
NOTE: TRANSISTOR COUNT 6425 (CMOS), 303 (BIPOLAR).
Figure 4. 20-Lead LFCSP_VQ Pin Configuration
Table 4. Pin Function Descriptions
Pin No. TSSOP
1 19 R
2 20 CP
Pin No. LFCSP Mnemonic Function
SET
Connecting a resistor between this pin and CPGND sets the maximum charge pump output current. The nominal voltage potential at the R
I
MAXCP
So, with R
SET
Charge Pump Output. When enabled, this provides ±I
5.25
=
R
SET
= 5.1 kΩ, I
CP MAX
= 5 mA.
pin is 0.66 V. The relationship between ICP and R
SET
to the external loop filter, which in turn
CP
drives the external VCO. 3 1 CPGND Charge Pump Ground. This is the ground return path for the charge pump. 4 2, 3 AGND 5 4 RF
B
IN
Analog Ground. This is the ground return path of the prescaler.
Complementary Input to the RF Prescaler. This point must be decoupled to the ground plane with
a small bypass capacitor, typically 100 pF. See Figure 18. 6 5 RF 7 6, 7 AV
8 8 REF
A Input to the RF Prescaler. This small signal input is ac-coupled to the external VCO.
IN
DD
IN
Analog Power Supply. This may range from 2.7 V to 3.3 V. Decoupling capacitors to the analog ground
plane should be placed as close as possible to this pin. AV
DD
Reference Input. This is a CMOS input with a nominal threshold of VDD/2 and a dc equivalent input
resistance of 100 kΩ. See Figure 18. This input can be driven from a TTL or CMOS crystal oscillator or
9 9, 10 DGND 10 11 CE
it can be ac-cou
Digital Ground.
Chip Enable. A logic low on this pin powers down the device and puts the charge pump output
pled.
into three-state mode. Taking the pin high powers up the device, depending on the status of the
power-down bit, F2. 11 12 CLK
Serial Clock Input. This serial clock is used to clock in the serial data to the registers. The data is latched
into the 24-bit shift register on the CLK rising edge. This input is a high impedance CMOS input. 12 13 DATA
Serial Data Input. The serial data is loaded MSB first with the two LSBs being the control bits.
This input is a high impedance CMOS input. 13 14 LE
Load Enable, CMOS Input. When LE goes high, the data stored in the shift registers is loaded into one
of the four latches with the latch being selected using the control bits. 14 15 MUXOUT
This multiplexer output allows either the lock detect, the scaled RF, or the scaled reference frequency
to be accessed externally. 15 16, 17 DV
16 18 V
DD
P
Digital Power Supply. This may range from 2.7 V to 3.3 V. Decoupling capacitors to the digital ground
plane should be placed as close as possible to this pin. DV
DD
Charge Pump Power Supply. This should be greater than or equal to VDD. In systems where VDD is 3 V,
it can be set to 5.5 V and used to drive a VCO with a tuning range of up to 5 V.
SET
V
DV
R 191817
20 CP
PIN 1 INDICATOR
ADF4106
TOP VIEW
6
7
8
IN
DD
DD
AV
AV
REF
DGND 9
must be the same value as DVDD.
must be the same value as AVDD.
DD
DV 16
15 MUXOUT 14 LE 13 DATA 12 CLK 11 CE
DGND 10
SET
is
02720-004
Rev. B | Page 6 of 24
ADF4106
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TYPICAL PERFORMANCE CHARACTERISTICS

FREQ UNIT GHz KEYWORD R PARAM TYPE S IMPEDANCE 50Ω DATA FORMAT MA
FREQ MAGS11 ANGS11
0.500 0.89148 –17.2820
0.600 0.88133 – 20.6919
0.700 0.87152 – 24.5386
0.800 0.85855 –27.3228
0.900 0.84911 –31.0698
1.000 0.83512 – 34.8623
1.100 0.82374 –38.5574
1.200 0.80871 –41.9093
1.300 0.79176 – 45.6990
1.400 0.77205 –49.4185
1.500 0.75696 –52.8898
1.600 0.74234 –56.2923
1.700 0.72239 –60.2584
1.800 0.69419 –63.1446
1.900 0.67288 –65.6464
2.000 0.66227 –68.0742
2.100 0.64758 –71.3530
2.200 0.62454 –75.5658
2.300 0.59466 –79.6404
2.400 0.55932 –82.8246
2.500 0.52256 –85.2795
2.600 0.48754 –85.6298
2.700 0.46411 –86.1854
2.800 0.45776 –86.4997
2.900 0.44859 –88.8080
3.000 0.44588 –91.9737
3.100 0.43810 –95.4087
3.200 0.43269 –99.1282
FREQ MAGS11 ANGS11
3.300 0.42777 –102.748
3.400 0.42859 –107.167
3.500 0.43365 –111.883
3.600 0.43849 –117.548
3.700 0.44475 –123.856
3.800 0.44800 –130.399
3.900 0.45223 –136.744
4.000 0.45555 –142.766
4.100 0.45313 –149.269
4.200 0.45622 –154.884
4.300 0.45555 –159.680
4.400 0.46108 –164.916
4.500 0.45325 –168.452
4.600 0.45054 –173.462
4.700 0.45200 –176.697
4.800 0.45043 178.824
4.900 0.45282 174.947
5.000 0.44287 170.237
5.100 0.44909 166.617
5.200 0.44294 162.786
5.300 0.44558 158.766
5.400 0.45417 153.195
5.500 0.46038 147.721
5.600 0.47128 139.760
5.700 0.47439 132.657
5.800 0.48604 125.782
5.900 0.50637 121.110
6.000 0.52172 115.400
Figure 5. S-Parameter Data for the RF Input
0
–5
–10
–15
–20
RF INPUT POWER (dBm)
–25
–30
T
= +25°C
A
RF INPUT FREQUENCY (GHz)
T
= –40°C
A
TA = +85°C
Figure 6. Input Sensitivity
0
REF LEVEL = –14.3dBm
–10
–20
–30
–40
–50
–60
–70
OUTPUT POWER (dB)
–80
–90
–100
–2kHz –1kHz 900MHz 1kHz 2kHz
VDD = 3V, VP = 5V
= 5mA
I
CP
PFD FREQUENCY = 200kHz LOOP BANDWIDTH = 20kHz RES BANDWIDTH = 10Hz VIDEO BANDWIDTH = 10Hz SWEEP = 1.9 SECONDS AVERAGES = 10
FREQUENCY
–93.0dBc/Hz
Figure 7. Phase Noise (900 MHz, 200 kHz, and 20 kHz)
VDD = 3V
= 3V
V
P
02720-005
02720-006
6543210
02720-007
–40
–50
–60
–70
–80
–90
–100
–110
OUTPUT POWER (dB)
–120
–130
–140
100Hz 1MHz
FREQUENCY OFFSET FROM 900MHz CARRIER
10dB/DIV R
= –40dBc/Hz
L
RMS NOISE = 0.36°
Figure 8. Integrated Phase Noise (900 MHz, 200 kHz, and 20 kHz)
0
REF LEVEL = –14.0dBm
–10
–20
–30
–40
–50
–60
OUTPUT POWER (dB)
–70
–80
–90
–100
–400kHz –200kHz 900MHz 200kHz 400kHz
V
= 3V, VP = 5V
DD
= 5mA
I
CP
PFD FREQUENCY = 200kHz LOOP BANDWIDTH = 20kHz RES BANDWIDTH = 1kHz VIDEO BANDWIDTH = 1kHz SWEEP = 2.5 SECONDS AVERAGES = 30
FREQUENCY
–91.0dBc/Hz
Figure 9. Reference Spurs (900 MHz, 200 kHz, and 20 kHz)
0
REF LEVEL = –10dBm
–10
–20
–30
–40
–50
–60
OUTPUT POWER (dB)
–70
–80
–90
–100
–2kHz –1kHz 5800MHz 1kHz 2kHz
FREQUENCY
= 3V, VP = 5V
V
DD
= 5mA
I
CP
PFD FREQUENCY = 1MHz LOOP BANDWIDTH = 100kHz RES BANDWIDTH = 10Hz VIDEO BANDWIDTH = 10Hz SWEEP = 1.9 SECONDS AVERAGES = 10
–83.5dBc/Hz
Figure 10. Phase Noise (5.8 GHz,1 MHz, and 100 kHz)
02720-008
02720-009
02720-010
Rev. B | Page 7 of 24
ADF4106
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–40
–50
–60
–70
–80
–90
–100
–110
PHASE NOISE (dBc/Hz)
–120
–130
–140
100Hz 1MHz
FREQUENCY OFFSET FROM 5800MHz CARRIER
Figure 11. Integrated Phase Noise (5.8 GHz,1 MHz, and 100 kHz)
0
REF LEVEL = –10dBm
–10
–20
–30
–40
–50
–66.0dBc
–60
–70
OUTPUT POWER (dB)
–80
–90
–100
–2kHz –1kHz 5800MHz 1kHz 2kHz
FREQUENCY (MHz)
Figure 12. Reference Spurs (5.8 GHz,1 MHz, and 100 kHz)
–60
–70
–80
PHASE NOISE (dBc/Hz)
–90
–100
TEMPERATURE (°C)
Figure 13. Phase Noise (5.8 GHz,1 MHz, and 100 kHz) vs. Temperature
10dB/DIV
= –40dBc/Hz
R
L
RMS NOISE = 1.8°
= 3V, VP = 5V
V
DD
= 5mA
I
CP
PFD FREQUENCY = 1MHz LOOP BANDWIDTH = 100kHz RES BANDWIDTH = 1kHz VIDEO BANDWIDTH = 1kHz SWEEP = 13 SECONDS AVERAGES = 1
–65.0dBc
VDD = 3V V
P
= 3V
02720-011
–5
–15
–25
–35
–45
–55
–65
–75
–85
FIRST REFERENCE SPUR (dBc)
–95
–105
TUNNING VOLTAGE (V)
Figure 14. Reference Spurs vs. V
(5.8 GHz,1 MHz, and 100 kHz)
TUNE
VDD = 3V V
= 5V
P
501234
02720-014
02720-012
PHASE NOISE (dBc/Hz)
–120
–130
–140
–150
–160
–170
–180
PHASE ETECTOR FREQUENCY (Hz)
VDD = 3V V
= 5V
P
02720-015
100M10k 100k 1M 10M
Figure 15. Phase Noise (Referred to CP Output) vs. PFD Frequency
–6 –5 –4 –3 –2 –1
0
(mA)
CP
I
1 2 3 4
02720-013
10040–200 20406080
5 6
V
CP
(V)
VPP = 5V
SETTLING = 5mA
I
CP
02720-016
5.00 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5
Figure 16. Charge Pump Output Characteristics
Rev. B | Page 8 of 24
ADF4106
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GENERAL DESCRIPTION

REFERENCE INPUT SECTION

The reference input stage is shown in Figure 17. SW1 and SW2 are normally closed switches. SW3 is a normally open switch. When power-down is initiated, SW3 is closed and SW1 and SW2 are opened. This ensures that there is no loading of the REF
pin on power-down.
IN
POWER-DOWN
CONTROL
100kΩ
NC
REF
SW2
IN
NC
SW1
SW3
NO
Figure 17. Reference Input Stage
BUFFER
TO R COUNTER

RF INPUT STAGE

The RF input stage is shown in Figure 18. It is followed by a 2-stage limiting amplifier to generate the CML clock levels needed for the prescaler.
02720-017

A COUNTER AND B COUNTER

The A counter and B CMOS counter combine with the dual modulus prescaler to allow a wide ranging division ratio in the PLL feedback counter. The counters are specified to work when the prescaler output is 325 MHz or less. Thus, with an RF input frequency of 4.0 GHz, a prescaler value of 16/17 is valid, but a value of 8/9 is not valid.

Pulse Swallow Function

The A counter and B counter, in conjunction with the dual­modulus prescaler, make it possible to generate output frequencies that are spaced only by the reference frequency divided by R. The equation for the VCO frequency is
f
REFIN
()
[]
f ×+×=
VCO
ABP
where:
is the output frequency of the external voltage controlled
f
VCO
oscillator (VCO).
P is t
he preset modulus of the dual-modulus prescaler
(8/9, 16/17, etc.).
R
500Ω
1.6V
500Ω
AV
DD
AGND
02720-018
RFINA
RF
IN
BIAS
GENERATOR
B
Figure 18. RF Input Stage

PRESCALER (P/P +1)

The dual-modulus prescaler (P/P + 1), along with the A counter and B counter, enables the large division ratio, N, to be realized (N = BP + A). The dual-modulus prescaler, operating at CML levels, takes the clock from the RF input stage and divides it down to a manageable frequency for the CMOS A counter and B counter. The prescaler is programmable. It can be set in soft­ware to 8/9, 16/17, 32/33, or 64/65. It is based on a synchronous 4/5 core. There is a minimum divide ratio possible for fully contiguous output frequencies. This minimum is determined by P, the prescaler value, and is given by (P
2
− P).
B is t
he preset divide ratio of the binary 13-bit counter
(3 to 8191).
A is t
he preset divide ratio of the binary 6-bit swallow
counter (0 to 63).
is the external reference frequency oscillator.
f
REFIN
N = BP + A
TO PFD
FROM RF
INPUT STAGE
PRESCALER
P/P + 1
MODULUS CONTROL
N DIVIDER
Figure 19. A and B Counters
13-BIT B
COUNTER
LOAD
LOAD
6-BIT A
COUNTER

R COUNTER

The 14-bit R counter allows the input reference frequency to be divided down to produce the reference clock to the phase frequency detector (PFD). Division ratios from 1 to 16,383 are allowed.
02720-019
Rev. B | Page 9 of 24
ADF4106
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PHASE FREQUENCY DETECTOR (PFD) AND CHARGE PUMP

The PFD takes inputs from the R counter and N counter (N = BP + A) and produces an output proportional to the phase and frequency difference between them. Figure 20 is a sim
plified schematic. The PFD includes a programmable delay element that controls the width of the antibacklash pulse. This pulse ensures that there is no dead zone in the PFD transfer function and minimizes phase noise and reference spurs. Two bits in the reference counter latch, ABP2 and ABP1, control the width of the pulse. See
HI
R DIVIDER
HID1D2
N DIVIDER

MUXOUT AND LOCK DETECT

The output multiplexer on the ADF4106 allows the user to access various internal points on the chip. The state of MUXOUT is controlled by M3, M2, and M1 in the function latch. Tabl e 9 shows the full truth table. Figure 21 shows the MUX
OUT section in block diagram form.

Lock Detect

MUXOUT can be programmed for two types of lock detect: digital lock detect and analog lock detect.
Digital lock detect is active high. When LDP in the R counter
tch is set to 0, digital lock detect is set high when the phase
la error on three consecutive phase detector cycles is less than 15 ns. With LDP set to 1, five consecutive cycles of less than 15 ns are required to set the lock detect. It stays set high until a phase error of greater than 25 ns is detected on any subsequent PD cycle.
Table 7 .
UP
Q1
U1
CLR1
PROGRAMMABLE
DELAY
ABP2
ABP1
CLR2
DOWN
Q2
U2
Figure 20. PFD Simplified Schematic
U3
V
P
CPGND
CHARGE
PUMP
CP
02720-020
The N-channel, open-drain, analog lock detect should be op
erated with an external pull-up resistor of 10 kΩ nominal. When lock is detected, this output is high with narrow, low­going pulses.
DV
DD
ANALOG LOCK DETECT
DIGITAL LOCK DETECT
R COUNTER OUTPUT
N COUNTER OUTPUT
SDOUT
MUX
Figure 21. MUXOUT Circuit
CONTROL
MUXOUT
DGND

INPUT SHIFT REGISTER

The ADF4106 digital section includes a 24-bit input shift register, a 14-bit R counter, and a 19-bit N counter, comprising a 6-bit A counter and a 13-bit B counter. Data is clocked into the 24-bit shift register on each rising edge of CLK. The data is clocked in MSB first. Data is transferred from the shift register to one of four latches on the rising edge of LE. The destination latch is determined by the state of the two control bits (C2, C1) in the shift register. These are the two LSBs, DB1 and DB0, as shown in the timing diagram of
hese bits is shown in Tabl e 5. Ta b l e 6 shows a summary of how
t t
he latches are programmed.
Table 5. C1, C2 Truth Table
Control Bits C2 C1 Data Latch
0 0 R Counter 0 1 N Counter (A and B) 1 0 Function Latch (Including Prescaler) 1 1 Initialization Latch
Figure 2. The truth table for
02720-021
Rev. B | Page 10 of 24
ADF4106
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Table 6. Latch Summary
REFERENCE COUNTER LATCH
RESERVED
00X
RESERVED
PRESCALER
VALUE
DB22DB23
TEST
MODE BITS
LOCK
DETECT
PRECISION
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
DB21DB22DB23
CP GAIN
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
DB21DB22DB23
G1XX
CURRENT
SETTING
POWER-
DB21
DOWN 2
2
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
ANTI-
BACKLASH
WIDTH
CURRENT
SETTING
CPI3CPI4
13-BIT B COUNTER
1
N COUNTER LATCH
FUNCTION LATCH
TIMER COUNTER
CONTROL
TC3 TC2 TC1
14-BIT REFERENCE COUNTER
R6
R7R8R9R10R11R12R13R14ABP1ABP2T1T2LDP
FASTLOCK
MODE
ENABLE
FASTLOCK
F4F5
STATE
CP THREE-
PD
POLARITY
6-BIT A COUNTER
MUXOUT
CONTROL
POWER-
DOWN 1
A1A2A3A4A5B1B2B3B4B5B6B7B8B9B10B11B12B13 A6
COUNTER
C2 (0) C1 (0)R1R2R3R4R5
C2 (0)
RESET
C2 (1) C1 (0)F1PD1M1M2M3F3P1P2 CPI1CPI2CPI5CPI6 TC4PD2 F2
CONTROL
BITS
CONTROL
BITS
C1 (1)
CONTROL
BITS
INITIALIZATION LATCH
PRESCALER
VALUE
DB21
DB22DB23
P1P2 CPI1CPI2
CURRENT
SETTING
POWER-
DOWN 2
2
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9
CPI5
CPI6 TC4PD2
CPI3CPI4
CURRENT
SETTING
1
TIMER COUNTER
CONTROL
TC3 TC2 TC1
Rev. B | Page 11 of 24
FASTLOCK
MODE
POLARITY
MUXOUT
CONTROL
POWER-
DOWN 1
PD
STATE
ENABLE
FASTLOCK
CP THREE-
D
DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
B
8
F3
F4F5
F2
COUNTER
F1PD1M1M2M3
RESET
CONTROL
BITS
C2 (1) C1 (1)
02720-022
ADF4106
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Table 7. Reference Counter Latch Map
RESERVED
X
X
= DON’T CARE
DB21DB22DB23
00
TEST
MODE BITS
LOCK
DETECT
PRECISION
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
ANTI-
BACKLASH
WIDTH
ABP2 ABP1 0 0 2.9ns 0 1 1.3ns
1 0 6.0ns 1 1 2.9ns
ANTIBACKLASH PULSE WIDTH
14-BIT REFERENCE COUNTER
R14 R13 R12 .......... R3 R2 R1
0 0 0 .......... 0 0 1 1
0 0 0 .......... 0 1 0 2
0 0 0 .......... 0 1 1 3
0 0 0 .......... 1 0 0 4
. . . .......... . . . .
. . . .......... . . . .
. . . .......... . . . .
1 1 1 .......... 1 0 0 16380
1 1 1 .......... 1 0 1 16381
1 1 1 .......... 1 1 0 16382
1 1 1 .......... 1 1 1 16383
CONTROL
BITS
C2 (0) C1 (0)R1R2R3R4R5R6R7R8R9R10R11R12R13R14ABP1ABP2T1T2LDP
DIVIDE RATIO
BOTH OF THESE BITS MUST BE SET TO 0 FOR NORMAL OPERATION.
TEST MODE BITS SHOULD BE SET TO 00 FOR NORMAL OPERATION.
LDP
OPERATION
0
THREE CONSECUTIVE CYCLES OF PHASE DELAY LESS THAN 15ns MUST OCCUR BEFORE LOCK DETECT IS SET. FIVE CONSECUTIVE CYCLES OF PHASE DELAY LESS THAN
1
15ns MUST OCCUR BEFORE LOCK DETECT IS SET.
02720-023
Rev. B | Page 12 of 24
ADF4106
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Table 8. N (A, B) Counter Latch Map
RESERVED
DB22DB23
XX
13-BIT B COUNTER
CP GAIN
DB21
G1
DB19
DB20
X = DON’T CARE
B13 B12 B11 B3 B2 B1
0 0 0 .......... 0 0 0
0 0 0 .......... 0 0 1
0 0 0 .......... 0 1 0
0 0 0 .......... 0 1 1
. . . .......... . . .
. . . .......... . . .
. . . .......... . . .
1 1 1 .......... 1 0 0
1 1 1 .......... 1 0 1
1 1 1 .......... 1 1 0
1 1 1 .......... 1 1 1
DB18 DB17
DB16 DB15 DB14
DB13 DB12 DB11
DB10 DB9
B COUNTER DIVIDE RATIO NOT ALLOWED
NOT ALLOWED NOT ALLOWED 3 . . . 8188 8189 8190
8191
DB8 DB7
A6 A5 .......... A2 A1
0 0 .......... 0 0 0
0 0 .......... 0 1 1
0 0 .......... 1 0 2
0 0 .......... 1 1 3
. . .......... . . .
. . .......... . . .
. . .......... . . .
1 1 .......... 0 0 60
1 1 .......... 0 1 61
1 1 .......... 1 0 62
1 1 .......... 1 1 63
6-BIT A COUNTER
DB6 DB5
DB4 DB3
CONTROL
DB2 DB1
C2 (0) C1 (1)A1A2A3A4A5B1B2B3B4B5B6B7B8B9B10B11B12B13 A6
A COUNTER DIVIDE RATIO
BITS
DB0
F4 (FUNCTION LATCH) FASTLOCK ENABLE
00
0
1
11
THESE BITS ARE NOT USED BY THE DEVICE AND ARE DON'T CARE BITS.
OPERATIONCP GAIN CHARGE PUMP CURRENT
1
0
SETTING 1 IS PERMANENTLY USED. CHARGE PUMP CURRENT
SETTING 2 IS PERMANENTLY USED. CHARGE PUMP CURRENT
SETTING 1 IS USED. CHARGE PUMP CURRENT IS
SWITCHED TO SETTING 2. THE TIME SPENT IN SETTING 2 IS DEPENDENT ON WHICH FASTLOCK MODE IS USED. SEE FUNCTION LATCH DESCRIPTION.
N = BP + A, P IS PRESCALER VALUE SET IN THE FUNCTION LATCH. B MUST BE GREATER THAN OR EQUAL TO A. FOR CONTINUOUSLY ADJACENT VALUES OF (N × F OUTPUT, N
IS (P2– P).
MIN
REF
), AT THE
02720-024
Rev. B | Page 13 of 24
ADF4106
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Table 9. Function Latch Map
PRESCALER
VALUE
DB22DB23
CURRENT
SETTING
POWER-
DB21
DOWN 2
2
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
CPI6
CURRENT
SETTING
1
CPI3CPI4
TC4 TC3 TC2 TC1 00003
00017 001011 001115
010019 010123 011027 011131
100035 100139 101043 101147 110051 110155 111059 111163
TIMER COUNTER
CONTROL
TC4PD2 F2
TC3 TC2 TC1
MODE
FASTLOCK
F5
F4 0
1 1
TIMEOUT (PFD CYCLES)
STATE
ENABLE
CP THREE-
FASTLOCK
F4
CHARGE PUMP
F3
OUTPUT
0
NORMAL THREE-STATE
1
F5
FASTLOCK MODE
X
FASTLOCK DISABLED
0
FASTLOCK MODE 1
1
FASTLOCK MODE 2
MUXOUT
PD
CONTROL
POLARITY
PHASE DETECTOR
F2
POLARITY NEGATIVE
0
POSITIVE
1
M3 M2 M1 000
001 010
011 100 101
110 111
POWER-
DOWN 1
M1M2M3F3P1P2 CPI1CPI2CPI5
PD1
F1 0
1
COUNTER
F1
CONTROL
BITS
RESET
C2 (1) C1 (0)
COUNTER OPERATION
NORMAL R, A, B COUNTERS
HELD IN RESET
OUTPUT THREE-STATE OUTPUT
DIGITAL LOCK DETECT (ACTIVE HIGH)
N DIVIDER OUTPUT DV
DD
R DIVIDER OUTPUT N-CHANNEL OPEN-DRAIN
LOCK DETECT SERIAL DATA OUTPUT DGND
I
CPI6 CPI5 CPI4 CPI3 CPI2 CPI1 0 0 0 1.06 0.625 0.289
0 0 1 2.12 1.25 0.580 0 1 0 3.18 1.875 0.870 0 1 1 4.24 2.5 1.160
1 0 0 5.30 3.125 1.450 1 0 1 6.36 3.75 1.730 1 1 0 7.42 4.375 2.020
1 1 1 8.50 5.0 2.320
CE PIN 0
1 101 111
P2 P1 0 0 8/9
0 1 16/17 1 0 32/33 1 1 64/65
PRESCALER VALUE
PD2 PD1 MODE X
X0
ASYNCHRONOUS POWER-DOWN
X
NORMAL OPERATION ASYNCHRONOUS POWER-DOWN SYNCHRONOUS POWER-DOWN
3kΩ 5.1kΩ 11kΩ
CP
(mA)
Rev. B | Page 14 of 24
02720-025
ADF4106
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Table 10. Initialization Latch Map
PRESCALER
VALUE
DB22DB23
CURRENT
SETTING
POWER-
DB21
DOWN 2
2
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
CPI6
CURRENT
SETTING
1
CPI3CPI4
TC4 TC3 TC2 TC1 00003
00017 001011 001115
010019 010123 011027 011131
100035 100139 101043 101147 110051 110155 111059 111163
TIMER COUNTER
CONTROL
TC4PD2 F2
TC3 TC2 TC1
MODE
FASTLOCK
F5
F4 0
1 1
TIMEOUT (PFD CYCLES)
STATE
ENABLE
CP THREE-
FASTLOCK
F4
CHARGE PUMP
F3
OUTPUT NORMAL
0
THREE-STATE
1
F5
FASTLOCK MODE
X
FASTLOCK DISABLED
0
FASTLOCK MODE 1
1
FASTLOCK MODE 2
MUXOUT
PD
CONTROL
POLARITY
PHASE DETECTOR
F2
POLARITY
NEGATIVE
0
POSITIVE
1
M3 M2 M1 000
001 010
011 100 101
110 111
POWER-
DOWN 1
M1M2M3F3P1P2 CPI1CPI2CPI5
PD1
F1 0
1
COUNTER
F1
CONTROL
BITS
RESET
C2 (1) C1 (1)
COUNTER OPERATION
NORMAL R, A, B COUNTERS
HELD IN RESET
OUTPUT THREE-STATE OUTPUT
DIGITAL LOCK DETECT (ACTIVE HIGH)
N DIVIDER OUTPUT DV
DD
R DIVIDER OUTPUT N-CHANNEL OPEN-DRAIN
LOCK DETECT SERIAL DATA OUTPUT DGND
I
CPI6 CPI5 CPI4 CPI3 CPI2 CPI1 0 0 0 1.06 0.625 0.289
0 0 1 2.12 1.25 0.580 0 1 0 3.18 1.875 0.870 0 1 1 4.24 2.5 1.160
1 0 0 5.30 3.125 1.450 1 0 1 6.36 3.75 1.730 1 1 0 7.42 4.375 2.020
1 1 1 8.50 5.0 2.320
CE PIN 0
1 101 111
P2 P1 0 0 8/9
0 1 16/17 1 0 32/33 1 1 64/65
PRESCALER VALUE
PD2 PD1 MODE X
X0
ASYNCHRONOUS POWER-DOWN
X
NORMAL OPERATION ASYNCHRONOUS POWER-DOWN SYNCHRONOUS POWER-DOWN
3kΩ 5.1kΩ 11kΩ
CP
(mA)
Rev. B | Page 15 of 24
02720-026
ADF4106
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THE FUNCTION LATCH

With C2 and C1 set to 1 and 0, respectively, the on-chip function latch is programmed. Tabl e 9 shows the input data
rmat for programming the function latch.
fo

Counter Reset

DB2 (F1) is the counter reset bit. When this is 1, the R counter and the N (A, B) counter are reset. For normal operation, this bit should be 0. When powering up, disable the F1 bit (set to 0). The N counter will then resume counting in close alignment with the R counter. (The maximum error is one prescaler cycle).

Power-Down

DB3 (PD1) and DB21 (PD2) provide programmable power­down modes. They are enabled by the CE pin.
When the CE pin is low, the device is immediately disabled re
gardless of the states of PD2, PD1.
In the programmed asynchronous power-down, the device p
owers down immediately after latching 1 into the PD1 bit,
with the condition that PD2 is loaded with 0.
In the programmed synchronous power-down, the device p
ower-down is gated by the charge pump to prevent unwanted frequency jumps. Once the power-down is enabled by writing 1 into the PD1 bit (provided that 1 has also been loaded to PD2), then the device goes into power-down during the next charge pump event.
When a power-down is activated (either synchronous or asy
nchronous mode, including CE pin activated power-down),
the following events occur:
ll active dc current paths are removed.
A
The R
, N, and timeout counters are forced to their load state
conditions.

Fastlock Mode Bit

DB10 of the function latch is the fastlock mode bit. When fastlock is enabled, this bit determines which fastlock mode is used. If the fastlock mode bit is 0, then Fastlock Mode 1 is selected; and if the fastlock mode bit is 1, then Fastlock Mode 2 is selected.

Fastlock Mode 1

The charge pump current is switched to the contents of Current Setting 2. The device enters fastlock when 1 is written to the CP gain bit in the N (A, B) counter latch. The device exits fastlock when 0 is written to the CP gain bit in the N (A, B) counter latch.

Fastlock Mode 2

The charge pump current is switched to the contents of Current Setting 2. The device enters fastlock when 1 is written to the CP gain bit in the N (A, B) counter latch. The device exits fastlock under the control of the timer counter. After the timeout period, which is determined by the value in TC4 to TC1, the CP gain bit in the N (A, B) counter latch is automatically reset to 0, and the device reverts to normal mode instead of fastlock. See Tabl e 9 for the timeout periods.

Timer Counter Control

The user has the option of programming two charge pump currents. The intent is that Current Setting 1 is used when the RF output is stable and the system is in a static state. Current Setting 2 is used when the system is dynamic and in a state of change (that is, when a new output frequency is programmed). The normal sequence of events follows.
The user initially decides what the preferred charge pump c
urrents are going to be. For example, the choice may be
2.5 mA as Current Setting 1 and 5 mA as the Current Setting 2.
The cha
T
The RF
T
The i
latching data.
rge pump is forced into three-state mode.
he digital clock detect circuitry is reset.
input is debiased.
IN
he reference input buffer circuitry is disabled.
nput register remains active and capable of loading and

MUXOUT Control

The on-chip multiplexer is controlled by M3, M2, and M1 on the ADF4106 family. Ta b le 9 shows the truth table.

Fastlock Enable Bit

DB9 of the function latch is the fastlock enable bit. When this bit is 1, fastlock is enabled.
Rev. B | Page 16 of 24
Simultaneously, the decision must be made as to how long the s
econdary current stays active before reverting to the primary current. This is controlled by the timer counter control bits, DB14 to DB11 (TC4 to TC1), in the function latch. The truth table is given in
To program a new output frequency, simply program the N (A,
unter latch with new values for A and B. Simultaneously,
B) co the CP gain bit can be set to 1, which sets the charge pump with the value in CPI6 to CPI4 for a period of time determined by TC4 to TC1. When this time is up, the charge pump current reverts to the value set by CPI3 to CPI1. At the same time, the CP gain bit in the N (A, B) counter latch is reset to 0 and is now ready for the next time the user wishes to change the frequency.
Note that there is an enable feature on the timer counter. It is ena
bled when Fastlock Mode 2 is chosen by setting the fastlock
mode bit (DB10) in the function latch to 1.
Tabl e 9.
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Charge Pump Currents

CPI3, CPI2, and CPI1 program Current Setting 1 for the charge pump. CPI6, CPI5, and CPI4 program Current Setting 2 for the charge pump. The truth table is given in
Tabl e 9.

Prescaler Value

P2 and P1 in the function latch set the prescaler values. The prescaler value should be chosen so that the prescaler output frequency is always less than or equal to 325 MHz. Therefore, with an RF frequency of 4 GHz, a prescaler value of 16/17 is valid, but a value of 8/9 is not valid.

PD Polarity

This bit sets the phase detector polarity bit. See Tab l e 9 .

CP Three-State

This bit controls the CP output pin. With the bit set high, the CP output is put into three-state. With the bit set low, the CP output is enabled.

THE INITIALIZATION LATCH

When C2 and C1 = 1 and 1, respectively, the initialization latch is programmed. This is essentially the same as the function latch (programmed when C2 and C1 = 1 and 0, respectively).
However, when the initialization latch is programmed, there is a
n additional internal reset pulse applied to the R and N (A, B) counters. This pulse ensures that the N (A, B) counter is at the load point when the N (A, B) counter data is latched and the device begins counting in close phase alignment.
If the latch is programmed for synchronous power-down (CE
in is high, PD1 bit is high, and PD2 bit is low), the internal
p pulse also triggers this power-down. The prescaler reference and the oscillator input buffer are unaffected by the internal reset pulse; therefore, close phase alignment is maintained when counting resumes.
When the first N (A, B) counter data is latched after ini
tialization, the internal reset pulse is again activated. However, successive N (A, B) counter loads after this will not trigger the internal reset pulse.

Device Programming After Initial Power-Up

After initial power up of the device, there are three methods for programming the device: initialization latch, CE pin, and counter reset.

Initialization Latch Method

Apply V
ogram the initialization latch (11 in two LSBs of input
Pr
word). Make sure that the F1 bit is programmed to 0.
Do a f
word), making sure that the F1 bit is programmed to a 0.
Do a
.
DD
unction latch load (10 in two LSBs of the control
n R load (00 in two LSBs).
Do a
n N (A, B) load (01 in two LSBs).
When the initialization latch is loaded, the following occurs:
The f
unction latch contents are loaded.
An in
ternal pulse resets the R, N (A, B), and timeout counters to load-state conditions and also three-states the charge pump. Note that the prescaler band gap reference and the oscillator input buffer are unaffected by the internal reset pulse, allowing close phase alignment when counting resumes.
atching the first N (A, B) counter data after the initialization
L
word activates the same internal reset pulse. Successive N (A, B) loads will not trigger the internal reset pulse, unless there is another initialization.

CE PIN METHOD

Apply V
ing CE low to put the device into power-down. This is an
Br
asychronous power-down in that it happens immediately.
rogram the function latch (10).
P
P
rogram the R counter latch (00).
P
rogram the N (A, B) counter latch (01).
B
ring CE high to take the device out of power-down. The R and N (A, B) counters now resume counting in close alignment.
Note that after CE goes high, a 1 μs duration may be required fo
r the prescaler band gap voltage and oscillator input buffer
bias to reach steady state.
CE can be used to power the device up and down to check for cha
nnel activity. The input register does not need to be reprogrammed each time the device is disabled and enabled as long as it is programmed at least once after V applied.
DD
.
is initially
DD

COUNTER RESET METHOD

Apply V
Do a f
load 1 to the F1 bit. This enables the counter reset.
Do a
Do a
Do a f
load 0 to the F1 bit. This disables the counter reset.
This sequence provides the same close alignment as the
nitialization method. It offers direct control over the internal
i reset. Note that counter reset holds the counters at load point and three-states the charge pump but does not trigger synchronous power-down.
.
DD
unction latch load (10 in two LSBs). As part of this,
n R counter load (00 in two LSBs).
n N (A, B) counter load (01 in two LSBs).
unction latch load (10 in two LSBs). As part of this,
Rev. B | Page 17 of 24
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APPLICATIONS

LOCAL OSCILLATOR FOR LMDS BASE STATION TRANSMITTER

Figure 22 shows the ADF4106 being used with a VCO to produce the LO for an LMDS base station.
The reference input signal is applied to the circuit at FREF and, in this case, is terminated in 50 Ω. A typical base station system would have either a TCXO or an OCXO driving the reference input without any 50 Ω termination.
To achieve a channel spacing of 1 MHz at the output, the 10 MH
z reference input must be divided by 10, using the
on-chip reference divider of the ADF4106.
The charge pump output of the ADF4106 (Pin 2) drives the
op filter. In calculating the loop filter component values, a
lo number of items need to be considered. In this example, the loop filter was designed so that the overall phase margin for the system would be 45°.
Other PLL system specifications include:
K
= 2.5 mA
D
K
= 80 MHz/V
V
V
DD
IN
V
P
Loop Bandwidth = 50 kHz
F
= 1 MHz
PFD
N = 5800
Extra Reference Spur Attenuation = 10 dB
These specifications are needed and used to derive the loop f
ilter component values shown in
Figure 22.
The circuit in Figure 22 shows a typical phase noise
erformance of −83.5 dBc/Hz at 1 kHz offset from the carrier.
p Spurs are better than −62 dBc.
The loop filter output drives the VCO, which in turn is fed
ack to the RF input of the PLL synthesizer and also drives the
b RF output terminal. A T-circuit configuration provides 50 Ω matching between the VCO output, the RF output, and the RF
IN
terminal of the synthesizer.
In a PLL system, it is important to know when the system
ck. In Figure 22, this is accomplished by using the
is in lo
OUT signal from the synthesizer. The MUXOUT pin
MUX can be programmed to monitor various internal signals in the synthesizer. One of these is the LD or lock-detect signal.
RF
OUT
100pF
18Ω
18Ω
18Ω
FREF
7
AV
1000pF
IN
1000pF
51Ω
DD
8
REF
16
15
V
DV
P
DD
2
CP
IN
100pF
6.2kΩ
4.3kΩ
20pF
14
V
CC
2
V956ME03
100pF
10
ADF4106
1.5nF
CE
MUXOUT
CLK DATA LE
RFINA
R
1
SET
5.1kΩ
-COMPATIBLE SERIAL BUS
®
SPI
CPGND
43
B
RF
IN
AGND
DGND
9
Figure 22. Local Oscillator for LMDS Base Station
LOCK
14
DETECT
100pF
6
5
100pF
51Ω
NOTE DECOUPLING CAPACITORS (0.1 V
OF THE ADF4106 AND ON VCC OF THE V956ME03 HAVE
P
BEEN OMITTED FROM THE DIAGRAM TO AID CLARITY.
1, 3, 4, 5, 7, 8, 9, 11, 12, 13
μ
F/10pF) ON AVDD, DVDD, AND
02720-027
Rev. B | Page 18 of 24
ADF4106
www.BDTIC.com/ADI

INTERFACING

The ADF4106 has a simple SPI-compatible serial interface for writing to the device. CLK, DATA, and LE control the data transfer. When LE goes high, the 24 bits clocked into the input register on each rising edge of CLK are transferred to the appropriate latch. See Tabl e 5 for the latch truth table.
The maximum allowable serial clock rate is 20 MHz. This
eans that the maximum update rate for the device is 833 kHz,
m or one update every 1.2 μs. This is certainly more than adequate for systems that have typical lock times in hundreds of microseconds.

ADuC812 Interface

Figure 23 shows the interface between the ADF4106 and the ADuC812 MicroConverter®. Since the ADuC812 is based on an 8051 core, this interface can be used with any 8051-based microcontroller. The MicroConverter is set up for SPI master mode with CPHA = 0. To initiate the operation, the I/O port driving LE is brought low. Each latch of the ADF4106 needs a 24-bit word. This is accomplished by writing three 8-bit bytes from the MicroConverter to the device. When the third byte is written, the LE input should be brought high to complete the transfer.
On first applying power to the ADF4106, it needs four writes (o
ne each to the initialization latch, function latch, R counter
latch, and N counter latch) for the output to become active.
I/O port lines on the ADuC812 are also used to control
ower-down (CE input) and to detect lock (MUXOUT
p configured as lock detect and polled by the port input).
When operating in the mode described, the maximum
OCK rate of the ADuC812 is 4 MHz. This means that
SCL the maximum rate at which the output frequency can be changed is 166 kHz.
SCLOCK
ADuC812
I/O PORTS
Figure 2 for the timing diagram and
CLK
MOSI
Figure 23. ADuC812-to-ADF4106 Interface
DATA
LE
ADF4106
CE MUXOUT
(LOCK DETECT)
02720-028

ADSP2181 Interface

Figure 24 shows the interface between the ADF4106 and the ADSP21xx digital signal processor (DSP). The ADF4106 needs a 24-bit serial word for each latch write. The easiest way to accomplish this using the ADSP21xx family is to use the autobuffered transmit mode of operation with alternate framing. This provides a means for transmitting an entire block of serial data before an interrupt is generated. Set up the word length for 8 bits and use three memory locations for each 24-bit word. To program each 24-bit latch, store the three 8-bit bytes, enable the autobuffered mode, and write to the transmit register of the DSP. This last operation initiates the autobuffer transfer.
ADSP-21xx
I/O FLAGS
SCLOCK
MOSI
TFS
Figure 24. ADSP-21xx-to-ADF4106 Interface
CLK
DATA
LE
ADF4106
CE MUXOUT
(LOCK DETECT)

PCB DESIGN GUIDELINES FOR CHIP SCALE PACKAGE

The lands on the LFCSP (CP-20) are rectangular. The printed circuit board (PCB) pad for these should be 0.1 mm longer than the package land length and 0.05 mm wider than the package land width. The land should be centered on the pad. This ensures that the solder joint size is maximized. The bottom of the LFCSP has a central thermal pad.
The thermal pad on the PCB should be at least as large as this exp
osed pad. On the PCB, there should be a clearance of at least
0.25 mm between the thermal pad and the inner edges of the pad pattern. This ensures that shorting is avoided.
Thermal vias may be used on the PCB thermal pad to improve t
hermal performance of the package. If vias are used, they should be incorporated in the thermal pad at 1.2 mm pitch grid. The via diameter should be between 0.3 mm and 0.33 mm, and the via barrel should be plated with 1 oz. copper to plug the via.
The user should connect the PCB thermal pad to AGND.
02720-029
Rev. B | Page 19 of 24
ADF4106
R
www.BDTIC.com/ADI

OUTLINE DIMENSIONS

5.10
5.00
4.90
PIN 1
INDICATO
1.00
0.85
0.80
SEATING
PLANE
0.15
0.05
4.50
4.40
4.30
PIN 1
16
0.65
BSC
COPLANARITY
COMPLIANT TO JEDEC STANDARDS MO-153-AB
0.10
0.30
0.19
9
81
1.20 MAX
SEATING PLANE
6.40 BSC
0.20
0.09
Figure 25. 16-Lead Thin Shrink Small Outline Package [TSSOP]
-16)
(RU
Dimensions shown in millimeters
4.00
BSC SQ
0.60
MAX
12° MAX
0.50
BSC
TOP
VIEW
0.80 MAX
0.65 TYP
0.20
REF
3.75
BCS SQ
0.05 MAX
0.02 NOM
0.75
0.55
0.35
COPLANARITY
0.08
8° 0°
0.60
MAX
16
15
11
10
PIN 1
INDICATOR
20
5
6
0.30
0.23
0.18
0.75
0.60
0.45
1
2.25
2.10 SQ
1.95
0.25 MIN
COMPLIANT TO JEDEC STANDARDS MO-220-VGGD-1
Figure 26. 20-Lead Lead Frame Chip Scale Package [LFCSP_VQ]
4
mm × 4 mm Body, Very Thin Quad
(CP-20-1)
Dimensions shown in millimeters
Rev. B | Page 20 of 24
ADF4106
www.BDTIC.com/ADI

ORDERING GUIDE

Model Temperature Range Package Description Package Option
ADF4106BRU –40°C to + 85°C 16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16 ADF4106BRU-REEL –40°C to + 85°C 16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16 ADF4106BRU-REEL7 –40°C to + 85°C 16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16 ADF4106BRUZ ADF4106BRUZ-RL ADF4106BRUZ-R7 ADF4106BCP –40°C to + 85°C 20-Lead Lead Frame Chip Scale Package (LFCSP_VQ) CP-20 ADF4106BCP-REEL –40°C to + 85°C 20-Lead Lead Frame Chip Scale Package (LFCSP_VQ) CP-20 ADF4106BCP-REEL7 –40°C to + 85°C 20-Lead Lead Frame Chip Scale Package (LFCSP_VQ) CP-20 ADF4106BCPZ ADF4106BCPZ-RL ADF4106BCPZ-R7 EVAL-ADF4106EB1 Evaluation Board EVAL-ADF411XEB1 Evaluation Board
1
Z = Pb-free part.
1
1
1
1
1
1
–40°C to + 85°C 16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16 –40°C to + 85°C 16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16 –40°C to + 85°C 16-Lead Thin Shrink Small Outline Package (TSSOP) RU-16
–40°C to + 85°C 20-Lead Lead Frame Chip Scale Package (LFCSP_VQ) CP-20 –40°C to + 85°C 20-Lead Lead Frame Chip Scale Package (LFCSP_VQ) CP-20 –40°C to + 85°C 20-Lead Lead Frame Chip Scale Package (LFCSP_VQ) CP-20
Rev. B | Page 21 of 24
ADF4106
www.BDTIC.com/ADI
NOTES
Rev. B | Page 22 of 24
ADF4106
www.BDTIC.com/ADI
NOTES
Rev. B | Page 23 of 24
ADF4106
www.BDTIC.com/ADI
NOTES
©2005 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners.
C02720–0–6/05(B)
Rev. B | Page 24 of 24
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