On-chip oscillator as clock source
High accuracy, supports 50 Hz/60 Hz IEC62053-21
Less than 0.1% error over a dynamic range of 500 to 1
Supplies positive-only average real power on frequency
outputs F1 an
High frequency output CF calibrates and supplies
instantaneous,
Logic output REVP indicates potential miswiring or negative
power
Direct drive for electromechanical counters and 2-phase
stepper motor
Proprietary ADCs and DSPs provide high accuracy over
large variations in environmental conditions and time
On-chip power supply monitoring
On-chip creep protection (no-load threshold)
On-chip reference 2.45 V (20 ppm/°C typical) with
external over
Single 5 V supply, low power (20 mW typical)
Low cost CMOS process
GENERAL DESCRIPTION
The ADE77681 is a high accuracy, electrical energy metering IC.
It is a pin reduction version of the ADE7755, enhanced with a
precise oscillator circuit that serves as a clock source to the chip.
The ADE7768 eliminates the cost of an external crystal or
resonator, thus reducing the overall cost of a meter built with
this IC. The chip directly interfaces with the shunt resistor.
1
U.S. Patents 5,745,323; 5,760,617; 5,862,069; 5,872,469; others pending.
d F2
positive-only real power
s (F1 and F2)
drive capability
ADE7768
The ADE7768 specifications surpass the accuracy requirements of the IEC62053-21 standard. The AN-679 Application
Note can be used as a basis for a description of an IEC61036
(equivalent to IEC62053-21) low cost, watt-hour meter
reference design.
The only analog circuitry used in the ADE7768 is in the Σ-Δ
DCs and reference circuit. All other signal processing, such as
A
multiplication and filtering, is carried out in the digital domain.
This approach provides superior stability and accuracy over
time and extreme environmental conditions.
The ADE7768 supplies positive-only average real power
rmation on the low frequency outputs, F1 and F2. These
info
outputs can be used to directly drive an electromechanical
counter or interface with an MCU. The high frequency CF logic
output, ideal for calibration purposes, provides instantaneous
positive-only, real power information.
The ADE7768 includes a power supply monitoring circuit on
th
supply pin. The ADE7768 remains inactive until the
e V
DD
supply voltage on V
falls below 4 V, the ADE7768 also remains inactive and the F1,
F2, and CF outputs are in their nonactive modes.
Internal phase matching circuitry ensures that the voltage and
c
urrent channels are phase matched, while the HPF in the
current channel eliminates dc offsets. An internal no-load
threshold ensures that the ADE7768 does not exhibit creep
when no load is present. When REVP is logic high, the
ADE7768 does not generate any pulse on F1, F2, and CF.
The ADE7768 comes in a 16-lead, narrow body SOIC package.
reaches approximately 4 V. If the supply
DD
FUNCTIONAL BLOCK DIAGRAM
V
AGND
DD
1613
POWER
SUPPLY MONITOR
2
V2P
+
3
V2N
4
V1N
+
5
V1P
2.5V
REFERENCE
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
Oscillator Frequency Tolerance
Oscillator Frequency Stability
1
1
±12 % reading typ
±30 ppm/°C typ
REFERENCE INPUT
REF
Input Voltage Range 2.65 V max 2.45 V nominal
IN/OUT
2.25 V min 2.45 V nominal
Input Capacitance 10 pF max
ON-CHIP REFERENCE 2.45 V nominal
Reference Error ±200 mV max
Temperature Coefficient ±20 ppm/°C typ
LOGIC INPUTS3
SCF, S0, S1
Input High Voltage, V
Input Low Voltage, V
INH
0.8 V max VDD = 5 V ± 5%
INL
2.4 V min VDD = 5 V ± 5%
Input Current, IIN ±1 μA max Typically 10 nA, VIN = 0 V to VDD
Input Capacitance, CIN 10 pF max
LOGIC OUTPUTS3
F1 and F2
Output High Voltage, VOH 4.5 V min I
= 10 mA, VDD = 5 V, I
SOURCE
Output Low Voltage, VOL 0.5 V max
CF
Output High Voltage, VOH 4 V min I
= 5 mA, VDD = 5 V, I
SOURCE
Output Low Voltage, VOL 0.5 V max
Frequency Output Error
1, 2
(CF) ±10 % ideal typ
External 2.5 V reference, V1 = 21.2 mV rms,
V2 = 116.7 mV r
MIN
to T
= −40°C to +85°C,
MAX
amic range 500 to 1,
V
of 200 mV rms @ 100 Hz
DD
s sections
ms
= 10 mA, VDD = 5 V
SINK
= 5 mA, VDD = 5 V
SINK
ms
Rev. A | Page 3 of 20
ADE7768
www.BDTIC.com/ADI
Parameter Value Unit Test Conditions/Comments
POWER SUPPLY For specified performance
VDD 4.75 V min 5 V – 5%
5.25 V max
I
5 mA max Typically 4 mA
DD
1
See the Terminology section for an explanation of specifications.
2
See the figures in the Typical Performance Characteristics section.
3
Sample tested during initial release and after any redesign or process change that may affect this parameter.
TIMING CHARACTERISTICS
VDD = 5 V ± 5%, AGND = DGND = 0 V, on-chip reference, RCLKIN = 6.2 kΩ, 0.5% ± 50 ppm/°C, T
unless otherwise noted. Sample tested during initial release and after any redesign or process change that may affect this parameter.
See
Figure 2.
Table 2.
Parameter Specifications Unit Test Conditions/Comments
1
t
1
t2 See Table 6 sec Output pulse period. See the Transfer Function section.
t
1/2 t2 sec Time between the F1 and F2 falling edges.
3
1, 2
t
4
t
See Table 7 sec CF pulse period. See the Transfer Function section.
5
t
6
1
The pulse widths of F1, F2, and CF are not fixed for higher output frequencies. See the Frequency Outputs section.
2
The CF pulse is always 35 μs in high frequency mode. See the Frequency Outputs section and Table 7.
120
ms
F1 and F2 pulse width (logic low)
90 ms CF pulse width (logic high).
2
μs
Minimum time between the F1 and F2 pulses.
5 V + 5%
MIN
to T
= –40°C to +85°C,
MAX
t
1
F1
t
6
t
2
F2
CF
t
3
t
4
t
5
05331-002
Figure 2. Timing Diagram for Frequency Outputs
Rev. A | Page 4 of 20
ADE7768
www.BDTIC.com/ADI
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 3.
Parameter Value
VDD to AGND −0.3 V to +7 V
VDD to DGND −0.3 V to +7 V
Analog Input Voltage to AGND,
V1P, V1N, V2P, and V2N −6 V to +6 V
Reference Input Voltage to AGND −0.3 V to VDD + 0.3 V
Digital Input Voltage to DGND −0.3 V to VDD + 0.3 V
Digital Output Voltage to DGND −0.3 V to VDD + 0.3 V
Operating Temperature Range −40°C to +85°C
Storage Temperature Range −65°C to +150°C
Junction Temperature 150°C
16-Lead Plastic SOIC, Power Dissipation 350 mW
θJA Thermal Impedance
Package Temperature Soldering See J-STD-20
1
JEDEC 1S standard (2-layer) board data.
1
124.9°C/W
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
Rev. A | Page 5 of 20
ADE7768
www.BDTIC.com/ADI
TERMINOLOGY
Measurement Error
The error associated with the energy measurement made by the
ADE7768 is defined by the following formula:
7768
−
%×
Phase Error Between Channels
The high-pass filter (HPF) in the current channel (Channel V1)
has a phase-lead response. To offset this phase response and
equalize the phase response between channels, a phasecorrection network is also placed in Channel V1. The phasecorrection network matches the phase to within 0.1° over a
range of 45 Hz to 65 Hz, and 0.2° over a range 40 Hz to 1 kHz
(see
Power Supply Rejection (PSR)
This
percentage of reading when the power supplies are varied.
For the ac PSR measurement, a reading at nominal supplies
(5 V) is tak
onto the supplies and a second reading is obtained under the
same input signal levels. Any error introduced is expressed as a
percentage of reading—see the Measurement Error definition.
For the dc PSR measurement, a reading at nominal supplies
(5 V) is t
reading is obtained with the same input signal levels. Any error
introduced is again expressed as a percentage of the reading.
=
Error
Figure 24 and Figure 25).
quantifies the ADE7768 measurement error as a
en. A 200 mV rms/100 Hz signal is then introduced
aken. The supplies are then varied 5% and a second
EnergyTrue
EnergyTrueADEbyRegisteredEnergy
%100
ADC Offset Error
This r
efers to the small dc signal (offset) associated with the
analog inputs to the ADCs. However, the HPF in Channel V1
eliminates the offset in the circuitry. Therefore, the power
calculation is not affected by this offset.
Frequency Output Error (CF)
requency output error of the ADE7768 is defined as the
The f
difference between the measured output frequency (minus the
offset) and the ideal output frequency. The difference is
expressed as a percentage of the ideal frequency. The ideal
frequency is obtained from the ADE7768 transfer function.
Gain Error
The ga
in error of the ADE7768 is defined as the difference
between the measured output of the ADCs (minus the offset)
and the ideal output of the ADCs. The difference is expressed
as a percentage of the ideal of the ADCs.
Oscillator Frequency Tolerance
cillator frequency tolerance of the ADE7768 is defined as
The os
the part-to-part frequency variation in terms of percentage at
room temperature (25°C). It is measured by taking the difference between the measured oscillator frequency and the
nominal frequency defined in the
Oscillator Frequency Stability
scillator frequency stability is defined as frequency variation
O
in terms of the parts-per-million drift over the operating
temperature range. In a metering application, the temperature
range is −40°C to +85°C. Oscillator frequency stability is
measured by taking the difference between the measured
oscillator frequency at −40°C and +85°C and the measured
oscillator frequency at +25°C.
Specifications section.
Rev. A | Page 6 of 20
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