Differential ECL-compatible outputs
700 ps propagation delay input to output
75 ps propagation delay dispersion
Input common-mode range: –2.0 V to +3.0 V
Robust input protection
Differential latch control
Internal latch pull-up resistors
Power supply rejection greater than 85 dB
700 ps minimum pulse width
1.5 GHz equivalent input rise time bandwidth
Typical output rise/fall time of 500 ps
ESD protection > 4kV HBM, >200V MM
Programmable hysteresis
APPLICATIONS
Automatic test equipment
High speed instrumentation
Scope and logic analyzer front ends
Window comparators
High speed line receivers
Threshold detection
Peak detection
High speed triggers
Patient diagnostics
Hand-held test instruments
Zero crossing detectors
Line receivers and signal restoration
Clock drivers
GENERAL DESCRIPTION
The ADCMP563/ADCMP564 are high speed comparators
fabricated on Analog Devices’ proprietary XFCB process. The
devices feature a 700 ps propagation delay with less than 75 ps
overdrive dispersion. Dispersion, a measure of the difference in
propagation delay under differing overdrive conditions, is a
particularly important characteristic of high speed comparators.
A separate programmable hysteresis pin is available on the
ADCMP564.
A differential input stage permits consistent propagation delay
wi
th a wide variety of signals in the common-mode range from
−2.0 V to +3.0 V. Outputs are complementary digital signals
that are fully compatible with ECL 10 K and 10 KH logic
families. The outputs provide sufficient drive current to directly
drive transmission lines terminated in 50 Ω to −2 V. A latch
input, which is included, permits tracking, track-and-hold, or
sample-and-hold modes of operation. The latch input pins
contain internal pull-ups that set the latch in tracking mode
when left open.
The ADCMP563/ADCMP564 are specified over the industrial
emperature range (−40°C to +85°C).
t
1
2
3
ADCMP564
4
BRQ
5
TOP VIEW
(Not to Scale)
6
7
8
9
10
GND
12
LEB
11
LEB
10
9
V
CC
Q OUTPUT
Q OUTPUT
111151-0-026
04650-0-001
GND
20
QB
19
QB
18
GND
17
LEB
16
LEB
15
V
14
–INB
13
+INB
12
HYSB
11
CC
04650-0-012
Rev. B
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
hanges to Specification Table ....................................................... 4
C
Changes to Figure 14........................................................................ 9
Changes to Figure 21...................................................................... 12
Changes to Figure 23...................................................................... 13
4/04—Revision 0: Initial Version
Rev. B | Page 2 of 16
ADCMP563/ADCMP564
www.BDTIC.com/ADI
SPECIFICATIONS
VCC = +5.0 V, VEE = −5.2 V, TA = −40°C to +85°C. Typical values are at TA = +25°C, unless otherwise noted.
Table 1. Electrical Characteristics
Parameter Symbol Conditions Min Typ Max Unit
DC INPUT CHARACTERISTICS
Input Voltage Range −2.0 3.0 V
Input Differential Voltage −5 +5 V
Input Offset Voltage V
OS
Input Offset Voltage Channel Matching ±2.0 mV
Offset Voltage Temperature Coefficient ∆VOS/d
Input Bias Current I
BC
Input Bias Current Temperature Coefficient 0.5 nA/°C
Input Offset Current ±1.0 μA
Input Capacitance C
IN
Input Resistance, Differential Mode 750 kΩ
Input Resistance, Common Mode 1800 kΩ
Active Gain A
V
Common-Mode Rejection Ratio CMRR VCM = −2.0 V to +3.0 V 80 dB
Hysteresis R
LATCH ENABLE CHARACTERISTICS
Latch Enable Voltage Range −2.0 0 V
Latch Enable Differential Input Voltage 0.4 2.0 V
Latch Enable Input High Current @ 0.0 V −300 +300 μA
Latch Enable Input Low Current @ −2.0 V −300 +300 μA
LE Voltage, Open Latch inputs not connected −0.2 0 +0.1 V
LE Voltage, Open
Latch Setup Time t
Latch Hold Time t
Latch to Output Delay
Latch Minimum Pulse Width t
Latch inputs not connected −2.8 −2.6 −2.4 V
S
H
t
PLOH
t
PLOL
PL
DC OUTPUT CHARACTERISTICS
Output Voltage—High Level V
Output Voltage—Low Level V
Rise Time t
Fall Time t
OH
OL
R
F
AC PERFORMANCE
Propagation Delay t
PD
V
Propagation Delay Temperature Coefficient ∆tPD /d
Prop Delay Skew—Rising Transition to Falling
V
Transition
Within Device Propagation Delay Skew—
V
Channel-to-Channel
Overdrive Dispersion 20 mV ≤ VOD ≤ 100 mV 75 ps
100 mV ≤ VOD ≤ 1.5 V 75 ps
Slew Rate Dispersion 0.4 V/ns ≤ SR ≤ 1.33 V/ns 50 ps
Pulse Width Dispersion 750ps ≤ PW ≤ 10ns 25 ps
Duty Cycle Dispersion 33 MHz, 1 V/ns, 0.5 V 10 ps
Common-Mode Voltage Dispersion 1 V swing, −1.5 V ≤ VCM ≤ +2.5 V 10 ps
ECL 50 Ω to −2.0 V −1.15 −0.81 V
ECL 50 Ω to −2.0 V −1.95 −1.54 V
10% to 90% 530 ps
10% to 90% 450 ps
VOD = 1 V 700 ps
= 20 mV 830 ps
OD
VOD = 1 V 0.25 ps/°C
T
= 1 V 50 ps
OD
= 1 V 50 ps
OD
Rev. B | Page 3 of 16
ADCMP563/ADCMP564
www.BDTIC.com/ADI
Parameter Symbol Conditions Min Typ Max Unit
AC PERFORMANCE (Continued)
Equivalent Input Rise Time Bandwidth
Maximum Toggle Rate >50% output swing, 50% duty cycle 800 MHz
Minimum Pulse Width PW
RMS Random Jitter
Unit to Unit Propagation Delay Skew 100 ps
POWER SUPPLY
Positive Supply Current I
Negative Supply Current I
Positive Supply Voltage V
Negative Supply Voltage V
Power Dissipation P
Dual, with load 150 180 230 mW
DC Power Supply Rejection Ratio—V
DC Power Supply Rejection Ratio—V
HYSTERESIS (ADCMP564 Only)
Hysteresis R
R
Hysteresis Pin Bias Voltage Referred to AGND −1 V
Hysteresis Pin Series Resistance 3 kΩ
1
Equivalent input rise time bandwidth assumes a first-order input response and is calculated by the following formula: BWEQ = 0.22/√(tr
20/80 input transition time applied to the comparator and tr is the effective transition time, as digitized by the comparator input.
1
BW
EQ
MIN
0 V to 1 V swing, 2 V/ns 1500 MHz
ΔtPD < 25 ps 700 ps
= 400 mV, 1.3 V/ns, 312 MHz,
V
OD
1.0 ps
50% duty cycle
VCC
VEE
CC
EE
D
CC
EE
PSRR
PSRR
COMP
@ +5.0 V 2 3.2 5 mA
@ −5.2 V 10 19 25 mA
Dual 4.75 5.0 5.25 V
Dual −4.96 −5.2 −5.45 V
Dual, without load 90 120 150 mW
85 dB
VCC
85 dB
VEE
= 23.5 kΩ 20 mV
HYS
= 9.0 kΩ 70 mV
HYS
2
2
P
– tr
COMP
), where tr is the
IN
IN
Rev. B | Page 4 of 16
ADCMP563/ADCMP564
www.BDTIC.com/ADI
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
Supply Voltages
Positive Supply Voltage (VCC to GND) −0.5 V to +6.0 V
Negative Supply Voltage (VEE to GND) −6.0 V to +0.5 V
Ground Voltage Differential −0.5 V to +0.5 V
Input Voltages
Input Common-Mode Voltage −3.0 V to +4.0 V
Differential Input Voltage −7.0 V to +7.0 V
Input Voltage, Latch Controls VEE to +0.5 V
Output
Output Current 30 mA
Temperature
Operating Temperature, Ambient −40°C to +85°C
Operating Temperature, Junction 125°C
Storage Temperature Range −65°C to +150°C
S
tresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may
affect device reliability.
THERMAL CONSIDERATIONS
The ADCMP563 QSOP 16-lead package option has a θJA
(junction-to-ambient thermal resistance) of 104°C/W in
still air.
The ADCMP563 LFCSP 16-lead package option has a θ
(junction-to-ambient thermal resistance) of 70°C/W in
still air.
The ADCMP564 QSOP 20-lead package option has a θ
(junction-to-ambient thermal resistance) of 80°C/W in
still air.
JA
JA
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. B | Page 5 of 16
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