8.1 dB SSB NF
0 dBm IIP3
AGC Free Range up to –34 dBm
12 dB Continuous AGC Range
16 dB Front End Attenuator
Baseband I/Q 16-Bit (or 24-Bit) Serial Digital Output
LO and Sampling Clock Synthesizers
Programmable Decimation Factor, Output Format,
AGC, and Synthesizer Settings
370 ⍀ Input Impedance
2.7 V to 3.6 V Supply Voltage
Low Current Consumption: 20 mA
48-Lead LQFP Package (1.4 mm Thick)
APPLICATIONS
Multimode Narrow-Band Radio Products
Analog/Digital UHF/VHF FDMA Receivers
TETRA, APCO25, GSM/EDGE
Portable and Mobile Radio Products
Base Station Applications
SATCOM Terminals
AD9874
*
GENERAL DESCRIPTION
The AD9874 is a general-purpose IF subsystem that digitizes a
low level 10 MHz to 300 MHz IF input with a signal bandwidth
ranging from 6.8 kHz to 270 kHz. The signal chain of the AD9874
consists of a low noise amplifier, a mixer, a band-pass sigma-delta
analog-to-digital converter, and a decimation filter with programmable decimation factor. An automatic gain control (AGC) circuit
gives the AD9874 12 dB of continuous gain adjustment. Auxiliary blocks include both clock and LO synthesizers.
The AD9874’s high dynamic range and inherent antialiasing
provided by the band-pass sigma-delta converter allow the
AD9874
to cope with blocking signals up to 95 dB stronger
than the desired signal. This attribute can often reduce the cost of
a
radio by reducing its IF filtering requirements. Also, it enables
multimode radios of varying channel bandwidths, allowing the
IF filter to be specified for the largest channel bandwidth.
The SPI port programs numerous parameters of the AD9874,
thus allowing the device to be optimized for any given application.
Programmable parameters include synthesizer divide ratios, AGC
attenuation and attack/decay time, received signal strength level,
decimation factor, output data format, 16 dB attenuator, and the
selected bias currents. The bias currents of the LNA and mixer
can be further reduced at the expense of degraded performance
for battery-powered applications.
FUNCTIONAL BLOCK DIAGRAM
MXOP MXON IF2P IF2NGCP GCN
–16dB
IFIN
FREF
*Protected by U.S. Patent No. 5,969,657;
LNA
LO
SYN
LO VCO AND
LOOP FILTER
LOOP FILTER
⌺-⌬ ADC
CLK SYN
CLKNCLKPIOUTCLONLOPIOUTL
REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective companies.
ResolutionFullIV1624Bits
Clock Frequency (f
Center FrequencyFullVf
Pass-Band Gain VariationFullIV1.0dB
)FullIV1326MHz
CLK
/8MHz
CLK
Alias AttenuationFullIV80dB
GAIN CONTROL
Programmable Gain StepFullV16dB
AGC Gain Range (Continuous)FullV12dB
GCP Output ResistanceFullIV5072.595k⍀
OVERALL
Analog Supply Voltage
(VDDA, VDDF, VDDI)FullVI2.73.03.6V
Digital Supply Voltage
(VDDD, VDDC, VDDL)FullVI2.73.03.6V
Interface Supply Voltage
7
(VDDH)FullVI1.83.6V
Charge Pump Supply Voltage
(VDDP, VDDQ)FullVI2.75.05.5V
Total Current
High Performance Setting
Low Power Mode
8
8
FullVI2026.5mA
FullVI1722mA
StandbyFullVI0.010.1mA
OPERATING TEMPERATUR
NOTES
1
Standard operating mode: LNA/Mixer @ high bias setting, VGA @ Min ATTEN setting, synthesizers in normal (not fast acquire) mode, f
factor = 900, 16-bit digital output, and 10 pF load on SSI output pins.
2
This includes 0.9 dB loss of matching network.
3
AGC with DVGA enabled.
4
Measured in 10 kHz bandwidth.
5
Programmable in 0.67 mA steps.
6
Voltage span in which LO (or CLK) charge pump output current is maintained within 5% of nominal value of VDDP/2 (or VDDQ/2).
7
VDDH must be less than VDDD + 0.5 V.
8
Clock VCO off, add additional 0.7 mA with VGA @ Max ATTEN setting.
Specifications subject to change without notice.
REV. A
E RANGE–40+85°C
= 18 MHz, decimation
CLK
–3–
AD9874
DIGITAL SPECIFICATIONS
f
= 18 MSPS, fIF = 109.65 MHz, fLO = 107.4 MHz, f
CLK
(VDDI = VDDF = VDDA = VDDC = VDDL = VDDD = VDDH = 2.7 V to 3.6 V, VDDQ = VDDP = 2.7 V to 5.5 V,
= 16.8 MHz, unless otherwise noted.)
REF
1
ParameterTempTest LevelMinTypMaxUnit
DECIMATOR
Decimation Factor
Pass-Band WidthFullV50%f
2
FullIV48960
CLKOUT
Pass-Band Gain VariationFullIV1.2dB
Alias AttenuationFullIV88dB
SPI-READ OPERATION (See Figure 1a)
PC Clock FrequencyFullIV10MHz
PC Clock Period (t
PC Clock HI (t
PC Clock LOW (t
PC to PD Setup Time (t
PC to PD Hold Time (t
PE to PC Setup Time (t
)FullIV100ns
CLK
)FullIV45ns
HI
)FullIV45ns
LOW
)FullIV2ns
DS
)FullIV2ns
DH
)FullIV5ns
S
PC to PE Hold Time (tH)FullIV5ns
SPI-WRITE OPERATION
3
(See Figure 1b)
PC Clock FrequencyFullIV10MHz
PC Clock Period (t
PC Clock HI (t
PC Clock LOW (t
PC to PD Setup Time (t
PC to PD Hold Time (t
PC to PD (or DOUBT) Data Valid Time (t
)FullIV100ns
CLK
)FullIV45ns
HI
)FullIV45ns
LOW
)FullIV2ns
DS
)FullIV2ns
DH
)FullIV3ns
DV
PE to PD Output Valid to Hi-Z (tEZ)FullIV8ns
3
(see Figure 2b)
SSI
CLKOUT FrequencyFullIV0.86726MHz
CLKOUT Period (t
CLKOUT Duty Cycle (t
CLKOUT to FS Valid Time (t
)FullIV38.41153ns
CLK
)FullIV335067ns
HI, tLOW
)FullIV–1+1ns
V
CLKOUT to DOUT Data Valid Time (tDV)FullIV–1+1ns
CMOS LOGIC INPUTS
4
Logic “1” Voltage (VIH)FullIVVDDH – 0.2V
Logic “0” Voltage (V
Logic “1” Current (V
Logic “0” Current (V
)FullIV0.5V
IL
)FullIV10µA
IH
)FullIV10µA
IL
Input CapacitanceFullIV3pF
CMOS LOGIC OUTPUTS
3, 4, 5
Logic “1” Voltage (VIH)FullIVVDDH – 0.2V
Logic “0” Voltage (VIL)FullIV0.2V
NOTES
1
Standard operating mode: high IIP3 setting, synthesizers in normal (not fast acquire) mode, f
VDDx = 3.0 V.
2
Programmable in steps of 48 or 60.
3
CMOS output mode with C
4
Absolute Max and Min input/output levels are VDDH +0.3 V and –0.3 V.
5
IOL = 1 mA; specification is also dependent on Drive Strength setting.
*Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum ratings for
extended periods may affect device reliability.
THERMAL CHARACTERISTICS
Thermal Resistance
48-Lead LQFP
= 76.2°C/W
JA
= 17°C/W
JC
EXPLANATION OF TEST LEVELS
TEST LEVEL
I.100% production tested.
II. 100% production tested at 25°C and sample tested at
specified temperatures. AC testing done on sample basis.
III. Sample tested only.
IV. Parameter is guaranteed by design and/or
characterization testing.
V.Parameter is a typical value only.
VI. All devices are 100% production tested at 25°C; min and
max guaranteed by design and characterization for industrial
temperature range.
AD9874ABST–40°C to +85°C48-Lead Thin Plastic Quad Flatpack (LQFP)ST-48
AD9874EBEvaluation Board
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
AD9874 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended
to avoid performance degradation or loss of functionality.
REV. A
–5–
AD9874
PIN CONFIGURATION
VDDI
IFIN
CXIF
GNDI
CXVL
LOP
LON
CXVM
VDDL
VDDP
IOUTL
CLKP
GNDC
404142
CLKN
GNDS
GNDD
PC
MXOP
MXON
GNDF
IF2N
IF2P
VDDF
GCP
GCN
VDDA
GNDA
VREFP
VREFN
48 47 46 45 4439 38 3743
1
PIN 1
2
IDENTIFIER
3
4
5
6
7
8
9
10
11
12
1319181716151420 21 22 23 24
RREF
VDDQ
IOUTC
AD9874
TOP VIEW
(Not to Scale)
VDDC
GNDQ
PIN FUNCTION DESCRIPTIONS
GNDP
PD
36
35
34
33
32
31
30
29
28
27
26
25
GNDL
FREF
GNDS
SYNCB
GNDH
FS
DOUTB
DOUTA
CLKOUT
VDDH
VDDD
PE
PinMnemonicDescription
1MXOPMixer Output, Positive.
2MXONMixer Output, Negative.
3GNDFGround for Front End of ADC.
4IF2NSecond IF Input (to ADC), Negative.
5IF2PSecond IF Input (to ADC), Positive.
6VDDFPositive
Power Supply for Front End of ADC.
7GCPFilter Capacitor for ADC Full-Scale Control.
8GCNFull-Scale Control Ground.
9VDDAPositive Power Supply for ADC Back End.
10GNDAGround for ADC Back End.
11VREFPVoltage Reference, Positive.
12VREFNVoltage Reference, Negative.
13RREFReference Resistor: Requires 100 kΩ to
GNDA.
14VDDQPositive
Power Supply for Clock Synthesizer.
15IOUTCClock Synthesizer Charge Pump Output
Current.
16GNDQGround for Clock Synthesizer Charge
Pump.
17VDDCPositive
Power Supply for Clock Synthesizer.
18GNDCGround for Clock Synthesizer.
19CLKPSampling Clock Input/Clock VCO Tank,
Positive.
20CLKNSampling Clock Input/Clock VCO Tank,
Negative.
21GNDSSubstrate Ground.
22GNDDGround for Digital Functions.
23PCClock Input for SPI Port.
24PDData I/O for SPI Port.
25PEEnable Input for SPI Port.
26VDDDPositive Power Supply for Internal Digital
Function.
PinMnemonicDescription
27VDDHPositive Power Supply for Digital Interface.
28CLKOUTClock Output for SSI Port.
29DOUTAData Output for SSI Port.
30DOUTBData Output for SSI Port (Inverted) or
SPI Port.
31FSFrame Sync for SSI Port.
32GNDHGround for Digital Interface.
33SYNCBResets SSI and Decimator Counters;
Active Low.
34GNDSSubstrate Ground.
35FREFReference Frequency Input for Both
Synthesizers.
36GNDLGround for LO Synthesizer.
37GNDPGround for LO Synthesizer Charge Pump.
38IOUTLLO Synthesizer Charge Pump Output
Current Charge Pump.
39VDDPPositive Power Supply for LO Synthesizer
Charge Pump.
40VDDLPositive Power Supply for LO Synthesizer.
41CXVMExternal Filter Capacitor; DC Output of
LNA.
42LONLO Input to Mixer and LO Synthesizer,
Negative.
43LOPLO Input to Mixer and LO Synthesizer,
Positive.
44CXVLExternal Bypass Capacitor for LNA Power
Supply.
45GNDIGround for Mixer and LNA.
46CXIFExternal Capacitor for Mixer V-I Con-
verter Bias.
47IFINFirst IF Input (to LNA).
48VDDIPositive Power Supply for LNA and Mixer.
–6–
REV. A
AD9874
DEFINITION OF SPECIFICATIONS/TEST METHODS
Single-Sideband Noise Figure (SSB NF)
Noise figure (NF) is defined as the degradation in SNR performance (in dB) of an IF input signal after it passes through a
component or system. It can be expressed with the equation
Noise FigureSNRSNR
=×10 log()
INOUT
The term SSB is applicable for heterodyne systems containing a
mixer. It indicates that the desired signal spectrum resides on
only one side of the LO frequency (i.e., single sideband); thus a
“noiseless” mixer has a noise figure of 3 dB.
The AD9874’s SSB noise figure is determined by the equation
SSB NFPBWdBm Hz SNR
=−×
{}
IN
()
−−10174log
where PIN is the input power of an unmodulated carrier, BW is
the noise measurement bandwidth, –174 dBm/Hz is the thermal
noise floor at 293 K, and SNR is the measured signal-to-noise
ratio in dB of the AD9874.
Note that P
is set to –85 dBm to minimize any degradation in
IN
measured SNR due to phase noise from the RF and LO signal
generators. The IF frequency, CLK frequency, and decimation
factors are selected to minimize any spurious components
falling within the measurement bandwidth. Note also that a
bandwidth of 10 kHz is used for the data sheet specification.
Refer to Figures 22a and 22b for an indication of how NF varies
with BW. Also, refer to the TPCs to see how NF is affected by
different operating conditions. All references to noise figures
within this data sheet imply single-sideband noise figure.
Input Third Order Intercept (IIP3)
IIP3 is a figure of merit used to determine a component’s or
system’s susceptibility to intermodulation distortion (IMD)
from its third order nonlinearities. Two unmodulated carriers at
a specified frequency relationship (f
and f2) are injected into a
1
nonlinear system exhibiting third order nonlinearities producing
IMD components at 2f
– f2 and 2f2 – f1. IIP3 graphically repre-
1
sents the extrapolated intersection of the carrier’s input power
with the third order IMD component when plotted in dB. The
difference in power (D in dBc) between the two carriers and the
resulting third order IMD components can be determined from
the equation
DIIPP
=×23(–)
IN
Dynamic Range (DR)
Dynamic range is the measure of a small target input signal
(P
(P
) in the presence of a large unwanted interferer signal
TARGET
). Typically, the large signal will cause some unwanted
INTER
characteristic of the component or system to degrade, thus
making it unable to detect the smaller target signal correctly. In
the case of the AD9874, it is often a degradation in noise figure
at increased VGA attenuation settings that limits its dynamic
range (refer to TPCs 15a, 15b, and 15c).
The test method for the AD9874 is as follows. The small target
signal (an unmodulated carrier) is input at the center of the IF
frequency, and its power level (P
SNR
of 6 dB. The power of the signal is then increased by
TARGET
) is adjusted to achieve an
TARGET
3 dB prior to injecting the interferer signal. The offset frequency
of the interferer signal is selected so that aliases produced by
the decimation filter’s response as well as phase noise from the LO
(due to reciprocal mixing) do not fall back within the measurement
bandwidth. For this reason, an offset of 110 kHz was selected.
The interferer signal (also an unmodulated carrier) is then
injected into the input and its power level is increased to the
point (P
) where the target signal SNR is reduced to 6 dB.
INTER
The dynamic range is determined with the equation:
DRPPSNR
=+–
INTERTARGETTARGET
Note that the AD9874’s AGC is enabled for this test.
IF Input Clip Point
The IF input clip point is defined as 2 dB below the input power
level (P
), resulting in the clipping of the AD9874’s ADC.
IN
Unlike other linear components that typically exhibit a soft
compression (characterized by its 1 dB compression point), an
ADC exhibits a hard compression once its input signal exceeds
its rated maximum input signal range. In the case of the AD9874,
which contains a - ADC, hard compression should be avoided
because it causes severe SNR degradation.